US10957471B2 - Calibration system and calibrating method - Google Patents
Calibration system and calibrating method Download PDFInfo
- Publication number
- US10957471B2 US10957471B2 US16/232,484 US201816232484A US10957471B2 US 10957471 B2 US10957471 B2 US 10957471B2 US 201816232484 A US201816232484 A US 201816232484A US 10957471 B2 US10957471 B2 US 10957471B2
- Authority
- US
- United States
- Prior art keywords
- electrical device
- resistance
- calibration system
- lead wire
- robot
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active, expires
Links
Images
Classifications
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23F—NON-MECHANICAL REMOVAL OF METALLIC MATERIAL FROM SURFACE; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL; MULTI-STEP PROCESSES FOR SURFACE TREATMENT OF METALLIC MATERIAL INVOLVING AT LEAST ONE PROCESS PROVIDED FOR IN CLASS C23 AND AT LEAST ONE PROCESS COVERED BY SUBCLASS C21D OR C22F OR CLASS C25
- C23F1/00—Etching metallic material by chemical means
- C23F1/10—Etching compositions
- C23F1/14—Aqueous compositions
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
- G01D18/00—Testing or calibrating apparatus or arrangements provided for in groups G01D1/00 - G01D15/00
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/01—Subjecting similar articles in turn to test, e.g. "go/no-go" tests in mass production; Testing objects at points as they pass through a testing station
- G01R31/013—Testing passive components
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01C—RESISTORS
- H01C17/00—Apparatus or processes specially adapted for manufacturing resistors
- H01C17/22—Apparatus or processes specially adapted for manufacturing resistors adapted for trimming
- H01C17/24—Apparatus or processes specially adapted for manufacturing resistors adapted for trimming by removing or adding resistive material
- H01C17/2416—Apparatus or processes specially adapted for manufacturing resistors adapted for trimming by removing or adding resistive material by chemical etching
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01C—RESISTORS
- H01C17/00—Apparatus or processes specially adapted for manufacturing resistors
- H01C17/22—Apparatus or processes specially adapted for manufacturing resistors adapted for trimming
- H01C17/26—Apparatus or processes specially adapted for manufacturing resistors adapted for trimming by converting resistive material
- H01C17/265—Apparatus or processes specially adapted for manufacturing resistors adapted for trimming by converting resistive material by chemical or thermal treatment, e.g. oxydation, reduction, annealing
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23F—NON-MECHANICAL REMOVAL OF METALLIC MATERIAL FROM SURFACE; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL; MULTI-STEP PROCESSES FOR SURFACE TREATMENT OF METALLIC MATERIAL INVOLVING AT LEAST ONE PROCESS PROVIDED FOR IN CLASS C23 AND AT LEAST ONE PROCESS COVERED BY SUBCLASS C21D OR C22F OR CLASS C25
- C23F1/00—Etching metallic material by chemical means
- C23F1/08—Apparatus, e.g. for photomechanical printing surfaces
Definitions
- the present invention relates to a calibration system and, more particularly, to a calibration system adapted to calibrate a resistance of an electrical device.
- a resistance of an electrical device is required to be within a predetermined range. Improved manufacturing precision is required to ensure that the resistance of the electrical device is within the predetermined range, which increases manufacturing difficulty and cost. If the resistance of the manufactured electrical device is not within the predetermined range, the electrical device is discarded, leading to increased manufacturing waste.
- a calibration system adapted to calibrate a resistance of an electrical device having a lead wire comprises a resistance detector adapted to detect the resistance of the electrical device, a first container containing an etching solution adapted to etch the lead wire, and a heater configured to heat the electrical device. If a first resistance of the electrical device detected by the resistance detector at a first temperature is within a first predetermined range, the electrical device is heated with the heater to a second temperature higher than the first temperature. A second resistance of the electrical device is detected by the resistance detector at the second temperature. If the second resistance is beyond a second predetermined range, the lead wire is etched by the etching solution to adjust the resistance of the electrical device until the second resistance at the second temperature is within the second predetermined range.
- FIG. 1 is a perspective view of a calibration system according to an embodiment
- FIG. 2 is a top view of an electrical device according to an embodiment.
- FIGS. 1 and 2 A calibration system adapted to calibrate a resistance of an electrical device 10 , so that the resistance of the electrical device 10 meets a predetermined precision requirement, is shown in FIGS. 1 and 2 .
- the electrical device 10 has a pair of lead wires 12 exposed outside of a body 11 of the electrical device 10 .
- the electrical device 10 is adapted to be electrically connected to a circuit board by the lead wires 12 .
- the electrical device 10 is a sensor and the body 11 of the electrical device 10 is cylindrical.
- the calibration system as shown in FIG. 1 , comprises a resistance detector 400 , a first container 710 , and a heater 500 .
- the resistance detector 400 is adapted to detect the resistance of the electrical device 10 .
- the first container 710 contains an etching solution suitable for etching the lead wire 12 .
- the heater 500 is configured to heat the electrical device 10 .
- the heater 500 is a flame heater configured to heat the electrical device 10 with a flame, so that the electrical device 10 may be rapidly heated.
- the electrical device 10 is heated to a second temperature higher than the first temperature by the heater 500 , and a second resistance of the electrical device 10 at a second temperature is detected by the resistance detector 400 . If the detected second resistance is beyond a second predetermined range, the lead wire 12 is etched by the etching solution to adjust the resistance of the electrical device 10 until the second resistance of the electrical device 10 at the second temperature is within the second predetermined range.
- the first temperature is a room temperature, that is, the temperature of the natural environment in which the calibration system is located; the first temperature is less than 40° C. in an embodiment.
- the second temperature is far above the first temperature and, in an embodiment, the second temperature is above 300° C.
- the calibration system comprises a robot 100 having a first gripper 110 adapted to grip the lead wire 12 and a second gripper 120 adapted to grip the body 11 of the electrical device 10 .
- the first gripper 110 is electrically connected to the resistance detector 400 .
- the electrical device 10 is electrically connected to the resistance detector 400 via the first gripper 110 , so as to detect the resistance of the electrical device 10 by the resistance detector 400 .
- the calibration system as shown in FIG. 1 , comprises a first tray 200 , a visual system 130 , and a rotation table 300 .
- a plurality of electrical devices 10 to be calibrated are placed on the first tray 200 .
- the visual system 130 is adapted to guide the second gripper 120 to grip the body 11 of the electrical device 10 from the first tray 200 .
- the visual system 130 is a camera.
- the electrical device 10 to be gripped by the second gripper 120 is placed on the rotation table 300 .
- the rotation table 300 rotates the electrical device 10 placed thereon to a predetermined position under the guidance of the visual system 130 .
- the calibration system comprises a second container 720 containing a deionized water for cleaning the electrical device 10 .
- the robot 100 guided by the visual system 130 , grips the lead wire 12 of the electrical device 10 by the first gripper 110 and places the gripped electrical device 10 in the second container 720 to clean it and remove impurities from it.
- the robot 100 takes the gripped electrical device 10 out of the second container 720 and detects the first resistance of the electrical device 10 at the first temperature by the resistance detector 400 .
- the calibration system comprises a third container 730 containing a purified water for cleaning the electrical device 10 . If the first resistance of the electrical device 10 at the first temperature detected by the resistance detector 400 is within the first predetermined range, the robot 100 puts the gripped electrical device 10 into the third container 730 to clean it. After the electrical device 10 is cleaned by the purified water, the robot 100 moves the gripped electrical device 10 to the heater 500 and heats the electrical device 10 to the second temperature by the heater 500 . When the electrical device 10 is heated to the second temperature, the second resistance of the electrical device 10 at the second temperature is detected by the resistance detector 400 . As shown in FIG. 1 , the first container 710 , the second container 720 and the third container 730 are mounted on a common support frame 700 of the calibration system.
- the robot 100 places the gripped electrical device 10 into the first container 710 to etch the lead wire 12 of the electrical device 10 . After the lead wire 12 of the electrical device 10 is etched, the robot 100 again places the gripped electrical device 10 into the third container 730 for cleaning and again detects the first resistance of the electrical device 10 at the first temperature by the resistance detector 400 . If the detected first resistance of the electrical device 10 at the first temperature is within the first predetermined range, the robot 500 again moves the gripped electrical device 10 to the heater 500 and again heats the electrical device 10 to the second temperature by the heater 500 . When the electrical device 10 is again heated to the second temperature, the second resistance of the electrical device 10 at the second temperature is again detected by the resistance detector 400 .
- the calibration system as shown in FIG. 1 , comprises a second tray 600 on which a plurality of calibrated electrical devices 10 are adapted to be placed. If the second resistance of the electrical device 10 at the second temperature detected by the resistance detector 400 is within the second predetermined range, the robot 100 places the gripped electrical device 10 on the second tray 600 .
- the calibration system as shown in FIG. 1 , comprises a security grating 800 located at an entrance of the calibration system to detect whether an external object enters into a working area of the calibration system.
- the security grating 800 detects that the external object enters into the working area of the calibration system, the calibration system immediately stops working.
- the calibration system comprises a control cabinet 2 and a base 1 mounted on the control cabinet 2 .
- the robot 100 , the first tray 200 , the rotation table 300 , the resistance detector 400 , the heater 500 , the second tray 600 , the support frame 700 , the security grating 800 , and the visual system 130 are mounted on the base 1 .
- the control cabinet 2 has supporting feet 2 a adapted to immovably support the control cabinet 2 on the ground and rollers 2 b adapted to movably support the control cabinet 2 on the ground.
- the supporting feet 2 a are foldable. When the supporting feet 2 a are unfolded, the control cabinet 2 is immovably supported on the ground by the supporting feet 2 a . When the supporting feet 2 a are folded, the control cabinet 2 is movably supported on the ground by the rollers 2 b.
- a method for calibrating a resistance of the electrical device 10 comprises the steps of:
- a method for calibrating a resistance of the electrical device 10 comprises the steps of:
Landscapes
- Engineering & Computer Science (AREA)
- Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- General Chemical & Material Sciences (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Manufacturing & Machinery (AREA)
- General Physics & Mathematics (AREA)
- Physics & Mathematics (AREA)
- Power Engineering (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Control Of Resistance Heating (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
Abstract
Description
Claims (20)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201711444495.7A CN109974763B (en) | 2017-12-27 | 2017-12-27 | Calibration system and calibration method |
CN201711444495.7 | 2017-12-27 |
Publications (2)
Publication Number | Publication Date |
---|---|
US20190198205A1 US20190198205A1 (en) | 2019-06-27 |
US10957471B2 true US10957471B2 (en) | 2021-03-23 |
Family
ID=66768039
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
US16/232,484 Active 2039-01-16 US10957471B2 (en) | 2017-12-27 | 2018-12-26 | Calibration system and calibrating method |
Country Status (3)
Country | Link |
---|---|
US (1) | US10957471B2 (en) |
CN (1) | CN109974763B (en) |
DE (1) | DE102018251745A1 (en) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN109974763B (en) * | 2017-12-27 | 2022-03-18 | 泰科电子(上海)有限公司 | Calibration system and calibration method |
CN110473681B (en) * | 2019-08-27 | 2021-08-10 | 博敏电子股份有限公司 | Chemical fine resistance adjusting method and corrosive agent for nickel-phosphorus layer embedded resistor |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6750416B1 (en) * | 1997-07-22 | 2004-06-15 | M&R Automatisierung Von Industrieanlagen | Instrument for measuring and sorting resistors and method therefor |
US20170056931A1 (en) * | 2014-05-14 | 2017-03-02 | Tyco Electronics (Shanghai) Co. Ltd. | Automatic Distributing Equipment |
US20170057026A1 (en) * | 2014-05-14 | 2017-03-02 | Tyco Electronics (Shanghai) Co. Ltd. | Electronic Apparatus Production System |
US20180245176A1 (en) * | 2015-08-28 | 2018-08-30 | Baoshan Iron & Steel Co., Ltd. | 600 MPA Yield Strength-Graded, High-Stretchability Hot-Dip Aluminum-Zinc and Color-Coated Steel Plate and Manufacturing Method Therefor |
US20190198205A1 (en) * | 2017-12-27 | 2019-06-27 | Tyco Electronics (Shanghai) Co. Ltd. | Calibration System and Calibrating Method |
Family Cites Families (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5491182A (en) * | 1977-12-28 | 1979-07-19 | Fujitsu Ltd | Dry etching control |
DE2965028D1 (en) * | 1979-05-21 | 1983-04-21 | Bbc Brown Boveri & Cie | Method and device for trimming at least one temperature-dependent resistor |
DE3117827A1 (en) * | 1981-05-06 | 1982-11-25 | Draloric Electronic GmbH, 6000 Frankfurt | Method for producing measurement resistors for a resistance thermometer, and a device for carrying out the method |
JPS62256438A (en) * | 1986-04-30 | 1987-11-09 | Hitachi Ltd | Etching end-point control pattern |
US6970008B2 (en) * | 2003-05-21 | 2005-11-29 | All Ring Tech Co., Ltd. | Chip testing machine with rotary conveying disk set for receiving and conveying the chips for testing |
CN1328589C (en) * | 2004-02-23 | 2007-07-25 | 西安交通大学 | Semi-wave impulse current automatic testing device of pressure-sensitive resistor disc |
CN201622313U (en) * | 2010-03-30 | 2010-11-03 | 南京时恒电子科技有限公司 | Thermal resistance full-automatic test grading device |
CN103424623B (en) * | 2012-05-24 | 2016-06-01 | 宸鸿科技(厦门)有限公司 | Resistivity measurement device |
CN202815027U (en) * | 2012-10-13 | 2013-03-20 | 贵州天义电器有限责任公司 | Relay test fixture |
KR101652369B1 (en) * | 2015-01-02 | 2016-08-30 | 서울시립대학교 산학협력단 | Manufacturing method for piezoresistive pressure sensor using wet and dry etching process |
CN106623007B (en) * | 2016-11-17 | 2020-08-11 | 南阳理工学院 | Automatic photosensitive resistance test sorting machine |
-
2017
- 2017-12-27 CN CN201711444495.7A patent/CN109974763B/en active Active
-
2018
- 2018-12-26 US US16/232,484 patent/US10957471B2/en active Active
- 2018-12-27 DE DE102018251745.2A patent/DE102018251745A1/en active Pending
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6750416B1 (en) * | 1997-07-22 | 2004-06-15 | M&R Automatisierung Von Industrieanlagen | Instrument for measuring and sorting resistors and method therefor |
US20170056931A1 (en) * | 2014-05-14 | 2017-03-02 | Tyco Electronics (Shanghai) Co. Ltd. | Automatic Distributing Equipment |
US20170057026A1 (en) * | 2014-05-14 | 2017-03-02 | Tyco Electronics (Shanghai) Co. Ltd. | Electronic Apparatus Production System |
US20180245176A1 (en) * | 2015-08-28 | 2018-08-30 | Baoshan Iron & Steel Co., Ltd. | 600 MPA Yield Strength-Graded, High-Stretchability Hot-Dip Aluminum-Zinc and Color-Coated Steel Plate and Manufacturing Method Therefor |
US20190198205A1 (en) * | 2017-12-27 | 2019-06-27 | Tyco Electronics (Shanghai) Co. Ltd. | Calibration System and Calibrating Method |
Non-Patent Citations (1)
Title |
---|
"Resistance and temperature relationship" found at www.basicsofelectricalengineering.com/2018/04/relationship-between-resistance-and.html. Article published Apr. 2018. (Year: 2018). * |
Also Published As
Publication number | Publication date |
---|---|
CN109974763A (en) | 2019-07-05 |
CN109974763B (en) | 2022-03-18 |
US20190198205A1 (en) | 2019-06-27 |
DE102018251745A1 (en) | 2019-06-27 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US10957471B2 (en) | Calibration system and calibrating method | |
RU2018144294A (en) | ELECTRICALLY CONTROLLED SYSTEM GENERATING AEROSOL WITH THE MEANS OF DETECTING TUBULAR PRODUCTS GENERATING AEROSOL | |
US20100231238A1 (en) | Proximity Sensor and Rotational Operation Detecting Device | |
US10763141B2 (en) | Non-contact temperature calibration tool for a substrate support and method of using the same | |
EP3144688B1 (en) | System for placing an imaging tool in a test and measurement tool | |
US20150108202A1 (en) | Automatic Soldering System | |
JP2012533835A5 (en) | ||
WO2004025694A3 (en) | .electromagnetic radiation sensing device with integrated housing including two superimposed sensors | |
TW200921836A (en) | Jig for detecting position | |
WO2007024344A3 (en) | A field coverage configurable passive infrared radiation intrusion detection device | |
US10431482B2 (en) | Substrate conveyance robot and substrate detection method | |
KR101964567B1 (en) | Single wafer separator for semiconductor wafers | |
WO2017196540A1 (en) | Sensor based auto-calibration wafer | |
JP2017207402A5 (en) | ||
EP1220570A3 (en) | Controlling device for controlling of electrical apparatus, particularly electrical heating apparatus | |
EP1912545B1 (en) | An electric cooking appliance comprising a removable bowl | |
US10143089B2 (en) | Printing system with first and second pairs of slide elements | |
KR102149085B1 (en) | Substrate transferring-and-receiving system and substrate transferring-and-receiving method | |
US8125653B2 (en) | Apparatus and method for the determination of the position of a disk-shaped object | |
CN111095518B (en) | Substrate conveying device and method for obtaining positional relationship between robot and placement unit | |
CN102956436A (en) | Monitoring device and monitoring method for relative position of manipulator and chip to be handled in station adjusting | |
US9550310B2 (en) | Method and apparatus to test an automatic stop safety feature of a rotary saw | |
WO2010017565A3 (en) | Radiant energy imager using null switching | |
RU2018100120A (en) | METHOD OF SETTING AND TREATMENT SYSTEM DETAILS CONTAINING A SETUP MODULE | |
JP2008044047A (en) | Method for setting reference position of device carrying height, and handler device |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
AS | Assignment |
Owner name: TE CONNECTIVITY CORPORATION, PENNSYLVANIA Free format text: ASSIGNMENT OF ASSIGNORS INTEREST;ASSIGNORS:WU, HAIDONG;XIAO, HUI;LU, ROBERTO FRANCISCO-YI;AND OTHERS;SIGNING DATES FROM 20181109 TO 20181127;REEL/FRAME:047853/0180 Owner name: TYCO ELECTRONICS (SHANGHAI) CO. LTD., CHINA Free format text: ASSIGNMENT OF ASSIGNORS INTEREST;ASSIGNORS:WU, HAIDONG;XIAO, HUI;LU, ROBERTO FRANCISCO-YI;AND OTHERS;SIGNING DATES FROM 20181109 TO 20181127;REEL/FRAME:047853/0180 Owner name: KUNSHAN LEAGUE AUTOMECHANISM CO., LTD., CHINA Free format text: ASSIGNMENT OF ASSIGNORS INTEREST;ASSIGNORS:WU, HAIDONG;XIAO, HUI;LU, ROBERTO FRANCISCO-YI;AND OTHERS;SIGNING DATES FROM 20181109 TO 20181127;REEL/FRAME:047853/0180 |
|
FEPP | Fee payment procedure |
Free format text: ENTITY STATUS SET TO UNDISCOUNTED (ORIGINAL EVENT CODE: BIG.); ENTITY STATUS OF PATENT OWNER: LARGE ENTITY |
|
STPP | Information on status: patent application and granting procedure in general |
Free format text: NON FINAL ACTION MAILED |
|
STPP | Information on status: patent application and granting procedure in general |
Free format text: RESPONSE TO NON-FINAL OFFICE ACTION ENTERED AND FORWARDED TO EXAMINER |
|
STPP | Information on status: patent application and granting procedure in general |
Free format text: NON FINAL ACTION MAILED |
|
STPP | Information on status: patent application and granting procedure in general |
Free format text: RESPONSE TO NON-FINAL OFFICE ACTION ENTERED AND FORWARDED TO EXAMINER |
|
STCF | Information on status: patent grant |
Free format text: PATENTED CASE |
|
AS | Assignment |
Owner name: TE CONNECTIVITY SERVICES GMBH, SWITZERLAND Free format text: ASSIGNMENT OF ASSIGNORS INTEREST;ASSIGNOR:TE CONNECTIVITY CORPORATION;REEL/FRAME:057197/0543 Effective date: 20210617 |
|
AS | Assignment |
Owner name: TE CONNECTIVITY SOLUTIONS GMBH, SWITZERLAND Free format text: MERGER;ASSIGNOR:TE CONNECTIVITY SERVICES GMBH;REEL/FRAME:060885/0482 Effective date: 20220301 |