US20160148634A1 - Magnetic recording media with improved grain columnar growth for energy assisted magnetic recording - Google Patents
Magnetic recording media with improved grain columnar growth for energy assisted magnetic recording Download PDFInfo
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- US20160148634A1 US20160148634A1 US15/013,206 US201615013206A US2016148634A1 US 20160148634 A1 US20160148634 A1 US 20160148634A1 US 201615013206 A US201615013206 A US 201615013206A US 2016148634 A1 US2016148634 A1 US 2016148634A1
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- 239000000696 magnetic material Substances 0.000 claims abstract description 17
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- MCMNRKCIXSYSNV-UHFFFAOYSA-N Zirconium dioxide Chemical compound O=[Zr]=O MCMNRKCIXSYSNV-UHFFFAOYSA-N 0.000 claims description 6
- QDOXWKRWXJOMAK-UHFFFAOYSA-N dichromium trioxide Chemical compound O=[Cr]O[Cr]=O QDOXWKRWXJOMAK-UHFFFAOYSA-N 0.000 claims description 6
- GNTDGMZSJNCJKK-UHFFFAOYSA-N divanadium pentaoxide Chemical compound O=[V](=O)O[V](=O)=O GNTDGMZSJNCJKK-UHFFFAOYSA-N 0.000 claims description 6
- ZKATWMILCYLAPD-UHFFFAOYSA-N niobium pentoxide Chemical compound O=[Nb](=O)O[Nb](=O)=O ZKATWMILCYLAPD-UHFFFAOYSA-N 0.000 claims description 6
- 229910052804 chromium Inorganic materials 0.000 claims description 4
- 229910052681 coesite Inorganic materials 0.000 claims description 4
- 229910052906 cristobalite Inorganic materials 0.000 claims description 4
- 229910052682 stishovite Inorganic materials 0.000 claims description 4
- 229910052905 tridymite Inorganic materials 0.000 claims description 4
- 229910011255 B2O3 Inorganic materials 0.000 claims description 3
- 229910052796 boron Inorganic materials 0.000 claims description 3
- CJNBYAVZURUTKZ-UHFFFAOYSA-N hafnium(IV) oxide Inorganic materials O=[Hf]=O CJNBYAVZURUTKZ-UHFFFAOYSA-N 0.000 claims description 3
- CPLXHLVBOLITMK-UHFFFAOYSA-N magnesium oxide Inorganic materials [Mg]=O CPLXHLVBOLITMK-UHFFFAOYSA-N 0.000 claims description 3
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- PBCFLUZVCVVTBY-UHFFFAOYSA-N tantalum pentoxide Inorganic materials O=[Ta](=O)O[Ta](=O)=O PBCFLUZVCVVTBY-UHFFFAOYSA-N 0.000 claims description 3
- ZNOKGRXACCSDPY-UHFFFAOYSA-N tungsten(VI) oxide Inorganic materials O=[W](=O)=O ZNOKGRXACCSDPY-UHFFFAOYSA-N 0.000 claims description 3
- XLOMVQKBTHCTTD-UHFFFAOYSA-N zinc oxide Inorganic materials [Zn]=O XLOMVQKBTHCTTD-UHFFFAOYSA-N 0.000 claims description 3
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- 238000000034 method Methods 0.000 abstract description 26
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- 230000015572 biosynthetic process Effects 0.000 description 3
- 238000009616 inductively coupled plasma Methods 0.000 description 3
- 229910015187 FePd Inorganic materials 0.000 description 2
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- 229910052751 metal Inorganic materials 0.000 description 2
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- 238000000992 sputter etching Methods 0.000 description 2
- 229910018979 CoPt Inorganic materials 0.000 description 1
- 241000849798 Nita Species 0.000 description 1
- ATJFFYVFTNAWJD-UHFFFAOYSA-N Tin Chemical compound [Sn] ATJFFYVFTNAWJD-UHFFFAOYSA-N 0.000 description 1
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- 229910021386 carbon form Inorganic materials 0.000 description 1
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- 229910052721 tungsten Inorganic materials 0.000 description 1
Images
Classifications
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
- G11B5/00—Recording by magnetisation or demagnetisation of a record carrier; Reproducing by magnetic means; Record carriers therefor
- G11B5/62—Record carriers characterised by the selection of the material
- G11B5/73—Base layers, i.e. all non-magnetic layers lying under a lowermost magnetic recording layer, e.g. including any non-magnetic layer in between a first magnetic recording layer and either an underlying substrate or a soft magnetic underlayer
- G11B5/7368—Non-polymeric layer under the lowermost magnetic recording layer
- G11B5/7375—Non-polymeric layer under the lowermost magnetic recording layer for heat-assisted or thermally-assisted magnetic recording [HAMR, TAMR]
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
- G11B5/00—Recording by magnetisation or demagnetisation of a record carrier; Reproducing by magnetic means; Record carriers therefor
- G11B5/62—Record carriers characterised by the selection of the material
- G11B5/73—Base layers, i.e. all non-magnetic layers lying under a lowermost magnetic recording layer, e.g. including any non-magnetic layer in between a first magnetic recording layer and either an underlying substrate or a soft magnetic underlayer
- G11B5/733—Base layers, i.e. all non-magnetic layers lying under a lowermost magnetic recording layer, e.g. including any non-magnetic layer in between a first magnetic recording layer and either an underlying substrate or a soft magnetic underlayer characterised by the addition of non-magnetic particles
-
- G11B5/647—
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
- G11B5/00—Recording by magnetisation or demagnetisation of a record carrier; Reproducing by magnetic means; Record carriers therefor
- G11B5/62—Record carriers characterised by the selection of the material
- G11B5/64—Record carriers characterised by the selection of the material comprising only the magnetic material without bonding agent
- G11B5/65—Record carriers characterised by the selection of the material comprising only the magnetic material without bonding agent characterised by its composition
- G11B5/653—Record carriers characterised by the selection of the material comprising only the magnetic material without bonding agent characterised by its composition containing Fe or Ni
-
- G11B5/732—
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- G11B5/7325—
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
- G11B5/00—Recording by magnetisation or demagnetisation of a record carrier; Reproducing by magnetic means; Record carriers therefor
- G11B5/62—Record carriers characterised by the selection of the material
- G11B5/73—Base layers, i.e. all non-magnetic layers lying under a lowermost magnetic recording layer, e.g. including any non-magnetic layer in between a first magnetic recording layer and either an underlying substrate or a soft magnetic underlayer
- G11B5/7368—Non-polymeric layer under the lowermost magnetic recording layer
- G11B5/7369—Two or more non-magnetic underlayers, e.g. seed layers or barrier layers
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
- G11B5/00—Recording by magnetisation or demagnetisation of a record carrier; Reproducing by magnetic means; Record carriers therefor
- G11B5/62—Record carriers characterised by the selection of the material
- G11B5/73—Base layers, i.e. all non-magnetic layers lying under a lowermost magnetic recording layer, e.g. including any non-magnetic layer in between a first magnetic recording layer and either an underlying substrate or a soft magnetic underlayer
- G11B5/7368—Non-polymeric layer under the lowermost magnetic recording layer
- G11B5/7379—Seed layer, e.g. at least one non-magnetic layer is specifically adapted as a seed or seeding layer
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
- G11B5/00—Recording by magnetisation or demagnetisation of a record carrier; Reproducing by magnetic means; Record carriers therefor
- G11B5/84—Processes or apparatus specially adapted for manufacturing record carriers
- G11B5/855—Coating only part of a support with a magnetic layer
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01F—MAGNETS; INDUCTANCES; TRANSFORMERS; SELECTION OF MATERIALS FOR THEIR MAGNETIC PROPERTIES
- H01F1/00—Magnets or magnetic bodies characterised by the magnetic materials therefor; Selection of materials for their magnetic properties
- H01F1/0027—Thick magnetic films
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01F—MAGNETS; INDUCTANCES; TRANSFORMERS; SELECTION OF MATERIALS FOR THEIR MAGNETIC PROPERTIES
- H01F41/00—Apparatus or processes specially adapted for manufacturing or assembling magnets, inductances or transformers; Apparatus or processes specially adapted for manufacturing materials characterised by their magnetic properties
- H01F41/14—Apparatus or processes specially adapted for manufacturing or assembling magnets, inductances or transformers; Apparatus or processes specially adapted for manufacturing materials characterised by their magnetic properties for applying magnetic films to substrates
- H01F41/30—Apparatus or processes specially adapted for manufacturing or assembling magnets, inductances or transformers; Apparatus or processes specially adapted for manufacturing materials characterised by their magnetic properties for applying magnetic films to substrates for applying nanostructures, e.g. by molecular beam epitaxy [MBE]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01F—MAGNETS; INDUCTANCES; TRANSFORMERS; SELECTION OF MATERIALS FOR THEIR MAGNETIC PROPERTIES
- H01F10/00—Thin magnetic films, e.g. of one-domain structure
- H01F10/08—Thin magnetic films, e.g. of one-domain structure characterised by magnetic layers
- H01F10/10—Thin magnetic films, e.g. of one-domain structure characterised by magnetic layers characterised by the composition
- H01F10/12—Thin magnetic films, e.g. of one-domain structure characterised by magnetic layers characterised by the composition being metals or alloys
- H01F10/123—Thin magnetic films, e.g. of one-domain structure characterised by magnetic layers characterised by the composition being metals or alloys having a L10 crystallographic structure, e.g. [Co,Fe][Pt,Pd] thin films
Definitions
- aspects of the present invention relate to heat assisted or energy assisted magnetic recording, and, more particular, systems and methods for forming magnetic recording media with improved columnar growth for heat assisted or energy assisted magnetic recording.
- FePt is often chosen as one of the suitable materials for a magnetic recording layer. This material is shown to have a desired thermal gradient near the Curie point for heat assisted magnetic recording.
- non-magnetic segregants e.g., C, Cr, B, SiO 2 , TiO 2 , Cr 2 O 3 , Ag, BN, V 2 O 5 , ZrO 2 , Nb 2 O 5 , HfO 2 , Ta 2 O 5 , WO 3 , MgO, B 2 O 3 , ZnO, etc.
- sufficiently low grain size distributions e.g., ⁇ 20%.
- Carbon has been found to be one of the effective additives which shows the above mentioned properties. However, as the grain sizes get smaller, it becomes difficult to make the magnetic recording layer thicker.
- a ratio t/D (where t is the thickness, and D is the grain diameter) is found to be limited to approximately 1. This leads to severe reduction in read-back amplitude and hence poor recording performance at high densities. Therefore, it is desirable to improve the performance of existing magnetic recording layers and methods for forming the same.
- Embodiments of the present invention are directed to magnetic recording media with improved columnar growth of the magnetic grains. Embodiments of the present invention are also directed to methods for forming the improved magnetic recording media.
- a method for fabricating a magnetic recording medium is provided.
- a first sub-layer of a magnetic layer is formed on a substrate, the magnetic layer including a magnetic material and a plurality of non-magnetic segregants, a top surface of the first sub-layer is etched to substantially remove the non-magnetic segregants accumulated on the top surface, and a second sub-layer of the magnetic layer is formed on the first sub-layer.
- the magnetic recording medium includes a substrate and a magnetic recording layer on the substrate, the magnetic recording layer including a magnetic material and a plurality of non-magnetic segregants.
- the magnetic material includes a plurality of grains having substantially continuous columnar crystal growth.
- the magnetic recording layer has a thickness of t, a diameter of the plurality of grains is D, and a ratio of t/D may be greater than 1.
- FIG. 1 illustrates a cross-sectional functional view of a layer stack of a magnetic recording medium for energy assisted magnetic recording (EAMR) according to an embodiment of the present invention.
- EAMR energy assisted magnetic recording
- FIG. 2 conceptually illustrates a process for fabricating an EAMR medium with an elongated columnar grain structure without the formation of an undesirable layer of segregant particles, according to an embodiment of the present invention.
- FIG. 1 illustrates a layer stack of a magnetic recording medium for energy assisted magnetic recording (EAMR).
- the magnetic recording medium includes a substrate 10 , an adhesion layer 20 on the substrate 10 , one or more heatsink layers 30 on the adhesion layer 20 , one or more under layers 40 on the heatsink layers 30 , a magnetic layer 50 on the under layers 40 , and a protective coat on the magnetic layer 50 .
- the substrate 10 may be a glass substrate, a metal substrate, or any other suitable substrates.
- the adhesion layer 20 may include CrTa, NiP, NiTa, or other suitable materials.
- the one or more heatsink layers 30 may include Cu, W, Ru, Mo, Ag, Au, Cr, Mg, Rh, Be, or alloys thereof, or other suitable materials.
- the one or more under layers 40 may include MgO, TiN, TiC, AIRu, VC, HfC, ZrC, TaC, NbC, CrC, NbN, CrN, VN, CoO, FeO, CaO, NiO, MnO, or other suitable materials.
- the magnetic layer 50 includes a first magnetic sub-layer 50 a and a second magnetic sub-layer 50 b.
- the second magnetic sub-layer 50 b is formed on the first magnetic sub-layer 50 a after performing an etching process on the first magnetic sub-layer 50 a.
- the etching process removes an accumulation of segregants such as carbon on a top surface of the first magnetic sub-layer 50 a.
- the accumulation of segregants will be discussed below in more details.
- Each of the first and second magnetic sub-layers ( 50 a and 50 b ) may include a magnetic material such as Fe, Co, and/or combinations thereof, according to several embodiments of the present invention.
- the magnetic material may include FePt, FePd, CoPt, or other suitable materials.
- the magnetic layer 50 has a ratio of t/D greater than 1, where t is a thickness of the magnetic layer 50 , and D is a diameter of the grains of the magnetic layer 50 .
- the magnetic layer 50 includes L10 FePt
- the under layers 40 include MgO on which FePt can grow with the desired texture.
- the substrate 10 can be a high temperature glass substrate or a metal substrate that facilitates the growth of the layers formed thereon for obtaining a good crystallographic texture growth for L10 FePt.
- carbon is added to segregate the grains of FePt because FePt and carbon are immiscible.
- an FePt layer when an FePt layer is grown to be thicker than a certain thickness (e.g., about 5 nm), a layer of carbon forms on a top surface of the formed FePt layer.
- the carbon layer will decouple the FePt grains vertically when the FePt layer is grown to be thicker than the certain thickness. It was found that carbon atoms cover the top of the FePt grains after the FePt layer is grown to the certain thickness, thus preventing the columnar growth of the FePt grains.
- the thickness of the FePt layer is grown to be thicker than, e.g., about 5 nm
- an upper FePt layer is separated from a bottom FePt layer by a layer of carbon formation between the upper FePt layer and the bottom FePt layer.
- This phenomenon makes the epitaxial columnar growth of the FePt layer very difficult above a certain thickness (e.g., 5 nm). As such, the control of grain distributions and magnetic properties of the magnetic layer become difficult.
- FIG. 2 conceptually illustrates a process for fabricating an EAMR medium with an elongated columnar grain structure without the formation of an undesirable layer of segregant particles (e.g., C), according to an embodiment of the present invention.
- the process forms a first sub-layer 110 of a magnetic layer (e.g., FePt layer) on a suitable substrate (not shown in FIG.
- the magnetic layer includes a magnetic material (e.g., FePt) and non-magnetic segregants (e.g., C, Cr, B, SiO 2 , TiO 2 , Cr 2 O 3 , Ag, BN, V 2 O 5 , ZrO 2 , Nb 2 O 5 , HfO 2 , Ta 2 O 5 , WO 3 , MgO, B 2 O 3 , ZnO, etc.).
- the first sub-layer 110 is grown to a preselected thickness (e.g., 5 nm).
- a segregant layer 112 e.g., carbon layer
- the presence of this undesirable segregant layer 112 prevents further vertical columnar growth of grains of the magnetic layer because the segregant layer 112 decouples the magnetic grains vertically.
- the process etches a top surface of the first sub-layer 110 to substantially remove the segregants accumulated on the top surface.
- the segregant layer 112 can be etched away by a suitable etching process. During the etching process of the first sub-layer 110 , a portion of the first sub-layer 110 proximate to the top surface is removed. The removed portion of the first sub-layer 110 has a concentration of the segregants higher than that of the other portions of the first sub-layer 110 .
- ICP inductively coupled plasma
- the ICP etching process can be performed with an ICP etch gas mixture selected from the group consisting of Ar, H 2 , O 2 , Xe, Ne, N 2 , and other suitable etching gases.
- an ICP etch gas mixture selected from the group consisting of Ar, H 2 , O 2 , Xe, Ne, N 2 , and other suitable etching gases.
- the present invention is not limited to the above described etching process, and other suitable etching processes, such as ion milling, sputter etching, reactive ion etching, etc., may be used in various embodiments.
- the process grows a second sub-layer 114 of the magnetic layer on the exposed grains of the etched first sub-layer 110 to increase the total thickness of the resultant magnetic layer.
- a thicker magnetic layer 200 can be fabricated (e.g., greater than 5 nm or 7 nm) with continuous columnar growth than if the segregant layer 112 were not removed.
- the magnetic layer 200 include FePt that can be grown from about 10 nm to about 15 nm in thickness with good epitaxy.
- the resultant magnetic layer i.e., FePt layer
- the magnetic layer 200 include FePt that has grain sizes between about 4 nm and about 9 nm in diameter, inclusive. In other embodiments, the magnetic layer 200 include FePt that has grain sizes between 5 nm and about 6 nm, inclusive.
- the first sub-layer 110 has a thickness between about 3 nm and about 6 nm, inclusive
- the second sub-layer 114 has a thickness between about 3 nm and about 10 nm, inclusive. In several embodiments, the first sub-layer 110 has a thickness between about 3 nm and about 4 nm, inclusive. It should be appreciated that the above described materials and processes used for forming the EAMR medium are illustrative only, and the present invention is not limited thereto. In several embodiments, the EAMR medium may include other suitable magnetic materials and segregants.
- the above described processes can be used to form additional sub-layers of the magnetic layer 200 .
- a top surface of the second sub-layer 114 can be etched to substantially remove a second segregant layer (not shown in FIG. 2 ) accumulated on the top surface of the second sub-layer 114 .
- a third sub-layer (not shown) of the magnetic layer 200 is formed on the second sub-layer 114 .
- an adhesion layer, a heatsink layer, and an under-layer can be formed between the magnetic layer 200 and the substrate.
- the process or method can perform the sequence of actions in a different order. In another embodiment, the process or method can skip one or more of the actions. In other embodiments, one or more of the actions are performed simultaneously or concurrently. In some embodiments, additional actions can be performed.
- magnetic layers with smaller grain sizes can be grown thicker to provide sufficient read-back signal and good signal-to-noise ratio (SNR). Also, the above described processes can significantly improve the surface roughness of a magnetic medium.
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- Chemical & Material Sciences (AREA)
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- Spectroscopy & Molecular Physics (AREA)
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Abstract
Description
- This application is a divisional of U.S. patent application Ser. No. 13/436,596, filed on Mar. 30, 2012, which is hereby incorporated by reference in its entirety.
- Aspects of the present invention relate to heat assisted or energy assisted magnetic recording, and, more particular, systems and methods for forming magnetic recording media with improved columnar growth for heat assisted or energy assisted magnetic recording.
- Due to the increasing demand for more data storage, heat assisted or energy assisted magnetic recording concepts have been pursued as ways to achieve higher density magnetic recording well over a Terabit/int in media design. Among the many available magnetic materials, FePt is often chosen as one of the suitable materials for a magnetic recording layer. This material is shown to have a desired thermal gradient near the Curie point for heat assisted magnetic recording.
- To achieve magnetic material (e.g., FePt, FePd) with high densities, non-magnetic segregants (e.g., C, Cr, B, SiO2, TiO2, Cr2O3, Ag, BN, V2O5, ZrO2, Nb2O5, HfO2, Ta2O5, WO3, MgO, B2O3, ZnO, etc.) can be added in order to attain smaller grain sizes of the magnetic material with sufficiently low grain size distributions (e.g., <20%). Carbon has been found to be one of the effective additives which shows the above mentioned properties. However, as the grain sizes get smaller, it becomes difficult to make the magnetic recording layer thicker. For example, in an FePt-C system, a ratio t/D (where t is the thickness, and D is the grain diameter) is found to be limited to approximately 1. This leads to severe reduction in read-back amplitude and hence poor recording performance at high densities. Therefore, it is desirable to improve the performance of existing magnetic recording layers and methods for forming the same.
- Embodiments of the present invention are directed to magnetic recording media with improved columnar growth of the magnetic grains. Embodiments of the present invention are also directed to methods for forming the improved magnetic recording media.
- According to an embodiment of the present invention, a method for fabricating a magnetic recording medium is provided. According to the embodiment, a first sub-layer of a magnetic layer is formed on a substrate, the magnetic layer including a magnetic material and a plurality of non-magnetic segregants, a top surface of the first sub-layer is etched to substantially remove the non-magnetic segregants accumulated on the top surface, and a second sub-layer of the magnetic layer is formed on the first sub-layer.
- According to another embodiment of the present invention, a magnetic recording medium is provided. According to the embodiment, the magnetic recording medium includes a substrate and a magnetic recording layer on the substrate, the magnetic recording layer including a magnetic material and a plurality of non-magnetic segregants. In the embodiment, the magnetic material includes a plurality of grains having substantially continuous columnar crystal growth. In one embodiment, the magnetic recording layer has a thickness of t, a diameter of the plurality of grains is D, and a ratio of t/D may be greater than 1.
- The above and other features and aspects of the present invention will become more apparent by describing in detail embodiments thereof with reference to the attached drawings in which:
-
FIG. 1 illustrates a cross-sectional functional view of a layer stack of a magnetic recording medium for energy assisted magnetic recording (EAMR) according to an embodiment of the present invention. -
FIG. 2 conceptually illustrates a process for fabricating an EAMR medium with an elongated columnar grain structure without the formation of an undesirable layer of segregant particles, according to an embodiment of the present invention. - As the present invention allows for various changes and numerous embodiments, particular embodiments will be illustrated in the drawings and described in detail in the written description. However, this is not intended to limit the present invention to particular modes of practice, and it is to be appreciated that all changes, equivalents, and substitutes that do not depart from the spirit and technical scope of the present invention are encompassed in the present invention.
-
FIG. 1 illustrates a layer stack of a magnetic recording medium for energy assisted magnetic recording (EAMR). Referring toFIG. 1 , the magnetic recording medium includes asubstrate 10, anadhesion layer 20 on thesubstrate 10, one ormore heatsink layers 30 on theadhesion layer 20, one or more underlayers 40 on theheatsink layers 30, amagnetic layer 50 on the underlayers 40, and a protective coat on themagnetic layer 50. Thesubstrate 10 may be a glass substrate, a metal substrate, or any other suitable substrates. Theadhesion layer 20 may include CrTa, NiP, NiTa, or other suitable materials. The one ormore heatsink layers 30 may include Cu, W, Ru, Mo, Ag, Au, Cr, Mg, Rh, Be, or alloys thereof, or other suitable materials. The one or more underlayers 40 may include MgO, TiN, TiC, AIRu, VC, HfC, ZrC, TaC, NbC, CrC, NbN, CrN, VN, CoO, FeO, CaO, NiO, MnO, or other suitable materials. - In
FIG. 1 , themagnetic layer 50 includes a firstmagnetic sub-layer 50 a and a secondmagnetic sub-layer 50 b. The secondmagnetic sub-layer 50 b is formed on the firstmagnetic sub-layer 50 a after performing an etching process on the firstmagnetic sub-layer 50 a. The etching process removes an accumulation of segregants such as carbon on a top surface of the firstmagnetic sub-layer 50 a. The accumulation of segregants will be discussed below in more details. Each of the first and second magnetic sub-layers (50 a and 50 b) may include a magnetic material such as Fe, Co, and/or combinations thereof, according to several embodiments of the present invention. For example, the magnetic material may include FePt, FePd, CoPt, or other suitable materials. In one embodiment, themagnetic layer 50 has a ratio of t/D greater than 1, where t is a thickness of themagnetic layer 50, and D is a diameter of the grains of themagnetic layer 50. - In one embodiment, the
magnetic layer 50 includes L10 FePt, and the underlayers 40 include MgO on which FePt can grow with the desired texture. Thesubstrate 10 can be a high temperature glass substrate or a metal substrate that facilitates the growth of the layers formed thereon for obtaining a good crystallographic texture growth for L10 FePt. In order to grow the FePt magnetic layer, carbon is added to segregate the grains of FePt because FePt and carbon are immiscible. - While not bound by any particular theory, when an FePt layer is grown to be thicker than a certain thickness (e.g., about 5 nm), a layer of carbon forms on a top surface of the formed FePt layer. The carbon layer will decouple the FePt grains vertically when the FePt layer is grown to be thicker than the certain thickness. It was found that carbon atoms cover the top of the FePt grains after the FePt layer is grown to the certain thickness, thus preventing the columnar growth of the FePt grains. Therefore, when the thickness of the FePt layer is grown to be thicker than, e.g., about 5 nm, an upper FePt layer is separated from a bottom FePt layer by a layer of carbon formation between the upper FePt layer and the bottom FePt layer. This phenomenon makes the epitaxial columnar growth of the FePt layer very difficult above a certain thickness (e.g., 5 nm). As such, the control of grain distributions and magnetic properties of the magnetic layer become difficult.
-
FIG. 2 conceptually illustrates a process for fabricating an EAMR medium with an elongated columnar grain structure without the formation of an undesirable layer of segregant particles (e.g., C), according to an embodiment of the present invention. Referring toFIG. 2 , in a block S100, the process forms afirst sub-layer 110 of a magnetic layer (e.g., FePt layer) on a suitable substrate (not shown inFIG. 2 ), where the magnetic layer includes a magnetic material (e.g., FePt) and non-magnetic segregants (e.g., C, Cr, B, SiO2, TiO2, Cr2O3, Ag, BN, V2O5, ZrO2, Nb2O5, HfO2, Ta2O5, WO3, MgO, B2O3, ZnO, etc.). Thefirst sub-layer 110 is grown to a preselected thickness (e.g., 5 nm). At this preselected thickness, a segregant layer 112 (e.g., carbon layer) forms on the top surface of thefirst sub-layer 110. The presence of this undesirablesegregant layer 112 prevents further vertical columnar growth of grains of the magnetic layer because thesegregant layer 112 decouples the magnetic grains vertically. - Still referring to
FIG. 2 , in block S102, the process etches a top surface of thefirst sub-layer 110 to substantially remove the segregants accumulated on the top surface. Thesegregant layer 112 can be etched away by a suitable etching process. During the etching process of thefirst sub-layer 110, a portion of thefirst sub-layer 110 proximate to the top surface is removed. The removed portion of thefirst sub-layer 110 has a concentration of the segregants higher than that of the other portions of thefirst sub-layer 110. In one embodiment, an inductively coupled plasma (ICP) etching process can be used to etch out thesegregant layer 112 to expose the grains of thefirst sub-layer 110 below. The ICP etching process can be performed with an ICP etch gas mixture selected from the group consisting of Ar, H2, O2, Xe, Ne, N2, and other suitable etching gases. However, the present invention is not limited to the above described etching process, and other suitable etching processes, such as ion milling, sputter etching, reactive ion etching, etc., may be used in various embodiments. - Still referring to
FIG. 2 , in block S104, after the removal of thesegregant layer 112, the process grows asecond sub-layer 114 of the magnetic layer on the exposed grains of the etchedfirst sub-layer 110 to increase the total thickness of the resultant magnetic layer. Because thesegregant layer 112 has been removed by etching, a thickermagnetic layer 200 can be fabricated (e.g., greater than 5 nm or 7 nm) with continuous columnar growth than if thesegregant layer 112 were not removed. In several embodiments of the present invention, themagnetic layer 200 include FePt that can be grown from about 10 nm to about 15 nm in thickness with good epitaxy. According to the embodiment ofFIG. 2 , the resultant magnetic layer (i.e., FePt layer) can have a ratio of t/D greater than about 1, where t is the thickness of the magnetic layer and D is a diameter of the FePt grains. - In several embodiments, the
magnetic layer 200 include FePt that has grain sizes between about 4 nm and about 9 nm in diameter, inclusive. In other embodiments, themagnetic layer 200 include FePt that has grain sizes between 5 nm and about 6 nm, inclusive. In several embodiments, thefirst sub-layer 110 has a thickness between about 3 nm and about 6 nm, inclusive, and thesecond sub-layer 114 has a thickness between about 3 nm and about 10 nm, inclusive. In several embodiments, thefirst sub-layer 110 has a thickness between about 3 nm and about 4 nm, inclusive. It should be appreciated that the above described materials and processes used for forming the EAMR medium are illustrative only, and the present invention is not limited thereto. In several embodiments, the EAMR medium may include other suitable magnetic materials and segregants. - In some embodiments, the above described processes can be used to form additional sub-layers of the
magnetic layer 200. For example, after forming thesecond sub-layer 114, a top surface of thesecond sub-layer 114 can be etched to substantially remove a second segregant layer (not shown inFIG. 2 ) accumulated on the top surface of thesecond sub-layer 114. Then, a third sub-layer (not shown) of themagnetic layer 200 is formed on thesecond sub-layer 114. In addition, an adhesion layer, a heatsink layer, and an under-layer can be formed between themagnetic layer 200 and the substrate. - In the above described embodiments, the process or method can perform the sequence of actions in a different order. In another embodiment, the process or method can skip one or more of the actions. In other embodiments, one or more of the actions are performed simultaneously or concurrently. In some embodiments, additional actions can be performed.
- According to the above described embodiments of the present invention, magnetic layers with smaller grain sizes can be grown thicker to provide sufficient read-back signal and good signal-to-noise ratio (SNR). Also, the above described processes can significantly improve the surface roughness of a magnetic medium.
- While the present invention has been particularly shown and described with reference to exemplary embodiments thereof, it will be understood by those of ordinary skill in the art that various changes in form and details may be made therein without departing from the spirit and scope of the present invention as defined by the following claims and their equivalents.
Claims (7)
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