TWM593648U - Flip-transfer device and surface inspection equipment - Google Patents

Flip-transfer device and surface inspection equipment Download PDF

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Publication number
TWM593648U
TWM593648U TW108217522U TW108217522U TWM593648U TW M593648 U TWM593648 U TW M593648U TW 108217522 U TW108217522 U TW 108217522U TW 108217522 U TW108217522 U TW 108217522U TW M593648 U TWM593648 U TW M593648U
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Taiwan
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detection
flip
detection unit
transfer device
turntable
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TW108217522U
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Chinese (zh)
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游坦穎
張維哲
陳立揚
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致茂電子股份有限公司
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Priority to TW108217522U priority Critical patent/TWM593648U/en
Publication of TWM593648U publication Critical patent/TWM593648U/en

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Abstract

本創作係揭露一種翻面移載裝置,用於表面檢測設備中以對待測物進行翻面,翻面移載裝置包含水平導軌、垂直導軌、基座、旋轉單元及翻轉單元,垂直導軌可水平移動地設置於水平導軌上;基座可垂直移動地設置於垂直導軌上;旋轉單元設置於基座上,用於暫時地拿取待測物並使待測物在水平面上旋轉第一角度;翻轉單元設置於基座上,用於暫時地拿取待測物並使待測物在垂直面上翻轉180度。The present invention discloses a flip transfer device, which is used in surface inspection equipment to flip the object to be measured. The flip transfer device includes a horizontal rail, a vertical rail, a base, a rotating unit and a flip unit. The vertical rail can be horizontal It is movably arranged on the horizontal guide rail; the base is vertically movable on the vertical guide rail; the rotating unit is arranged on the base for temporarily taking the object to be measured and rotating the object to the first angle on the horizontal plane; The reversing unit is provided on the base and is used to temporarily take the object to be tested and turn the object to be turned 180 degrees on the vertical plane.

Description

翻面移載裝置及表面檢測設備Overturning transfer device and surface detection equipment

本創作係關於一種翻面移載裝置及表面檢測設備,其係用於檢測例如具有六面體之待測物的所有表面。This creation relates to a flip transfer device and surface detection equipment, which are used to detect all surfaces of a test object having a hexahedron, for example.

六面體待測物的表面檢測,係由於其形狀的因素,導致一般表面檢測設備上需要配置翻面的裝置,以使待測物的反面朝上,始能以光學檢測裝置檢測待測物的各個表面。The surface detection of the hexahedral object to be measured is due to its shape factor, so that the general surface inspection equipment needs to be equipped with a flip device so that the opposite side of the object to be measured is facing upwards, and the object can be detected by the optical detection device The various surfaces.

現有的表面檢測裝置中,大部分係採用機械手臂與夾具來夾持住待測物後,再翻轉待測物。然而,較為脆弱或無法受壓的待測物,例如鋰電池等,則無法承受夾具的夾持,致使目前例如鋰電池或其他類似物的表面檢測,皆是以人工檢測來完成。Most of the existing surface detection devices use a mechanical arm and a jig to hold the object to be measured, and then turn the object to be tested. However, the relatively weak or incompressible test objects, such as lithium batteries, cannot withstand the gripping of the fixture, so that the current surface inspection of lithium batteries or other similar objects is performed manually.

如此,習知檢測鋰電池或類似物表面的方式,存在不方便、耗費人力、不準確以及品管品質不一的缺點。In this way, the conventional methods of detecting the surface of lithium batteries or the like have the disadvantages of inconvenience, labor-consuming, inaccuracy, and inconsistent quality control.

為了克服現有技術的不足,本創作的一目的在於提供一種可檢測待測物之表面檢測設備及配置於該表面檢測設備內的翻面移載裝置。In order to overcome the shortcomings of the prior art, an object of the present invention is to provide a surface detection device capable of detecting an object to be measured and a flip transfer device arranged in the surface detection device.

為達上述目的或其他目的,本創作係揭露一種翻面移載裝置,用於表面檢測設備中以對待測物進行翻面,該翻面移載裝置包含一水平導軌、一垂直導軌、一基座、一旋轉單元及一翻轉單元,該垂直導軌可水平移動地設置於該水平導軌上;該基座可垂直移動地設置於該垂直導軌上;該旋轉單元設置於該基座的一端上,用於暫時地拿取該待測物並使該待測物在一水平面上旋轉一第一角度;該翻轉單元設置於該基座的另一端上,用於暫時地拿取該待測物並使該待測物在一垂直面上翻轉180度。In order to achieve the above purpose or other purposes, the present invention discloses a flip transfer device used in surface inspection equipment to flip the object to be measured. The flip transfer device includes a horizontal rail, a vertical rail, and a base A base, a rotating unit and a turning unit, the vertical guide rail is horizontally movable on the horizontal guide rail; the base is vertically movable on the vertical rail; the rotating unit is installed on one end of the base, It is used to temporarily take the object to be tested and rotate the object to be tested by a first angle on a horizontal plane; the turning unit is provided on the other end of the base for temporarily taking the object to be tested and Turn the object to be measured 180 degrees on a vertical plane.

於本創作的一實施例中,該旋轉單元係包含一第一迴轉氣缸及一第一吸盤,該第一迴轉氣缸設置於該基座上,該第一吸盤係設置於該第一迴轉氣缸的轉動軸上並用於吸附該待測物。In an embodiment of the present invention, the rotating unit includes a first rotary cylinder and a first suction cup, the first rotary cylinder is disposed on the base, and the first suction cup is disposed on the first rotary cylinder Rotate on the shaft and used to attract the test object.

於本創作的一實施例中,該翻轉單元係包含一第二迴轉氣缸及一第二吸盤,該第二迴轉氣缸設置於該基座上,該第二吸盤係設置於該第二迴轉氣缸的轉動軸上並用於吸附該待測物,該第二迴轉氣缸的轉動軸係垂直該第一迴轉氣缸的轉動軸。In an embodiment of the present invention, the turning unit includes a second rotary cylinder and a second suction cup, the second rotary cylinder is disposed on the base, and the second suction cup is disposed on the second rotary cylinder The rotating shaft is used to attract the object to be measured, and the rotating shaft of the second rotating cylinder is perpendicular to the rotating shaft of the first rotating cylinder.

於本創作的一實施例中,該第一角度為180度。In an embodiment of the present creation, the first angle is 180 degrees.

於本創作的一實施例中,該第一迴轉氣缸與該第二迴轉氣缸係被驅動為同時作動。In an embodiment of the present invention, the first rotary cylinder and the second rotary cylinder are driven to operate simultaneously.

為達上述目的或其他目的,本創作復揭露一種表面檢測設備,用於檢測待測物的表面,包含一第一檢測單元、一第二檢測單元及翻面移載裝置,該第一檢測單元包括一第一轉軸、以該第一轉軸為中心轉動之一第一轉盤及複數個第一光學檢測模組,該第一檢測單元配置有供該第一轉盤旋轉通過的複數個第一檢測位置,該等第一光學檢測模組相對於各該第一檢測位置而配置,用以當該待測物到達該等第一檢測位置時檢測該待測物的至少其中三個表面;該第二檢測單元包括一第二轉軸、以該第二轉軸為中心轉動之一第二轉盤及複數個第二光學檢測模組,該第二檢測單元配置有供該第二轉盤旋轉通過的複數個第二檢測位置,該等第二光學檢測模組被相對各該第二檢測位置地配置,用以當該待測物到達該等第二檢測位置時檢測該待測物的至少其中另三個表面;該翻面移載裝置設置於該第一檢測單元與該第二檢測單元之間,該待測物係經由該翻面移載裝置被從該第一檢測單元移至該第二檢測單元。In order to achieve the above purpose or other purposes, the present invention discloses a surface detection device for detecting the surface of an object to be measured, including a first detection unit, a second detection unit and a flip transfer device, the first detection unit It includes a first rotation shaft, a first turntable rotating around the first rotation shaft as the center and a plurality of first optical detection modules, the first detection unit is configured with a plurality of first detection positions for the first turntable to rotate through , The first optical detection modules are disposed relative to each of the first detection positions to detect at least three surfaces of the object to be tested when the object to be detected reaches the first detection positions; the second The detection unit includes a second rotation shaft, a second turntable rotating around the second rotation shaft as the center, and a plurality of second optical detection modules. The second detection unit is provided with a plurality of second rotation shafts through which the second turntable rotates Detection positions, the second optical detection modules are arranged relative to each second detection position, and are used for detecting at least three other surfaces of the test object when the test object reaches the second detection positions; The flip transfer device is disposed between the first detection unit and the second detection unit, and the object to be tested is moved from the first detection unit to the second detection unit via the flip transfer device.

於本創作的一實施例中, 該翻面移載裝置更包含一暫存平台,且該第一檢測單元係具有一第一移載位置,該第二檢測單元具有一第二移載位置,該第一移載位置、該暫存平台與該第二移載位置係位在一直線路徑上。In an embodiment of the present invention, the flip transfer device further includes a temporary storage platform, and the first detection unit has a first transfer position, and the second detection unit has a second transfer position, The first transfer position, the temporary storage platform and the second transfer position are located on a straight path.

於本創作的一實施例中, 每一第一光學檢測模組及每一第二光學檢測模組係各自包括一頂部表面檢測器及一側部表面檢測器。In an embodiment of the present invention, each first optical detection module and each second optical detection module each include a top surface detector and a side surface detector.

於本創作的一實施例中,每一側部表面檢測器係具有二鏡頭,該二鏡頭被配置在垂直於該第一轉盤之表面的一平面上或被配置在垂直於該第二轉盤之表面的一平面上,且每一側部表面檢測器的該二鏡頭的取像方向係被以相對該第一轉盤或該第二轉盤呈小於90度地配置。In an embodiment of the present invention, each side surface detector has two lenses arranged on a plane perpendicular to the surface of the first turntable or on a surface perpendicular to the second turntable On a plane of the surface, and the imaging directions of the two lenses of each side surface detector are arranged to be less than 90 degrees relative to the first turntable or the second turntable.

於本創作的一實施例中,該第一檢測單元係具有二個第一檢測位置,該第二檢測單元係具有二個第二檢測位置。In an embodiment of the present invention, the first detection unit has two first detection positions, and the second detection unit has two second detection positions.

藉此,本創作實施例之表面檢測設備,係藉由翻面移載裝置的配置,而可輕易地將待測物進行旋轉與翻轉,並藉由該第一檢測單元與該第二檢測單元上的轉盤及光學檢測組件的配置,使得待測物的六個面可以被依序完成所有表面的瑕疵檢測,藉以達到自動化表面檢測的功能。In this way, the surface detection device of this creative embodiment can easily rotate and flip the object to be measured by the configuration of the flip transfer device, and by the first detection unit and the second detection unit The configuration of the turntable and the optical inspection component on the top allows the six surfaces of the object to be tested to be sequentially inspected for defects on all surfaces, thereby achieving the function of automated surface inspection.

為充分瞭解本創作之目的、特徵及功效,茲藉由下述具體之實施例,並配合所附之圖式,對本創作做一詳細說明,說明如後:In order to fully understand the purpose, characteristics and effects of this creation, the following specific examples and the accompanying drawings are used to explain this creation in detail, as follows:

於本文中,所描述之用語「包含、包括、具有」或其他任何類似用語意係非僅限於本文所列出的此等要件而已,而是可包括未明確列出但卻是部件、單元或裝置中通常固有的其他要件。In this article, the terms "include, include, have" or any other similar meanings are not limited to the elements listed in this article, but may include components, units or components that are not explicitly listed Other requirements usually inherent in the device.

於本文中,在不相衝突的前提下,所描述的各實施例之間或各技術特徵之間係可以任意組合形成新的實施例。In this article, under the premise of no conflict, the described embodiments or the technical features can be combined in any combination to form new embodiments.

本創作實施例係主要相關於一種用於檢測待測物的表面檢測設備,其係為了確保待測物表面是否存在例如凹陷、凸起、破洞、皺褶、汙染、或是印刷模糊等表面瑕疵。This creative embodiment is mainly related to a surface detection device for detecting a test object, which is to ensure whether there is a surface such as a dent, bump, hole, wrinkle, pollution, or printing blur on the surface of the test object defect.

請同時參閱圖1及圖2,圖1係為本創作實施例之表面檢測設備的俯視示意圖;圖2係為本創作實施例之表面檢測設備的側視示意圖。為了清楚顯示及方便說明,圖中省略了部分支架或固定座等結構。Please refer to FIG. 1 and FIG. 2 at the same time. FIG. 1 is a schematic top view of the surface inspection device of the creative embodiment; FIG. 2 is a schematic side view of the surface inspection device of the creative embodiment. For the sake of clear display and convenient explanation, some structures such as brackets or fixing seats are omitted in the figure.

本創作實施例之表面檢測設備係用於檢測一種待測物10的表面,該待測物10外形形態為六面體,例如為通常呈現片體外形的鋰電池等。該表面檢測設備包含一第一檢測單元100、一第二檢測單元200及一翻面移載裝置300。The surface detection device of this creative embodiment is used to detect the surface of an object 10 to be tested. The shape of the object 10 to be tested is a hexahedron, for example, a lithium battery that usually exhibits the shape of a sheet. The surface detection device includes a first detection unit 100, a second detection unit 200, and a flip transfer device 300.

該第一檢測單元100可包括一第一轉軸110、以該第一轉軸110為中心轉動之一第一轉盤120及複數個第一光學檢測模組130。該第一檢測單元100配置有供該第一轉盤110旋轉通過的複數個第一檢測位置140A,140B。該等第一光學檢測模組130相對於各該第一檢測位置140A,140B而配置,用以當承載於該第一轉盤120上的該待測物10被運送到達該等第一檢測位置140A,140B時,檢測該待測物10的至少其中三個表面。The first detection unit 100 may include a first rotation shaft 110, a first turntable 120 rotating around the first rotation shaft 110 and a plurality of first optical detection modules 130. The first detection unit 100 is configured with a plurality of first detection positions 140A, 140B for the first turntable 110 to rotate through. The first optical detection modules 130 are disposed relative to each of the first detection positions 140A, 140B, and are used to reach the first detection positions 140A when the object to be tested 10 carried on the first turntable 120 is transported At 140B, at least three surfaces of the test object 10 are detected.

該第二檢測單元200係可包括一第二轉軸210、以該第二轉軸210為中心轉動之一第二轉盤220及複數個第二光學檢測模組230。該第二檢測單元200配置有供該第二轉盤220旋轉通過的複數個第二檢測位置240A,240B。該等第二光學檢測模組230相對於各該第二檢測位置240A,240B而配置,用以當承載於該第二轉盤220上的該待測物10被運送到達該等第二檢測位置240A,240B時檢測該待測物10的至少其中另三個表面。The second detection unit 200 may include a second rotation shaft 210, a second turntable 220 rotating around the second rotation shaft 210 and a plurality of second optical detection modules 230. The second detection unit 200 is configured with a plurality of second detection positions 240A, 240B through which the second turntable 220 rotates. The second optical detection modules 230 are disposed relative to each of the second detection positions 240A, 240B, and are used to transport the test object 10 carried on the second turntable 220 to the second detection positions 240A At 240B, at least three other surfaces of the object 10 are detected.

該翻面移載裝置300係可設置於該第一檢測單元100與該第二檢測單元200之間,該翻面移載裝置300係用於表面檢測設備中以對待測物10進行翻面。該翻面移載裝置300包含一水平導軌310、一垂直導軌320、一基座330、一旋轉單元340及一翻轉單元350。該垂直導軌320係可水平移動地設置於該水平導軌310上,該基座330係可垂直移動地設置於該垂直導軌320上。該旋轉單元340設置於該基座330的一端上,用於暫時地拿取該待測物10並使該待測物10在一水平面上旋轉一第一角度。該翻轉單元350設置於該基座330的另一端上,用於暫時地拿取該待測物10並使該待測物10在一垂直面上翻轉180度。The flip transfer device 300 can be disposed between the first detection unit 100 and the second detection unit 200. The flip transfer device 300 is used in a surface inspection device to flip the object 10. The flip transfer device 300 includes a horizontal rail 310, a vertical rail 320, a base 330, a rotation unit 340, and a flip unit 350. The vertical rail 320 is horizontally movable on the horizontal rail 310, and the base 330 is vertically movable on the vertical rail 320. The rotating unit 340 is disposed on one end of the base 330 to temporarily take the object to be measured 10 and rotate the object to be measured 10 at a first angle on a horizontal plane. The reversing unit 350 is disposed on the other end of the base 330 for temporarily taking the object to be measured 10 and turning the object to be tested 180 degrees on a vertical plane.

據此,該待測物10係可經由該翻面移載裝置300從該第一檢測單元100被輸送移動至該第二檢測單元200,且該待測物10被旋轉與翻轉,以使尚未被該第一檢測單元100檢測的表面可被該第二檢測單元200檢測,進而完成該待測物10上六個面的檢測。According to this, the object to be tested 10 can be transported and moved from the first detection unit 100 to the second detection unit 200 via the flip transfer device 300, and the object to be tested 10 is rotated and turned over so that The surface detected by the first detection unit 100 can be detected by the second detection unit 200 to complete the detection of the six surfaces on the object to be measured 10.

本實施例之翻面移載裝置300可藉由更包含一暫存平台360來協助該待測物10的翻轉。該暫存平台360係設置於該第一檢測單元100與該第二檢測單元200之間,其具有一檯面供該待測物10被該旋轉單元340旋轉後暫時地置放,以供之後再被該翻轉單元350拿取來進行翻轉。該第一檢測單元100係可具有一第一移載位置150,該第二檢測單元200具有一第二移載位置250。該第一移載位置150、該暫存平台360與該第二移載位置250較佳地係配置在一直線路徑上,所述之直線路徑係指該待測物10從該第一移載位置150移動至該第二移載位置250的路徑係大致呈直線(如圖1)。The flip transfer device 300 of this embodiment may further include a temporary storage platform 360 to assist the flip of the object to be measured 10. The temporary storage platform 360 is disposed between the first detection unit 100 and the second detection unit 200, and has a table for the test object 10 to be temporarily placed after being rotated by the rotation unit 340 for later It is picked up by the turning unit 350 and turned over. The first detection unit 100 may have a first transfer position 150, and the second detection unit 200 has a second transfer position 250. The first transfer position 150, the temporary storage platform 360 and the second transfer position 250 are preferably arranged on a linear path, the linear path refers to the object 10 to be tested from the first transfer position The path from 150 to the second transfer position 250 is substantially straight (see FIG. 1).

本實施例中,如圖2所示,該旋轉單元340係可包含一第一迴轉氣缸341及一第一吸盤342。該第一迴轉氣缸341設置於該基座330上。該第一吸盤342係設置於該第一迴轉氣缸341的轉動軸上並用於暫時地吸附該待測物10,該第一迴轉氣缸341待該第一吸盤342吸取該待測物10之後被驅動,而使該第一吸盤342與該待測物10轉動。該第一迴轉氣缸341的轉動軸係為垂直,該待測物10係被帶動於一水平面上轉動。較佳地是,該第一角度為180度,即該待測物係被旋轉180度,而使其四個側面變換相對於該翻面移載裝置300的方向。In this embodiment, as shown in FIG. 2, the rotating unit 340 may include a first rotary cylinder 341 and a first suction cup 342. The first rotary cylinder 341 is disposed on the base 330. The first suction cup 342 is disposed on the rotating shaft of the first rotary cylinder 341 and is used to temporarily adsorb the object to be measured 10. The first rotary cylinder 341 is driven after the first suction cup 342 absorbs the object to be tested 10 To rotate the first suction cup 342 and the object to be measured 10. The rotation axis of the first rotary cylinder 341 is vertical, and the object to be measured 10 is driven to rotate on a horizontal plane. Preferably, the first angle is 180 degrees, that is, the object to be measured is rotated by 180 degrees, so that its four sides change the direction relative to the flip transfer device 300.

該翻轉單元350係可包含一第二迴轉氣缸351及一第二吸盤352。該第二迴轉氣缸351設置於該基座330上。該第二吸盤352係設置於該第二迴轉氣缸351的轉動軸上並用於暫時地吸附該待測物10,該第二迴轉氣缸351待該第二吸盤352吸取該待測物10之後被驅動,而使該第二吸盤352與該待測物10轉動。該第二迴轉氣缸351的轉動軸係垂直該第一迴轉氣缸341的轉動軸,該待測物10係被帶動於一垂直面上轉動180度。所述垂直面係可例如為垂直於該暫存平台360且平行該水平導軌310的面,使得該待測物10的頂部與底部變換相對於該翻面移載裝置300的方向,讓第一檢測單元100尚未檢測到的反面可以被朝上。同時,使在第一檢測單元100中,原本處於遠離該第一轉軸110的位置並已被檢測過的側面,經翻轉後,在第二檢測單元200中就可面向該第二轉軸210,以及使得在該第一檢測單元100中面向該第一轉軸110且尚未被檢測過的側面,可以處於遠離該第二轉軸210的位置並面向該等光學檢測模組230。The turning unit 350 may include a second rotary cylinder 351 and a second suction cup 352. The second rotary cylinder 351 is disposed on the base 330. The second suction cup 352 is disposed on the rotating shaft of the second rotary cylinder 351 and is used to temporarily adsorb the object to be measured 10. The second rotary cylinder 351 is driven after the second suction cup 352 absorbs the object to be tested 10 To rotate the second suction cup 352 and the object to be measured 10. The rotation axis of the second rotary cylinder 351 is perpendicular to the rotation axis of the first rotary cylinder 341, and the object to be measured 10 is driven to rotate 180 degrees on a vertical plane. The vertical plane may be, for example, a plane perpendicular to the temporary storage platform 360 and parallel to the horizontal guide rail 310, so that the top and bottom of the object to be tested 10 change direction relative to the flip transfer device 300, allowing the first The reverse side that the detection unit 100 has not yet detected may be directed upward. At the same time, in the first detection unit 100, the side that has been detected away from the first rotating shaft 110 and turned over can face the second rotating shaft 210 in the second detecting unit 200, and Therefore, the side of the first detection unit 100 that faces the first rotating shaft 110 and has not been detected can be located away from the second rotating shaft 210 and facing the optical detection modules 230.

本實施例中,該第一迴轉氣缸341與該第二迴轉氣缸351係較佳地是同時作動。據此,該翻面移載裝置300一趟的行程(由該第一檢測單元100移至該第二檢測單元200)完成時,可以有一個待測物10從該第一移載位置150被移至該暫存平台360,同時間有另一個待測物10被從該暫存平台360移至該第二移載位置250。In this embodiment, the first rotary cylinder 341 and the second rotary cylinder 351 preferably operate simultaneously. According to this, when the trip of the flip transfer device 300 (moving from the first detection unit 100 to the second detection unit 200) is completed, a test object 10 can be removed from the first transfer position 150 Move to the temporary storage platform 360, and at the same time, another object to be tested 10 is moved from the temporary storage platform 360 to the second transfer location 250.

該翻面移載裝置300運作時,該基座330係藉由該水平導軌310與該垂直導軌320進行水平與垂直的移動,而使該旋轉單元340的該第一吸盤342對應至該第一移載位置150上的該待測物10。隨後,該第一吸盤342被啟動並吸附該待測物10朝上的正面,該基座330被驅動以藉由該垂直導軌320上升。接著,該第一迴轉氣缸341啟動,使該第一吸盤342與該待測物10於該水平面上被一同旋轉180度。再接著,該基座330被驅動以藉由該水平導軌310移動,使該旋轉單元340到達該暫存平台360,該第一吸盤342關閉而使該待測物10可被放置於該暫存平台360上。When the flip transfer device 300 is in operation, the base 330 is horizontally and vertically moved by the horizontal rail 310 and the vertical rail 320, so that the first suction cup 342 of the rotating unit 340 corresponds to the first Transfer the test object 10 on the loading position 150. Subsequently, the first suction cup 342 is activated and attracts the front side of the object to be tested 10 facing upward, and the base 330 is driven to rise by the vertical rail 320. Next, the first rotary cylinder 341 is started, so that the first suction cup 342 and the object to be measured 10 are rotated 180 degrees together on the horizontal plane. Then, the base 330 is driven to move by the horizontal guide rail 310, so that the rotation unit 340 reaches the temporary storage platform 360, the first suction cup 342 is closed, and the object 10 can be placed in the temporary storage On platform 360.

緊接著,該基座330係藉由該水平導軌310與該垂直導軌320進行水平與垂直的移動,而使該翻轉單元350的該第二吸盤352對應至暫存平台360上的該待測物10。位置對應後,該第二吸盤352被啟動並吸附該待測物10朝上的正面,該基座330被驅動以藉由該垂直導軌320上升。接著,該第二迴轉氣缸351啟動,使該第二吸盤352與該待測物10於該垂直面上被一同翻轉180度。再接著,該基座330被驅動以藉由該水平導軌310移動後,使該翻轉單元350到達該第二移載位置250,該第二吸盤352關閉而使該待測物10可被放置於該第二移載位置250上。Next, the base 330 moves the horizontal rail 310 and the vertical rail 320 horizontally and vertically, so that the second suction cup 352 of the turning unit 350 corresponds to the object to be tested on the temporary storage platform 360 10. After the position is matched, the second suction cup 352 is activated and attracts the front side of the object to be measured 10 upward, and the base 330 is driven to rise by the vertical guide rail 320. Next, the second rotary cylinder 351 is started, so that the second suction cup 352 and the object to be tested 10 are turned 180 degrees together on the vertical plane. Then, after the base 330 is driven to move by the horizontal guide rail 310, the turning unit 350 reaches the second transfer position 250, and the second suction cup 352 is closed so that the object 10 can be placed in The second transfer position 250 is on.

每一第一光學檢測模組130係包括一頂部表面檢測器131A,131B及一側部表面檢測器132A,132B。該頂部表面檢測器131A,131B係配置於該等第一檢測位置140A,140B的上方並朝向該等第一檢測位置140A,140B。該側部表面檢測器132A,132B係配置於該等第一檢測位置140A,140B的一側並朝向該等第一檢測位置140A,140B。每一第二光學檢測模組230係包括一頂部表面檢測器231A,231B及一側部表面檢測器232A,232B,該頂部表面檢測器232A,232B係配置於該等第二檢測位置240A,240B的上方並朝向該等第二檢測位置240A,240B,該側部表面檢測器232A,232B係配置於該等第二檢測位置240A,240B的一側並朝向該等第二檢測位置240A,240B。Each first optical detection module 130 includes a top surface detector 131A, 131B and a side surface detector 132A, 132B. The top surface detectors 131A, 131B are disposed above the first detection positions 140A, 140B and face the first detection positions 140A, 140B. The side surface detectors 132A, 132B are disposed on one side of the first detection positions 140A, 140B and face the first detection positions 140A, 140B. Each second optical detection module 230 includes a top surface detector 231A, 231B and a side surface detector 232A, 232B. The top surface detector 232A, 232B is disposed at the second detection positions 240A, 240B Above and toward the second detection positions 240A, 240B. The side surface detectors 232A, 232B are disposed on one side of the second detection positions 240A, 240B and face the second detection positions 240A, 240B.

於本實施例中,如圖1所示,該第一檢測單元100係具有二個第一檢測位置140A,140B,其配置成由一個第一檢測位置140A到達另一個第一檢測位置140B係呈現為該第一轉盤120被順時針旋轉90度的方式,亦即被配置為位在該第一轉盤120的不同徑向方向上。該第二檢測單元200係具有二個第二檢測位置240A,240B,其配置成由一個第二檢測位置240A到達另一個第二檢測位置240B係呈現為該第二轉盤220被逆時針旋轉90度的方式,亦即被配置為位在該第二轉盤220的不同徑向方向上。然而,第一檢測位置與第二檢測位置的數量並不限於此,此係可依據檢測項目的種類或多寡、光學組件的種類或多寡等因素而變化設計。In this embodiment, as shown in FIG. 1, the first detection unit 100 has two first detection positions 140A, 140B, which are configured to be presented from one first detection position 140A to another first detection position 140B The first turntable 120 is rotated clockwise by 90 degrees, that is, it is configured to be located in different radial directions of the first turntable 120. The second detection unit 200 has two second detection positions 240A, 240B, which are configured to reach the second detection position 240B from one second detection position 240A, the second turntable 220 is rotated 90 degrees counterclockwise Is configured to be located in different radial directions of the second turntable 220. However, the number of the first detection position and the second detection position is not limited to this, and this can be changed and designed according to factors such as the type or number of detection items, the type or number of optical components, and so on.

如圖1及2所示,在一個第一檢測位置140A時,該待測物10朝上的面(定義為正面)及長邊側面係可被檢測;而在另一個第一檢測位置140B時,該待測物10朝上的面(即正面)及短邊側面係可被檢測。另一方面,在一個第二檢測位置240A時,該待測物10朝上的面(係為相反於該正面的面,即反面)及短邊側面係可被檢測;而在另一個該第二檢測位置240B時,該待測物10朝上的面(即反面)及長邊側面係可被檢測。As shown in FIGS. 1 and 2, at one first detection position 140A, the upward-facing surface (defined as the front side) and the long side of the object to be measured 10 can be detected; while at the other first detection position 140B The upward-facing surface (ie, front surface) and short-side side surface of the object to be tested 10 can be detected. On the other hand, at a second detection position 240A, the upward-facing surface of the object to be measured 10 (which is the surface opposite to the front surface, that is, the reverse surface) and the short-side side surface can be detected; In the second detection position 240B, the upward-facing surface (ie, the reverse surface) and the long-side side surface of the object 10 can be detected.

請參照圖3,其係為本創作實施例中第一檢測位置之側部表面檢測器的配置示意圖。Please refer to FIG. 3, which is a schematic diagram of the configuration of the side surface detector at the first detection position in this creative embodiment.

於本實施例中,該待測物10係以長方形片體之鋰電池為例,且該待測物10的側面的中間位置係環繞有一凸緣11(通常為鋰電池的電路軟板或封膜等)。In this embodiment, the test object 10 is a rectangular lithium battery as an example, and the middle of the side surface of the test object 10 is surrounded by a flange 11 (usually a circuit board or seal of the lithium battery) Membrane, etc.).

如圖3所示,以一個該側部表面檢測器132A作為示例,該側部表面檢測器132A係可進一步配置有二個鏡頭1321。該二鏡頭1321配置在垂直於該第一轉盤120之表面的面(垂直面)上或配置在垂直於該第二轉盤之表面(圖未示)的面(垂直面)上。此外,該二鏡頭1321的取像方向係被以相對於該第一轉盤120或該第二轉盤(圖未示)呈小於90度(例如為45度角)地配置。該側部表面檢測器132A還可進一步具有二光源1322,該二光源1322係被以可向正對於該待測物10的長邊或短邊的方向發射光線的方式配置。據此,藉由該二鏡頭1321的斜向配置,表面檢測係可不受該待測物10的該凸緣11的阻礙。類似地,另一個該側部表面檢測器132A及該側部表面檢測器232A,232B亦可作類似的配置。As shown in FIG. 3, taking one side surface detector 132A as an example, the side surface detector 132A may be further configured with two lenses 1321. The two lenses 1321 are arranged on a plane (vertical plane) perpendicular to the surface of the first turntable 120 or a plane (vertical plane) perpendicular to the surface (not shown) of the second turntable. In addition, the imaging directions of the two lenses 1321 are arranged to be smaller than 90 degrees (for example, 45 degrees) with respect to the first turntable 120 or the second turntable (not shown). The side surface detector 132A may further have two light sources 1322 configured to emit light in a direction facing the long side or short side of the object 10 to be measured. Accordingly, with the oblique arrangement of the two lenses 1321, the surface detection system is not hindered by the flange 11 of the object 10 to be measured. Similarly, the other side surface detector 132A and the side surface detectors 232A, 232B can also be configured similarly.

綜上所述,本創作實施例之表面檢測設備,係藉由翻面移載裝置的配置,而可將待測物變換各個面的方向,並藉由該第一檢測單元與該第二檢測單元上的轉盤及光學檢測組件的配置,使得待測物的六個面可以被依序完成所有表面的瑕疵檢測,藉以達到自動化表面檢測的功能,適合應用於較為脆弱或無法以夾具夾持的待測物表面檢測上。In summary, the surface detection device of this creative embodiment can change the direction of each surface by the configuration of the flip transfer device, and by the first detection unit and the second detection The configuration of the turntable and optical detection components on the unit allows the six faces of the object to be tested to complete the defect detection of all surfaces in sequence, so as to achieve the function of automatic surface detection, suitable for applications that are more fragile or cannot be clamped by fixtures The surface of the test object is detected.

本創作在上文中已以較佳實施例揭露,然熟習本項技術者應理解的是,該實施例僅用於描繪本創作,而不應解讀為限制本創作之範圍。應注意的是,舉凡與該實施例等效之變化與置換,均應設為涵蓋於本創作之範疇內。因此,本創作之保護範圍當以申請專利範圍所界定者為準。This creation has been disclosed in the above with preferred embodiments. However, those skilled in the art should understand that this embodiment is only for depicting this creation, and should not be interpreted as limiting the scope of this creation. It should be noted that all changes and replacements equivalent to this embodiment should be included in the scope of this creation. Therefore, the scope of protection of this creation shall be determined by the scope of the patent application.

10:待測物 11:凸緣 100:第一檢測單元 110:第一轉軸 120:第一轉盤 130:第一光學檢測模組 131A,131B:頂部表面檢測器 132A,132B:側部表面檢測器 1321:鏡頭 1322:光源 140A,140B:第一檢測位置 150:第一移載位置 200:第二檢測單元 210:第二轉軸 220:第二轉盤 230:第二光學檢測模組 231A,231B:頂部表面檢測器 232A,232B:側部表面檢測器 240A,240B:第二檢測位置 250:第二移載位置 300:翻面移載裝置 310:水平導軌 320:垂直導軌 330:基座 340:旋轉單元 341:第一迴轉氣缸 342:第一吸盤 350:翻轉單元 351:第二迴轉氣缸 352:第二吸盤 360:暫存平台 10: Test object 11: flange 100: first detection unit 110: the first shaft 120: first turntable 130: The first optical inspection module 131A, 131B: top surface detector 132A, 132B: side surface detector 1321: lens 1322: Light source 140A, 140B: the first detection position 150: first transfer position 200: second detection unit 210: second shaft 220: second turntable 230: Second optical detection module 231A, 231B: top surface detector 232A, 232B: side surface detector 240A, 240B: second detection position 250: second transfer position 300: Flip and transfer device 310: horizontal rail 320: vertical rail 330: Dock 340: Rotating unit 341: the first rotary cylinder 342: The first sucker 350: flip unit 351: Second rotary cylinder 352: second suction cup 360: temporary storage platform

[圖1]為本創作實施例之表面檢測設備的俯視示意圖。 [圖2]為本創作實施例之表面檢測設備的側視示意圖。 [圖3]為本創作實施例中第一檢測位置之側部表面檢測器的配置示意圖。 [FIG. 1] A schematic top view of the surface detection device of this creative embodiment. [FIG. 2] A schematic side view of the surface detection device of this creative embodiment. [FIG. 3] This is a schematic diagram of the configuration of the side surface detector in the first detection position in the creative embodiment.

10:待測物 10: Test object

11:凸緣 11: flange

100:第一檢測單元 100: first detection unit

110:第一轉軸 110: the first shaft

120:第一轉盤 120: first turntable

130:第一光學檢測模組 130: The first optical inspection module

131A,131B:頂部表面檢測器 131A, 131B: top surface detector

132A,132B:側部表面檢測器 132A, 132B: side surface detector

140A,140B:第一檢測位置 140A, 140B: the first detection position

150:第一移載位置 150: first transfer position

200:第二檢測單元 200: second detection unit

210:第二轉軸 210: second shaft

220:第二轉盤 220: second turntable

230:第二光學檢測模組 230: Second optical detection module

231A,231B:頂部表面檢測器 231A, 231B: top surface detector

232A,232B:側部表面檢測器 232A, 232B: side surface detector

240A,240B:第二檢測位置 240A, 240B: second detection position

250:第二移載位置 250: second transfer position

300:翻面移載裝置 300: Flip and transfer device

310:水平導軌 310: horizontal rail

320:垂直導軌 320: vertical rail

330:基座 330: Dock

340:旋轉單元 340: Rotating unit

350:翻轉單元 350: flip unit

360:暫存平台 360: temporary storage platform

Claims (10)

一種翻面移載裝置,用於表面檢測設備中以對待測物進行翻面,該翻面移載裝置包含: 一水平導軌; 一垂直導軌,可水平移動地設置於該水平導軌上; 一基座,可垂直移動地設置於該垂直導軌上; 一旋轉單元,設置於該基座的一端上,用於暫時地拿取該待測物並使該待測物在一水平面上旋轉一第一角度;及 一翻轉單元,設置於該基座的另一端上,用於暫時地拿取該待測物並使該待測物在一垂直面上翻轉180度。 A flip transfer device is used in a surface detection device to flip a test object. The flip transfer device includes: A horizontal rail; A vertical guide rail, which can be horizontally arranged on the horizontal guide rail; A base, which is vertically movable on the vertical guide rail; A rotating unit, disposed on one end of the base, for temporarily taking the object to be tested and rotating the object to be tested by a first angle on a horizontal plane; and A reversing unit is provided on the other end of the base for temporarily taking the object to be tested and turning the object to be turned 180 degrees on a vertical plane. 如請求項1所述之翻面移載裝置,其中該旋轉單元係包含一第一迴轉氣缸及一第一吸盤,該第一迴轉氣缸設置於該基座上,該第一吸盤係設置於該第一迴轉氣缸的轉動軸上並用於吸附該待測物。The flip transfer device according to claim 1, wherein the rotating unit comprises a first rotary cylinder and a first suction cup, the first rotary cylinder is arranged on the base, and the first suction cup is arranged on the The rotating shaft of the first rotary cylinder is used to attract the object to be measured. 如請求項2所述之翻面移載裝置,其中該翻轉單元係包含一第二迴轉氣缸及一第二吸盤,該第二迴轉氣缸設置於該基座上,該第二吸盤係設置於該第二迴轉氣缸的轉動軸上並用於吸附該待測物,該第二迴轉氣缸的轉動軸係垂直該第一迴轉氣缸的轉動軸。The flip transfer device according to claim 2, wherein the flip unit includes a second rotary cylinder and a second suction cup, the second rotary cylinder is disposed on the base, and the second suction cup is disposed on the The rotating shaft of the second rotating cylinder is used to attract the object to be measured, and the rotating shaft of the second rotating cylinder is perpendicular to the rotating shaft of the first rotating cylinder. 如請求項3所述之翻面移載裝置,其中該第一角度為180度。The flip transfer device according to claim 3, wherein the first angle is 180 degrees. 如請求項4所述之翻面移載裝置,其中該第一迴轉氣缸與該第二迴轉氣缸係被驅動為同時作動。The flip transfer device according to claim 4, wherein the first rotary cylinder and the second rotary cylinder are driven to operate simultaneously. 一種表面檢測設備,用於檢測待測物的表面,包含: 一第一檢測單元,包括一第一轉軸、以該第一轉軸為中心轉動之一第一轉盤及複數個第一光學檢測模組,該第一檢測單元配置有供該第一轉盤旋轉通過的複數個第一檢測位置,該等第一光學檢測模組相對於各該第一檢測位置而配置,用以當該待測物到達該等第一檢測位置時檢測該待測物的至少其中三個表面; 一第二檢測單元,包括一第二轉軸、以該第二轉軸為中心轉動之一第二轉盤及複數個第二光學檢測模組,該第二檢測單元配置有供該第二轉盤旋轉通過的複數個第二檢測位置,該等第二光學檢測模組被相對各該第二檢測位置地配置,用以當該待測物到達該等第二檢測位置時檢測該待測物的至少其中另三個表面;及 如請求項1至5中任一項所述之翻面移載裝置,設置於該第一檢測單元與該第二檢測單元之間,該待測物係經由該翻面移載裝置被從該第一檢測單元移至該第二檢測單元。 A surface detection device for detecting the surface of an object to be measured, including: A first detection unit includes a first rotation shaft, a first turntable rotating around the first rotation shaft as the center, and a plurality of first optical detection modules, the first detection unit is configured for the first turntable to rotate through A plurality of first detection positions, the first optical detection modules are arranged relative to each of the first detection positions, and are used to detect at least three of the objects to be tested when the objects to be tested reach the first detection positions Surface A second detection unit includes a second rotation shaft, a second turntable rotating around the second rotation shaft as the center, and a plurality of second optical detection modules, the second detection unit is configured for the second turntable to rotate through A plurality of second detection positions, the second optical detection modules are arranged relative to each second detection position, and used to detect at least one of the other objects when the object reaches the second detection positions Three surfaces; and The flip transfer device according to any one of claims 1 to 5 is provided between the first detection unit and the second detection unit, and the object to be measured is removed from the transfer device via the flip transfer device The first detection unit moves to the second detection unit. 如請求項6所述之表面檢測設備,其中該翻面移載裝置更包含一暫存平台,且該第一檢測單元係具有一第一移載位置,該第二檢測單元具有一第二移載位置,該第一移載位置、該暫存平台與該第二移載位置係位在一直線路徑上。The surface detection device according to claim 6, wherein the flip transfer device further includes a temporary storage platform, and the first detection unit has a first transfer position, and the second detection unit has a second transfer Loading position, the first transfer position, the temporary storage platform and the second transfer position are located on a straight path. 如請求項7所述之表面檢測設備,其中每一第一光學檢測模組及每一第二光學檢測模組係各自包括一頂部表面檢測器及一側部表面檢測器。The surface inspection device according to claim 7, wherein each first optical inspection module and each second optical inspection module each include a top surface detector and a side surface detector. 如請求項8所述之表面檢測設備,其中每一側部表面檢測器係具有二鏡頭,該二鏡頭被配置在垂直於該第一轉盤之表面的一平面上或被配置在垂直於該第二轉盤之表面的一平面上,且每一側部表面檢測器的該二鏡頭的取像方向係被以相對該第一轉盤或該第二轉盤呈小於90度地配置。The surface inspection device according to claim 8, wherein each side surface detector has two lenses, which are arranged on a plane perpendicular to the surface of the first turntable or arranged perpendicular to the first The surface of the two turntables is on a plane, and the imaging directions of the two lenses of each side surface detector are arranged to be less than 90 degrees relative to the first turntable or the second turntable. 如請求項9所述之表面檢測設備,其中該第一檢測單元的該第一轉盤上係具有被配置為位在不同徑向方向上的二個第一檢測位置,該第二檢測單元的該第二轉盤上係具有被配置為位在不同徑向方向上的二個第二檢測位置。The surface detection device according to claim 9, wherein the first turntable of the first detection unit has two first detection positions configured to be located in different radial directions, and the second detection unit The second turntable has two second detection positions arranged in different radial directions.
TW108217522U 2019-12-31 2019-12-31 Flip-transfer device and surface inspection equipment TWM593648U (en)

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