WO1994019706A1 - Substance sensible au rayonnement ionisant - Google Patents

Substance sensible au rayonnement ionisant Download PDF

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Publication number
WO1994019706A1
WO1994019706A1 PCT/RU1993/000051 RU9300051W WO9419706A1 WO 1994019706 A1 WO1994019706 A1 WO 1994019706A1 RU 9300051 W RU9300051 W RU 9300051W WO 9419706 A1 WO9419706 A1 WO 9419706A1
Authority
WO
WIPO (PCT)
Prior art keywords
radiation
ions
sensitive
image
gallium
Prior art date
Application number
PCT/RU1993/000051
Other languages
English (en)
Russian (ru)
Inventor
Dmitry Ivanovich Kochubei
Konsuella Evgenievna Gjunsburg
Gennady Borisovich Gorin
Vyacheslav Ivanovich Kochubei
Nina Petrovna Zvezdova
Original Assignee
Institut Kataliza Sibirskogo Otdelenia Rossiiskoi Akademii Nauk
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Institut Kataliza Sibirskogo Otdelenia Rossiiskoi Akademii Nauk filed Critical Institut Kataliza Sibirskogo Otdelenia Rossiiskoi Akademii Nauk
Priority to JP51886194A priority Critical patent/JPH08507856A/ja
Priority to PCT/RU1993/000051 priority patent/WO1994019706A1/fr
Publication of WO1994019706A1 publication Critical patent/WO1994019706A1/fr

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors

Definitions

  • the material is sensitive to ⁇ radiation, used for the registration of X-ray images with the use of electronic devices.
  • This material includes C ⁇ ⁇ mono-crystals modified by the ⁇ G or ISAa ions ("Generator", Comparison, ⁇ . ⁇ . ⁇ lyuyev, 1980,
  • the named material ensures a commercially available solution, which corresponds to 10 lines / mm;
  • the material is known on the basis of the crystalline compound of Karag, the modi fi ed ions of the divalent ⁇ .
  • the system is used for registration of X-ray radiation. By X-ray radiation in the material
  • the material provides a simple resolution of up to 100 ⁇ m (10 lines / mm), and the available dynamic range (10) does not allow a lot of time.
  • the registered image cannot be kept long due to the relaxation of the luminescence centers (the loss of luminescent centers is up to 30 days). It is only possible to read one by one, since the image is also destroyed.
  • a material sensitive to emitting radiation is also known, including a polys- tem of a cleaned method, which was modified by the Egyptians (there was a disruption to 1970). For the sake of this material, we have developed a radio-luminescent product that ensures long-term storage (from I for 3 months).
  • the indicated material has a low breaking capacity (not higher than 100 lines / mm), due to which it is small for X-ray diffraction. In addition, the high sensitivity of such material does not allow the measurement of small doses of dimming radiation (less than ⁇ altern).
  • the materials having a high stability and the ability to read a large amount of information contain the medium.
  • the material is sensitive to dampening radiation, including alkaline-galoidal crystals, having a structure of the type CASC, modified ⁇ / ⁇ / 00051
  • ions of metals contains in the quality of modifying ions of metals selected from a group including gallium, indium, indium.
  • Blag ⁇ da ⁇ ya iz ⁇ b ⁇ e ⁇ eniyu claimed ma ⁇ e ⁇ ial imee ⁇ dynam- miches ⁇ y dia ⁇ az ⁇ n chuvs ⁇ vi ⁇ eln ⁇ s ⁇ i, ⁇ avny 5 * 10, ⁇ es ⁇ ⁇ 50 m ⁇ d ⁇ 250 ⁇ , and ⁇ bes ⁇ echivae ⁇ ⁇ az ⁇ eshayuschuyu s ⁇ s ⁇ bn ⁇ s ⁇ ⁇ 100 d ⁇ 300 lines / mm and v ⁇ zm ⁇ zhn ⁇ s ⁇ ⁇ aneniya in ⁇ matsii 3-5 months ⁇ i mn ⁇ g ⁇ a ⁇ n ⁇ m schi ⁇ yvanii.
  • An embodiment of the claimed invention is in fact inclusive that the modifying materials include divalent nickel in a concentration of 0.02-1.00 mol. .
  • the material of such a system has the lowest low sensitivity (50 m Sprint ⁇ ), which is the most favorable for the use of the lowering radiation.
  • the material includes modifying ions of gallium, indium, palladium, thallium at a concentration of 0.1-1.0%. .
  • the product is designed to provide a high-resolution solution that allows you to use it for an X-ray.
  • the inventive material sensitive to dampening radiation provides a superior alkaline-gallant method and is negligible.
  • crusty metals can serve as a hot-water burner, livelihoods, brigade and natural gas and water.
  • - 5 The indicated crystals, according to the invention, are modified by the nickel, gallium, indium, thallium, palladium ions, which are in the form of a consumable in the declared material.
  • the inventive material may be used many times without changing its properties.
  • the material which is sensitive to dampening radiation, provides a large amount of calcium chloride, which is modified by indium ions, increased by 0.1% from the alloy. 15
  • the radiator emits X-ray radiation with the next visible light. In this case, a short image is obtained that is designed with structural defects with modifying ions.
  • the resulting image is taken into account by registering the luminescence of the structural defects of a crystal at 20 and a wavelength of 530–580 nm is taken into account.
  • the modes of exposure the energy of quanta 12 K ⁇ , dose I ⁇ .
  • the resolution of the resulting image is 25,200 lines / mm, possibly multiple reading without deterioration of the image.
  • the image is taken for 6 months.
  • the material which is sensitive to dampening radiation, delivers a self-absorbed, purely 30% sodium modulus at a percentage of 0.5%.
  • the model is subject to conditions similar to those specified in Example I, but reads the disclaimer and excitation of structural defects at a temperature of 320–3 nm. 35
  • the resolution of the received images is 300 lines, possibly a multiple reading without deterioration of the image.
  • the image is lost for up to six months. - 7 - Example 3.
  • the material sensitive to dampening radiation, provides a large fraction of the output, modified by gallium ions, at a concentration of 1.0 mol.%. 5
  • the case is subject to conditions similar to those specified in Example I, but takes into account the resulting image at excitation of the defects in the region of 330 nm.
  • the resolution of the obtained image is 300 lines / mm, possibly multiple readings without deterioration of 10 images.
  • the image is taken for 6 months.
  • the material sensitive to dampening radiation, provides a large variety of crystalline, modified with palladium ions at a concentration of 0.5%. 15
  • the case is subject to conditions similar to those specified in Example I, but takes into account the resulting image in the case of excitation of defects in the region of 250-3.
  • the resolution of the resulting image is 100 lines / mm, possibly multiple readings without affecting the 20 images.
  • the image is taken 3 months.
  • Example 5 The resolution of the resulting image is 100 lines / mm, possibly multiple readings without affecting the 20 images.
  • the image is taken 3 months. Example 5.
  • the material sensitive to dampening radiation, provides a large range of filters, modified by nickel ions in a concentration of 0.02 mol%. 25
  • the case is subject to conditions similar to those specified in Example I, but the exposure rate is 50 ⁇ .
  • the obtained image takes into account by recording the luminescence of the structural defects of the crystal at a wavelength of 390 nm and 580 nm, the excitation distance is 30–270 nm.
  • the resolution of the received image is 200 l / m, possibly a multiple reading without deterioration of the image.
  • the image is taken I year.
  • Example 6. 35 The material, which is sensitive to dampening radiation, provides a large amount of crystalline material, which is modified by nickel in a percentage of 0.2%. - 8 _
  • the device allows radiation to be eliminated through a lead shield 0.25 mm thick.
  • the radiation dose is 50 m ⁇ .
  • the resulting radiation dose is measured by measuring the luminescence of the crystal defects under conditions similar to the 5 indicated in Example 4. With this, the noise signal is equal to 2.

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Molecular Biology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Crystals, And After-Treatments Of Crystals (AREA)
  • Conversion Of X-Rays Into Visible Images (AREA)
  • Luminescent Compositions (AREA)

Abstract

L'invention concerne une substance sensible au rayonnement ionisant composée de cristaux d'halogénure alcalin d'une structure de type NaCl, d'ions modifiés de nickel, gallium, indium, thallium et de palladium.
PCT/RU1993/000051 1993-02-22 1993-02-22 Substance sensible au rayonnement ionisant WO1994019706A1 (fr)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP51886194A JPH08507856A (ja) 1993-02-22 1993-02-22 電離放射線に対して敏感な材料
PCT/RU1993/000051 WO1994019706A1 (fr) 1993-02-22 1993-02-22 Substance sensible au rayonnement ionisant

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/RU1993/000051 WO1994019706A1 (fr) 1993-02-22 1993-02-22 Substance sensible au rayonnement ionisant

Publications (1)

Publication Number Publication Date
WO1994019706A1 true WO1994019706A1 (fr) 1994-09-01

Family

ID=20129761

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/RU1993/000051 WO1994019706A1 (fr) 1993-02-22 1993-02-22 Substance sensible au rayonnement ionisant

Country Status (2)

Country Link
JP (1) JPH08507856A (fr)
WO (1) WO1994019706A1 (fr)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2011157457A (ja) * 2010-01-29 2011-08-18 Chichibu Fuji Co Ltd 中性子線検出材料とその製造方法、および中性子線検出器

Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1221823A (en) * 1967-06-29 1971-02-10 Matsushita Electric Ind Co Ltd Thermoluminescent phosphor
SU361189A1 (ru) * 1970-12-28 1972-12-07 Л. С. Друскина , И. Шавер ЛЮМИНОФОР дл ТЕРМОЛЮМИНЕСЦЕНТНОЙ ДОЗИМЕТРИИ НА ОСНОВЕ ФТОРИСТОГО ЛИТИЯ
FR2245959A1 (en) * 1973-09-28 1975-04-25 Emi Ltd Thallium-doped alkali halide scintillator for detectors - for X-and gamma-radiation amount and direction
GB2026017A (en) * 1977-11-21 1980-01-30 Gen Electric Phosphor scintillator structure
DE3739397A1 (de) * 1986-11-21 1988-06-01 Bicron Corp Bohrloch-untersuchungsvorrichtung
US4954707A (en) * 1988-06-29 1990-09-04 Battelle Memorial Institute System for use with solid state dosimeter
US5003181A (en) * 1989-04-07 1991-03-26 Minnesota Mining And Manufacturing Company Method for recording and reproducing a radiation image, panel and phosphors for storing a radiation image

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1221823A (en) * 1967-06-29 1971-02-10 Matsushita Electric Ind Co Ltd Thermoluminescent phosphor
SU361189A1 (ru) * 1970-12-28 1972-12-07 Л. С. Друскина , И. Шавер ЛЮМИНОФОР дл ТЕРМОЛЮМИНЕСЦЕНТНОЙ ДОЗИМЕТРИИ НА ОСНОВЕ ФТОРИСТОГО ЛИТИЯ
FR2245959A1 (en) * 1973-09-28 1975-04-25 Emi Ltd Thallium-doped alkali halide scintillator for detectors - for X-and gamma-radiation amount and direction
GB2026017A (en) * 1977-11-21 1980-01-30 Gen Electric Phosphor scintillator structure
DE3739397A1 (de) * 1986-11-21 1988-06-01 Bicron Corp Bohrloch-untersuchungsvorrichtung
US4954707A (en) * 1988-06-29 1990-09-04 Battelle Memorial Institute System for use with solid state dosimeter
US5003181A (en) * 1989-04-07 1991-03-26 Minnesota Mining And Manufacturing Company Method for recording and reproducing a radiation image, panel and phosphors for storing a radiation image

Also Published As

Publication number Publication date
JPH08507856A (ja) 1996-08-20

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