US4834537A - Position encoding holographic spectrometer - Google Patents
Position encoding holographic spectrometer Download PDFInfo
- Publication number
- US4834537A US4834537A US07/136,681 US13668187A US4834537A US 4834537 A US4834537 A US 4834537A US 13668187 A US13668187 A US 13668187A US 4834537 A US4834537 A US 4834537A
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- beam components
- spectrometer
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- 230000003595 spectral effect Effects 0.000 claims abstract description 33
- 238000000034 method Methods 0.000 claims abstract description 11
- 230000007246 mechanism Effects 0.000 abstract description 37
- 238000001228 spectrum Methods 0.000 description 5
- 230000003287 optical effect Effects 0.000 description 4
- 239000000835 fiber Substances 0.000 description 2
- 230000004075 alteration Effects 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/28—Investigating the spectrum
- G01J3/45—Interferometric spectrometry
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
- G01S3/00—Direction-finders for determining the direction from which infrasonic, sonic, ultrasonic, or electromagnetic waves, or particle emission, not having a directional significance, are being received
- G01S3/78—Direction-finders for determining the direction from which infrasonic, sonic, ultrasonic, or electromagnetic waves, or particle emission, not having a directional significance, are being received using electromagnetic waves other than radio waves
- G01S3/782—Systems for determining direction or deviation from predetermined direction
- G01S3/783—Systems for determining direction or deviation from predetermined direction using amplitude comparison of signals derived from static detectors or detector systems
- G01S3/784—Systems for determining direction or deviation from predetermined direction using amplitude comparison of signals derived from static detectors or detector systems using a mosaic of detectors
Definitions
- the present invention relates to spectrometers and more particularly, to holographic spectrometers enabling the simultaneous determination of spatial and spectral information of a light source.
- Holographic spectrometers are well known in the art and are used to determined spectral information from radiant sources. These spectrometers determine the spectral content of the light contained in the source.
- a spectrometer that is used to determine spectral information from a light source is shown in FIG. 1.
- the spectrometer of FIG. 1 illustrates a light source (1) radiating a beam (2) which is projected into a beam splitter (3).
- the radiant beam (2) is split into two beam components (4) and (5).
- the beam components (4) and (5) are projected towards mirrors (6) and (7).
- the beams (4) and (5) are reflected from one mirror to the other mirror, as shown by the arrows in the drawing, and are directed back towards the beam splitter (3).
- the beam splitter (3) projects the reflected beam components (4) and (5) through a lens (8) which, in turn, projects the beams onto an interference plane (9).
- mirror (6) is positioned a desired distance behind the symetrical mirror position indicated by dash line (10) and virtual sources (11) and (12) are formed behind the mirror (6).
- This positioning enables the two beam components (4) and (5) to interfere with one another, causing an interference pattern, directed by the lens (8), to be projected onto the interference plane (9) for determining spectral information of the source by the application of fourier transform techniques to the measured interference pattern of the two beam components.
- the beam components are projected onto the interference plane, all spatial information about the source is lost. Only spectral information can be determined from the interference plane.
- This type of spectrometer only measures the spectral content of polychromatic extended scenes. Therefore, this art has the disadvantage that it can only determine spectral information.
- Dispersive spectrometer may be used with a position encoding device to determine two-dimensional spatial positioning of a light source.
- position encoding with a dispersive spectrometer requires complex fiber optic reformatting to accomplish the simultaneous determination of the two-dimensional spatial position and spectral content of the light source.
- the use of fiber optics with the dispersive spectrometer is not only complex but is very expensive.
- the present invention provides the art with a spectrometer having the capability to simultaneously measure high resolution spectral information and positional information for a wide field of view while having large optical throughput.
- the present invention also provides the art with a spectrometer having improved optical throughput and field of view. Further, the present invention enables simultaneous measuring of spectral and positional information for a wide two-dimensional field of view with large optical throughput by untilizing conventional optical elements.
- the new and improved spectrometer of the present invention includes a mechanism for splitting a source beam entering into the spectrometer into two beam components.
- a mechanism for focusing and centering the two beam components is positioned in the line of projection of the two beam components.
- a mechanism for reflecting the beam components is positioned in the line of projection of the beam components.
- a detector mechanism for detecting the beam components is positioned in the line of projection of the two beam components.
- a mechanism for determining spatial and spectral information of the beam source is associated with the detector mechanism.
- the method includes; passing the beam from the source into the spectrometer; splitting the beam into a pair of beam components; directing the pair of beam components through the mechanism for centering and focusing the beam components; directing the focused pair of beam components to the reflecting mechanism; reflecting the two beam components from the reflecting mechanism to the detector mechanism; transmitting information from the detector mechanism to the mechanism for determining spatial and spectral information; and determining the spectral and spatial information of the light source.
- FIG. 1 is a schematic view of a prior art spectrometer.
- FIG. 2 is a schematic view of a spectrometer in accordance with the present invention.
- FIG. 3 is a view of a pattern projected to the detector plane.
- the spectrometer generally includes a two-dimensional aperture stop (22) for enabling beam (24) from light source (26) to enter into the spectrometer (20).
- the spectrometer (20) further includes a mechanism (28) for splitting the beams into two components (30) and (32).
- Mechanisms (34) and (36), for centering and focusing the two beam components (30) and (32), are positioned in the line of projection of the beam components (30) and (32).
- Mechanisms (38) and (40), for reflecting the two beam components (30) and (32), are positioned in the line of projection of the two beam components (30) and (32).
- a detector mechanism (42) is positioned in the line of projection of the two beam components (30) and (32).
- a mechanism (44) for determining spatial and spectral information of the light source (26) is associated with the detector mechanism (42).
- the mechanism (28) for splitting the beam (24) into its two components (30) and (32) is a conventional beam splitter.
- the splitter is positioned at a desired distance from the aperture stop (22) in the spectrometer (20).
- the beam splitter is tilted and centered with respect to the beam (24) at a desired angle for projecting the beam components (30) and (32) along their desired path.
- Centering and focusing mechanisms (34) and (36) are generally either two positive lenses, or one positive lens and one negative lens.
- the spectrometer configuration displayed in FIG. 2 uses two positive lenses.
- Each lens (34) and (36) is positioned in the line of projection of one of the beam components (30) and (32).
- the lenses (34) and (36) are positioned such that they receive the beam components (30) and (32) and project the beam components (30) and (32) onto the reflecting mechanisms (38) and (40).
- the lenses (34) and (36) are positioned with respect to the beam splitter (28) such that they are at a desired orientation for excepting the beams coming from the beam splitter (28) and passing the beams back to the beam splitter (28).
- the combined afocal characteristics of the lenses (34) and (36) enables the beam components (30) and (32) to pass through the lenses (34) and (36) in one direction, having certain wavefront information characteristics, and then return through the lenses in the opposite directions having different wavefront information characteristics.
- the lenses (34) and (36) are positioned such that their focal points coincide at a point (57) between the reflecting mechanisms (38) and (40).
- the lenses (34) and (36) are separated by a path length equal to the sum of their focal lengths.
- the detector plane (42) is a distance from the lens (36) equal to the focal length of lens (36), and the detector plane also is a distance from the lens (34) equal to the focal length of lens (34).
- the actual beam paths traversed by beam component (30) and (32) are coincident, they are displaced slightly in FIG. 2 for ease of understanding.
- Reflecting mechanisms (38) and (40) are generally planar mirrors.
- the mirrors (38) and (40) are tilted and centered with respect to the line of projection of the beam components (30) and (32). Also the mirrors (38) and (40) are positioned such that the beam components (30) and (32) are reflected from one mirror to the other and back through the lens (34) or (36) which the beam components (30) and (32) did not originally pass through.
- the detector mechanism (42) is generally a two-dimensional detector array, as best seen in FIG. 3.
- the detector array (42) is positioned at a desired distance from the beam splitter (28) and in the line of projection of the beam components (30) and (32).
- the detector (42) is tilted and centered with respect to the line of projection of the beam components (30) and (32).
- the beam components (30) and (32) project concentric interference ring patterns (50) and (52) onto the detector array (42).
- the concentric ring patterns (50) and (52) have centers (54) and (56) and a plurality of rings surrounding the centers (54) and (56). The positioning of the centers (54) and (56) enables the mechanism (44) for determining spatial and spectral information to determine the positions of light sources (26). Also, from the number and amplitude of the individual rings in the concentric ring patterns (50) and (52) the spectral information of the light sources can be determined.
- the mechanism (44) for determining the spatial and spectral information of the beam source is associated with the detector array (42).
- the mechanism (44) being a conventional microprocessor, interprets information from the detector array (42) and determine the positions and spectra of the light sources (26).
- the intensity for a non-monochromatic point source is given by the following equation: ##EQU1##
- the spectrum is encoded spatialy in the detector plane by the Cos(Kr 2 ) transform.
- K-- is a constant related to the focal lengths of lenses (34) and (36)
- Path 1- refers to the path traversed by beam component (30)
- Path 2- refers to the path traversed by beam component (32)
- the focal plane intensity pattern is exemplified by Fresnel rings center about each source image.
- the centroid of the Fresnel pattern yields position, while the spatial frequencies of the diffraction rings yield the transform of the spectrum.
- the above described spectrometer generally functions in the following manner.
- the sources (26) project beam (24) from the sources (26).
- the beams are intercepted by the spectrometer (20) and pass through the aperture stop (22).
- Beams (24) are passed into the beam splitter (28) of the spectrometer (20).
- the beam splitter (28) splits the source beams (24) into two beam components (30) and (32).
- Beam component (30) is projected through lens (34) and transmitted to the mirror (38).
- the mirror (38) reflects beam (30) into mirror (40).
- the mirror (40) reflects beam component (30) through lens (36) in the opposite direction of beam component (32).
- Beam component (30) is projected from lens (36) and transmitted to the beam splitter (28).
- the beam splitter (28) projects beam component (30) into the detector array (42).
- Beam component (32) is projected from the beam splitter (28) through lens (36).
- Lens (36) transmitts beam component (32) to the mirror (40).
- the mirror (40) reflects beam component (32) into the mirror (38).
- the mirror (38) reflects beam component (32) through lens (34) which, in turn, transmitt beam component (32) to beam splitter (28).
- the beam splitter (28) projects beam component (32) towards the detector array (42).
- the detector array (42) measures the spatial intensity distribtion formed by the interference between the two beams (30) and (32).
- the measured intensity information is transmitted from the detector array (42) to the mechanism (44) for determining the spectra and locations of the point sources (26).
- the mechanism (44) by using the measured interference pattern of the beams, and the above equation, determines the position and spectra of point sources (26).
- the afocal lenses (34) and (36) are positioned such that their focal points coincide at a point (57) between the reflecting mechanisms (38) and (40).
- the lenses (34) and (36) are separated by a path length equal to the sum of their focal lengths.
- the locations of lenses (34) and (36) relative to the detector plane (42) are such that the path length from lens (34) to the detector plane is equal to the focal length of lens (34), and the path length from lens (36) to the detector plane (42) is equal to the focal length of lens (36).
- the beam components are directed through the lenses (34) and (36) to the mirrors (38) and (40) and then re-directed back through the other lens (34) or (36) to produce an interference pattern at the detector array (42) as described above.
- the present invention may be utilized for enabling the determination of simultaneous spectral and positional information from re-entry vehicles. Also the present invention may be utilized to simultaneous determine spectral and positional information from laser beam sources.
Abstract
Description
Claims (13)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US07/136,681 US4834537A (en) | 1987-12-22 | 1987-12-22 | Position encoding holographic spectrometer |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
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US07/136,681 US4834537A (en) | 1987-12-22 | 1987-12-22 | Position encoding holographic spectrometer |
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Publication Number | Publication Date |
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US4834537A true US4834537A (en) | 1989-05-30 |
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US07/136,681 Expired - Lifetime US4834537A (en) | 1987-12-22 | 1987-12-22 | Position encoding holographic spectrometer |
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Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
USH1972H1 (en) * | 1998-10-06 | 2001-07-03 | Nikon Corporation | Autofocus system using common path interferometry |
CN100562731C (en) * | 2008-02-01 | 2009-11-25 | 北京理工大学 | A kind of space reflection type optical remote sensor main mirror face deformation detecting method and system |
RU2616875C2 (en) * | 2015-05-21 | 2017-04-18 | Федеральное государственное казенное военное образовательное учреждение высшего профессионального образования "Военно-космическая академия имени А.Ф. Можайского" Министерства обороны Российской Федерации | Optoelectronic system for determining spectral-energy parameters and coordinates of infrared laser radiation source |
US11268860B2 (en) | 2020-07-24 | 2022-03-08 | Raytheon Company | Radiometric calibration of detector |
-
1987
- 1987-12-22 US US07/136,681 patent/US4834537A/en not_active Expired - Lifetime
Non-Patent Citations (4)
Title |
---|
Ballard, "Detecting Laser Illumination for Military Countermeasures", Laser Focus, pp. 72, 74, 76, 78, 80, 4/81. |
Ballard, Detecting Laser Illumination for Military Countermeasures , Laser Focus, pp. 72, 74, 76, 78, 80, 4/81. * |
Chakrabarti et al., "A New Inverted Shear Interferometer" J. Opt. (India), vol. 5, No. 4, pp. 80-87, 12/76. |
Chakrabarti et al., A New Inverted Shear Interferometer J. Opt. (India), vol. 5, No. 4, pp. 80 87, 12/76. * |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
USH1972H1 (en) * | 1998-10-06 | 2001-07-03 | Nikon Corporation | Autofocus system using common path interferometry |
CN100562731C (en) * | 2008-02-01 | 2009-11-25 | 北京理工大学 | A kind of space reflection type optical remote sensor main mirror face deformation detecting method and system |
RU2616875C2 (en) * | 2015-05-21 | 2017-04-18 | Федеральное государственное казенное военное образовательное учреждение высшего профессионального образования "Военно-космическая академия имени А.Ф. Можайского" Министерства обороны Российской Федерации | Optoelectronic system for determining spectral-energy parameters and coordinates of infrared laser radiation source |
US11268860B2 (en) | 2020-07-24 | 2022-03-08 | Raytheon Company | Radiometric calibration of detector |
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