US20080013820A1 - Peripheral inspection system and method - Google Patents

Peripheral inspection system and method Download PDF

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Publication number
US20080013820A1
US20080013820A1 US11/484,282 US48428206A US2008013820A1 US 20080013820 A1 US20080013820 A1 US 20080013820A1 US 48428206 A US48428206 A US 48428206A US 2008013820 A1 US2008013820 A1 US 2008013820A1
Authority
US
United States
Prior art keywords
image data
inspection
mirror
projected
image
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
US11/484,282
Other languages
English (en)
Inventor
Victor Vertoprakhov
Wong Soon Wei
Sergey Smorgon
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
MICROVIEW TECHNOLOGIES Pte Ltd
Microview Tech Ptd Ltd
Original Assignee
Microview Tech Ptd Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Microview Tech Ptd Ltd filed Critical Microview Tech Ptd Ltd
Priority to US11/484,282 priority Critical patent/US20080013820A1/en
Assigned to MICROVIEW TECHNOLOGIES PTE LTD reassignment MICROVIEW TECHNOLOGIES PTE LTD ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: SMORGON, SERGEY, VERTOPRAKHOV, VICTOR, WEI, WONG SOON
Priority to EP07013487.9A priority patent/EP2120039B1/de
Priority to MYPI20071114A priority patent/MY158021A/en
Priority to TW096125224A priority patent/TWI337250B/zh
Priority to SG200705154-3A priority patent/SG139656A1/en
Priority to CN200710136877.3A priority patent/CN101311667B/zh
Publication of US20080013820A1 publication Critical patent/US20080013820A1/en
Priority to US14/445,010 priority patent/US9824432B2/en
Abandoned legal-status Critical Current

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Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8803—Visual inspection
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8806—Specially adapted optical and illumination features
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/952—Inspecting the exterior surface of cylindrical bodies or wires
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T3/00—Geometric image transformations in the plane of the image
    • G06T3/06—Topological mapping of higher dimensional structures onto lower dimensional surfaces
    • G06T3/073—Transforming surfaces of revolution to planar images, e.g. cylindrical surfaces to planar images
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T5/00—Image enhancement or restoration
    • G06T5/80—Geometric correction
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection
    • G06T2207/30164—Workpiece; Machine component

Definitions

  • inspection typically requires obtaining multiple sets of image data.
  • objects may be initially oriented in a predetermined position and then moved to other pre-determined positions. This requires multiple images of the object to be generated.
  • the inspection system must still track the object and recognise it once it has reached the new orientation. This process requires a computationally intensive operation that can be the limiting factor in the production and quality control of objects.

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Chemical & Material Sciences (AREA)
  • Immunology (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Pathology (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Quality & Reliability (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Image Processing (AREA)
  • Geometry (AREA)
US11/484,282 2006-07-11 2006-07-11 Peripheral inspection system and method Abandoned US20080013820A1 (en)

Priority Applications (7)

Application Number Priority Date Filing Date Title
US11/484,282 US20080013820A1 (en) 2006-07-11 2006-07-11 Peripheral inspection system and method
EP07013487.9A EP2120039B1 (de) 2006-07-11 2007-07-10 Peripheres Prüfungssystem und -verfahren
MYPI20071114A MY158021A (en) 2006-07-11 2007-07-11 Peripheral inspection system and method
TW096125224A TWI337250B (en) 2006-07-11 2007-07-11 Peripheral inspection system and method
SG200705154-3A SG139656A1 (en) 2006-07-11 2007-07-11 Peripheral inspection system and method
CN200710136877.3A CN101311667B (zh) 2006-07-11 2007-07-11 外围检测系统和方法
US14/445,010 US9824432B2 (en) 2006-07-11 2014-07-28 Peripheral inspection system and method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US11/484,282 US20080013820A1 (en) 2006-07-11 2006-07-11 Peripheral inspection system and method

Related Child Applications (1)

Application Number Title Priority Date Filing Date
US14/445,010 Continuation US9824432B2 (en) 2006-07-11 2014-07-28 Peripheral inspection system and method

Publications (1)

Publication Number Publication Date
US20080013820A1 true US20080013820A1 (en) 2008-01-17

Family

ID=38949310

Family Applications (2)

Application Number Title Priority Date Filing Date
US11/484,282 Abandoned US20080013820A1 (en) 2006-07-11 2006-07-11 Peripheral inspection system and method
US14/445,010 Expired - Fee Related US9824432B2 (en) 2006-07-11 2014-07-28 Peripheral inspection system and method

Family Applications After (1)

Application Number Title Priority Date Filing Date
US14/445,010 Expired - Fee Related US9824432B2 (en) 2006-07-11 2014-07-28 Peripheral inspection system and method

Country Status (6)

Country Link
US (2) US20080013820A1 (de)
EP (1) EP2120039B1 (de)
CN (1) CN101311667B (de)
MY (1) MY158021A (de)
SG (1) SG139656A1 (de)
TW (1) TWI337250B (de)

Cited By (23)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP2116840A2 (de) * 2008-05-09 2009-11-11 Semiconductor Technologies & Instruments Pte Ltd. Multiples Oberflächenprüfungssystem und -verfahren
US20110157342A1 (en) * 2009-12-30 2011-06-30 Jvm Co., Ltd. Medicine management system and method using the same
US20110181169A1 (en) * 2008-05-14 2011-07-28 The Board Of Trustees Of The University Of Illinoi Microcavity and microchannel plasma device arrays in a single, unitary sheet
WO2014032744A1 (de) * 2012-08-29 2014-03-06 Khs Gmbh Vorrichtung zum inspizieren von gegenständen
EP2710354A4 (de) * 2011-05-17 2015-03-18 Gii Acquisition Llc Dba General Inspection Llc Verfahren und system zur optischen prüfung von teilen
EP2775923A4 (de) * 2011-11-08 2015-07-15 Univ Columbia Systeme und verfahren für eine gleichzeitige multidirektionale abbildung zur erfassung tomographischer daten
US20150253258A1 (en) * 2014-03-06 2015-09-10 Daihen Corporation Substrate damage detection device, substrate transfer robot with substrate damage detection device, and substrate damage detection method
EP2823289A4 (de) * 2012-03-07 2015-10-07 Gii Acquisition Llc Dba General Inspection Llc 3d-hochgeschwindigkeitsverfahren und system zur optischen prüfung von teilen
WO2016084065A1 (en) * 2014-11-27 2016-06-02 A. B. Imaging Solutions Ltd 3d scanners for simultaneous acquisition of multiple 3d data sets of 3d object
US9372160B2 (en) 2011-05-17 2016-06-21 Gii Acquisition, Llc Method and system for optically inspecting the ends of a manufactured part at a single inspection station having a measurement axis
US9575013B2 (en) 2011-05-17 2017-02-21 Gii Acquisition, Llc Non-contact method and system for inspecting a manufactured part at an inspection station having a measurement axis
US9697596B2 (en) 2011-05-17 2017-07-04 Gii Acquisition, Llc Method and system for optically inspecting parts
US20180143410A1 (en) * 2013-12-10 2018-05-24 Arvalis Institut Du Vegetal Device and method for imaging an object
US20180176549A1 (en) * 2016-12-16 2018-06-21 Utechzone Co., Ltd. Multi-view-angle image capturing device and multi-view-angle image inspection apparatus using the same
EP3364174A1 (de) 2017-02-15 2018-08-22 Christian Koller Optisches inspektionssystem und verfahren zur optischen inspektion eines prüflings
US10088431B2 (en) 2011-05-17 2018-10-02 Gii Acquisition, Llc Method and system for optically inspecting headed manufactured parts
US10094785B2 (en) 2011-05-17 2018-10-09 Gii Acquisition, Llc Method and system for optically inspecting headed manufactured parts
US10207297B2 (en) 2013-05-24 2019-02-19 GII Inspection, LLC Method and system for inspecting a manufactured part at an inspection station
US10290091B1 (en) * 2018-07-06 2019-05-14 Arevo, Inc. Filament inspection system
US10300510B2 (en) 2014-08-01 2019-05-28 General Inspection Llc High speed method and system for inspecting a stream of parts
CN110914967A (zh) * 2017-06-08 2020-03-24 布鲁克斯自动化(德国)有限公司 用于衬底容器的检查系统和方法
CN111721216A (zh) * 2020-06-29 2020-09-29 河南科技大学 基于三维图像的钢丝绳检测装置、表面损伤检测及绳径计算方法
US11282187B2 (en) * 2019-08-19 2022-03-22 Ricoh Company, Ltd. Inspection system, inspection apparatus, and method using multiple angle illumination

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CN102997842A (zh) * 2011-09-19 2013-03-27 苏州比特速浪电子科技有限公司 样品多面检测装置
CN102435617A (zh) * 2011-11-25 2012-05-02 南京邮电大学 基于镜面成像显微拍摄技术的球面缺陷的检测装置
US9148571B2 (en) * 2012-09-14 2015-09-29 Apple Inc. Image distortion correction in scaling circuit
ITUB20153230A1 (it) * 2015-08-26 2017-02-26 Marco Lottici Apparato di ispezione esterna di contenitori o oggetti in transito su trasportatori
SG10201509497VA (en) * 2015-11-18 2017-06-29 Emage Vision Pte Ltd Contact lens defect inspection using uv illumination
CN105466954B (zh) * 2016-01-18 2019-03-12 湖南远见视觉科技有限责任公司 一种柱状物检测设备
CN109949728B (zh) * 2019-04-24 2022-10-11 苏州华兴源创科技股份有限公司 一种显示面板的检测装置
EP4103934A1 (de) * 2020-02-12 2022-12-21 Abb Schweiz Ag Vorrichtung zur erfassung der oberflächenbeschaffenheit von objekten und verfahren zur herstellung der vorrichtung
KR20230154954A (ko) * 2021-03-10 2023-11-09 비디 키에스트라 비.브이. 용기를 이미징하기 위한 시스템 및 방법
CN117295953A (zh) * 2021-03-10 2023-12-26 贝克顿·迪金森公司 使用成像检查血液培养瓶的设备
TWI804142B (zh) * 2021-12-30 2023-06-01 華新麗華股份有限公司 物檢測設備

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US5699152A (en) * 1995-04-03 1997-12-16 Alltrista Corporation Electro-optical inspection system and method
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US20070065014A1 (en) * 2005-09-20 2007-03-22 Yuri Owechko Method for warped image object recognition

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US5699152A (en) * 1995-04-03 1997-12-16 Alltrista Corporation Electro-optical inspection system and method
US5828913A (en) * 1995-06-06 1998-10-27 Zanen; Pieter O. Method for three dimensional measurement and imaging having focus-related convergence compensation
US5760826A (en) * 1996-05-10 1998-06-02 The Trustees Of Columbia University Omnidirectional imaging apparatus
US5936725A (en) * 1997-10-28 1999-08-10 Materials Technologies Corp. Apparatus and method for viewing and inspecting a circumferential surface area of a test object
US6122045A (en) * 1997-10-28 2000-09-19 Materials Technologies Corporation Apparatus and method for viewing and inspecting a circumferential surface area of an object
US6130783A (en) * 1998-05-14 2000-10-10 Sharp Kabushiki Kaisha Omnidirectional visual sensor having a plurality of mirrors with surfaces of revolution
US20010015751A1 (en) * 1998-06-16 2001-08-23 Genex Technologies, Inc. Method and apparatus for omnidirectional imaging
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US20030068098A1 (en) * 2001-09-27 2003-04-10 Michael Rondinelli System and method for panoramic imaging
US6912042B2 (en) * 2002-03-28 2005-06-28 Carl Zeiss Smt Ag 6-mirror projection objective with few lenses
US20040105597A1 (en) * 2002-12-03 2004-06-03 Docomo Communications Laboratories Usa, Inc. Representation and coding of panoramic and omnidirectional images
US20070065014A1 (en) * 2005-09-20 2007-03-22 Yuri Owechko Method for warped image object recognition

Cited By (29)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP2116840A2 (de) * 2008-05-09 2009-11-11 Semiconductor Technologies & Instruments Pte Ltd. Multiples Oberflächenprüfungssystem und -verfahren
US8890409B2 (en) 2008-05-14 2014-11-18 The Board Of Trustees Of The University Of Illnois Microcavity and microchannel plasma device arrays in a single, unitary sheet
US20110181169A1 (en) * 2008-05-14 2011-07-28 The Board Of Trustees Of The University Of Illinoi Microcavity and microchannel plasma device arrays in a single, unitary sheet
US20110157342A1 (en) * 2009-12-30 2011-06-30 Jvm Co., Ltd. Medicine management system and method using the same
US8791993B2 (en) * 2009-12-30 2014-07-29 Jvm Co., Ltd. Medicine management system and method using the same
US10094785B2 (en) 2011-05-17 2018-10-09 Gii Acquisition, Llc Method and system for optically inspecting headed manufactured parts
US9575013B2 (en) 2011-05-17 2017-02-21 Gii Acquisition, Llc Non-contact method and system for inspecting a manufactured part at an inspection station having a measurement axis
EP2710354A4 (de) * 2011-05-17 2015-03-18 Gii Acquisition Llc Dba General Inspection Llc Verfahren und system zur optischen prüfung von teilen
US10088431B2 (en) 2011-05-17 2018-10-02 Gii Acquisition, Llc Method and system for optically inspecting headed manufactured parts
US9372160B2 (en) 2011-05-17 2016-06-21 Gii Acquisition, Llc Method and system for optically inspecting the ends of a manufactured part at a single inspection station having a measurement axis
US9370799B2 (en) 2011-05-17 2016-06-21 Gii Acquisition, Llc Method and system for optically inspecting a manufactured part at a single inspection station having a measurement axis
US9697596B2 (en) 2011-05-17 2017-07-04 Gii Acquisition, Llc Method and system for optically inspecting parts
EP2775923A4 (de) * 2011-11-08 2015-07-15 Univ Columbia Systeme und verfahren für eine gleichzeitige multidirektionale abbildung zur erfassung tomographischer daten
EP2823289A4 (de) * 2012-03-07 2015-10-07 Gii Acquisition Llc Dba General Inspection Llc 3d-hochgeschwindigkeitsverfahren und system zur optischen prüfung von teilen
WO2014032744A1 (de) * 2012-08-29 2014-03-06 Khs Gmbh Vorrichtung zum inspizieren von gegenständen
US10207297B2 (en) 2013-05-24 2019-02-19 GII Inspection, LLC Method and system for inspecting a manufactured part at an inspection station
US20180143410A1 (en) * 2013-12-10 2018-05-24 Arvalis Institut Du Vegetal Device and method for imaging an object
US10571667B2 (en) * 2013-12-10 2020-02-25 Arvalis Institut Du Vegetal Device and method for imaging an object by arranging a reflective optical surface or reflective optical system around the object
US20150253258A1 (en) * 2014-03-06 2015-09-10 Daihen Corporation Substrate damage detection device, substrate transfer robot with substrate damage detection device, and substrate damage detection method
US9390953B2 (en) * 2014-03-06 2016-07-12 Daihen Corporation Substrate damage detection device, substrate transfer robot with substrate damage detection device, and substrate damage detection method
US10300510B2 (en) 2014-08-01 2019-05-28 General Inspection Llc High speed method and system for inspecting a stream of parts
WO2016084065A1 (en) * 2014-11-27 2016-06-02 A. B. Imaging Solutions Ltd 3d scanners for simultaneous acquisition of multiple 3d data sets of 3d object
US20180176549A1 (en) * 2016-12-16 2018-06-21 Utechzone Co., Ltd. Multi-view-angle image capturing device and multi-view-angle image inspection apparatus using the same
WO2018149877A1 (de) 2017-02-15 2018-08-23 Christian Koller Optisches inspektionssystem und verfahren zur optischen inspektion eines prüflings
EP3364174A1 (de) 2017-02-15 2018-08-22 Christian Koller Optisches inspektionssystem und verfahren zur optischen inspektion eines prüflings
CN110914967A (zh) * 2017-06-08 2020-03-24 布鲁克斯自动化(德国)有限公司 用于衬底容器的检查系统和方法
US10290091B1 (en) * 2018-07-06 2019-05-14 Arevo, Inc. Filament inspection system
US11282187B2 (en) * 2019-08-19 2022-03-22 Ricoh Company, Ltd. Inspection system, inspection apparatus, and method using multiple angle illumination
CN111721216A (zh) * 2020-06-29 2020-09-29 河南科技大学 基于三维图像的钢丝绳检测装置、表面损伤检测及绳径计算方法

Also Published As

Publication number Publication date
MY158021A (en) 2016-08-30
SG139656A1 (en) 2008-02-29
CN101311667B (zh) 2015-01-21
TWI337250B (en) 2011-02-11
EP2120039B1 (de) 2016-12-14
CN101311667A (zh) 2008-11-26
US9824432B2 (en) 2017-11-21
EP2120039A3 (de) 2009-12-09
TW200809164A (en) 2008-02-16
US20140333760A1 (en) 2014-11-13
EP2120039A2 (de) 2009-11-18

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