US20150168271A1

US20150168271A1 - Method and system for performing components fault problem close loop analysis

Info

Publication number: US20150168271A1
Application number: US14/351,865
Authority: US
Inventors: Xiaoqi He; Ping Lai; Yunfei En; Yuan Chen; Yunhui Wang
Original assignee: Fifth Electronics Research Institute of Ministry of Industry and Information Technology
Current assignee: Fifth Electronics Research Institute of Ministry of Industry and Information Technology
Priority date: 2012-11-30
Filing date: 2013-10-29
Publication date: 2015-06-18
Also published as: US20180136640A1; CN103020436B; WO2014082516A1; CN103020436A; US10191480B2

Abstract

A method and system for performing component fault problem close loop analysis are provided. The system establishes a component failure physics fault tree, converts the failure physics fault tree into a failure locating fault tree, establishes, a component fault dictionary with failure mechanism cause corresponding to failure characteristics and performs fault problem close loop analysis to the component according to the fault tree and the fault dictionary. By the method and system of the present disclosure, it is possible to locate the component fault in the internal physical structure by the failure locating fault tree, to give a clear failure path, to quickly identify the failure mechanism corresponding to the component failure mode by analysis of failure feature vector of the fault dictionary, and to determine the mechanism factors and influencing factors of relevant failure mechanism by the failure physics fault tree. Thus, targeted failure control measures are proposed to achieve fast and accurate locating and diagnosis to the electronic component failure.

Description

FIELD OF THE INVENTION

The present disclosure relates generally to the field of fault diagnosis, and more particularly to a method and system for performing component fault problem close loop analysis.

BACKGROUND OF THE INVENTION

The aim of component fault problem close loop analysis is to locate failure and determine the failure mechanism by FTA and failure analysis, to propose improvements according to the cause of failure, and thus to achieve the fault problem close loop, that is, meeting the requirements of “accurate locating, clear mechanism, and effective measures” to the fault. To achieve component fault problem close loop, a variety of techniques are used. However, most of the existing techniques of component failure analysis are those of failure phenomenon observation, which lack of analysis technology to the failure information, and the resulted fault problem close loop conclusion are related to one's analysis experience. Thus, the key to fault problem close loop analysis lies in the following aspects: performing fault problem close loop analysis by systematically applying the failure observations and failure information, accurately giving the failure site and failure path inside a component, clearly giving the mechanism cause leading to the failure, and proposing effective measures for improving the mechanism reasons.
Fault tree analysis is a logical reasoning method for analysis of system reliability and security. By analyzing and determining the logical relations from a variety of possible factors that may lead to failure, the causes of system failure can be identified using this method, which has been widely used in the field of aerospace and electronics systems, etc. In order to meet the quality problem close loop requirements, starting from the beginning of this century, fault tree analysis is gradually applied to electronic components to conduct fault problem close loop analysis by learning the electronic fault tree analysis. The current problem to be solved is how to establish the component fault tree. In this regard, the fault dictionary method is an effective way to achieve fast fault location in complex electronic machines. The fault dictionary created should be able to reflect the relationship between the cause of the fault of the measured object and the measurable external parameters and characteristics. The event information of fault tree is usually used to establish this type of relationship.
Fault diagnosis and fault problem close loop analysis using fault tree and fault dictionary method have the above advantages. Thus, for a general electronic machine, the fault tree and fault dictionary method are usually used to perform fault diagnosis and locating. But for electronic components, the general fault diagnosis and fault problem close loop analysis using fault tree and fault dictionary method cannot accurately perform fault locating and diagnosis due to the diversity of the failure modes and the complexity of the failure mechanism of electronic components.

SUMMARY OF THE INVENTION

To address the aforementioned deficiencies and inadequacies, there is a need to provide a method and system for performing component fault problem close loop analysis, which can perform fast and accurate locating and diagnosis to electronic component failure.
According to an aspect of the present invention, a method for performing component fault problem close loop analysis includes the steps of:
establishing, according to common characteristics of component failure physics, a component failure physics fault tree;
converting a failure physics event into an observable node event according to the failure physics fault tree, and converting the failure physics fault tree into a failure locating fault tree;
establishing, according to the failure locating fault tree, a component fault dictionary with failure mechanism cause corresponding to failure characteristics;
performing fault problem close loop analysis to the component according to the failure physics fault tree and the component fault dictionary.
In one embodiment, the common characteristics of component failure physics include: fault object, failure mode, failure site, failure mechanism, mechanism factor, and influencing factor.
In one embodiment, the step of converting the failure physics fault tree into a failure locating fault tree further includes:
determining an observable node between a failure mode and a failure mechanism, and representing an immeasurable event of failure physics by an observable node event;
selecting, according to the structure and performance characteristics of the component, feature parameters representing each node, the feature parameters being observable parameters, the observable parameters including: electrical properties, thermal properties, mechanical properties, the apparent characteristic, gas confidentiality, and environmental adaptability;
representing a component failure event by a node failure event, and representing the node failure event by the observable parameters; and
establishing a component failure locating fault tree, the fault tree having the failure mode as top event, the observable node as intermediate event, and the failure mechanism as bottom event.
In one embodiment, the step of establishing, according to the failure locating fault tree, a component fault dictionary with failure mechanism cause corresponding to failure characteristics further includes:
determining, according to the failure positioning fault tree, a component failure mode set, the set including multiple subsets of failure mode;
determining, according to the failure positioning fault tree, observable node of the subset of failure mode in a failure mode;
obtaining, according to the failure positioning fault tree, observed parameters from the observable node, and obtaining feature value of the observable node in the failure mode according to the observed parameters;
determining, according to the feature value of the observable node, feature vector of the component in all failure modes;
determining, according to the failure positioning fault tree, failure mechanism cause of the component; and establishing, according to the failure mechanism cause and the feature value of the observable node, a component fault dictionary with failure mechanism cause corresponding to failure characteristics.
In one embodiment, the step of performing fault problem close loop analysis to the component according to the failure physics fault tree and the component fault dictionary further includes:
observing the component according to the node parameters of the component fault dictionary, and obtaining feature value of an observed vector;
comparing the feature value of the observed vector and the component fault dictionary, and determining the failure mechanism cause of the component;
looking for, according to the failure mechanism cause, the mechanism factors and influencing factors corresponding to the failure mechanism in the failure physics fault tree, so as to propose measures against the failure mechanism.
According to another aspect of the present invention, a system for performing component fault problem close loop analysis includes:
a failure physics fault tree establishing module, configured to establish, according to common characteristics of component failure physics, a component failure physics fault tree;
a failure locating fault tree establishing module, configured to convert a failure physics event into an observable node event according to the failure physics fault tree, and to convert the failure physics fault tree into a failure locating fault tree;
a fault dictionary establishing module, configured to establish, according to the failure locating fault tree, a component fault dictionary with failure mechanism cause corresponding to failure characteristics;
a fault problem close loop analyzing module, configured to perform fault problem close loop analysis to the component according to the failure physics fault tree and the component fault dictionary.
In one embodiment, the common characteristics of component failure physics include: fault object, failure mode, failure site, failure mechanism, mechanism factor, and influencing factor.
In one embodiment, the failure locating fault tree establishing module further includes:
an event conversion unit, configured to determine an observable node between a failure mode and a failure mechanism, and to represent an immeasurable event of failure physics by an observable node event;
a feature parameters selecting unit, configured to select, according to the structure and performance characteristics of the component, feature parameters representing each node, the feature parameters being observable parameters, the observable parameters including: electrical properties, thermal properties, mechanical properties, the apparent characteristic, gas confidentiality, and environmental adaptability;
a parameter representing unit, configured to represent a component failure event by a node failure event, and to represent the node failure event by the observable parameters; and
a fault tree establishing unit, configured to establish a component failure locating fault tree, the fault tree having the failure mode as top event, the observable node as intermediate event, and the failure mechanism as bottom event.
In one embodiment, the fault dictionary establishing module further includes:
a failure mode set determining unit, configured to determine, according to the failure positioning fault tree, a component failure mode set, the set including multiple subsets of failure mode;
an observable node determining module, configured to determine, according to the failure positioning fault tree, observable node of the subset of failure mode in a failure mode;
a feature value obtaining unit, configured to obtain, according to the failure positioning fault tree, observed parameters from the observable node, and to obtain feature value of the observable node in the failure mode according to the observed parameters;
a feature vector obtaining unit, configured to determine, according to the feature value of the observable node, feature vector of the component in all failure modes;
a failure mechanism determining unit, configured to determine, according to the failure positioning fault tree, the failure mechanism cause of the component;
a fault dictionary establishing unit, configured to establish, according to the failure mechanism cause and the feature value of the observable node, a component fault dictionary with failure mechanism cause corresponding to failure characteristics.
In one embodiment, the fault problem close loop analyzing module further includes:
an observing unit, configured to observe the component according to the node parameters of the component fault dictionary, and to obtain feature value of an observed vector;
a comparing unit, configured to compare the feature value of the observed vector and the component fault dictionary, and to determine the failure mechanism cause of the component;
a look-up unit, configured to look for, according to the failure mechanism cause, the mechanism factors and influencing factors corresponding to the failure mechanism in the failure physics fault tree, so as to propose measures against the failure mechanism.
By the method and system for performing component fault problem close loop analysis of the present disclosure, it is possible to locate the component fault in the internal physical structure by the failure locating fault tree, to give a clear failure path, to quickly identify the failure mechanism corresponding to the component failure mode by analysis of failure feature vector of the fault dictionary, and to determine the mechanism factors and influencing factors of relevant failure mechanism by the failure physics fault tree. Thus, targeted failure control measures are proposed to achieve fast and accurate locating and diagnosis to the electronic component failure.

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1 is a flowchart showing a method for performing component fault problem close loop analysis according to an embodiment of the disclosure.

FIG. 2 is a detailed flowchart showing a method for performing component fault problem close loop analysis according to an embodiment of the disclosure.

FIG. 3 is a structural schematic diagram showing a system for performing component fault problem close loop analysis according to an embodiment of the disclosure.

FIG. 4 is a detailed structural schematic diagram showing a system for performing component fault problem close loop analysis according to an embodiment of the disclosure.

DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS

In the following description of embodiments, reference is made to the accompanying drawings which form a part hereof, and in which it is shown by way of illustration specific embodiments of the disclosure that can be practiced. It is to be understood that other embodiments can be used and structural changes can be made without departing from the scope of the disclosed embodiments.
The basic principle of the method and system for performing component fault problem close loop analysis of the present disclosure lies in that, due to the similarity in structure and process of each type of component, the component failure physics fault tree can be established in accordance with the common characteristics of failure physics of such type of component, and the physical events of the failure physics fault tree can be described by conversion of observable events. The observable events can be represented by physical parameters such as electrical properties, thermal properties, mechanical properties, the apparent characteristic, and gas confidentiality, etc. Consequently, fault dictionary with single failure mechanism cause corresponding to failure characteristics is established. If the collected failure feature vector is the same as a row vector of the fault dictionary, then the mechanism cause of the failure mode is determined. Further, improvements are proposed directed to the mechanism factor and influencing factor, so as to perform fault problem close loop analysis with “accurate locating, clear mechanism, and effective measures”.
As shown in FIGS. 1 and 2, a method for constructing component fault tree based on failure physics includes the following steps.
Step S100: establishing, according to common characteristics of component failure physics, a component failure physics fault tree.
Due to the similarity in structure and process of each type of component, the component failure physics fault tree can be established in accordance with the common characteristics of failure physics of such component.
In one embodiment, the common characteristics of component include fault object, failure mode, failure site, failure mechanism, mechanism factor, and influencing factor. Such six common characteristics can completely and comprehensively cover the fault feature and failure cause of the components. After finishing arranging the six common characteristics, a component failure physics fault tree can be established respectively in six layers of fault object, failure mode, failure site, failure mechanism, mechanism factor, and influencing factor.
In this failure physics fault tree, according to the relevance of the component failure physics, the relevance of events between the upper and lower grades of fault object, failure mode, failure site, and failure mechanism is an “OR” gate. The structural function of the “OR” gate of the events between the upper and lower grades is
$Φ (\vec{X}) = \overset{n}{⋃_{1}} x_{i},$
wherein Φ is the status of the event of upper grade, and x is the status of the event of lower grade; if the event xi of lower grade happens, then the value will be 1, otherwise it will be 0. The structural function describing the occurrence status Φ of the upper event can be
$Φ (\vec{X}) = 1 - \prod_{1}^{n} (1 - x_{i}),$
and if the event happens, then the value will be 1, otherwise it will be 0. This structural function means that the event of the upper grade will happen if only an event of lower grade happens. Meanwhile, the relevance of events between the upper and lower grades of failure mechanism, mechanism factor and influencing factor is an “OR” gate or “AND” gate, wherein the structural function of the “AND” gate is
$Φ (\vec{X}) = \underset{1}{⋂^{n}} x_{i},$
and if the event xi of lower grade happens, then the value will be 1, otherwise it will be 0. The structural function describing the occurrence status Φ of the upper event is
$Φ (\vec{X}) = \prod_{1}^{n} x_{i},$
and if the event happens, then the value will be 1, otherwise it will be 0. This structural function means that the event of the upper grade will happen only if all events of lower grade happen. Physical events of each layer from the second to the sixth layer of the fault tree can be decomposed into events of 1 to 3 grades, forming component fault tree of n grades and of six physical layers, and it is easy to understand that the minimum of n is 6.
Step S200: converting a failure physics event into an observable node event according to the failure physics fault tree, and converting the failure physics fault tree into a failure locating fault tree.
In one embodiment, Step S200 further includes:
Step S220: determining an observable node between a failure mode and a failure mechanism, and representing an immeasurable event of failure physics by an observable node event;
Step S240: selecting, according to the structure and performance characteristics of the component, feature parameters representing each node, the feature parameters being observable parameters, the observable parameters including: electrical properties, thermal properties, mechanical properties, the apparent characteristic, gas confidentiality, and environmental adaptability;
Step S260: representing a component failure event by a node failure event, and representing the node failure event by the observable parameters; and
Step S280: establishing a component failure locating fault tree, the fault tree having the failure mode as top event, the observable node as intermediate event, and the failure mechanism as bottom event.
Step S300: establishing, according to the failure locating fault tree, a component fault dictionary with failure mechanism cause corresponding to failure characteristics.
In one embodiment, Step S300 further includes:
Step S310: determining, according to the failure positioning fault tree, a component failure mode set, the set including multiple subsets of failure mode;
Step S320: determining, according to the failure positioning fault tree, observable node of the subset of failure mode in a failure mode;
Step S330: obtaining, according to the failure positioning fault tree, observed parameters from the observable node, and obtaining feature value of the observable node in the failure mode according to the observed parameters;
Step S340: determining, according to the feature value of the observable node, feature vector of the component in all failure modes;
Step S350: determining, according to the failure positioning fault tree, failure mechanism cause of the component; and
Step S360: establishing, according to the failure mechanism cause and the feature value of the observable node, a component fault dictionary with failure mechanism cause corresponding to failure characteristics.
Step S400: performing fault problem close loop analysis to the component according to the failure physics fault tree and the component fault dictionary.
In one embodiment, Step S400 further includes:
Step S420: observing the component according to the node parameters of the component fault dictionary, and obtaining feature value of an observed vector;
Step S440: comparing the feature value of the observed vector and the component fault dictionary, and determining the failure mechanism cause of the component; and
Step S460: looking for, according to the failure mechanism cause, the mechanism factors and influencing factors corresponding to the failure mechanism in the failure physics fault tree, so as to propose measures against the failure mechanism.
By the method for performing component fault problem close loop analysis of the present disclosure, it is possible to locate the component fault in the internal physical structure by the failure locating fault tree, to give a clear failure path, to quickly identify the failure mechanism corresponding to the component failure mode by analysis of failure feature vector of the fault dictionary, and to determine the mechanism factors and influencing factors of relevant failure mechanism by the failure physics fault tree. Thus, targeted failure control measures are proposed to achieve fast and accurate locating and diagnosis to the electronic component failure.
To better illustrate the method for performing component fault problem close loop analysis of the disclosure, an example of fault problem close loop analysis of “electrical parameter drift” of hybrid integrated circuit will be further described to illustrate the technical solution and the beneficial effect brought.
Step 1, establishing a failure physics fault tree of hybrid integrated circuit.
Establish a failure physics fault tree of a failure mode according to the characteristics of “electrical parameter drift” failure physics of hybrid integrated circuit.
Establish a failure physics fault tree of hybrid integrated circuit in six layers of fault object, failure mode, failure site, failure mechanism, mechanism factor, and influencing factor. In this fault object, logical relation between events of the first, second, third and fourth layers are “OR” gate, and logical relation between events of the fourth, fifth and sixth layers are “AND” gate. The failure physics fault tree has sixth layers of failure physics and events of eight grades in total.
Step 2, converting the failure physics fault tree into a failure locating fault tree.
Convert the failure physics fault tree established in Step 1 into a failure locating fault tree having failure mechanism as the bottom event.
Firstly, regarding the established failure physics fault tree of hybrid integrated circuit, between the failure object top events and the failure mechanism events, converting the failure physics events that cannot be measured directly including immeasurable degradation of component welding/soldering, and degradation of wire bonding point into one or more measurable and observable node events including: thermal resistance of the component is too high, wire bonding strength fails to reach the standard, clear IMC on the interface, etc., which are the intermediate events of the failure locating fault tree.
The node failure events are represented by feature parameters including junction temperature Tj, bonding strength, the interface IMC, moisture content, etc.
The converted failure locating fault tree of “electrical parameter drift” of hybrid integrated circuit is a failure locating fault tree containing 15 failure mechanism causes and 8 grades of events.
Step 3, establishing a component fault dictionary of electrical parameter drift of hybrid integrated circuit.
Establish a component fault dictionary with single failure mechanism cause corresponding to failure characteristics according to the failure locating fault tree established in Step 2.
Determine 23 observable nodes and their feature parameters in the electrical parameter drift failure mode F₁. The node feature parameters representing that internal component failure causes HIC parameters drift includes: component parameter drift, component microcrack, ESD damage, and surface contamination and leakage, etc. The node feature parameters representing that assembly failure causes HIC parameter drift includes: component welding/soldering thermal resistance, bonding interface IMC and bonding point corrosion, etc. The node feature parameters representing that insulation degradation causes HIC parameter drift includes: insulation resistance between pin/housing, and insulation resistance between joints, etc. The node failure feature parameter is X₁={X_1,1, X_1,2, . . . , X_1,23}.
Based on the node failure feature parameter of X₁={X_1,1, X_1,2, . . . , X_1,23}, the corresponding feature value F_1,jis obtained by the following equation according to the range of X₁, so as to obtain the feature vector, F_i,1={F_1,1, F_1,2, . . . , F_1,23}. The range of sp refers to the qualified criteria of relevant standards of hybrid integrated circuit and the components, namely the observed range of each node.
$F_{i, j} = {\begin{matrix} 1 & X_{i, j} \notin sp \\ 0 & X_{i, j} \in sp \end{matrix}$
There are 15 failure mechanism causes for electrical parameter drift of hybrid integrated circuit, and mechanism cause set is M_1,j={M_1,1, M_1,2, . . . , M_i,15}. According to the logical relationship between the node events of the failure locating fault tree of electrical parameter drift, corresponding relationships between each observed node failure feature and failure mechanism cause are given in the following list.
A fault code dictionary of the electrical parameter drift mode of hybrid integrated circuit is established based on the corresponding relationships between each observed node failure feature and failure mechanism cause. See Table 1: Failure code fault dictionary of HIC “electrical parameter drift”.


FIG. 1

mechanism

Failure Feature

cause	F_{1, 1}	F_{1, 2}	F_{1, 3}	F_{1, 4}	F_{1, 5}	F_{1, 6}	F_{1, 7}	F_{1, 8}	F_{1, 9}	F_{1, 10}	F_{1, 11}	F_{1, 12}

M_{1, 1}	1	1	1	0	0	0	0	0	0	0	0	0
M_{1, 2}	1	1	0	1	0	0	0	0	0	0	0	0
M_{1, 3}	1	1	0	0	1	0	0	0	0	0	0	0
M_{1, 4}	1	1	0	0	0	1	0	0	0	0	1	0
M_{1, 5}	1	1	0	0	0	1	0	0	0	0	0	1
M_{1, 6}	1	1	0	0	0	0	1	0	0	0	0	0
M_{1, 7}	1	1	0	0	0	0	1	0	0	0	0	0
M_{1, 8}	1	1	0	0	0	0	1	0	0	0	0	0
M_{1, 9}	1	1	0	0	0	0	1	0	0	0	0	0
M_{1, 10}	1	1	0	0	0	0	0	0	0	0	0	0
M_{1, 11}	1	1	0	0	0	0	0	0	0	0	0	0
M_{1, 12}	1	1	0	0	0	0	0	0	0	0	0	0
M_{1, 13}	1	1	0	0	0	0	0	1	0	0	0	0
M_{1, 14}	1	1	0	0	0	0	0	0	1	0	0	0
M_{1, 15}	1	1	0	0	0	0	0	0	0	1	0	0

mechanism

Failure Feature

cause	F_{1, 13}	F_{1, 14}	F_{1, 15}	F_{1, 16}	F_{1, 17}	F_{1, 18}	F_{1, 19}	F_{1, 20}	F_{1, 21}	F_{1, 22}	F_{1, 23}

M_{1, 1}	0	0	0	0	0	0	0	0	0	0	0
M_{1, 2}	0	0	0	0	0	0	0	0	0	0	0
M_{1, 3}	0	0	0	0	0	0	0	0	0	0	0
M_{1, 4}	0	0	0	0	0	0	0	0	0	0	0
M_{1, 5}	0	0	0	0	0	0	0	0	0	0	0
M_{1, 6}	1	0	0	0	0	0	0	0	0	0	0
M_{1, 7}	0	1	0	0	0	0	0	0	0	0	0
M_{1, 8}	0	0	1	0	0	0	0	0	0	1	0
M_{1, 9}	0	0	0	1	0	0	0	0	0	1	0
M_{1, 10}	0	0	0	0	1	0	0	0	0	0	1
M_{1, 11}	0	0	0	0	0	1	0	0	0	0	1
M_{1, 12}	0	0	0	0	0	1	0	0	0	0	1
M_{1, 13}	0	0	0	0	0	0	1	0	0	0	0
M_{1, 14}	0	0	0	0	0	0	0	1	0	0	0
M_{1, 15}	0	0	0	0	0	0	0	0	1	0	0

Step 4, performing fault problem close loop analysis to the electrical parameter drift according to the fault tree and fault dictionary.
Perform fault problem close loop analysis to the electrical parameter drift of hybrid integrated circuit according to the fault dictionary established in Step 3 and the failure physics fault tree established in Step 1.
According to the node parameters of the fault dictionary, the hybrid integrated circuit is observed, and the feature value of the measured observation vector F_i,1={F_1,1, F_1,2, . . . , F_1,23} is compared with the fault dictionary. If the feature value is the same to a row vector of the fault dictionary, then it can be determined that a failure of corresponding single mechanism (M_i,j) cause has happened to the component. After determining the failure mechanism cause, the mechanism factors and influencing factors of corresponding failure mechanism (M_i,j) is looked up in the failure physics fault tree, so as to propose control measures to the failure mechanism.
A fault problem close loop analysis is conducted by applying the above fault tree of electrical parameter drift of hybrid integrated circuit and the fault dictionary.
After a high temperature steady life test, the output voltage of a linear power hybrid integrated circuit is out of tolerance. Thus, the fault tree and fault dictionary method is used to conduct fault problem close loop analysis to the circuit to find the failure mechanism cause and determine the failure path, so as to propose control measures.
Upon analysis and observation of the circuit, the feature value of the measured observation vector F_i,1={F_1,1, F_1,2, . . . , F_1,23} is compared with the fault dictionary of electrical parameter drift failure of Table 1. Considering that the vector result of the feature parameter of a chip is the same to the vector of mechanism M_1,1of the first row, the failure mechanism M_1,1is determined as: electrical parameter drift caused by component degradation or overload usage is the cause of out-of-tolerance output voltage. Based on the failure physics fault tree, and considering the high test temperature heat and the allowable junction temperature limit T_Mjof the chip, it is determined that the out-of-tolerance output voltage is caused by the electrical parameter drift of the chip due to overrun use of chip junction temperature. Therefore, the failure control measures are to select a chip with higher level of junction temperature limit T_Mj, and to design and use it in a thermal derating way.
As shown in FIG. 3, a system for performing component failure fault problem close loop analysis includes:
a failure physics fault tree establishing module 100, configured to establish, according to common characteristics of component failure physics, a component failure physics fault tree;
a failure locating fault tree establishing module 200, configured to convert a failure physics event into an observable node event according to the failure physics fault tree, and to convert the failure physics fault tree into a failure locating fault tree;
a fault dictionary establishing module 300, configured to establish, according to the failure locating fault tree, a component fault dictionary with failure mechanism cause corresponding to failure characteristics; and
a failure fault problem close loop analyzing module 400, configured to perform fault problem close loop analysis to the component according to the failure physics fault tree and the component fault dictionary.
By the system for performing component fault problem close loop analysis of the present disclosure, it is possible to locate the component fault in the internal physical structure by the failure locating fault tree, to give a clear failure path, to quickly identify the failure mechanism corresponding to the component failure mode by analysis of failure feature vector of the fault dictionary, and to determine the mechanism factors and influencing factors of relevant failure mechanism by the failure physics fault tree. Thus, targeted failure control measures are proposed to achieve fast and accurate locating and diagnosis to the electronic component failure.
In one embodiment, the common characteristics of component failure physics include: fault object, failure mode, failure site, failure mechanism, mechanism factor, and influencing factor.
Thus, using the six common characteristics, it is possible to completely and comprehensively conduct fault diagnosis and locating of the component. After finishing arranging the six common characteristics, a component failure physics fault tree can be established respectively in six layers of fault object, failure mode, failure site, failure mechanism, mechanism factor, and influencing factor.
As shown in FIG. 4, the failure locating fault tree establishing module 200 further includes:
an event conversion unit 220, configured to determine an observable node between a failure mode and a failure mechanism, and to represent an immeasurable event of failure physics by an observable node event;
a feature parameters selecting unit 240, configured to select, according to the structure and performance characteristics of the component, feature parameters representing each node, the feature parameters being observable parameters, the observable parameters including: electrical properties, thermal properties, mechanical properties, the apparent characteristic, gas confidentiality, and environmental adaptability;
a parameter representing unit 260, configured to represent a component failure event by a node failure event, and to represent the node failure event by the observable parameters; and a fault tree establishing unit 280, configured to establish a component failure locating fault tree, the fault tree having the failure mode as top event, the observable node as intermediate event, and the failure mechanism as bottom event.
As shown in FIG. 4, the fault dictionary establishing module 300 further includes:
a failure mode set determining unit 310, configured to determine, according to the failure positioning fault tree, a component failure mode set, the set including multiple subsets of failure mode;
an observable node determining module 320, configured to determine, according to the failure positioning fault tree, observable node of the subset of failure mode in a failure mode;
a feature value obtaining unit 330, configured to obtain, according to the failure positioning fault tree, observed parameters from the observable node, and to obtain feature value of the observable node in the failure mode according to the observed parameters;
a feature vector obtaining unit 340, configured to determine, according to the feature value of the observable node, feature vector of the component in all failure modes;
a failure mechanism determining unit 350, configured to determine, according to the failure positioning fault tree, the failure mechanism cause of the component; and
a fault dictionary establishing unit 360, configured to establish, according to the failure mechanism cause and the feature value of the observable node, a component fault dictionary with failure mechanism cause corresponding to failure characteristics.
As shown in FIG. 4, the fault problem close loop analyzing module 400 further includes:
an observing unit 420, configured to observe the component according to the node parameters of the component fault dictionary, and to obtain feature value of an observed vector;
a comparing unit 440, configured to compare the feature value of the observed vector and the component fault dictionary, and to determine the failure mechanism cause of the component; and
a look-up unit 460, configured to look for, according to the failure mechanism cause, the mechanism factors and influencing factors corresponding to the failure mechanism in the failure physics fault tree, so as to propose measures against the failure mechanism.
Based on the above, by the method and system for performing component fault problem close loop analysis of the present disclosure, it is possible to locate the component fault in the internal physical structure by the failure locating fault tree, to give a clear failure path, to quickly identify the failure mechanism corresponding to the component failure mode by analysis of failure feature vector of the fault dictionary, and to determine the mechanism factors and influencing factors of relevant failure mechanism by the failure physics fault tree. Thus, targeted failure control measures can be proposed to achieve fast and accurate locating and diagnosis to the electronic component failure, meeting the requirements of “accurate locating, clear mechanism, and effective measures”.
The embodiments are chosen and described in order to explain the principles of the disclosure and their practical application so as to allow others skilled in the art to utilize the disclosure and various embodiments and with various modifications as are suited to the particular use contemplated. Alternative embodiments will become apparent to those skilled in the art to which the present disclosure pertains without departing from its spirit and scope. Accordingly, the scope of the present disclosure is defined by the appended claims rather than the foregoing description and the exemplary embodiments described therein.

Claims

1. A method for performing component fault problem close loop analysis, comprising:

establishing, according to common characteristics of component failure physics, a component failure physics fault tree;

converting a failure physics event into an observable node event according to the failure physics fault tree, and converting the failure physics fault tree into a failure locating fault tree;

establishing, according to the failure locating fault tree, a component fault dictionary with failure mechanism cause corresponding to failure characteristics; and

performing fault problem close loop analysis to the component according to the failure physics fault tree and the component fault dictionary.

2. The method of claim 1, wherein the common characteristics of component failure physics comprise: fault object, failure mode, failure site, failure mechanism, mechanism factor, and influencing factor.

3. The method of claim 1, wherein the step of converting the failure physics fault tree into a failure locating fault tree further comprises:

determining an observable node between a failure mode and a failure mechanism, and representing an immeasurable event of failure physics by an observable node event;

selecting, according to the structure and performance characteristics of the component, feature parameters representing each node, the feature parameters being observable parameters, the observable parameters including: electrical properties, thermal properties, mechanical properties, the apparent characteristic, gas confidentiality, and environmental adaptability;

representing a component failure event by a node failure event, and representing the node failure event by the observable parameters; and

establishing a component failure locating fault tree, the fault tree having the failure mode as top event, the observable node as intermediate event, and the failure mechanism as bottom event.

4. The method of claim 1, wherein the step of establishing, according to the failure locating fault tree, a component fault dictionary with failure mechanism cause corresponding to failure characteristics further comprises:

determining, according to the failure positioning fault tree, a component failure mode set, the set including multiple subsets of failure mode;

determining, according to the failure positioning fault tree, observable node of the subset of failure mode in a failure mode;

obtaining, according to the failure positioning fault tree, observed parameters from the observable node, and obtaining feature value of the observable node in the failure mode according to the observed parameters;

determining, according to the feature value of the observable node, feature vector of the component in all failure modes;

determining, according to the failure positioning fault tree, failure mechanism cause of the component; and

establishing, according to the failure mechanism cause and the feature value of the observable node, a component fault dictionary with failure mechanism cause corresponding to failure characteristics.

5. The method of claim 1, wherein the step of performing fault problem close loop analysis to the component according to the failure physics fault tree and the component fault dictionary further comprises:

observing the component according to the node parameters of the component fault dictionary, and obtaining feature value of an observed vector;

comparing the feature value of the observed vector and the component fault dictionary, and determining the failure mechanism cause of the component;

looking for, according to the failure mechanism cause, the mechanism factors and influencing factors corresponding to the failure mechanism in the failure physics fault tree, so as to propose measures against the failure mechanism.

6. A system for performing component fault problem close loop analysis, comprising:

a failure physics fault tree establishing module, configured to establish, according to common characteristics of component failure physics, a component failure physics fault tree;

a failure locating fault tree establishing module, configured to convert a failure physics event into an observable node event according to the failure physics fault tree, and to convert the failure physics fault tree into a failure locating fault tree;

a fault dictionary establishing module, configured to establish, according to the failure locating fault tree, a component fault dictionary with failure mechanism cause corresponding to failure characteristics; and

a fault problem close loop analyzing module, configured to perform fault problem close loop analysis to the component according to the failure physics fault tree and the component fault dictionary.

7. The system of claim 6, wherein the common characteristics of component failure physics comprise: fault object, failure mode, failure site, failure mechanism, mechanism factor, and influencing factor.

8. The system of claim 6, wherein the failure locating fault tree establishing module further comprises:

an event conversion unit, configured to determine an observable node between a failure mode and a failure mechanism, and to represent an immeasurable event of failure physics by an observable node event;

a feature parameters selecting unit, configured to select, according to the structure and performance characteristics of the component, feature parameters representing each node, the feature parameters being observable parameters, the observable parameters including: electrical properties, thermal properties, mechanical properties, the apparent characteristic, gas confidentiality, and environmental adaptability;

a parameter representing unit, configured to represent a component failure event by a node failure event, and to represent the node failure event by the observable parameters; and

a fault tree establishing unit, configured to establish a component failure locating fault tree, the fault tree having the failure mode as top event, the observable node as intermediate event, and the failure mechanism as bottom event.

9. The system of claim 6, wherein the fault dictionary establishing module further comprises:

a failure mode set determining unit, configured to determine, according to the failure positioning fault tree, a component failure mode set, the set including multiple subsets of failure mode;

an observable node determining module, configured to determine, according to the failure positioning fault tree, observable node of the subset of failure mode in a failure mode;

a feature value obtaining unit, configured to obtain, according to the failure positioning fault tree, observed parameters from the observable node, and to obtain feature value of the observable node in the failure mode according to the observed parameters;

a feature vector obtaining unit, configured to determine, according to the feature value of the observable node, feature vector of the component in all failure modes;

a failure mechanism determining unit, configured to determine, according to the failure positioning fault tree, the failure mechanism cause of the component; and

a fault dictionary establishing unit, configured to establish, according to the failure mechanism cause and the feature value of the observable node, a component fault dictionary with failure mechanism cause corresponding to failure characteristics.

10. The system of claim 6, wherein the fault problem close loop analyzing module further comprises:

an observing unit, configured to observe the component according to the node parameters of the component fault dictionary, and to obtain feature value of an observed vector;

a comparing unit, configured to compare the feature value of the observed vector and the component fault dictionary, and to determine the failure mechanism cause of the component;

a look-up unit, configured to look for, according to the failure mechanism cause, the mechanism factors and influencing factors corresponding to the failure mechanism in the failure physics fault tree, so as to propose measures against the failure mechanism.