USD781730S1 - Optical measuring theodolite using light wave - Google Patents

Optical measuring theodolite using light wave Download PDF

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Publication number
USD781730S1
USD781730S1 US29/544,296 US201529544296F USD781730S US D781730 S1 USD781730 S1 US D781730S1 US 201529544296 F US201529544296 F US 201529544296F US D781730 S USD781730 S US D781730S
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United States
Prior art keywords
light wave
optical measuring
measuring theodolite
theodolite
view
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US29/544,296
Inventor
Mitsuo Ishii
Satoshi Nakamura
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Topcon Corp
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Topcon Corp
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Assigned to KABUSHIKI KAISHA TOPCON reassignment KABUSHIKI KAISHA TOPCON ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: ISHII, MITSUO, NAKAMURA, SATOSHI
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FIG. 1 is a front elevational view of the optical measuring theodolite using light wave;
FIG. 2 is a rear elevational view thereof;
FIG. 3 is a left-side elevational view thereof;
FIG. 4 is a right-side elevational view thereof;
FIG. 5 is a top plan view thereof;
FIG. 6 is a bottom plan view thereof;
FIG. 7 is a front, right-side perspective view thereof; and,
FIG. 8 is a rear, left-side perspective view thereof.
The broken lines depict environmental subject matter only and form no part of the claimed design.

Claims (1)

    CLAIM
  1. The ornamental design for an optical measuring theodolite using light wave, as shown and described.
US29/544,296 2015-06-16 2015-11-02 Optical measuring theodolite using light wave Active USD781730S1 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JPD2015-13282F JP1541476S (en) 2015-06-16 2015-06-16
JP2015-013282 2015-06-16

Publications (1)

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USD781730S1 true USD781730S1 (en) 2017-03-21

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JP (1) JP1541476S (en)

Cited By (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD795720S1 (en) * 2016-01-18 2017-08-29 Topcon Corporation Surveying instrument
USD795721S1 (en) * 2016-01-27 2017-08-29 Topcon Corporation Surveying instrument
USD834968S1 (en) * 2016-12-21 2018-12-04 Topcon Corporation Light wave distance measuring theodolite
USD834969S1 (en) * 2016-12-21 2018-12-04 Topcon Corporation Light wave distance measuring theodolite
USD843860S1 (en) * 2016-11-09 2019-03-26 Leica Geosystems Ag Surveying instrument
USD844468S1 (en) * 2016-11-09 2019-04-02 Leica Geosystems Ag Case for surveying instrument
USD845794S1 (en) * 2016-11-09 2019-04-16 Leica Geosystems Ag Surveying instrument
US10324073B2 (en) 2015-01-16 2019-06-18 Industrial Scientific Corporation Modular gas monitoring system
USD859185S1 (en) * 2018-01-22 2019-09-10 Topcon Corporation Surveying instrument
USD901315S1 (en) * 2018-12-25 2020-11-10 Topcon Corporation Surveying instrument
USD962797S1 (en) * 2020-01-17 2022-09-06 Topcon Corporation Surveying instrument
USD980734S1 (en) 2016-01-15 2023-03-14 Industrial Scientific Corporation Gas monitoring device
USD993257S1 (en) * 2018-02-19 2023-07-25 AI Incorporated Display screen with user inputs
USD998478S1 (en) * 2016-01-15 2023-09-12 Industrial Scientific Corporation Gas monitoring device

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD684068S1 (en) * 2011-09-22 2013-06-11 Kabushiki Kaisha Topcon Light wave distance measuring theodolite
USD684069S1 (en) * 2011-09-22 2013-06-11 Kabushiki Kaisha Topcon Light wave distance measuring theodolite
US8897482B2 (en) * 2008-02-29 2014-11-25 Trimble Ab Stereo photogrammetry from a single station using a surveying instrument with an eccentric camera
USD723953S1 (en) * 2013-10-07 2015-03-10 Kabushiki Kaisha Topcon Measuring device for measuring in three-dimension

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8897482B2 (en) * 2008-02-29 2014-11-25 Trimble Ab Stereo photogrammetry from a single station using a surveying instrument with an eccentric camera
USD684068S1 (en) * 2011-09-22 2013-06-11 Kabushiki Kaisha Topcon Light wave distance measuring theodolite
USD684069S1 (en) * 2011-09-22 2013-06-11 Kabushiki Kaisha Topcon Light wave distance measuring theodolite
USD723953S1 (en) * 2013-10-07 2015-03-10 Kabushiki Kaisha Topcon Measuring device for measuring in three-dimension

Cited By (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10324073B2 (en) 2015-01-16 2019-06-18 Industrial Scientific Corporation Modular gas monitoring system
US11408876B2 (en) 2015-01-16 2022-08-09 Industrial Scientific Corporation Modular gas monitoring system
USD980734S1 (en) 2016-01-15 2023-03-14 Industrial Scientific Corporation Gas monitoring device
USD998478S1 (en) * 2016-01-15 2023-09-12 Industrial Scientific Corporation Gas monitoring device
USD795720S1 (en) * 2016-01-18 2017-08-29 Topcon Corporation Surveying instrument
USD795721S1 (en) * 2016-01-27 2017-08-29 Topcon Corporation Surveying instrument
USD843860S1 (en) * 2016-11-09 2019-03-26 Leica Geosystems Ag Surveying instrument
USD844468S1 (en) * 2016-11-09 2019-04-02 Leica Geosystems Ag Case for surveying instrument
USD845794S1 (en) * 2016-11-09 2019-04-16 Leica Geosystems Ag Surveying instrument
USD873158S1 (en) * 2016-11-09 2020-01-21 Leica Geosystems Ag Surveying instrument
USD834968S1 (en) * 2016-12-21 2018-12-04 Topcon Corporation Light wave distance measuring theodolite
USD834969S1 (en) * 2016-12-21 2018-12-04 Topcon Corporation Light wave distance measuring theodolite
USD859185S1 (en) * 2018-01-22 2019-09-10 Topcon Corporation Surveying instrument
USD993257S1 (en) * 2018-02-19 2023-07-25 AI Incorporated Display screen with user inputs
USD901315S1 (en) * 2018-12-25 2020-11-10 Topcon Corporation Surveying instrument
USD962797S1 (en) * 2020-01-17 2022-09-06 Topcon Corporation Surveying instrument

Also Published As

Publication number Publication date
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