US9165834B2 - Integrated native device without a halo implanted channel region and method for its fabrication - Google Patents
Integrated native device without a halo implanted channel region and method for its fabrication Download PDFInfo
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- US9165834B2 US9165834B2 US12/660,618 US66061810A US9165834B2 US 9165834 B2 US9165834 B2 US 9165834B2 US 66061810 A US66061810 A US 66061810A US 9165834 B2 US9165834 B2 US 9165834B2
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- native
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- length
- native devices
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- 125000001475 halogen functional group Chemical group 0.000 title claims abstract description 48
- 238000004519 manufacturing process Methods 0.000 title description 10
- 238000000034 method Methods 0.000 title description 8
- 239000004065 semiconductor Substances 0.000 claims abstract description 30
- 239000000758 substrate Substances 0.000 claims abstract description 22
- 239000007943 implant Substances 0.000 claims abstract description 14
- 238000002513 implantation Methods 0.000 claims abstract description 7
- 230000015572 biosynthetic process Effects 0.000 claims abstract description 5
- 239000012535 impurity Substances 0.000 description 8
- 125000006850 spacer group Chemical group 0.000 description 7
- 239000004020 conductor Substances 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 230000002411 adverse Effects 0.000 description 1
- 230000010354 integration Effects 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000008707 rearrangement Effects 0.000 description 1
- 238000006467 substitution reaction Methods 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
- H01L21/77—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate
- H01L21/78—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices
- H01L21/82—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices to produce devices, e.g. integrated circuits, each consisting of a plurality of components
- H01L21/822—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices to produce devices, e.g. integrated circuits, each consisting of a plurality of components the substrate being a semiconductor, using silicon technology
- H01L21/8232—Field-effect technology
- H01L21/8234—MIS technology, i.e. integration processes of field effect transistors of the conductor-insulator-semiconductor type
- H01L21/823412—MIS technology, i.e. integration processes of field effect transistors of the conductor-insulator-semiconductor type with a particular manufacturing method of the channel structures, e.g. channel implants, halo or pocket implants, or channel materials
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/26—Bombardment with radiation
- H01L21/263—Bombardment with radiation with high-energy radiation
- H01L21/265—Bombardment with radiation with high-energy radiation producing ion implantation
- H01L21/26586—Bombardment with radiation with high-energy radiation producing ion implantation characterised by the angle between the ion beam and the crystal planes or the main crystal surface
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/02—Semiconductor bodies ; Multistep manufacturing processes therefor
- H01L29/06—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions
- H01L29/10—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions with semiconductor regions connected to an electrode not carrying current to be rectified, amplified or switched and such electrode being part of a semiconductor device which comprises three or more electrodes
- H01L29/107—Substrate region of field-effect devices
- H01L29/1075—Substrate region of field-effect devices of field-effect transistors
- H01L29/1079—Substrate region of field-effect devices of field-effect transistors with insulated gate
- H01L29/1083—Substrate region of field-effect devices of field-effect transistors with insulated gate with an inactive supplementary region, e.g. for preventing punch-through, improving capacity effect or leakage current
Definitions
- the present invention generally relates to the field of semiconductors. More particularly, the invention relates to the fabrication of native semiconductor devices.
- a native semiconductor device is a transistor ideally having a threshold voltage near zero volts. It can be desirable to provide native semiconductor devices along with non-native semiconductor devices.
- a non-native device can include halo implants in a channel region of the device. As channel lengths become smaller, the halo implants in the non-native device become more crucial, for example, to reduce short channel effects.
- a conventional native device can also include halo implants in a channel region of the device. At large channel lengths, halo implants can have little impact on the threshold voltage of the native device. However, as channel lengths become smaller, halo implants can undesirably cause roll-up of threshold voltage in the native device.
- FIG. 1 shows a cross-sectional view of exemplary integrated native and non-native devices, in accordance with one embodiment of the present invention.
- FIG. 2 shows a flowchart showing the steps taken to implement one embodiment of the present invention.
- FIG. 3A shows a cross-sectional view, which includes a portion of a wafer processed according to an embodiment of the invention, corresponding to an initial step in the flowchart in FIG. 2 .
- FIG. 3B shows a cross-sectional view, which includes a portion of a wafer processed according to an embodiment of the invention, corresponding to an intermediate step in the flowchart in FIG. 2 .
- FIG. 3C shows a cross-sectional view, which includes a portion of a wafer processed according to an embodiment of the invention, corresponding to an intermediate step in the flowchart in FIG. 2 .
- FIG. 3D shows a cross-sectional view, which includes a portion of a wafer processed according to an embodiment of the invention, corresponding to a final step in the flowchart in FIG. 2 .
- the present invention is directed to an integrated native device without a halo implanted channel region and method for its fabrication.
- the following description contains specific information pertaining to the implementation of the present invention.
- One skilled in the art will recognize that the present invention may be implemented in a manner different from that specifically discussed in the present application. Moreover, some of the specific details of the invention are not discussed in order to not obscure the invention. The specific details not described in the present application are within the knowledge of a person of ordinary skill in the art.
- FIG. 1 shows a cross-sectional view of exemplary integrated native and non-native devices, in accordance with one embodiment of the present invention.
- structure 100 includes native device 160 integrated with non-native device 162 .
- Native device 160 which can also be called native transistor 160 , is situated in native device region 104 of structure 100 and can comprise a logic core transistor, for example.
- Native device 160 includes substrate 101 , which comprises a semiconductor substrate, for example, a P-type semiconductor substrate.
- channel region 148 of native device 160 is disposed in substrate 101 and has a channel length between source/drain regions 152 .
- source/drain regions 152 can comprise lightly doped drain-source (LDD) regions in substrate 101 , and can have N-type conductivity.
- LDD lightly doped drain-source
- Native device 160 also includes insulative region 116 , conductive region 120 , and sidewall spacers 124 .
- Insulative region 116 is disposed over channel region 148 and conductive region 120 is disposed over insulative region 116 .
- sidewall spacers 124 are disposed on respective sidewalls of conductive region 120 .
- non-native device 162 which can also be called non-native transistor 162 , is situated in non-native device region 106 of structure 100 , which is separated from native device region 104 by intervening region 108 .
- Non-native device 162 is disposed perpendicular to (or substantially perpendicular to) native device 160 and includes substrate 101 and well region 110 .
- well region 110 can comprise a doped P-well formed in substrate 101 .
- well region 110 can be more heavily doped than substrate 101 .
- channel region 146 of non-native device 162 is disposed in well region 110 and has a channel length between source/drain regions 154 .
- source/drain regions 154 can comprise LDD regions regions formed in well region 110 , and can have N-type conductivity.
- Non-native device 162 also includes halo regions 142 and 144 formed in well region 110 and channel region 146 , which can comprise doped P regions and can be more heavily doped than well region 110 and substrate 101 .
- non-native device 162 includes insulative region 118 , conductive region 122 , and sidewall spacers 126 .
- Insulative region 118 is disposed over channel region 146 and conductive region 122 is disposed over insulative region 118 .
- sidewall spacers 126 are disposed on respective sidewalls of conductive region 122 .
- structure 100 includes additional elements, for example, elements of native device 160 and non-native device 162 , not shown in FIG. 1 for clarity. Furthermore, structure 100 can include a number of native devices 160 each formed perpendicular to (or substantially perpendicular to) a number of non-native devices 162 . Other features and advantages of structure 100 will be set forth with reference to the method of FIG. 2 and related FIGS. 3A-3D .
- FIG. 2 shows flowchart 200 describing a method for fabricating an integrated native device without a halo implanted channel region, according to one embodiment of the present invention.
- Certain details and features have been left out of flowchart 200 that are apparent to a person of ordinary skill in the art.
- a step may consist of one or more substeps or may involve specialized equipment or materials, as known in the art.
- Steps 270 through 276 indicated in flowchart 200 are sufficient to describe one embodiment of the present invention, however, other embodiments of the invention may utilize steps different from those shown in flowchart 200 .
- processing steps shown in flowchart 200 are performed on a portion of processed wafer, which, prior to step 270 , includes, among other things, a substrate with native and non-native device regions, and a well region, such as a P-well region, in the non-native device region.
- the processed wafer may also be referred to simply as a wafer or a semiconductor die or simply a die in the present application.
- structures 370 through 376 in FIGS. 3A through 3D show the result of performing steps 270 through 276 of flowchart 200 , respectively.
- structure 370 shows a semiconductor structure after processing step 270
- structure 372 shows structure 370 after the processing of step 272
- structure 374 shows structure 372 after the processing of step 274 , and so forth.
- step 270 of flowchart 200 comprises forming perpendicular native and non-native gate arrangements over a substrate in respective native and non-native device regions.
- Structure 370 of FIG. 3A shows a cross-sectional view of a structure including a substrate, after completion of step 270 of flowchart 200 in FIG. 2 .
- the front side surface of the wafer is indicated by arrow 302 .
- Structure 370 includes substrate 301 , respective native and non-native device regions 304 and 306 , intervening region 308 , well region 310 , insulative regions 316 and 318 , conductive regions 320 and 322 , and sidewall spacers 324 and 326 , which correspond respectively to substrate 101 , native and non-native device regions 104 and 106 , intervening region 108 , well region 110 , insulative regions 116 and 118 , conductive regions 120 and 122 , and sidewall spacers 124 and 126 , in FIG. 1 .
- native and non-native device regions 304 and 306 include respective native and non-native gate arrangements 312 and 314 .
- native and non-native gate arrangements 312 and 314 include respective insulative regions 316 and 318 , conductive regions 320 and 322 , and sidewall spacers 324 and 326 .
- native device arrangement 312 is formed perpendicular to non-native device region 314 . That is, native device arrangement 312 can extend laterally along an X-axis and non-native gate arrangement 314 can extend laterally along a Z-axis perpendicular to the X-axis, where X and Z-axes correspond to respective X and Z-axes in a Cartesian coordinate system.
- FIG. 3A also shows a Y-axis, which corresponds to a Y-axis in a Cartesian coordinate system.
- the relative orientation of native device arrangement 312 and non-native device region 314 is further shown in FIG. 3B .
- FIG. 3B shows line 3 A- 3 A, which can correspond to a cross-sectional view of native and non-native device regions in structure 370 in FIG. 3A .
- mask 328 is formed over front side surface 302 .
- mask 328 is disposed in native and non-native device regions 304 and 306 and includes openings 330 , 332 , 334 , and 336 .
- openings 330 and 332 are disposed adjacent respective sides of conductive material 320 in native device region 304 , and expose substrate 301 .
- openings 334 and 336 are disposed adjacent respective sides of conductive material 322 in non-native device region 306 , and expose well region 310 .
- openings 330 , 332 , 334 , and 336 can comprise openings for source/drain implants, which can form source/drain regions for native and non-native devices.
- mask 328 can comprise openings to form source/drain regions in both native and non-native device regions 304 and 306 in a shared implantation step.
- Openings 334 and 336 can also comprise openings for halo implants in non-native device region 306 .
- mask 328 can comprise openings to form both source/drain regions in native and non-native device regions 304 and 306 and halo regions in non-native device region 306 .
- the result of step 272 of flowchart 200 is illustrated by structure 372 in FIG. 3B .
- step 274 of flowchart 200 native and non-native device regions 304 and 306 are exposed to impurities directed perpendicular to non-native gate arrangement 314 to form halo regions in non-native device region 306 .
- impurities can be directed along heading 338 through opening 334 and along heading 340 through opening 336 of mask 328 to form respective halo regions 342 and 344 in non-native device region 306 , which can correspond to respective halo regions 142 and 144 in FIG. 1 .
- FIG. 1 As shown in FIG.
- heading 338 comprises component X 1 along X-axis and component Y 1 along Y-axis and heading 340 comprises component X 2 along X-axis and component Y 2 along Y-axis, such that, headings 338 and 340 are perpendicular to non-native gate arrangement 314 .
- halo regions 342 and 344 can be formed in well region 310 and in channel region 346 under non-native gate arrangement 314 in non-native device region 306 . It is noted that channel region 346 under non-native gate arrangement 314 and channel region 348 under native device gate arrangement 312 , in FIG. 3C , correspond respectively to channel regions 146 and 148 , in FIG. 1 .
- halo regions are notably not formed in channel region 348 under gate arrangement 312 in native device region 304 . More particularly, impurities directed along headings 338 and 340 are blocked from channel region 348 . For example, headings 338 and 340 are perpendicular to non-native gate arrangement 314 , such that, native gate arrangement 312 can block impurities from channel region 348 under native gate arrangement 312 . Consequently, despite implantation regions 342 / 344 being formed adjacent to native gate arrangement 312 as a result of halo implant formation in non-native device region 306 , halo implantation under native gate arrangement 312 is avoided in native device region 304 .
- halo regions can be formed in non-native device region 306 through openings 334 and 336 of mask 328 , while native device region 304 is substantially without halo regions under native arrangement 312 .
- the result of step 274 of flowchart 200 is illustrated by structure 374 in FIG. 3C .
- step 276 of flowchart 200 respective native and non-native device regions 304 and 306 are exposed to impurities to form source/drain regions 352 in native device region 304 , which can correspond to source/drain regions 152 in FIG. 1 , and to form source/drain regions 354 in non-native device region 306 , which can correspond to source/drain regions 154 in FIG. 1 .
- source/drain regions 352 and 354 can be formed by directing impurities along heading 350 , which can comprise a Y component along Y-axis, through openings 330 and 332 in native device region 304 and through openings 334 and 336 in non-native device region 306 .
- source/drain regions 352 and 354 can comprise LDD regions.
- the result of step 276 of flowchart 200 is illustrated by structure 376 in FIG. 3D .
- an integrated native device can be formed without halo implants formed in its channel region.
- the native device can be formed with a threshold voltage near zero volts and without threshold voltage roll-up, which can cause threshold voltage to rise when the channel length is less than approximately 0.5 um, particularly in the range between approximately 0.05 um and approximately 0.3 um, where conventional native devices can have considerable voltage roll-up.
- an integrated non-native device can be formed with halo regions in its channel region, which can, for example, reduce short channel effects.
- an embodiment of the invention can provide integrated native and non-native devices with desirable performance characteristics, which can be maintained for short channel lengths.
- a mask can comprise openings to form source/drain regions in both native and non-native device regions. Furthermore, the mask can form halo regions in the non-native device region. By exposing native and non-native device regions to impurities directed perpendicular to a non-native gate arrangement, the impurities can be blocked in the native device region while halo regions are formed through the mask openings in the non-native device region. As such, a single mask can be provided to form both source/drain regions and halo regions.
- an embodiment of the invention can provide integrated native and non-native devices in a highly integrated manufacturing process and at reduced cost.
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US12/660,618 US9165834B2 (en) | 2010-03-01 | 2010-03-01 | Integrated native device without a halo implanted channel region and method for its fabrication |
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US12/660,618 US9165834B2 (en) | 2010-03-01 | 2010-03-01 | Integrated native device without a halo implanted channel region and method for its fabrication |
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US9165834B2 true US9165834B2 (en) | 2015-10-20 |
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US9177802B2 (en) * | 2012-12-31 | 2015-11-03 | Texas Instruments Incorporated | High tilt angle plus twist drain extension implant for CHC lifetime improvement |
Citations (7)
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US6417550B1 (en) * | 1996-08-30 | 2002-07-09 | Altera Corporation | High voltage MOS devices with high gated-diode breakdown voltage and punch-through voltage |
US20040185595A1 (en) * | 2003-03-13 | 2004-09-23 | Won-Ho Lee | Method for fabricating complementary metal oxide semiconductor image sensor |
US6909639B2 (en) * | 2003-04-22 | 2005-06-21 | Nexflash Technologies, Inc. | Nonvolatile memory having bit line discharge, and method of operation thereof |
US20050233494A1 (en) * | 2004-03-31 | 2005-10-20 | Hong Hee J | Image sensor and method for fabricating the same |
US20060054965A1 (en) * | 2003-04-18 | 2006-03-16 | Sung-Ho Kim | Byte-operational nonvolatile semiconductor memory device |
US20090224290A1 (en) * | 2008-03-06 | 2009-09-10 | Kabushiki Kaisha Toshiba | Two-way Halo Implant |
US20100244150A1 (en) * | 2009-03-27 | 2010-09-30 | National Semiconductor Corporation | Configuration and fabrication of semiconductor structure in which source and drain extensions of field-effect transistor are defined with different dopants |
-
2010
- 2010-03-01 US US12/660,618 patent/US9165834B2/en active Active
Patent Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6417550B1 (en) * | 1996-08-30 | 2002-07-09 | Altera Corporation | High voltage MOS devices with high gated-diode breakdown voltage and punch-through voltage |
US20040185595A1 (en) * | 2003-03-13 | 2004-09-23 | Won-Ho Lee | Method for fabricating complementary metal oxide semiconductor image sensor |
US20060054965A1 (en) * | 2003-04-18 | 2006-03-16 | Sung-Ho Kim | Byte-operational nonvolatile semiconductor memory device |
US6909639B2 (en) * | 2003-04-22 | 2005-06-21 | Nexflash Technologies, Inc. | Nonvolatile memory having bit line discharge, and method of operation thereof |
US20050233494A1 (en) * | 2004-03-31 | 2005-10-20 | Hong Hee J | Image sensor and method for fabricating the same |
US20090224290A1 (en) * | 2008-03-06 | 2009-09-10 | Kabushiki Kaisha Toshiba | Two-way Halo Implant |
US20100244150A1 (en) * | 2009-03-27 | 2010-09-30 | National Semiconductor Corporation | Configuration and fabrication of semiconductor structure in which source and drain extensions of field-effect transistor are defined with different dopants |
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