US20210331287A1 - Grinding and polishing simulation method and system and grinding and polishing process transferring method - Google Patents
Grinding and polishing simulation method and system and grinding and polishing process transferring method Download PDFInfo
- Publication number
- US20210331287A1 US20210331287A1 US17/135,729 US202017135729A US2021331287A1 US 20210331287 A1 US20210331287 A1 US 20210331287A1 US 202017135729 A US202017135729 A US 202017135729A US 2021331287 A1 US2021331287 A1 US 2021331287A1
- Authority
- US
- United States
- Prior art keywords
- grinding
- workpiece
- polishing
- polishing apparatus
- model
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000005498 polishing Methods 0.000 title claims abstract description 167
- 238000000034 method Methods 0.000 title claims abstract description 87
- 238000004088 simulation Methods 0.000 title claims abstract description 56
- 238000007517 polishing process Methods 0.000 title claims abstract description 23
- 238000003754 machining Methods 0.000 claims abstract description 44
- 239000004576 sand Substances 0.000 claims description 18
- 238000012937 correction Methods 0.000 claims description 15
- 239000000463 material Substances 0.000 claims description 12
- 238000009826 distribution Methods 0.000 claims description 9
- 230000003746 surface roughness Effects 0.000 claims description 8
- 238000010586 diagram Methods 0.000 description 10
- 101100015324 Arabidopsis thaliana MUR1 gene Proteins 0.000 description 6
- 238000004519 manufacturing process Methods 0.000 description 4
- 238000012545 processing Methods 0.000 description 3
- 238000012546 transfer Methods 0.000 description 3
- 101100015321 Arabidopsis thaliana GMD1 gene Proteins 0.000 description 2
- 238000013404 process transfer Methods 0.000 description 2
- 238000011161 development Methods 0.000 description 1
- 238000006073 displacement reaction Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B13/00—Adaptive control systems, i.e. systems automatically adjusting themselves to have a performance which is optimum according to some preassigned criterion
- G05B13/02—Adaptive control systems, i.e. systems automatically adjusting themselves to have a performance which is optimum according to some preassigned criterion electric
- G05B13/04—Adaptive control systems, i.e. systems automatically adjusting themselves to have a performance which is optimum according to some preassigned criterion electric involving the use of models or simulators
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B51/00—Arrangements for automatic control of a series of individual steps in grinding a workpiece
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/005—Control means for lapping machines or devices
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B1/00—Processes of grinding or polishing; Use of auxiliary equipment in connection with such processes
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F30/00—Computer-aided design [CAD]
- G06F30/20—Design optimisation, verification or simulation
-
- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B17/00—Systems involving the use of models or simulators of said systems
Definitions
- the disclosure relates in general to a simulation method, a simulation method system and a process transfer method, and more particularly to a grinding and polishing simulation method, a grinding and polishing simulation system and a grinding and polishing process transferring method.
- the disclosure is directed to a grinding and polishing simulation method, a grinding and polishing simulation system and a grinding and polishing process transferring method.
- a grinding and polishing simulation method is provided.
- a sensing information of a grinding and polishing apparatus when grinding or polishing a workpiece is obtained.
- a plurality of model parameters is identified according to the sensing information.
- At least one quality parameter is calculated according to a machining path, a plurality of process parameters and the model parameters.
- a grinding and polishing simulation system includes a sensing unit, an identification unit and a simulation unit.
- the sensing unit is configured to obtain a sensing information of a grinding and polishing apparatus when grinding or polishing a workpiece.
- the identification unit is configured to identify a plurality of model parameters according to the sensing information.
- the simulation unit is configured to calculate at least one quality parameter according to a machining path, a plurality of process parameters and the model parameters.
- a grinding and polishing process transferring method is provided.
- a first simulated environment corresponding to a first real environment is created, wherein the first real environment includes a first grinding and polishing apparatus and a first robot, and the first simulated environment includes a first grinding and polishing apparatus physical model and a first workpiece physical model.
- a first sensing information of the first grinding and polishing apparatus and the first robot when grinding or polishing a first workpiece is obtained.
- a plurality of first model parameters is identified according to the first sensing information.
- a first machining path, a plurality of first process parameters and the first model parameters are inputted to the first grinding and polishing apparatus physical model and the first workpiece physical model to calculate at least one first quality parameter.
- a second simulated environment corresponding to a second real environment is created, wherein the second real environment includes a second grinding and polishing apparatus and a second robot, and the second simulated environment includes a second grinding and polishing apparatus physical model and a second workpiece physical model.
- a first calibration information associated with the first grinding and polishing apparatus and the first robot is obtained, a second calibration information associated with the second grinding and polishing apparatus and the second robot is obtained, and the first simulated environment and the second simulated environment are calibrated according to the first calibration information and the second calibration information respectively.
- the first simulated environment and the second simulated environment are analyzed to obtain a difference information.
- At least one part of the first machining path, the first process parameters and the first model parameters are inputted to the second grinding and polishing apparatus physical model and the second workpiece physical model according to the difference information to simulate the operation of grinding or polishing a second workpiece by the second grinding and polishing apparatus and the second robot and to calculate at least one second quality parameter.
- FIG. 1 is a schematic diagram of a grinding and polishing simulation system, a grinding and polishing apparatus, a robot, and a workpiece.
- FIG. 2 is a flowchart of a grinding and polishing simulation method according to an embodiment of the present disclosure.
- FIG. 3 is a flowchart of sub-steps of step S 110 and S 120 according to an embodiment of the present disclosure.
- FIG. 4 is a schematic diagram of a region defined by an identification unit according to an embodiment of the present disclosure.
- FIG. 5 is a flowchart of sub-steps of step S 130 according to an embodiment of the present disclosure.
- FIG. 6 is a schematic diagram of a grinding and polishing apparatus physical model and a workpiece physical model according to an embodiment of the present disclosure.
- FIG. 7 is a flowchart of a grinding and polishing process transferring method according to an embodiment of the present disclosure.
- FIG. 8 is a schematic diagram of a grinding and polishing process transfer according to an embodiment of the present disclosure.
- FIG. 9 is a schematic diagram of a first workpiece and a second workpiece according to an embodiment of the present disclosure.
- the grinding and polishing simulation system 100 includes a sensing unit 110 , an identification unit 120 , a simulation unit 130 , a machining path generation unit 140 and an input interface 150 .
- the sensing unit 110 which can be a force sensor, a displacement sensor, a surface roughness meter or a vision sensor, is configured to sense various sensing information SI of a grinding and polishing apparatus 200 and a robot 300 when grinding or polishing the workpiece 400 .
- the identification unit 120 , the simulation unit 130 and the machining path generation unit 140 can be realized by a circuit, a chip, or a circuit board.
- the input interface 150 can be realized by a touch screen, or a keyboard.
- FIG. 2 is a flowchart of a grinding and polishing simulation method according to an embodiment of the present disclosure.
- step S 110 a sensing information SI of the grinding and polishing apparatus 200 when grinding or polishing the workpiece 400 is obtained by the sensing unit 110 .
- the robot 300 grasps the workpiece 400 to touch the grinding and polishing apparatus 200 to perform a grinding and polishing operation.
- the robot 300 can also grasp the grinding and polishing apparatus 200 to touch the workpiece 400 to perform a grinding and polishing operation (not illustrated).
- the method of the present disclosure can be used in the two arrangements disclosed above but is not limited thereto.
- the sensing unit 110 only needs to obtain the sensing information SI of the grinding and polishing apparatus 200 and the workpiece 400 and does not need to obtain the sensing information of the robot 300 .
- the sensing information SI include six-axis force information, geometric variation, surface roughness, or surface state of the workpiece.
- step S 120 a plurality of model parameters MP is identified by the identification unit 120 according to the sensing information SI.
- Steps S 110 and S 120 include steps S 121 to S 127 .
- a region R is defined by the identification unit 120 .
- FIG. 4 a schematic diagram of a region R defined by an identification unit 120 according to an embodiment of the present disclosure is shown. Furthermore, the identification unit 120 , based on the touch position between the workpiece 400 and the grinding and polishing apparatus 200 , sets the region R including the said touch position and the vicinity thereof.
- the region R can be a cube, a sphere or other shapes.
- the robot 300 guides the workpiece 400 to move relative to the grinding and polishing apparatus 200 . That is, the robot 300 grasps the workpiece 400 to move on the grinding and polishing apparatus 200 (in other words, part in hand) or the robot 300 grasps the grinding and polishing apparatus 200 to move on the workpiece 400 (in other words, tool in hand).
- step S 122 the sensing information SI of a plurality of touch points TP in the region R, on which the workpiece 400 is guided by the robot 300 to move relative to the grinding and polishing apparatus 200 , is received from the sensing unit 110 by the identification unit 120 . Furthermore, the sensing unit 110 obtains the sensing information SI of each of the touch points TP, and the identification unit 120 receives the sensing information SI.
- the predictive value of a quality parameter is calculated by the identification unit 120 according to the set value of the model parameter corresponding to the quality parameter.
- the identification unit 120 needs to calculate the predictive value of the quality parameter according to a pre-arbitrarily set value of a model parameter.
- the set value of the model parameter is such as the set value of the geometric parameter, the set value of the sand belt tension, the set value of the deformation correction parameter, or the set value of the wear correction parameter of the grinding and polishing apparatus 200 and the workpiece 400 .
- the predictive value of the quality parameter is such as the predictive value of the normal/tangential force distribution, the predictive value of the material removal rate, the predictive value of the surface roughness, or the predictive value of the coverage. Since the predictive value of the quality parameter and the set value of the model parameter are associated with each other, the predictive value of a quality parameter can be calculated according to the set value of the model parameter corresponding to the quality parameter.
- step S 124 whether the error between the predictive value of the quality parameter and the real sensing information SI is lower than a threshold value is calculated by the identification unit 120 . If yes, the method proceeds to step S 127 ; otherwise, the method proceeds to step S 125 .
- the identification unit 120 analyzes the quality parameter corresponding to the real sensing information SI. For example, the identification unit 120 analyzes the normal/tangential force distribution corresponding to the six-axis force information, analyzes the material removal rate corresponding to the workpiece geometric variation, and analyzes the coverage corresponding to the surface state of the workpiece.
- the identification unit 120 calculates whether the error between the predictive value of the quality parameter and the quality parameter corresponding to the real sensing information SI is lower than a threshold value, For example, the identification unit 120 calculates whether the root mean square error (RMSE), the mean square error (MSE), the mean absolute error (MAE), the mean absolute percentage error (MAPE) or the symmetric mean absolute percentage error (SMAPE) between the predictive value of the quality parameter and the real sensing information SI of the quality parameter is lower than a threshold value, wherein the setting of the threshold value depends on the situations.
- RMSE root mean square error
- MSE mean square error
- MAE mean absolute error
- MAPE mean absolute percentage error
- SMAPE symmetric mean absolute percentage error
- step S 123 If the error between the predictive value of the quality parameter and the real sensing information SI is lower than the threshold value, this implies that the set value of the model parameter of step S 123 is suitable. Then, the method proceeds to step S 127 , the set value of the model parameter is defined as the model parameter MP finally adopted by the identification unit 120 , and the method proceeds to step S 130 .
- step S 123 If the error between the predictive value of the quality parameter and the real sensing information SI is not lower than the threshold value, this implies that the set value of the model parameter of step S 123 is not suitable, and the method proceeds to step S 125 .
- step S 125 whether the count of updating the set value of the model parameter is greater than a predetermined count is determined by the identification unit 120 , wherein the setting of the predetermined count depends on the situations. If yes, this implies that the error between the predictive value of the quality parameter and the real sensing information SI is not lower than the threshold value within the predetermined count, and the method returns to step S 122 to obtain another sensing information SI and perform subsequent steps; otherwise, this implies that the count of updating the set value of the model parameter is still within the predetermined count, and the method proceeds to step S 126 .
- step S 126 the set value of the model parameter is updated by the identification unit 120 .
- the identification unit 120 updates the set value of the geometric parameter, the set value of the sand belt tension, the set value of the deformation correction parameter, or the set value of the wear correction parameter of the grinding and polishing apparatus 200 and the workpiece 400 .
- the method returns to step S 123 , the updated predictive value of the quality parameter is calculated by the identification unit 120 according to the updated set value of the model parameter corresponding to the quality parameter.
- the method proceeds to step S 124 , whether the error between the updated predictive value of the quality parameter and the real sensing information SI is lower than a threshold value is calculated by the identification unit 120 .
- steps S 123 to S 126 form a recursive process which will be repeated until the error between the predictive value of the quality parameter and the real sensing information SI calculated according to the set value of the model parameter is lower than the threshold value (step S 124 ), or until the count of updating the set value of the model parameter is greater than the predetermined count (step S 125 ).
- step S 125 when the identification unit 120 determines that the count of updating the set value of the model parameter is greater than the predetermined count, this implies that the initial set value of the model parameter is not selected properly, therefore the set value of the model parameter will not converge regardless how many times the set value of the model parameter has been updated (that is, despite that the count of repeating steps S 123 to S 126 is over the predetermined count, the error is still not lower than the threshold value). Under such circumstance, the method needs to return to step S 122 of obtaining the sensing information SI to select an initial set value and start the next recursive process of error comparison.
- step S 130 at least one quality parameter QP is calculated by the simulation unit 130 according to the machining path PT, the process parameters PP and the model parameters MP.
- the machining path PT is generated by the machining path generation unit 140 according to the workpiece 400 , wherein the machining path PT is generated by an off-line programming code.
- the process parameters PP are inputted by an on-site person through the input interface 150 .
- the machining path PT can also be inputted by an on-site person through the input interface 150 .
- the process parameters PP are such as grinding and polishing touch points, sand belt number, workpiece speed, sand belt/polisher speed, feed depth, workpiece material, or original surface quality of the workpiece.
- the model parameters MP are such as geometric parameter, sand belt tension, deformation correction parameter, or wear correction parameter of the grinding and polishing apparatus 200 and the workpiece 400 .
- the at least one quality parameter QP is such as normal/tangential force distribution, material removal rate, surface roughness, or coverage.
- the grinding and polishing simulation system 100 further includes an external sensing unit (not illustrated), through which the grinding and polishing simulation system 100 can directly obtain the model parameters MP from the grinding and polishing apparatus 200 and the workpiece 400 . Then, as indicated in FIG. 1 , the simulation unit 130 calculates at least one quality parameter QP according to the machining path PT, the process parameters PP and the model parameters MP.
- Step S 130 includes steps S 131 to S 133 .
- step S 131 a grinding and polishing apparatus physical model is created by the simulation unit 130 according to the grinding and polishing apparatus 200 .
- step S 132 a workpiece physical model is created by the simulation unit 130 according to the workpiece 400 .
- step S 131 and step S 132 can be performed concurrently or consecutively. As indicated in FIG. 5 , step S 131 is performed before step S 132 , but this order is for exemplarily rather than restrictive purpose.
- FIG. 6 a schematic diagram of a grinding and polishing apparatus physical model 210 and a workpiece physical model 410 according to an embodiment of the present disclosure is shown.
- the grinding and polishing apparatus physical model 210 and the workpiece physical model 410 include known parameters as follows:
- the method proceeds to step S 133 , the machining path PT, the process parameters PP and model parameters MP are inputted to the grinding and polishing apparatus physical model 210 and the workpiece physical model 410 by the simulation unit 130 to calculate at least one quality parameter QP.
- the quality parameter QP be the normal/tangential force distribution.
- the two-dimensional normal/tangential force distribution F 2D and the three-dimensional normal/tangential force distribution F 3D can be obtained according to formula 1 and formula 2 respectively:
- T represents a sand belt tension (model parameter MP)
- ⁇ represents a grinding depth (machining path PT).
- the quality parameter QP be the material removal rate ⁇ ij .
- the material removal rate ⁇ ij can be obtained according to formula 3:
- C A represents a fixed calibration parameter (model parameters MP)
- K A represents a parameter relevant to the workpiece material and the sand belt number (model parameter MP)
- K t represents a wear correction parameter (model parameter MP)
- V b represents a sand belt/polisher speed (process parameter PP)
- V w represent a workpiece speed (process parameter PP)
- ⁇ , ⁇ , ⁇ represent calibration factors (model parameters MP).
- model parameters can be identified immediately and at least one quality parameter can be calculated during the grinding and polishing process.
- the present disclosure can adjust various device parameters without using a large amount of labor and time.
- FIG. 7 is a flowchart of a grinding and polishing process transferring method according to an embodiment of the present disclosure.
- FIG. 8 is a schematic diagram of a grinding and polishing process transfer according to an embodiment of the present disclosure.
- step S 210 a first simulated environment EV 1 corresponding to a first real environment is created, wherein the first real environment includes a first grinding and polishing apparatus 2001 and a first the robot 3001 , and the first simulated environment EV 1 includes a first grinding and polishing apparatus physical model GMD 1 and a first workpiece physical model WMD 1 .
- step S 220 the grinding and polishing simulation method is performed in the first simulated environment EV 1 .
- the grinding and polishing simulation method of the present step is similar to the grinding and polishing simulation method of FIG. 2 to FIG. 4 . That is, a first sensing information of the first grinding and polishing apparatus 2001 and the first the robot 3001 when grinding or polishing a first workpiece 4001 is obtained; a plurality of first model parameters is identified according to the first sensing information; a first machining path, a plurality of first process parameters and the first model parameters are outputted to the first grinding and polishing apparatus physical model GMD 1 and the first workpiece physical model WMD 1 to calculate at least one first quality parameter.
- step S 230 a second simulated environment EV 2 corresponding to a second real environment is created, wherein the second real environment includes a second grinding and polishing apparatus 2002 and a second robot 3002 , and the second simulated environment EV 2 includes a second grinding and polishing apparatus physical model GMD 2 and a second workpiece physical model WMD 2 .
- step S 240 the first simulated environment EV 1 and the second simulated environment EV 2 are calibrated. Firstly, a first calibration information associated with the first grinding and polishing apparatus 2001 and the first the robot 3001 is obtained, a second calibration information associated with the second grinding and polishing apparatus 2002 and the second robot 3002 is obtained, and the first simulated environment EV 1 and the second simulated environment EV 2 are calibrated according to the first calibration information and the second calibration information respectively.
- the first calibration information is, for example, a position calibration of the first the robot 3001 and the first grinding and polishing apparatus 2001 , a size calibration of the gripper unit of the first the robot 3001 , a variation correction of the first workpiece 4001 , or additional rotation axis calibration of the first grinding and polishing apparatus 2001 .
- the second calibration information is, for example, a position calibration of the second robot 3002 and the second grinding and polishing apparatus 2002 , a size calibration of the gripper unit of the second robot 3002 , a variation correction of the second workpiece 4002 , or additional rotation axis calibration of the second grinding and polishing apparatus 2002 .
- step S 250 the first simulated environment EV 1 and the second simulated environment EV 2 are analyzed to obtain a difference information.
- the difference information is, for example, the geometric difference between the geometry of the first workpiece 4001 and the geometry of the second workpiece 4002 or the configuration difference between the configuration of the first the robot 3001 and the first grinding and polishing apparatus 2001 and the configuration of the second robot 3002 and the second grinding and polishing apparatus 2002 .
- step S 260 the grinding and polishing process is transferred to the second simulated environment EV 2 from the first simulated environment EV 1 according to the difference information. Furthermore, at least one part of the first machining path, the first process parameters and the first model parameters are inputted to the second grinding and polishing apparatus physical model GMD 2 and the second workpiece physical model WMD 2 according to the difference information to simulate the operation of grinding or polishing the second workpiece 4002 by the second grinding and polishing apparatus 2002 and the second robot 3002 and to calculate at least one second quality parameter.
- the first machining path is such as the workpiece machining path or the robot machining path. Furthermore, there is a correspondence relation between the workpiece machining path and the robot machining path, and the workpiece machining path can be transferred to a corresponding robot machining path according to the type of the robot. Detailed descriptions of the difference information are disclosed below.
- the difference information is that the first workpiece 4001 and the second workpiece 4002 are the same, and the configuration of the first the robot 3001 and the first grinding and polishing apparatus 2001 and the configuration of the second robot 3002 and the second grinding and polishing apparatus 2002 are also the same, the first machining path, the first process parameters and the first model parameters are inputted to the second grinding and polishing apparatus physical model GMD 2 and the second workpiece physical model WMD 2 to simulate the operation of grinding or polishing the second workpiece 4002 by the second grinding and polishing apparatus 2002 and the second robot 3002 and to calculate at least one second quality parameter.
- the difference information is that the first workpiece 4002 and the second workpiece 4002 are the same, but the configuration of the first the robot 3001 and the first grinding and polishing apparatus 2001 and the configuration of the second robot 3002 and the second grinding and polishing apparatus 2002 are different, a plurality of second model parameters is identified in the second simulated environment EV 2 , and the first machining path, the first process parameters and the second model parameters are inputted to the second grinding and polishing apparatus physical model GMD 2 and the second workpiece physical model WMD 2 to simulate the operation of grinding or polishing the second workpiece 4002 by the second grinding and polishing apparatus 2002 and the second robot 3002 and to calculate at least one second quality parameter.
- a plurality of second model parameters is identified in the second simulated environment EV 2 , the first workpiece 4001 is compared with the second workpiece 4002 to obtain an identical part between the first workpiece 4001 and the second workpiece 4002 , and the first machining path corresponding to the identical part, the first process parameter corresponding to the identical part, and the second model parameters are inputted to the second grinding and polishing apparatus physical model GMD 2 and the second workpiece physical model WMD 2 to simulate the operation of grinding or polishing the second workpiece 4002 by the second grinding and polishing apparatus 2002 and the second robot 3002 and to calculate at least one second quality parameter.
- the identical part between the first workpiece 4001 and the second workpiece 4002 are disclosed below.
- the first workpiece 4001 includes a first part 4001 - 1 and a second part 4001 - 2 .
- the second workpiece 4002 includes a first part 4002 - 1 and a second part 4002 - 2 .
- the first part 4001 - 1 of the the first workpiece 4001 is identical to the second part 4002 - 1 of the second workpiece 4002 , and both the first part 4001 - 1 and the second part 4002 - 1 are a cylinder.
- the first machining path corresponding to the first part 4001 - 1 of the first workpiece 4001 and the first process parameter corresponding to the first part 4001 - 1 of the first workpiece 4001 are inputted to the second grinding and polishing apparatus physical model GMD 2 and the second workpiece physical model WMD 2 .
- the grinding and polishing process can be transferred between different production lines according to the commonality and difference information between different production lines.
Landscapes
- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Physics & Mathematics (AREA)
- Theoretical Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Evolutionary Computation (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Software Systems (AREA)
- Medical Informatics (AREA)
- Artificial Intelligence (AREA)
- Automation & Control Theory (AREA)
- Computer Hardware Design (AREA)
- Geometry (AREA)
- General Engineering & Computer Science (AREA)
- Health & Medical Sciences (AREA)
- Constituent Portions Of Griding Lathes, Driving, Sensing And Control (AREA)
- Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
Abstract
Description
- This application claims the benefits of U.S. provisional application Ser. No. 63/013,602, filed Apr. 22, 2020 and Taiwan application Serial No. 109138813, filed Nov. 6, 2020, the disclosures of which are incorporated by reference herein in its entirety.
- The disclosure relates in general to a simulation method, a simulation method system and a process transfer method, and more particularly to a grinding and polishing simulation method, a grinding and polishing simulation system and a grinding and polishing process transferring method.
- Along with the industrial development, many processing processes are already automatized, particularly a large amount of labor in the grinding and polishing process has now been replaced with robotic arms or robots. Although the grinding and polishing process has gradually become automatized, tedious labor is still required to adjust various device parameters to meet the processing requirements and the device configurations of different products, such that the processing quality can be assured. On the other hand, existing technology is still unable to transfer the grinding and polishing process between the production lines.
- Therefore, it has become a prominent task for the industry to provide a simulation system and method, which, through the simulation of the grinding and polishing process, resolves the problem that the adjustment of device parameters takes a large amount of labor and time, and to provide a process transfer method to resolve the problem that the grinding and polishing process cannot be transferred between the production lines.
- The disclosure is directed to a grinding and polishing simulation method, a grinding and polishing simulation system and a grinding and polishing process transferring method.
- According to one embodiment, a grinding and polishing simulation method is provided. A sensing information of a grinding and polishing apparatus when grinding or polishing a workpiece is obtained. A plurality of model parameters is identified according to the sensing information. At least one quality parameter is calculated according to a machining path, a plurality of process parameters and the model parameters.
- According to another embodiment, a grinding and polishing simulation system is provided. The grinding and polishing simulation system includes a sensing unit, an identification unit and a simulation unit. The sensing unit is configured to obtain a sensing information of a grinding and polishing apparatus when grinding or polishing a workpiece. The identification unit is configured to identify a plurality of model parameters according to the sensing information. The simulation unit is configured to calculate at least one quality parameter according to a machining path, a plurality of process parameters and the model parameters.
- According to an alternative embodiment, a grinding and polishing process transferring method is provided. A first simulated environment corresponding to a first real environment is created, wherein the first real environment includes a first grinding and polishing apparatus and a first robot, and the first simulated environment includes a first grinding and polishing apparatus physical model and a first workpiece physical model. A first sensing information of the first grinding and polishing apparatus and the first robot when grinding or polishing a first workpiece is obtained. A plurality of first model parameters is identified according to the first sensing information. A first machining path, a plurality of first process parameters and the first model parameters are inputted to the first grinding and polishing apparatus physical model and the first workpiece physical model to calculate at least one first quality parameter. A second simulated environment corresponding to a second real environment is created, wherein the second real environment includes a second grinding and polishing apparatus and a second robot, and the second simulated environment includes a second grinding and polishing apparatus physical model and a second workpiece physical model. A first calibration information associated with the first grinding and polishing apparatus and the first robot is obtained, a second calibration information associated with the second grinding and polishing apparatus and the second robot is obtained, and the first simulated environment and the second simulated environment are calibrated according to the first calibration information and the second calibration information respectively. The first simulated environment and the second simulated environment are analyzed to obtain a difference information. At least one part of the first machining path, the first process parameters and the first model parameters are inputted to the second grinding and polishing apparatus physical model and the second workpiece physical model according to the difference information to simulate the operation of grinding or polishing a second workpiece by the second grinding and polishing apparatus and the second robot and to calculate at least one second quality parameter.
- The above and other aspects of the disclosure will become understood with regard to the following detailed description of the preferred but non-limiting embodiment(s). The following description is made with reference to the accompanying drawings.
-
FIG. 1 is a schematic diagram of a grinding and polishing simulation system, a grinding and polishing apparatus, a robot, and a workpiece. -
FIG. 2 is a flowchart of a grinding and polishing simulation method according to an embodiment of the present disclosure. -
FIG. 3 is a flowchart of sub-steps of step S110 and S120 according to an embodiment of the present disclosure. -
FIG. 4 is a schematic diagram of a region defined by an identification unit according to an embodiment of the present disclosure. -
FIG. 5 is a flowchart of sub-steps of step S130 according to an embodiment of the present disclosure. -
FIG. 6 is a schematic diagram of a grinding and polishing apparatus physical model and a workpiece physical model according to an embodiment of the present disclosure. -
FIG. 7 is a flowchart of a grinding and polishing process transferring method according to an embodiment of the present disclosure. -
FIG. 8 is a schematic diagram of a grinding and polishing process transfer according to an embodiment of the present disclosure. -
FIG. 9 is a schematic diagram of a first workpiece and a second workpiece according to an embodiment of the present disclosure. - In the following detailed description, for purposes of explanation, numerous specific details are set forth in order to provide a thorough understanding of the disclosed embodiments. It will be apparent, however, that one or more embodiments may be practiced without these specific details. In other instances, well-known structures and devices are schematically shown in order to simplify the drawing.
- Referring to
FIG. 1 , a schematic diagram of a grinding andpolishing simulation system 100, a grinding andpolishing apparatus 200, arobot 300, and aworkpiece 400 is shown. The grinding andpolishing simulation system 100 includes asensing unit 110, anidentification unit 120, asimulation unit 130, a machiningpath generation unit 140 and aninput interface 150. Thesensing unit 110, which can be a force sensor, a displacement sensor, a surface roughness meter or a vision sensor, is configured to sense various sensing information SI of a grinding andpolishing apparatus 200 and arobot 300 when grinding or polishing theworkpiece 400. Theidentification unit 120, thesimulation unit 130 and the machiningpath generation unit 140 can be realized by a circuit, a chip, or a circuit board. Theinput interface 150 can be realized by a touch screen, or a keyboard. - Refer to
FIGS. 1 and 2 .FIG. 2 is a flowchart of a grinding and polishing simulation method according to an embodiment of the present disclosure. In step S110, a sensing information SI of the grinding andpolishing apparatus 200 when grinding or polishing theworkpiece 400 is obtained by thesensing unit 110. InFIG. 1 , therobot 300 grasps theworkpiece 400 to touch the grinding and polishingapparatus 200 to perform a grinding and polishing operation. In an embodiment, therobot 300 can also grasp the grinding andpolishing apparatus 200 to touch theworkpiece 400 to perform a grinding and polishing operation (not illustrated). The method of the present disclosure can be used in the two arrangements disclosed above but is not limited thereto. In the present step, thesensing unit 110 only needs to obtain the sensing information SI of the grinding andpolishing apparatus 200 and theworkpiece 400 and does not need to obtain the sensing information of therobot 300. Examples of the sensing information SI include six-axis force information, geometric variation, surface roughness, or surface state of the workpiece. - In step S120, a plurality of model parameters MP is identified by the
identification unit 120 according to the sensing information SI. Referring toFIG. 3 , a flowchart of sub-steps of step S110 and S120 according to an embodiment of the present disclosure is shown. Steps S110 and S120 include steps S121 to S127. - In step S121, a region R is defined by the
identification unit 120. Referring toFIG. 4 , a schematic diagram of a region R defined by anidentification unit 120 according to an embodiment of the present disclosure is shown. Furthermore, theidentification unit 120, based on the touch position between theworkpiece 400 and the grinding andpolishing apparatus 200, sets the region R including the said touch position and the vicinity thereof. The region R can be a cube, a sphere or other shapes. After the region R is defined by theidentification unit 120, theworkpiece 400 is guided by therobot 300 to move on a plurality of touch points TP in the region R relative to the grinding and polishingapparatus 200. It should be noted that there are two scenarios when therobot 300 guides theworkpiece 400 to move relative to the grinding and polishingapparatus 200. That is, therobot 300 grasps theworkpiece 400 to move on the grinding and polishing apparatus 200 (in other words, part in hand) or therobot 300 grasps the grinding and polishingapparatus 200 to move on the workpiece 400 (in other words, tool in hand). - In step S122, the sensing information SI of a plurality of touch points TP in the region R, on which the
workpiece 400 is guided by therobot 300 to move relative to the grinding and polishingapparatus 200, is received from thesensing unit 110 by theidentification unit 120. Furthermore, thesensing unit 110 obtains the sensing information SI of each of the touch points TP, and theidentification unit 120 receives the sensing information SI. - In step S123, the predictive value of a quality parameter is calculated by the
identification unit 120 according to the set value of the model parameter corresponding to the quality parameter. Theidentification unit 120 needs to calculate the predictive value of the quality parameter according to a pre-arbitrarily set value of a model parameter. The set value of the model parameter is such as the set value of the geometric parameter, the set value of the sand belt tension, the set value of the deformation correction parameter, or the set value of the wear correction parameter of the grinding and polishingapparatus 200 and theworkpiece 400. The predictive value of the quality parameter is such as the predictive value of the normal/tangential force distribution, the predictive value of the material removal rate, the predictive value of the surface roughness, or the predictive value of the coverage. Since the predictive value of the quality parameter and the set value of the model parameter are associated with each other, the predictive value of a quality parameter can be calculated according to the set value of the model parameter corresponding to the quality parameter. - In step S124, whether the error between the predictive value of the quality parameter and the real sensing information SI is lower than a threshold value is calculated by the
identification unit 120. If yes, the method proceeds to step S127; otherwise, the method proceeds to step S125. Firstly, theidentification unit 120 analyzes the quality parameter corresponding to the real sensing information SI. For example, theidentification unit 120 analyzes the normal/tangential force distribution corresponding to the six-axis force information, analyzes the material removal rate corresponding to the workpiece geometric variation, and analyzes the coverage corresponding to the surface state of the workpiece. Then, theidentification unit 120 calculates whether the error between the predictive value of the quality parameter and the quality parameter corresponding to the real sensing information SI is lower than a threshold value, For example, theidentification unit 120 calculates whether the root mean square error (RMSE), the mean square error (MSE), the mean absolute error (MAE), the mean absolute percentage error (MAPE) or the symmetric mean absolute percentage error (SMAPE) between the predictive value of the quality parameter and the real sensing information SI of the quality parameter is lower than a threshold value, wherein the setting of the threshold value depends on the situations. - If the error between the predictive value of the quality parameter and the real sensing information SI is lower than the threshold value, this implies that the set value of the model parameter of step S123 is suitable. Then, the method proceeds to step S127, the set value of the model parameter is defined as the model parameter MP finally adopted by the
identification unit 120, and the method proceeds to step S130. - If the error between the predictive value of the quality parameter and the real sensing information SI is not lower than the threshold value, this implies that the set value of the model parameter of step S123 is not suitable, and the method proceeds to step S125.
- In step S125, whether the count of updating the set value of the model parameter is greater than a predetermined count is determined by the
identification unit 120, wherein the setting of the predetermined count depends on the situations. If yes, this implies that the error between the predictive value of the quality parameter and the real sensing information SI is not lower than the threshold value within the predetermined count, and the method returns to step S122 to obtain another sensing information SI and perform subsequent steps; otherwise, this implies that the count of updating the set value of the model parameter is still within the predetermined count, and the method proceeds to step S126. - In step S126, the set value of the model parameter is updated by the
identification unit 120. For example, theidentification unit 120 updates the set value of the geometric parameter, the set value of the sand belt tension, the set value of the deformation correction parameter, or the set value of the wear correction parameter of the grinding and polishingapparatus 200 and theworkpiece 400. Then, the method returns to step S123, the updated predictive value of the quality parameter is calculated by theidentification unit 120 according to the updated set value of the model parameter corresponding to the quality parameter. Then, the method proceeds to step S124, whether the error between the updated predictive value of the quality parameter and the real sensing information SI is lower than a threshold value is calculated by theidentification unit 120. That is, steps S123 to S126 form a recursive process which will be repeated until the error between the predictive value of the quality parameter and the real sensing information SI calculated according to the set value of the model parameter is lower than the threshold value (step S124), or until the count of updating the set value of the model parameter is greater than the predetermined count (step S125). - In step S125, when the
identification unit 120 determines that the count of updating the set value of the model parameter is greater than the predetermined count, this implies that the initial set value of the model parameter is not selected properly, therefore the set value of the model parameter will not converge regardless how many times the set value of the model parameter has been updated (that is, despite that the count of repeating steps S123 to S126 is over the predetermined count, the error is still not lower than the threshold value). Under such circumstance, the method needs to return to step S122 of obtaining the sensing information SI to select an initial set value and start the next recursive process of error comparison. - Refer to
FIGS. 1 and 2 again. In step S130, at least one quality parameter QP is calculated by thesimulation unit 130 according to the machining path PT, the process parameters PP and the model parameters MP. In the present embodiment, the machining path PT is generated by the machiningpath generation unit 140 according to theworkpiece 400, wherein the machining path PT is generated by an off-line programming code. The process parameters PP are inputted by an on-site person through theinput interface 150. In another embodiment, the machining path PT can also be inputted by an on-site person through theinput interface 150. The process parameters PP are such as grinding and polishing touch points, sand belt number, workpiece speed, sand belt/polisher speed, feed depth, workpiece material, or original surface quality of the workpiece. The model parameters MP are such as geometric parameter, sand belt tension, deformation correction parameter, or wear correction parameter of the grinding and polishingapparatus 200 and theworkpiece 400. The at least one quality parameter QP is such as normal/tangential force distribution, material removal rate, surface roughness, or coverage. In another embodiment, the grinding and polishingsimulation system 100 further includes an external sensing unit (not illustrated), through which the grinding and polishingsimulation system 100 can directly obtain the model parameters MP from the grinding and polishingapparatus 200 and theworkpiece 400. Then, as indicated inFIG. 1 , thesimulation unit 130 calculates at least one quality parameter QP according to the machining path PT, the process parameters PP and the model parameters MP. - Referring to
FIG. 5 , a flowchart of sub-steps of step S130 according to an embodiment of the present disclosure is shown. Step S130 includes steps S131 to S133. - In step S131, a grinding and polishing apparatus physical model is created by the
simulation unit 130 according to the grinding and polishingapparatus 200. In step S132, a workpiece physical model is created by thesimulation unit 130 according to theworkpiece 400. It should be noted that step S131 and step S132 can be performed concurrently or consecutively. As indicated inFIG. 5 , step S131 is performed before step S132, but this order is for exemplarily rather than restrictive purpose. Refer toFIG. 6 , a schematic diagram of a grinding and polishing apparatusphysical model 210 and a workpiecephysical model 410 according to an embodiment of the present disclosure is shown. The grinding and polishing apparatusphysical model 210 and the workpiecephysical model 410 include known parameters as follows: -
- O1, O2: respective center points of two grinding wheels;
- R1, R2: respective radii of the two grinding wheels of the grinding and polishing apparatus;
- r: a local radius of the workpiece on the touch points (not illustrated);
- A, B: touch points between the grinding sand belt and the two grinding wheels at the first time point;
- C: a touch point between the workpiece and the grinding sand belt at the first time point;
- P: a center point of the workpiece at the first time point;
- D, E: touch points between the grinding sand belt and the two grinding wheels at the second time point;
- F, G: touch points between the workpiece and the grinding sand belt at the second time point;
- P′: a center point of the workpiece at the second time point;
- m0: a length from O1 to P;
- n0: a length from O2 to P
- m: a length from O1 to P′
- n: length from O2 to P′
- a: an angle formed by the line connecting O1 and D and the line connecting O1 and P′;
- b: an angle formed by the line connecting O2 and E and the line connecting O2 and P′;
- c: an angle formed by the line connecting O1 and P′ and the line connecting O1 and O2;
- d: an angle formed by the line connecting O2 and P′ and the line connecting O1 and O2;
- L: a distance between the two grinding wheels (O1 to O2)
- Lm0: a length from A to C
- Lth0: √{square root over (L2−(R1−R2)2)}
- Then, the method proceeds to step S133, the machining path PT, the process parameters PP and model parameters MP are inputted to the grinding and polishing apparatus
physical model 210 and the workpiecephysical model 410 by thesimulation unit 130 to calculate at least one quality parameter QP. Let the quality parameter QP be the normal/tangential force distribution. The two-dimensional normal/tangential force distribution F2D and the three-dimensional normal/tangential force distribution F3D can be obtained according to formula 1 and formula 2 respectively: -
F2D=f(T,r,Lm0,δ,R1,R2,L) (formula 1) -
F 3D=∫w 0 F 2D(y)×dy (formula 2) - Wherein, T represents a sand belt tension (model parameter MP), δ represents a grinding depth (machining path PT).
- Let the quality parameter QP be the material removal rate γij. The material removal rate γij can be obtained according to formula 3:
-
- Wherein CA represents a fixed calibration parameter (model parameters MP), KA represents a parameter relevant to the workpiece material and the sand belt number (model parameter MP), Kt represents a wear correction parameter (model parameter MP), Vb represents a sand belt/polisher speed (process parameter PP), Vw represent a workpiece speed (process parameter PP), α, β, γ represent calibration factors (model parameters MP).
- Although the above descriptions are exemplified by the normal/tangential force distribution and the material removal rate, the present disclosure is not limited thereto.
- Through the grinding and polishing simulation method and system of the present disclosure, model parameters can be identified immediately and at least one quality parameter can be calculated during the grinding and polishing process. Thus, the present disclosure can adjust various device parameters without using a large amount of labor and time.
- Refer to
FIGS. 7 and 8 .FIG. 7 is a flowchart of a grinding and polishing process transferring method according to an embodiment of the present disclosure.FIG. 8 is a schematic diagram of a grinding and polishing process transfer according to an embodiment of the present disclosure. - In step S210, a first simulated environment EV1 corresponding to a first real environment is created, wherein the first real environment includes a first grinding and polishing
apparatus 2001 and a first therobot 3001, and the first simulated environment EV1 includes a first grinding and polishing apparatus physical model GMD1 and a first workpiece physical model WMD1. - In step S220, the grinding and polishing simulation method is performed in the first simulated environment EV1. The grinding and polishing simulation method of the present step is similar to the grinding and polishing simulation method of
FIG. 2 toFIG. 4 . That is, a first sensing information of the first grinding and polishingapparatus 2001 and the first therobot 3001 when grinding or polishing afirst workpiece 4001 is obtained; a plurality of first model parameters is identified according to the first sensing information; a first machining path, a plurality of first process parameters and the first model parameters are outputted to the first grinding and polishing apparatus physical model GMD1 and the first workpiece physical model WMD1 to calculate at least one first quality parameter. - In step S230, a second simulated environment EV2 corresponding to a second real environment is created, wherein the second real environment includes a second grinding and polishing
apparatus 2002 and asecond robot 3002, and the second simulated environment EV2 includes a second grinding and polishing apparatus physical model GMD2 and a second workpiece physical model WMD2. - In step S240, the first simulated environment EV1 and the second simulated environment EV2 are calibrated. Firstly, a first calibration information associated with the first grinding and polishing
apparatus 2001 and the first therobot 3001 is obtained, a second calibration information associated with the second grinding and polishingapparatus 2002 and thesecond robot 3002 is obtained, and the first simulated environment EV1 and the second simulated environment EV2 are calibrated according to the first calibration information and the second calibration information respectively. The first calibration information is, for example, a position calibration of the first therobot 3001 and the first grinding and polishingapparatus 2001, a size calibration of the gripper unit of the first therobot 3001, a variation correction of thefirst workpiece 4001, or additional rotation axis calibration of the first grinding and polishingapparatus 2001. The second calibration information is, for example, a position calibration of thesecond robot 3002 and the second grinding and polishingapparatus 2002, a size calibration of the gripper unit of thesecond robot 3002, a variation correction of thesecond workpiece 4002, or additional rotation axis calibration of the second grinding and polishingapparatus 2002. - In step S250, the first simulated environment EV1 and the second simulated environment EV2 are analyzed to obtain a difference information. The difference information is, for example, the geometric difference between the geometry of the
first workpiece 4001 and the geometry of thesecond workpiece 4002 or the configuration difference between the configuration of the first therobot 3001 and the first grinding and polishingapparatus 2001 and the configuration of thesecond robot 3002 and the second grinding and polishingapparatus 2002. - In step S260, the grinding and polishing process is transferred to the second simulated environment EV2 from the first simulated environment EV1 according to the difference information. Furthermore, at least one part of the first machining path, the first process parameters and the first model parameters are inputted to the second grinding and polishing apparatus physical model GMD2 and the second workpiece physical model WMD2 according to the difference information to simulate the operation of grinding or polishing the
second workpiece 4002 by the second grinding and polishingapparatus 2002 and thesecond robot 3002 and to calculate at least one second quality parameter. In the present step, the first machining path is such as the workpiece machining path or the robot machining path. Furthermore, there is a correspondence relation between the workpiece machining path and the robot machining path, and the workpiece machining path can be transferred to a corresponding robot machining path according to the type of the robot. Detailed descriptions of the difference information are disclosed below. - When the difference information is that the
first workpiece 4001 and thesecond workpiece 4002 are the same, and the configuration of the first therobot 3001 and the first grinding and polishingapparatus 2001 and the configuration of thesecond robot 3002 and the second grinding and polishingapparatus 2002 are also the same, the first machining path, the first process parameters and the first model parameters are inputted to the second grinding and polishing apparatus physical model GMD2 and the second workpiece physical model WMD2 to simulate the operation of grinding or polishing thesecond workpiece 4002 by the second grinding and polishingapparatus 2002 and thesecond robot 3002 and to calculate at least one second quality parameter. - When the difference information is that the
first workpiece 4002 and thesecond workpiece 4002 are the same, but the configuration of the first therobot 3001 and the first grinding and polishingapparatus 2001 and the configuration of thesecond robot 3002 and the second grinding and polishingapparatus 2002 are different, a plurality of second model parameters is identified in the second simulated environment EV2, and the first machining path, the first process parameters and the second model parameters are inputted to the second grinding and polishing apparatus physical model GMD2 and the second workpiece physical model WMD2 to simulate the operation of grinding or polishing thesecond workpiece 4002 by the second grinding and polishingapparatus 2002 and thesecond robot 3002 and to calculate at least one second quality parameter. - When the difference information is that the
first workpiece 4001 and thesecond workpiece 4002 are different, and the configuration of the first therobot 3001 and the first grinding and polishingapparatus 2001 and the configuration of thesecond robot 3002 and the second grinding and polishingapparatus 2002 are also different, a plurality of second model parameters is identified in the second simulated environment EV2, thefirst workpiece 4001 is compared with thesecond workpiece 4002 to obtain an identical part between thefirst workpiece 4001 and thesecond workpiece 4002, and the first machining path corresponding to the identical part, the first process parameter corresponding to the identical part, and the second model parameters are inputted to the second grinding and polishing apparatus physical model GMD2 and the second workpiece physical model WMD2 to simulate the operation of grinding or polishing thesecond workpiece 4002 by the second grinding and polishingapparatus 2002 and thesecond robot 3002 and to calculate at least one second quality parameter. Detailed description of the identical part between thefirst workpiece 4001 and thesecond workpiece 4002 are disclosed below. - Referring to
FIG. 9 , a schematic diagram of afirst workpiece 4001 and asecond workpiece 4002 according to an embodiment of the present disclosure is shown. Thefirst workpiece 4001 includes a first part 4001-1 and a second part 4001-2. Thesecond workpiece 4002 includes a first part 4002-1 and a second part 4002-2. The first part 4001-1 of the thefirst workpiece 4001 is identical to the second part 4002-1 of thesecond workpiece 4002, and both the first part 4001-1 and the second part 4002-1 are a cylinder. After the identical part is identified through comparison, the first machining path corresponding to the first part 4001-1 of thefirst workpiece 4001 and the first process parameter corresponding to the first part 4001-1 of thefirst workpiece 4001 are inputted to the second grinding and polishing apparatus physical model GMD2 and the second workpiece physical model WMD2. - Thus, through the grinding and polishing process transferring method of the present disclosure, the grinding and polishing process can be transferred between different production lines according to the commonality and difference information between different production lines.
- It will be apparent to those skilled in the art that various modifications and variations can be made to the disclosed embodiments. It is intended that the specification and examples be considered as exemplary only, with a true scope of the disclosure being indicated by the following claims and their equivalents.
Claims (23)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US17/135,729 US20210331287A1 (en) | 2020-04-22 | 2020-12-28 | Grinding and polishing simulation method and system and grinding and polishing process transferring method |
Applications Claiming Priority (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US202063013602P | 2020-04-22 | 2020-04-22 | |
TW109138813 | 2020-11-06 | ||
TW109138813A TWI763112B (en) | 2020-04-22 | 2020-11-06 | Grinding and polishing simulation method, system and grinding and polishing process transferring method |
US17/135,729 US20210331287A1 (en) | 2020-04-22 | 2020-12-28 | Grinding and polishing simulation method and system and grinding and polishing process transferring method |
Publications (1)
Publication Number | Publication Date |
---|---|
US20210331287A1 true US20210331287A1 (en) | 2021-10-28 |
Family
ID=78221621
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
US17/135,729 Pending US20210331287A1 (en) | 2020-04-22 | 2020-12-28 | Grinding and polishing simulation method and system and grinding and polishing process transferring method |
Country Status (2)
Country | Link |
---|---|
US (1) | US20210331287A1 (en) |
CN (1) | CN113618621B (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN114406809A (en) * | 2022-03-03 | 2022-04-29 | 广州大学 | Method for intelligently designing machining cavity of ultrasonic grinding machine |
CN116341151A (en) * | 2023-05-18 | 2023-06-27 | 贵州大学 | Surface shape error control method for central symmetrical concave surface shape of large-diameter sheet part |
CN117415682A (en) * | 2023-11-29 | 2024-01-19 | 深圳市摆渡微电子有限公司 | Tungsten steel nozzle machining and polishing method and device |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN114800247B (en) * | 2022-04-08 | 2023-04-14 | 东莞市鸿仁自动化设备科技有限公司 | Brush grinding machine control method and device, computer equipment and storage medium |
Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7246023B2 (en) * | 2004-01-26 | 2007-07-17 | Ranko, Llc | Flexible process optimizer |
US20110190916A1 (en) * | 2010-01-29 | 2011-08-04 | Siemens Product Lifecycle Managemet Software Inc. | System and Method for Management of Parameters Using Options and Variants in a Product Lifecycle Management System |
US8051863B2 (en) * | 2007-10-18 | 2011-11-08 | Lam Research Corporation | Methods of and apparatus for correlating gap value to meniscus stability in processing of a wafer surface by a recipe-controlled meniscus |
US20130035781A1 (en) * | 2011-08-03 | 2013-02-07 | Rolls-Royce Plc | Control of a machining operation |
US20200356711A1 (en) * | 2019-05-10 | 2020-11-12 | Coventor, Inc. | System and method for process window optimization in a virtual semiconductor device fabrication environment |
US20220003679A1 (en) * | 2018-11-29 | 2022-01-06 | Basf Se | Prediction of physical properties of superabsorbent polymers |
Family Cites Families (21)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6492273B1 (en) * | 1999-08-31 | 2002-12-10 | Micron Technology, Inc. | Methods and apparatuses for monitoring and controlling mechanical or chemical-mechanical planarization of microelectronic substrate assemblies |
JP3685776B2 (en) * | 2002-07-16 | 2005-08-24 | 川崎重工業株式会社 | Large workpiece automatic finishing method and apparatus |
JP2005088106A (en) * | 2003-09-16 | 2005-04-07 | Canon Inc | Method and apparatus for calculating working data |
JP4319092B2 (en) * | 2004-06-03 | 2009-08-26 | 住友重機械工業株式会社 | Double-sided processing equipment |
US7930058B2 (en) * | 2006-01-30 | 2011-04-19 | Memc Electronic Materials, Inc. | Nanotopography control and optimization using feedback from warp data |
CN101088705B (en) * | 2007-02-14 | 2010-08-25 | 长春设备工艺研究所 | Efficient numerically controlled polishing process and apparatus for great aperture aspherical optical elements |
IT1397985B1 (en) * | 2010-02-08 | 2013-02-04 | Prima Ind Spa | MONITORING PROCEDURE FOR THE QUALITY OF LASER PROCESSING PROCESSES AND ITS SYSTEM |
JP2013094902A (en) * | 2011-11-01 | 2013-05-20 | Nsk Ltd | Control device and control method of grinding machine |
CN203738543U (en) * | 2013-12-18 | 2014-07-30 | 南京德朔实业有限公司 | Belt sander |
CN104889864B (en) * | 2015-05-21 | 2019-02-22 | 天津智通机器人有限公司 | A kind of automatic grinding polishing system |
DE102015119240B3 (en) * | 2015-11-09 | 2017-03-30 | ATENSOR Engineering and Technology Systems GmbH | AUTOMATIC DETECTING AND ROBOT-BASED MACHINING OF SURFACE DEFECTS |
JP6782145B2 (en) * | 2016-10-18 | 2020-11-11 | 株式会社荏原製作所 | Board processing control system, board processing control method, and program |
CN106334993A (en) * | 2016-10-24 | 2017-01-18 | 上海华力微电子有限公司 | Simulating device for chemical machine grinding technology |
KR101781184B1 (en) * | 2017-05-12 | 2017-10-10 | 한봉석 | Method and apparatus for analysis of polishing behavior in CMP process of semiconductor wafer |
WO2019022961A1 (en) * | 2017-07-28 | 2019-01-31 | Applied Materials, Inc. | Method of identifying and tracking roll to roll polishing pad materials during processing |
CN108655898B (en) * | 2018-04-18 | 2020-11-03 | 上海发那科机器人有限公司 | Automatic correction and generation method of faucet polishing program |
CN109202688B (en) * | 2018-08-02 | 2023-09-26 | 华南理工大学 | Constant force grinding device and grinding control method thereof |
CN110118543B (en) * | 2019-04-22 | 2020-07-10 | 武汉理工大学 | Workpiece surface roughness prediction method based on robot disc type polishing |
CN110893579B (en) * | 2019-10-22 | 2021-05-28 | 南京航空航天大学 | Honing surface roughness prediction method considering oilstone yielding |
CN110990964A (en) * | 2019-10-24 | 2020-04-10 | 武汉理工大学 | Processing technology for inhibiting microcracks on ceramic surface of robot abrasive belt grinding and polishing engineering |
CN110900379B (en) * | 2019-11-26 | 2021-08-17 | 华中科技大学 | Robot abrasive belt grinding and polishing processing method for compressor blade |
-
2020
- 2020-12-28 US US17/135,729 patent/US20210331287A1/en active Pending
-
2021
- 2021-01-04 CN CN202110005115.XA patent/CN113618621B/en active Active
Patent Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7246023B2 (en) * | 2004-01-26 | 2007-07-17 | Ranko, Llc | Flexible process optimizer |
US8051863B2 (en) * | 2007-10-18 | 2011-11-08 | Lam Research Corporation | Methods of and apparatus for correlating gap value to meniscus stability in processing of a wafer surface by a recipe-controlled meniscus |
US20110190916A1 (en) * | 2010-01-29 | 2011-08-04 | Siemens Product Lifecycle Managemet Software Inc. | System and Method for Management of Parameters Using Options and Variants in a Product Lifecycle Management System |
US20130035781A1 (en) * | 2011-08-03 | 2013-02-07 | Rolls-Royce Plc | Control of a machining operation |
US20220003679A1 (en) * | 2018-11-29 | 2022-01-06 | Basf Se | Prediction of physical properties of superabsorbent polymers |
US20200356711A1 (en) * | 2019-05-10 | 2020-11-12 | Coventor, Inc. | System and method for process window optimization in a virtual semiconductor device fabrication environment |
Non-Patent Citations (6)
Title |
---|
Guo, J., et al. "Optimal Parameter Selection in Robotic Belt Polishing for Aeroengine Blade Based on GRA-RSM Method" Symmetry, vol. 11, pp. 1526-1537 (2019) (Year: 2019) * |
Lv, H., et al. "Parameter Optimization Using PSO for ESN-based Robotic Belt Grinding Modeling" IEEE 3rd Int'l Workshop on Intelligent Sys. & Applications (2011) available from <https://ieeexplore.ieee.org/abstract/document/5873383> (Year: 2011) * |
Pandiyan, V., et al. "Predictive Modelling and Analysis of Process Parameters on Material Removal Characteristics in Abrasive Belt Grinding Process" Applied Sciences, vol. 7, issue 4 (2017) available from <https://www.mdpi.com/2076-3417/7/4/363> (Year: 2017) * |
Silva, M. "Off-line Programming of Grinding Robots at Grohe Portugal" IEEE Int’l Conf. on Autonomous Robot Systems & Competitions, pp. 294-299 (2016) (Year: 2016) * |
Xie, X., & Sun, L. "Force Control Based Robotic Grinding System And Application" IEEE 12th World Congress on Intelligent Control & Automation, pp. 2552-2555 (2016) (Year: 2016) * |
Zhang, G., et al. "Multi-objective optimization for surface grinding process using a hybrid particle swarm optimization algorithm" Int’l J. Manufacturing Technology, vol. 71, pp. 1861-1872 (2014) (Year: 2014) * |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN114406809A (en) * | 2022-03-03 | 2022-04-29 | 广州大学 | Method for intelligently designing machining cavity of ultrasonic grinding machine |
CN116341151A (en) * | 2023-05-18 | 2023-06-27 | 贵州大学 | Surface shape error control method for central symmetrical concave surface shape of large-diameter sheet part |
CN117415682A (en) * | 2023-11-29 | 2024-01-19 | 深圳市摆渡微电子有限公司 | Tungsten steel nozzle machining and polishing method and device |
Also Published As
Publication number | Publication date |
---|---|
CN113618621A (en) | 2021-11-09 |
CN113618621B (en) | 2023-08-08 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US20210331287A1 (en) | Grinding and polishing simulation method and system and grinding and polishing process transferring method | |
CN102105908B (en) | Method and device for production of master pattern tool | |
EP3733355A1 (en) | Robot motion optimization system and method | |
US7809455B2 (en) | Method of correcting die model data | |
CN102445922B (en) | For the method and apparatus of Compound Machining | |
Qazani et al. | An investigation on the motion error of machine tools’ hexapod table | |
TWI649648B (en) | Processing machine thermal compensation control system and method thereof | |
US10540779B2 (en) | Posture positioning system for machine and the method thereof | |
US20200166906A1 (en) | Simulation method for milling by use of dynamic position error | |
US20060212171A1 (en) | Off-line teaching device | |
CN109848989B (en) | Robot execution tail end automatic calibration and detection method based on ruby probe | |
CN107063060A (en) | A kind of method and device for determining surface planarity | |
CN103513610A (en) | Tool path display apparatus for displaying tool vector of machine tool | |
US11707842B2 (en) | Robot system and coordinate conversion method | |
US11556110B2 (en) | Method and device for generating tool paths | |
CN111571314B (en) | Extensible automatic grinding and polishing system and method | |
TW202128378A (en) | Calibrating method and calibrating system | |
CN111085902B (en) | Workpiece polishing system for visual online detection and correction | |
Gotlih et al. | Determination of accuracy contour and optimization of workpiece positioning for robot milling. | |
Bhatt et al. | Optimizing part placement for improving accuracy of robot-based additive manufacturing | |
CN110154043A (en) | The robot system and its control method of study control are carried out based on processing result | |
CN109725595A (en) | Compensation method, processing method and the workpiece of the machining path of workpiece | |
KR101333768B1 (en) | Machining path generating method | |
TWI763112B (en) | Grinding and polishing simulation method, system and grinding and polishing process transferring method | |
CN114488943B (en) | Random multi-area efficient polishing path planning method oriented to matched working conditions |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
AS | Assignment |
Owner name: INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE, TAIWAN Free format text: ASSIGNMENT OF ASSIGNORS INTEREST;ASSIGNORS:LO, YUAN-CHIEH;WANG, YU-HSUN;LIN, PEI-CHUN;AND OTHERS;SIGNING DATES FROM 20201221 TO 20201223;REEL/FRAME:054792/0473 |
|
STPP | Information on status: patent application and granting procedure in general |
Free format text: DOCKETED NEW CASE - READY FOR EXAMINATION |
|
STPP | Information on status: patent application and granting procedure in general |
Free format text: FINAL REJECTION MAILED |
|
STPP | Information on status: patent application and granting procedure in general |
Free format text: DOCKETED NEW CASE - READY FOR EXAMINATION |
|
STPP | Information on status: patent application and granting procedure in general |
Free format text: NON FINAL ACTION MAILED |
|
STPP | Information on status: patent application and granting procedure in general |
Free format text: RESPONSE TO NON-FINAL OFFICE ACTION ENTERED AND FORWARDED TO EXAMINER |
|
STPP | Information on status: patent application and granting procedure in general |
Free format text: FINAL REJECTION MAILED |
|
STPP | Information on status: patent application and granting procedure in general |
Free format text: RESPONSE AFTER FINAL ACTION FORWARDED TO EXAMINER |
|
STPP | Information on status: patent application and granting procedure in general |
Free format text: ADVISORY ACTION MAILED |
|
STPP | Information on status: patent application and granting procedure in general |
Free format text: DOCKETED NEW CASE - READY FOR EXAMINATION |
|
STPP | Information on status: patent application and granting procedure in general |
Free format text: NON FINAL ACTION MAILED |