USD843860S1 - Surveying instrument - Google Patents

Surveying instrument Download PDF

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Publication number
USD843860S1
USD843860S1 US29/596,908 US201729596908F USD843860S US D843860 S1 USD843860 S1 US D843860S1 US 201729596908 F US201729596908 F US 201729596908F US D843860 S USD843860 S US D843860S
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US
United States
Prior art keywords
surveying instrument
view
surveying
instrument
elevation view
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
US29/596,908
Inventor
Matthias Wieser
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Leica Geosystems AG
Original Assignee
Leica Geosystems AG
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Leica Geosystems AG filed Critical Leica Geosystems AG
Priority to US29/596,908 priority Critical patent/USD843860S1/en
Assigned to LEICA GEOSYSTEMS AG reassignment LEICA GEOSYSTEMS AG ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: WIESER, MATTHIAS
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Publication of USD843860S1 publication Critical patent/USD843860S1/en
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This application is related to a U.S. design application Ser. No. 29/596,907 entitled “Surveying Instrument” that claims the same priority.
This application is related to a U.S. design application Ser. No. 29/596,928 entitled “Case for Surveying Instrument” that claims the same priority.
FIG. 1 is a right-front perspective view of a surveying instrument.
FIG. 2 is a right-rear perspective view of the surveying instrument.
FIG. 3 is a front elevation view of the surveying instrument.
FIG. 4 is a left elevation view of the surveying instrument.
FIG. 5 is a rear elevation view of the surveying instrument.
FIG. 6 is a right elevation view of the surveying instrument.
FIG. 7 is a top view of the surveying instrument; and,
FIG. 8 is a bottom view of the surveying instrument.
The broken lines depict portions of the surveying instrument that form no part of the claimed design.

Claims (1)

    CLAIM
  1. The ornamental design for a surveying instrument, as shown and described.
US29/596,908 2016-11-09 2017-03-13 Surveying instrument Active USD843860S1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
US29/596,908 USD843860S1 (en) 2016-11-09 2017-03-13 Surveying instrument

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
CH1316501 2016-11-09
LI1316501 2016-11-09
EM1316501 2016-11-09
US29/596,908 USD843860S1 (en) 2016-11-09 2017-03-13 Surveying instrument

Publications (1)

Publication Number Publication Date
USD843860S1 true USD843860S1 (en) 2019-03-26

Family

ID=65762790

Family Applications (1)

Application Number Title Priority Date Filing Date
US29/596,908 Active USD843860S1 (en) 2016-11-09 2017-03-13 Surveying instrument

Country Status (1)

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US (1) USD843860S1 (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD873158S1 (en) * 2016-11-09 2020-01-21 Leica Geosystems Ag Surveying instrument
USD906141S1 (en) * 2019-06-26 2020-12-29 Leica Geosystems Ag Surveying instrument
USD906846S1 (en) * 2019-06-07 2021-01-05 Leica Geosystems Ag Surveying instrument

Citations (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20070155069A1 (en) * 2005-12-09 2007-07-05 Junichi Sudou Laser level
USD581819S1 (en) * 2007-06-19 2008-12-02 Sokkia Co., Ltd. Automatic leveling laser marking instrument
USD638318S1 (en) * 2010-03-18 2011-05-24 Riegl Laser Measurement Systems Gmbh Laser scanner
USD642485S1 (en) * 2010-03-18 2011-08-02 Riegl Laser Measurement Systems Gmbh Laser scanner
USRE44112E1 (en) * 2009-09-18 2013-04-02 Riegl Laser Measurement Systems Gmbh Laser scanner
USRE44751E1 (en) * 2009-09-18 2014-02-11 Riegl Laser Measurement Systems Gmbh Laser scanner
USD705678S1 (en) * 2012-02-21 2014-05-27 Faro Technologies, Inc. Laser tracker
USD723398S1 (en) * 2013-08-06 2015-03-03 Kabushiki Kaisha Topcon Light wave distance measuring theodolite
USD766753S1 (en) * 2015-03-20 2016-09-20 Kabushiki Kaisha Topcon Optical measuring thedolite using light wave
USD766754S1 (en) * 2015-04-03 2016-09-20 Kabushiki Kaisha Topcon Optical measuring theodolite using light wave
USD768516S1 (en) * 2015-04-03 2016-10-11 Kabushiki Kaisha Topcon Optical measuring theodolite using light wave
USD777588S1 (en) * 2015-06-23 2017-01-31 Kabushiki Kaisha Topcon Optical measuring theodolite using light wave
USD778745S1 (en) * 2015-04-24 2017-02-14 Kabushiki Kaisha Topcon Optical measuring theodolite using light wave
USD781731S1 (en) * 2015-06-10 2017-03-21 Kabushiki Kaisha Topcon Optical measuring theodolite using light wave
USD781730S1 (en) * 2015-06-16 2017-03-21 Kabushiki Kaisha Topcon Optical measuring theodolite using light wave
USD787345S1 (en) * 2015-04-24 2017-05-23 Kabushiki Kaisha Topcon Light wave optical measuring theodolite

Patent Citations (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20070155069A1 (en) * 2005-12-09 2007-07-05 Junichi Sudou Laser level
USD581819S1 (en) * 2007-06-19 2008-12-02 Sokkia Co., Ltd. Automatic leveling laser marking instrument
USRE44112E1 (en) * 2009-09-18 2013-04-02 Riegl Laser Measurement Systems Gmbh Laser scanner
USRE44751E1 (en) * 2009-09-18 2014-02-11 Riegl Laser Measurement Systems Gmbh Laser scanner
USD638318S1 (en) * 2010-03-18 2011-05-24 Riegl Laser Measurement Systems Gmbh Laser scanner
USD642485S1 (en) * 2010-03-18 2011-08-02 Riegl Laser Measurement Systems Gmbh Laser scanner
USD705678S1 (en) * 2012-02-21 2014-05-27 Faro Technologies, Inc. Laser tracker
USD723398S1 (en) * 2013-08-06 2015-03-03 Kabushiki Kaisha Topcon Light wave distance measuring theodolite
USD766753S1 (en) * 2015-03-20 2016-09-20 Kabushiki Kaisha Topcon Optical measuring thedolite using light wave
USD766754S1 (en) * 2015-04-03 2016-09-20 Kabushiki Kaisha Topcon Optical measuring theodolite using light wave
USD768516S1 (en) * 2015-04-03 2016-10-11 Kabushiki Kaisha Topcon Optical measuring theodolite using light wave
USD778745S1 (en) * 2015-04-24 2017-02-14 Kabushiki Kaisha Topcon Optical measuring theodolite using light wave
USD787345S1 (en) * 2015-04-24 2017-05-23 Kabushiki Kaisha Topcon Light wave optical measuring theodolite
USD781731S1 (en) * 2015-06-10 2017-03-21 Kabushiki Kaisha Topcon Optical measuring theodolite using light wave
USD781730S1 (en) * 2015-06-16 2017-03-21 Kabushiki Kaisha Topcon Optical measuring theodolite using light wave
USD777588S1 (en) * 2015-06-23 2017-01-31 Kabushiki Kaisha Topcon Optical measuring theodolite using light wave

Non-Patent Citations (3)

* Cited by examiner, † Cited by third party
Title
https://aecscene.com/2016/11/the-leica-blk360-laser-scanner-autodesk-recap-mobile-app/ Posted Nov. 16, 2016 (Year: 2016). *
https://www.abtech.cc/en/produits/leica-blk-360/ Mar. 2017 (Year: 2017). *
https://www.linkedin.com/pulse/b1k360-leica-geosystems-reality-capture-new-level-matthias-wieser?articleId=6204557275005227008#comments-6204557275005227008&trk=prof-post Posted Nov. 16, 2016 (Year: 2016). *

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD873158S1 (en) * 2016-11-09 2020-01-21 Leica Geosystems Ag Surveying instrument
USD906846S1 (en) * 2019-06-07 2021-01-05 Leica Geosystems Ag Surveying instrument
USD906141S1 (en) * 2019-06-26 2020-12-29 Leica Geosystems Ag Surveying instrument

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