USD778745S1 - Optical measuring theodolite using light wave - Google Patents

Optical measuring theodolite using light wave Download PDF

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Publication number
USD778745S1
USD778745S1 US29/536,904 US201529536904F USD778745S US D778745 S1 USD778745 S1 US D778745S1 US 201529536904 F US201529536904 F US 201529536904F US D778745 S USD778745 S US D778745S
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United States
Prior art keywords
light wave
optical measuring
measuring theodolite
theodolite
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US29/536,904
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English (en)
Inventor
Mitsuo Ishii
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Topcon Corp
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Topcon Corp
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Assigned to KABUSHIKI KAISHA TOPCON reassignment KABUSHIKI KAISHA TOPCON ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: ISHII, MITSUO
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US29/536,904 2015-04-24 2015-08-20 Optical measuring theodolite using light wave Active USD778745S1 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2015-009304 2015-04-24
JPD2015-9304F JP1542104S (enrdf_load_stackoverflow) 2015-04-24 2015-04-24

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USD778745S1 true USD778745S1 (en) 2017-02-14

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JP (1) JP1542104S (enrdf_load_stackoverflow)

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD834969S1 (en) * 2016-12-21 2018-12-04 Topcon Corporation Light wave distance measuring theodolite
USD834968S1 (en) * 2016-12-21 2018-12-04 Topcon Corporation Light wave distance measuring theodolite
USD843860S1 (en) * 2016-11-09 2019-03-26 Leica Geosystems Ag Surveying instrument
USD844468S1 (en) * 2016-11-09 2019-04-02 Leica Geosystems Ag Case for surveying instrument
USD845794S1 (en) * 2016-11-09 2019-04-16 Leica Geosystems Ag Surveying instrument
USD971037S1 (en) * 2021-01-29 2022-11-29 Topcon Corporation Surveying instrument
USD1073496S1 (en) * 2022-07-22 2025-05-06 Topcon Corporation Surveying instrument

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD723953S1 (en) * 2013-10-07 2015-03-10 Kabushiki Kaisha Topcon Measuring device for measuring in three-dimension

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD723953S1 (en) * 2013-10-07 2015-03-10 Kabushiki Kaisha Topcon Measuring device for measuring in three-dimension

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD843860S1 (en) * 2016-11-09 2019-03-26 Leica Geosystems Ag Surveying instrument
USD844468S1 (en) * 2016-11-09 2019-04-02 Leica Geosystems Ag Case for surveying instrument
USD845794S1 (en) * 2016-11-09 2019-04-16 Leica Geosystems Ag Surveying instrument
USD873158S1 (en) * 2016-11-09 2020-01-21 Leica Geosystems Ag Surveying instrument
USD834969S1 (en) * 2016-12-21 2018-12-04 Topcon Corporation Light wave distance measuring theodolite
USD834968S1 (en) * 2016-12-21 2018-12-04 Topcon Corporation Light wave distance measuring theodolite
USD971037S1 (en) * 2021-01-29 2022-11-29 Topcon Corporation Surveying instrument
USD1073496S1 (en) * 2022-07-22 2025-05-06 Topcon Corporation Surveying instrument

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JP1542104S (enrdf_load_stackoverflow) 2019-01-15

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