USRE37124E1 - Ring oscillator using current mirror inverter stages - Google Patents

Ring oscillator using current mirror inverter stages Download PDF

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USRE37124E1
USRE37124E1 US09/096,693 US9669398A USRE37124E US RE37124 E1 USRE37124 E1 US RE37124E1 US 9669398 A US9669398 A US 9669398A US RE37124 E USRE37124 E US RE37124E
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transistor
coupled
stage
oscillator
input
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Trevor K. Monk
Andrew M. Hall
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STMicroelectronics lnc USA
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    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03KPULSE TECHNIQUE
    • H03K3/00Circuits for generating electric pulses; Monostable, bistable or multistable circuits
    • H03K3/02Generators characterised by the type of circuit or by the means used for producing pulses
    • H03K3/027Generators characterised by the type of circuit or by the means used for producing pulses by the use of logic circuits, with internal or external positive feedback
    • H03K3/03Astable circuits
    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03KPULSE TECHNIQUE
    • H03K3/00Circuits for generating electric pulses; Monostable, bistable or multistable circuits
    • H03K3/02Generators characterised by the type of circuit or by the means used for producing pulses
    • H03K3/023Generators characterised by the type of circuit or by the means used for producing pulses by the use of differential amplifiers or comparators, with internal or external positive feedback
    • H03K3/0231Astable circuits
    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03KPULSE TECHNIQUE
    • H03K3/00Circuits for generating electric pulses; Monostable, bistable or multistable circuits
    • H03K3/02Generators characterised by the type of circuit or by the means used for producing pulses
    • H03K3/027Generators characterised by the type of circuit or by the means used for producing pulses by the use of logic circuits, with internal or external positive feedback
    • H03K3/03Astable circuits
    • H03K3/0315Ring oscillators
    • H03K3/0322Ring oscillators with differential cells
    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03KPULSE TECHNIQUE
    • H03K3/00Circuits for generating electric pulses; Monostable, bistable or multistable circuits
    • H03K3/02Generators characterised by the type of circuit or by the means used for producing pulses
    • H03K3/353Generators characterised by the type of circuit or by the means used for producing pulses by the use, as active elements, of field-effect transistors with internal or external positive feedback
    • H03K3/354Astable circuits
    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03KPULSE TECHNIQUE
    • H03K5/00Manipulating of pulses not covered by one of the other main groups of this subclass
    • H03K5/00006Changing the frequency
    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03KPULSE TECHNIQUE
    • H03K5/00Manipulating of pulses not covered by one of the other main groups of this subclass
    • H03K5/13Arrangements having a single output and transforming input signals into pulses delivered at desired time intervals
    • H03K5/133Arrangements having a single output and transforming input signals into pulses delivered at desired time intervals using a chain of active delay devices
    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03KPULSE TECHNIQUE
    • H03K5/00Manipulating of pulses not covered by one of the other main groups of this subclass
    • H03K5/15Arrangements in which pulses are delivered at different times at several outputs, i.e. pulse distributors
    • H03K5/151Arrangements in which pulses are delivered at different times at several outputs, i.e. pulse distributors with two complementary outputs
    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03KPULSE TECHNIQUE
    • H03K5/00Manipulating of pulses not covered by one of the other main groups of this subclass
    • H03K2005/00013Delay, i.e. output pulse is delayed after input pulse and pulse length of output pulse is dependent on pulse length of input pulse
    • H03K2005/0015Layout of the delay element
    • H03K2005/00195Layout of the delay element using FET's
    • H03K2005/00202Layout of the delay element using FET's using current mirrors
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10STECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S331/00Oscillators
    • Y10S331/03Logic gate active element oscillator

Definitions

  • This invention relates to an oscillator and more particularly to a ring oscillator.
  • Advanced Phase-Locked Loops require stable oscillators which may be varied in frequency by a control signal.
  • oscillators integrated into a noisy VLSI environment often use a regulator to generate a quiet power supply. This usually has to be at an even lower voltage than the normal power supply.
  • CMOS Ring Oscillator with controlled frequency which describes a ring oscillator using CMOS transistors and is designed to give an almost sinusoidal output. This design suffers from stability problems outside a narrow range of frequencies. In particular, as the frequency increases, the amplitude decreases and it becomes difficult to convert the signal to CMOS levels.
  • a ring oscillator comprising a plurality of oscillator stages, each stage comprising a first and second transistors.
  • the first transistor has a controllable path connected between an output node and a reference voltage and a control node acting as an input node to the stage.
  • the second transistor has a controllable path connected between the output node and the reference voltage and a control node connected to the output node.
  • the gain of each stage is selectively determined by the ratio of the widths of the first and second transistors to produce an output signal having a sawtooth or trapezoidal waveform.
  • Each stage further comprise a respective current source which controls the speed of the stage and which is connected to the output node.
  • the input node of one stage is connected to the output node of a preceding stage to form a ring and the number of stages is selected so that there is a total phase shift of 360° around the ring at the frequency of operation.
  • the width of the first transistor can be set to m times the width of the second transistor where m>1 to determine the d.c. gain of the stage.
  • This ratio m determines the shape of the waveform output by the oscillator. The higher the value of m, the more the waveform moves away from a sinusoid. For a three stage oscillator, a ratio of m close to 2 produces a substantially sinusoidal output.
  • the present invention uses a ratio higher than 2 and preferably with a minimum value of 2.5. In practice the smallest value that can be selected to provide an appropriately shaped waveform will be selected.
  • the maximum value of m is limited by practical considerations and particularly layout considerations. A practical maximum value for m is likely to be about 10.
  • the first and second transistors can be n-channel field effect devices having a gate as the control node and the source-drain path as the controllable path. As the transistors are of the same type, process variations affect the transistors in the same manner. The maximum frequency of operation is limited only by the ratio of gain to gate capacitance.
  • the current source can comprise a p-channel transistor gated by a control voltage.
  • the first transistor is preferably operated in its saturation region.
  • the current sources of each stage can either be controlled by a common control signal or by respective different control signals.
  • the present oscillator can operate at voltages down to a level just above the threshold voltages of the transistors.
  • FIG. 1 is a circuit diagram of a low-voltage inverting gain stage in MOS technology
  • FIG. 1a is a circuit diagram of an implementation of a current source
  • FIG. 2 is a circuit diagram of a low-voltage inverting gain stage in bipolar technology
  • FIG. 3 is a diagram showing the transistor structure of a ring oscillator
  • FIG. 4 is an equivalent logical schematic for FIG. 3.
  • FIG. 5 shows typical waveforms for the 3-stage ring oscillator of FIGS. 3 and 4 .
  • FIG. 1 shows a low-voltage inverting gain stage in MOS technology.
  • the stage comprises first and second transistors T 1 , T 2 which have their drains connected together and their sources connected to ground.
  • the gate of the first transistor T 1 acts as the input S in for the stage and the gate of the second transistor T 2 acts as the output S out .
  • the gate of the second transistor T 2 is connected to its drain.
  • Each stage is controlled by a control current I which is generated by a current source 2 .
  • the current source 2 is connected between a supply voltage Vcc and the drains of the first and second transistors T 1 ,T 2 .
  • the common node between the current source 2 and the drains of the transistors T 1 and T 2 is denoted 4 . As shown in FIG.
  • the current source 2 can comprise a p-channel MOS field effect transistor T 3 with its source/drain path connected between the supply voltage Vcc and the node 4 and its gate connected to receive a control signal V which is taken with respect to the supply voltage Vcc.
  • V the supply voltage
  • the control current I this can be taken in practice as being derived from the control voltage V.
  • the stage also has capacitance C, the largest component of which is the gate capacitance of the transistors connected to the output S out .
  • the ratio of gains of the transistors T 1 ,T 2 is indicated as “m”.
  • the value of m controls the relative charge and discharge rates of the output mode S out , and thus determines the gain of the stage.
  • the speed of the stage (and thus the phaseshift at the frequency of operation) is readily controlled by varying the current I supplied by the current source 2 .
  • FIG. 2 shows the low-voltage inverting gain stage in bipolar technology. This also has excellent low-voltage operation characteristics and the speed can be controlled using a current source 2 in precisely the same way.
  • MOS circuits it should be understood that the same idea can easily be applied to bipolar technology.
  • the first and second transistors are denoted Ti′ and T 2 ′ and are connected in the same way as for FIG. 1, where gates correspond to bases, drains correspond to collectors and sources correspond to emitters.
  • FIG. 3 illustrates a 3-stage ring oscillator, the three stages being denoted S 1 ,S 2 ,S 3 .
  • Each stage S 1 ,S 2 ,S 3 is as illustrated in FIG. 1 .
  • FIG. 4 shows the ring oscillator in an equivalent logical schematic.
  • Each stage is a so-called single-ended stage, that is with a single input and a single output and is inverting.
  • For oscillation to occur it can be shown that there must be:
  • n number of stages
  • the gain m W(T 1 )/W(T 2 ), where W is the width of a transistor.
  • the parameter m can be made substantially independent of manufacturing process variables which would tend to affect the width of both transistors by corresponding amounts.
  • the required value for m, and hence the transistor sizes, is selected to satisfy small signal and large signal design requirements to provide a sawtooth or trapezoidal waveform.
  • a system designed to produce these waveforms produces a more stable output amplitude from the oscillator across all operating frequencies.
  • a more stable amplitude over a wide range of operating frequencies provides a signal which can be more reliably and easily converted to CMOS levels over a wide range of frequencies.
  • Node 1 , node 2 and node 3 are denoted N 1 , N 2 and N 3 in FIG. 4 .
  • the frequency of oscillation of the ring can be controlled by the control current I.
  • each stage has the same phase shift at the frequency of operation (equal to 180°/n for inverting stages) and receives a common control signal so that the control currents I are the same.
  • the phase shift can differ for each stage provided that the complete phase shift in the loop is 360° at the frequency of oscillation.
  • the control currents I for the individual stages can be independently varied.

Abstract

A ring oscillator having an odd number of single ended stages, each stage including two transistors connected as a current mirror. The stage provides for low-voltage performance and improved process tolerance characteristics.

Description

FIELD OF THE INVENTION
This invention relates to an oscillator and more particularly to a ring oscillator.
BACKGROUND OF THE INVENTION
New manufacturing processes and new applications are forcing power supplies to lower voltages (3.3 v now, with 2.4 v and 1.5 v being expected soon). Advanced Phase-Locked Loops require stable oscillators which may be varied in frequency by a control signal.
To help achieve frequency stability, oscillators integrated into a noisy VLSI environment often use a regulator to generate a quiet power supply. This usually has to be at an even lower voltage than the normal power supply.
There is thus a desire to provide oscillators which can work at these very low supply voltages and still produce high quality, high frequency output signals.
Reference is made to IBM Technical Disclosure Bulletin, Vol. 31, No. 2, July 1988, pages 154 to 156 “CMOS Ring Oscillator with controlled frequency” which describes a ring oscillator using CMOS transistors and is designed to give an almost sinusoidal output. This design suffers from stability problems outside a narrow range of frequencies. In particular, as the frequency increases, the amplitude decreases and it becomes difficult to convert the signal to CMOS levels.
SUMMARY OF THE INVENTION
According to the present invention there is provided a ring oscillator comprising a plurality of oscillator stages, each stage comprising a first and second transistors. The first transistor has a controllable path connected between an output node and a reference voltage and a control node acting as an input node to the stage. The second transistor has a controllable path connected between the output node and the reference voltage and a control node connected to the output node. The gain of each stage is selectively determined by the ratio of the widths of the first and second transistors to produce an output signal having a sawtooth or trapezoidal waveform. Each stage further comprise a respective current source which controls the speed of the stage and which is connected to the output node. The input node of one stage is connected to the output node of a preceding stage to form a ring and the number of stages is selected so that there is a total phase shift of 360° around the ring at the frequency of operation.
For transistors of the same length, the width of the first transistor can be set to m times the width of the second transistor where m>1 to determine the d.c. gain of the stage. This ratio m determines the shape of the waveform output by the oscillator. The higher the value of m, the more the waveform moves away from a sinusoid. For a three stage oscillator, a ratio of m close to 2 produces a substantially sinusoidal output. The present invention uses a ratio higher than 2 and preferably with a minimum value of 2.5. In practice the smallest value that can be selected to provide an appropriately shaped waveform will be selected. The maximum value of m is limited by practical considerations and particularly layout considerations. A practical maximum value for m is likely to be about 10.
The first and second transistors can be n-channel field effect devices having a gate as the control node and the source-drain path as the controllable path. As the transistors are of the same type, process variations affect the transistors in the same manner. The maximum frequency of operation is limited only by the ratio of gain to gate capacitance.
The current source can comprise a p-channel transistor gated by a control voltage.
The first transistor is preferably operated in its saturation region.
The current sources of each stage can either be controlled by a common control signal or by respective different control signals.
The present oscillator can operate at voltages down to a level just above the threshold voltages of the transistors.
For a better understanding of the present invention and to show how the same may be carried into effect, reference will now be made by way of example to the accompanying drawings.
BRIEF DESCRIPTION OF THE DRAWINGS
FIG. 1 is a circuit diagram of a low-voltage inverting gain stage in MOS technology;
FIG. 1a is a circuit diagram of an implementation of a current source;
FIG. 2 is a circuit diagram of a low-voltage inverting gain stage in bipolar technology;
FIG. 3 is a diagram showing the transistor structure of a ring oscillator;
FIG. 4 is an equivalent logical schematic for FIG. 3; and
FIG. 5 shows typical waveforms for the 3-stage ring oscillator of FIGS. 3 and 4.
DESCRIPTION OF THE PREFERRED EMBODIMENT
FIG. 1 shows a low-voltage inverting gain stage in MOS technology. The stage comprises first and second transistors T1, T2 which have their drains connected together and their sources connected to ground. The gate of the first transistor T1 acts as the input Sin for the stage and the gate of the second transistor T2 acts as the output Sout. The gate of the second transistor T2 is connected to its drain. Each stage is controlled by a control current I which is generated by a current source 2. The current source 2 is connected between a supply voltage Vcc and the drains of the first and second transistors T1,T2. The common node between the current source 2 and the drains of the transistors T1 and T2 is denoted 4. As shown in FIG. 1a, the current source 2 can comprise a p-channel MOS field effect transistor T3 with its source/drain path connected between the supply voltage Vcc and the node 4 and its gate connected to receive a control signal V which is taken with respect to the supply voltage Vcc. In the following discussion, it will readily be apparent that where reference is made to the control current I, this can be taken in practice as being derived from the control voltage V. The stage also has capacitance C, the largest component of which is the gate capacitance of the transistors connected to the output Sout.
The ratio of gains of the transistors T1,T2 is indicated as “m”. The value of m controls the relative charge and discharge rates of the output mode Sout, and thus determines the gain of the stage. The speed of the stage (and thus the phaseshift at the frequency of operation) is readily controlled by varying the current I supplied by the current source 2.
FIG. 2 shows the low-voltage inverting gain stage in bipolar technology. This also has excellent low-voltage operation characteristics and the speed can be controlled using a current source 2 in precisely the same way. Although the rest of this specification refers to MOS circuits, it should be understood that the same idea can easily be applied to bipolar technology.
In FIG. 2, the first and second transistors are denoted Ti′ and T2′ and are connected in the same way as for FIG. 1, where gates correspond to bases, drains correspond to collectors and sources correspond to emitters.
FIG. 3 illustrates a 3-stage ring oscillator, the three stages being denoted S1,S2,S3. Each stage S1,S2,S3 is as illustrated in FIG. 1. Of course, a similar ring oscillator could be produced using the stages of FIG. 2. FIG. 4 shows the ring oscillator in an equivalent logical schematic. Each stage is a so-called single-ended stage, that is with a single input and a single output and is inverting. As is well known in the design of ring oscillators, for oscillation to occur it can be shown that there must be:
(i) an odd number n of stages
(ii) minimum of three stages
(iii) if all stages are identical and have a gain ratio of “m”, then
m>1/cos(pi/n)
where
pi=3.14 . . .
n=number of stages
and
m=gain of each stage
For a 3-stage ring, the formula above gives m>2.
Where the transistors are of the same length, the gain m=W(T1)/W(T2), where W is the width of a transistor.
Thus, by use of an appropriate layout, the parameter m can be made substantially independent of manufacturing process variables which would tend to affect the width of both transistors by corresponding amounts.
The required value for m, and hence the transistor sizes, is selected to satisfy small signal and large signal design requirements to provide a sawtooth or trapezoidal waveform. A system designed to produce these waveforms produces a more stable output amplitude from the oscillator across all operating frequencies. A more stable amplitude over a wide range of operating frequencies provides a signal which can be more reliably and easily converted to CMOS levels over a wide range of frequencies.
FIG. 5 shows the waveforms for the 3-stage oscillator of FIG. 4 when m=3. Node 1, node 2 and node 3 are denoted N1, N2 and N3 in FIG. 4.
The frequency of oscillation of the ring can be controlled by the control current I. In a symmetrical arrangement, each stage has the same phase shift at the frequency of operation (equal to 180°/n for inverting stages) and receives a common control signal so that the control currents I are the same. However, the phase shift can differ for each stage provided that the complete phase shift in the loop is 360° at the frequency of oscillation. In this case, the control currents I for the individual stages can be independently varied.

Claims (25)

We claim:
1. A ring oscillator comprising:
a plurality of oscillator stages, each stage comprising first and second transistors, wherein the first transistor has a controllable path connected between an output node and a reference voltage and a control node acting as an input node to the stage and wherein the second transistor has a controllable path connected between the output node and the reference voltage and a control node connected to the output node, the gain of each stage being selectively determined by the ratio of the widths of the first and second transistors to produce an output signal having a sawtooth or trapezoidal waveform and each stage further comprising a respective current source which controls the speed of the stage and which is connected to said output node, wherein the input node of one stage is connected to the output node of a preceding stage to form said ring oscillator and wherein the number of stages is selected so that there is a total phase shift of 360° around the ring at the frequency of operation.
2. A ring oscillator according to claim 1, wherein the first and second transistors are n-channel field effect devices having a gate as the control node and a source/drain path as the controllable path.
3. A ring oscillator according to claim 1, wherein the first and second transistors are bipolar transistors in which the base is the control node and the controllable path extends between a collector and emitter.
4. A ring oscillator according to claim 1, wherein the current source comprises a p-channel MOS field effect transistor gated by a control voltage.
5. A ring oscillator according to claim 2 wherein the current source comprises a p-channel MOS field effect transistor gated by a control voltage.
6. A ring oscillator according to claim 3 wherein the current source comprises a p-channel MOS field effect transistor gated by a control voltage.
7. A ring oscillator having improved process tolerance characteristics, said ring oscillator comprising:
a plurality of oscillator stages, each stage having a gain, a speed, and an operation frequency wherein an input node of one stage is coupled to an output node of a preceding stage to form a ring, and wherein the number of stages is selected so there is a total phase shift of 360° around the ring at the operation frequency, each stage including:
a first transistor having a control node, and a path controlled by the control node, the path coupling a reference voltage to the output node of said stage, wherein the control node is coupled to the input node of said stage;
a second transistor having a control node coupled to the output node of said stage and a controllable path which couples the reference voltage to the output node,
wherein the gain of said stage is selectively determined by the ratio of widths of said first transistor and said second transistor, and wherein an output signal of the stage is at least one of a sawtooth waveform and a trapezoidal waveform; and
a current source, which controls the speed of the stage, coupled to the output node.
8. An oscillator for producing a periodic waveform, the oscillator comprising:
a first, a middle, and a last serially coupled stage, each stage having an input terminal and an output terminal and the output terminal of the last stage coupled to the input terminal of the first stage, at least one stage including:
an input transistor coupled between the output terminal and a reference voltage, and having a control terminal coupled to the input terminal,
a second transistor coupled between the output terminal and the reference voltage, and having a control terminal coupled to the output terminal,
a current source coupled to the output terminal, and
wherein a ratio of the gain of the input transistor to the second transistor is greater than 2.
9. The oscillator of claim 8 wherein the input and second transistors comprise respective MOS transistors and wherein a drain of the input transistor is coupled to the output terminal, a gate of the input transistor is coupled to the input terminal, and wherein both a drain and gate of the second transistor are coupled to the output terminal.
10. The oscillator of claim 9 wherein the input and second transistors have respective first and second widths, wherein the ratio of the first width to the second width is greater than 2.
11. The oscillator of claim 8 wherein the input and second transistors comprise respective bipolar transistors and wherein a collector of the input transistor is coupled to the output terminal, a base of the input transistor is coupled to the input terminal, and wherein both a collector and base of the second transistor are coupled to the output terminal.
12. The oscillator of claim 11 wherein the ratio of the gain of the input transistor to the second transistor is a ratio of an area of the input transistor to the area of the second transistor.
13. The oscillator of claim 8 wherein the ratio is at least 2.5.
14. The oscillator of claim 8 wherein the ratio is selected such that at least one of the stages produces a sawtooth waveform at its output terminal.
15. The oscillator of claim 8 wherein the ratio is selected such that at least one of the stages produces a trapezoidal waveform at its output terminal.
16. The oscillator of claim 8 wherein the current source comprises a PMOS transistor having a drain coupled to the output terminal and having a gate coupled to a control voltage.
17. The oscillator of claim 8 wherein the current source comprises a bipolar transistor having a base coupled to a control voltage.
18. The oscillator of claim 8 wherein the speed of the at least one stage is controlled by the current source.
19. An oscillator for producing a periodic waveform, the oscillator comprising:
at least three stages each having an input terminal and an output terminal, wherein the input terminal of each stage is coupled to the output terminal of another stage so as to constitute a ring, at least one stage including:
an input transistor coupled between the output terminal and a supply voltage, and having a control terminal coupled to the input terminal,
a second transistor coupled between the output terminal and the supply voltage, and having a control terminal coupled to the output terminal,
a current source coupled to the output terminal, and
wherein a gain of the at least one stage is approximately 2.
20. The oscillator of claim 19 wherein the input and second transistors comprise respective MOS transistors and wherein a drain of the input transistor is coupled to the output terminal, a gate of the input transistor is coupled to the input terminal, and wherein both a drain and gate of the second transistor are coupled to the output terminal.
21. The oscillator of claim 20 wherein the input and second transistors have respective first and second widths, wherein the ratio of the first width to the second width is greater than 2.
22. The oscillator of claim 19 wherein the input and second transistors comprise respective bipolar transistors and wherein a collector of the input transistor is coupled to the output terminal, a base of the input transistor is coupled to the input terminal, and wherein both a collector and base of the second transistor are coupled to the output terminal.
23. The oscillator of claim 22 wherein the ratio of area of the input transistor to the second transistor is greater than 2.
24. The oscillator of claim 19 wherein the gain is selected such that at least one of the stages produces a sawtooth waveform at its output terminal.
25. The oscillator of claim 19 wherein the gain is selected such that at least one of the stages produces a trapezoidal waveform at its output terminal.
US09/096,693 1993-04-30 1994-04-27 Ring oscillator using current mirror inverter stages Expired - Lifetime USRE37124E1 (en)

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GB939308944A GB9308944D0 (en) 1993-04-30 1993-04-30 Ring oscillator
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US08/360,699 US5525938A (en) 1993-04-30 1994-04-27 Ring oscillator using current mirror inverter stages
PCT/GB1994/000890 WO1994026025A1 (en) 1993-04-30 1994-04-27 Ring oscillator
US09/096,693 USRE37124E1 (en) 1993-04-30 1994-04-27 Ring oscillator using current mirror inverter stages

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US08/360,699 Ceased US5525938A (en) 1993-04-30 1994-04-27 Ring oscillator using current mirror inverter stages
US08/360,696 Expired - Lifetime US5635866A (en) 1993-04-30 1994-04-27 Frequency Doubler
US08/360,698 Expired - Lifetime US5635877A (en) 1993-04-30 1994-04-27 Low voltage high frequency ring oscillator for controling phase-shifted outputs
US08/636,851 Expired - Lifetime US5602514A (en) 1993-04-30 1996-04-23 Quadrature oscillator having a variable frequency

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US08/360,696 Expired - Lifetime US5635866A (en) 1993-04-30 1994-04-27 Frequency Doubler
US08/360,698 Expired - Lifetime US5635877A (en) 1993-04-30 1994-04-27 Low voltage high frequency ring oscillator for controling phase-shifted outputs
US08/636,851 Expired - Lifetime US5602514A (en) 1993-04-30 1996-04-23 Quadrature oscillator having a variable frequency

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US20100033226A1 (en) * 2008-07-18 2010-02-11 Tae Youn Kim Level shifter with output spike reduction
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Families Citing this family (42)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB9308944D0 (en) * 1993-04-30 1993-06-16 Inmos Ltd Ring oscillator
DE4322701C1 (en) * 1993-07-07 1994-08-18 Siemens Ag Circuit arrangement for a ring oscillator
JP3519143B2 (en) * 1994-11-17 2004-04-12 三菱電機株式会社 Current type inverter circuit, current type logic circuit, current type latch circuit, semiconductor integrated circuit, current type ring oscillator, voltage controlled oscillator, and PLL circuit
US5673008A (en) * 1995-05-18 1997-09-30 Matsushita Electric Industrial Co., Ltd. Voltage-controlled oscillator and PLL circuit exhibiting high-frequency band operation, linear frequency characteristics, and power-source variation immunity
US5568099A (en) * 1995-09-27 1996-10-22 Cirrus Logic, Inc. High frequency differential VCO with common biased clipper
US5877907A (en) * 1995-11-22 1999-03-02 Fujitsu Limited Apparatus and method for demodulating data signals read from a recording medium
FR2750268B1 (en) 1996-06-19 1998-07-31 Bull Sa METHOD FOR OBTAINING A VARIABLE FREQUENCY SIGNAL AND VARIABLE DELAY CELL SUITABLE FOR IMPLEMENTING THE METHOD
KR0177586B1 (en) * 1996-06-29 1999-04-01 김주용 Oscillator Output Generator
US5847182A (en) * 1997-03-19 1998-12-08 Korea Institue Of Science And Technology Fluorenyl substituted organosilanes and their preparation methods
US5990721A (en) * 1997-08-18 1999-11-23 Ncr Corporation High-speed synchronous clock generated by standing wave
DE19736857C1 (en) * 1997-08-23 1999-01-07 Philips Patentverwaltung Ring oscillator
US6385442B1 (en) * 1998-03-04 2002-05-07 Symbol Technologies, Inc. Multiphase receiver and oscillator
JP2001523435A (en) * 1998-03-04 2001-11-20 コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ Device having an oscillator circuit
US6091271A (en) * 1998-06-30 2000-07-18 Lucent Technologies, Inc. Frequency doubling method and apparatus
US6188291B1 (en) * 1999-06-30 2001-02-13 Lucent Technologies, Inc. Injection locked multi-phase signal generator
US6278334B1 (en) * 1999-11-29 2001-08-21 Arm Limited Voltage controlled oscillator with accelerating and decelerating circuits
ATE287139T1 (en) * 1999-12-13 2005-01-15 Broadcom Corp OSCILLATOR WITH MULTIPHASE COMPLEMENTARY OUTPUTS
US6348830B1 (en) 2000-05-08 2002-02-19 The Regents Of The University Of Michigan Subharmonic double-balanced mixer
US6339346B1 (en) * 2000-08-30 2002-01-15 United Memories, Inc. Low skew signal generation circuit
WO2002065632A1 (en) * 2001-02-13 2002-08-22 Telefonaktiebolaget Lm Ericsson (Publ.) A differential oscillator
US6657502B2 (en) * 2001-10-01 2003-12-02 Motorola, Inc. Multiphase voltage controlled oscillator
US6990164B2 (en) * 2001-10-01 2006-01-24 Freescale Semiconductor, Inc. Dual steered frequency synthesizer
US6900699B1 (en) 2001-11-14 2005-05-31 Berkana Wireless, Inc. Phase synchronous multiple LC tank oscillator
US7005930B1 (en) 2001-11-14 2006-02-28 Berkana Wireless, Inc. Synchronously coupled oscillator
US20040032300A1 (en) * 2002-08-19 2004-02-19 Koninklijke Philips Electronics N.V. Multi-phase oscillator and method therefor
US7302011B1 (en) 2002-10-16 2007-11-27 Rf Micro Devices, Inc. Quadrature frequency doubling system
KR100533626B1 (en) * 2003-04-01 2005-12-06 삼성전기주식회사 Quadrature signal generator with feedback type frequency doubler
KR101153911B1 (en) * 2003-08-12 2012-06-08 매그나칩 반도체 유한회사 Ring Oscillator
US7071789B2 (en) * 2004-04-21 2006-07-04 Texas Instruments Incorporated Cross coupled voltage controlled oscillator
FR2879374B1 (en) * 2004-12-15 2007-03-02 Commissariat Energie Atomique DOUBLE FREQUENCY DEVICE
US7221204B2 (en) * 2005-02-01 2007-05-22 Infineon Technologies Ag Duty cycle corrector
US7268635B2 (en) * 2005-04-29 2007-09-11 Seiko Epson Corporation Circuits for voltage-controlled ring oscillators and method of generating a periodic signal
WO2006126733A1 (en) 2005-05-27 2006-11-30 Matsushita Electric Industrial Co., Ltd. Coupled ring oscillator and method for laying out the same
WO2007063965A1 (en) 2005-12-02 2007-06-07 Matsushita Electric Industrial Co., Ltd. Multi-phase oscillator
JP2007188395A (en) * 2006-01-16 2007-07-26 Elpida Memory Inc Clock signal generation circuit
US7683725B2 (en) * 2007-08-14 2010-03-23 International Business Machines Corporation System for generating a multiple phase clock
US8369820B2 (en) 2007-09-05 2013-02-05 General Instrument Corporation Frequency multiplier device
JP4808197B2 (en) * 2007-09-06 2011-11-02 シャープ株式会社 Optical encoder and electronic device having the same
DE102007059231A1 (en) * 2007-12-07 2009-06-10 Polyic Gmbh & Co. Kg Electronic assembly with organic switching elements
US20100045389A1 (en) * 2008-08-20 2010-02-25 Pengfei Hu Ring oscillator
JP6415285B2 (en) * 2014-12-08 2018-10-31 セイコーNpc株式会社 Temperature voltage sensor
WO2022101901A1 (en) * 2020-11-11 2022-05-19 Ariel Scientific Innovations Ltd. Current mirror circuit for enhancement mode wide bandgap semiconductor

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3350659A (en) 1966-05-18 1967-10-31 Rca Corp Logic gate oscillator
US4210882A (en) 1977-09-02 1980-07-01 U.S. Philips Corporation Delay network comprising a chain of all-pass sections
US4368480A (en) 1978-04-05 1983-01-11 Massachusetts Institute Of Technology Multiplexing of chemically responsive FETs
US4408168A (en) 1979-11-29 1983-10-04 Fujitsu Limited Delay circuit oscillator having unequal on and off times
EP0187572A1 (en) 1984-12-04 1986-07-16 Thomson-Csf Logic voltage excursion limiter circuit, and circuit using such an excursion limiter
EP0407082A2 (en) 1989-07-07 1991-01-09 STMicroelectronics Limited Clock generation

Family Cites Families (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3448387A (en) * 1967-01-06 1969-06-03 Us Army Frequency doubler
US3382455A (en) * 1967-04-03 1968-05-07 Rca Corp Logic gate pulse generator
JPS5029270A (en) * 1973-07-18 1975-03-25
US4077010A (en) * 1976-12-08 1978-02-28 Motorola, Inc. Digital pulse doubler with 50 percent duty cycle
EP0101896B1 (en) * 1982-07-30 1988-05-18 Kabushiki Kaisha Toshiba Mos logic circuit
JPS5981914A (en) * 1982-11-02 1984-05-11 Nec Corp Digital frequency doubling circuit for clock signal
JPS61163714A (en) * 1985-01-14 1986-07-24 Nec Corp Frequency multiplying circuit using delay line
US4737732A (en) * 1987-02-24 1988-04-12 Motorola, Inc. Low voltage operational amplifier having a substantially full range output voltage
EP0282735B1 (en) * 1987-03-20 1992-05-06 Hitachi, Ltd. Clock signal supply system
US5103114A (en) * 1990-03-19 1992-04-07 Apple Computer, Inc. Circuit technique for creating predetermined duty cycle
DE69226627T2 (en) * 1992-05-15 1998-12-24 Sgs Thomson Microelectronics Generator for signals with higher frequency and non-overlapping phases
SE515076C2 (en) * 1992-07-01 2001-06-05 Ericsson Telefon Ab L M Multiplexer / demultiplexer circuit
JPH06152338A (en) * 1992-10-30 1994-05-31 Nec Ic Microcomput Syst Ltd Multiplying circuit
GB9308944D0 (en) * 1993-04-30 1993-06-16 Inmos Ltd Ring oscillator
US5399994A (en) * 1993-09-30 1995-03-21 Texas Instruments Incorporated Programmable voltage-controlled oscillator having control current generating and compensating circuits
US5475322A (en) * 1993-10-12 1995-12-12 Wang Laboratories, Inc. Clock frequency multiplying and squaring circuit and method

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3350659A (en) 1966-05-18 1967-10-31 Rca Corp Logic gate oscillator
US4210882A (en) 1977-09-02 1980-07-01 U.S. Philips Corporation Delay network comprising a chain of all-pass sections
US4368480A (en) 1978-04-05 1983-01-11 Massachusetts Institute Of Technology Multiplexing of chemically responsive FETs
US4408168A (en) 1979-11-29 1983-10-04 Fujitsu Limited Delay circuit oscillator having unequal on and off times
EP0187572A1 (en) 1984-12-04 1986-07-16 Thomson-Csf Logic voltage excursion limiter circuit, and circuit using such an excursion limiter
EP0407082A2 (en) 1989-07-07 1991-01-09 STMicroelectronics Limited Clock generation

Non-Patent Citations (6)

* Cited by examiner, † Cited by third party
Title
Bennett et al., "Sub-Nanosecond Bipolar LSI" 1st I.E.E. European Solid State Circuits Conference, London, GB, pp. 34-35, 1975.
IBM Technical Disclosure Bulletin, 31:(2), pp. 154-156, Jul. 1988.
IBM Technical Disclosure Bulletin, 32:(12), pp. 149-151, May 1990.
Kumar, U. and S.P. Suri, "A simple digital 2n frequency multiplier," Int. J. Electronics 48:(1), pp. 43-45, 1980.
McGahee, T., "Pulse-frequency doubler requires no adjustment," Electronics 48:(8), p. 149, Apr. 17, 1975.
Ware, et al., "THPM 14.1: a 200 MHz CMOS Phase-Locked Loop With Dual Phase Detectors," IEEE International Solid-State Circuits Conference, New York, USA, pp. 192-193 and 338, 1989.

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DE69426498T2 (en) 2001-05-03
US5635866A (en) 1997-06-03
EP0648388B1 (en) 1997-07-16
US5525938A (en) 1996-06-11
DE69421035D1 (en) 1999-11-11
US5635877A (en) 1997-06-03
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JPH07507914A (en) 1995-08-31
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DE69426498D1 (en) 2001-02-01
EP0648388A1 (en) 1995-04-19
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WO1994026026A1 (en) 1994-11-10
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US5602514A (en) 1997-02-11
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GB9308944D0 (en) 1993-06-16
EP0648387A1 (en) 1995-04-19
DE69404935D1 (en) 1997-09-18
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WO1994026025A1 (en) 1994-11-10
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JPH07507436A (en) 1995-08-10
EP0749207A3 (en) 1997-01-15

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