US20080280058A1 - Method of Preparing Zinc Oxide Nanorods on a Substrate By Chemical Spray Pyrolysis - Google Patents

Method of Preparing Zinc Oxide Nanorods on a Substrate By Chemical Spray Pyrolysis Download PDF

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US20080280058A1
US20080280058A1 US11/911,565 US91156506A US2008280058A1 US 20080280058 A1 US20080280058 A1 US 20080280058A1 US 91156506 A US91156506 A US 91156506A US 2008280058 A1 US2008280058 A1 US 2008280058A1
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substrate
solution
zinc oxide
zinc
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Malle Krunks
Ilona Oja-Acik
Tatjana Dedova
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Tallinn University of Technology
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    • B—PERFORMING OPERATIONS; TRANSPORTING
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    • B05D1/00—Processes for applying liquids or other fluent materials
    • B05D1/02—Processes for applying liquids or other fluent materials performed by spraying
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    • C23C18/00—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating
    • C23C18/02—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating by thermal decomposition
    • C23C18/12—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating by thermal decomposition characterised by the deposition of inorganic material other than metallic material
    • C23C18/1204—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating by thermal decomposition characterised by the deposition of inorganic material other than metallic material inorganic material, e.g. non-oxide and non-metallic such as sulfides, nitrides based compounds
    • C23C18/1208—Oxides, e.g. ceramics
    • C23C18/1216—Metal oxides
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    • C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C18/00—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating
    • C23C18/02—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating by thermal decomposition
    • C23C18/12—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating by thermal decomposition characterised by the deposition of inorganic material other than metallic material
    • C23C18/1229—Composition of the substrate
    • C23C18/1245—Inorganic substrates other than metallic
    • C—CHEMISTRY; METALLURGY
    • C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C18/00—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating
    • C23C18/02—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating by thermal decomposition
    • C23C18/12—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating by thermal decomposition characterised by the deposition of inorganic material other than metallic material
    • C23C18/125—Process of deposition of the inorganic material
    • C23C18/1258—Spray pyrolysis
    • C—CHEMISTRY; METALLURGY
    • C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C18/00—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating
    • C23C18/02—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating by thermal decomposition
    • C23C18/12—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating by thermal decomposition characterised by the deposition of inorganic material other than metallic material
    • C23C18/125—Process of deposition of the inorganic material
    • C23C18/1291—Process of deposition of the inorganic material by heating of the substrate
    • C—CHEMISTRY; METALLURGY
    • C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C4/00—Coating by spraying the coating material in the molten state, e.g. by flame, plasma or electric discharge
    • C23C4/04—Coating by spraying the coating material in the molten state, e.g. by flame, plasma or electric discharge characterised by the coating material
    • C23C4/10—Oxides, borides, carbides, nitrides or silicides; Mixtures thereof
    • C23C4/11—Oxides
    • H—ELECTRICITY
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    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/02104—Forming layers
    • H01L21/02365—Forming inorganic semiconducting materials on a substrate
    • H01L21/02518—Deposited layers
    • H01L21/02521—Materials
    • H01L21/02551—Group 12/16 materials
    • H01L21/02554—Oxides
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    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/02104—Forming layers
    • H01L21/02365—Forming inorganic semiconducting materials on a substrate
    • H01L21/02518—Deposited layers
    • H01L21/02587—Structure
    • H01L21/0259—Microstructure
    • H01L21/02603—Nanowires
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    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/02104—Forming layers
    • H01L21/02365—Forming inorganic semiconducting materials on a substrate
    • H01L21/02612—Formation types
    • H01L21/02617—Deposition types
    • H01L21/02623—Liquid deposition
    • H01L21/02628—Liquid deposition using solutions

Definitions

  • the invention relates to zinc oxide (ZnO) nanostructures, such as nanorods and nanoneedles, and to a method for manufacturing thereof, and more particularly, to a method of preparing highly structured zinc oxide layers comprising zinc oxide nanorods or nanoneedles, on various substrates by chemical spray pyrolysis (CSP) at moderate deposition temperatures of the substrate (from about 400 to 600° C.).
  • CSP chemical spray pyrolysis
  • Such nanorods are individual single crystals with high purity.
  • CSP is technologically simple deposition technique where no costly equipment is needed. Therefore, the invention provides very cheap and simple method, compared to alternative methods, for manufacturing zinc oxide nanostructures.
  • Zinc oxide is one of the most promising materials for optoelectronic applications due to its wide band gap of 3.37 eV and large exiton binding energy of 60 meV.
  • Zinc oxide nanostructures have wide range of potential applications also in areas such as solar cells, field emission devices, chemical and biological sensors, photocatalysts, light emitting devices, including light emitting diodes, and nano-sized lasers.
  • Flat zinc oxide layers are widely used for electronic and optoelectronic devices, for example, as transparent electrodes in thin film solar cells where simultaneously a high transparency and a low resistivity is required, but also in thin film gas sensors, varistors, and surface acoustic-wave devices.
  • Flat zinc oxide layers are conventionally prepared by several technologies, including sputtering, chemical vapour deposition, sol-gel deposition, atom layer deposition, molecular beam epitaxy, and different spray pyrolysis technologies (ultrasonic spray, pneumatic spray, pressure spray).
  • spray pyrolysis technologies ultrasonic spray, pneumatic spray, pressure spray.
  • the advantage of spray technique is its extreme simplicity. So the capital cost and the production cost of high quality metal oxide semiconductor films are expected to be the lowest compared to all other techniques. Furthermore, this technique is also well suited for mass production systems.
  • zinc salts e.g. zinc acetate, zinc nitrate etc.
  • Appropriate additives as salts of Indium, Aluminum or Terbium were added into the spray solution to make the films electrically conductive (European Patent application No 336574 to Sener for producing a layer of transparent conductive zinc oxide, priority date 6 Apr. 1988) and cobaltous or chromium acetylacetonates to accelerate the growth of the films in spray process (European Patent No 490493 to Platts for A process for depositing a layer of zinc oxide onto a substrate, date of filing 14.11.91, priority 12.12.90; U.S. Pat. No. 5,180,686 to Banerjee for Method for continuously depositing a transparent oxide material by chemical pyrolysis, issue date Jan. 19, 1993).
  • Zinc oxide nanopowder is also widely used, e.g., in sunscreens, paints, plastics, cosmetics because of its property to absorb ultra-violet radiation. Different methods are used to produce such powder.
  • Spherical ZnO microcrystals could be obtained by spray pyrolysis (see, e.g., M. Andres-Verges, et al, J. Materials Science 27 (1992) 3756-3762, Kikuo Okuyama et al Chemical Engineering Science 58 (2003) 537-547, Kang, Y. C. et al Journal of Aerosol Science, 26 (1995) 1131-1138).
  • M. Andres-Verges et al, J. Materials Science 27 (1992) 3756-3762
  • Kikuo Okuyama et al Chemical Engineering Science 58 (2003) 537-547 Kang, Y. C. et al Journal of Aerosol Science, 26 (1995) 1131-1138.
  • metal oxide nanorods for method of producing metal oxide nanorods describes metal oxide nanorods with diameter between 1 and 200 nm and aspect rations between 5 and 2000, produced by controlled vapour-solid growth processes in a furnace from a metal vapour source such as a mixture of a bulk metal oxide powder and carbon powder, and a low concentration of oxygen gas.
  • a metal vapour source such as a mixture of a bulk metal oxide powder and carbon powder, and a low concentration of oxygen gas.
  • Rod-like zinc oxide nanoparticles/crystals of different size are made by deposition from solutions (M. Andres-Verges, et al, J. Materials Science 27 (1992) 3756-3762), by hydrothermal synthesis in solutions (Wei H. et al Materials Science and Engineering A, 393 (2005) 80-82, Bai F. et al Materials Letters 59 (2005) 1687-1690, Guo M. et al Applied Surface Science, In Press, Corrected Proof, Available online 7 Jan. 2005, Kiwamu Sue et al Materials Letters, 58 (2004) 3350-3352), by chemical bath deposition (A. M. Peiró et al Thin Solid Films, In Press, Corrected Proof, Available online 20 Jan.
  • the method of growing nanostructured zinc oxide (ZnO) layers on a substrate comprises the steps of heating a substrate to a predetermined temperature, atomizing a solution, comprising a precursor, such as zinc chloride (ZnCl 2 ) or zinc acetate (Zn(CH 3 COO) 2 ), and a solvent, into small discrete droplets using spray pyrolysis; and depositing the atomized solution to the substrate, using predetermined solution feeding rate.
  • the solvent evaporates when the droplets reach the substrate and the precursor reacts to form a plurality of zinc oxide nanorods (or, in some cases, nanoneedles) on said substrate.
  • Aqueous or aqueous-alcoholic solution of zinc chloride or zinc acetate is used. Fine droplets of said solution are produced by atomizing of the solution with the help of ultrazonic or pneumatic spray techniques. The deposition process is carried out in air, compressed air, nitrogen or argon are used as carrier gases.
  • the aqueous or aqueous-alcoholic solution of zinc chloride may additionally contain thiourea (thiocarbamide SC(NH 2 ) 2 ) or urea (carbamide, OCN 2 H 4 ). Adding thiourea or urea to the aqueous or aqueous-alcoholic solution of zinc acetate may also be useful in some cases.
  • the substrate can be, e.g., glass, silicon or quartz (quartz slide).
  • the substrate can be covered by a flat layer of different metal oxides, e.g., indium tin oxide, tin oxide, titanium oxide, zinc oxide.
  • the nanocolumnar zinc oxide layers are consisting of well-developed hexagonal nanorods of single crystal zinc oxide with length from 50 nm up to six-seven microns, the diameter of rods could be varied from some tens of nanometers up to 1 micron.
  • the shape and size of zinc oxide crystals are controlled by several parameters, including the growth temperature, stock solution composition, concentration of precursors in stock solution, solution feeding rate, type of substrate, type of a flat layer of metal oxide (also called underlayer), and carrier gas flow rate.
  • FIG. 1 is a SEM cross-section of the nanostructured zinc oxide layer that is deposited from aqueous solution of zinc chloride (0.05 mol/l) onto glass substrate that was placed onto the soldered tin bath heated up to 600° C., and using the solution feeding rate of 2.4 ml/min;
  • FIG. 2 is a SEM cross-section of the nanostructured zinc oxide layer that is deposited from aqueous solution of zinc chloride (0.1 mol/l) onto glass substrate covered with conductive indium tin oxide (ITO) layer, whereas the glass substrate was placed onto the soldered tin bath heated up to 600° C., and using the solution feeding rate of 2.4 ml/min;
  • ITO conductive indium tin oxide
  • FIG. 3 is a SEM micrograph of the surface of the nanostructured zinc oxide layer that is deposited from aqueous solution of zinc chloride (0.1 mol/l) onto glass substrate covered with dense film of ZnO:In with thickness of about 300 ⁇ m, whereas the glass substrate was placed onto the soldered tin bath heated up to 600° C., and using the solution feed rate of 2.4 ml/min;
  • FIG. 4 is a SEM cross-section of the nanostructured zinc oxide layer that is prepared from zinc chloride solution with concentration of 0.2 mol/l onto the glass substrate that was placed onto the soldered tin bath heated up to 600° C., and using the solution feed rate of 1.7 ml/min;
  • FIG. 5 is a SEM cross-section of the nanostructured zinc oxide layer that is prepared from zinc chloride solution with concentration of 0.2 mol/l onto glass substrate that was placed onto the soldered tin bath heated up to 600° C., and using the solution feed rate of 3.3 ml/min;
  • FIG. 6A is a SEM micrograph of the nanostructured zinc oxide layer that is prepared from zinc chloride solution with concentration of 0.1 mol/l onto glass substrate that was placed onto the soldered tin bath heated up to 525° C., and using the solution feed rate of 2.3 ml/min;
  • FIG. 6B is a SEM cross-section of the nanostructured zinc oxide layer that is prepared from zinc chloride solution with concentration of 0.1 mol/l onto glass substrate that was placed onto the soldered tin bath heated up to 525° C., and using the solution feed rate of 2.3 ml/min;
  • FIG. 9 is a SEM cross-sectional image of the nanostructured zinc oxide layer that is deposited from the isopropanol and water solution (in ration 1:1 by volume) with zinc chloride concentration of 0.1 mol/l, deposited onto glass substrate that was placed onto the soldered tin bath heated up to 525° C., and solution feed rate 2.0 ml/min;
  • FIG. 10 is a SEM cross-sectional image of the nanostructured zinc oxide layer that is deposited from the solution containing zinc chloride (0.1 mol/l) and urea at molar ratio of 1:1 onto glass substrates that was placed onto the soldered tin bath heated up to 580° C., and solution feed rate 2.2 ml/min;
  • FIG. 11 is a ratio of zinc oxide (002) peak intensity to (101) plane intensity (I(002)/I(101)) in the XRD pattern for the layers with different amount of thiourea (tu) in the stock solution of the samples (prepared at constant tin bath temperature of 620° C., temperature at the substrate surface (the growth temperature) approximately 500° C.);
  • FIG. 12 is an XRD pattern of the sample that is depicted on FIG. 1 ;
  • FIG. 13 is an XRD pattern of the sample that is depicted on FIG. 2 ;
  • FIG. 14 is an XRD pattern of the sample, depicted on FIG. 3 ;
  • FIG. 15 is a RHEED pattern of a zinc oxide nanorod
  • FIG. 16 is a near band edge PL spectrum of zinc oxide nanorods
  • FIG. 17 is a SEM cross-sectional image of the nanostructured zinc oxide layer that is deposited from aqueous-alcoholic solution of zinc acetate (0.2 mol/l) onto glass substrate that was placed onto soldered tin bath heated up to 450° C.;
  • FIG. 18 is a SEM micrograph of the surface of the nanostructured zinc oxide layer that is deposited from aqueous-alcoholic solution of zinc acetate (0.2 mol/l) onto glass substrate that was placed onto soldered tin bath heated up to 450° C.;
  • FIG. 19 is a near band edge PL spectrum of nanostructured zinc oxide layer comprising zinc oxide nanoneedles.
  • the process of preparing nanostructured zinc oxide layers comprising nanorods or nanoneedles on a substrate according to present invention requires a solution comprising a precursor, such as zinc salt, e.g., zinc chloride (ZnCl 2 ), or zinc acetate (Zn(CH 3 COO) 2 ).
  • a precursor such as zinc salt, e.g., zinc chloride (ZnCl 2 ), or zinc acetate (Zn(CH 3 COO) 2
  • ZnCl 2 zinc chloride
  • Zn(CH 3 COO) 2 zinc acetate
  • Aqueous or aqueous-alcoholic solution can be used, whereas the concentration of zinc chloride in the solution can be from about 10 mmol up to about 0.4 mol per liter, and preferably from about 0.05 mol/l to 0.2 mol/l.
  • Suitable substrate for the nanostructured zinc oxide layer is glass, silicon, quartz, or metal oxide (such as indium tin oxide, titanium oxide, zinc oxide) covered glass.
  • the substrate must be heated up, whereas the temperature of the surface (on which the nanostructured ZnO layer is to be prepared—hereinafter also called the first surface), prior to deposition is from about 400 to about 650° C. for Silicon and quartz and 400° C. to 600° C. for glass and metal oxide covered glass. This temperature is also known as growth temperature.
  • substrate is placed onto a soldered metal bath (the surface that is facing the soldered metal is hereinafter also called the second surface), and the temperature of the first surface of the substrate is controlled indirectly by controlling the temperature of the soldered metal.
  • the metal having low vapor pressure e.g., tin (Sn) could be used as the soldered metal.
  • heat plate can be used as heating element instead of soldered metal bath.
  • the temperature of the heating element e.g., soldered metal
  • the temperature of the first surface of the substrate whereas this difference is substantial for substrates like glass and metal oxide covered class and nearly zero for Silicon.
  • the temperature of the soldered metal is about 70 to about 130 degrees higher than the growth temperature for the range of growth temperatures between about 400° C. to 600° C. for a glass/quartz substrate with a thickness of about 1 mm.
  • Atomization i.e. producing a spray of small droplets of the solution of a required size, is then carried out.
  • Any suitable means can be used, e.g., ultrasonic spray atomizer, pneumatic spray atomizer.
  • the spray of small droplets of the solution is then directed to the substrate, thereby creating a layer of nanostructured zinc oxide, comprising nanorods or nanoneedles, on the substrate.
  • the orientation of the nanorods or needles does not depend on the direction of the spray stream is applied on the substrate, but rather on the properties of substrate (or the layer of metal oxide on the substrate, as the case might be).
  • the deposition can be carried out in an open system.
  • Compressed air at 2-3 bar
  • nitrogen, or argon can be used, if needed.
  • a flow rate of the carrier gas is preferably from about 5 to about 9 l/min.
  • zinc chloride is dissolved in a solvent, comprising water and suitable alcohol, such as propanol, isopropanol, ethanol or methanol, e.g., in ratio 1:1 to 2:3 (by volume).
  • suitable alcohol such as propanol, isopropanol, ethanol or methanol, e.g., in ratio 1:1 to 2:3 (by volume).
  • Aqueous-alcoholic solution allows the process to be carried out at the lower temperatures of the heating element compared to when aqueous solution is used.
  • a solution additionally comprises thiourea.
  • the amount of thiourea is selected so that the molar ratios of precursors Zn:S is from 1:1 to 4:1.
  • a solution additionally comprises urea (carbamide, OC(NH 2 ) 2 ) as a precursor, whereas a precursor ratio ZnCl 2 : OC(NH 2 ) 2 in the solution is from about 1:1 to about 4:1.
  • zinc acetate is used as precursor, i.e., zinc acetate dihydrate is dissolved in aqueous or aqueous-alcoholic solution.
  • Zinc oxide layers comprising nanoneedles (with shape of cones and size of: diameter at bottom from 5-10 to 50 nm and length up to 200 nm) in between and on leaf-like grains/on the surface of ZnO film can be prepared.
  • the deposition temperature can be varied from about 350-450° C., preferably 370-400° C.
  • Solution concentrations can be varied from about 0.1 mol/l to about 0.4 mol/l.
  • the solutions were prepared at the room temperature (from about 18 to about 25° C.), but generally, the temperature of the solution is not critical.
  • Zinc chloride (pro analysis, Merck) or zinc acetate dihydrate (pro analysis, Merck), thiourea (pro synthesis, Merck), Urea (pro synthesis, Merck), 2-propanol (pro analysis, Merck), Ethanol (pro analysis, Merck), deionized water (with specific resistance 18 M ⁇ .cm) were used as starting materials.
  • a soldered metal bath was used as a heating element.
  • the bath is a custom-made stainless steel cylinder with diameter 80 mm, depth 20 mm, compromising a cavity for a thermocouple.
  • Temperature of the bath was set and electronically controlled using a thermocouple which is directly contacted with the bath and a temperature controller (Love 16010 by Dwyer Instruments).
  • Solution was atomised using air atomizing nozzle (W/O SU 1/4JN-SS by Spraying Systems; allows to set different solution flow rates), comprising fluid cap PF1650-SS and air cap PA64-SS.
  • Carrier gas flow rate was controlled by a flowmeter EK-4AR (Kytölö Incorporated).
  • the layers are consisting of well-developed hexagonal rods of zinc oxide with length from 500-800 nm up to 7000 nm, the diameter of rods could be varied from 20 nm up to 1000 nm.
  • the aspect ratio (length to diameter) of the crystals is from 1.5 up to 20.
  • XRD diffraction patterns were recorded for the prepared layers deposited onto different substrates.
  • the replicas of deposited layer on the diffractograms are belonging to the hexagonal zinc oxide (PDF 36-1451) independent of the substrate at deposition temperatures 400-600° C. (it should be appreciated that if the solution contains thiourea, the temperature will increase as the decomposition of zinc chloride thiourea complex compound formed in solution is exothermic process (runks M. et al Journal Thermal analysis and Calorimetry, 72 (2003) 497-506).
  • the crystallites in the film are orientated in the (002) direction (c-axis perpendicularly to the substrate) if grown onto the glass and conductive oxide covered substrates ( FIGS. 12 and 13 ).
  • the ratio of the peak intensities (I(002)/I(101)) is about 10 when ZnO nanorods were prepared onto glass or ITO substrates.
  • Flat ZnO film has the thickness of 50-200 nm and is prepared by spray pyrolysis from the solution of zinc acetate dihydrate dissolved in deionized water. Indium was added in amount of 1 at % (from indium chloride) into the solution to make flat films conductive.
  • Indium was added in amount of 1 at % (from indium chloride) into the solution to make flat films conductive.
  • TEM EMV-100BR The structure of sprayed nanorods was studied on a TEM EMV-100BR. Both, bright field (B.F.) and dark field (D.F.) images were studied.
  • TEM study confirms that grown rods are single crystals of ZnO.
  • the near band edge photoluminescence (PL) spectrum of zinc oxide nanorods measured at 10 K is presented in FIG. 16 .
  • PL spectrum shows very sharp emission peak at 3.356 eV, with two sattelites at 3.361 and 3.376 eV.
  • the recorded near band edge photoluminescence spectrum and absence of PL green emission band verifies high purity and perfect crystallinity of zinc oxide nanorods.
  • PL spectrum in UV region of the sample comprising nanoneedles on the surface is presented in FIG. 19 , showing that the zinc oxide nanoneedles are also of high purity and with perfect crystallinity.

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CN102181850A (zh) * 2011-03-29 2011-09-14 北京化工大学 一种氧化锌纳米薄膜的原位合成方法
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CN103303965B (zh) * 2013-05-14 2015-04-01 上海交通大学 顶端多尖型氧化锌纳米棒结构的制备方法
CN103303965A (zh) * 2013-05-14 2013-09-18 上海交通大学 顶端多尖型氧化锌纳米棒结构的制备方法
US9672873B2 (en) 2013-12-27 2017-06-06 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device
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US10684242B2 (en) * 2015-10-02 2020-06-16 Universitat Politecnica De Catalunya Control method for gas chemosensors and gas detection system
US10008502B2 (en) 2016-05-04 2018-06-26 Semiconductor Energy Laboratory Co., Ltd. Memory device
US20190106785A1 (en) * 2017-10-07 2019-04-11 Flosfia Inc. Method of forming film
US10927458B2 (en) * 2017-10-07 2021-02-23 Flosfia Inc. Method of forming film

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