Classifications

• • C—CHEMISTRY; METALLURGY
  • C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
  • C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
  • C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
  • C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
  • C23C16/455—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
  • C23C16/45523—Pulsed gas flow or change of composition over time
  • C23C16/45525—Atomic layer deposition [ALD]
  • C23C16/45553—Atomic layer deposition [ALD] characterized by the use of precursors specially adapted for ALD
• • C—CHEMISTRY; METALLURGY
  • C07—ORGANIC CHEMISTRY
  • C07D—HETEROCYCLIC COMPOUNDS
  • C07D207/00—Heterocyclic compounds containing five-membered rings not condensed with other rings, with one nitrogen atom as the only ring hetero atom
  • C07D207/02—Heterocyclic compounds containing five-membered rings not condensed with other rings, with one nitrogen atom as the only ring hetero atom with only hydrogen or carbon atoms directly attached to the ring nitrogen atom
  • C07D207/30—Heterocyclic compounds containing five-membered rings not condensed with other rings, with one nitrogen atom as the only ring hetero atom with only hydrogen or carbon atoms directly attached to the ring nitrogen atom having two double bonds between ring members or between ring members and non-ring members
  • C07D207/32—Heterocyclic compounds containing five-membered rings not condensed with other rings, with one nitrogen atom as the only ring hetero atom with only hydrogen or carbon atoms directly attached to the ring nitrogen atom having two double bonds between ring members or between ring members and non-ring members with only hydrogen atoms, hydrocarbon or substituted hydrocarbon radicals, directly attached to ring carbon atoms
• • C—CHEMISTRY; METALLURGY
  • C07—ORGANIC CHEMISTRY
  • C07D—HETEROCYCLIC COMPOUNDS
  • C07D207/00—Heterocyclic compounds containing five-membered rings not condensed with other rings, with one nitrogen atom as the only ring hetero atom
  • C07D207/02—Heterocyclic compounds containing five-membered rings not condensed with other rings, with one nitrogen atom as the only ring hetero atom with only hydrogen or carbon atoms directly attached to the ring nitrogen atom
  • C07D207/30—Heterocyclic compounds containing five-membered rings not condensed with other rings, with one nitrogen atom as the only ring hetero atom with only hydrogen or carbon atoms directly attached to the ring nitrogen atom having two double bonds between ring members or between ring members and non-ring members
  • C07D207/32—Heterocyclic compounds containing five-membered rings not condensed with other rings, with one nitrogen atom as the only ring hetero atom with only hydrogen or carbon atoms directly attached to the ring nitrogen atom having two double bonds between ring members or between ring members and non-ring members with only hydrogen atoms, hydrocarbon or substituted hydrocarbon radicals, directly attached to ring carbon atoms
  • C07D207/33—Heterocyclic compounds containing five-membered rings not condensed with other rings, with one nitrogen atom as the only ring hetero atom with only hydrogen or carbon atoms directly attached to the ring nitrogen atom having two double bonds between ring members or between ring members and non-ring members with only hydrogen atoms, hydrocarbon or substituted hydrocarbon radicals, directly attached to ring carbon atoms with substituted hydrocarbon radicals, directly attached to ring carbon atoms
  • C07D207/333—Radicals substituted by oxygen or sulfur atoms
• • C—CHEMISTRY; METALLURGY
  • C07—ORGANIC CHEMISTRY
  • C07D—HETEROCYCLIC COMPOUNDS
  • C07D207/00—Heterocyclic compounds containing five-membered rings not condensed with other rings, with one nitrogen atom as the only ring hetero atom
  • C07D207/02—Heterocyclic compounds containing five-membered rings not condensed with other rings, with one nitrogen atom as the only ring hetero atom with only hydrogen or carbon atoms directly attached to the ring nitrogen atom
  • C07D207/30—Heterocyclic compounds containing five-membered rings not condensed with other rings, with one nitrogen atom as the only ring hetero atom with only hydrogen or carbon atoms directly attached to the ring nitrogen atom having two double bonds between ring members or between ring members and non-ring members
  • C07D207/32—Heterocyclic compounds containing five-membered rings not condensed with other rings, with one nitrogen atom as the only ring hetero atom with only hydrogen or carbon atoms directly attached to the ring nitrogen atom having two double bonds between ring members or between ring members and non-ring members with only hydrogen atoms, hydrocarbon or substituted hydrocarbon radicals, directly attached to ring carbon atoms
  • C07D207/33—Heterocyclic compounds containing five-membered rings not condensed with other rings, with one nitrogen atom as the only ring hetero atom with only hydrogen or carbon atoms directly attached to the ring nitrogen atom having two double bonds between ring members or between ring members and non-ring members with only hydrogen atoms, hydrocarbon or substituted hydrocarbon radicals, directly attached to ring carbon atoms with substituted hydrocarbon radicals, directly attached to ring carbon atoms
  • C07D207/335—Radicals substituted by nitrogen atoms not forming part of a nitro radical
• • C—CHEMISTRY; METALLURGY
  • C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
  • C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
  • C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
• • C—CHEMISTRY; METALLURGY
  • C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
  • C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
  • C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
  • C23C16/06—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of metallic material
  • C23C16/18—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of metallic material from metallo-organic compounds
• • C—CHEMISTRY; METALLURGY
  • C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
  • C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
  • C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
  • C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
  • C23C16/455—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
  • C23C16/45523—Pulsed gas flow or change of composition over time
  • C23C16/45525—Atomic layer deposition [ALD]

Definitions

• the present invention relates to a process for the preparation of ligands and copper complexes useful in the deposition of copper via Atomic Layer Deposition or Chemical Vapor Deposition.
• ALD Atomic Layer Deposition
• CVD Chemical Vapor Deposition
• a substrate on which the metal is to be deposited is placed in a vacuum chamber.
• a volatile metal complex is then admitted into the vacuum chamber and allowed to adsorb onto a substrate.
• the excess, unadsorbed vapor of the metal complex is then pumped or purged from the vacuum chamber.
• the adsorbed metal complex is then exposed to a second reagent, which causes the complex to react to produce metal.
• the second reagent is a reducing agent.
• Suitable copper precursor complexes for this process must be volatile enough to sublime and thermally stable in the temperature range of the process.
• the ligands themselves should preferably leave as the free ligand.
• a heated substrate is exposed to a vapor of the volatile metal complex, optionally in the presence of another reactant (a co-reactant) in the gas phase.
• the complex decomposes to metal on contact with the substrate, or reacts with the co-reactant(s) in the vicinity of the substrate, to produce a deposited metal film.
• the ligand can evolve either as volatile free ligand or be decomposed into volatile by-products.
• the metal complex must be volatile and stable enough to form a vapor phase, but unlike for ALD, must decompose on contact with the heated substrate in the absence or presence of a co-reactant under the conditions of the CVD process to give the desired film.
• Copper films formed via ALD or CVD processes are useful in many applications, including the production of electronic devices, catalytic surfaces and decorative effects.
• the present invention relates to processes for the preparation of ligands and the corresponding copper complexes, and the use of such complexes to deposit copper onto substrates.
• a first embodiment of this invention relates to a process for preparing pyrrolealdimines, comprising the steps of:
• a second embodiment of this invention is an aqueous process for preparing Cu(II) complexes of 2-pyrrolyl imino ligands comprising reacting an aqueous mixture of 2-formylpyrrole and a source of Cu(ll) with a primary amine, R 1 NH 2 , wherein
• R 1 is selected from the group consisting of C 1 -C 10 alkyl or substituted alkyl; C 6 to C 12 aryl or substituted aryl; allyl; benzyl; NHR 3 ; and NR 4 R 5 ; and
• R 3 , R 4 , and R 5 are independently selected from C 1 -C 6 alkyl or substituted alkyl and C 6 to C 12 aryl or substituted aryl.
• a third embodiment of this invention is a process for preparing Cu(II) complexes of a 2-acylpyrrole comprising:
• a fourth embodiment of this invention provides Cu(ll) complexes comprising:
• R 3 , R 4 , and R 5 are independently selected from C 1 -C 6 alkyl or substituted alkyl, and C 6 to C 12 aryl or substituted aryl;
• X is O, and R 8 is C 1 -C 10 alkyl or substituted alkyl, or C 6 to C 12 aryl or substituted aryl; or
• X is NR 1 and R 8 is H;
• R 1 is selected from the group consisting of C 1 -C 10 alkyl or substituted alkyl; C 6 to C 12 aryl or substituted aryl; allyl; benzyl; NHR 3 ; and NR 4 R 5 ; and
• R 3 , R 4 , and R 5 are independently chosen from C 1 -C 6 alkyl or substituted alkyl, and C 6 to C 12 aryl or substituted aryl.
• X is O, and R 8 is C 1 -C 10 alkyl or substituted alkyl, or C 6 to C 12 aryl or substituted aryl; or
• X is NR 1 and R 8 is H;
• R 1 is selected from the group consisting of C 1 -C 10 alkyl or substituted alkyl; C 6 to C 12 aryl or substituted aryl; allyl; benzyl; NHR 3 , and NR 4 R 5 ; and
• R 3 , R 4 , and R 5 are independently selected from C 1 -C 6 alkyl or substituted alkyl, and C 6 to C 12 aryl or substituted aryl.
• pyrrolealdimino and pyrroleketo complexes of copper are especially useful as volatile copper precursors for ALD and/or CVD processes. These complexes are air- and moisture-stable, thermally stable and volatile under ALD and/or CVD process conditions. These complexes can be decomposed in the presence of appropriate reducing agents to form copper metal.
• the pyrrolealdimino and pyrroleketo copper (II) complexes are easily prepared in good yield in aqueous media from readily available reagents.
• the pyrrolealdimine ligands can be isolated from the reaction of 2-formylpyrrole with the appropriate primary amine, and then reacted with a source of copper (II) to give the desired copper (II) complex.
• the pyrrolealdimine ligand can be made in situ, such that the pyrrolealdimino copper complex is isolated directly from the aqueous reaction mixture of 2-formylpyrrole, the primary amine and a source of copper(II).
• a preferred method for preparing the pyrrolealdimine ligands is to react 2-formylpyrrole with a primary amine in water, and then add a water-immiscible organic compound to form a two-phase system in which the pyrrolealdimine ligand is extracted into the organic phase.
• Preferred primary amines, RNH 2 are those for which R is C 1 to C 10 alkyl or substituted alkyl, or C 6 to C 12 aryl or substituted aryl.
• the preferred molar ratio of 2-formylpyrrole to primary amine is between about 1:2 and 2:1.
• Preferred temperatures are about 0° C. to about 100° C.
• Preferred water-immiscible compounds are organic solvents such as alkanes, chlorinated alkanes, cycloalkanes, and aromatic solvents.
• Especially preferred solvents include pentane, hexanes, heptanes, chloroform, dichloromethane, carbon tetrachloride, cylcopentane, cyclohexane, benzene, and toluene.
• the pyrrolealdimine ligand can be isolated from the organic solvent by conventional means and further purified, if necessary, by crystallization, sublimation or other common methods.
• the water-immiscible organic compound is a water-immiscible liquid primary amine which functions as both the reagent and the organic phase.
• the desired copper(II) complexes can also be obtained by reacting 2-formylpyrrole, a primary amine, R 1 NH 2 , and a source of copper(II) in water.
• Suitable primary amines are of the form, R 1 NH 2 , where R 1 is selected from the group comprising C 1 -C 10 alkyl or substituted alkyl; C 6 to C 12 aryl or substituted aryl; allyl; benzyl; NHR 3 ; and NR 4 R 5 , wherein R 3 , R 4 , and R 5 are independently selected from C 1 -C 6 alkyl or substituted alkyl, and C 6 to C 12 aryl or substituted aryl.
• Suitable substituent groups on the substituted alkyls and substituted aryls include F, Cl, periluoroalkyls, alkyl esters, methoxy and ethoxy groups.
• complexes containing only Cu, C, H, and N are preferred.
• the preferred molar ratio of 2-formylpyrrole to primary amine is between about 1:1 and about 1:10.
• the preferred molar ratio of copper to 2-formylpyrrole is from about 10 to I to about 1 to 10, more preferably from about 1.2 to 2.
• Preferred temperatures are about 0° C. to about 100° C., more preferably between about 20° C. and about 80° C. If the product is a solid, it may be isolated and purified by standard methods (e.g., filtration, recrystallization, sublimation, etc.). If the product is an oil, it may be isolated by decanting off the aqueous phase, and then purified by standard methods (e.g., chromatography or distillation).
• 2-formylpyrrole and a primary amine are reacted in water, and then a source of copper(II) is added and the resulting mixture is allowed to react to form the copper(II) complex. Isolation of the complex is carried out as described above.
• the synthesis of the copper pyrrolylaldimino complexes may be performed under biphasic conditions, i.e., in the presence of an organic solvent that is immiscible with water, yet capable of dissolving the desired Cu complex product.
• the Cu is complex product will be extracted, fully or partially, into the organic phase as it forms.
• the biphasic technique may be beneficial due to more efficient agitation of the reaction mixture and higher conversions after shorter reaction times.
• the desired Cu complex product can be isolated from the organic phase via conventional filtration, evaporation, and recrystallization (if necessary).
• Solvents suitable for this technique include dichloromethane, toluene, benzene, ether, alkanes, and cycloalkanes, as long as the particular complex product exhibits sufficient solubility in such media.
• the products of the reactions of 2-formylpyrrole, a primary amine, R 1 NH 2 and a source of copper(II) are bis(2-pyrrolealdimino)copper(II) complexes in which the imino nitrogen is substituted with R 1 selected from the group consisting of C 1 -C 10 alkyl or substituted alkyl; C 6 to C 12 aryl or substituted aryl; allyl; benzyl; NHR 3 ; and NR 4 R 5 ; where R 3 , R 4 , and R 5 are independently selected from C 1 -C 6 alkyl or substituted alkyl, and C 6 to C 12 aryl or substituted aryl.
• Bis(acylpyrrolyl)copper(II) complexes can be prepared by reacting an acylpyrrole and a source of copper(II) in water, followed by addition of a base.
• Suitable 2-acylpyrroles include acetylpyrrole.
• Suitable bases include NaOH, KOH, and calcium hydroxide. Freshly precipitated copper(II) hydroxide may be used in the absence of extra base.
• the 2-acylpyrroles useful in this process are readily synthesized using known procedures.
• Suitable sources of copper(II) include copper hydroxide, copper(II) chloride, copper nitrate, copper sulfate, copper(II) salts of carboxylic acids (e.g., copper acetate and copper benzoate), and copper alkoxides (e.g., copper methoxide). Either the hydrated or the anhydrous form of these copper(II) salts may be used.
• a copper(II) salt of a strong acid such as nitrate, sulfate, chloride, and bromide
• the acid which is released during the synthesis may be neutralized by addition of a base such as alkali (NaOH, KOH, Ba(OH) 2 ) or Ca(OH) 2 , or any base that can scavenge the acid while not interfering with Cu complex formation
• compositions comprising a copper atom coordinated to two bidentate pyrrole ligands.
• the pyrrole ligand has either an acyl or aldimine group in the 2-position of the pyrrole ring.
• the ligands are chosen to form a copper(II) complex that is volatile in an appropriate temperature range (typically 20° C. to 250° C.) but does not decompose in this temperature range; however, the complex decomposes to metal on addition of a suitable reducing agent.
• the ligand is further chosen so that the ligand and or products of its transformations will desorb upon exposure to a reducing agent during the atomic layer deposition process.
• the copper(II) complexes of this invention are suitable for use in ALD and CVD processes for creation of copper films for use as seed layers in formation of copper interconnects on integrated circuits or as decorative or catalytic applications.
• a substrate on which copper is to be deposited is placed in a vacuum chamber.
• At least one copper(II) complex (I) is then admitted into the vacuum chamber and allowed to adsorb onto the substrate.
• the copper complex will be added to a reactor at a temperature, time and pressure to attain a suitable fluence of complex to the surface.
• the excess, unadsorbed vapor of the copper complex is then pumped or purged from the vacuum chamber.
• the adsorbed metal complex is then exposed to a reducing reagent at a pressure of approximately 10 to 760 millitorr, which causes the complex to decompose to copper and free ligand.
• the substrate is held at a temperature between approximately 50° C. to 300° C. during reduction. Reducing agent exposure times may be from about a second to several hours.
• the ligand and/or the products of its transformation are removed by evacuation of the chamber.
• the copper film is produced when the vapor of a volatile copper(II) complex decomposes on contact with a heated substrate.
• a gas-phase reducing agent can be added with the volatile copper complex to facilitate the clean decomposition of the complex.
• the substrate is heated to approximately 100° C. to 300° C.
• the ligand and/or the products of its decomposition are removed by evacuation of the chamber or an inert gas sweep.
• Suitable substrates for the ALD and CVD processes include glass, metals and ceramics, preferably silicon wafers coated with a barrier layer such as titanium nitride or tantalum/tantalum nitride.
• Suitable reducing reagents for the ALD and CVD processes of this invention include ammonia and ammonia/hydrogen mixtures, hydrazine, CO/hydrogen mixtures, 9-BBN, borane, dihydrobenzofuran, pyrazoline, diethylsilane, dimethylsilane, ethylsilane, phenylsilane, and silane. Ammonia/hydrogen mixtures and diethylsilane are preferred.
• Preferred copper (II) complexes for use in the ALD and CVD processes of this invention include bis(2-pyrrolylaldmethylimino)copper(II), bis(2-pyrrolylaldethylimino)copper(II), bis(2-pyrrolylald-n-propylimino)copper(II), bis(2-pyrrolylaldisopropylimino)copper(II), bis(2-pyrrolylald-n-butylimino)copper(II), bis(2-pyrrolylald-t-butylimino)copper(II), bis(2-pyrrolylaldisobutylimino)copper(II), bis(2-pyrrolylaldphenylimino)copper(II), bis(2-pyrrolylald(m-trifluoromethylphenyl)imino)copper(II), bis(2-pyrrolylaldbenzylimino)copper(I
• Aqueous methylamine (40%; 4 mL) was added, with stirring, to 2-formylpyrrole (2.00 g). After stirring for I min at room temperature, a white solid formed.
• Water (25 mL) and hexanes (150 mL) were added with stirring to produce a solids-free liquid-liquid biphasic mixture. After 15 min of stirring the organic layer was separated and filtered through a short column filled with anhydrous sodium sulfate. The clear, colorless filtrate was reduced in volume to about 20 mL and kept at +5° C. overnight.
• the white crystals were collected, dried with a nitrogen flow (the compound is very volatile), and sublimed under vacuum to give 1.80 g (79%) of white 2-pyrrolealdmethylimine (identical with an authentic sample).
• This complex (m.p. 131-132° C.) was prepared similarly, using commercially available 70% aqueous EtNH 2 (1.75 mL), 2-formylpyrrole (1.50 g), and Cu (II) acetate (1.72 g) in water (50 mL).
• n-Butylamine (3.0 mL) was added, with stirring, to a mixture of 2-formylpyrrole (1.38 g) and water (25 mL). After 5 min, Cu(OAc) 2 (1.60 g) was added. The mixture was stirred at room temperature in air for 3.5 h, then water (25 mL) was added and the stirring continued for 3 more hours. The brown solid was filtered, washed with water, air-dried, and dissolved in dichloromethane. The solution was filtered and evaporated to dryness. Methanol (10 mL) was added to the residue and the dark solution was kept at about 5° C. for 4 hours.
• the 2nd batch was prepared similarly, using 2-formylpyrrole (25.0 g), CuCl 2 .2H 2 O (24.6 g) in water (200 mL), 40% aqueous methylamine (25 mL), and a solution of NaOH (16.6 g) in water (150 mL).
• the two crude products were combined and purified by Soxhlet extraction with simultaneous filtraton through silica gel in a double thimble setup.
• the product was placed in the inner thimble which was centered inside a larger thimble.
• the space in between the two thimbles was filled with silica gel. After the extraction was complete (extracts colorless) the mixture in the receiver was reduced in volume to ca.
• Bis(2-pyrrolylaldphenylimino)copper(II) (10 mg) and diethylsilane (0.2 mL) were placed in a glass tube under nitrogen. The tube was sealed and then gradually heated to 210° C. At 160-170° C. and above, copper metal formation (thin film) was noticed on the inner walls of the tube.
• a bis(2-pyrrolylaldalkylimino)copper(II) complex (3-10 mg) was placed in a glass tube.
• the tube was heated under a mixture of NH 3 and H 2 (ca. 1:1) with the temperature gradually being raised from 120° C. to 220° C.
• the formation of copper metal occurred, in the form of a thin film on the inner wall of the tube.
• Bis(2-pyrrolylaldmethylimino)copper(II) and bis(2-pyrrolylaldethylimino)copper(II) gave the best films.
• ammonia-hydrogen mixtures were superior to either pure component.
• Bis(2-acetylpyrrolyl)copper(II) underwent reduction to copper metal with ammonia-hydrogen at a slightly lower temperature, around 160° C.

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