WO1996033388A1 - System und verfahren zur zweidimensionalen vermessung planer objekte - Google Patents
System und verfahren zur zweidimensionalen vermessung planer objekte Download PDFInfo
- Publication number
- WO1996033388A1 WO1996033388A1 PCT/EP1995/001485 EP9501485W WO9633388A1 WO 1996033388 A1 WO1996033388 A1 WO 1996033388A1 EP 9501485 W EP9501485 W EP 9501485W WO 9633388 A1 WO9633388 A1 WO 9633388A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- use according
- measurement
- measuring
- measured
- dimensional measurement
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/002—Measuring arrangements characterised by the use of optical techniques for measuring two or more coordinates
Definitions
- the measuring machines currently used to measure the above-mentioned planar objects are often high-precision 3D measuring machines which are not only very expensive but also very complicated to operate.
- 2D measuring machines are also known, which either measure mechanically or optically contactlessly measure parts such as 3D coordinate machines. Measuring machines of this type are essentially characterized by elaborate precision mechanics in connection with high-precision length scales and precise drive elements. Furthermore, profile projectors or measuring microscopes are also introduced in measuring technology for measuring two-dimensional contours. These manual, non-reproducible systems, which are dependent on the particular daily form of the machine operator, require exceptionally long measuring times in the hour range for the measurement of only one workpiece. Automatic, CNC-controlled projectors work similarly to 2D coordinate measuring machines and also represent the state of the relevant technology.
- the invention is therefore based on the object of specifying a system and a method for the two-dimensional measurement of planar objects which are highly precise and at the same time are extraordinarily inexpensive.
- This object is achieved for a system according to the invention in that a flatbed scanner is used for the two-dimensional measurement of flat objects.
- the solution according to the invention for a method consists in that the system according to the invention is used for the two-dimensional measurement of planar objects, the object to be measured being carried out on the object surface, then the measurement point recording / teach-in, and the measurement evaluation then taking place.
- Advantageous embodiments of the invention are specified in the respective dependent claims.
- One embodiment of a system for the two-dimensional measurement of planar objects consists of a cuboid-shaped housing which is vibration-damped and dust and light-tight.
- the top of this housing is essentially formed by an object support surface.
- a CCD chip with a lighting device that can be moved in the X-Y direction is usually arranged in the interior of the housing.
- the object support surface can be covered with and without an object located on it by means of a lid.
- the position of the object is identified by means of a so-called teach-in method.
- a mechanical stop can also be provided on the object receiving surface, as a result of which a defined position of the object is defined.
- the system is computer-aided and CNC-controlled and can therefore carry out the measurement fully automatically.
- the operating computer consists of two monitors, a mouse or joystick and an alphanumeric keyboard.
- the measuring system-specific software is also integrated in the operating computer, the graphical user interface determining the functionality of the system.
- the operator computer can also be integrated into an EDP network and use the resulting data network. Measuring programs once created can be stored and called up again at any time in order to be able to measure similar parts without measuring programs / teach-in to be created again.
- the system described has a measuring accuracy of typically s ⁇ 50 ⁇ m, the height of the workpieces to be measured depending on the configuration of the cover. Generally, a workpiece / object height of max. 30 mm must not be exceeded.
- the method for the two-dimensional measurement of planar objects with this system begins with the placement of the object to be measured on the object support, the system not requiring any special alignment of the object to be measured.
- the position detection is then carried out using suitable software.
- the result can be shown as a digital image on a display.
- a mechanical stop can also be provided for a defined position of the object to be measured, e.g. when the same objects are measured.
- the subsequent measurement point recording is done either manually, then by controlling the desired measurement points with a mouse, the catch area of the cursor is only to be placed in the vicinity of the workpiece or object edge to be measured, or automatically using the computer if the computer knows known objects should be measured. Both the measurement point recording and the measurement following it are carried out using an edge finding (edge finding) and a sub-grid point algorithm (subpixeling).
- the possible mechanical and optical errors of the specific measuring machine or the specific measuring system are determined with a suitable calibration method and compensated accordingly. It is advantageous to store the location-dependent correction data in a system-inherent database so that the location-specific data of the object edges can be corrected with the values stored in this database.
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Length Measuring Devices With Unspecified Measuring Means (AREA)
Abstract
Description
Claims
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
PCT/EP1995/001485 WO1996033388A1 (de) | 1995-04-20 | 1995-04-20 | System und verfahren zur zweidimensionalen vermessung planer objekte |
AU65230/96A AU6523096A (en) | 1995-04-20 | 1995-04-20 | Plane object two-dimensional measurement process and system |
EP95918573A EP0821780A1 (de) | 1995-04-20 | 1995-04-20 | System und verfahren zur zweidimensionalen vermessung planer objekte |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
PCT/EP1995/001485 WO1996033388A1 (de) | 1995-04-20 | 1995-04-20 | System und verfahren zur zweidimensionalen vermessung planer objekte |
Publications (1)
Publication Number | Publication Date |
---|---|
WO1996033388A1 true WO1996033388A1 (de) | 1996-10-24 |
Family
ID=8166005
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/EP1995/001485 WO1996033388A1 (de) | 1995-04-20 | 1995-04-20 | System und verfahren zur zweidimensionalen vermessung planer objekte |
Country Status (3)
Country | Link |
---|---|
EP (1) | EP0821780A1 (de) |
AU (1) | AU6523096A (de) |
WO (1) | WO1996033388A1 (de) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE19703382A1 (de) * | 1997-01-30 | 1998-08-06 | Fraunhofer Ges Forschung | Scanner und Verfahren zum Erfassen eines Objekts unter Verwendung eines Scanners |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5184217A (en) * | 1990-08-02 | 1993-02-02 | Doering John W | System for automatically inspecting a flat sheet part |
WO1995003525A1 (fr) * | 1993-07-22 | 1995-02-02 | Gianfranco Passoni | Procede et ensemble de mesure pour mesurer les dimensions d'un article |
-
1995
- 1995-04-20 WO PCT/EP1995/001485 patent/WO1996033388A1/de not_active Application Discontinuation
- 1995-04-20 AU AU65230/96A patent/AU6523096A/en not_active Abandoned
- 1995-04-20 EP EP95918573A patent/EP0821780A1/de not_active Withdrawn
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5184217A (en) * | 1990-08-02 | 1993-02-02 | Doering John W | System for automatically inspecting a flat sheet part |
WO1995003525A1 (fr) * | 1993-07-22 | 1995-02-02 | Gianfranco Passoni | Procede et ensemble de mesure pour mesurer les dimensions d'un article |
Non-Patent Citations (2)
Title |
---|
ADAMS R ET AL: "FLACHTEILE BERUEHRUNGSLOS, SCHNELL UND PRAZISE MESSEN", F & M. FEINWERKTECHNIK MIKROTECHNIK MESSTECHNIK, vol. 100, no. 1 / 02, 1 February 1992 (1992-02-01), pages 33 - 36, XP000291860 * |
ANON.: "Oberflächen im Fokus", ELEKTROTECHNIK, vol. 76, no. 6, 13 June 1994 (1994-06-13), WURZBURG DE, pages 14, XP000438393 * |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE19703382A1 (de) * | 1997-01-30 | 1998-08-06 | Fraunhofer Ges Forschung | Scanner und Verfahren zum Erfassen eines Objekts unter Verwendung eines Scanners |
DE19703382C2 (de) * | 1997-01-30 | 2000-10-05 | Fraunhofer Ges Forschung | Scanner zum Erfassen eines Objekts |
Also Published As
Publication number | Publication date |
---|---|
EP0821780A1 (de) | 1998-02-04 |
AU6523096A (en) | 1996-11-07 |
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