US20150168271A1 - Method and system for performing components fault problem close loop analysis - Google Patents

Method and system for performing components fault problem close loop analysis Download PDF

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Publication number
US20150168271A1
US20150168271A1 US14/351,865 US201314351865A US2015168271A1 US 20150168271 A1 US20150168271 A1 US 20150168271A1 US 201314351865 A US201314351865 A US 201314351865A US 2015168271 A1 US2015168271 A1 US 2015168271A1
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failure
component
fault
fault tree
physics
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Xiaoqi He
Ping Lai
Yunfei En
Yuan Chen
Yunhui Wang
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Fifth Electronics Research Institute of Ministry of Industry and Information Technology
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Fifth Electronics Research Institute of Ministry of Industry and Information Technology
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Assigned to FIFTH ELECTRONICS RESEARCH INSTITUTE OF MINISTRY OF INDUSTRY AND INFORMATION TECHNOLOGY reassignment FIFTH ELECTRONICS RESEARCH INSTITUTE OF MINISTRY OF INDUSTRY AND INFORMATION TECHNOLOGY ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: CHEN, YUAN, EN, Yunfei, HE, Xiaoqi, LAI, Ping, WANG, Yunhui
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    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B23/00—Testing or monitoring of control systems or parts thereof
    • G05B23/02—Electric testing or monitoring
    • G05B23/0205—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
    • G05B23/0218—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterised by the fault detection method dealing with either existing or incipient faults
    • G05B23/0243—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterised by the fault detection method dealing with either existing or incipient faults model based detection method, e.g. first-principles knowledge model
    • G05B23/0245—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterised by the fault detection method dealing with either existing or incipient faults model based detection method, e.g. first-principles knowledge model based on a qualitative model, e.g. rule based; if-then decisions
    • G05B23/0248—Causal models, e.g. fault tree; digraphs; qualitative physics
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M99/00—Subject matter not provided for in other groups of this subclass
    • G01M99/008—Subject matter not provided for in other groups of this subclass by doing functionality tests
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B23/00—Testing or monitoring of control systems or parts thereof
    • G05B23/02—Electric testing or monitoring
    • G05B23/0205—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
    • G05B23/0218—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterised by the fault detection method dealing with either existing or incipient faults
    • G05B23/0243—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterised by the fault detection method dealing with either existing or incipient faults model based detection method, e.g. first-principles knowledge model
    • G05B23/0245—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterised by the fault detection method dealing with either existing or incipient faults model based detection method, e.g. first-principles knowledge model based on a qualitative model, e.g. rule based; if-then decisions
    • G05B23/0251—Abstraction hierarchy, e.g. "complex systems", i.e. system is divided in subsystems, subsystems are monitored and results are combined to decide on status of whole system
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B23/00—Testing or monitoring of control systems or parts thereof
    • G05B23/02—Electric testing or monitoring
    • G05B23/0205—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
    • G05B23/0259—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterized by the response to fault detection
    • G05B23/0267—Fault communication, e.g. human machine interface [HMI]
    • G05B23/0272—Presentation of monitored results, e.g. selection of status reports to be displayed; Filtering information to the user
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
    • G06F11/0703—Error or fault processing not based on redundancy, i.e. by taking additional measures to deal with the error or fault not making use of redundancy in operation, in hardware, or in data representation
    • G06F11/0706—Error or fault processing not based on redundancy, i.e. by taking additional measures to deal with the error or fault not making use of redundancy in operation, in hardware, or in data representation the processing taking place on a specific hardware platform or in a specific software environment
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
    • G06F11/0703—Error or fault processing not based on redundancy, i.e. by taking additional measures to deal with the error or fault not making use of redundancy in operation, in hardware, or in data representation
    • G06F11/079—Root cause analysis, i.e. error or fault diagnosis
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F17/00—Digital computing or data processing equipment or methods, specially adapted for specific functions
    • G06F17/10—Complex mathematical operations
    • G06F17/18—Complex mathematical operations for evaluating statistical data, e.g. average values, frequency distributions, probability functions, regression analysis

Definitions

  • the present disclosure relates generally to the field of fault diagnosis, and more particularly to a method and system for performing component fault problem close loop analysis.
  • component fault problem close loop analysis is to locate failure and determine the failure mechanism by FTA and failure analysis, to propose improvements according to the cause of failure, and thus to achieve the fault problem close loop, that is, meeting the requirements of “accurate locating, clear mechanism, and effective measures” to the fault.
  • FTA and failure analysis To achieve component fault problem close loop, a variety of techniques are used. However, most of the existing techniques of component failure analysis are those of failure phenomenon observation, which lack of analysis technology to the failure information, and the resulted fault problem close loop conclusion are related to one's analysis experience.
  • the key to fault problem close loop analysis lies in the following aspects: performing fault problem close loop analysis by systematically applying the failure observations and failure information, accurately giving the failure site and failure path inside a component, clearly giving the mechanism cause leading to the failure, and proposing effective measures for improving the mechanism reasons.
  • Fault tree analysis is a logical reasoning method for analysis of system reliability and security. By analyzing and determining the logical relations from a variety of possible factors that may lead to failure, the causes of system failure can be identified using this method, which has been widely used in the field of aerospace and electronics systems, etc.
  • fault tree analysis is gradually applied to electronic components to conduct fault problem close loop analysis by learning the electronic fault tree analysis.
  • the current problem to be solved is how to establish the component fault tree.
  • the fault dictionary method is an effective way to achieve fast fault location in complex electronic machines.
  • the fault dictionary created should be able to reflect the relationship between the cause of the fault of the measured object and the measurable external parameters and characteristics.
  • the event information of fault tree is usually used to establish this type of relationship.
  • fault diagnosis and fault problem close loop analysis using fault tree and fault dictionary method have the above advantages.
  • the fault tree and fault dictionary method are usually used to perform fault diagnosis and locating.
  • the general fault diagnosis and fault problem close loop analysis using fault tree and fault dictionary method cannot accurately perform fault locating and diagnosis due to the diversity of the failure modes and the complexity of the failure mechanism of electronic components.
  • a method for performing component fault problem close loop analysis includes the steps of:
  • the common characteristics of component failure physics include: fault object, failure mode, failure site, failure mechanism, mechanism factor, and influencing factor.
  • the step of converting the failure physics fault tree into a failure locating fault tree further includes:
  • feature parameters representing each node the feature parameters being observable parameters, the observable parameters including: electrical properties, thermal properties, mechanical properties, the apparent characteristic, gas confidentiality, and environmental adaptability;
  • the fault tree having the failure mode as top event, the observable node as intermediate event, and the failure mechanism as bottom event.
  • the step of establishing, according to the failure locating fault tree, a component fault dictionary with failure mechanism cause corresponding to failure characteristics further includes:
  • failure mechanism cause of the component determining, according to the failure positioning fault tree, failure mechanism cause of the component; and establishing, according to the failure mechanism cause and the feature value of the observable node, a component fault dictionary with failure mechanism cause corresponding to failure characteristics.
  • the step of performing fault problem close loop analysis to the component according to the failure physics fault tree and the component fault dictionary further includes:
  • a system for performing component fault problem close loop analysis includes:
  • a failure physics fault tree establishing module configured to establish, according to common characteristics of component failure physics, a component failure physics fault tree
  • a failure locating fault tree establishing module configured to convert a failure physics event into an observable node event according to the failure physics fault tree, and to convert the failure physics fault tree into a failure locating fault tree;
  • a fault dictionary establishing module configured to establish, according to the failure locating fault tree, a component fault dictionary with failure mechanism cause corresponding to failure characteristics
  • a fault problem close loop analyzing module configured to perform fault problem close loop analysis to the component according to the failure physics fault tree and the component fault dictionary.
  • the common characteristics of component failure physics include: fault object, failure mode, failure site, failure mechanism, mechanism factor, and influencing factor.
  • the failure locating fault tree establishing module further includes:
  • an event conversion unit configured to determine an observable node between a failure mode and a failure mechanism, and to represent an immeasurable event of failure physics by an observable node event
  • a feature parameters selecting unit configured to select, according to the structure and performance characteristics of the component, feature parameters representing each node, the feature parameters being observable parameters, the observable parameters including: electrical properties, thermal properties, mechanical properties, the apparent characteristic, gas confidentiality, and environmental adaptability;
  • a parameter representing unit configured to represent a component failure event by a node failure event, and to represent the node failure event by the observable parameters
  • a fault tree establishing unit configured to establish a component failure locating fault tree, the fault tree having the failure mode as top event, the observable node as intermediate event, and the failure mechanism as bottom event.
  • the fault dictionary establishing module further includes:
  • a failure mode set determining unit configured to determine, according to the failure positioning fault tree, a component failure mode set, the set including multiple subsets of failure mode
  • an observable node determining module configured to determine, according to the failure positioning fault tree, observable node of the subset of failure mode in a failure mode
  • a feature value obtaining unit configured to obtain, according to the failure positioning fault tree, observed parameters from the observable node, and to obtain feature value of the observable node in the failure mode according to the observed parameters;
  • a feature vector obtaining unit configured to determine, according to the feature value of the observable node, feature vector of the component in all failure modes
  • a failure mechanism determining unit configured to determine, according to the failure positioning fault tree, the failure mechanism cause of the component
  • a fault dictionary establishing unit configured to establish, according to the failure mechanism cause and the feature value of the observable node, a component fault dictionary with failure mechanism cause corresponding to failure characteristics.
  • the fault problem close loop analyzing module further includes:
  • an observing unit configured to observe the component according to the node parameters of the component fault dictionary, and to obtain feature value of an observed vector
  • a comparing unit configured to compare the feature value of the observed vector and the component fault dictionary, and to determine the failure mechanism cause of the component
  • a look-up unit configured to look for, according to the failure mechanism cause, the mechanism factors and influencing factors corresponding to the failure mechanism in the failure physics fault tree, so as to propose measures against the failure mechanism.
  • the method and system for performing component fault problem close loop analysis of the present disclosure it is possible to locate the component fault in the internal physical structure by the failure locating fault tree, to give a clear failure path, to quickly identify the failure mechanism corresponding to the component failure mode by analysis of failure feature vector of the fault dictionary, and to determine the mechanism factors and influencing factors of relevant failure mechanism by the failure physics fault tree.
  • targeted failure control measures are proposed to achieve fast and accurate locating and diagnosis to the electronic component failure.
  • FIG. 1 is a flowchart showing a method for performing component fault problem close loop analysis according to an embodiment of the disclosure.
  • FIG. 2 is a detailed flowchart showing a method for performing component fault problem close loop analysis according to an embodiment of the disclosure.
  • FIG. 3 is a structural schematic diagram showing a system for performing component fault problem close loop analysis according to an embodiment of the disclosure.
  • FIG. 4 is a detailed structural schematic diagram showing a system for performing component fault problem close loop analysis according to an embodiment of the disclosure.
  • the basic principle of the method and system for performing component fault problem close loop analysis of the present disclosure lies in that, due to the similarity in structure and process of each type of component, the component failure physics fault tree can be established in accordance with the common characteristics of failure physics of such type of component, and the physical events of the failure physics fault tree can be described by conversion of observable events.
  • the observable events can be represented by physical parameters such as electrical properties, thermal properties, mechanical properties, the apparent characteristic, and gas confidentiality, etc. Consequently, fault dictionary with single failure mechanism cause corresponding to failure characteristics is established. If the collected failure feature vector is the same as a row vector of the fault dictionary, then the mechanism cause of the failure mode is determined. Further, improvements are proposed directed to the mechanism factor and influencing factor, so as to perform fault problem close loop analysis with “accurate locating, clear mechanism, and effective measures”.
  • a method for constructing component fault tree based on failure physics includes the following steps.
  • Step S 100 establishing, according to common characteristics of component failure physics, a component failure physics fault tree.
  • the component failure physics fault tree can be established in accordance with the common characteristics of failure physics of such component.
  • the common characteristics of component include fault object, failure mode, failure site, failure mechanism, mechanism factor, and influencing factor. Such six common characteristics can completely and comprehensively cover the fault feature and failure cause of the components. After finishing arranging the six common characteristics, a component failure physics fault tree can be established respectively in six layers of fault object, failure mode, failure site, failure mechanism, mechanism factor, and influencing factor.
  • the relevance of events between the upper and lower grades of fault object, failure mode, failure site, and failure mechanism is an “OR” gate.
  • the structural function of the “OR” gate of the events between the upper and lower grades is
  • ⁇ ⁇ ( X ⁇ ) ⁇ 1 n ⁇ x i ,
  • ⁇ is the status of the event of upper grade
  • x is the status of the event of lower grade
  • ⁇ ⁇ ( X ⁇ ) 1 - ⁇ 1 n ⁇ ⁇ ( 1 - x i ) ,
  • ⁇ ⁇ ( X ⁇ ) ⁇ n 1 ⁇ x i ,
  • ⁇ ⁇ ( X ⁇ ) ⁇ 1 n ⁇ x i ,
  • Step S 200 converting a failure physics event into an observable node event according to the failure physics fault tree, and converting the failure physics fault tree into a failure locating fault tree.
  • Step S 200 further includes:
  • Step S 220 determining an observable node between a failure mode and a failure mechanism, and representing an immeasurable event of failure physics by an observable node event;
  • Step S 240 selecting, according to the structure and performance characteristics of the component, feature parameters representing each node, the feature parameters being observable parameters, the observable parameters including: electrical properties, thermal properties, mechanical properties, the apparent characteristic, gas confidentiality, and environmental adaptability;
  • Step S 260 representing a component failure event by a node failure event, and representing the node failure event by the observable parameters;
  • Step S 280 establishing a component failure locating fault tree, the fault tree having the failure mode as top event, the observable node as intermediate event, and the failure mechanism as bottom event.
  • Step S 300 establishing, according to the failure locating fault tree, a component fault dictionary with failure mechanism cause corresponding to failure characteristics.
  • Step S 300 further includes:
  • Step S 310 determining, according to the failure positioning fault tree, a component failure mode set, the set including multiple subsets of failure mode;
  • Step S 320 determining, according to the failure positioning fault tree, observable node of the subset of failure mode in a failure mode
  • Step S 330 obtaining, according to the failure positioning fault tree, observed parameters from the observable node, and obtaining feature value of the observable node in the failure mode according to the observed parameters;
  • Step S 340 determining, according to the feature value of the observable node, feature vector of the component in all failure modes;
  • Step S 350 determining, according to the failure positioning fault tree, failure mechanism cause of the component.
  • Step S 360 establishing, according to the failure mechanism cause and the feature value of the observable node, a component fault dictionary with failure mechanism cause corresponding to failure characteristics.
  • Step S 400 performing fault problem close loop analysis to the component according to the failure physics fault tree and the component fault dictionary.
  • Step S 400 further includes:
  • Step S 420 observing the component according to the node parameters of the component fault dictionary, and obtaining feature value of an observed vector
  • Step S 440 comparing the feature value of the observed vector and the component fault dictionary, and determining the failure mechanism cause of the component.
  • Step S 460 looking for, according to the failure mechanism cause, the mechanism factors and influencing factors corresponding to the failure mechanism in the failure physics fault tree, so as to propose measures against the failure mechanism.
  • the method for performing component fault problem close loop analysis of the present disclosure it is possible to locate the component fault in the internal physical structure by the failure locating fault tree, to give a clear failure path, to quickly identify the failure mechanism corresponding to the component failure mode by analysis of failure feature vector of the fault dictionary, and to determine the mechanism factors and influencing factors of relevant failure mechanism by the failure physics fault tree.
  • targeted failure control measures are proposed to achieve fast and accurate locating and diagnosis to the electronic component failure.
  • Step 1 establishing a failure physics fault tree of hybrid integrated circuit.
  • failure physics fault tree of hybrid integrated circuit in six layers of fault object, failure mode, failure site, failure mechanism, mechanism factor, and influencing factor.
  • logical relation between events of the first, second, third and fourth layers are “OR” gate
  • logical relation between events of the fourth, fifth and sixth layers are “AND” gate.
  • the failure physics fault tree has sixth layers of failure physics and events of eight grades in total.
  • Step 2 converting the failure physics fault tree into a failure locating fault tree.
  • Step 1 Convert the failure physics fault tree established in Step 1 into a failure locating fault tree having failure mechanism as the bottom event.
  • the node failure events are represented by feature parameters including junction temperature Tj, bonding strength, the interface IMC, moisture content, etc.
  • the converted failure locating fault tree of “electrical parameter drift” of hybrid integrated circuit is a failure locating fault tree containing 15 failure mechanism causes and 8 grades of events.
  • Step 3 establishing a component fault dictionary of electrical parameter drift of hybrid integrated circuit.
  • the node feature parameters representing that internal component failure causes HIC parameters drift includes: component parameter drift, component microcrack, ESD damage, and surface contamination and leakage, etc.
  • the node feature parameters representing that assembly failure causes HIC parameter drift includes: component welding/soldering thermal resistance, bonding interface IMC and bonding point corrosion, etc.
  • the node feature parameters representing that insulation degradation causes HIC parameter drift includes: insulation resistance between pin/housing, and insulation resistance between joints, etc.
  • the range of sp refers to the qualified criteria of relevant standards of hybrid integrated circuit and the components, namely the observed range of each node.
  • a fault code dictionary of the electrical parameter drift mode of hybrid integrated circuit is established based on the corresponding relationships between each observed node failure feature and failure mechanism cause. See Table 1: Failure code fault dictionary of HIC “electrical parameter drift”.
  • Step 4 performing fault problem close loop analysis to the electrical parameter drift according to the fault tree and fault dictionary.
  • Step 3 Perform fault problem close loop analysis to the electrical parameter drift of hybrid integrated circuit according to the fault dictionary established in Step 3 and the failure physics fault tree established in Step 1.
  • a fault problem close loop analysis is conducted by applying the above fault tree of electrical parameter drift of hybrid integrated circuit and the fault dictionary.
  • the fault tree and fault dictionary method is used to conduct fault problem close loop analysis to the circuit to find the failure mechanism cause and determine the failure path, so as to propose control measures.
  • the failure mechanism M 1,1 is determined as: electrical parameter drift caused by component degradation or overload usage is the cause of out-of-tolerance output voltage. Based on the failure physics fault tree, and considering the high test temperature heat and the allowable junction temperature limit T Mj of the chip, it is determined that the out-of-tolerance output voltage is caused by the electrical parameter drift of the chip due to overrun use of chip junction temperature. Therefore, the failure control measures are to select a chip with higher level of junction temperature limit T Mj , and to design and use it in a thermal derating way.
  • a system for performing component failure fault problem close loop analysis includes:
  • a failure physics fault tree establishing module 100 configured to establish, according to common characteristics of component failure physics, a component failure physics fault tree;
  • a failure locating fault tree establishing module 200 configured to convert a failure physics event into an observable node event according to the failure physics fault tree, and to convert the failure physics fault tree into a failure locating fault tree;
  • a fault dictionary establishing module 300 configured to establish, according to the failure locating fault tree, a component fault dictionary with failure mechanism cause corresponding to failure characteristics;
  • a failure fault problem close loop analyzing module 400 configured to perform fault problem close loop analysis to the component according to the failure physics fault tree and the component fault dictionary.
  • the system for performing component fault problem close loop analysis of the present disclosure it is possible to locate the component fault in the internal physical structure by the failure locating fault tree, to give a clear failure path, to quickly identify the failure mechanism corresponding to the component failure mode by analysis of failure feature vector of the fault dictionary, and to determine the mechanism factors and influencing factors of relevant failure mechanism by the failure physics fault tree.
  • targeted failure control measures are proposed to achieve fast and accurate locating and diagnosis to the electronic component failure.
  • the common characteristics of component failure physics include: fault object, failure mode, failure site, failure mechanism, mechanism factor, and influencing factor.
  • a component failure physics fault tree can be established respectively in six layers of fault object, failure mode, failure site, failure mechanism, mechanism factor, and influencing factor.
  • the failure locating fault tree establishing module 200 further includes:
  • an event conversion unit 220 configured to determine an observable node between a failure mode and a failure mechanism, and to represent an immeasurable event of failure physics by an observable node event;
  • a feature parameters selecting unit 240 configured to select, according to the structure and performance characteristics of the component, feature parameters representing each node, the feature parameters being observable parameters, the observable parameters including: electrical properties, thermal properties, mechanical properties, the apparent characteristic, gas confidentiality, and environmental adaptability;
  • a parameter representing unit 260 configured to represent a component failure event by a node failure event, and to represent the node failure event by the observable parameters
  • a fault tree establishing unit 280 configured to establish a component failure locating fault tree, the fault tree having the failure mode as top event, the observable node as intermediate event, and the failure mechanism as bottom event.
  • the fault dictionary establishing module 300 further includes:
  • a failure mode set determining unit 310 configured to determine, according to the failure positioning fault tree, a component failure mode set, the set including multiple subsets of failure mode;
  • an observable node determining module 320 configured to determine, according to the failure positioning fault tree, observable node of the subset of failure mode in a failure mode;
  • a feature value obtaining unit 330 configured to obtain, according to the failure positioning fault tree, observed parameters from the observable node, and to obtain feature value of the observable node in the failure mode according to the observed parameters;
  • a feature vector obtaining unit 340 configured to determine, according to the feature value of the observable node, feature vector of the component in all failure modes;
  • a failure mechanism determining unit 350 configured to determine, according to the failure positioning fault tree, the failure mechanism cause of the component
  • a fault dictionary establishing unit 360 configured to establish, according to the failure mechanism cause and the feature value of the observable node, a component fault dictionary with failure mechanism cause corresponding to failure characteristics.
  • the fault problem close loop analyzing module 400 further includes:
  • an observing unit 420 configured to observe the component according to the node parameters of the component fault dictionary, and to obtain feature value of an observed vector
  • a comparing unit 440 configured to compare the feature value of the observed vector and the component fault dictionary, and to determine the failure mechanism cause of the component
  • a look-up unit 460 configured to look for, according to the failure mechanism cause, the mechanism factors and influencing factors corresponding to the failure mechanism in the failure physics fault tree, so as to propose measures against the failure mechanism.
  • the method and system for performing component fault problem close loop analysis of the present disclosure it is possible to locate the component fault in the internal physical structure by the failure locating fault tree, to give a clear failure path, to quickly identify the failure mechanism corresponding to the component failure mode by analysis of failure feature vector of the fault dictionary, and to determine the mechanism factors and influencing factors of relevant failure mechanism by the failure physics fault tree.
  • targeted failure control measures can be proposed to achieve fast and accurate locating and diagnosis to the electronic component failure, meeting the requirements of “accurate locating, clear mechanism, and effective measures”.

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US20150067400A1 (en) * 2013-09-03 2015-03-05 International Business Machines Corporation Generating a fault tree
CN108226775A (zh) * 2016-12-13 2018-06-29 北京金风科创风电设备有限公司 风力发电机的故障自检测方法及装置
US10191480B2 (en) 2012-11-30 2019-01-29 Fifth Electronics Research Institute Of Ministry Of Industry And Information Technology Method and system of close-loop analysis to electronic component fault problem
US10241852B2 (en) * 2015-03-10 2019-03-26 Siemens Aktiengesellschaft Automated qualification of a safety critical system
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