WO1990012310A1 - Procede et appareil servant a determiner la repartition granulometrique et/ou morphologique de particules - Google Patents

Procede et appareil servant a determiner la repartition granulometrique et/ou morphologique de particules Download PDF

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Publication number
WO1990012310A1
WO1990012310A1 PCT/FI1990/000092 FI9000092W WO9012310A1 WO 1990012310 A1 WO1990012310 A1 WO 1990012310A1 FI 9000092 W FI9000092 W FI 9000092W WO 9012310 A1 WO9012310 A1 WO 9012310A1
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WO
WIPO (PCT)
Prior art keywords
chip
light
chips
transport surface
particle
Prior art date
Application number
PCT/FI1990/000092
Other languages
English (en)
Inventor
Tom Fredrik NÄSE
Yrjö Rainer VUORISALO
Original Assignee
Oy Keskuslaboratorio Centrallaboratorium Ab
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Oy Keskuslaboratorio Centrallaboratorium Ab filed Critical Oy Keskuslaboratorio Centrallaboratorium Ab
Publication of WO1990012310A1 publication Critical patent/WO1990012310A1/fr

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
    • G01N33/46—Wood
    • G01N15/1433—
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume, or surface-area of porous materials
    • G01N15/10—Investigating individual particles
    • G01N15/14—Electro-optical investigation, e.g. flow cytometers
    • G01N2015/1497—Particle shape
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N2021/845—Objects on a conveyor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/86—Investigating moving sheets
    • G01N2021/8663—Paper, e.g. gloss, moisture content
    • G01N2021/8681—Paper fibre orientation

Definitions

  • the present invention concerns a procedure for determining the size and/or shape distribution of wood chips meant for pulp manufacturing, or simply chips, the particles being spread out on a substantially pla ⁇ nar transport base which transports the particles at a given velocity, the particles being illuminated from a given direction, and the light reflected by the parti ⁇ cles being detected in another direction.
  • the invention further concerns an apparatus for determining the size and/or shape distribution of wood chips meant for pulp manufacturing.
  • Various screening procedures are at present the most commonly employed classifying methods in clas ⁇ sification of wood chip raw material for use in making cellulose or mechanical pulp, that is of chips. In these procedures endeavours are to obtain an idea of the size distribution of the chips by using for in ⁇ stance superimposed screen plates with different-sized apertures or slits. Screening methods are however ex ⁇ ceedingly inaccurate because they furnish no exact in ⁇ formation on the dimensions of the particles: one only finds out with their aid that the particular particle fraction has passed through a screen plate aperture or slit of a certain size under certain circumstances.
  • an optical classify ⁇ ing method in which the particles are photographed with an optoelectric camera and the two-dimensional image thus obtained is processed in a computer system for determination of the size distribution of the chips.
  • uniform illumination is applied, either perpendicular or at an angle against the transport sur- face on which the chips to be measured have been spread.
  • the area of the chip and the shadow which it throws can be measured, whereby a coarse estimate is gained of the chip's dimension in the height direction on the transport surface.
  • the above-mentioned procedures of prior art are unable to give an accurate picture of the topo- graphy of the particles, e.g. of wood chip raw material particles which are going to be used in pulpmaking. Furthermore, it is not possible generally to distin ⁇ guish between the length and breadth of the chip par ⁇ ticle with the methods of prior art.
  • the shape of particles in chips to be used in pulpmaking is essentially an oblique trapezoid. Its es ⁇ sential dimensions are its length in the fibre direc ⁇ tion, its thickness and its breadth. The chip length gives an idea of how large a part of the wood fibres has been cut off in the defibrating process.
  • the thick ⁇ ness has significance regarding heat and matter trans ⁇ fer in the delignifying or pulping process.
  • the breadth is less significant regarding the bulk density of the chips.
  • the length in the fibre direction is not necessarily the largest di ⁇ mension of the particle; the present trend is towards chipping methods in which the dimension of the chip in the breadth direction is greater than the length in the fibre direction. Methods and apparatus of prior art yield no accurate enough picture of these quantities e.g. in view of controlling the delignifying or pulping process.
  • the object of the present invention is to eliminate the drawbacks presented in the foregoing. It is a particular object of the invention to provide a procedure for determining the size and/or shape distri- bution of wood chips meant to be used in pulp manufac ⁇ turing with substantially greater accuracy, ease and speed than before.
  • the object of the invention is to provide a procedure by which the size and/or shape dis ⁇ tribution of particles, their topside topography, their volume and/or underside topography, the fibre orienta ⁇ tion and the thickness of the chips can be determined in full detail and with any desired accuracy, and rapidly and easily.
  • the invention is based on the fundamental idea that the chips to be measured are illuminated with structured light from a certain direction, e.g. at an oblique angle above the transport surface, and the off ⁇ set of said structured light caused by the dimension of the chip in the height direction is detected in various directions, and the dimension of the chip in the height direction at the location of the respective line of light is determined on the basis of the offset.
  • the chip which is being measured it is illuminated with lineal light, and the offset of the light is detected at given inter- vals in time so that of the chip under measurement the desired number of offset determinations is obtained, at given intervals, while the chip is moving on the trans- port surface, for determination of the chip's shape at desired intervals and with desired accuracy.
  • any given chip may thus be illuminated and the band of light striking it detected, i.e., the lateral offset of e.g. lineal light caused by the height-direction dimension of the chip can be detected e.g. at intervals on the order of lO- 2 seconds, e.g. at linear intervals on the order of 0.1 to 1 mm.
  • the procedure yields of the height-direction dimension of the respective chip a fully accurate topographic image. Thereby the size and shape of the particles being measured can be determined in full detail and with any desired accura ⁇ cy, which affords a chance for completely unrestricted quality classification.
  • Structured light is here understood to mean lineal or square-configurated light, that is, the light source illuminates the chips with the aid of straight lines of light or of squares which are formed by straight lines of light.
  • the structured light may be directed on the particle to be measured from any direc ⁇ tion whatsoever, for instance at an oblique angle against the transport surface, for instance at right angles against the chip's direction of travel, with the light line of the structured light parallelling the particle's direction of travel or enclosing a right angle or an oblique angle with the chip's direction of travel.
  • the light line is directed at an oblique angle against the transport surface and at right angles against the chip's direction of travel.
  • the lateral offset of the structured, that is e.g. lineal, light is detected by viewing it from a different direction relative to the illuminating direc ⁇ tion, e.g. under an oblique or right angle against the chip illuminating direction, with the line advantage ⁇ ously and the detection obliquely or perpendicularly relative to the transport surface, i.e., from straight above the chip.
  • the chips are illu ⁇ minated advantageously at the same time or at different times from different directions with lineal light at an oblique angle from above the transport surface. This can be accomplished e.g. with the aid of two or more light sources which have been disposed to illuminate the chips in the way just described.
  • the image is advantageously formed into a line image, e.g. a dot matrix 50 to 500 times 50 to 500 dots.
  • the side lengths (11,12,13,14) of the chip can be determined from the dot matrix by determining the sides of the chip (the chip has substantially the shape of a rhomboid trapezoid) , by determining the slope co ⁇ efficients (dy/dx) of the chip sides relative to the transport direction, as a function of the line integral of the chip side, i.e., of the edge length, and by calculating the derivate d(dy/dx)/dh of this function, whereby the extreme value points of the function thus obtained represent the corners of the body, and the distance between them represents the side lengths.
  • the chips may be transported upon a substantially transparent transport surface and illuminated with structured, e.g. lineal light from under the transport surface; in that case the lateral offset of the lineal light caused by the height-direction dimension of the particle is detected from below the surface.
  • structured e.g. lineal light from under the transport surface; in that case the lateral offset of the lineal light caused by the height-direction dimension of the particle is detected from below the surface.
  • the size and shape of the chips can then be determined from either side, from above and from below, the chips can be defined altogether unambiguously and accurately with regard to their entire configuration.
  • the grain (or fibre) direction of wood chips can also be determined on the basis of their general shape, i.e., for instance on the basis of the oblique cut surfaces of chips with trapezoidal shape.
  • the fibre direction may also be determined on the basis of the measured grain structure of ⁇ the surface of the wood chips or the shape .of the illuminated figure produced by structured light.
  • the volume of the chips which are being meas ⁇ ured can be determined by calculation from the measured lateral offset of structured light, in particular when said offset is measured at several points of the par ⁇ ticle and/or on different sides of the particle, e.g. on the topside and underside.
  • For detector in the procedure of the invention may be used e.g. a matrix-type camera, (CCD) , or equiv ⁇ alent, or generally any kind of optoelectric camera or optoelectric recording device by which it is possible to create a signal characterizing the lateral offset of structured, e.g. lineal light caused by the height- direction dimension of the particle which is being measured.
  • CCD matrix-type camera
  • equiv ⁇ alent e.g. a matrix-type camera, (CCD) , or equiv ⁇ alent
  • optoelectric camera or optoelectric recording device by which it is possible to create a signal characterizing the lateral offset of structured, e.g. lineal light caused by the height- direction dimension of the particle which is being measured.
  • Such optoelectric cameras and devices are in themselves known in the art and their use shall not be described in greater detail in this connection.
  • a conventional computer advantageously a computer capable of parallel processing (a tranputer) on account of the major data quantity that has to be processed.
  • a tranputer a computer capable of parallel processing
  • Fig. 1 presents a chip on a transport surface and approaching a lineal line of light
  • Fig. 2 presents the chip of Fig. 1 as it has reached the lineal line of light
  • Fig. 3 presents in elevational view, and schematically, an apparatus according to the invention for implement ⁇ ing the procedure
  • Fig. 4 presents the transport surface belonging to the apparatus of Fig. 2 with a chip thereon, in top view
  • Fig. 5 presents schematically the apparatus od another embodiment of the invention in elevational view
  • Fig. 6 presents a dot matrix image of a wood chip, produced with the procedure and apparatus of the inven ⁇ tion
  • Fig. 7 presents the chip side directions de ⁇ termined from Fig. 6 and their derivates.
  • a wood chip 10 intended for pulp manufacturing has been disposed on a transport surface 1, that is, on a conventional belt conveyor, while this conveyor is travelling in the direction of arrow 13.
  • the transport base is illuminated obliquely from the direction in which the particle arrives, and from above the transport base, with a lineal light source which causes a line of light 11 to run across the transport base at right angles against the transport direction.
  • the particle 10 has a certain dimension in the height direction, i.e., the top face of the particle rises to a height greater than that of the top surface of the transport base.
  • the particle 10 is illuminated with lineal light at an oblique angle with reference to the transport surface 1 and from above it, as described in the foregoing.
  • the height-direction dimension of the particle has given rise to an offset a of the lineal light, that is of the line of light 11, at the location of the chip, in other words, the line 11 has been drawn to indicate the location where the lineal light would strike if there were no particle upon the surface 1, and the site of incidence 12 of the lineal light upon the particle, that is the line of light 12, has a cer ⁇ tain phase shift a relative to the line of light 11.
  • the offset a is determin ⁇ ed with the aid of a detector which forms a signal cor ⁇ responding to the offset, and the dimension in the height direction of the particle is determined on the basis of said offset, e.g. with the aid of a calculat- ing means 4, such as a computer, on the basis of the illumination angle and of the detection angle.
  • the line of light may in this context also be understood to mean one edge of a light band with finite width.
  • Fig. 3 is seen a schematic picture of the apparatus of the invention.
  • the apparatus comprises a transport surface l, which is substantially horizontal and planar and has been arranged to transport the par ⁇ ticle 10 placed thereupon, with a given velocity.
  • a light source 2 which has been arranged to illuminate the chips with structured, i.e., lineal light from a given direction, i.e., at an oblique angle from the direction in which the particle arrives and from above the transport sur ⁇ face.
  • the apparatus further includes a detector 3, which has been placed above the transport surface 1, aimed perpendicularly against the transport surface at the site of that line of light which the light source 2 produces when striking the transport surface without obstruction.
  • the apparatus presented here comprises furthermore a second light source 2 " -- which has likewise been positioned above the transport surface, to illumi ⁇ nate the particles lineally under an oblique angle, now from the direction in which the particles leave, and symmetrically with reference to the light source 2 , i,e., in such manner that the lines of light of both light sources coincide.
  • the light sources may equally be asymmetrically positioned relative to each other and they may be aimed under different angles against the transport surface.
  • the detector 3 is a conventional matrix cam ⁇ era, and it has been disposed to produce signals which correspond to the line of light offsets observed in the direction of the detector, in both illuminating direc ⁇ tions.
  • the matrix camera is connected to a computer 4, which has been arranged to determine the size and/or shape of the particle 10 on the basis of the lines of light striking the detected particle and of their off ⁇ sets, that is on the basis of the signals from the de ⁇ tector.
  • a particle in the apparatus of Fig. 3 illuminated with light sources 2 and 2 ⁇ viewed from the direction of the detector 3.
  • the di en- sion in the height direction of the particle has caused lateral offsets of the lines of light in the incoming and off-going directions, respectively, of the parti ⁇ cle, that is in the directions of the light sources 2 and I 3 - .
  • the dimension of the particle can then be de ⁇ termined from the offsets detected at the site of the lines of light, with the aid of the calculating means 4.
  • the light source 2 may be any kind of light source emitting structured light, e.g. lineal light, such as a linear laser which has a given wavelength, or a lineal light source comprising one or several wave ⁇ lengths, established with the aid of lens optics through a slit.
  • lineal light such as a linear laser which has a given wavelength
  • a lineal light source comprising one or several wave ⁇ lengths, established with the aid of lens optics through a slit.
  • Fig. 5 is depicted an apparatus in which the transport surface 1 belonging thereto is transpar ⁇ ent.
  • the apparatus comprises one or several underside light sources 5,6 and one underside detector 7 with calculating means 4 , placed in similar manner as in Fig. 3 the light sources 2,2 a - and the detector 3 with calculating means 4, however underneath the transport surface.
  • the shape and size of the parti ⁇ cle are determinable similarly as in the foregoing, on the basis of lines of light directed obliquely through the transport surface and of the offsets of the lines of light caused by the height-direction dimension of the particle, as presented in the foregoing.
  • Fig. 6 In Fig. 6 is seen a line matrix image, pro ⁇ quizd with the apparatus of Figs 3-4, of a wood chip, simplified for perspicuity.
  • the margins of the wood chips are seen in the image as boundary lines between readings 0 and readings >0, entered as lines in the figure.
  • Matrix readings >0 indicate directly the height of the chip over the base, i.e., its topography.
  • the fibre orientation of a wood chip piece can be determined with the calculating means 4, directly as the chip dimension perpendicular against the side A, or as the dimension perpendicular relative to the waves of the chip by the wave spectrum method described earlier.
  • Fig. 7 presents, schematically, the previously described method of determining the edge length of the body.

Abstract

Dans le procédé décrit, qui sert à déterminer la répartition granulométrique et/ou morphologique de particules, des particules sont exposées au rayonnement d'une lumière structurée provenant d'une direction donnée et la déviation latérale de la lumière linéaire causée par la dimension dans le sens de la hauteur de la particule qui est mesurée est détectée et la dimension dans le sens de la hauteur de la particule est déterminée sur la base de cette déviation. Un appareil, qui sert à déterminer la répartition granulométrique et/ou morphologique de particules, comprend une surface de transport (1), une source lumineuse (2) qui est destinée à exposer les particules au rayonnement d'une lumière structurée provenant d'une direction donnée depuis le dessus de la surface de transport, un détecteur (3) qui est destiné à détecter la lumière réfléchie par la particule mesurée, dans une autre direction, et qui est destiné à produire un signal correspondant à la déviation de la lumière causée par la dimension de la particule dans le sens de la hauteur, ainsi qu'un organe de calcul (4) qui est destiné à déterminer la dimension de la particule dans le sens de la hauteur au moins en un point de la particule sur la base de la déviation de la lumière.
PCT/FI1990/000092 1989-04-05 1990-04-04 Procede et appareil servant a determiner la repartition granulometrique et/ou morphologique de particules WO1990012310A1 (fr)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FI891641 1989-04-05
FI891641A FI84761B (fi) 1989-04-05 1989-04-05 Foerfarande och anordning foer bestaemning av dimensionen pao traespaon.

Publications (1)

Publication Number Publication Date
WO1990012310A1 true WO1990012310A1 (fr) 1990-10-18

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Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2001084115A1 (fr) * 2000-04-28 2001-11-08 Norsk Hydro Asa Procede et systeme pour analyse automatique de particules
DE10260201A1 (de) * 2002-12-20 2004-07-01 Sick Ag Verfahren und Vorrichtung zur Erfassung von auf einem Fördermittel bewegten Objekten mittels eines optoelektronischen Sensors
DE202014100974U1 (de) * 2014-03-04 2015-06-08 Retsch Technology Gmbh Vorrichtung zur Bestimmung der Partikelgröße und/oder der Partikelform eines Partikelgemisches
CN105229464A (zh) * 2013-05-10 2016-01-06 凯米罗总公司 检测纸张中的游离纤维端部的方法及装置
WO2017216090A1 (fr) * 2016-06-14 2017-12-21 Basf Se Détermination de la forme tridimensionnelle de particules lignocellulosiques
CN109855559A (zh) * 2018-12-27 2019-06-07 成都市众智三维科技有限公司 一种全空间标定系统及方法
EP2796853B1 (fr) * 2013-04-25 2021-04-07 Fagus-Grecon Greten Gmbh & Co. Kg Procédé de détection qualitative et quantitative des fibres plus grosses dans un lit de particules et dispositif destiné à l'exécution du procédé

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FI20216300A1 (fi) * 2021-12-20 2023-06-21 Teknosavo Oy Menetelmä ja järjestely kuoren osuuden määrittämiseksi puuhakkeessa

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2012948A (en) * 1977-12-29 1979-08-01 Sumitomo Metal Ind Investigation of Particle Size Distribution
WO1985004249A1 (fr) * 1984-03-14 1985-09-26 Svenska Träforskningsinstitutet Procede de mesure granulometrique

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2012948A (en) * 1977-12-29 1979-08-01 Sumitomo Metal Ind Investigation of Particle Size Distribution
WO1985004249A1 (fr) * 1984-03-14 1985-09-26 Svenska Träforskningsinstitutet Procede de mesure granulometrique

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
TAPPI JOURNAL, Vol., July 1988, PETTERSON, OLSSON and LUNDQVIST: "On-Line Measurement of Wood Chip Size", See page 78 - page 81. *

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2001084115A1 (fr) * 2000-04-28 2001-11-08 Norsk Hydro Asa Procede et systeme pour analyse automatique de particules
US6822736B2 (en) 2000-04-28 2004-11-23 Norsk Hydro Asa Method and system for automatic analysis of particles
DE10260201A1 (de) * 2002-12-20 2004-07-01 Sick Ag Verfahren und Vorrichtung zur Erfassung von auf einem Fördermittel bewegten Objekten mittels eines optoelektronischen Sensors
US7199385B2 (en) 2002-12-20 2007-04-03 Sick Ag Method and an apparatus for the detection of objects moved on a conveyor means by means of an optoelectronic sensor
EP2796853B1 (fr) * 2013-04-25 2021-04-07 Fagus-Grecon Greten Gmbh & Co. Kg Procédé de détection qualitative et quantitative des fibres plus grosses dans un lit de particules et dispositif destiné à l'exécution du procédé
CN105229464A (zh) * 2013-05-10 2016-01-06 凯米罗总公司 检测纸张中的游离纤维端部的方法及装置
DE202014100974U1 (de) * 2014-03-04 2015-06-08 Retsch Technology Gmbh Vorrichtung zur Bestimmung der Partikelgröße und/oder der Partikelform eines Partikelgemisches
WO2017216090A1 (fr) * 2016-06-14 2017-12-21 Basf Se Détermination de la forme tridimensionnelle de particules lignocellulosiques
CN109855559A (zh) * 2018-12-27 2019-06-07 成都市众智三维科技有限公司 一种全空间标定系统及方法

Also Published As

Publication number Publication date
FI84761B (fi) 1991-09-30
FI891641A0 (fi) 1989-04-05
FI891641A (fi) 1990-10-06

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