WO1993001619A1 - Moisture relief for chip carriers - Google Patents

Moisture relief for chip carriers Download PDF

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Publication number
WO1993001619A1
WO1993001619A1 PCT/US1992/005580 US9205580W WO9301619A1 WO 1993001619 A1 WO1993001619 A1 WO 1993001619A1 US 9205580 W US9205580 W US 9205580W WO 9301619 A1 WO9301619 A1 WO 9301619A1
Authority
WO
WIPO (PCT)
Prior art keywords
substrate
integrated circuit
semiconductor die
circuit package
die
Prior art date
Application number
PCT/US1992/005580
Other languages
French (fr)
Inventor
Bruce J. Freyman
Frank J. Juskey
Barry M. Miles
Original Assignee
Motorola, Inc.
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Motorola, Inc. filed Critical Motorola, Inc.
Priority to JP5502327A priority Critical patent/JPH07500947A/en
Priority to EP9292915115A priority patent/EP0603198A4/en
Priority to KR1019940700055A priority patent/KR0134902B1/en
Publication of WO1993001619A1 publication Critical patent/WO1993001619A1/en

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    • H01L23/00—Details of semiconductor or other solid state devices
    • H01L23/564—Details not otherwise provided for, e.g. protection against moisture
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Definitions

  • This invention relates to printed circuit board chip carriers, and more particularly to overmolded and glob top chip carriers that allow for moisture relief.
  • Overmolded carriers such as the Over Molded Pad Array Carrier (OMPAC), the Over Molded Peripheral Chip Carrier (OMPCC), and the Over Molded Hn Grid Array (OMPGA) and their equivalent glob top printed circuit board chip carriers are susceptible to moisture during manufacturing.
  • OMPAC Over Molded Pad Array Carrier
  • OMPCC Over Molded Peripheral Chip Carrier
  • OMPGA Over Molded Hn Grid Array
  • the die attach adhesive is usually a hygroscopic material. Exposure of the package to solder reflow temperatures after the die attach adhesive absorbs moisture, causes the rapid expansion of the moisture into water vapor. This causes the die to delaminate from the substrate. Thus, the "popcorn" effect.
  • U.S. Patent No. 4,866,506 by Nambu et. al. discusses a flat plastic-sealed IC device and lead frame in a package that has an opening in the back surface of the package, allowing exposure to the atmosphere and the release of moisture when subjected to heat.
  • This package also known as the Quad Flat Pack (QFP)
  • QFP Quad Flat Pack
  • the QFP does not use a substrate or printed circuit board as in OMPAC, OMPCC, and OMPGA and their glob top equivalents; thus, a different solution is required.
  • the present invention provides a means for releasing moisture in a completely different structure.
  • An integrated circuit package comprises a semiconductor die having a top surface and a bottom surface, and a substrate for receiving the semiconductor die.
  • the substrate should have an aperture(s) below the semiconductor die.
  • An adhesive applied to the substrate allows for mounting the semiconductor die to the substrate. Then, an over molded encapsulant or a glob top for sealing the top surface of the semiconductor die is formed over the semiconductor die and portions of the substrate.
  • FIG. 1 is an exploded peripheral view of an overmolded chip carrier in accordance with the present invention.
  • FIG. 2 is an exploded peripheral view of a overmolded pad array carrier in accordance with the present invention.
  • FIG. 3 is a cut view of overmolded pin grid array in accordance with the present invention.
  • FIG. 4 is a cut view of a glob top pin grid array in accordance with the present invention.
  • FIG. 5. is a top plan view of a glob top peripheral chip carrier in accordance with the present invention.
  • FIG. 6 is an exploded peripheral view of a glob top pad array carrier in accordance with the present invention.
  • the chip carrier is an overmolded pad array carrier, an overmolded pin grid array, an overmolded peripheral chip carrier, or alternatively, a glob top pad array carrier, a glob top pin grid array, or a glob top peripheral chip carrier.
  • the present invention is applicable to any printed circuit board chip carrier having integrated circuits and an encapsulant such as an over mold or glob top.
  • a substrate 16 for receiving a semiconductor die 14 has printed circuitry 22 on the substrate 16.
  • a hole(s) or aperture(s) 18 is arranged and constructed so as to reside below the semiconductor die 14.
  • the hole 18 is preferably small enough (less than 0.8 mm diameter) not to alter the design of the solder connections on the bottom of the package.
  • a die attach adhesive 20 such as a bisphenol-epichlorhydrin based epoxy which is preferably filled with silver is applied in the die attach region.
  • the adhesive is preferably dispensed onto the substrate, although other means of applying the adhesive is within contemplation of the present invention.
  • the adhesive is cured by using heat.
  • the hole 18 is usually partially filled with the adhesive after curing.
  • an overmolded compound 12 is applied over the die and portions of the substrate 16 forming the overmolded peripheral chip carrier 10 shown in FIG. 1.
  • This overmolded pad array carrier 30 further includes solder pads 38 on the bottom portion of a substrate 36 for receiving a semiconductor die 34 that has printed circuitry (not shown).
  • a hole(s) or aperture(s) 42 is arranged and constructed so as to reside below the semiconductor die 34.
  • the hole 42 is preferably small enough Gess than 0.8 mm diameter) not to alter the design of a solder bumped pad array on the bottom of a package as shown.
  • a die attach adhesive 40 is applied either to the bottom of the die 34 or the top surface of the substrate 36.
  • the adhesive 40 is preferably dispensed or screened onto the substrate 36, although other means of applying the adhesive is within contemplation of the present invention.
  • an overmolded compound 32 is formed over the die and portions of the substrate 36.
  • FIG. 3 there is shown a cut view of an overmolded pin grid array (OMPGA) 50.
  • the OMPGA is formed essentially as described above in FIG. 2, with the addition of pins 51 protruding from the bottom of the package.
  • the OMPGA 50 comprises a substrate 56 having at least one aperture 55 residing below a semiconductor die 54.
  • the back plane of the die 54 is attached to the substrate 56 via an adhesive 58.
  • Some of the conductive runners 57 on the substrate 56 are coupled to the die 54 via a wirebond 53.
  • an overmold 52 is formed above the substrate and die.
  • FIG. 4 there is shown a cut view of an glob top pin grid array 60.
  • the device 60 is formed essentially as described above in FIG. 2, with the addition of pins 61 protruding from the bottom of the package and a glob top instead of an overmold.
  • the device 60 comprises a substrate 66 having at least one aperture 65 residing below a semiconductor die 64.
  • the back plane of the die 64 is attached to the substrate 66 via an adhesive 58.
  • Some of the conductive runners 67 on the substrate 66 are coupled to the die 64 via a wirebond 63.
  • an glob top 62 is formed above the substrate and die.
  • FIG. 5 there is shown a top plan view of an glob top peripheral chip carrier 70.
  • the device 70 is formed essentially as described above in FIG. 1, with a glob top instead of an overmold.
  • the device 70 comprises a substrate 76 having at least one aperture 75 residing below a semiconductor die 74.
  • the back plane of the die 74 is attached to the substrate 76 via an adhesive (not shown).
  • Some of the conductive runners 77 on the substrate 76 are coupled to the die 74 via a wirebond 73. Once the die is wirebonded, then a glob top 72 is formed above the substrate and die.
  • FIG. 6 there is shown an exploded peripheral view of an glob top pad array carrier 80.
  • the device 80 is formed essentially as described above in FIG. 2, with a glob top instead of an overmold.
  • the device 80 comprises a substrate 86 having at least one aperture 85 residing below a semiconductor die 84.
  • the substrate 86 further comprises several solder pads 81 on the bottom surface of the substrate 86.
  • the back plane of the die 84 is attached to the substrate 86 via an adhesive 88. Once the die is wirebonded, then a glob top 82 is formed above the substrate and die.

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  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Computer Hardware Design (AREA)
  • Power Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Die Bonding (AREA)
  • Structures Or Materials For Encapsulating Or Coating Semiconductor Devices Or Solid State Devices (AREA)

Abstract

An integrated circuit package (10) comprises a semiconductor die (14) having a top surface and a bottom surface, and a substrate (16) for receiving the semiconductor die. The substrate should have an aperture(s) (18) below the semiconductor die for providing moisture relief during temperature excursions. An adhesive (20) applied to the substrate allows for mounting the semiconductor die to the substrate. Then, the semicondcutor die is wirebonded to the substrate. Finally, an encapsulant (12) for sealing the top surface of the semiconductor die is formed over the semiconductor die and portions of the substrate.

Description

MOISTURE RELIEF FOR CHIP CARRIERS
TECHNICAL FIELD
This invention relates to printed circuit board chip carriers, and more particularly to overmolded and glob top chip carriers that allow for moisture relief.
BACKGROUND of he INVENTION
Overmolded carriers such as the Over Molded Pad Array Carrier (OMPAC), the Over Molded Peripheral Chip Carrier (OMPCC), and the Over Molded Hn Grid Array (OMPGA) and their equivalent glob top printed circuit board chip carriers are susceptible to moisture during manufacturing. These integrated circuit packages suffer from "popcorning" when subjected to heat. This problem is particularly noticeable in surface mount packages using printed circuit boards, which experience higher thermal and mechanical stresses due to the exposure of the entire package to solder reflow temperatures. Typically, these integrated circuit packages are baked prior to solder assembly to remove moisture. Moisture usually penetrates the over mold top or glob top, the substrate, the die or integrated circuit residing between the over mold top or glob top and the substrate, and especially the adhesive used to attach the die to the substrate. The die attach adhesive is usually a hygroscopic material. Exposure of the package to solder reflow temperatures after the die attach adhesive absorbs moisture, causes the rapid expansion of the moisture into water vapor. This causes the die to delaminate from the substrate. Thus, the "popcorn" effect.
U.S. Patent No. 4,866,506 by Nambu et. al. discusses a flat plastic-sealed IC device and lead frame in a package that has an opening in the back surface of the package, allowing exposure to the atmosphere and the release of moisture when subjected to heat. This package, also known as the Quad Flat Pack (QFP), is easily manufactured, but leaves the bottom surface of the lead frame exposed to the atmosphere. The QFP does not use a substrate or printed circuit board as in OMPAC, OMPCC, and OMPGA and their glob top equivalents; thus, a different solution is required. The present invention provides a means for releasing moisture in a completely different structure.
SUMMARY of the INVENTION
An integrated circuit package comprises a semiconductor die having a top surface and a bottom surface, and a substrate for receiving the semiconductor die. The substrate should have an aperture(s) below the semiconductor die. An adhesive applied to the substrate allows for mounting the semiconductor die to the substrate. Then, an over molded encapsulant or a glob top for sealing the top surface of the semiconductor die is formed over the semiconductor die and portions of the substrate.
BRIEF DESCRIPTION of the DRAWINGS
FIG. 1 is an exploded peripheral view of an overmolded chip carrier in accordance with the present invention.
FIG. 2 is an exploded peripheral view of a overmolded pad array carrier in accordance with the present invention. FIG. 3 is a cut view of overmolded pin grid array in accordance with the present invention.
FIG. 4 is a cut view of a glob top pin grid array in accordance with the present invention.
FIG. 5. is a top plan view of a glob top peripheral chip carrier in accordance with the present invention. FIG. 6 is an exploded peripheral view of a glob top pad array carrier in accordance with the present invention.
D___K_R_PTTON f _heP____-Ε__Riro Referring to FIG. 1, there is shown a chip carrier 10 in accordance with the present invention. Preferably, the chip carrier is an overmolded pad array carrier, an overmolded pin grid array, an overmolded peripheral chip carrier, or alternatively, a glob top pad array carrier, a glob top pin grid array, or a glob top peripheral chip carrier. Essentially, the present invention is applicable to any printed circuit board chip carrier having integrated circuits and an encapsulant such as an over mold or glob top. Typically, a substrate 16 for receiving a semiconductor die 14 has printed circuitry 22 on the substrate 16. A hole(s) or aperture(s) 18 is arranged and constructed so as to reside below the semiconductor die 14. The hole 18 is preferably small enough (less than 0.8 mm diameter) not to alter the design of the solder connections on the bottom of the package. Then a die attach adhesive 20 such as a bisphenol-epichlorhydrin based epoxy which is preferably filled with silver is applied in the die attach region. The adhesive is preferably dispensed onto the substrate, although other means of applying the adhesive is within contemplation of the present invention. Once the die 14 is attached to the substrate 16 (via the adhesive 20), the adhesive is cured by using heat. The hole 18 is usually partially filled with the adhesive after curing. The partially filled hole prevents mechanical damage to the die back plane, but allows water vapor to be expunged during temperature excursions such as during reflow soldering. After wire bonding, an overmolded compound 12 is applied over the die and portions of the substrate 16 forming the overmolded peripheral chip carrier 10 shown in FIG. 1.
Referring to FIG. 2, there is shown another overmolded chip carrier 30 in accordance with the present invention. This overmolded pad array carrier 30 further includes solder pads 38 on the bottom portion of a substrate 36 for receiving a semiconductor die 34 that has printed circuitry (not shown). A hole(s) or aperture(s) 42 is arranged and constructed so as to reside below the semiconductor die 34. The hole 42 is preferably small enough Gess than 0.8 mm diameter) not to alter the design of a solder bumped pad array on the bottom of a package as shown. Then a die attach adhesive 40 is applied either to the bottom of the die 34 or the top surface of the substrate 36. The adhesive 40 is preferably dispensed or screened onto the substrate 36, although other means of applying the adhesive is within contemplation of the present invention. Then an overmolded compound 32 is formed over the die and portions of the substrate 36. Referring to FIG. 3, there is shown a cut view of an overmolded pin grid array (OMPGA) 50. The OMPGA is formed essentially as described above in FIG. 2, with the addition of pins 51 protruding from the bottom of the package. The OMPGA 50 comprises a substrate 56 having at least one aperture 55 residing below a semiconductor die 54. The back plane of the die 54 is attached to the substrate 56 via an adhesive 58. Some of the conductive runners 57 on the substrate 56 are coupled to the die 54 via a wirebond 53. Once the die is wirebonded, then an overmold 52 is formed above the substrate and die. Referring to FIG. 4, there is shown a cut view of an glob top pin grid array 60. The device 60 is formed essentially as described above in FIG. 2, with the addition of pins 61 protruding from the bottom of the package and a glob top instead of an overmold. The device 60 comprises a substrate 66 having at least one aperture 65 residing below a semiconductor die 64. The back plane of the die 64 is attached to the substrate 66 via an adhesive 58. Some of the conductive runners 67 on the substrate 66 are coupled to the die 64 via a wirebond 63. Once the die is wirebonded, then an glob top 62 is formed above the substrate and die. Referring to FIG. 5, there is shown a top plan view of an glob top peripheral chip carrier 70. The device 70 is formed essentially as described above in FIG. 1, with a glob top instead of an overmold. The device 70 comprises a substrate 76 having at least one aperture 75 residing below a semiconductor die 74. The back plane of the die 74 is attached to the substrate 76 via an adhesive (not shown). Some of the conductive runners 77 on the substrate 76 are coupled to the die 74 via a wirebond 73. Once the die is wirebonded, then a glob top 72 is formed above the substrate and die.
Referring to FIG. 6, there is shown an exploded peripheral view of an glob top pad array carrier 80. The device 80 is formed essentially as described above in FIG. 2, with a glob top instead of an overmold. The device 80 comprises a substrate 86 having at least one aperture 85 residing below a semiconductor die 84. The substrate 86 further comprises several solder pads 81 on the bottom surface of the substrate 86. The back plane of the die 84 is attached to the substrate 86 via an adhesive 88. Once the die is wirebonded, then a glob top 82 is formed above the substrate and die.
We claim as our invention:

Claims

___________
1. .An integrated circuit package, comprising: a semiconductor die having a top surface and a bottom surface; a substrate for receiving said semiconductor die, said substrate having at least one aperture below said die; an adhesive applied to the substrate for mounting said semiconductor die to said substrate; at least one wirebond from said substrate to said semiconductor die; an over molded encapsulant for sealing the top surface of said semiconductor die.
2. The integrated circuit package of claim 1, wherein said integrated circuit package comprises an over-molded pad array carrier.
3. The integrated circuit package of claim 1, wherein said integrated circuit package comprises an over-molded pin grid array.
4. The integrated circuit package of claim 1, wherein said integrated circuit package comprises an over-molded peripheral chip carrier.
5. The integrated circuit package of claim 1, wherein said aperture(s) is less than 0.8 mm mils in diameter.
6. An integrated circuit package, comprising: a semiconductor die having a top surface and a bottom surface; a substrate for receiving said semiconductor die, said substrate having an aperture below said die; an adhesive applied to the substrate for mounting said semiconductor die to said substrate; at least one wirebond from said substrate to said semiconductor die; an glob top encapsulant for sealing the top surface of said semiconductor die.
7. The integrated circuit package of claim 7, wherein said integrated circuit package comprises an glob top pad array carrier.
8. The integrated circuit package of claim 7, wherein said integrated circuit package comprises an glob top pin grid array.
9. The integrated circuit package of claim 7, wherein said integrated circuit package comprises an glob top peripheral chip carrier.
10. The integrated circuit package of claim 7, wherein said aperture(s) is less than 0.8 mm in diameter.
PCT/US1992/005580 1991-07-08 1992-07-02 Moisture relief for chip carriers WO1993001619A1 (en)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP5502327A JPH07500947A (en) 1991-07-08 1992-07-02 Moisture removal for chip carriers
EP9292915115A EP0603198A4 (en) 1991-07-08 1992-07-02 Moisture relief for chip carriers.
KR1019940700055A KR0134902B1 (en) 1991-07-08 1992-07-02 Moisture relief for chip carriers

Applications Claiming Priority (2)

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US72666091A 1991-07-08 1991-07-08
US726,660 1991-07-08

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JP (1) JPH07500947A (en)
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EP0603198A1 (en) 1994-06-29
EP0603198A4 (en) 1994-08-17
JPH07500947A (en) 1995-01-26
US5296738A (en) 1994-03-22
KR0134902B1 (en) 1998-04-20

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