US20060057886A1 - Holding device for holding an electronic component - Google Patents

Holding device for holding an electronic component Download PDF

Info

Publication number
US20060057886A1
US20060057886A1 US11/076,799 US7679905A US2006057886A1 US 20060057886 A1 US20060057886 A1 US 20060057886A1 US 7679905 A US7679905 A US 7679905A US 2006057886 A1 US2006057886 A1 US 2006057886A1
Authority
US
United States
Prior art keywords
seat
deformable member
accommodating space
holding device
electronic module
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
US11/076,799
Inventor
Hsin-Feng Chien
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Individual
Original Assignee
Individual
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Individual filed Critical Individual
Priority to US11/353,414 priority Critical patent/US7273385B2/en
Publication of US20060057886A1 publication Critical patent/US20060057886A1/en
Abandoned legal-status Critical Current

Links

Images

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/04Housings; Supporting members; Arrangements of terminals
    • G01R1/0408Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0416Connectors, terminals

Definitions

  • the invention relates to a holding device, more particularly to a holding device, which holds an electronic component that is to be tested by a testing apparatus.
  • FIG. 1 illustrates a conventional holding device that includes a seat 21 , a clamping unit 22 , a pair of electrical connectors 23 , and a hydraulic driving unit 24 .
  • the conventional holding device serves to hold a dual in-line memory module (DIMM) 1 that is to be tested by a testing apparatus (not shown).
  • the DIMM 1 includes a printed circuit board, a plurality of integrated circuits mounted on the printed circuit board, a first set of pins 13 , which are coupled to the integrated circuits and which are disposed on one side of the printed circuit board, and a second set of pins 14 , which are coupled to the integrated circuits and which are disposed on the other side of the printed circuit board.
  • the seat 21 includes a pair of jaws 211 , and defines an accommodating space 213 .
  • the first and second sets of pins 13 , 14 of the DIMM 1 are disposed in the accommodating space 213 when the DIMM 1 is clenched between the jaws 211 of the seat 21 .
  • the clamping unit 22 is disposed in the accommodating space 213 in the seat 21 , and includes a pair of clamps 221 that are operable so as to clamp the first and second sets of pins 13 , 14 of the DIMM 1 when the latter is inserted into the accommodating space 213 in the seat 21 .
  • Each of the electrical connectors 23 has first and second ends 232 , 233 , each of which has a set of electrical contacts.
  • the first end 232 of each of the electrical connectors 23 is connected detachably to a respective one of the clamps 221 of the clamping unit 22 .
  • the second ends 233 of the electrical connectors 23 are connected removably to the testing apparatus.
  • the hydraulic driving unit 24 controls the operation of the clamps 221 of the clamping unit 22 .
  • the first end 232 of each of the electrical connectors 23 is in contact with a respective one of the first and second sets of pins 13 , 14 of the DIMM 1 when the clamps 221 of the clamping unit 22 are operated by the hydraulic driving unit 24 , thereby permitting the testing apparatus to perform tests on the DIMM 1 .
  • the hydraulic driving unit 24 generates undesirable noise.
  • the first ends 232 of the electrical connectors 23 are brought into contact with the first and second sets of pins 13 , 14 of the DIMM 1 by means of clamping, the first ends 232 of the electrical connectors 23 are easily damaged, thereby requiring frequent replacement of the electrical connectors 23 .
  • the DIMM 1 is subjected to high temperatures during soldering of the integrated circuits on the printed circuit board, deformation of the DIMM 1 occurs.
  • the first ends 232 of the electrical connectors 23 may not be properly brought into contact with the first and second sets of pins 13 , 14 of the deformed DIMM 1 , thereby making the test results inaccurate.
  • the object of the present invention is to provide a holding device that can overcome the aforesaid drawbacks of the prior art.
  • a holding device which is for a testing apparatus, comprises a seat, a deformable member, an electrical connector, and a force-imparting member.
  • the seat defines an accommodating space therein, and is adapted to hold an electronic module that extends into the accommodating space in the seat and that is to be tested by the testing apparatus.
  • the deformable member is disposed in the accommodating space in the seat.
  • the electrical connector has a first end attached to the deformable member, and a second end adapted to be coupled to the testing apparatus.
  • the force-imparting member is connected to the seat, and is operable so as to impart a pushing force on the deformable member such that the deformable member deforms elastically to a contact position, where the first end of the electrical connector is in contact with electrical contacts of the electronic module when the electronic module is held by the seat and extends into the accommodating space in the seat, thereby permitting the testing apparatus to perform tests on the electronic module.
  • FIG. 1 is a schematic view of a conventional holding device
  • FIGS. 2 and 3 are schematic views of the conventional holding device in a state of use
  • FIG. 4 is a fragmentary sectional view of the first preferred embodiment of a holding device according to the present invention.
  • FIG. 5 is a schematic top view of the first preferred embodiment
  • FIGS. 6 and 7 are fragmentary sectional views of the first preferred embodiment in a state of use.
  • FIG. 8 is a fragmentary sectional view of the second preferred embodiment of a holding device according to the present invention.
  • the first preferred embodiment of a holding device 3 is shown to include a seat 4 , a pair of first and second deformable members 51 , 52 , a pair of first and second electrical connectors 61 , 62 , and a pneumatic driving unit 7 .
  • the holding device 3 of this embodiment serves to hold removably a dual in-line memory module (DIMM) 1 (see FIGS. 6 and 7 ) that is to be tested by a testing apparatus 200 .
  • the DIMM 1 includes a printed circuit board, a plurality of integrated circuits mounted on the printed circuit board, a first set of electrical contacts 13 , each of which is coupled to the integrated circuits and is disposed on one side of the printed circuit board, and a second set of electrical contacts 14 , each of which is coupled to the integrated circuits and is disposed on the other side of the printed circuit board.
  • the testing apparatus 200 is installed with test software for executing tests apparatus 200 on the DIMM 1 .
  • the seat 4 includes a pair of jaws 41 , and defines an accommodating space (S) therein.
  • the first and second sets of electrical contacts 13 , 14 of the DIMM 1 are disposed in the accommodating space (S) of the seat 4 when the DIMM 1 is clenched between the jaws 41 of the seat 4 .
  • Each of the first and second deformable members 51 , 52 is disposed in the accommodating space (S) in the seat 4 .
  • each of the first and second deformable members 51 , 52 is made from a plastic material.
  • Each of the first and second electrical connectors 61 , 62 has a first end 611 , 621 that is secured detachably to a respective one of the first and second deformable members 51 , 52 , and a second end 612 , 622 that is connected electrically to the testing apparatus 200 .
  • each of the first and second electrical connectors 61 , 62 is a ribbon connector.
  • the pneumatic driving unit 7 is connected to the seat 4 , and includes a pair of first and second nozzles 71 , 72 that are in fluid communication with the accommodating space (S) in the seat 4 , and a pair of first and second pneumatic controllers 73 , 74 , each of which is connected to a respective one of the nozzles 71 , 72 of the pneumatic driving unit 7 . It is noted that each of the pneumatic controllers 73 , 74 includes a Venturi tube. In this embodiment, as best shown in FIG.
  • the first pneumatic controller 73 of the pneumatic driving unit 7 is operable so as to impart a pushing force, such as by blowing, on the first deformable member 51 through the first nozzle 71 of the pneumatic driving unit 7 such that the first deformable member 51 deforms elastically from a first initial position to a first contact position, where the first end 611 of the first electrical connector 61 is in direct contact with the first set of electrical contacts 13 of the DIMM 1 .
  • the second pneumatic controller 74 of the pneumatic driving unit 7 is operable so as to impart a force, such as by blowing air, on the second deformable member 52 through the second nozzle 72 such that the second deformable member 52 deforms elastically from a second initial position to a second contact position, where the first end 621 of the second electrical connector 62 is in direct contact with the second set of electrical contacts 14 of the DIMM 1 .
  • the testing apparatus 200 is able to perform tests on the DIMM 1 .
  • first and second electrical connectors 61 , 62 are at first and second original positions, respectively, as best shown in FIG. 4 , the first ends 611 , 621 of the first and second electrical connectors 61 , 62 are not in contact with the first and second sets of electrical contacts 13 , 14 of the DIMM 1 .
  • the first pneumatic controller 73 of the pneumatic driving unit 7 is further operable so as to impart a pulling force, by suction, on the first deformable member 51 through the first nozzle 71 such that the first deformable member 51 deforms elastically from the first contact position to a first non-contact position, where the first end 611 of the first electrical connector 61 is not in contact with the first set of electrical contacts 13 of the DIMM 1 .
  • the second vacuum 74 of the pneumatic driving unit 7 is further operable so as to impart a force, by suction, on the second deformable member 52 through the second nozzle 72 such that the second deformable member 52 deforms elastically from the second contact position to a second non-contact position, where the first end 621 of the second electrical connector 62 is not in contact with the second set of electrical contacts 14 of the DIMM 1 .
  • the DIMM 1 may be replaced by another DIMM 1 .
  • the first and second vacuums 73 , 74 are disabled so as to dispose the first and second electrical connectors 61 , 62 at the first and second original positions, respectively.
  • FIG. 8 illustrates the second preferred embodiment of a holding device 3 according to this invention.
  • the holding device 3 of this embodiment serves to hold a single in-line memory module (SIMM) (not shown).
  • SIMM includes a printed circuit board, a plurality of integrated circuits mounted on the printed circuit board, and a set of electrical contacts, each of which is coupled to the integrated circuits and is disposed on one side of the printed circuit board.
  • the second deformable member 52 (see FIG. 4 ), the second electrical connector 62 (see FIG. 4 ), and the second vacuum 74 (see FIG. 4 ) and the second nozzle 72 (see FIG. 4 ) of the pneumatic driving unit 7 of the previous embodiment are dispensed with in this embodiment. Since the operation of the holding device 3 of this embodiment is similar to that described hereinabove in connection with the holding device 3 of the previous embodiment, a detailed description of the same will be dispensed with herein for the sake of brevity.

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Tests Of Electronic Circuits (AREA)

Abstract

A holding device includes a seat, a deformable member, an electrical connector, and a force-imparting member. The seat defines an accommodating space therein, and serves to hold an electronic module that extends into the accommodating space. The deformable member is disposed in the accommodating space. The electrical connector has a first end attached to the deformable member, and a second end coupled to the testing apparatus. The force-imparting member is connected to the seat, and is operable so as to deform elastically the deformable member to a contact position, where the first end of the electrical connector is in contact with electrical contacts of the electronic module, thereby permitting the testing apparatus to perform tests on the electronic module.

Description

    CROSS-REFERENCE TO RELATED APPLICATION
  • This application claims priority of Taiwanese application no. 093214721, filed on Sep. 15, 2004.
  • BACKGROUND OF THE INVENTION
  • 1. Field of the Invention
  • The invention relates to a holding device, more particularly to a holding device, which holds an electronic component that is to be tested by a testing apparatus.
  • 2. Description of the Related Art
  • FIG. 1 illustrates a conventional holding device that includes a seat 21, a clamping unit 22, a pair of electrical connectors 23, and a hydraulic driving unit 24. With further reference to FIG. 2, the conventional holding device serves to hold a dual in-line memory module (DIMM) 1 that is to be tested by a testing apparatus (not shown). The DIMM 1 includes a printed circuit board, a plurality of integrated circuits mounted on the printed circuit board, a first set of pins 13, which are coupled to the integrated circuits and which are disposed on one side of the printed circuit board, and a second set of pins 14, which are coupled to the integrated circuits and which are disposed on the other side of the printed circuit board. The seat 21 includes a pair of jaws 211, and defines an accommodating space 213. The first and second sets of pins 13, 14 of the DIMM 1 are disposed in the accommodating space 213 when the DIMM 1 is clenched between the jaws 211 of the seat 21. The clamping unit 22 is disposed in the accommodating space 213 in the seat 21, and includes a pair of clamps 221 that are operable so as to clamp the first and second sets of pins 13, 14 of the DIMM 1 when the latter is inserted into the accommodating space 213 in the seat 21. Each of the electrical connectors 23 has first and second ends 232, 233, each of which has a set of electrical contacts. The first end 232 of each of the electrical connectors 23 is connected detachably to a respective one of the clamps 221 of the clamping unit 22. The second ends 233 of the electrical connectors 23 are connected removably to the testing apparatus. The hydraulic driving unit 24 controls the operation of the clamps 221 of the clamping unit 22. As illustrated in FIG. 3, the first end 232 of each of the electrical connectors 23 is in contact with a respective one of the first and second sets of pins 13, 14 of the DIMM 1 when the clamps 221 of the clamping unit 22 are operated by the hydraulic driving unit 24, thereby permitting the testing apparatus to perform tests on the DIMM 1.
  • Although the aforementioned conventional holding device achieves its intended purpose, the hydraulic driving unit 24 generates undesirable noise. Moreover, since the first ends 232 of the electrical connectors 23 are brought into contact with the first and second sets of pins 13, 14 of the DIMM 1 by means of clamping, the first ends 232 of the electrical connectors 23 are easily damaged, thereby requiring frequent replacement of the electrical connectors 23. Further, since the DIMM 1 is subjected to high temperatures during soldering of the integrated circuits on the printed circuit board, deformation of the DIMM 1 occurs. As such, since the clamps 221 of the clamping unit 22 are rigid, the first ends 232 of the electrical connectors 23 may not be properly brought into contact with the first and second sets of pins 13, 14 of the deformed DIMM 1, thereby making the test results inaccurate.
  • SUMMARY OF THE INVENTION
  • Therefore, the object of the present invention is to provide a holding device that can overcome the aforesaid drawbacks of the prior art.
  • According to the present invention, a holding device, which is for a testing apparatus, comprises a seat, a deformable member, an electrical connector, and a force-imparting member. The seat defines an accommodating space therein, and is adapted to hold an electronic module that extends into the accommodating space in the seat and that is to be tested by the testing apparatus. The deformable member is disposed in the accommodating space in the seat. The electrical connector has a first end attached to the deformable member, and a second end adapted to be coupled to the testing apparatus. The force-imparting member is connected to the seat, and is operable so as to impart a pushing force on the deformable member such that the deformable member deforms elastically to a contact position, where the first end of the electrical connector is in contact with electrical contacts of the electronic module when the electronic module is held by the seat and extends into the accommodating space in the seat, thereby permitting the testing apparatus to perform tests on the electronic module.
  • BRIEF DESCRIPTION OF THE DRAWINGS
  • Other features and advantages of the present invention will become apparent in the following detailed description of the preferred embodiments with reference to the accompanying drawings, of which:
  • FIG. 1 is a schematic view of a conventional holding device;
  • FIGS. 2 and 3 are schematic views of the conventional holding device in a state of use;
  • FIG. 4 is a fragmentary sectional view of the first preferred embodiment of a holding device according to the present invention;
  • FIG. 5 is a schematic top view of the first preferred embodiment;
  • FIGS. 6 and 7 are fragmentary sectional views of the first preferred embodiment in a state of use; and
  • FIG. 8 is a fragmentary sectional view of the second preferred embodiment of a holding device according to the present invention.
  • DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS
  • Before the present invention is described in greater detail, it should be noted that like elements are denoted by the same reference numerals throughout the disclosure.
  • Referring to FIGS. 4 and 5, the first preferred embodiment of a holding device 3 according to this invention is shown to include a seat 4, a pair of first and second deformable members 51, 52, a pair of first and second electrical connectors 61, 62, and a pneumatic driving unit 7.
  • The holding device 3 of this embodiment serves to hold removably a dual in-line memory module (DIMM) 1 (see FIGS. 6 and 7) that is to be tested by a testing apparatus 200. The DIMM 1 includes a printed circuit board, a plurality of integrated circuits mounted on the printed circuit board, a first set of electrical contacts 13, each of which is coupled to the integrated circuits and is disposed on one side of the printed circuit board, and a second set of electrical contacts 14, each of which is coupled to the integrated circuits and is disposed on the other side of the printed circuit board. The testing apparatus 200 is installed with test software for executing tests apparatus 200 on the DIMM 1.
  • With further reference to FIG. 6, the seat 4 includes a pair of jaws 41, and defines an accommodating space (S) therein. The first and second sets of electrical contacts 13, 14 of the DIMM 1 are disposed in the accommodating space (S) of the seat 4 when the DIMM 1 is clenched between the jaws 41 of the seat 4.
  • Each of the first and second deformable members 51, 52 is disposed in the accommodating space (S) in the seat 4. In this embodiment, each of the first and second deformable members 51, 52 is made from a plastic material.
  • Each of the first and second electrical connectors 61, 62 has a first end 611, 621 that is secured detachably to a respective one of the first and second deformable members 51, 52, and a second end 612, 622 that is connected electrically to the testing apparatus 200. In this embodiment, each of the first and second electrical connectors 61, 62 is a ribbon connector.
  • The pneumatic driving unit 7 is connected to the seat 4, and includes a pair of first and second nozzles 71, 72 that are in fluid communication with the accommodating space (S) in the seat 4, and a pair of first and second pneumatic controllers 73, 74, each of which is connected to a respective one of the nozzles 71, 72 of the pneumatic driving unit 7. It is noted that each of the pneumatic controllers 73, 74 includes a Venturi tube. In this embodiment, as best shown in FIG. 6, the first pneumatic controller 73 of the pneumatic driving unit 7 is operable so as to impart a pushing force, such as by blowing, on the first deformable member 51 through the first nozzle 71 of the pneumatic driving unit 7 such that the first deformable member 51 deforms elastically from a first initial position to a first contact position, where the first end 611 of the first electrical connector 61 is in direct contact with the first set of electrical contacts 13 of the DIMM 1. On the other hand, the second pneumatic controller 74 of the pneumatic driving unit 7 is operable so as to impart a force, such as by blowing air, on the second deformable member 52 through the second nozzle 72 such that the second deformable member 52 deforms elastically from a second initial position to a second contact position, where the first end 621 of the second electrical connector 62 is in direct contact with the second set of electrical contacts 14 of the DIMM 1. In this state, the testing apparatus 200 is able to perform tests on the DIMM 1.
  • It is noted that, when the first and second electrical connectors 61, 62 are at first and second original positions, respectively, as best shown in FIG. 4, the first ends 611, 621 of the first and second electrical connectors 61, 62 are not in contact with the first and second sets of electrical contacts 13, 14 of the DIMM 1.
  • In this embodiment, with further reference to FIG. 7, the first pneumatic controller 73 of the pneumatic driving unit 7 is further operable so as to impart a pulling force, by suction, on the first deformable member 51 through the first nozzle 71 such that the first deformable member 51 deforms elastically from the first contact position to a first non-contact position, where the first end 611 of the first electrical connector 61 is not in contact with the first set of electrical contacts 13 of the DIMM 1. The second vacuum 74 of the pneumatic driving unit 7 is further operable so as to impart a force, by suction, on the second deformable member 52 through the second nozzle 72 such that the second deformable member 52 deforms elastically from the second contact position to a second non-contact position, where the first end 621 of the second electrical connector 62 is not in contact with the second set of electrical contacts 14 of the DIMM 1. It is noted that, when the first and second deformable members 61, 62 are disposed at the first and second non-contact positions, respectively, the DIMM 1 may be replaced by another DIMM 1. In another embodiment, when replacing the DIMM 1, the first and second vacuums 73, 74 are disabled so as to dispose the first and second electrical connectors 61, 62 at the first and second original positions, respectively.
  • FIG. 8 illustrates the second preferred embodiment of a holding device 3 according to this invention. When compared to the previous embodiment, the holding device 3 of this embodiment serves to hold a single in-line memory module (SIMM) (not shown). The SIMM includes a printed circuit board, a plurality of integrated circuits mounted on the printed circuit board, and a set of electrical contacts, each of which is coupled to the integrated circuits and is disposed on one side of the printed circuit board. The second deformable member 52 (see FIG. 4), the second electrical connector 62 (see FIG. 4), and the second vacuum 74 (see FIG. 4) and the second nozzle 72 (see FIG. 4) of the pneumatic driving unit 7 of the previous embodiment are dispensed with in this embodiment. Since the operation of the holding device 3 of this embodiment is similar to that described hereinabove in connection with the holding device 3 of the previous embodiment, a detailed description of the same will be dispensed with herein for the sake of brevity.
  • While the present invention has been described in connection with what is considered the most practical and preferred embodiments it is understood that this invention is not limited to the disclosed embodiments but is intended to cover various arrangements included within the spirit and scope of the broadest interpretation so as to encompass all such modifications and equivalent arrangements.

Claims (5)

1. A holding device for a testing apparatus, comprising:
a seat defining an accommodating space therein, and adapted to hold an electronic module that extends into said accommodating space in said seat and that is to be tested by the testing apparatus;
a deformable member disposed in said accommodating space in said seat;
an electrical connector having a first end attached to said deformable member, and a second end adapted to be coupled to the testing apparatus; and
a force-imparting member connected to said seat, and operable so as to impart a pushing force on said deformable member such that said deformable member deforms elastically to a contact position, where said first end of said electrical connector is in contact with electrical contacts of the electronic module when the electronic module is held by said seat and extends into said accommodating space in said seat, thereby permitting the testing apparatus to perform tests on the electronic module.
2. The holding device as claimed in claim 1, wherein said seat includes a pair of jaws adapted to secure the electronic module therebetween.
3. The holding device as claimed in claim 1, wherein said force-imparting member is a pneumatic driving unit for elastically deforming said deformable member by blowing, said pneumatic driving unit including a nozzle that is in fluid communication with said accommodating space in said seat, and a pneumatic controller that is connected to said nozzle.
4. The holding device as claimed in claim 1, wherein said force-imparting member is further operable so as to impart a pulling force on said deformable member such that said deformable member deforms elastically to a non-contact position, where said first end of said electrical connector is not in contact with the electrical contacts of the electronic module.
5. The holding device as claimed in claim 4, wherein said force-imparting member is a pneumatic driving unit for elastically deforming said deformable member by suction, said pneumatic driving unit including a nozzle that is in fluid communication with said accommodating space in said seat, and a pneumatic controller that is connected to said nozzle.
US11/076,799 2004-09-15 2005-03-10 Holding device for holding an electronic component Abandoned US20060057886A1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
US11/353,414 US7273385B2 (en) 2004-09-15 2006-02-14 Holding device for holding a tested electronic module

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
TW093214721 2004-09-15
TW093214721U TWM267625U (en) 2004-09-15 2004-09-15 Holding apparatus of pneumatic thin-film test

Related Child Applications (1)

Application Number Title Priority Date Filing Date
US11/353,414 Continuation-In-Part US7273385B2 (en) 2004-09-15 2006-02-14 Holding device for holding a tested electronic module

Publications (1)

Publication Number Publication Date
US20060057886A1 true US20060057886A1 (en) 2006-03-16

Family

ID=36034643

Family Applications (2)

Application Number Title Priority Date Filing Date
US11/076,799 Abandoned US20060057886A1 (en) 2004-09-15 2005-03-10 Holding device for holding an electronic component
US11/353,414 Expired - Fee Related US7273385B2 (en) 2004-09-15 2006-02-14 Holding device for holding a tested electronic module

Family Applications After (1)

Application Number Title Priority Date Filing Date
US11/353,414 Expired - Fee Related US7273385B2 (en) 2004-09-15 2006-02-14 Holding device for holding a tested electronic module

Country Status (2)

Country Link
US (2) US20060057886A1 (en)
TW (1) TWM267625U (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
NO20161464A1 (en) * 2016-09-15 2017-06-26 Sevi Blue Power As Electrical connector, arrangement and method

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3090026A (en) * 1956-12-13 1963-05-14 Monroe Calculating Machine Electrical connectors
US5181853A (en) * 1990-04-18 1993-01-26 International Business Machines Corporation Fluid pressure actuated electrical connector
US5622505A (en) * 1994-10-21 1997-04-22 Japan Aviation Electronics Industry, Limited Multi-row connector comprising flexible contact sheets with insulating resilient pieces
US6071137A (en) * 1996-06-13 2000-06-06 Intel Corporation Pressure actuated zero insertion force circuit board edge connector socket

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3757219A (en) * 1971-12-15 1973-09-04 A Aksu Circuit board testing equipment
GB1508884A (en) * 1975-05-17 1978-04-26 Int Computers Ltd Apparatus for testing printed circuit board assemblies

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3090026A (en) * 1956-12-13 1963-05-14 Monroe Calculating Machine Electrical connectors
US5181853A (en) * 1990-04-18 1993-01-26 International Business Machines Corporation Fluid pressure actuated electrical connector
US5622505A (en) * 1994-10-21 1997-04-22 Japan Aviation Electronics Industry, Limited Multi-row connector comprising flexible contact sheets with insulating resilient pieces
US6071137A (en) * 1996-06-13 2000-06-06 Intel Corporation Pressure actuated zero insertion force circuit board edge connector socket

Also Published As

Publication number Publication date
US7273385B2 (en) 2007-09-25
TWM267625U (en) 2005-06-11
US20060128211A1 (en) 2006-06-15

Similar Documents

Publication Publication Date Title
WO2007057944A1 (en) Electronic component test equipment and method for loading performance board on the electronic component test equipment
JPH11248745A (en) Testing head for microstructure with interface
US7988500B2 (en) Socket and contact having anchors
CN111798775B (en) Detection device with variable space according to size of display panel
JP4045687B2 (en) IC device test carrier board
TWI400442B (en) A detection method for a detection device and a panel
US20060057886A1 (en) Holding device for holding an electronic component
CN102324655B (en) Floating power supply connector
CN108306163B (en) Fixing device
US10424986B2 (en) Actuator
JP4399863B2 (en) Holding device
US20100164524A1 (en) Zif connectors and semiconductor testing device and system using the same
JP2000164647A (en) Wafer cassette and inspection device for semiconductor integrated circuit
KR100683450B1 (en) Holding device for holding an electronic component
US20100277194A1 (en) Chip pin test apparatus
JP2010003933A (en) Flexible printed circuit board and method of holding the same in electronic apparatus
KR100759080B1 (en) A socket for testing electonic module
CN108008276B (en) Test auxiliary device for multi-channel transistor array
JP2006080337A (en) Component transferring device
JP2005283218A (en) Connector checking fixture
US7235992B2 (en) Semiconductor facility
TW554586B (en) Socket of chip scale package
KR200294815Y1 (en) The connecter of printed circuit board
US20030143889A1 (en) Electrical signal taking-out method and device therefor
CN220155518U (en) Semiconductor gold ball push-pull force test fixing device

Legal Events

Date Code Title Description
STCB Information on status: application discontinuation

Free format text: ABANDONED -- FAILURE TO RESPOND TO AN OFFICE ACTION