US20160334330A1 - Method for estimating carboxylic acid gas concentration and soldering apparatus - Google Patents
Method for estimating carboxylic acid gas concentration and soldering apparatus Download PDFInfo
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- US20160334330A1 US20160334330A1 US15/112,400 US201515112400A US2016334330A1 US 20160334330 A1 US20160334330 A1 US 20160334330A1 US 201515112400 A US201515112400 A US 201515112400A US 2016334330 A1 US2016334330 A1 US 2016334330A1
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- carboxylic acid
- thermometer
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- temperature
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- 238000000034 method Methods 0.000 title claims abstract description 60
- 238000005476 soldering Methods 0.000 title claims abstract description 32
- 150000001732 carboxylic acid derivatives Chemical class 0.000 title claims 30
- 239000007789 gas Substances 0.000 claims abstract description 200
- 230000005855 radiation Effects 0.000 claims abstract description 58
- 238000010438 heat treatment Methods 0.000 claims abstract description 42
- 239000011261 inert gas Substances 0.000 claims abstract description 19
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- 238000010306 acid treatment Methods 0.000 claims description 46
- 238000006243 chemical reaction Methods 0.000 claims description 8
- 150000001735 carboxylic acids Chemical class 0.000 abstract description 142
- BDAGIHXWWSANSR-UHFFFAOYSA-N methanoic acid Natural products OC=O BDAGIHXWWSANSR-UHFFFAOYSA-N 0.000 abstract description 70
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- 235000019253 formic acid Nutrition 0.000 abstract description 35
- 229910000679 solder Inorganic materials 0.000 description 22
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- SMZOUWXMTYCWNB-UHFFFAOYSA-N 2-(2-methoxy-5-methylphenyl)ethanamine Chemical compound COC1=CC=C(C)C=C1CCN SMZOUWXMTYCWNB-UHFFFAOYSA-N 0.000 description 1
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- WPYVAWXEWQSOGY-UHFFFAOYSA-N indium antimonide Chemical compound [Sb]#[In] WPYVAWXEWQSOGY-UHFFFAOYSA-N 0.000 description 1
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- 235000006408 oxalic acid Nutrition 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 235000019260 propionic acid Nutrition 0.000 description 1
- IUVKMZGDUIUOCP-BTNSXGMBSA-N quinbolone Chemical compound O([C@H]1CC[C@H]2[C@H]3[C@@H]([C@]4(C=CC(=O)C=C4CC3)C)CC[C@@]21C)C1=CCCC1 IUVKMZGDUIUOCP-BTNSXGMBSA-N 0.000 description 1
- 230000009257 reactivity Effects 0.000 description 1
- SBIBMFFZSBJNJF-UHFFFAOYSA-N selenium;zinc Chemical compound [Se]=[Zn] SBIBMFFZSBJNJF-UHFFFAOYSA-N 0.000 description 1
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Images
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K3/00—Tools, devices, or special appurtenances for soldering, e.g. brazing, or unsoldering, not specially adapted for particular methods
- B23K3/08—Auxiliary devices therefor
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
- G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
- G01N21/3504—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing gases, e.g. multi-gas analysis
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K1/00—Soldering, e.g. brazing, or unsoldering
- B23K1/20—Preliminary treatment of work or areas to be soldered, e.g. in respect of a galvanic coating
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/0014—Radiation pyrometry, e.g. infrared or optical thermometry for sensing the radiation from gases, flames
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N25/00—Investigating or analyzing materials by the use of thermal means
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
- G01N33/0004—Gaseous mixtures, e.g. polluted air
- G01N33/0009—General constructional details of gas analysers, e.g. portable test equipment
- G01N33/0027—General constructional details of gas analysers, e.g. portable test equipment concerning the detector
- G01N33/0036—Specially adapted to detect a particular component
- G01N33/0047—Specially adapted to detect a particular component for organic compounds
Definitions
- the present invention relates to a method for estimating a carboxylic acid gas concentration in a chamber and relates to a soldering apparatus capable of estimating the carboxylic acid gas concentration in the chamber, suitably used in a soldering process or the like for a semiconductor. More particularly, the present invention relates to a method for estimating the carboxylic acid gas concentration by utilizing an infrared absorption of a specific wavelength by carboxylic acid and also relates to a soldering apparatus applicable to the method.
- solder bump When a solder bump is formed on a semiconductor chip, a solder is deposited on a pad and then a shape of the solder bump is changed from a mushroom shape to a hemisphere shape, followed by reflowing to join by soldering.
- a surface oxide film of a solder is removed with a flux to cleanse the surface of the solder bump.
- An acid treatment by formic acid is usually performed with vaporized gaseous formic acid because a reduction start temperature of formic acid is about 150° C., and a boiling temperature of formic acid is about 100° C.
- a method of collecting a gas in the chamber and analyzing the collected gas by gas chromatograph or a FTIR (Fourier Transform Infrared Spectrometer) may be used.
- FTIR Fastier Transform Infrared Spectrometer
- the formic acid gas after the end of the acid treatment is forcibly discharged out of the chamber.
- a method of collecting the gas in the chamber and analyzing the collected gas by the gas chromatograph, the FTIR or the like to confirm whether the formic gas in the chamber is sufficiently discharged faces the same problem.
- Patent Document 1 JP 2001-244618 A
- Patent Document 2 JP 2007-125578 A
- an object of the present invention is to provide a method for estimating a concentration of carboxylic acid gas, which is capable of measuring safely the concentration of carboxylic acid gas such as formic acid gas or the like in a chamber of a soldering apparatus in real time, and a soldering apparatus capable of estimating the concentration of the carboxylic acid gas in the chamber.
- the present invention provides the following method and apparatus to solve the above-described problems.
- thermometer for measuring a temperature without any influence of infrared absorption by carboxylic acid
- second thermometer for measuring a temperature by infrared in a wavelength region that the carboxylic acid absorbs
- thermometer for measuring a temperature without any influence of infrared absorption by carboxylic acid
- second thermometer for measuring a temperature by infrared in a wavelength region that the carboxylic acid absorbs
- the method for estimating a concentration of a carboxylic acid gas according to above (2) further including: preparing the calibration lines showing a relationship of the carboxylic acid gas concentration and the temperature difference ( ⁇ T) under a plurality of conditions different in an acid treatment temperature; obtaining a relational expression showing a relationship of a gradient of the calibration line and the acid treatment temperature, obtaining a gradient of the calibration line in a predetermined acid treatment temperature from the relational expression, and estimating the concentration of carboxylic acid gas in the chamber on the basis of the gradient of the calibration line and the temperature difference ( ⁇ Tx).
- thermometer is a radiation thermometer for measuring a temperature by the infrared in a wavelength region that the carboxylic acid does not absorb.
- a method for estimating an amount of carboxylic acid including: estimating a concentration of a carboxylic acid gas in a chamber by using the method of estimating a concentration of a carboxylic acid gas according to any one of above (1) to (6); and calculating an amount of carboxylic acid in the chamber from an estimated value of the concentration of the carboxylic acid, a capacity of the chamber and an internal pressure of the chamber.
- a soldering apparatus capable of estimating a concentration of a carboxylic acid gas in a chamber, the soldering apparatus including: a heating stage; a gas introducing part for introducing a mixed gas of an inert gas and a carboxylic acid gas; and a chamber having a gas discharging part; wherein the chamber comprises a thermometer (first thermometer) for measuring a temperature without any influence of infrared absorption by carboxylic acid, and a radiation thermometer (second thermometer) for measuring a temperature by infrared in a wavelength region that the carboxylic acid absorbs.
- first thermometer for measuring a temperature without any influence of infrared absorption by carboxylic acid
- second thermometer for measuring a temperature by infrared in a wavelength region that the carboxylic acid absorbs.
- thermometer is a radiation thermometer for measuring a temperature by infrared in a wavelength region that the carboxylic acid does not absorb
- the chamber comprises two transmissive windows corresponding to the first thermometer and the second thermometer.
- the concentration of the carboxylic acid gas in the chamber can be estimated in non-contact and in real time. Further, since there is no need of collecting the carboxylic acid gas, contact with or inhalation of the highly irritating formic acid gas in particular can be avoided, and the concentration of the carboxylic acid gas can be very safely estimated. Still further, the amount of the carboxylic acid in the chamber can be obtained from the concentration of the carboxylic acid gas.
- the carboxylic acid gas concentration in the chamber can be controlled at a minimum concentration that allows a reduction reaction to progress; a cost can be saved due to suppressed introduction of excess carboxylic acid in the chamber; an end of the acid treatment can be determined by knowing a change in the carboxylic acid gas concentration in the chamber; and the like.
- FIG. 1 is a schematic diagram, showing an embodiment of a soldering apparatus of an embodiment of the present invention.
- FIG. 2 is a graph, showing an infrared absorption spectrum of formic acid.
- FIG. 3 is a graph, showing temperatures measured by a first thermometer and a second thermometer for each of formic acid concentrations.
- FIG. 4 is a graph, showing temperatures measured by the first thermometer and the second thermometer for each of measured temperatures.
- FIG. 5 depicts calibration lines, showing a relationship of a carboxylic acid gas concentration (%) and a temperature difference ( ⁇ T).
- FIG. 6 is a graph, showing a relationship of an acid treatment temperature and a gradient of the calibration line.
- FIG. 1 is a configuration diagram, showing a suitable embodiment of a soldering apparatus to which a method of estimating a concentration of a carboxylic acid gas according to the present invention is suitably applied.
- a carboxylic acid in the embodiment of the present invention formic acid, acetic acid, acrylic acid, propionic acid, caproic acid, oxalic acid, succinic acid, malonic acid, caprylic acid, caproic acid or the like can be used.
- the method of estimating a concentration of carboxylic acid gas is a method of estimating the concentration of the carboxylic acid gas in a chamber into which carboxylic acid gas for reaction is introduced. Specifically, it is a method of estimating the concentration of the carboxylic acid gas for reaction in the chamber 10 in which an oxide deposited on a surface of members to be joined such as a substrate, a semiconductor chip, an electrode and the like that are placed on a heating stage 30 in the chamber and heated to a predetermined temperature is removed by a mixed gas of an inert gas and the carboxylic acid gas.
- the inert gas nitrogen, helium, argon and the like can be used. However, readily obtainable nitrogen is preferably used.
- the chamber 10 is a vacuum chamber for removing an oxide film deposited on the surface of the members 31 , 32 and for joining these members.
- the heating stage 30 is used to bear a pair of the members 31 , 32 thereon that sandwich a solder 35 therebetween, then heat the members 31 , 32 to a temperature equal to or higher than the reduction temperature of carboxylic acid and lower than the melting point of the solder to remove the oxide film, and after the end of the removal of the oxide film, heat to a temperature where the solder melts.
- FIG. 1 shows a configuration example of the soldering apparatus, including: gas introduction means 25 for introducing the mixed gas of the inert gas and the carboxylic acid gas; the heating stage 30 for bearing the members 31 , 32 thereon that sandwich the solder 35 therebetween and heating the members to a predetermined temperature; gas discharging means 26 for discharging gas; and the chamber 10 provided with a set of a first thermometer 37 and a transmissive window 37 w and a set of a radiation thermometer 38 as a second thermometer and a transmissive window 38 w.
- the gas introduction means 25 may be configured to introduce the mixed gas of the inert gas and carboxylic acid gas which have been mixed in advance into the chamber 10 through one line or may be configured to introduce each of the inert gas and the carboxylic acid gas into the chamber 10 in separate lines or may be configured to spray the carboxylic acid gas into the inert gas.
- a method of preparing the mixed gas of the inert gas and the carboxylic gas is not particularly limited.
- the mixed gas can be conditioned by vaporizing a predetermined amount of the carboxylic acid in the inert gas within a separate container connected with the gas introduction means 25 .
- the carboxylic acid gas concentration in the mixed gas may be obtained from a ratio of amounts of introduced gasses, or may be obtained by measuring with the gas chromatograph or the FTIR.
- the concentration of the carboxylic acid gas in the mixed gas to be introduced into the chamber 10 is not particularly limited, a concentration of 1.5% by volume or more is preferable in view of the reactivity. In this way, the oxide film deposited on a surface of the solder or the members to be joined can be readily removed, a solder wetting and spreading property becomes excellent, and generation of a void can be reduced in a soldering part.
- the carboxylic acid gas concentration of 1.5% by volume or more and 3% by volume or less is more preferable.
- the gas discharging means 26 is connected to a vacuum pump (not shown) and is used to forcibly discharge gases from the inside of the chamber 10 to form a vacuum state before the inert gas and carboxylic acid gas are introduced and the acid treatment is started. By forcibly discharging gases from the inside of the chamber 10 , an oxygen gas or the like that disturbs the acid treatment is removed. Under this vacuum condition, the carboxylic acid gas introduced into the chamber 10 can be readily vaporized and dispersed. The gas discharging means 26 is used to discharge a gas remaining in the chamber 10 after the acid treatment.
- thermometer for measuring a temperature without any influence of an infrared absorption by carboxylic acid and a radiation thermometer (second thermometer) for measuring a temperature by an infrared in a wavelength region that the carboxylic acid absorbs are used to measure a surface temperature of the same object in the chamber at the same point in time. Then, when the predetermined same object is measured at the same point in time, a temperature difference ( ⁇ Tx) is generated between the temperatures indicated by the first thermometer and the second thermometer. In this way, the concentration of the carboxylic acid gas in the chamber is estimated from a degree of the temperature difference ( ⁇ Tx).
- both of the first thermometer and the radiation thermometer as the second thermometer measure the surface temperature of the same object placed in the chamber.
- “To measure at the same point in time” “the surface temperature of the same object” means that the two thermometers simultaneously measure the temperature of the object having the same surface temperature.
- the object placed in the chamber means an object placed in a room (chamber) where a carboxylic acid treatment is carried out. Therefore, the object placed in the chamber may be the members to be joined, an arbitrary object placed in the chamber, or an object placed for temperature measurement, without limiting to the heating plate such as the heating stage 30 or the like.
- thermometer 37 it is necessary to use a thermometer that is not influenced by the infrared absorption by the carboxylic acid gas.
- a contact type thermometer for example, a mercury thermometer, a resistance thermometer, a thermocouple thermometer or the like, or a non-contact type thermometer, for example, a radiation thermometer for measuring a temperature by infrared in a wavelength region that the carboxylic acid gas does not absorb or the like can be applied.
- the first thermometer also has a function of controlling a temperature of the heating stage 30 at a predetermined temperature.
- this radiation thermometer may be of a type used generally in a soldering apparatus as long as it can measure the temperature without being influenced by the carboxylic acid.
- the formic acid as shown in an infrared absorption spectrum in FIG. 2 , wavelengths of the infrared that the formic acid absorbs are in regions of between 2.5 ⁇ m and 4.0 ⁇ m, between 5.5 ⁇ m and 6.0 ⁇ m, and between 7.0 ⁇ m and 14.0 ⁇ m.
- a radiation thermometer including InSb as a detecting element and a band-path filter for measuring the temperature by the infrared in the wavelength region between 4.5 ⁇ m and 5 ⁇ m that the formic acid does not absorb can be used.
- the radiation thermometer 38 that is the second thermometer (hereinafter, referred to as “the second radiation thermometer”), a radiation thermometer that can measure a temperature by the infrared in the wavelength region that the carboxylic acid gas absorbs is used. Therefore, the temperature of the heating stage 30 that is measured by the second radiation thermometer 38 is influenced by the carboxylic acid gas concentration in the chamber 10 .
- thermometer with a detecting element for detecting the infrared in the above-described region that the carboxylic acid absorbs is used as the second radiation thermometer
- thermometer when the radiation thermometer is used as the first thermometer 37 and when the second radiation thermometer 38 is used, it is desirable that the temperature of the heating stage 30 is measured in a state where the carboxylic acid gas is not present and these thermometers are calibrated in advance such that these measured temperatures may coincide with a temperature measured by a contact type thermometer such as a thermocouple or the like.
- Installation positions of the first thermometer 37 and the second radiation thermometer 38 are not particularly limited. However, in general, the contact type thermometer is frequently installed in the chamber 10 . On the other hand, when the radiation thermometer is used as the first thermometer, these two radiation thermometers can also be installed in the chamber 10 . When the radiation thermometer is installed in the chamber 10 , there is a concern that a measurement error of the temperature becomes large because the radiation thermometer detects heat radiated from the radiation thermometer itself and also heat radiated from a floor or a wall of the chamber. Therefore, as shown in FIG. 1 , two radiation thermometers are preferably installed outside of the chamber 10 .
- transmissive windows are disposed so that radiation heat (infrared) can transmit outside of the chamber 10 .
- the transmissive windows In order to prevent the infrared from entering the radiation thermometer from other than the heating stage 30 such as a floor, a wall or the like of the chamber 10 , it is better to provide the transmissive windows having an area as small as possible and to dispose the transmissive windows corresponding to the radiation thermometers respectively.
- FIG. 1 there is shown an example in which the transmissive window 37 w corresponds to the first thermometer 37 , and the transmissive window 38 w corresponds to the second radiation thermometer 38 .
- the transmissive windows are preferably formed of a material that does not absorb the infrared, such as BaF 2 , CaF 2 and ZnSe.
- the acid treatment and the joining process performed by using the soldering apparatus according to the embodiment of the present invention are not particularly limited and may be a well-known process or the like.
- a following process may be applied.
- a gas such as air present in the chamber 10 is forcibly discharged through the gas discharging means 26 by a vacuum pump. Simultaneously, the heating stage 30 is heated. The temperature of the heating stage 30 is measured in real time. After confirming that the temperature of the members 31 , 32 has reached the predetermined temperature, a valve 21 is closed to disconnect the gas discharging means 26 and the chamber 10 .
- the valve 21 is closed to disconnect the gas discharging means 26 and the chamber 10 , and then the heating stage 30 may be heated.
- the heating stage 30 can be heated to the predetermined temperature in a shorter time.
- a valve 20 is opened, the mixed gas of the inert gas and the carboxylic acid gas is introduced by the gas introducing means 25 for the mixed gas of the inert gas and the carboxylic acid gas, the inside of the chamber 10 is filled with the mixed gas of the inert gas and the carboxylic acid gas, and the acid treatment is performed.
- a surface temperature of the heating stage 30 is measured with two thermometers, one thermometer that is not influenced by the carboxylic acid and the other thermometer that is influenced by the carboxylic acid, thereby to estimate the concentration of the carboxylic acid gas in the chamber 10 .
- the first thermometer 37 is a contact type thermometer such as a mercury thermometer, a resistance thermometer, a thermocouple thermometer or the like, or, as described above, a radiation thermometer that measures a temperature by infrared in a wavelength region that the carboxylic acid gas does not absorb, and the measured temperature is an actual temperature of the heating stage 30 because it is not influenced by the carboxylic acid gas.
- the surface temperature of the heating stage 30 is controlled, and an acid treatment temperature is kept within a predetermined temperature range.
- the first thermometer 37 can be used to measure and maintain the surface temperature when heating the heating stage 30 to a melting temperature of the solder after the end of the acid treatment.
- the second radiation thermometer 38 is, as described above, a radiation thermometer for measuring a temperature by infrared in the region that the carboxylic acid gas absorbs.
- the surface temperature of the heating stage 30 measured by the second radiation thermometer does not show an actual temperature of the heating stage 30 because it is influenced by the carboxylic acid gas. That is, the second radiation thermometer 38 shows a temperature lower than the actual temperature in accordance with an amount of the infrared absorbed by the carboxylic acid gas. Further, the amount of the infrared absorbed by the carboxylic acid gas is proportional to the concentration of the carboxylic acid gas.
- the temperature indicated by the second radiation thermometer 38 becomes lower as the carboxylic acid gas concentration becomes higher, the temperature indicated by the second radiation thermometer 38 becomes higher as the carboxylic acid gas concentration becomes lower.
- the second radiation thermometer 38 shows a temperature that is the same as the temperature indicated by the first thermometer 37 , the concentration of the carboxylic acid gas is zero.
- the carboxylic acid gas concentration in the chamber 10 decreases and becomes substantially constant after the end of the acid treatment. Therefore, the temperature indicated by the second radiation thermometer 38 is low at the time of start of the acid treatment, rises gradually as the acid treatment progresses, and becomes substantially constant after the end of the acid treatment. Thus, a progress status of the acid treatment can be determined from the temperature indicated by the second radiation thermometer 38 in real time.
- the surface temperature of the heating stage 30 is measured with the first thermometer 37 . While controlling the temperature of the heating stage 30 to a predetermined temperature on the basis of the measured temperature, the surface temperature of the heating stage 30 is measured with the second radiation thermometer 38 .
- the concentration of the carboxylic acid gas in the chamber 10 can be determined.
- the carboxylic acid gas concentration can be quantitatively determined.
- the calibration line of the formic acid can be prepared, for example, in the following manner. After evacuating the chamber 10 , the heating stage 30 placed in the chamber is heated to a predetermined temperature. Then after the temperature of the heating stage 30 is stabilized, a mixed gas of a formic acid gas whose concentration is known and an inert gas is introduced into the chamber 10 . A temperature (T 1 ) that the first thermometer 37 indicates and a temperature (T 2 ) that the second radiation thermometer 38 indicates are simultaneously measured, and a temperature difference ( ⁇ T) between T 1 and T 2 is determined. With changing the formic acid gas concentration, a similar operation is repeated. Further, with changing the temperature of the heating stage 30 , a similar operation is repeated. At the end, for every temperature of the heating stage 30 , the relationship between the formic acid gas concentration (%) and the temperature difference ( ⁇ T) is plotted and approximating by a linear regression line, the calibration line is sufficient.
- the carboxylic acid gas concentration for preparing the calibration line can be optionally set.
- a preferable range of the formic acid gas used is 1.5 to 3% by volume.
- the calibration line of the concentration up to about 3% by volume may be prepared.
- the intensity of the radiated infrared changes depending on the temperature of the heating stage 30 because the intensity of the radiated infrared is different depending on the temperature of the object. Therefore, even when an amount of the infrared that the carboxylic acid gas absorbs is the same, the temperature indicated by the second radiation thermometer 38 is different for different acid treatment temperatures. Therefore, the calibration line has to be prepared for every acid treatment temperature because the relationship between the carboxylic acid gas concentration and the temperature difference ( ⁇ T) varies depending on the temperature.
- the carboxylic acid gas concentration can be known for a wide range of temperature.
- the calibration lines that show the relationship between the carboxylic acid gas concentration and the temperature difference ( ⁇ T) under a plurality of conditions different in the acid treatment temperature and by obtaining a relational expression that shows the relationship between a gradient of the calibration line and the acid treatment temperature, a gradient of the calibration line at a predetermined acid treatment temperature can be determined from the relational expression. Then, by determining the carboxylic acid gas concentration in the chamber from the gradient of the calibration line and the temperature difference ( ⁇ Tx), the carboxylic acid gas concentration can be estimated.
- the carboxylic acid gas concentrations in the soldering treatment and the soldering apparatus can be estimated.
- a width of the temperature for which the calibration line is prepared is not particularly limited but may be appropriately selected in the range between 25° C. and 50° C. in accordance with measurement precision of the carboxylic acid concentration.
- the formic acid concentration can be estimated with high precision in the range between 100° C. and 300° C.
- An amount of the carboxylic acid in the chamber can be also estimated by using the carboxylic acid gas concentration estimated by the method for estimating the carboxylic acid gas concentration according to the embodiment of the present invention. Specifically, after determining the amount of the carboxylic acid gas in the chamber by multiplying a chamber volume by the carboxylic acid gas concentration, and by converting a pressure in the chamber into normal pressure, the amount of the carboxylic acid gas in the chamber can be determined. It should be noted that the pressure in the chamber is a pressure in the chamber at a point of time of a measurement of a temperature difference ( ⁇ Tx) between the temperatures indicated by the first thermometer and the second thermometer.
- ⁇ Tx a temperature difference
- a test was performed using a soldering apparatus provided with a chamber 10 having a capacity of 20 liters.
- a heating plate (heating stage 30 ) disposed in the chamber was heated to 150° C. and after stabilization of the temperature, a mixed gas of a formic acid gas having a concentration of 2.4% and an inert gas was introduced into the chamber.
- a temperature (T 1 ) indicated by the first thermometer 37 and a temperature (T 2 ) indicated by the second radiation thermometer 38 were simultaneously read, and a temperature difference of T 1 and T 2 ( ⁇ T) was determined.
- the similar operation was repeated with change of the formic acid gas concentration to 1.2% and 0.6%. See FIG. 3 .
- the similar operation was repeated with change of the temperature of the heating plate to 250° C. and 350° C. See FIG. 4 .
- FIG. 3 and FIG. 4 shows that the higher the formic acid gas concentration is, the larger the temperature difference ( ⁇ T) becomes.
- the formic acid gas concentrations are the same, the higher the temperature of the heating plate is, the larger the temperature difference ( ⁇ T) becomes.
- the formic acid gas concentration in the chamber can be estimated. Further, by using the calibration line of FIG. 5 , the formic acid gas concentration can be quantitatively determined.
- the gradient of the calibration line at the acid treatment temperature of 200° C. can be determined as 0.37 (%/ ⁇ T) using the linear regression line prepared in Example 1 ( FIG. 6 ). Further, from the gradient of the calibration line and measured temperature difference ( ⁇ T) of two thermometers at the acid treatment temperature of 200° C., the carboxylic acid gas concentration in the chamber can be calculated.
- An amount of the carboxylic acid at the acid treatment temperature of 200° C. can be calculated by multiplying the carboxylic acid gas concentration calculated in Example 2 by the chamber capacity (20 liters) to calculate an amount of the carboxylic acid gas in the chamber, and by converting this amount from a pressure in the chamber at the time of temperature measurement to a normal pressure.
- the method for estimating concentration of the carboxylic acid gas of the present invention is useful for a) knowing the concentration of the carboxylic acid gas in the chamber after the end of the acid treatment process, b) knowing the change of the concentration of the carboxylic acid gas in the case where the temperature is changed during the acid treatment process, and c) tracking the variation in the concentration of the carboxylic acid gas in the soldering apparatus.
- the soldering apparatus for estimating the carboxylic acid gas concentration in the chamber is also useful for improvement of the productivity due to shortening of the soldering process.
Abstract
Description
- The present invention relates to a method for estimating a carboxylic acid gas concentration in a chamber and relates to a soldering apparatus capable of estimating the carboxylic acid gas concentration in the chamber, suitably used in a soldering process or the like for a semiconductor. More particularly, the present invention relates to a method for estimating the carboxylic acid gas concentration by utilizing an infrared absorption of a specific wavelength by carboxylic acid and also relates to a soldering apparatus applicable to the method.
- When a solder bump is formed on a semiconductor chip, a solder is deposited on a pad and then a shape of the solder bump is changed from a mushroom shape to a hemisphere shape, followed by reflowing to join by soldering. According to a conventional soldering method, in order to form a uniform solder bump, a surface oxide film of a solder is removed with a flux to cleanse the surface of the solder bump.
- However, according to a soldering process that uses a flux, small cavities (voids) may be formed in the solder bump due to decomposition of the flux. These cavities not only deteriorate electrical and mechanical properties of a formed solder joint but also destroy flatness of a semiconductor with the solder bump and may generate a harmful effect on the following semiconductor joining process. A volatile material of the decomposed flux may contaminate the inside of a reflow processor and as a result a maintenance cost may increase. In addition, a flux residue remains frequently on a semiconductor substrate to cause metal corrosion, and degradation of performance of an assembly. Further, according to a method in which the flux residue is cleansed and removed after reflow step, a time required for soldering increases because of addition of after-cleansing as a new processing step.
- Therefore, as a soldering method without use of a flux, there is known a method of reducing with formic acid the solder and the joined members such as a substrate and electrode (see
Patent Documents 1 to 3 and others). According to such a method of reduction, when a temperature of joined members on which the solder is mounted reaches a predetermined temperature, the solder is exposed to a reducing gas including formic acid to perform an acid treatment in which a surface oxide film is removed and are then molten to be processed. - An acid treatment by formic acid is usually performed with vaporized gaseous formic acid because a reduction start temperature of formic acid is about 150° C., and a boiling temperature of formic acid is about 100° C. At that time, to know a concentration of formic acid gas in a chamber, a method of collecting a gas in the chamber and analyzing the collected gas by gas chromatograph or a FTIR (Fourier Transform Infrared Spectrometer) may be used. However, in these cases, there are problems, for example, further provision of analyzers such as the gas chromatograph, FTIR or the like, and requirement of safety measures for collecting highly irritating formic acid in a high temperature gas state. Further, there is also a problem that the formic acid concentration cannot be measured in real time because an analysis takes time.
- Further, the formic acid gas after the end of the acid treatment is forcibly discharged out of the chamber. At that time, a method of collecting the gas in the chamber and analyzing the collected gas by the gas chromatograph, the FTIR or the like to confirm whether the formic gas in the chamber is sufficiently discharged faces the same problem.
- Therefore, in the acid treatment with a carboxylic acid gas such as formic acid or the like, a method of conveniently and safely measuring the carboxylic acid gas concentration in the chamber in real time is desired.
- Patent Document 1: JP 2001-244618 A
- Patent Document 2: JP 2007-125578 A
- In view of the above-described problems, an object of the present invention is to provide a method for estimating a concentration of carboxylic acid gas, which is capable of measuring safely the concentration of carboxylic acid gas such as formic acid gas or the like in a chamber of a soldering apparatus in real time, and a soldering apparatus capable of estimating the concentration of the carboxylic acid gas in the chamber.
- The present invention provides the following method and apparatus to solve the above-described problems.
- (1) A method for estimating a concentration of a carboxylic acid gas in a chamber, the carboxylic acid gas introduced into the chamber being for reaction, the method including:
- measuring a surface temperature of a same object placed in the chamber at a same point in time by using a thermometer (first thermometer) for measuring a temperature without any influence of infrared absorption by carboxylic acid, and a radiation thermometer (second thermometer) for measuring a temperature by infrared in a wavelength region that the carboxylic acid absorbs; and estimating the concentration of the carboxylic acid gas in the chamber on the basis of a temperature difference (ΔTx) between temperatures indicated by the first thermometer and the second thermometer.
- (2) A method for estimating a concentration of a carboxylic acid gas in a chamber, the carboxylic acid gas introduced into the chamber being for reaction, the method including:
- measuring, while changing a concentration of the carboxylic acid gas for reaction, a surface temperature of a same object placed in the chamber at a same point in time by using a thermometer (first thermometer) for measuring a temperature without any influence of infrared absorption by carboxylic acid, and a radiation thermometer (second thermometer) for measuring a temperature by infrared in a wavelength region that the carboxylic acid absorbs; preparing in advance a calibration line showing a relationship of the carboxylic acid gas concentration and a temperature difference (ΔT) by obtaining the temperature difference (ΔT) between temperatures indicated by the first thermometer and the second thermometer; and estimating the concentration of the carboxylic acid gas in the chamber on the basis of the prepared calibration line and the temperature difference (ΔTx) between temperatures indicated by the first thermometer and the second thermometer for a surface temperature of the same object placed in the chamber.
- (3) The method for estimating a concentration of a carboxylic acid gas according to above (2), further including: preparing the calibration lines showing a relationship of the carboxylic acid gas concentration and the temperature difference (ΔT) under a plurality of conditions different in an acid treatment temperature; obtaining a relational expression showing a relationship of a gradient of the calibration line and the acid treatment temperature, obtaining a gradient of the calibration line in a predetermined acid treatment temperature from the relational expression, and estimating the concentration of carboxylic acid gas in the chamber on the basis of the gradient of the calibration line and the temperature difference (ΔTx).
(4) The method for estimating a concentration of a carboxylic acid gas according to any one of above (1) to (3), wherein the first thermometer is a radiation thermometer for measuring a temperature by the infrared in a wavelength region that the carboxylic acid does not absorb.
(5) The method for estimating a concentration of a carboxylic acid gas according to any one of above (1) to (3), wherein the method is applied to an object having a surface temperature between normal temperature and 350° C.
(6) The method for estimating a concentration of a carboxylic acid gas according to above (4), wherein the method is applied to an object having a surface temperature between normal temperature and 350° C.
(7) A method for estimating an amount of carboxylic acid, the method including: estimating a concentration of a carboxylic acid gas in a chamber by using the method of estimating a concentration of a carboxylic acid gas according to any one of above (1) to (6); and calculating an amount of carboxylic acid in the chamber from an estimated value of the concentration of the carboxylic acid, a capacity of the chamber and an internal pressure of the chamber.
(8) A soldering apparatus capable of estimating a concentration of a carboxylic acid gas in a chamber, the soldering apparatus including: a heating stage; a gas introducing part for introducing a mixed gas of an inert gas and a carboxylic acid gas; and a chamber having a gas discharging part; wherein the chamber comprises a thermometer (first thermometer) for measuring a temperature without any influence of infrared absorption by carboxylic acid, and a radiation thermometer (second thermometer) for measuring a temperature by infrared in a wavelength region that the carboxylic acid absorbs.
(9) The soldering apparatus according to above (8), wherein the first thermometer is a radiation thermometer for measuring a temperature by infrared in a wavelength region that the carboxylic acid does not absorb, and the chamber comprises two transmissive windows corresponding to the first thermometer and the second thermometer. - According to the embodiments of the present invention, the concentration of the carboxylic acid gas in the chamber can be estimated in non-contact and in real time. Further, since there is no need of collecting the carboxylic acid gas, contact with or inhalation of the highly irritating formic acid gas in particular can be avoided, and the concentration of the carboxylic acid gas can be very safely estimated. Still further, the amount of the carboxylic acid in the chamber can be obtained from the concentration of the carboxylic acid gas.
- Therefore, in the acid treatment with the carboxylic acid gas, there are advantages such that the carboxylic acid gas concentration in the chamber can be controlled at a minimum concentration that allows a reduction reaction to progress; a cost can be saved due to suppressed introduction of excess carboxylic acid in the chamber; an end of the acid treatment can be determined by knowing a change in the carboxylic acid gas concentration in the chamber; and the like.
- Further, after the acid treatment, when the carboxylic acid gas in the chamber is discharged, the completion of discharge can be determined. Therefore, a chamber material can be prevented from being corroded due to a long time exposure to the carboxylic acid gas.
-
FIG. 1 is a schematic diagram, showing an embodiment of a soldering apparatus of an embodiment of the present invention. -
FIG. 2 is a graph, showing an infrared absorption spectrum of formic acid. -
FIG. 3 is a graph, showing temperatures measured by a first thermometer and a second thermometer for each of formic acid concentrations. -
FIG. 4 is a graph, showing temperatures measured by the first thermometer and the second thermometer for each of measured temperatures. -
FIG. 5 depicts calibration lines, showing a relationship of a carboxylic acid gas concentration (%) and a temperature difference (ΔT). -
FIG. 6 is a graph, showing a relationship of an acid treatment temperature and a gradient of the calibration line. - Hereinafter, embodiments of the present invention will be described in more detail with reference to the drawings.
FIG. 1 is a configuration diagram, showing a suitable embodiment of a soldering apparatus to which a method of estimating a concentration of a carboxylic acid gas according to the present invention is suitably applied. As the carboxylic acid in the embodiment of the present invention, formic acid, acetic acid, acrylic acid, propionic acid, caproic acid, oxalic acid, succinic acid, malonic acid, caprylic acid, caproic acid or the like can be used. - The method of estimating a concentration of carboxylic acid gas according to an embodiment of the present invention is a method of estimating the concentration of the carboxylic acid gas in a chamber into which carboxylic acid gas for reaction is introduced. Specifically, it is a method of estimating the concentration of the carboxylic acid gas for reaction in the
chamber 10 in which an oxide deposited on a surface of members to be joined such as a substrate, a semiconductor chip, an electrode and the like that are placed on aheating stage 30 in the chamber and heated to a predetermined temperature is removed by a mixed gas of an inert gas and the carboxylic acid gas. As the inert gas, nitrogen, helium, argon and the like can be used. However, readily obtainable nitrogen is preferably used. - The
chamber 10 is a vacuum chamber for removing an oxide film deposited on the surface of themembers heating stage 30 is used to bear a pair of themembers solder 35 therebetween, then heat themembers -
FIG. 1 shows a configuration example of the soldering apparatus, including: gas introduction means 25 for introducing the mixed gas of the inert gas and the carboxylic acid gas; theheating stage 30 for bearing themembers solder 35 therebetween and heating the members to a predetermined temperature; gas discharging means 26 for discharging gas; and thechamber 10 provided with a set of afirst thermometer 37 and atransmissive window 37 w and a set of aradiation thermometer 38 as a second thermometer and atransmissive window 38 w. - As shown in
FIG. 1 , the gas introduction means 25 may be configured to introduce the mixed gas of the inert gas and carboxylic acid gas which have been mixed in advance into thechamber 10 through one line or may be configured to introduce each of the inert gas and the carboxylic acid gas into thechamber 10 in separate lines or may be configured to spray the carboxylic acid gas into the inert gas. Further, a method of preparing the mixed gas of the inert gas and the carboxylic gas is not particularly limited. For example, the mixed gas can be conditioned by vaporizing a predetermined amount of the carboxylic acid in the inert gas within a separate container connected with the gas introduction means 25. The carboxylic acid gas concentration in the mixed gas may be obtained from a ratio of amounts of introduced gasses, or may be obtained by measuring with the gas chromatograph or the FTIR. - Although the concentration of the carboxylic acid gas in the mixed gas to be introduced into the
chamber 10 is not particularly limited, a concentration of 1.5% by volume or more is preferable in view of the reactivity. In this way, the oxide film deposited on a surface of the solder or the members to be joined can be readily removed, a solder wetting and spreading property becomes excellent, and generation of a void can be reduced in a soldering part. The carboxylic acid gas concentration of 1.5% by volume or more and 3% by volume or less is more preferable. The reason why the preferable concentration of carboxylic acid gas is 1.5% by volume or more is because this does not hinder the acid treatment by carboxylic acid, and the reason why it is 3% by volume or less is because a concern of corrosion of a chamber material by carboxylic acid can be reduced. - The gas discharging means 26 is connected to a vacuum pump (not shown) and is used to forcibly discharge gases from the inside of the
chamber 10 to form a vacuum state before the inert gas and carboxylic acid gas are introduced and the acid treatment is started. By forcibly discharging gases from the inside of thechamber 10, an oxygen gas or the like that disturbs the acid treatment is removed. Under this vacuum condition, the carboxylic acid gas introduced into thechamber 10 can be readily vaporized and dispersed. The gas discharging means 26 is used to discharge a gas remaining in thechamber 10 after the acid treatment. - According to an embodiment of the present invention, a thermometer (first thermometer) for measuring a temperature without any influence of an infrared absorption by carboxylic acid and a radiation thermometer (second thermometer) for measuring a temperature by an infrared in a wavelength region that the carboxylic acid absorbs are used to measure a surface temperature of the same object in the chamber at the same point in time. Then, when the predetermined same object is measured at the same point in time, a temperature difference (ΔTx) is generated between the temperatures indicated by the first thermometer and the second thermometer. In this way, the concentration of the carboxylic acid gas in the chamber is estimated from a degree of the temperature difference (ΔTx).
- That is, both of the first thermometer and the radiation thermometer as the second thermometer measure the surface temperature of the same object placed in the chamber. “To measure at the same point in time” “the surface temperature of the same object” means that the two thermometers simultaneously measure the temperature of the object having the same surface temperature. Further, “the object placed in the chamber” means an object placed in a room (chamber) where a carboxylic acid treatment is carried out. Therefore, the object placed in the chamber may be the members to be joined, an arbitrary object placed in the chamber, or an object placed for temperature measurement, without limiting to the heating plate such as the
heating stage 30 or the like. - As the
first thermometer 37, it is necessary to use a thermometer that is not influenced by the infrared absorption by the carboxylic acid gas. As such thermometer, a contact type thermometer, for example, a mercury thermometer, a resistance thermometer, a thermocouple thermometer or the like, or a non-contact type thermometer, for example, a radiation thermometer for measuring a temperature by infrared in a wavelength region that the carboxylic acid gas does not absorb or the like can be applied. The first thermometer also has a function of controlling a temperature of theheating stage 30 at a predetermined temperature. - In the case where a radiation thermometer is used as a first thermometer, this radiation thermometer may be of a type used generally in a soldering apparatus as long as it can measure the temperature without being influenced by the carboxylic acid. For the formic acid, as shown in an infrared absorption spectrum in
FIG. 2 , wavelengths of the infrared that the formic acid absorbs are in regions of between 2.5 μm and 4.0 μm, between 5.5 μm and 6.0 μm, and between 7.0 μm and 14.0 μm. Therefore, for example, a radiation thermometer including InSb as a detecting element and a band-path filter for measuring the temperature by the infrared in the wavelength region between 4.5 μm and 5 μm that the formic acid does not absorb can be used. - On the other hand, as the
radiation thermometer 38 that is the second thermometer (hereinafter, referred to as “the second radiation thermometer”), a radiation thermometer that can measure a temperature by the infrared in the wavelength region that the carboxylic acid gas absorbs is used. Therefore, the temperature of theheating stage 30 that is measured by thesecond radiation thermometer 38 is influenced by the carboxylic acid gas concentration in thechamber 10. Since a radiation thermometer with a detecting element for detecting the infrared in the above-described region that the carboxylic acid absorbs is used as the second radiation thermometer, a radiation thermometer having a thermopile as a detecting element that can measure a temperature by the infrared of wavelength between 8 μm and 13 μm, for example, can be used. - It should be noted that when the radiation thermometer is used as the
first thermometer 37 and when thesecond radiation thermometer 38 is used, it is desirable that the temperature of theheating stage 30 is measured in a state where the carboxylic acid gas is not present and these thermometers are calibrated in advance such that these measured temperatures may coincide with a temperature measured by a contact type thermometer such as a thermocouple or the like. - Installation positions of the
first thermometer 37 and thesecond radiation thermometer 38 are not particularly limited. However, in general, the contact type thermometer is frequently installed in thechamber 10. On the other hand, when the radiation thermometer is used as the first thermometer, these two radiation thermometers can also be installed in thechamber 10. When the radiation thermometer is installed in thechamber 10, there is a concern that a measurement error of the temperature becomes large because the radiation thermometer detects heat radiated from the radiation thermometer itself and also heat radiated from a floor or a wall of the chamber. Therefore, as shown inFIG. 1 , two radiation thermometers are preferably installed outside of thechamber 10. - If the radiation thermometers are installed outside of the
chamber 10, transmissive windows are disposed so that radiation heat (infrared) can transmit outside of thechamber 10. In order to prevent the infrared from entering the radiation thermometer from other than theheating stage 30 such as a floor, a wall or the like of thechamber 10, it is better to provide the transmissive windows having an area as small as possible and to dispose the transmissive windows corresponding to the radiation thermometers respectively. InFIG. 1 , there is shown an example in which thetransmissive window 37 w corresponds to thefirst thermometer 37, and thetransmissive window 38 w corresponds to thesecond radiation thermometer 38. - The transmissive windows are preferably formed of a material that does not absorb the infrared, such as BaF2, CaF2 and ZnSe.
- The acid treatment and the joining process performed by using the soldering apparatus according to the embodiment of the present invention are not particularly limited and may be a well-known process or the like. For example, a following process may be applied. First, on the
heating stage 30 within thechamber 10, the members to be joined 31, 32 that sandwich thesolder 35 therebetween are placed. A gas such as air present in thechamber 10 is forcibly discharged through the gas discharging means 26 by a vacuum pump. Simultaneously, theheating stage 30 is heated. The temperature of theheating stage 30 is measured in real time. After confirming that the temperature of themembers valve 21 is closed to disconnect thegas discharging means 26 and thechamber 10. Alternatively, after the inside of the chamber is depressurized by forcibly discharging the gas such as air present in thechamber 10 by the vacuum pump, thevalve 21 is closed to disconnect thegas discharging means 26 and thechamber 10, and then theheating stage 30 may be heated. Thus, compared with the case where the heating is performed simultaneously with the forcible discharge of gas, theheating stage 30 can be heated to the predetermined temperature in a shorter time. Subsequently, avalve 20 is opened, the mixed gas of the inert gas and the carboxylic acid gas is introduced by the gas introducing means 25 for the mixed gas of the inert gas and the carboxylic acid gas, the inside of thechamber 10 is filled with the mixed gas of the inert gas and the carboxylic acid gas, and the acid treatment is performed. - That is, the method for estimating the concentration of the carboxylic acid gas according to the embodiment of
claim 1, during the acid treatment, a surface temperature of theheating stage 30 is measured with two thermometers, one thermometer that is not influenced by the carboxylic acid and the other thermometer that is influenced by the carboxylic acid, thereby to estimate the concentration of the carboxylic acid gas in thechamber 10. Thefirst thermometer 37 is a contact type thermometer such as a mercury thermometer, a resistance thermometer, a thermocouple thermometer or the like, or, as described above, a radiation thermometer that measures a temperature by infrared in a wavelength region that the carboxylic acid gas does not absorb, and the measured temperature is an actual temperature of theheating stage 30 because it is not influenced by the carboxylic acid gas. On the basis of the measured temperature of thefirst thermometer 37, the surface temperature of theheating stage 30 is controlled, and an acid treatment temperature is kept within a predetermined temperature range. Thefirst thermometer 37 can be used to measure and maintain the surface temperature when heating theheating stage 30 to a melting temperature of the solder after the end of the acid treatment. - The
second radiation thermometer 38 is, as described above, a radiation thermometer for measuring a temperature by infrared in the region that the carboxylic acid gas absorbs. The surface temperature of theheating stage 30 measured by the second radiation thermometer does not show an actual temperature of theheating stage 30 because it is influenced by the carboxylic acid gas. That is, thesecond radiation thermometer 38 shows a temperature lower than the actual temperature in accordance with an amount of the infrared absorbed by the carboxylic acid gas. Further, the amount of the infrared absorbed by the carboxylic acid gas is proportional to the concentration of the carboxylic acid gas. For example, under condition of constant temperature, the temperature indicated by thesecond radiation thermometer 38 becomes lower as the carboxylic acid gas concentration becomes higher, the temperature indicated by thesecond radiation thermometer 38 becomes higher as the carboxylic acid gas concentration becomes lower. When thesecond radiation thermometer 38 shows a temperature that is the same as the temperature indicated by thefirst thermometer 37, the concentration of the carboxylic acid gas is zero. Thus, whether the carboxylic acid gas concentration is high or low can be estimated from the temperature difference between the temperatures that the first thermometer and the second radiation thermometer indicate. - As the acid treatment progresses, the carboxylic acid gas concentration in the
chamber 10 decreases and becomes substantially constant after the end of the acid treatment. Therefore, the temperature indicated by thesecond radiation thermometer 38 is low at the time of start of the acid treatment, rises gradually as the acid treatment progresses, and becomes substantially constant after the end of the acid treatment. Thus, a progress status of the acid treatment can be determined from the temperature indicated by thesecond radiation thermometer 38 in real time. - Now, it is known that intensity of infrared radiated from an object is influenced by a temperature thereof and increases as the temperature becomes higher. Therefore, when the carboxylic acid gas concentration during the acid treatment is measured by using the
second radiation thermometer 38, it is an important requisite that the temperature in thechamber 10 is constant. However, in an embodiment of the present invention, there is no problem in this point because the temperature of theheating stage 30 is measured with thefirst thermometer 37 in real time and controlled so as to keep a predetermined temperature. - Further, in a method for estimating a concentration of a carboxylic acid gas according to the embodiment of
claim 2, while changing the carboxylic acid gas concentration in a mixed gas of an inert gas and the carboxylic acid gas, the surface temperature of theheating stage 30 is measured with thefirst thermometer 37. While controlling the temperature of theheating stage 30 to a predetermined temperature on the basis of the measured temperature, the surface temperature of theheating stage 30 is measured with thesecond radiation thermometer 38. Then, by obtaining a temperature difference (ΔT) between the temperatures indicated by thefirst thermometer 37 and thesecond radiation thermometer 38 and then by preparing in advance a calibration line that shows the relationship of the concentration of the carboxylic acid gas and the temperature difference (ΔT) and using the calibration line, from a temperature difference (ΔTx) of the surface temperature of theheating stage 30 by the first thermometer and the second radiation thermometer, the concentration of the carboxylic acid gas in thechamber 10 can be determined. - That is, when the calibration line that shows the relationship between the carboxylic acid gas concentration and the temperature difference (ΔT) is prepared in advance, only by obtaining the temperature difference ΔTx in the
chamber 10 in which carboxylic acid gas concentration is unknown, the carboxylic acid gas concentration can be quantitatively determined. - The calibration line of the formic acid can be prepared, for example, in the following manner. After evacuating the
chamber 10, theheating stage 30 placed in the chamber is heated to a predetermined temperature. Then after the temperature of theheating stage 30 is stabilized, a mixed gas of a formic acid gas whose concentration is known and an inert gas is introduced into thechamber 10. A temperature (T1) that thefirst thermometer 37 indicates and a temperature (T2) that thesecond radiation thermometer 38 indicates are simultaneously measured, and a temperature difference (ΔT) between T1 and T2 is determined. With changing the formic acid gas concentration, a similar operation is repeated. Further, with changing the temperature of theheating stage 30, a similar operation is repeated. At the end, for every temperature of theheating stage 30, the relationship between the formic acid gas concentration (%) and the temperature difference (ΔT) is plotted and approximating by a linear regression line, the calibration line is sufficient. - The carboxylic acid gas concentration for preparing the calibration line can be optionally set. For example, in the case of removing an oxide film by the formic acid, a preferable range of the formic acid gas used is 1.5 to 3% by volume. When considering that the formic acid gas concentration decreases by the acid treatment, the calibration line of the concentration up to about 3% by volume may be prepared.
- As described above, the intensity of the radiated infrared changes depending on the temperature of the
heating stage 30 because the intensity of the radiated infrared is different depending on the temperature of the object. Therefore, even when an amount of the infrared that the carboxylic acid gas absorbs is the same, the temperature indicated by thesecond radiation thermometer 38 is different for different acid treatment temperatures. Therefore, the calibration line has to be prepared for every acid treatment temperature because the relationship between the carboxylic acid gas concentration and the temperature difference (ΔT) varies depending on the temperature. - When the calibration line is prepared, by optionally setting a temperature range and by preparing a plurality of the calibration lines corresponding to each of acid treatment temperatures in advance, the carboxylic acid gas concentration can be known for a wide range of temperature. By preparing the calibration lines that show the relationship between the carboxylic acid gas concentration and the temperature difference (ΔT) under a plurality of conditions different in the acid treatment temperature and by obtaining a relational expression that shows the relationship between a gradient of the calibration line and the acid treatment temperature, a gradient of the calibration line at a predetermined acid treatment temperature can be determined from the relational expression. Then, by determining the carboxylic acid gas concentration in the chamber from the gradient of the calibration line and the temperature difference (ΔTx), the carboxylic acid gas concentration can be estimated. From a viewpoint such that there is a case where, in the chamber of normal temperature under evacuation, the mixed gas of the inert gas and the carboxylic acid gas is introduced in advance, or almost all solder is molten at 350° C., or the like, when the calibration lines are prepared in the range of from normal temperature to 350° C., the carboxylic acid gas concentrations in the soldering treatment and the soldering apparatus can be estimated.
- Further, a width of the temperature for which the calibration line is prepared is not particularly limited but may be appropriately selected in the range between 25° C. and 50° C. in accordance with measurement precision of the carboxylic acid concentration. For example, when the acid treatment temperature is set to 150° C., by preparing the calibration lines at an interval of 50° C. between 100° C. and 300° C., the formic acid concentration can be estimated with high precision in the range between 100° C. and 300° C.
- An amount of the carboxylic acid in the chamber can be also estimated by using the carboxylic acid gas concentration estimated by the method for estimating the carboxylic acid gas concentration according to the embodiment of the present invention. Specifically, after determining the amount of the carboxylic acid gas in the chamber by multiplying a chamber volume by the carboxylic acid gas concentration, and by converting a pressure in the chamber into normal pressure, the amount of the carboxylic acid gas in the chamber can be determined. It should be noted that the pressure in the chamber is a pressure in the chamber at a point of time of a measurement of a temperature difference (ΔTx) between the temperatures indicated by the first thermometer and the second thermometer.
- Hereinafter, the present invention will be described in more detail with reference to some examples. However, the present invention is not limited to the following examples.
- In a configuration shown in
FIG. 1 , a test was performed using a soldering apparatus provided with achamber 10 having a capacity of 20 liters. After evacuating thechamber 10, a heating plate (heating stage 30) disposed in the chamber was heated to 150° C. and after stabilization of the temperature, a mixed gas of a formic acid gas having a concentration of 2.4% and an inert gas was introduced into the chamber. A temperature (T1) indicated by thefirst thermometer 37 and a temperature (T2) indicated by thesecond radiation thermometer 38 were simultaneously read, and a temperature difference of T1 and T2 (ΔT) was determined. Then the similar operation was repeated with change of the formic acid gas concentration to 1.2% and 0.6%. SeeFIG. 3 . The similar operation was repeated with change of the temperature of the heating plate to 250° C. and 350° C. SeeFIG. 4 . - For every temperature of the heating plate, the relationship between the formic acid gas concentration (%) and the temperature difference (ΔT) was plotted and approximated with a linear regression line to prepare a calibration line. See
FIG. 5 . - Further, regarding three calibration lines in
FIG. 5 , with the acid treatment temperature (plate setting temperature) in a horizontal axis and with a gradient (%/ΔT) of the calibration line in a vertical axis, a relational expression (linear regression line) showing the relationship between the gradient of the calibration line and the acid treatment temperature was prepared. SeeFIG. 6 . -
FIG. 3 andFIG. 4 shows that the higher the formic acid gas concentration is, the larger the temperature difference (ΔT) becomes. In the case where the formic acid gas concentrations are the same, the higher the temperature of the heating plate is, the larger the temperature difference (ΔT) becomes. Thus, by measuring the temperature difference (ΔT), the formic acid gas concentration in the chamber can be estimated. Further, by using the calibration line ofFIG. 5 , the formic acid gas concentration can be quantitatively determined. - The gradient of the calibration line at the acid treatment temperature of 200° C. can be determined as 0.37 (%/ΔT) using the linear regression line prepared in Example 1 (
FIG. 6 ). Further, from the gradient of the calibration line and measured temperature difference (ΔT) of two thermometers at the acid treatment temperature of 200° C., the carboxylic acid gas concentration in the chamber can be calculated. - An amount of the carboxylic acid at the acid treatment temperature of 200° C. can be calculated by multiplying the carboxylic acid gas concentration calculated in Example 2 by the chamber capacity (20 liters) to calculate an amount of the carboxylic acid gas in the chamber, and by converting this amount from a pressure in the chamber at the time of temperature measurement to a normal pressure.
- As described above, the method for estimating concentration of the carboxylic acid gas of the present invention is useful for a) knowing the concentration of the carboxylic acid gas in the chamber after the end of the acid treatment process, b) knowing the change of the concentration of the carboxylic acid gas in the case where the temperature is changed during the acid treatment process, and c) tracking the variation in the concentration of the carboxylic acid gas in the soldering apparatus. Further, the soldering apparatus for estimating the carboxylic acid gas concentration in the chamber is also useful for improvement of the productivity due to shortening of the soldering process.
-
- 10 chamber
- 20 valve
- 21 valve
- 25 gas introduction means
- 26 gas discharging means
- 30 heating stage
- 31 member
- 32 member
- 35 solder
- 37 first thermometer
- 37W transmissive window
- 38 second radiation thermometer
- 38W transmissive window
Claims (9)
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JP2014-009261 | 2014-01-22 | ||
JP2014009261A JP5661957B1 (en) | 2014-01-22 | 2014-01-22 | Method for estimating carboxylic acid gas concentration and soldering apparatus |
PCT/JP2015/050100 WO2015111424A1 (en) | 2014-01-22 | 2015-01-06 | Method for estimating carboxylic acid gas concentration, and soldering device |
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PCT/JP2015/050100 A-371-Of-International WO2015111424A1 (en) | 2014-01-22 | 2015-01-06 | Method for estimating carboxylic acid gas concentration, and soldering device |
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US15/358,653 Continuation US9956635B2 (en) | 2014-01-22 | 2016-11-22 | Method for estimating carboxylic acid gas concentration and soldering apparatus |
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US15/358,653 Expired - Fee Related US9956635B2 (en) | 2014-01-22 | 2016-11-22 | Method for estimating carboxylic acid gas concentration and soldering apparatus |
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US (2) | US9513211B1 (en) |
EP (1) | EP3098012B1 (en) |
JP (1) | JP5661957B1 (en) |
CN (1) | CN106029277B (en) |
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US20190128827A1 (en) * | 2017-11-01 | 2019-05-02 | Palo Alto Research Center Incorporated | Sorbent based gas concentration monitor |
US10766085B2 (en) * | 2017-03-30 | 2020-09-08 | Origin Company, Limited | Work processing apparatus and method for manufacturing a processed work |
EP4088846A4 (en) * | 2020-01-09 | 2024-01-17 | Origin Co Ltd | Deoxidized member production method and deoxidizing device |
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CN108344764A (en) * | 2018-03-13 | 2018-07-31 | 华侨大学 | Low-temperature high-vacuum composite heating platform |
JP6476342B1 (en) * | 2018-10-15 | 2019-02-27 | オリジン電気株式会社 | Reducing gas supply device and method of manufacturing processed object |
JP2020150202A (en) * | 2019-03-15 | 2020-09-17 | キオクシア株式会社 | Method for manufacturing semiconductor device |
JP7116236B1 (en) * | 2021-09-30 | 2022-08-09 | 株式会社オリジン | Soldering device and method for manufacturing soldered products |
TWI810058B (en) * | 2022-09-06 | 2023-07-21 | 廣化科技股份有限公司 | Measuring method of liquid mixture purity |
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JPH071203B2 (en) * | 1989-12-18 | 1995-01-11 | 三洋電機株式会社 | Infrared detector |
JP2967888B2 (en) * | 1991-09-03 | 1999-10-25 | 井関農機株式会社 | Temperature estimation method by near infrared spectroscopy |
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JP2008045985A (en) * | 2006-08-15 | 2008-02-28 | Omron Corp | Solder material inspection method, solder material inspection device, control program, computer-readable recording medium |
JP5308022B2 (en) * | 2007-12-28 | 2013-10-09 | 三菱重工業株式会社 | Dehydration apparatus and method |
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2014
- 2014-01-22 JP JP2014009261A patent/JP5661957B1/en not_active Expired - Fee Related
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- 2015-01-06 WO PCT/JP2015/050100 patent/WO2015111424A1/en active Application Filing
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Cited By (5)
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US10766085B2 (en) * | 2017-03-30 | 2020-09-08 | Origin Company, Limited | Work processing apparatus and method for manufacturing a processed work |
US20190128827A1 (en) * | 2017-11-01 | 2019-05-02 | Palo Alto Research Center Incorporated | Sorbent based gas concentration monitor |
US10883947B2 (en) * | 2017-11-01 | 2021-01-05 | Palo Alto Research Center Incorporated | Sorbent based gas concentration monitor |
US11619601B2 (en) | 2017-11-01 | 2023-04-04 | Palo Alto Research Center Incorporated | Sorbent based gas concentration monitor |
EP4088846A4 (en) * | 2020-01-09 | 2024-01-17 | Origin Co Ltd | Deoxidized member production method and deoxidizing device |
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CN106029277A (en) | 2016-10-12 |
EP3098012A1 (en) | 2016-11-30 |
EP3098012B1 (en) | 2018-12-19 |
US9513211B1 (en) | 2016-12-06 |
JP5661957B1 (en) | 2015-01-28 |
US9956635B2 (en) | 2018-05-01 |
TW201534889A (en) | 2015-09-16 |
JP2015136711A (en) | 2015-07-30 |
CN106029277B (en) | 2017-11-21 |
TWI529382B (en) | 2016-04-11 |
US20170072493A1 (en) | 2017-03-16 |
WO2015111424A1 (en) | 2015-07-30 |
EP3098012A4 (en) | 2017-08-23 |
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