US3852596A - Cold cathode gaseous discharge device for producing electrons in an x-ray fluorescence analysis apparatus - Google Patents

Cold cathode gaseous discharge device for producing electrons in an x-ray fluorescence analysis apparatus Download PDF

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Publication number
US3852596A
US3852596A US00338869A US33886973A US3852596A US 3852596 A US3852596 A US 3852596A US 00338869 A US00338869 A US 00338869A US 33886973 A US33886973 A US 33886973A US 3852596 A US3852596 A US 3852596A
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United States
Prior art keywords
chamber
channel
gas
enclosure
cathode
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Expired - Lifetime
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US00338869A
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English (en)
Inventor
E Houtman
J Siekman
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US Philips Corp
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US Philips Corp
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Priority to US00338869A priority Critical patent/US3852596A/en
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Publication of US3852596A publication Critical patent/US3852596A/en
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    • CCHEMISTRY; METALLURGY
    • C11ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
    • C11DDETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
    • C11D3/00Other compounding ingredients of detergent compositions covered in group C11D1/00
    • C11D3/0005Other compounding ingredients characterised by their effect
    • C11D3/0052Gas evolving or heat producing compositions
    • CCHEMISTRY; METALLURGY
    • C11ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
    • C11DDETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
    • C11D3/00Other compounding ingredients of detergent compositions covered in group C11D1/00
    • C11D3/16Organic compounds
    • C11D3/38Products with no well-defined composition, e.g. natural products
    • C11D3/386Preparations containing enzymes, e.g. protease or amylase
    • C11D3/38672Granulated or coated enzymes
    • CCHEMISTRY; METALLURGY
    • C11ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
    • C11DDETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
    • C11D7/00Compositions of detergents based essentially on non-surface-active compounds
    • C11D7/02Inorganic compounds
    • C11D7/04Water-soluble compounds
    • C11D7/10Salts
    • C11D7/12Carbonates bicarbonates
    • CCHEMISTRY; METALLURGY
    • C11ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
    • C11DDETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
    • C11D7/00Compositions of detergents based essentially on non-surface-active compounds
    • C11D7/22Organic compounds
    • C11D7/26Organic compounds containing oxygen
    • C11D7/265Carboxylic acids or salts thereof
    • CCHEMISTRY; METALLURGY
    • C11ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
    • C11DDETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
    • C11D7/00Compositions of detergents based essentially on non-surface-active compounds
    • C11D7/22Organic compounds
    • C11D7/26Organic compounds containing oxygen
    • C11D7/267Heterocyclic compounds
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J35/00X-ray tubes
    • H01J35/02Details
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00Investigating materials by wave or particle radiation
    • G01N2223/07Investigating materials by wave or particle radiation secondary emission
    • G01N2223/076X-ray fluorescence

Definitions

  • the invention has for its object to mitigate the disadvantages of the known arrangement.
  • the ele'ctron beam emerging from the cathode is guided through a hollow cylinder, behind which the specimen is located in an equipotential space so that the electrons travel along substantially straight paths, while the gas pressure is of the order of to 10" Torr.
  • the anode is formed by a hollow cylinder, the communication between the discharge space and the space accommodating the specimen is so large that the degree of vacuum in both spaces'is the same.
  • the communication has such a flow resistance that impurities originating from the specimen can penetrate only with difficulty into the discharge space between the anode and the cathode. Also higher gas expulsions from the specimen can hardly affect the discharge.
  • the specimen space may be traversed, if desired, by a flushing gas of the same pressure as required in the discharge space, if necessary with addition of'flushing gasthrough the discharge space.
  • the arrangement embodying the invention it is possible, for example, to dispose in the specimen space a sample of a steel melt shortly after solidifience to the drawing, which shows schematically a device embodying the invention.
  • the grid is connected via a capacitor 19 and a resistor 20 to the cathode.
  • a direct voltage of 15 to 30 kV is applied to the terminals 21.
  • the grid 5 takes a charge of 2 to 4,kV positive to the cathode.
  • the discharge current is 1 to 2 mA and satisfactorily stable owing to the self-adjusting grid.

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  • Chemical & Material Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Organic Chemistry (AREA)
  • Engineering & Computer Science (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Oil, Petroleum & Natural Gas (AREA)
  • Wood Science & Technology (AREA)
  • Health & Medical Sciences (AREA)
  • Emergency Medicine (AREA)
  • Inorganic Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
US00338869A 1970-03-20 1973-03-07 Cold cathode gaseous discharge device for producing electrons in an x-ray fluorescence analysis apparatus Expired - Lifetime US3852596A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
US00338869A US3852596A (en) 1970-03-20 1973-03-07 Cold cathode gaseous discharge device for producing electrons in an x-ray fluorescence analysis apparatus

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
NL7003972.A NL157144B (nl) 1970-03-20 1970-03-20 Inrichting voor materiaalonderzoek door middel van roentgenfluorescentie.
US12139271A 1971-03-05 1971-03-05
US00338869A US3852596A (en) 1970-03-20 1973-03-07 Cold cathode gaseous discharge device for producing electrons in an x-ray fluorescence analysis apparatus

Publications (1)

Publication Number Publication Date
US3852596A true US3852596A (en) 1974-12-03

Family

ID=19809628

Family Applications (1)

Application Number Title Priority Date Filing Date
US00338869A Expired - Lifetime US3852596A (en) 1970-03-20 1973-03-07 Cold cathode gaseous discharge device for producing electrons in an x-ray fluorescence analysis apparatus

Country Status (7)

Country Link
US (1) US3852596A (OSRAM)
JP (1) JPS5213113B1 (OSRAM)
CA (1) CA935568A (OSRAM)
DE (1) DE2110323C3 (OSRAM)
FR (1) FR2083464B1 (OSRAM)
GB (1) GB1330948A (OSRAM)
NL (1) NL157144B (OSRAM)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4119855A (en) * 1977-07-08 1978-10-10 Massachusetts Institute Of Technology Non vacuum soft x-ray lithographic source

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* Cited by examiner, † Cited by third party
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US20060061008A1 (en) 2004-09-14 2006-03-23 Lee Karner Mounting assembly for vehicle interior mirror
US7881496B2 (en) 2004-09-30 2011-02-01 Donnelly Corporation Vision system for vehicle
US7720580B2 (en) 2004-12-23 2010-05-18 Donnelly Corporation Object detection system for vehicle
US7914187B2 (en) 2007-07-12 2011-03-29 Magna Electronics Inc. Automatic lighting system with adaptive alignment function
US20100020170A1 (en) 2008-07-24 2010-01-28 Higgins-Luthman Michael J Vehicle Imaging System
EP2401176B1 (en) 2009-02-27 2019-05-08 Magna Electronics Alert system for vehicle
WO2011014497A1 (en) 2009-07-27 2011-02-03 Magna Electronics Inc. Vehicular camera with on-board microcontroller
WO2011028686A1 (en) 2009-09-01 2011-03-10 Magna Mirrors Of America, Inc. Imaging and display system for vehicle
US9264672B2 (en) 2010-12-22 2016-02-16 Magna Mirrors Of America, Inc. Vision display system for vehicle
US10019841B2 (en) 2011-05-18 2018-07-10 Magna Electronics Inc. Driver assistance systems for vehicle
US9146898B2 (en) 2011-10-27 2015-09-29 Magna Electronics Inc. Driver assist system with algorithm switching
US10457209B2 (en) 2012-02-22 2019-10-29 Magna Electronics Inc. Vehicle vision system with multi-paned view
US10328932B2 (en) 2014-06-02 2019-06-25 Magna Electronics Inc. Parking assist system with annotated map generation

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2924715A (en) * 1956-06-01 1960-02-09 Philips Corp X-ray analysis apparatus
US3155827A (en) * 1960-04-07 1964-11-03 Hilger & Watts Ltd Electron microscope with a secondary electron source utilized for electron probe analysis
US3307066A (en) * 1964-12-21 1967-02-28 First Pennsylvania Banking And Afocal-beam probe system and apparatus
US3346736A (en) * 1964-09-22 1967-10-10 Applied Res Lab Inc Electron probe apparatus having an objective lens with an aperture for restricting fluid flow
US3374349A (en) * 1966-11-14 1968-03-19 Victor G. Macres Electron probe having a specific shortfocal length magnetic lens and light microscope
US3435211A (en) * 1966-01-04 1969-03-25 Stanford Research Inst Gaseous glow discharge tube with cathode means surrounding anode means

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2924715A (en) * 1956-06-01 1960-02-09 Philips Corp X-ray analysis apparatus
US3155827A (en) * 1960-04-07 1964-11-03 Hilger & Watts Ltd Electron microscope with a secondary electron source utilized for electron probe analysis
US3346736A (en) * 1964-09-22 1967-10-10 Applied Res Lab Inc Electron probe apparatus having an objective lens with an aperture for restricting fluid flow
US3307066A (en) * 1964-12-21 1967-02-28 First Pennsylvania Banking And Afocal-beam probe system and apparatus
US3435211A (en) * 1966-01-04 1969-03-25 Stanford Research Inst Gaseous glow discharge tube with cathode means surrounding anode means
US3374349A (en) * 1966-11-14 1968-03-19 Victor G. Macres Electron probe having a specific shortfocal length magnetic lens and light microscope

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4119855A (en) * 1977-07-08 1978-10-10 Massachusetts Institute Of Technology Non vacuum soft x-ray lithographic source

Also Published As

Publication number Publication date
DE2110323C3 (de) 1979-09-06
GB1330948A (en) 1973-09-19
DE2110323A1 (de) 1971-09-30
JPS5213113B1 (OSRAM) 1977-04-12
FR2083464A1 (OSRAM) 1971-12-17
CA935568A (en) 1973-10-16
NL157144B (nl) 1978-06-15
FR2083464B1 (OSRAM) 1973-06-08
DE2110323B2 (de) 1979-01-04
NL7003972A (OSRAM) 1971-09-22

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