EP1042718A4 - Method and apparatus for three-dimensional surface contouring using a digital video projection system - Google Patents

Method and apparatus for three-dimensional surface contouring using a digital video projection system

Info

Publication number
EP1042718A4
EP1042718A4 EP98965560A EP98965560A EP1042718A4 EP 1042718 A4 EP1042718 A4 EP 1042718A4 EP 98965560 A EP98965560 A EP 98965560A EP 98965560 A EP98965560 A EP 98965560A EP 1042718 A4 EP1042718 A4 EP 1042718A4
Authority
EP
European Patent Office
Prior art keywords
digital video
projection system
dimensional surface
video projection
surface contouring
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
EP98965560A
Other languages
German (de)
French (fr)
Other versions
EP1042718A1 (en
Inventor
Peisen S Huang
Fu-Pen Chiang
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Research Foundation of State University of New York
Original Assignee
Research Foundation of State University of New York
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Research Foundation of State University of New York filed Critical Research Foundation of State University of New York
Publication of EP1042718A1 publication Critical patent/EP1042718A1/en
Publication of EP1042718A4 publication Critical patent/EP1042718A4/en
Withdrawn legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T1/00—General purpose image data processing
    • G06T1/0007—Image acquisition

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Image Processing (AREA)
EP98965560A 1997-12-31 1998-12-31 Method and apparatus for three-dimensional surface contouring using a digital video projection system Withdrawn EP1042718A4 (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US7013897P 1997-12-31 1997-12-31
US70138P 1997-12-31
PCT/US1998/027915 WO1999034301A1 (en) 1997-12-31 1998-12-31 Method and apparatus for three-dimensional surface contouring using a digital video projection system

Publications (2)

Publication Number Publication Date
EP1042718A1 EP1042718A1 (en) 2000-10-11
EP1042718A4 true EP1042718A4 (en) 2002-10-16

Family

ID=22093382

Family Applications (1)

Application Number Title Priority Date Filing Date
EP98965560A Withdrawn EP1042718A4 (en) 1997-12-31 1998-12-31 Method and apparatus for three-dimensional surface contouring using a digital video projection system

Country Status (5)

Country Link
EP (1) EP1042718A4 (en)
JP (1) JP2002500369A (en)
AU (1) AU2100199A (en)
CA (1) CA2316838A1 (en)
WO (1) WO1999034301A1 (en)

Families Citing this family (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
AU758952B2 (en) * 2000-01-06 2003-04-03 Canon Kabushiki Kaisha Demodulation and phase estimation of two-dimensional patterns
JP2002081924A (en) * 2000-07-05 2002-03-22 Ckd Corp Three-dimensional measuring device
US7050876B1 (en) * 2000-10-06 2006-05-23 Phonak Ltd. Manufacturing methods and systems for rapid production of hearing-aid shells
JP3731073B2 (en) 2002-09-17 2006-01-05 独立行政法人理化学研究所 Microscope equipment
JP4480488B2 (en) * 2003-08-28 2010-06-16 富士通株式会社 Measuring device, computer numerical control device, and program
JP5356650B2 (en) * 2004-01-15 2013-12-04 テクニオン リサーチ アンド ディベロップメント ファウンデーション リミテッド 3D video scanner
GB0415916D0 (en) 2004-07-16 2004-08-18 Pilkington Plc Glazing inspection
US7898651B2 (en) 2005-10-24 2011-03-01 General Electric Company Methods and apparatus for inspecting an object
DE102006048234A1 (en) * 2006-10-11 2008-04-17 Steinbichler Optotechnik Gmbh Method and device for determining the 3D coordinates of an object
US7471383B2 (en) 2006-12-19 2008-12-30 Pilkington North America, Inc. Method of automated quantitative analysis of distortion in shaped vehicle glass by reflected optical imaging
US9846689B2 (en) 2008-01-29 2017-12-19 Adobe Systems Incorporated Method and system to provide portable database functionality in an electronic form
US8165351B2 (en) * 2010-07-19 2012-04-24 General Electric Company Method of structured light-based measurement
CN103487441B (en) * 2013-09-24 2015-09-30 电子科技大学 A kind of method for silicon wafer defects detection and surface shape measurement
CN103528543B (en) * 2013-11-05 2015-12-02 东南大学 System calibrating method in a kind of optical grating projection three-dimensional measurement
CN105300319B (en) * 2015-11-20 2017-11-07 华南理工大学 A kind of quick three-dimensional stereo reconstruction method based on chromatic grating
CN109297435A (en) * 2018-10-24 2019-02-01 重庆大学 A kind of reversed colorful number grating encoding method for offsetting nonlinearity erron
CN114018176A (en) * 2021-10-27 2022-02-08 华中科技大学 Projection image processing module, three-dimensional reconstruction method and system thereof
CN114812437B (en) * 2022-03-25 2023-07-04 珠海城市职业技术学院 Optical three-dimensional measurement method and system based on pixel coding
CN117804381B (en) * 2024-03-01 2024-05-10 成都信息工程大学 Three-dimensional reconstruction method for object based on camera array focusing structure light

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0076866A1 (en) * 1981-10-09 1983-04-20 Ibm Deutschland Gmbh Interpolating light section process
US4634278A (en) * 1984-02-06 1987-01-06 Robotic Vision Systems, Inc. Method of three-dimensional measurement with few projected patterns
EP0769674A2 (en) * 1995-10-17 1997-04-23 Aluminum Company Of America Electronic fringe analysis for determining surface contours
US5633755A (en) * 1995-03-08 1997-05-27 Nikon Corporation Projection apparatus and method

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5038291A (en) * 1989-04-03 1991-08-06 General Electric Company Computerized ply pattern generation
US5550960A (en) * 1993-08-02 1996-08-27 Sun Microsystems, Inc. Method and apparatus for performing dynamic texture mapping for complex surfaces

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0076866A1 (en) * 1981-10-09 1983-04-20 Ibm Deutschland Gmbh Interpolating light section process
US4634278A (en) * 1984-02-06 1987-01-06 Robotic Vision Systems, Inc. Method of three-dimensional measurement with few projected patterns
US5633755A (en) * 1995-03-08 1997-05-27 Nikon Corporation Projection apparatus and method
EP0769674A2 (en) * 1995-10-17 1997-04-23 Aluminum Company Of America Electronic fringe analysis for determining surface contours

Non-Patent Citations (2)

* Cited by examiner, † Cited by third party
Title
SANSONI G ET AL: "A NOVEL, ADAPTIVE SYSTEM FOR 3-D OPTICAL PROFILOMETRY USING A LIQUID CRYSTAL LIGHT PROJECTOR", IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, IEEE INC. NEW YORK, US, vol. 43, no. 4, 1 August 1994 (1994-08-01), pages 558 - 565, XP000466818, ISSN: 0018-9456 *
See also references of WO9934301A1 *

Also Published As

Publication number Publication date
CA2316838A1 (en) 1999-07-08
JP2002500369A (en) 2002-01-08
EP1042718A1 (en) 2000-10-11
WO1999034301A9 (en) 1999-09-23
WO1999034301A1 (en) 1999-07-08
AU2100199A (en) 1999-07-19

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