USD749968S1 - Electrical test lead - Google Patents

Electrical test lead Download PDF

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Publication number
USD749968S1
USD749968S1 US29/497,386 US201429497386F USD749968S US D749968 S1 USD749968 S1 US D749968S1 US 201429497386 F US201429497386 F US 201429497386F US D749968 S USD749968 S US D749968S
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United States
Prior art keywords
electrical test
test lead
lead
view
electrical
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
US29/497,386
Inventor
Wei Huang
Yurui Shen
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fluke Precision Measurement Ltd
Original Assignee
Danaher Shanghai Industrial Instrumentation Technologies R&D Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
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Application filed by Danaher Shanghai Industrial Instrumentation Technologies R&D Co Ltd filed Critical Danaher Shanghai Industrial Instrumentation Technologies R&D Co Ltd
Assigned to DANAHER (SHANGHAI) INDUSTRIAL INSTRUMENTATION TECHNOLOGIES R&D CO., LTD. reassignment DANAHER (SHANGHAI) INDUSTRIAL INSTRUMENTATION TECHNOLOGIES R&D CO., LTD. ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: HUANG, WEI, SHEN, YURUI
Priority to US29/551,777 priority Critical patent/USD772741S1/en
Application granted granted Critical
Publication of USD749968S1 publication Critical patent/USD749968S1/en
Assigned to SHANGHAI SHILU INSTRUMENTS CO., LTD. reassignment SHANGHAI SHILU INSTRUMENTS CO., LTD. ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: DANAHER (SHANGHAI) INDUSTRIAL INSTRUMENTATION TECHNOLOGIES R&D CO., LTD.
Assigned to SHANGHAI SHILU INSTRUMENT CO., LTD. reassignment SHANGHAI SHILU INSTRUMENT CO., LTD. ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: DANAHER (SHANGHAI) INDUSTRIAL INSTRUMENTATION TECHNOLOGIES R&D CO., LTD.
Assigned to FLUKE PRECISION MEASUREMENT LTD. reassignment FLUKE PRECISION MEASUREMENT LTD. ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: SHANGHAI SHILU INSTRUMENT CO., LTD.
Active legal-status Critical Current
Anticipated expiration legal-status Critical

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Description

FIG. 1 is a top front left isometric view of an electrical test lead showing our new design;
FIG. 2 is a top plan view thereof;
FIG. 3 is a bottom plan view thereof;
FIG. 4 is a rear elevation view thereof;
FIG. 5 is a front elevation view thereof;
FIG. 6 is an inverted right side elevation view thereof;
FIG. 7 is a left side elevation view thereof; and,
FIG. 8 is a top rear left isometric view thereof.

Claims (1)

    CLAIM
  1. The ornamental design for an electrical test lead, as shown and described.
US29/497,386 2014-01-24 2014-07-23 Electrical test lead Active USD749968S1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
US29/551,777 USD772741S1 (en) 2014-01-24 2016-01-15 Electrical test lead

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
CN201430020906 2014-01-24
CN201430020906 2014-01-24

Related Child Applications (1)

Application Number Title Priority Date Filing Date
US29/551,777 Continuation USD772741S1 (en) 2014-01-24 2016-01-15 Electrical test lead

Publications (1)

Publication Number Publication Date
USD749968S1 true USD749968S1 (en) 2016-02-23

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US29/497,386 Active USD749968S1 (en) 2014-01-24 2014-07-23 Electrical test lead
US29/551,777 Active USD772741S1 (en) 2014-01-24 2016-01-15 Electrical test lead

Family Applications After (1)

Application Number Title Priority Date Filing Date
US29/551,777 Active USD772741S1 (en) 2014-01-24 2016-01-15 Electrical test lead

Country Status (1)

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Cited By (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD764331S1 (en) * 2014-12-04 2016-08-23 Omron Corporation Probe pin
USD764330S1 (en) * 2014-12-04 2016-08-23 Omron Corporation Probe pin
USD764332S1 (en) * 2014-12-04 2016-08-23 Omron Corporation Probe pin
USD769749S1 (en) * 2014-12-19 2016-10-25 Omron Corporation Probe pin
USD769747S1 (en) * 2014-12-15 2016-10-25 Omron Corporation Probe pin
USD769754S1 (en) * 2015-09-15 2016-10-25 Omron Corporation Probe pin
USD769750S1 (en) * 2015-09-15 2016-10-25 Omron Corporation Probe pin
USD769751S1 (en) * 2014-12-15 2016-10-25 Omron Corporation Probe pin
USD769748S1 (en) * 2014-12-15 2016-10-25 Omron Corporation Probe pin
USD769752S1 (en) * 2014-12-15 2016-10-25 Omron Corporation Probe pin
USD769753S1 (en) * 2014-12-19 2016-10-25 Omron Corporation Probe pin
USD775984S1 (en) * 2015-03-04 2017-01-10 Omron Corporation Probe pin
USD776551S1 (en) * 2014-12-15 2017-01-17 Omron Corporation Probe pin
USD776552S1 (en) * 2014-12-15 2017-01-17 Omron Corporation Probe pin
USD810598S1 (en) * 2014-01-24 2018-02-20 Fluke Precision Measurement Ltd. Interactive test probe for battery tester
USD811911S1 (en) * 2015-11-11 2018-03-06 Fluke Corporation AC clamp accessory
USD1016642S1 (en) * 2022-03-17 2024-03-05 Fluke Corporation Test lead
USD1030526S1 (en) * 2022-03-18 2024-06-11 Therm-O-Disc, Incorporated Single probe sensor
USD1031467S1 (en) * 2022-03-18 2024-06-18 Therm-O-Disc, Incorporated Dual probe sensor

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD853871S1 (en) * 2018-03-22 2019-07-16 Lem Intellectual Property Sa Current measuring sensor
USD853870S1 (en) * 2018-03-22 2019-07-16 Lem Intellectual Property Sa Current measuring sensor

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5136234A (en) * 1990-10-04 1992-08-04 Hastings Fiber Glass Products, Inc. Digital high-voltage meter device
USD474415S1 (en) * 2002-07-16 2003-05-13 Snap-On Technologies, Inc. Test lead head
US20090267590A1 (en) * 2008-04-29 2009-10-29 International Business Machines Corporation Method of enabling triggering an oscilloscope
US20110309853A1 (en) * 2010-06-17 2011-12-22 Brymen Technology Corporation Sectional test probe assembly for electric meter
US20130320962A1 (en) * 2012-06-04 2013-12-05 Weidmueller Interface Gmbh & Co. Kg Measuring Instrument for Testing Voltage
US9030220B2 (en) * 2011-10-12 2015-05-12 Fluke Corporation Voltage tester having alternatively attachable or separable probes

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD750987S1 (en) * 2014-01-24 2016-03-08 Danaher (Shanghai) Industrial Instruments Technologies R&D Co., Ltd. Interactive test probe for battery tester

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5136234A (en) * 1990-10-04 1992-08-04 Hastings Fiber Glass Products, Inc. Digital high-voltage meter device
USD474415S1 (en) * 2002-07-16 2003-05-13 Snap-On Technologies, Inc. Test lead head
US20090267590A1 (en) * 2008-04-29 2009-10-29 International Business Machines Corporation Method of enabling triggering an oscilloscope
US20110309853A1 (en) * 2010-06-17 2011-12-22 Brymen Technology Corporation Sectional test probe assembly for electric meter
US9030220B2 (en) * 2011-10-12 2015-05-12 Fluke Corporation Voltage tester having alternatively attachable or separable probes
US20130320962A1 (en) * 2012-06-04 2013-12-05 Weidmueller Interface Gmbh & Co. Kg Measuring Instrument for Testing Voltage

Cited By (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD810598S1 (en) * 2014-01-24 2018-02-20 Fluke Precision Measurement Ltd. Interactive test probe for battery tester
USD764331S1 (en) * 2014-12-04 2016-08-23 Omron Corporation Probe pin
USD764330S1 (en) * 2014-12-04 2016-08-23 Omron Corporation Probe pin
USD764332S1 (en) * 2014-12-04 2016-08-23 Omron Corporation Probe pin
USD769752S1 (en) * 2014-12-15 2016-10-25 Omron Corporation Probe pin
USD769747S1 (en) * 2014-12-15 2016-10-25 Omron Corporation Probe pin
USD769751S1 (en) * 2014-12-15 2016-10-25 Omron Corporation Probe pin
USD769748S1 (en) * 2014-12-15 2016-10-25 Omron Corporation Probe pin
USD776552S1 (en) * 2014-12-15 2017-01-17 Omron Corporation Probe pin
USD776551S1 (en) * 2014-12-15 2017-01-17 Omron Corporation Probe pin
USD769749S1 (en) * 2014-12-19 2016-10-25 Omron Corporation Probe pin
USD769753S1 (en) * 2014-12-19 2016-10-25 Omron Corporation Probe pin
USD775984S1 (en) * 2015-03-04 2017-01-10 Omron Corporation Probe pin
USD769754S1 (en) * 2015-09-15 2016-10-25 Omron Corporation Probe pin
USD769750S1 (en) * 2015-09-15 2016-10-25 Omron Corporation Probe pin
USD811911S1 (en) * 2015-11-11 2018-03-06 Fluke Corporation AC clamp accessory
USD852660S1 (en) 2015-11-11 2019-07-02 Fluke Corporation AC clamp accessory
USD1016642S1 (en) * 2022-03-17 2024-03-05 Fluke Corporation Test lead
USD1030526S1 (en) * 2022-03-18 2024-06-11 Therm-O-Disc, Incorporated Single probe sensor
USD1031467S1 (en) * 2022-03-18 2024-06-18 Therm-O-Disc, Incorporated Dual probe sensor

Also Published As

Publication number Publication date
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