US20100289901A1 - Thermographic camera - Google Patents
Thermographic camera Download PDFInfo
- Publication number
- US20100289901A1 US20100289901A1 US12/863,466 US86346608A US2010289901A1 US 20100289901 A1 US20100289901 A1 US 20100289901A1 US 86346608 A US86346608 A US 86346608A US 2010289901 A1 US2010289901 A1 US 2010289901A1
- Authority
- US
- United States
- Prior art keywords
- thermographic camera
- temperature
- characteristic curve
- thermographic
- adjustment device
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Abandoned
Links
- 238000000034 method Methods 0.000 claims abstract description 8
- 230000005855 radiation Effects 0.000 claims abstract description 6
- 238000005259 measurement Methods 0.000 claims description 7
- 230000010354 integration Effects 0.000 claims description 3
- 230000003321 amplification Effects 0.000 claims description 2
- 230000001419 dependent effect Effects 0.000 claims description 2
- 238000003199 nucleic acid amplification method Methods 0.000 claims description 2
- 230000001105 regulatory effect Effects 0.000 claims 1
- 238000006073 displacement reaction Methods 0.000 description 2
- 238000013178 mathematical model Methods 0.000 description 2
- 238000009529 body temperature measurement Methods 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N5/00—Details of television systems
- H04N5/30—Transforming light or analogous information into electric information
- H04N5/33—Transforming infrared radiation
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
- H04N23/20—Cameras or camera modules comprising electronic image sensors; Control thereof for generating image signals from infrared radiation only
- H04N23/23—Cameras or camera modules comprising electronic image sensors; Control thereof for generating image signals from infrared radiation only from thermal infrared radiation
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
- H04N25/67—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to fixed-pattern noise, e.g. non-uniformity of response
- H04N25/671—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to fixed-pattern noise, e.g. non-uniformity of response for non-uniformity detection or correction
Definitions
- the invention relates to a thermographic camera with at least one infrared radiation detector, such as a thermal detector or a pyrodetector, and with at least one adjustment device that provides control and/or supply voltages necessary for the operation of the thermographic camera.
- the invention further relates to a method for operating a thermographic camera.
- Thermographic cameras are known for determining temperature profiles of objects and are frequently used in environments with varying temperatures.
- the adjustment devices of the thermographic camera which must provide various supply and/or control voltages, are also subject to corresponding temperature fluctuations, which can certainly amount to as much as 70° C. Because of this, the voltages generated by the associated electronics are also subject to fluctuations.
- thermographic camera in which the temperature-induced drift of electronics can be compensated for with simultaneously reduced component costs.
- thermographic camera of the type mentioned above on which a storage means is provided, in which at least one temperature-dependent characteristic is stored, and in which the thermographic camera automatically compensates for a temperature-induced drift of the at least one adjustment device based on the characteristic curve.
- thermographic camera There are various possibilities for re-regulating the detector gain by analog or digital means in the thermographic camera. These adjustment possibilities permit a compensation for the drift in the electronics.
- the slopes of the detector characteristic, as well as the temperature of the at least one adjustment device are determined for various ambient temperatures in a calibration step, and are then described by a mathematical model. From the latter, at least one characteristic curve is obtained which, once stored in the camera, can compensate for the temperature-induced drift of the system and is used in the measurement. In a temperature measurement range between 0° C. and 100° C., the measurement error component caused by the electronics drift can be reduced in this manner to fractions of a degree.
- thermographic camera in which the infrared radiation detector is formed by a bolometer, in particular a bolometer with a focal plane array (FPA) having a plurality of individual sensors (pixels).
- FPA focal plane array
- the compensation of measurement values based on a characteristic stored in memory can be realized especially expediently in a thermographic camera in which the detector amplification is accomplished by analog variation of the control voltage, the control current or the integration time of the adjustment device, or digitally by a coding processable by a processor.
- a more precise compensation of the electronics drift that also takes the temperature over smaller intervals into account can be achieved by the use of several characteristic curves associated with individual components or groups thereof, so that in an advantageous configuration of the thermographic camera, the storage means can hold one or more characteristic curves, each associated with one or more adjustment devices.
- At least one temperature sensor is provided to determine the ambient temperature of the adjustment devices, in particular one temperature sensor for each adjustment device.
- thermographic camera for example the thermographic camera as described above.
- the camera is first subjected to a calibration to be performed one time, in which the following steps are carried out.
- the camera is housed inside a temperature-stabilized environment, such as a thermal testing cabinet, after which the control and/or supply voltages provided by the electronic components at different temperatures are determined.
- a characteristic curve is derived from these voltages that are subsequently stored in a storage means of the thermographic camera for compensation of the electronics drift.
- the drift of the electronics is compensated for by specifying the correct control voltage based on the characteristic curve, so that the slope of the detector characteristic does not change.
- the above-mentioned compensation can also be accomplished in a different manner than via the control voltage, namely by an analog change of the control current or the integration time, or digitally by an appropriate coding to be processed by a processor and which is implemented in a chip.
- thermographic camera in which the temperature-induced drift of electronic components of the camera can be minimized or compensated for with reduced component expense.
Landscapes
- Engineering & Computer Science (AREA)
- Multimedia (AREA)
- Signal Processing (AREA)
- Health & Medical Sciences (AREA)
- Toxicology (AREA)
- Photometry And Measurement Of Optical Pulse Characteristics (AREA)
- Radiation Pyrometers (AREA)
- Transforming Light Signals Into Electric Signals (AREA)
- Studio Devices (AREA)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE102008005167.5 | 2008-01-19 | ||
DE102008005167A DE102008005167A1 (de) | 2008-01-19 | 2008-01-19 | Wärmebildkamera |
PCT/EP2008/006871 WO2009089852A1 (de) | 2008-01-19 | 2008-08-21 | Wärmebildkamera |
Publications (1)
Publication Number | Publication Date |
---|---|
US20100289901A1 true US20100289901A1 (en) | 2010-11-18 |
Family
ID=40668439
Family Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
US12/863,466 Abandoned US20100289901A1 (en) | 2008-01-19 | 2008-08-21 | Thermographic camera |
US12/863,452 Active 2031-02-23 US8872110B2 (en) | 2008-01-19 | 2008-12-22 | Thermographic camera |
Family Applications After (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
US12/863,452 Active 2031-02-23 US8872110B2 (en) | 2008-01-19 | 2008-12-22 | Thermographic camera |
Country Status (6)
Country | Link |
---|---|
US (2) | US20100289901A1 (zh) |
EP (2) | EP2245848B1 (zh) |
JP (2) | JP2011510274A (zh) |
CN (2) | CN101919237A (zh) |
DE (1) | DE102008005167A1 (zh) |
WO (2) | WO2009089852A1 (zh) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN111609937A (zh) * | 2020-06-08 | 2020-09-01 | 北京环境特性研究所 | 一种红外热像仪外场标定方法及装置 |
Families Citing this family (16)
Publication number | Priority date | Publication date | Assignee | Title |
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US8296088B2 (en) * | 2006-06-02 | 2012-10-23 | Luminex Corporation | Systems and methods for performing measurements of one or more materials |
WO2015072006A1 (ja) * | 2013-11-15 | 2015-05-21 | 富士通株式会社 | 赤外線検知装置 |
JP6314652B2 (ja) * | 2014-05-20 | 2018-04-25 | 日産自動車株式会社 | 温度検出装置及び温度検出方法 |
DE102014108971B4 (de) * | 2014-06-26 | 2020-08-13 | Technische Universität Dresden | Kalibrierverfahren und Korrekturverfahren für ein verschlussloses Infrarotkamerasystem und selbiges |
KR102524529B1 (ko) | 2015-04-01 | 2023-04-24 | 삼성디스플레이 주식회사 | 발열 패키지 테스트 장치 및 그 작동 방법 |
CN105376499B (zh) * | 2015-12-11 | 2019-07-05 | 上海兴芯微电子科技有限公司 | 红外摄像装置的死点校正方法、系统及校正系统 |
JP6540519B2 (ja) * | 2016-01-12 | 2019-07-10 | 三菱電機株式会社 | 赤外線撮像装置 |
US10509434B1 (en) * | 2016-09-27 | 2019-12-17 | Amazon Technologies, Inc. | Oscillator profiling for time synchronization |
DE102016219391A1 (de) | 2016-10-06 | 2018-04-12 | Robert Bosch Gmbh | Verfahren zu einer Rauschoptimierung einer Kamera, insbesondere einer handgehaltenen Wärmebildkamera |
KR101947256B1 (ko) * | 2017-03-06 | 2019-02-12 | 동의대학교 산학협력단 | 고온계측이 가능한 교정곡선 산출 방법 |
KR101863498B1 (ko) * | 2017-04-04 | 2018-05-31 | 동의대학교 산학협력단 | 고온계측이 가능한 교정곡선 산출 시스템 |
JP6921591B2 (ja) * | 2017-04-05 | 2021-08-18 | 旭化成エレクトロニクス株式会社 | センサ出力処理装置およびセンサ出力処理方法 |
JP6921592B2 (ja) * | 2017-04-05 | 2021-08-18 | 旭化成エレクトロニクス株式会社 | センサ出力処理装置およびセンサ出力処理方法 |
KR102010329B1 (ko) * | 2017-08-04 | 2019-10-15 | 주식회사 디엠에스 | 기판처리장치 및 이를 이용한 인라인 기판처리시스템 |
CN109060136A (zh) * | 2018-06-05 | 2018-12-21 | 哈尔滨工程大学 | 一种基于围道积分的涡轮叶片辐射测温中背景辐射影响修正方法 |
KR102228266B1 (ko) * | 2019-02-12 | 2021-03-18 | (주)유우일렉트로닉스 | 열화상 카메라를 이용한 온도 측정 장치, 방법 및 컴퓨터로 독출 가능한 기록 매체 |
Citations (5)
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US5861913A (en) * | 1995-12-15 | 1999-01-19 | Nec Corporation | Heat-sensitive infrared-light image sensor with circuitry for canceling temperature-dependent drift components |
US5994699A (en) * | 1996-11-25 | 1999-11-30 | Nikon Corporation | Thermal camera for infrared imaging |
US6777701B1 (en) * | 2000-11-20 | 2004-08-17 | V-Gen Ltd. | Thermal radiation marker |
US20060255274A1 (en) * | 2005-02-03 | 2006-11-16 | Lin Alice L | Bolometer having an amorphous titanium oxide layer with high resistance stability |
US20070183475A1 (en) * | 2006-02-03 | 2007-08-09 | Hutcherson David R | Methods and systems for determining temperature of an object |
Family Cites Families (31)
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US5763885A (en) | 1995-12-19 | 1998-06-09 | Loral Infrared & Imaging Systems, Inc. | Method and apparatus for thermal gradient stabilization of microbolometer focal plane arrays |
US7495220B2 (en) * | 1995-10-24 | 2009-02-24 | Bae Systems Information And Electronics Systems Integration Inc. | Uncooled infrared sensor |
US6515285B1 (en) * | 1995-10-24 | 2003-02-04 | Lockheed-Martin Ir Imaging Systems, Inc. | Method and apparatus for compensating a radiation sensor for ambient temperature variations |
EP0865672B1 (en) | 1995-12-04 | 2000-08-30 | Lockheed-Martin IR Imaging Systems | Infrared radiation detector having a reduced active area |
USRE38527E1 (en) * | 1996-04-19 | 2004-06-08 | Nec Corporation | Thermal-type infrared imaging device |
US5756999A (en) | 1997-02-11 | 1998-05-26 | Indigo Systems Corporation | Methods and circuitry for correcting temperature-induced errors in microbolometer focal plane array |
US6028309A (en) | 1997-02-11 | 2000-02-22 | Indigo Systems Corporation | Methods and circuitry for correcting temperature-induced errors in microbolometer focal plane array |
KR200156903Y1 (ko) | 1997-02-20 | 1999-09-01 | 전주범 | 냉장고의 콤프레서 고정구조 |
JP3237822B2 (ja) * | 1997-04-18 | 2001-12-10 | 日本電気株式会社 | 赤外線撮像装置 |
JP3226859B2 (ja) * | 1997-11-17 | 2001-11-05 | 日本電気株式会社 | 撮像装置 |
JPH11337415A (ja) * | 1998-05-25 | 1999-12-10 | Matsushita Electric Works Ltd | 放射温度検出素子 |
JP2000028436A (ja) * | 1998-07-15 | 2000-01-28 | Nec Corp | 熱型赤外線検出回路 |
US6267501B1 (en) | 1999-03-05 | 2001-07-31 | Raytheon Company | Ambient temperature micro-bolometer control, calibration, and operation |
JP4362898B2 (ja) * | 1999-08-16 | 2009-11-11 | 株式会社ニコン | デジタルカメラ |
JP2001094884A (ja) * | 1999-09-21 | 2001-04-06 | Fuji Photo Film Co Ltd | 検出信号補正方法および装置 |
US6444983B1 (en) | 1999-10-07 | 2002-09-03 | Infrared Solutions, Inc. | Microbolometer focal plane array with controlled bias |
US6953932B2 (en) | 1999-10-07 | 2005-10-11 | Infrared Solutions, Inc. | Microbolometer focal plane array with temperature compensated bias |
IL152425A (en) | 2000-05-01 | 2006-12-10 | Bae Systems Information | Methods and apparatus for compensating a radiation sensor for temperature variations of the sensor |
US6465785B1 (en) | 2000-05-05 | 2002-10-15 | Infrared Solutions, Inc. | Apparatus and method for compensating for pixel non-uniformity in a bolometer |
JP4250323B2 (ja) * | 2000-10-23 | 2009-04-08 | 三菱電機株式会社 | 赤外線撮像装置 |
US6476392B1 (en) | 2001-05-11 | 2002-11-05 | Irvine Sensors Corporation | Method and apparatus for temperature compensation of an uncooled focal plane array |
CN2596340Y (zh) * | 2002-11-19 | 2003-12-31 | 西安交通大学 | 基于软件补偿的红外测温传感装置 |
US7030378B2 (en) | 2003-08-05 | 2006-04-18 | Bae Systems Information And Electronic Systems Integration, Inc. | Real-time radiation sensor calibration |
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DE102005010986B4 (de) * | 2005-03-03 | 2007-05-10 | Carl Zeiss Optronics Gmbh | Verfahren und Vorrichtung zum Aufnehmen eines Wärmebildes |
US7385199B2 (en) * | 2005-09-26 | 2008-06-10 | Teledyne Licensing, Llc | Microbolometer IR focal plane array (FPA) with in-situ mirco vacuum sensor and method of fabrication |
JP4441578B2 (ja) * | 2006-10-11 | 2010-03-31 | パナソニック株式会社 | 電子デバイスおよびその制御方法 |
US8233050B2 (en) * | 2006-10-26 | 2012-07-31 | Fluke Corporation | Multiple view infrared imaging system |
JP2008268155A (ja) * | 2007-04-25 | 2008-11-06 | Mitsubishi Electric Corp | 熱型赤外線固体撮像素子 |
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-
2008
- 2008-01-19 DE DE102008005167A patent/DE102008005167A1/de not_active Withdrawn
- 2008-08-21 EP EP08801648.0A patent/EP2245848B1/de active Active
- 2008-08-21 CN CN200880125123.0A patent/CN101919237A/zh active Pending
- 2008-08-21 US US12/863,466 patent/US20100289901A1/en not_active Abandoned
- 2008-08-21 JP JP2010542519A patent/JP2011510274A/ja active Pending
- 2008-08-21 WO PCT/EP2008/006871 patent/WO2009089852A1/de active Application Filing
- 2008-12-22 JP JP2010542533A patent/JP5535085B2/ja active Active
- 2008-12-22 US US12/863,452 patent/US8872110B2/en active Active
- 2008-12-22 EP EP08870935.7A patent/EP2245849B1/de active Active
- 2008-12-22 CN CN200880125121.1A patent/CN101919236B/zh active Active
- 2008-12-22 WO PCT/EP2008/011032 patent/WO2009089897A2/de active Application Filing
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5861913A (en) * | 1995-12-15 | 1999-01-19 | Nec Corporation | Heat-sensitive infrared-light image sensor with circuitry for canceling temperature-dependent drift components |
US5994699A (en) * | 1996-11-25 | 1999-11-30 | Nikon Corporation | Thermal camera for infrared imaging |
US6777701B1 (en) * | 2000-11-20 | 2004-08-17 | V-Gen Ltd. | Thermal radiation marker |
US20060255274A1 (en) * | 2005-02-03 | 2006-11-16 | Lin Alice L | Bolometer having an amorphous titanium oxide layer with high resistance stability |
US20070183475A1 (en) * | 2006-02-03 | 2007-08-09 | Hutcherson David R | Methods and systems for determining temperature of an object |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN111609937A (zh) * | 2020-06-08 | 2020-09-01 | 北京环境特性研究所 | 一种红外热像仪外场标定方法及装置 |
Also Published As
Publication number | Publication date |
---|---|
EP2245849A2 (de) | 2010-11-03 |
JP2011510274A (ja) | 2011-03-31 |
US20100294933A1 (en) | 2010-11-25 |
CN101919236B (zh) | 2012-11-28 |
EP2245849B1 (de) | 2019-03-27 |
JP2011510275A (ja) | 2011-03-31 |
WO2009089897A3 (de) | 2009-09-24 |
WO2009089852A8 (de) | 2009-09-24 |
WO2009089897A2 (de) | 2009-07-23 |
DE102008005167A1 (de) | 2009-07-23 |
EP2245848B1 (de) | 2014-04-23 |
US8872110B2 (en) | 2014-10-28 |
WO2009089852A1 (de) | 2009-07-23 |
CN101919237A (zh) | 2010-12-15 |
CN101919236A (zh) | 2010-12-15 |
JP5535085B2 (ja) | 2014-07-02 |
EP2245848A1 (de) | 2010-11-03 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
AS | Assignment |
Owner name: TESTO AG, GERMANY Free format text: ASSIGNMENT OF ASSIGNORS INTEREST;ASSIGNORS:STRATMANN, MARTIN;SCHULER, KARL;MESSERSCHMID, ANDREAS;REEL/FRAME:024703/0445 Effective date: 20100713 |
|
STCB | Information on status: application discontinuation |
Free format text: ABANDONED -- AFTER EXAMINER'S ANSWER OR BOARD OF APPEALS DECISION |