UA83170U - Method for production of probes of scanning tunnel electron microscopy - Google Patents

Method for production of probes of scanning tunnel electron microscopy

Info

Publication number
UA83170U
UA83170U UAU201303494U UAU201303494U UA83170U UA 83170 U UA83170 U UA 83170U UA U201303494 U UAU201303494 U UA U201303494U UA U201303494 U UAU201303494 U UA U201303494U UA 83170 U UA83170 U UA 83170U
Authority
UA
Ukraine
Prior art keywords
production
probes
electron microscopy
scanning tunnel
tunnel electron
Prior art date
Application number
UAU201303494U
Other languages
Russian (ru)
Ukrainian (uk)
Inventor
Алексей Павлович Чепугов
Сергей Алексеевич Ивахненко
Максим Александрович Цисар
Original Assignee
Институт Сверхтвердых Материалов Им. В.М.Бакуля Нан Украины
Алексей Павлович Чепугов
Сергей Алексеевич Ивахненко
Максим Александрович Цисар
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Институт Сверхтвердых Материалов Им. В.М.Бакуля Нан Украины, Алексей Павлович Чепугов, Сергей Алексеевич Ивахненко, Максим Александрович Цисар filed Critical Институт Сверхтвердых Материалов Им. В.М.Бакуля Нан Украины
Priority to UAU201303494U priority Critical patent/UA83170U/en
Publication of UA83170U publication Critical patent/UA83170U/en

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  • Crystals, And After-Treatments Of Crystals (AREA)

Abstract

A method for production of probes for scanning tunnel electron microscopy includes production of the tip of the probe with use of diamond monocrystal grown on seed with application of high pressure and temperature to the growth cell by method of temperature gradient between the source of carbon and the seed crystal. To make the tip of the probe a crystal of diamond is used that has semiconductor properties and concentration of boron admixture not less than 10cm.
UAU201303494U 2013-03-21 2013-03-21 Method for production of probes of scanning tunnel electron microscopy UA83170U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
UAU201303494U UA83170U (en) 2013-03-21 2013-03-21 Method for production of probes of scanning tunnel electron microscopy

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
UAU201303494U UA83170U (en) 2013-03-21 2013-03-21 Method for production of probes of scanning tunnel electron microscopy

Publications (1)

Publication Number Publication Date
UA83170U true UA83170U (en) 2013-08-27

Family

ID=52275416

Family Applications (1)

Application Number Title Priority Date Filing Date
UAU201303494U UA83170U (en) 2013-03-21 2013-03-21 Method for production of probes of scanning tunnel electron microscopy

Country Status (1)

Country Link
UA (1) UA83170U (en)

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