US3902115A - Self-cleaning aperture tube for coulter study apparatus and electrolyte supply system therefor - Google Patents

Self-cleaning aperture tube for coulter study apparatus and electrolyte supply system therefor Download PDF

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Publication number
US3902115A
US3902115A US400986A US40098673A US3902115A US 3902115 A US3902115 A US 3902115A US 400986 A US400986 A US 400986A US 40098673 A US40098673 A US 40098673A US 3902115 A US3902115 A US 3902115A
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United States
Prior art keywords
aperture
tube
chamber
inlet chamber
suspension
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US400986A
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English (en)
Inventor
Walter R Hogg
Wallace H Coulter
Guenter Ginsberg
Oscar Proni
Thomas J Godin
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Coulter Electronics Inc
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Coulter Electronics Inc
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Application filed by Coulter Electronics Inc filed Critical Coulter Electronics Inc
Priority to US400986A priority Critical patent/US3902115A/en
Priority to JP10833274A priority patent/JPS5522734B2/ja
Priority to SE7411921A priority patent/SE409246B/xx
Priority to GB41368/74A priority patent/GB1479901A/en
Priority to CA209,751A priority patent/CA1007704A/en
Priority to DE2445411A priority patent/DE2445411C2/de
Priority to FR7432022A priority patent/FR2244989B1/fr
Priority to NL7412562A priority patent/NL7412562A/xx
Priority to US05/589,936 priority patent/US3979669A/en
Application granted granted Critical
Publication of US3902115A publication Critical patent/US3902115A/en
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G01N15/10—Investigating individual particles
    • G01N15/1031—Investigating individual particles by measuring electrical or magnetic effects
    • G01N15/12—Investigating individual particles by measuring electrical or magnetic effects by observing changes in resistance or impedance across apertures when traversed by individual particles, e.g. by using the Coulter principle
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G01N15/10—Investigating individual particles
    • G01N15/1031—Investigating individual particles by measuring electrical or magnetic effects
    • G01N15/12—Investigating individual particles by measuring electrical or magnetic effects by observing changes in resistance or impedance across apertures when traversed by individual particles, e.g. by using the Coulter principle
    • G01N15/13—Details pertaining to apertures
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N1/00—Sampling; Preparing specimens for investigation
    • G01N1/28—Preparing specimens for investigation including physical details of (bio-)chemical methods covered elsewhere, e.g. G01N33/50, C12Q
    • G01N1/38—Diluting, dispersing or mixing samples

Definitions

  • a two chamber aperture tube for obtaining signals from particles suspended in a fluid which passes through a scanning aperture.
  • the suspension enters an aperture in an inlet chamber and passes thereafter to an outlet chamber in fluid connection with the inlet chamber.
  • the inlet chamber of the tube is connected to a source of clean electrolyte; the outlet chamber is connected to a waste collecting container.
  • a vacuum is applied to the collecting container to cause clean electrolyte to be drawn through the inlet chamber and wash behind the aperture simultaneously with passage of the suspension through the aperture.
  • a restriction in the path of flow of the clean electrolyte causes the flow velocity thereof to increase behind the aperture and ensure that proper signals from all particles in the suspension are obtained 32 Claims.
  • the herein invention also is related to and is an improvement upon the structure disclosed in U.S. Pat. No. 3,746,976 issued July 17, 1973 for Self-Cleaning Aperture Tube for Coulter Study Apparatus", the applicant therein being one of the inventors herein, and owned by the same assignee as this invention.
  • This invention relates generally to the art of studying the physical properties of particles carried in suspension and more particularly is concerned with improved apparatus for obtaining signals from particles passing through a scanning aperture without extraneous interference from other particles.
  • One of the objects of the invention disclosed in the Related Patent was to provide an aperture tube which was self-cleaning in that the suspension in the immediate vicinity of the aperture was kept free of extraneous particles.
  • eddy currents of fluid in the aperture tube at the downstream end of the primary bore could occur, and these eddy currents swirled into the secondary bore immediately adjacent the primary bore. It was believed that the fluid would be stagnant liquid substantially devoid of particles, hence not introducing appreciable extraneous signals, but while this was largely true, the action was deemed not sufficient to satisfy the more critical demands of today's technology. A small percentage of particles was not caught by the orifice in the elongate neck of the second chamber and these sometimes produced extraneous signals by virture of the eddy currents at the bottom of the central chamber of the aper ture tube.
  • the invention disclosed in U.S. Pat. No. 3,746,976 provides a selfcleaning aperture tube as disclosed in the Related Patent, with the addition of a pump device interposed between the first and second chambers to produce a closed system in which there are no inlets or outlets other than the primary bore in the first chamber.
  • the pump operates to draw the particle suspension up through the second chamber and force the same back into the first chamber, completing a circuit around this path and creating a sheath flow at the orificev
  • the flow created by the pump is such as to ensure that all parti cles introduced into the aperture tube are caught by the orifice of the second chamber so as to prevent the occurrence of extraneous signals.
  • FIG. 1 is a sectional view through a system constructed in accordance with the invention, including some diagrammatic representation of associated apparatus for the purpose of explaining the same;
  • FIG. 2 is a fragmentary enlarged sectional view through the aperture tube of the invention showing the details thereof;
  • FIG. 3 is a view similar to that of FIG. 2 illustrating a modified construction of the aperture tube
  • FIG. 4 is a view similar to that of FIG. 2 illustrating a further modified construction of the aperture tube
  • FIG. 5 is a fragmentary enlarged sectional view of another form of aperture tube for use with the structure of FIG. 1;
  • FIG. 6 is a fragmentary enlarged sectional view of a still further form of aperture tube for use with the structure of the invention.
  • FIG. 7 is a fragmentary enlarged sectional view of another alternate embodiment of the aperture tube for use with the structure of the invention.
  • FIG. 8 is a sectional view taken along the line 8-8 of FIG. 7 in the direction indicated generally;
  • FIG. 9 is a sectional view taken along the line 99 of FIG. 7 in the direction indicated generally;
  • FIG. I0 is a fragmentary enlarged sectional view of an additional alternate embodiment of the aperture tube for use with the structure of FIG. 1;
  • FIG. 11 is a sectional view taken along the line IIl1 of FIG. 10 in the direction indicated generally;
  • H0. 12 is a sectional view taken along the line 12-12 of FIG. in the direction indicated generally;
  • FIG. 13 is a sectional view taken along the line 1313 of FIG. 10 in the direction indicated generally.
  • the apparatus with which the structure of the invention is intended for use is known as the Coulter electronic particle analyzing device.
  • the Coulter device and its principle of operation is referred to with particularity in the Related Patent. Since the Related Patent is incorporated herein as a part hereof by specific referencc, the disclosure thereof will not be repeated except in instances where understanding of the invention herein will be enhanced.
  • a measuring aperture 14 is formed in the wall of the first chamber 13 near the lower end thereof; a cleaning orifree 16 is formed in the wall of the second chamber 18 in registry with the aperture 14.
  • the vessel 38 retains a body of the sample solution 48 to be drawn through aperture 14 and orifice 16; electrodes 34 and 36 are positioned within the aperture tube 12 and vessel 38, respectively, and are connected to the detector of a Coulter study apparatus through leads 17 in the manner described in the Related Patent for purposes of performing an analysis of the sample solution.
  • Aperture tube 12 is associated with the structure 10 by mounting same on coupling block 54 which is separable along the juncture line 56, the two portions 57, 58 of block 54 being secured together by screws 59.
  • the tube 12 terminates within the block 54 at its upper end 62.
  • An O-ring 64 is positioned about tube 12 to provide an air and liquid-tight seal.
  • the tube is secured by cast epoxy resin to the lower half 57 of block 54 to form an easily mounted integral assembly.
  • the tube 12 thereby may be replaced readily with another of the same type in the event of breakage, or with an alternate form of tube as discussed hereinafter.
  • a conduit 71 with valve 73 for flushing and purging the tube 12 is connected to the tube by fitting 70.
  • Chamber l8 terminates downstream in the upper portion 19 thereof at a fitting 21 which couples the terminal portion 19 to a conduit 20.
  • a valve 22 is positioned in conduit and the conduit terminates at a waste drip chamber or waste container 24.
  • a vacuum source (not shown) is connected to the waste container 24 by conduit 23.
  • a waste conduit 42 with valve 43 is provided on the bottom of container 24.
  • Chamber 13 forms the upstream portion of structure 10.
  • the upper port 25 of chamber 13 is connected by couplings and conduits designated generally 80 through the choke" or hydraulic resistance 27 to an electrolyte supply drip chamber 29 having access ports 31 and 35, normally closed by valves not shown, and a supply port 33.
  • Clean electrolyte 28 is supplied to chamber 29 through supply reservoir 52 which empties into reservoir 26 and is drawn into the chamber through fluid connection 40 having a valve 30 interposed therein.
  • a shield represented by the dashed line 32 is provided electrically to insulate connecting members and supply drip chamber 29 when the electrode 34 serves as the signal electrode for the Coulter study apparatus. This will be the case when more than one aperture are immersed in the sample bath 48 of vessel 38. [f a single aperture tube 12 is used in the sample bath, the electrode 34 may be grounded and the electrode 36 may be the signal electrode in which case the shield 32 may be omitted. Since the electrolyte path 40 between valve 30 and the aperture tube 12 is broken by the drip chamber 29, it may be grounded and located at any convenient position regardless which electrode is used as the signal electrode.
  • the waste bottle/waste drip chamber 24 will serve one or the other function depending upon the application and desired mode of operation of the structure of the invention. If the bottle/chamber 24 has a volume greater than the combined sample and clean "wash electrolyte. and the waste is evacuated after each measurement through tube 42 by opening valve 43, the bottle/chamber 24 will serve merely as a drip chamber and the electrical connection will be broken between the electrolyte path through the tube 42 and the electrolyte path through the tube 20 and valve 22 by means of the droplet formation indicated at 41. If the valve 43 is not opened after each measurement cycle, the bott le/chamber 24 must have a much larger capacity and will serve as a waste bottle.
  • Operation of the structure 10 is as follows: a vacuum is applied from the vacuum source through conduit 23, the waste bottle/drip chamber 24, valve 22 and tubing 20 to the inside chamber 18. Assuming that the aper ture 14 is plugged, suction is applied to the orifice 16, which in turn sucks liquid up out of reservoir 26 along a path through fluid connection 40, valve 30, accumulation chamber 29 and connection members 80. This flow of electrolyte creates a washing action behind the measuring aperture 14. If the measuring aperture is open as it will be in operation of the structure 10 the sample 48 will be drawn into the aperture tube 12 at the same time that electrolyte is passing behind aperture 14.
  • the clean electrolyte from reservoir 26 will surround the sample coming through the aperture 14 and prevent particles from straying in the aperture tube 12, thus eliminating the disadvantageous swirling effect of eddy currents as in US. Pat. No. 3,746,976.
  • the washing action created by the flow of electrolyte behind the measuring aperture 14 is such as to ensure that all particles introduced into the aperture tube are caught by the orifice of the second chamber 18 so as to prevent the occurrence of extraneous signals.
  • the supply reservoir 52 is illustrated in the form of a livestock waterer in order to keep the level 37 of clean electrolyte 28 in reservoir 26 at a constant height. It is necessary to maintain the pressure drop stable so that the flow rate through the aperture 14 will be relatively constant. Since in the arrangement shown it is not possible to measure the volume of sample scanned by the detector. it is mandatory that the flow rates be stable.
  • the structure of the present invention may be adapted to a closed-loop circulatory system similar to that disclosed in U.S. Pat. No. 3,746,976. This could be accomplished by closing or omitting connection 23, and connecting waste conduit 42 to fluid connection 40 with a pump and filter interposed therebetween.
  • the effective operation of the structure herein would be the same except recirculating electrolyte would flow through structure instead of clean fluid from reservoir 26. 7
  • FIGS. 2, 3 and 4 illustrate three forms of construction of the aperture tube comprising inner and outer chambers as shown in FIG. 1.
  • the orifice 16 is drilled directly into the glass wall of the second chamber 18.
  • a tungsten point is inserted into the wall of the inner chamber 18 before it is sealed into the outer chamber 13.
  • a tiny spot of heat is applied to the intended location of orifice 16 and the dimple 60 is pushed out by the tungsten point when the glass gets hot.
  • the dimple subsequently is ground down flat as shown and the orifice 16 is drilled thereon.
  • the aperture 14 is formed within a wafer which is heat-sealed to the outer chamber 13 in registry with orifice 16 in a known manner.
  • a jewel or sapphire wafer having the measuring aperture 14' is mounted on the inside of the tubing which is intended to form the wall of chamber 13'.
  • the hole for the wafer bearing aperture 14' is picked in the opposite side of the tube and the wafer is positioned behind the hole.
  • the wafer and the glass around it are then heated and sealed, such that the wafer is an integral part of the glass tubing.
  • a wafer with orifice 16' is mounted on the outside of a length of smaller diameter tubing intended to form the inner chamber 18 of the aperture tube.
  • the aperture 14" is formed within a wafer positioned on the wall of the outer chamber 13" in the same manner as that of FIG. 2.
  • the orifice 16" is formed on an upstanding jewel or sapphire 61 which is fused to the wall of chamber 18". The effect and operation of this tube is the same as that of the tube shown in FIG. 2.
  • the large bore tubing carrying aperture 14, 14' or 14" and the small bore tubing carrying the respective orifice 16, 16' or 16" are both fabricated, they are held together in a suitable fixture or vise so that the aperture and orifice are in registry with proper spacing between the tubes.
  • the two tubes are then heat-melted and sealed at the locations 50, 50' or 50" to produce the aperture tube as shown. It may be desirable to put a graded seal in both tubes so that the temperature coefficients do not cause breakage of the aperture tube on cooling. This may be avoided if the entire structure is made of glass having the same temperature coefficient as that of the wafer as known in the art.
  • the structure of the invention is such that aperture tubes of a construction different from tube 12 may be used by disassembling coupling block 54, removing tube 12 and positioning a new tube. So long as the upper parts of the new tube which are retained in block 54 have the same configuration as tube 12 any of a wide variety of tubes may be used.
  • FIG. 5 one such interchangeable alternate form of aperture tube is shown.
  • a relatively narrow connecting tube 130 connects the tubes 113 and 118.
  • An aperture 114 is provided in connecting tube 130 and an orifice 116 is provided in the wall of tube 113.
  • Coupling members 125, 162, 121, 170 and 173 corresponding to members 24, 62, 21, 70 and 73 shown in FIG. 1 are provided to enable positioning of the aperture tube assembly on connecting block 54.
  • Oring 164 seals the tube in the block in the same manner as O-ring 64 of FIG. 1.
  • An electrode 134 is located in tube 113 and corresponds to electrode 34.
  • FIGS. 6, 7 and 10 illustrate three further interchangeable alternate forms of aperture tube which may be used in the structure 10.
  • the upper elements of the tube are shown with conduits and fittings corresponding to like elements of the tube 12 to enable placement of the alternate tube in the connecting block 54.
  • These like elements are identified with the same reference numbers as in FIG. 1 with single, double or triple primes added.
  • the aperture 214 is positioned in the side of a U tube 213 of small diameter measuring about 2.5 mm.
  • a V-shaped restriction 280 is formed in the wall of the U tube opposite the aperture to increase the flow velocity of electrolyte as it passes behind the aperture.
  • the dimensions of the U tube proximate the aperture and V-shaped restriction are on the order of about 1 mm.
  • Clean electrolyte flows down leg 215 and provides a continuous washing effect behind aperture 214 normal to the aperture axis by reason of the restriction 280. The wash electrolyte together with the sample which has been drawn through aperture 214, then leaves the U tube by passing up leg 217 and out into conduit 20.
  • the zone 216 immediately below restriction 280 and behind aperture 214 is roughly equivalent to orifice 16 of aperture tube 12 in that the fluid present in this zone is used wash electrolyte and sample. This fluid immediately is carried away from the mea suring aperture 214 by reason of increased flow rate behind the restriction 280.
  • aperture 314 is positioned on tube 313.
  • a V-shaped restriction 380 is formed in the wall of tube 313 opposite the aperture, again for the purpose of increasing the flow velocity of electrolyte as it passes behind the aperture.
  • a capillary tube 317 is positioned within tube 313 and terminates at the lower end 330 of tube 313 below the aperture opening. Clean electrolyte flows down tube 313 to provide the continuous washing effect behind aperture 314 normal to the aperture axis by reason of the restriction 380. The wash electrolyte together with the sample which has been drawn through aperture 314 then leaves the aperture tube by passing up capillary tube 317 and out into conduit 20".
  • the zone 316 immediately below restriction 380 and behind aperture 314 is roughly equivalent to orifice 16 of aperture tube 12 in that the fluid present in this zone is used wash electrolyte and sample. This fluid immediately is carried away from the measuring aperture 314 by reason of increased flow rate behind the restriction 380.
  • the whole assembly is fitted to a coupling block 54 (not shown) as described in connection with FIGS. 1 and 5 for the appropriate liquid and electrical connections.
  • aperture 414 is positioned on tube'413 at a location of reduced diameter.
  • a second tube 417 which is open at the bottom 430 of tube 413 is positioned within tube 413 with one wall 420 of tube 417 engaging the back wall 422 of tube 413 along the length thereof.
  • the surface 424 of tube 417 opposite wall 420 is deformed in the shape of a longitudinal channel such that tube 417 is of generally half-moon cross-sectional configuration.
  • a protrusion 480 is formed in surface 424 proximate the back side of aperture 414 to provide the desired increased flow velocity of electrolyte as it passes behind the aperture.
  • the tube 417 terminates below aperture 414 with space below the terminal end for passage of fluid up the tube.
  • the half-moon configuration of tube 417 is such as to divide tube 413 into two portions, a first portion 430 for down-flow of electrolyte and a second portion 432 for up-flow of electrolyte and sample. Proximate the location of aperture 414 the inner tube 417 is completely flat so that wash electrolyte must pass through countersink 440 behind aperture 414, the countersink being formed in the wall of tube 413 when the wafer having aperture 414 is secured to the outside surface of the tube. Another longitudinal depression is formed in tube 417 below the protrusion 480 to permit wash fluid to pass out from behind aperture 414.
  • the radial di mension of the protrusion 480 proximate aperture 414 is as small as possible in order to cause the crosssectional area of the electrolyte between the aperture and electrode to become large as quickly as possible.
  • Clean electrolyte flows down portion 430 of tube 413 to provide the washing effect behind aperture 414 as described.
  • the wash electrolyte and sample which has been drawn through the aperture then passes up tube 417 along portion 432 and out into conduit
  • the restrictions 280, 380 and 480 behind the aperture of the embodiments of FIGS. 6, 7 and 10, respectively, are such as to provide very high electrolyte fiow rates without necessitating the use of large quantities of clean electrolyte.
  • a criterion of performance satisfied by each of the embodiments disclosed herein is that the speed of the washing flow of clean electrolyte down past the measuring aperture is greater than any upward components of any currents formed behind the aperture thus sweeping particles which have already been measured out of the sensing zone and preventing any particles from traveling upwards behind the aperture into the zone immediately upstream thereof where false pulses may be created.
  • a particle measuring apparatus including a vessel for containing a body of particulate liquid suspension to be tested, an aperture tube extending into said vessel and including an aperture, fluid moving means for establishing pressure differentials and adapted for moving the suspension from the vessel through the aperture into and through the aperture tube to a waste collection container, a first electrode in the vessel and a second electrode in the aperture tube to establish an electrical field in the aperture between said vessel and the aperture tube, means including elecrical leads connected to the electrodes and adapted to extend connections to a detector to respond to electrical measuring signals produced across said electrodes with passage of particles through said aperture, the aperture tube having an inlet chamber adapted for fluid connection with a source of particle free liquid, said inlet chamber having said aperture in fluid communication on one side thereof with the suspension in the vessel to permit passage of the suspension through the aperture into the inlet chamber, there being a zone in the aperture tube proximate to and downstream of the aperture in which spurious signals may normally be produced, an outlet chamber in fluid connection with said inlet chamber, means for connecting said outlet chamber to said fluid
  • a particle measuring apparatus including a vessel for containing a body of particulate liquid suspension to be tested, an aperture tube extending into said vessel and including an aperture, fluid moving means for establishing pressure differentials and adapted for moving the suspension from the vessel through the aperture into and through the aperture tube to a waste collection container, a first electrode in the vessel and a second electrode in the aperture tube to establish an electrical field in the aperture between said vessel and the aperture tube, means including electrical leads connected to the electrodes and adapted to extend connections to a detector to respond to electrical measuring signals produced across said electrodes with passage of particles through said aperture, the aperture tube having an inlet chamber adapted for fluid connection with a source of particle free liquid, said inlet chamber having said aperture in fluid communication on one side thereof with the suspension in the vessel to permit passage of the suspension through the aperture into the inlet chamber, there being a zone in the aperture tube proximate to and downstream of the aperture in which spurious signals may normally be produced, an outlet chamber in fluid connection with said inlet chamber, means for connecting said outlet chamber to said fluid moving means and
  • a particle measuring apparatus including a vessel for containing a body of particulate liquid suspension to be tested, an aperture tube extending into said vessel and including an aperture, fluid moving means for establishing pressure differentials and adapted for moving the suspension from the vessel through the aperture into and through the aperture tube to a waste collection container, a first electrode in the vessel and a second electrode in the aperture tube to establish an electrical field in the aperture between said vessel and the aperture tube, means including electrical leads connected to the electrodes and adapted to extend connections to a detector to respond to electrical measuring signals produced across said electrodes with passage of particles through said aperture, the aperture tube having an inlet chamber adapted for fluid connection with a source of particle free liquid, said inlet chamber having said aperture in fluid communication on one side thereof with the suspension in the vessel to permit passage of the suspension through the aperture into the inlet chamber, there being a zone in the aperture tube proximate to and downstream of the aperture in which spurious signals may normally be produced, an outlet chamber in fluid connection with said inlet chamber, means for connecting said outlet chamber to said fluid moving means and
  • a particle measuring apparatus including a ves sel for containing a body of particulate liquid suspension to be tested, an aperture tube extending into said vessel and including an aperture, fluid moving means for establishing pressure differentials and adapted for moving the suspension from the vessel through the aperture into and through the aperture tube to a waste collection container, a first electrode in the vessel and a second electrode in the aperture tube to establish an electrical field in the aperture between said vessel and the aperture tube, means including electrical leads connected to the electrodes and adapted to extend connections to a detector to respond to electrical measuring signals produced across said electrodes with passage of particles through said aperture, the aperture tube having an inlet chamber adapted for fluid connection with a source of particle free liquid, said inlet chamber having said aperture in fluid communication on one side thereof with the suspension in the vessel to permit passage of the suspension through the aperture into the inlet chamber, there being a zone in the aperture tube proximate to and downstream of the aperture in which spurious signals may normally be produced, an outlet chamber in fluid connection with said inlet chamber, means for connecting said outlet chamber to said outlet
  • a particle measuring apparatus including a vessel for containing a body of particulate liquid suspen sion to be tested, an aperture tube extending into said vessel and including an aperture, fluid moving means for establishing pressure differentials and adapted for moving the suspension from the vessel through the aperture into and through the aperture tube to a waste collection container, a first electrode in the vessel and a second electrode in the aperture tube to establish an electrical field in the aperture between said vessel and the aperture tube, means including electrical leads con nected to the electrodes and adapted to extend connections to a detector to respond to electrical measuring signals produced across said electrodes with passage of particles through said aperture, the aperture tube having an inlet chamber adapted for fluid connection with a source of particle free liquid, said inlet chamber having said aperture in fluid communication on one side thereof with the suspension in the vessel to permit passage of the suspension through the aperture into the inlet chamber, there being a zone in the aperture tube proximate to and downstream of the aperture in which spurious signals may normally be produced, an outlet chamber in fluid connection with said inlet chamber,
  • the outlet chamber being formed within the inlet chamber.
  • the inlet chamber having a closed bottom, the outlet chamber terminating at the closed bottom of the inlet chamber at an open end positioned below the aperture, said aperture tube having a restriction in the path of flow of said particle free liquid to cause the flow velocity thereof to increase in the spurious signal producing zone and continuously to wash the zone simultaneously with passage of the suspension through the aperture such that particles which have been measured within the aperture and thereafter passing out of the same immediately are swept out of the spurious signal producing zone by the particle free liquid and moved into the outlet chamber.
  • An aperture tube for use in particle measuring apparatus including a container of particulate liquid suspension into which the aperture tube extends, said tube comprising, an inlet chamber, an outlet chamber in fluid connection with the inlet chamber, said outlet chamber being formed within the inlet chamber, the chambers having a common closed bottom wall, the inlet chamber having an aperture adapted to be in communication on one side thereof with the liquid suspension, there being a zone in the aperture tube proximate to and downstream of the aperture in which spurious signals may normally be produced, means for connecting the inlet chamber to a source of particle free liquid, means for connecting the outlet chamber to fluid moving means to move the suspension from the container through the aperture into the spurious signal producing zone, the tube having a restriction in the path of flow of the particle free liquid to cause the flow velocity thereof to increase in the spurious signal producing zone and continuously wash the zone simultaneously with passage of the suspension through the aperture such that particles which have passed through the aperture immediately are swept out of the spurious signal producing zone by the particle free liquid and moved into the outlet chamber.
  • An aperture tube for use in particle measuring apparatus including a container or particulate liquid suspension into which the aperture tube extends, said tube comprising, an inlet chamber, an outlet chamber in fluid connection with the inlet chamber, the inlet chamber having an aperture adapted to be in commun cation on one side thereof with the liquid suspension, there being a zone in the aperture tube proximate to and downstream of the aperture in which spurious signals may normally be produced, means for connecting the inlet chamber to a source of particle free liquid, means for connecting the outlet chamber to fluid moving means to move the suspension from the container through the aperture into the spurious signal producing zone, the tube having a restriction in the path of flow of the particle free liquid, the inlet chamber including a first tube and a connecting tube formed normal to the first tube, said outlet chamber being in fluid connection with the connecting tube, said aperture being formed in the connection tube, and said restriction is an orifice formed in the wall of the first tube opening into the connection tube, whereby the flow velocity of the parti cle free liquid increases in the spurious signal producing zone and continuously washes the
  • An aperture tube for use in particle measuring apparatus including a container of particulate liquid suspension into which the aperture tube extends, said tube comprising, an inlet chamber, an outlet chamber in fluid connection with the inlet chamber, the tube being of generally U-shaped configuration with one leg forming the inlet chamber and the other leg forming the outlet chamber, the inlet chamber having an aperture adapted to be in communication on one side thereof with the liquid suspension, there being a zone in the aperture tube proximate to and downstream of the aperture in which spurious signals may normally be produced, means for connecting the inlet chamber to a source of particle free liquid, means for connecting the outlet chamber to fluid moving means to move the suspension from the container through the aperture into the spurious signal producing zone, the tube having a restriction in the path of flow of the particle free liquid to cause the flow velocity thereof to increase in the spurious signal producing zone and continuously wash the zone simultaneously with passage of the suspension through the aperture such that particles which have passed through the aperture immediately are swept out of the spurious signal producing zone by the particle free liquid and moved into the outlet chamber.
  • An aperture tube for use in particle measuring apparatus including a container of particulate liquid suspension into which the aperture tube extends, said tube comprising, an inlet chamber, a capillary tube outlet chamber formed within the inlet chamber and in fluid connection therewith, the inlet chamber having a closed bottom and an aperture adapted to be in communication on one side thereof with the liquid suspen sion, the outlet chamber terminating at the closed bottom of the inlet chamber at an open end positioned below the aperture, there being a zone in the aperture tube proximate to and downstream of the aperture in which spurious signals may normally be produced, means for connecting the inlet chamber to a source of particle free liquid, means for connecting the outlet chamber to fluid moving means to move the suspension from the container through the aperture into the spurious signal producing zone, the tube having a restriction in the path of flow of the particle free liquid to cause the flow velocity thereof to increase in the spurious signal producing zone and continuously wash the zone simultaneously with passage of the suspension through the aperture such that particles which have passed through the aperture immediately are swept out of the spurious signal producing zone by the
  • An aperture tube for use in particle measuring apparatus including a container of particulate liquid suspension into which the aperture tube extends, said tube comprising, an inlet chamber, an outlet chamber formed within the inlet chamber and in fluid connection therewith, the inlet chamber having a closed bottom and an aperture adapted to be in communication on one side thereof with the liquid suspension, the outlet chamber terminating at the closed bottom of the inlet chamber at an open end positioned below the aperture, there being a zone in the aperture tube proximate to and downstream of the aperture in which spurious signals may normally be produced, means for connecting the inlet chamber to a source of particle free liquid, means for connecting the outlet chamber to fluid moving means to move the suspension from the container through the aperture into the spurious signal producing zone, the tube having a restriction in the path of flow of the particle free liquid to cause the flow velocity thereof to increase in the spurious signal producing zone and continuously wash the zone simultaneously with passage of the suspension through the aperture such that particles which have passed through the aperture immediately are swept out of the spurious signal producing zone by the particle free liquid and moved into the outlet
  • An electrolyte supply system for particle measuring apparatus in which an aperture tube is suspended in a vessel for containing a body of particulate liquid suspension to be tested, the tube having an aperture to permit passage of the suspension from the container into the tube, the apparatus including a first electrode in the vessel and a second electrode in the aperture tube to establish an electrical field in the aperture between the vessel and the aperture tube, and means including electrical leads connected to the electrodes and adapted to extend connections to a detector to respond to electrical measuring signals produced across the electrodes with passage of particles through said aperture, said system comprising, the aperture tube having an inlet chamber for introduction of particle free electrolyte, an outlet chamber in fluid connection with the inlet chamber, the aperture tube being mounted at the end opposite the suspended end in a coupling block, an electrolyte reservoir in fluid communication with the inlet chamber, a waste container in fluid communica tion with the outlet chamber, and fluid moving means connected to the waste container, whereby the fluid moving means will cause electrolyte to pass from the reservoir through the inlet and outlet chambers and into the container

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  • Sampling And Sample Adjustment (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
US400986A 1973-09-26 1973-09-26 Self-cleaning aperture tube for coulter study apparatus and electrolyte supply system therefor Expired - Lifetime US3902115A (en)

Priority Applications (9)

Application Number Priority Date Filing Date Title
US400986A US3902115A (en) 1973-09-26 1973-09-26 Self-cleaning aperture tube for coulter study apparatus and electrolyte supply system therefor
JP10833274A JPS5522734B2 (fr) 1973-09-26 1974-09-21
GB41368/74A GB1479901A (en) 1973-09-26 1974-09-23 Self-cleaning aperture tube for coulter study apparatus and electrolyte supply system therefor
CA209,751A CA1007704A (en) 1973-09-26 1974-09-23 Self-cleaning aperture tube for coulter study apparatus and electrolyte supply system therefor
SE7411921A SE409246B (sv) 1973-09-26 1974-09-23 Oppningsmodul for anvendning i en partikelmetapparat
DE2445411A DE2445411C2 (de) 1973-09-26 1974-09-23 Meßgefäßanordnung für ein Teilchenmeßgerät
FR7432022A FR2244989B1 (fr) 1973-09-26 1974-09-23
NL7412562A NL7412562A (nl) 1973-09-26 1974-09-23 Een zelfreinigende apertuurbuis voor een coulter deringsinrichting en een aanvoersysteem het elektrolyt.
US05/589,936 US3979669A (en) 1973-09-26 1975-06-24 Particle analyzing system

Applications Claiming Priority (1)

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US400986A US3902115A (en) 1973-09-26 1973-09-26 Self-cleaning aperture tube for coulter study apparatus and electrolyte supply system therefor

Related Child Applications (1)

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US05/589,936 Continuation-In-Part US3979669A (en) 1973-09-26 1975-06-24 Particle analyzing system

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US3902115A true US3902115A (en) 1975-08-26

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US400986A Expired - Lifetime US3902115A (en) 1973-09-26 1973-09-26 Self-cleaning aperture tube for coulter study apparatus and electrolyte supply system therefor

Country Status (8)

Country Link
US (1) US3902115A (fr)
JP (1) JPS5522734B2 (fr)
CA (1) CA1007704A (fr)
DE (1) DE2445411C2 (fr)
FR (1) FR2244989B1 (fr)
GB (1) GB1479901A (fr)
NL (1) NL7412562A (fr)
SE (1) SE409246B (fr)

Cited By (22)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3979669A (en) * 1973-09-26 1976-09-07 Coulter Electronics, Inc. Particle analyzing system
US4014611A (en) * 1975-04-30 1977-03-29 Coulter Electronics, Inc. Aperture module for use in particle testing apparatus
US4090128A (en) * 1977-02-15 1978-05-16 Coulter Electronics, Inc. Aperture module for use in particle testing apparatus
US4103229A (en) * 1977-01-28 1978-07-25 The University Of Virginia Continuous-flow, resistive-particle counting apparatus
US4157498A (en) * 1977-08-01 1979-06-05 Miles Laboratories, Inc. Flow-through type particle analyzing apparatus
US4290011A (en) * 1978-05-18 1981-09-15 Particle Data, Inc. Particle length and volume comeasurement with controlled orientation
US4361803A (en) * 1980-08-26 1982-11-30 Coulter Electronics, Inc. Apparatus for recirculating sweep flow electrolyte without a pump
US4491786A (en) * 1978-09-13 1985-01-01 Coulter Electronics, Inc. Transducer for measuring particles suspended in a fluid
US4710021A (en) * 1983-10-14 1987-12-01 Sequoia-Turner Corporation Particulate matter analyzing apparatus and method
EP0405729A2 (fr) * 1989-05-04 1991-01-02 Abbott Laboratories Système d'écoulement de fluide, antisiphon et autoremplissant pour procédés et instruments d'analyse de particules
US5402062A (en) * 1993-12-23 1995-03-28 Abbott Laboratories Mechanical capture of count wafer for particle analysis
US5432992A (en) * 1993-12-23 1995-07-18 Abbott Laboratories Method of making count probe with removable count wafer
US5500992A (en) * 1993-12-23 1996-03-26 Abbott Laboratories Method of making stress relieved count probe
US5895869A (en) * 1995-11-17 1999-04-20 Mwi, Inc. Method and apparatus for analyzing particulate matter
US6111398A (en) * 1997-07-03 2000-08-29 Coulter International Corp. Method and apparatus for sensing and characterizing particles
US6175227B1 (en) 1997-07-03 2001-01-16 Coulter International Corp. Potential-sensing method and apparatus for sensing and characterizing particles by the Coulter principle
WO2001011338A1 (fr) * 1999-08-06 2001-02-15 Ulrik Darling Larsen Appareil de caracterisation de particules
US6259242B1 (en) 1999-05-26 2001-07-10 Coulter International Corp. Apparatus incorporating a sensing conduit in conductive material and method of use thereof for sensing and characterizing particles
US20050214928A1 (en) * 2002-06-11 2005-09-29 Larsen Ulrik D Disposable cartridge for characterizing particles suspended in a liquid
US20080202217A1 (en) * 2005-02-10 2008-08-28 Chempaq A/S Dual Sample Cartridge and Method for Characterizing Particles in Liquid
US20120103091A1 (en) * 2009-06-08 2012-05-03 Sms Siemag Aktiengesellschaft Method and device for detecting contaminants in a fluid
US8573033B2 (en) 2005-02-10 2013-11-05 Koninklijke Philips N.V. Method for characterizing particles in liquid using a dual sample cartridge

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
IL53921A (en) * 1977-02-15 1979-12-30 Coulter Electronics Electronic particle sensing aperture module with perforated electrode
JPS55143431A (en) * 1979-04-26 1980-11-08 Toa Medical Electronics Co Ltd Detector for corpuscle
JPH0129567Y2 (fr) * 1980-01-21 1989-09-08
JPS56103348A (en) * 1980-01-22 1981-08-18 Toa Medical Electronics Co Ltd Particle detector
DE3437519A1 (de) * 1983-10-14 1985-04-25 Sequoia Turner Corp Verfahren und vorrichtung zum analysieren von teilchenfoermigem material
JPH0622203Y2 (ja) * 1989-01-26 1994-06-08 東亜医用電子株式会社 試料測定装置

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3340471A (en) * 1966-08-22 1967-09-05 Coulter Electronics Flow-through sample apparatus for use with electrical particle study device
US3746976A (en) * 1971-04-07 1973-07-17 Coulter Electronics Self-cleaning aperture tube for coulter study apparatus

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3340471A (en) * 1966-08-22 1967-09-05 Coulter Electronics Flow-through sample apparatus for use with electrical particle study device
US3746976A (en) * 1971-04-07 1973-07-17 Coulter Electronics Self-cleaning aperture tube for coulter study apparatus

Cited By (33)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3979669A (en) * 1973-09-26 1976-09-07 Coulter Electronics, Inc. Particle analyzing system
US4014611A (en) * 1975-04-30 1977-03-29 Coulter Electronics, Inc. Aperture module for use in particle testing apparatus
US4103229A (en) * 1977-01-28 1978-07-25 The University Of Virginia Continuous-flow, resistive-particle counting apparatus
US4090128A (en) * 1977-02-15 1978-05-16 Coulter Electronics, Inc. Aperture module for use in particle testing apparatus
US4157498A (en) * 1977-08-01 1979-06-05 Miles Laboratories, Inc. Flow-through type particle analyzing apparatus
US4290011A (en) * 1978-05-18 1981-09-15 Particle Data, Inc. Particle length and volume comeasurement with controlled orientation
US4491786A (en) * 1978-09-13 1985-01-01 Coulter Electronics, Inc. Transducer for measuring particles suspended in a fluid
US4361803A (en) * 1980-08-26 1982-11-30 Coulter Electronics, Inc. Apparatus for recirculating sweep flow electrolyte without a pump
US4710021A (en) * 1983-10-14 1987-12-01 Sequoia-Turner Corporation Particulate matter analyzing apparatus and method
EP0405729A2 (fr) * 1989-05-04 1991-01-02 Abbott Laboratories Système d'écoulement de fluide, antisiphon et autoremplissant pour procédés et instruments d'analyse de particules
EP0405729A3 (en) * 1989-05-04 1991-11-21 Exact Science, Inc. Self-filling anti-siphon fluid flow system for particle analysis methods and instruments
US5094818A (en) * 1989-05-04 1992-03-10 Exact Science, Inc. Self-filling anti-siphon flow system for particle analysis
US5402062A (en) * 1993-12-23 1995-03-28 Abbott Laboratories Mechanical capture of count wafer for particle analysis
US5432992A (en) * 1993-12-23 1995-07-18 Abbott Laboratories Method of making count probe with removable count wafer
US5500992A (en) * 1993-12-23 1996-03-26 Abbott Laboratories Method of making stress relieved count probe
US5983735A (en) * 1995-11-17 1999-11-16 Mwi, Inc. Method and apparatus for analyzing particulate matter
US5895869A (en) * 1995-11-17 1999-04-20 Mwi, Inc. Method and apparatus for analyzing particulate matter
US6111398A (en) * 1997-07-03 2000-08-29 Coulter International Corp. Method and apparatus for sensing and characterizing particles
US6175227B1 (en) 1997-07-03 2001-01-16 Coulter International Corp. Potential-sensing method and apparatus for sensing and characterizing particles by the Coulter principle
US6259242B1 (en) 1999-05-26 2001-07-10 Coulter International Corp. Apparatus incorporating a sensing conduit in conductive material and method of use thereof for sensing and characterizing particles
US6959618B1 (en) 1999-08-06 2005-11-01 Chempaq A/S Particle characterization apparatus
WO2001011338A1 (fr) * 1999-08-06 2001-02-15 Ulrik Darling Larsen Appareil de caracterisation de particules
US20060177347A1 (en) * 2002-06-11 2006-08-10 Larsen Ulrik D Lysing reagent, cartridge and automatic electronic cell counter for simultaneous enumeration of different types of white blood cells
US20060013725A1 (en) * 2002-06-11 2006-01-19 Larsen Ulrik D Disposable cartridge for characterizing particles suspended in a liquid
US20050214928A1 (en) * 2002-06-11 2005-09-29 Larsen Ulrik D Disposable cartridge for characterizing particles suspended in a liquid
US7771658B2 (en) 2002-06-11 2010-08-10 Chempaq A/S Disposable cartridge for characterizing particles suspended in a liquid
US7797990B2 (en) 2002-06-11 2010-09-21 Chempaq A/S Disposable cartridge for characterizing particles suspended in a liquid
US8227250B2 (en) 2002-06-11 2012-07-24 Koninklijke Philips Electronics N.V. Lysing reagent, cartridge and automatic electronic cell counter for simultaneous enumeration of different types of white blood cells
US20080202217A1 (en) * 2005-02-10 2008-08-28 Chempaq A/S Dual Sample Cartridge and Method for Characterizing Particles in Liquid
US8028566B2 (en) 2005-02-10 2011-10-04 Chempaq A/S Dual sample cartridge and method for characterizing particles in liquid
US8573033B2 (en) 2005-02-10 2013-11-05 Koninklijke Philips N.V. Method for characterizing particles in liquid using a dual sample cartridge
US20120103091A1 (en) * 2009-06-08 2012-05-03 Sms Siemag Aktiengesellschaft Method and device for detecting contaminants in a fluid
US8875564B2 (en) * 2009-06-08 2014-11-04 Hydac Filter Systems Gmbh Method and device for detecting contaminants in a fluid

Also Published As

Publication number Publication date
FR2244989B1 (fr) 1976-10-22
DE2445411C2 (de) 1984-08-09
DE2445411A1 (de) 1975-05-07
JPS5061269A (fr) 1975-05-26
SE409246B (sv) 1979-08-06
GB1479901A (en) 1977-07-13
NL7412562A (nl) 1975-04-01
JPS5522734B2 (fr) 1980-06-18
CA1007704A (en) 1977-03-29
FR2244989A1 (fr) 1975-04-18
SE7411921L (sv) 1975-03-27

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