UA106938C2 - Скануючий пристрій та спосіб візуалізації шляхом зворотного розсіювання з застосуванням пучка променів - Google Patents

Скануючий пристрій та спосіб візуалізації шляхом зворотного розсіювання з застосуванням пучка променів

Info

Publication number
UA106938C2
UA106938C2 UAA201307518A UAA201307518A UA106938C2 UA 106938 C2 UA106938 C2 UA 106938C2 UA A201307518 A UAA201307518 A UA A201307518A UA A201307518 A UAA201307518 A UA A201307518A UA 106938 C2 UA106938 C2 UA 106938C2
Authority
UA
Ukraine
Prior art keywords
screen
fixed
plate
radiation
rotating
Prior art date
Application number
UAA201307518A
Other languages
English (en)
Ukrainian (uk)
Inventor
Жіціанг Чен
Юаньцзинг Лі
Зіран Жао
Їнонг Ліу
Ванлонг ВУ
Лі Жанг
Чао ТУ
Ле Танг
Їньгканг Джін
Шуо Као
Гуангвей Дінг
Original Assignee
Ньюктех Компані Лімітед
Цінхуа Юніверсіті
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ньюктех Компані Лімітед, Цінхуа Юніверсіті filed Critical Ньюктех Компані Лімітед
Publication of UA106938C2 publication Critical patent/UA106938C2/uk

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/203—Measuring back scattering
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01V—GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
    • G01V5/00—Prospecting or detecting by the use of ionising radiation, e.g. of natural or induced radioactivity
    • G01V5/20—Detecting prohibited goods, e.g. weapons, explosives, hazardous substances, contraband or smuggled objects
    • G01V5/22—Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays
    • G01V5/222—Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays measuring scattered radiation
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
    • G21K1/02—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diaphragms, collimators
    • G21K1/04—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diaphragms, collimators using variable diaphragms, shutters, choppers
    • G21K1/043—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diaphragms, collimators using variable diaphragms, shutters, choppers changing time structure of beams by mechanical means, e.g. choppers, spinning filter wheels
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/30—Accessories, mechanical or electrical features
    • G01N2223/33—Accessories, mechanical or electrical features scanning, i.e. relative motion for measurement of successive object-parts
    • G01N2223/3301—Accessories, mechanical or electrical features scanning, i.e. relative motion for measurement of successive object-parts beam is modified for scan, e.g. moving collimator

Landscapes

  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Pathology (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Immunology (AREA)
  • Health & Medical Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Life Sciences & Earth Sciences (AREA)
  • Geophysics (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Mechanical Optical Scanning Systems (AREA)
  • Measurement Of Radiation (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
UAA201307518A 2010-12-31 2011-04-28 Скануючий пристрій та спосіб візуалізації шляхом зворотного розсіювання з застосуванням пучка променів UA106938C2 (uk)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
CN201010624252.3A CN102565110B (zh) 2010-12-31 2010-12-31 一种背散射成像用射线束的扫描装置和方法
PCT/CN2011/073474 WO2012088810A1 (zh) 2010-12-31 2011-04-28 一种背散射成像用射线束的扫描装置和方法

Publications (1)

Publication Number Publication Date
UA106938C2 true UA106938C2 (uk) 2014-10-27

Family

ID=45638240

Family Applications (1)

Application Number Title Priority Date Filing Date
UAA201307518A UA106938C2 (uk) 2010-12-31 2011-04-28 Скануючий пристрій та спосіб візуалізації шляхом зворотного розсіювання з застосуванням пучка променів

Country Status (13)

Country Link
US (1) US8983033B2 (de)
EP (1) EP2573551B1 (de)
JP (1) JP5696226B2 (de)
KR (2) KR101608884B1 (de)
CN (1) CN102565110B (de)
AU (1) AU2011349928B2 (de)
BR (1) BR112013016361B1 (de)
CA (1) CA2823121C (de)
CL (1) CL2013001524A1 (de)
HK (1) HK1175238A1 (de)
RU (1) RU2532495C1 (de)
UA (1) UA106938C2 (de)
WO (1) WO2012088810A1 (de)

Families Citing this family (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103776847B (zh) * 2012-10-24 2016-04-27 清华大学 射线发射装置和成像系统
CN103901487B (zh) * 2012-12-27 2017-11-21 同方威视技术股份有限公司 人体背散射安检系统及其方法
CN103901491B (zh) * 2012-12-27 2017-10-17 同方威视技术股份有限公司 人体背散射安检系统
CN103901494B (zh) 2012-12-27 2017-08-29 同方威视技术股份有限公司 人体背散射安检系统及其方法
CN104345350A (zh) 2013-07-23 2015-02-11 清华大学 人体安全检查方法和人体安全检查系统
CN104898173B (zh) * 2014-03-07 2018-03-23 北京君和信达科技有限公司 一种飞点形成装置及设计方法
US9978471B2 (en) 2014-03-07 2018-05-22 Powerscan Company Limited Flying spot forming apparatus and design method
CN104764759B (zh) * 2015-04-01 2017-11-21 中国原子能科学研究院 一种用于x射线背散射成像系统的跳线飞点扫描装置
CN105445303B (zh) * 2015-12-29 2019-02-19 清华大学 手持式背散射成像仪及其成像方法
US10714227B2 (en) * 2016-06-06 2020-07-14 Georgetown Rail Equipment Company Rotating radiation shutter collimator
CN108072891B (zh) * 2016-11-15 2024-02-27 台山核电合营有限公司 Ams探测器校验装置
CN106841249A (zh) * 2017-04-12 2017-06-13 北京君和信达科技有限公司 透射式辐射成像系统
CN107068225B (zh) * 2017-04-13 2023-09-22 云南电网有限责任公司电力科学研究院 一种x射线无损移动检测平台射线屏蔽装置
US10748740B2 (en) 2018-08-21 2020-08-18 Fei Company X-ray and particle shield for improved vacuum conductivity
CN113884520A (zh) * 2021-09-24 2022-01-04 中国原子能科学研究院 一种用于中子散射测试样品的储存测试装置
US11972920B2 (en) 2021-11-23 2024-04-30 Fei Company Vacuum compatible X-ray shield

Family Cites Families (21)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4342914A (en) * 1980-09-29 1982-08-03 American Science And Engineering, Inc. Flying spot scanner having arbitrarily shaped field size
US4745631A (en) * 1982-12-27 1988-05-17 North American Philips Corp. Flying spot generator
EP0311177B1 (de) 1987-10-05 1993-12-15 Philips Patentverwaltung GmbH Anordnung zur Untersuchung eines Körpers mit einer Strahlenquelle
DE3829688A1 (de) * 1988-09-01 1990-03-15 Philips Patentverwaltung Anordnung zur erzeugung eines roentgen- oder gammastrahls mit geringem querschnitt und veraenderlicher richtung
DE3908966A1 (de) 1989-03-18 1990-09-20 Philips Patentverwaltung Anordnung zur erzeugung eines roentgen- oder gammastrahls mit geringem querschnitt und veraenderbarer lage
JPH0512424A (ja) * 1991-07-05 1993-01-22 Toshiba Corp 散乱線断層画像撮影装置
US5493596A (en) * 1993-11-03 1996-02-20 Annis; Martin High-energy X-ray inspection system
JPH10185842A (ja) * 1996-12-20 1998-07-14 Toshiba Fa Syst Eng Kk Ｘ線検査装置
CN1107882C (zh) * 1999-08-25 2003-05-07 沈阳师范学院 多功能工业x射线成像系统
US6272206B1 (en) * 1999-11-03 2001-08-07 Perkinelmer Detection Systems, Inc. Rotatable cylinder dual beam modulator
US20040256565A1 (en) * 2002-11-06 2004-12-23 William Adams X-ray backscatter mobile inspection van
CN2645079Y (zh) * 2003-08-22 2004-09-29 貊大卫 一种反散射式x射线扫描仪
JP2005091053A (ja) * 2003-09-12 2005-04-07 I-Bit Co Ltd Ｘ線反射波撮像装置
DE102005048519A1 (de) * 2005-10-06 2007-04-19 BAM Bundesanstalt für Materialforschung und -prüfung Brennpunktorientierte Blende
US20070172031A1 (en) * 2005-12-30 2007-07-26 Cason William R Concentric Dual Drum Raster Scanning Beam System and Method
CN200941097Y (zh) * 2006-07-27 2007-08-29 上海英迈吉东影图像设备有限公司 一种具有x射线背散射和断层扫描的成像装置
CN201173903Y (zh) * 2008-03-14 2008-12-31 王经瑾 跳点扫描辐射成像装置
US8532259B2 (en) * 2008-04-17 2013-09-10 University Of Florida Research Foundation, Inc. Method and apparatus for computed imaging backscatter radiography
CN201285377Y (zh) 2008-08-05 2009-08-05 同方威视技术股份有限公司 背散射成像用射线束扫描装置
CN101644687A (zh) * 2008-08-05 2010-02-10 同方威视技术股份有限公司 背散射成像用射线束扫描方法和装置
CN202013328U (zh) * 2010-12-31 2011-10-19 同方威视技术股份有限公司 一种背散射成像用射线束的扫描装置

Also Published As

Publication number Publication date
RU2532495C1 (ru) 2014-11-10
KR20150048916A (ko) 2015-05-07
EP2573551A4 (de) 2014-04-23
JP5696226B2 (ja) 2015-04-08
WO2012088810A1 (zh) 2012-07-05
EP2573551B1 (de) 2019-11-13
CA2823121A1 (en) 2012-07-05
CA2823121C (en) 2017-08-22
CN102565110B (zh) 2015-04-01
US8983033B2 (en) 2015-03-17
CL2013001524A1 (es) 2014-04-11
BR112013016361B1 (pt) 2020-03-31
EP2573551A1 (de) 2013-03-27
JP2014500507A (ja) 2014-01-09
HK1175238A1 (en) 2013-06-28
AU2011349928B2 (en) 2014-09-04
BR112013016361A2 (pt) 2019-01-08
US20120170716A1 (en) 2012-07-05
KR20140052932A (ko) 2014-05-07
CN102565110A (zh) 2012-07-11
KR101608884B1 (ko) 2016-04-04

Similar Documents

Publication Publication Date Title
UA106938C2 (uk) Скануючий пристрій та спосіб візуалізації шляхом зворотного розсіювання з застосуванням пучка променів
WO2012168322A3 (en) Dual-resolution 3d scanner
GB201303509D0 (en) Optically variable device
WO2012107720A3 (en) Radiation imaging apparatus
McManamy et al. Spallation neutron source target imaging system operation
CN205251569U (zh) 一种限束器安装结构
Brannon et al. Measuring Optical Thickness and Geometric Effects in Flare Ribbon Plasma with Si IV Spectral Lines as Observed by IRIS
Ghavamian COS G140L Optics Alignment and Focus
McBride et al. The Simultaneous Combination of Phase Contrast Imaging with In Situ X-ray diffraction from Shock Compressed Matter
Johnston et al. High Resolution Optical Scans of Pixelated Silicon Avalanche Photodiodes
Golubaev et al. Preliminary Results of the Observations of a Meteor Shower of Comet C/2012 s1 (ison) in January 2014
Mandell et al. Investigating small-scale edge turbulence with the NSTX-U GPI diagnostic
Caratti o Garatti et al. Massive Jets from High-Mass YSOs
Nagel et al. Temporally Resolved Measurement of X-ray Radiation using DIXI, a Pulse-dilation Enhanced Gated Framing Camera
Funda Bostanci et al. Fourier analysis of chromospheric fine structures in two different regions
WO2012156521A3 (de) Handscanner und diesen umfassendes kommissioniersystem
Lockwood CCD Sparse Field CTE Internal
Biretta et al. MAMA NUV Flats
Pöhler et al. Quantification of Coastal Macro Algae Iodine Emissions and its Spatial Variability at the West Coast of Ireland
Singh et al. VHE pulsar observations with HAGAR telescope array
Willingale A Bright Source Defocusing Optic for IXO
Qiang et al. C 2 H, HC 3 N and HNC observations in OMC-2/3
Anada et al. Suzaku observation of the unidentified VHE gamma-ray source HESS J1837-069
Antoci et al. Flares in A-type stars?
Miller Direct detection of X-ray reverberation in nearby AGN