WO1999034301A1 - Method and apparatus for three-dimensional surface contouring using a digital video projection system - Google Patents

Method and apparatus for three-dimensional surface contouring using a digital video projection system Download PDF

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Publication number
WO1999034301A1
WO1999034301A1 PCT/US1998/027915 US9827915W WO9934301A1 WO 1999034301 A1 WO1999034301 A1 WO 1999034301A1 US 9827915 W US9827915 W US 9827915W WO 9934301 A1 WO9934301 A1 WO 9934301A1
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WO
WIPO (PCT)
Prior art keywords
fiinge
pattern
patterns
phase
fringe
Prior art date
Application number
PCT/US1998/027915
Other languages
English (en)
French (fr)
Other versions
WO1999034301A9 (en
Inventor
Peisen S. Huang
Fu-Pen Chiang
Original Assignee
The Research Foundation Of State University Of New York
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by The Research Foundation Of State University Of New York filed Critical The Research Foundation Of State University Of New York
Priority to CA002316838A priority Critical patent/CA2316838A1/en
Priority to EP98965560A priority patent/EP1042718A4/en
Priority to AU21001/99A priority patent/AU2100199A/en
Priority to JP2000526877A priority patent/JP2002500369A/ja
Publication of WO1999034301A1 publication Critical patent/WO1999034301A1/en
Publication of WO1999034301A9 publication Critical patent/WO1999034301A9/en

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Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T1/00—General purpose image data processing
    • G06T1/0007—Image acquisition

Definitions

  • the apparatus can further comprise a mechanical phase shifter for shifting the phase angle.
  • Traditional mechanical phase shifters generally include motors to either translate a grating or the object being imaged, or rotate a glass plate that refracts the projected fiinge pattern. Examples of mechanical phase shifters are found in U.S. Patent Nos. 4,641,972 to Halioua et al., 4,984,893 to Lange, and 5,561,526 to Huber et al, the disclosures of which are incorporated herein by reference.

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Image Processing (AREA)
PCT/US1998/027915 1997-12-31 1998-12-31 Method and apparatus for three-dimensional surface contouring using a digital video projection system WO1999034301A1 (en)

Priority Applications (4)

Application Number Priority Date Filing Date Title
CA002316838A CA2316838A1 (en) 1997-12-31 1998-12-31 Method and apparatus for three-dimensional surface contouring using a digital video projection system
EP98965560A EP1042718A4 (en) 1997-12-31 1998-12-31 METHOD AND APPARATUS FOR FORMING THREE-DIMENSIONAL CONTOURS OF A SURFACE USING A DIGITAL VIDEO PROJECTION SYSTEM
AU21001/99A AU2100199A (en) 1997-12-31 1998-12-31 Method and apparatus for three-dimensional surface contouring using a digital video projection system
JP2000526877A JP2002500369A (ja) 1997-12-31 1998-12-31 デジタル・ビデオ投影システムを使用して三次元表面輪郭描画を行う方法および装置

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US7013897P 1997-12-31 1997-12-31
US60/070,138 1997-12-31

Publications (2)

Publication Number Publication Date
WO1999034301A1 true WO1999034301A1 (en) 1999-07-08
WO1999034301A9 WO1999034301A9 (en) 1999-09-23

Family

ID=22093382

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/US1998/027915 WO1999034301A1 (en) 1997-12-31 1998-12-31 Method and apparatus for three-dimensional surface contouring using a digital video projection system

Country Status (5)

Country Link
EP (1) EP1042718A4 (ja)
JP (1) JP2002500369A (ja)
AU (1) AU2100199A (ja)
CA (1) CA2316838A1 (ja)
WO (1) WO1999034301A1 (ja)

Cited By (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002081924A (ja) * 2000-07-05 2002-03-22 Ckd Corp 三次元計測装置
AU758952B2 (en) * 2000-01-06 2003-04-03 Canon Kabushiki Kaisha Demodulation and phase estimation of two-dimensional patterns
EP1617175A1 (en) * 2004-07-16 2006-01-18 Pilkington Plc Glazing inspection
US7277566B2 (en) 2002-09-17 2007-10-02 Riken Microscope system
WO2008079208A1 (en) 2006-12-19 2008-07-03 Pilkington North America, Inc. Method of automated quantitative analysis of distortion shaped vehicle glass by reflected optical imaging
EP1912477A3 (en) * 2000-10-06 2008-08-13 Phonak AG Manufacturing methods and systems for rapid production of hearing-aid shells
US7898651B2 (en) 2005-10-24 2011-03-01 General Electric Company Methods and apparatus for inspecting an object
CN102401646A (zh) * 2010-07-19 2012-04-04 通用电气公司 基于结构光测量的方法
CN103487441A (zh) * 2013-09-24 2014-01-01 电子科技大学 一种用于硅晶片缺陷检测和面形测量的方法
CN105300319A (zh) * 2015-11-20 2016-02-03 华南理工大学 一种基于彩色光栅的快速三维立体重建方法
US9846689B2 (en) 2008-01-29 2017-12-19 Adobe Systems Incorporated Method and system to provide portable database functionality in an electronic form
CN114018176A (zh) * 2021-10-27 2022-02-08 华中科技大学 一种投影图像处理模块、三维重构方法及其系统

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4480488B2 (ja) * 2003-08-28 2010-06-16 富士通株式会社 計測装置、コンピュータ数値制御装置及びプログラム
WO2005067389A2 (en) * 2004-01-15 2005-07-28 Technion Research & Development Foundation Ltd. Three-dimensional video scanner
DE102006048234A1 (de) * 2006-10-11 2008-04-17 Steinbichler Optotechnik Gmbh Verfahren und Vorrichtung zur Bestimmung der 3D-Koordinaten eines Objekts
CN103528543B (zh) * 2013-11-05 2015-12-02 东南大学 一种光栅投影三维测量中的系统标定方法
KR20200036565A (ko) * 2018-09-28 2020-04-07 화성혜 3차원 피부 스캔 방법
CN109297435A (zh) * 2018-10-24 2019-02-01 重庆大学 一种反向抵消非线性误差的彩色数字光栅编码方法
CN114812437B (zh) * 2022-03-25 2023-07-04 珠海城市职业技术学院 一种基于像素编码的光学三维测量方法及系统
CN117804381B (zh) * 2024-03-01 2024-05-10 成都信息工程大学 一种基于相机阵列聚焦结构光对物体三维重建方法

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5038291A (en) * 1989-04-03 1991-08-06 General Electric Company Computerized ply pattern generation
US5550960A (en) * 1993-08-02 1996-08-27 Sun Microsystems, Inc. Method and apparatus for performing dynamic texture mapping for complex surfaces

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0076866B1 (de) * 1981-10-09 1985-05-02 Ibm Deutschland Gmbh Interpolierendes Lichtschnitt-Verfahren
US4634278A (en) * 1984-02-06 1987-01-06 Robotic Vision Systems, Inc. Method of three-dimensional measurement with few projected patterns
JPH08251520A (ja) * 1995-03-08 1996-09-27 Nikon Corp ビデオプロジェクター
AU683803B2 (en) * 1995-10-17 1997-11-20 Aluminum Company Of America Electronic fringe analysis for determining surface contours

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5038291A (en) * 1989-04-03 1991-08-06 General Electric Company Computerized ply pattern generation
US5550960A (en) * 1993-08-02 1996-08-27 Sun Microsystems, Inc. Method and apparatus for performing dynamic texture mapping for complex surfaces

Non-Patent Citations (2)

* Cited by examiner, † Cited by third party
Title
NADAS T, FOURNIER A: "GRAPE: AN ENVIRONMENT TO BUILD DISPLAY PROCESSES", COMPUTER GRAPHICS., ACM, US, vol. 21, no. 04, 1 July 1987 (1987-07-01), US, pages 75 - 84, XP002917530, ISSN: 0097-8930, DOI: 10.1145/37402.37412 *
See also references of EP1042718A4 *

Cited By (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
AU758952B2 (en) * 2000-01-06 2003-04-03 Canon Kabushiki Kaisha Demodulation and phase estimation of two-dimensional patterns
JP2002081924A (ja) * 2000-07-05 2002-03-22 Ckd Corp 三次元計測装置
EP1912477A3 (en) * 2000-10-06 2008-08-13 Phonak AG Manufacturing methods and systems for rapid production of hearing-aid shells
US7277566B2 (en) 2002-09-17 2007-10-02 Riken Microscope system
EP1617175A1 (en) * 2004-07-16 2006-01-18 Pilkington Plc Glazing inspection
US7995094B2 (en) 2004-07-16 2011-08-09 Pilkington Plc Glazing inspection
US7898651B2 (en) 2005-10-24 2011-03-01 General Electric Company Methods and apparatus for inspecting an object
WO2008079208A1 (en) 2006-12-19 2008-07-03 Pilkington North America, Inc. Method of automated quantitative analysis of distortion shaped vehicle glass by reflected optical imaging
US9846689B2 (en) 2008-01-29 2017-12-19 Adobe Systems Incorporated Method and system to provide portable database functionality in an electronic form
CN102401646A (zh) * 2010-07-19 2012-04-04 通用电气公司 基于结构光测量的方法
CN102401646B (zh) * 2010-07-19 2014-07-16 通用电气公司 基于结构光测量的方法
CN103487441A (zh) * 2013-09-24 2014-01-01 电子科技大学 一种用于硅晶片缺陷检测和面形测量的方法
CN105300319A (zh) * 2015-11-20 2016-02-03 华南理工大学 一种基于彩色光栅的快速三维立体重建方法
CN105300319B (zh) * 2015-11-20 2017-11-07 华南理工大学 一种基于彩色光栅的快速三维立体重建方法
CN114018176A (zh) * 2021-10-27 2022-02-08 华中科技大学 一种投影图像处理模块、三维重构方法及其系统

Also Published As

Publication number Publication date
EP1042718A4 (en) 2002-10-16
AU2100199A (en) 1999-07-19
EP1042718A1 (en) 2000-10-11
WO1999034301A9 (en) 1999-09-23
JP2002500369A (ja) 2002-01-08
CA2316838A1 (en) 1999-07-08

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