USD768516S1 - Optical measuring theodolite using light wave - Google Patents

Optical measuring theodolite using light wave Download PDF

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Publication number
USD768516S1
USD768516S1 US29/529,899 US201529529899F USD768516S US D768516 S1 USD768516 S1 US D768516S1 US 201529529899 F US201529529899 F US 201529529899F US D768516 S USD768516 S US D768516S
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US
United States
Prior art keywords
light wave
optical measuring
theodolite
measuring theodolite
elevational view
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
US29/529,899
Inventor
Takeo Aoki
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Topcon KK
Original Assignee
Topcon KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority to JP2015-007625 priority Critical
Priority to JPD2015-7625F priority patent/JP1541004S/ja
Application filed by Topcon KK filed Critical Topcon KK
Assigned to KABUSHIKI KAISHA TOPCON reassignment KABUSHIKI KAISHA TOPCON ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: AOKI, TAKEO
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Publication of USD768516S1 publication Critical patent/USD768516S1/en
Application status is Active legal-status Critical
Anticipated expiration legal-status Critical

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FIG. 1 is a front elevational view of the optical measuring theodolite using light wave;

FIG. 2 is a rear elevational view thereof;

FIG. 3 is a left-side elevational view thereof;

FIG. 4 is a right-side elevational view thereof;

FIG. 5 is a top plan view thereof;

FIG. 6 is a bottom plan view thereof;

FIG. 7 is a front, right-side, top perspective view thereof; and,

FIG. 8 is a rear, left-side, top perspective view thereof.

The broken lines depict environmental subject matter only and form no part of the claimed design.

Claims (1)

    CLAIM
  1. The ornamental design for an optical measuring theodolite using light wave, as shown and described.
US29/529,899 2015-04-03 2015-06-11 Optical measuring theodolite using light wave Active USD768516S1 (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2015-007625 2015-04-03
JPD2015-7625F JP1541004S (en) 2015-04-03 2015-04-03

Publications (1)

Publication Number Publication Date
USD768516S1 true USD768516S1 (en) 2016-10-11

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Family Applications (1)

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US29/529,899 Active USD768516S1 (en) 2015-04-03 2015-06-11 Optical measuring theodolite using light wave

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US (1) USD768516S1 (en)
JP (1) JP1541004S (en)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD834969S1 (en) * 2016-12-21 2018-12-04 Topcon Corporation Light wave distance measuring theodolite
USD834968S1 (en) * 2016-12-21 2018-12-04 Topcon Corporation Light wave distance measuring theodolite
USD843860S1 (en) * 2016-11-09 2019-03-26 Leica Geosystems Ag Surveying instrument
USD844468S1 (en) * 2016-11-09 2019-04-02 Leica Geosystems Ag Case for surveying instrument
USD845794S1 (en) * 2016-11-09 2019-04-16 Leica Geosystems Ag Surveying instrument

Citations (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD409507S (en) * 1998-06-11 1999-05-11 Kabushiki Kaisha Topcon Electro-optical distance-measuring instrument
US6354010B1 (en) * 1998-04-23 2002-03-12 Asahi Kogaku Kogyo Kabushiki Kaisha Surveying instrument
US6492806B2 (en) * 2000-06-14 2002-12-10 Pentax Corporation Magnetic encoder and survey instrument having magnetic encoder
USD494074S1 (en) * 2003-09-12 2004-08-10 Kabushiki Kaisha Topcon Optical measuring theodolite
USD526223S1 (en) * 2004-10-19 2006-08-08 Kabushiki Kaisha Topcon Laser measuring instrument
USD526588S1 (en) * 2004-09-10 2006-08-15 Trimble Ab Surveying device
USD531921S1 (en) * 2005-02-17 2006-11-14 Sokkia Co., Ltd. Portion of electronic theodolite
USD558075S1 (en) * 2006-04-21 2007-12-25 Kabushiki Kaisha Topcon Laser transit
USD576062S1 (en) * 2006-06-29 2008-09-02 Pentax Corporation Total station
USD605959S1 (en) * 2008-07-23 2009-12-15 Leica Geosystems Ag Land surveying total station measuring device
US7764809B2 (en) * 2004-03-08 2010-07-27 Kabushiki Kaisha Topcon Surveying method and surveying instrument
US8264672B1 (en) * 2009-06-12 2012-09-11 Sprint Communications Company L.P. Visually determining Fresnel zone boundaries in a device
USD684069S1 (en) * 2011-09-22 2013-06-11 Kabushiki Kaisha Topcon Light wave distance measuring theodolite
USD684068S1 (en) * 2011-09-22 2013-06-11 Kabushiki Kaisha Topcon Light wave distance measuring theodolite
USD723953S1 (en) * 2013-10-07 2015-03-10 Kabushiki Kaisha Topcon Measuring device for measuring in three-dimension

Patent Citations (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6354010B1 (en) * 1998-04-23 2002-03-12 Asahi Kogaku Kogyo Kabushiki Kaisha Surveying instrument
USD409507S (en) * 1998-06-11 1999-05-11 Kabushiki Kaisha Topcon Electro-optical distance-measuring instrument
US6492806B2 (en) * 2000-06-14 2002-12-10 Pentax Corporation Magnetic encoder and survey instrument having magnetic encoder
USD494074S1 (en) * 2003-09-12 2004-08-10 Kabushiki Kaisha Topcon Optical measuring theodolite
US7764809B2 (en) * 2004-03-08 2010-07-27 Kabushiki Kaisha Topcon Surveying method and surveying instrument
USD526588S1 (en) * 2004-09-10 2006-08-15 Trimble Ab Surveying device
USD526223S1 (en) * 2004-10-19 2006-08-08 Kabushiki Kaisha Topcon Laser measuring instrument
USD531921S1 (en) * 2005-02-17 2006-11-14 Sokkia Co., Ltd. Portion of electronic theodolite
USD558075S1 (en) * 2006-04-21 2007-12-25 Kabushiki Kaisha Topcon Laser transit
USD576062S1 (en) * 2006-06-29 2008-09-02 Pentax Corporation Total station
USD605959S1 (en) * 2008-07-23 2009-12-15 Leica Geosystems Ag Land surveying total station measuring device
US8264672B1 (en) * 2009-06-12 2012-09-11 Sprint Communications Company L.P. Visually determining Fresnel zone boundaries in a device
USD684069S1 (en) * 2011-09-22 2013-06-11 Kabushiki Kaisha Topcon Light wave distance measuring theodolite
USD684068S1 (en) * 2011-09-22 2013-06-11 Kabushiki Kaisha Topcon Light wave distance measuring theodolite
USD723953S1 (en) * 2013-10-07 2015-03-10 Kabushiki Kaisha Topcon Measuring device for measuring in three-dimension

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD843860S1 (en) * 2016-11-09 2019-03-26 Leica Geosystems Ag Surveying instrument
USD844468S1 (en) * 2016-11-09 2019-04-02 Leica Geosystems Ag Case for surveying instrument
USD845794S1 (en) * 2016-11-09 2019-04-16 Leica Geosystems Ag Surveying instrument
USD834969S1 (en) * 2016-12-21 2018-12-04 Topcon Corporation Light wave distance measuring theodolite
USD834968S1 (en) * 2016-12-21 2018-12-04 Topcon Corporation Light wave distance measuring theodolite

Also Published As

Publication number Publication date
JP1541004S (en) 2015-12-28

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