TWM591166U - Tray turnover detection system - Google Patents
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- TWM591166U TWM591166U TW108213811U TW108213811U TWM591166U TW M591166 U TWM591166 U TW M591166U TW 108213811 U TW108213811 U TW 108213811U TW 108213811 U TW108213811 U TW 108213811U TW M591166 U TWM591166 U TW M591166U
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Abstract
本創作提供一種載盤翻面檢測系統,包含:一上/下料盤,具有數個放置輪廓,每一放置輪廓適於承載一待測物;一精密盤,具有數個限位輪廓,每一限位輪廓由複數個移動限位塊所界定,並與該放置輪廓呈鏡射關係;一上/下料翻轉機構,包含用於承載該上/下料盤的一上/下料盤載具與用於承載該精密盤的一精密盤載具,該上/下料盤載具與該精密盤載具可分別旋轉閉合或分離,使該精密盤的限位輪廓用以承載該待測物;以及一光學影像檢測系統,包含:一檢測載台,用以承載該精密盤,用以檢測該精密盤的每一限位輪廓所承載的該待測物的一檢測面。This creation provides a tray turning detection system, including: an upper/lower tray with several placement contours, each placement contour is suitable for carrying a test object; a precision tray with several limit contours, each A limit contour is defined by a plurality of moving limit blocks and has a mirror relationship with the placement contour; an up/down material turning mechanism includes an up/down material tray for carrying the up/down material tray And a precision disc carrier for carrying the precision disc, the upper/lower disc carrier and the precision disc carrier can be respectively rotated closed or separated, so that the limit profile of the precision disc is used to carry the to-be-measured An object; and an optical image inspection system, comprising: an inspection stage for carrying the precision disc, for inspecting a detection surface of the object to be inspected carried by each limit profile of the precision disc.
Description
本創作係關於一種光學式翻面檢測系統,更明確地說明,本創作是一種可以進行翻面且精準對位的瑕疵檢測之載盤翻面檢測系統。 This creation is about an optical flip detection system, which more clearly states that this creation is a disc flip detection system that can perform flip and accurate alignment defect detection.
自動化檢測設備中,光學影像拍攝系統是檢測設備中成本比重高的部分,為了增加其檢測產能效率,檢測載台會盡量承載複數個待測物,藉由布滿整個待測物,由光學影像檢測系統一次檢出最多複數個待測物。In the automatic testing equipment, the optical image shooting system is a part of the testing equipment that has a high cost ratio. In order to increase the efficiency of its testing capacity, the testing stage will try to carry a plurality of objects to be tested. By covering the entire object to be tested, the optical image is detected The system can detect at most a plurality of test objects at a time.
一般待測物由前面製程站產出後,複數個待測物會放置在一塑膠盤內,該塑膠盤將做為產線內搬運輸送的最小單位。該塑膠盤被傳送到光學檢測站時,這些待測物必須分別從塑膠盤裡拿出來,逐一放置在光學檢測站的檢測載具上,才開始掃描這些待測物做光學瑕疵檢測。目前傳送該塑膠盤,並把複數個待測物從產線內搬運的塑膠盤中取出係使用機械手臂,該機械手臂前端有複數個吸氣裝置,可一次吸取複數個待測物,把複數個待測物放置到光學檢測站的檢測載具上,反覆進行直到放滿為止。Generally, after the test object is produced by the previous process station, a plurality of test objects will be placed in a plastic tray. The plastic tray will be used as the smallest unit for transportation in the production line. When the plastic disc is transferred to the optical inspection station, the objects to be tested must be taken out of the plastic disc and placed on the inspection carrier of the optical inspection station one by one before scanning the objects to be tested for optical defects. At present, the plastic tray is transported, and the plurality of objects to be tested are taken out of the plastic tray transported in the production line by using a robotic arm. The front end of the robotic arm has a plurality of suction devices, which can suck a plurality of objects to be tested at one time The objects to be tested are placed on the inspection carrier of the optical inspection station, and it is repeated until they are full.
然而,如果待測物越來越小,機械手臂的吸嘴在吸取複數個待測物時,很容易發生吸附不好而導致掉料的現象,進而影響整體的吸附搬運良率。只能再找更小的吸嘴,與更精密的微調裝置,確保一次吸附複數個待測物的搬運,不致有掉料的產生。However, if the object to be measured is getting smaller and smaller, the suction nozzle of the robot arm is prone to suck up and cause a material drop, which will affect the overall yield of adsorption and handling. You can only find a smaller suction nozzle and a more precise fine-tuning device to ensure the handling of multiple analytes at a time, so that there is no material loss.
如果直接把塑膠盤放置到光學檢測站的檢測載具上做量測,將會因為塑膠盤的形變與粗糙度和精密度太差,造成塑膠盤內待測物高低位置不一或平整度不一。若光學檢測站直接量測塑膠盤內的待測物,容易因為物件擺放的高度或平整度影響拍攝焦距,或者光源被塑膠盤的限位柱擋住,而導致檢測數據不佳。此外,因應檢測項目的需求,光學檢測站要檢測待測物的背面,機械手臂的搬運過程還要執行翻面操作才能將待測物置於檢測載具上。因此,本創作若能提供一種一次性將複數個待測物進行翻面且精準對位之載盤翻面檢測系統,將可使檢測時程效率提升,具有產業的實用性。 If the plastic disc is placed directly on the inspection carrier of the optical inspection station for measurement, it will be caused by the deformation, roughness and precision of the plastic disc being too poor, resulting in uneven positions or flatness of the object to be measured in the plastic disc One. If the optical inspection station directly measures the object to be measured in the plastic disc, it is easy to affect the shooting focal length due to the height or flatness of the object, or the light source is blocked by the limit post of the plastic disc, resulting in poor detection data. In addition, in response to the needs of the inspection project, the optical inspection station must detect the back of the object to be measured, and the robotic arm must also perform a flip operation before the object is placed on the inspection carrier. Therefore, if this creation can provide a flip-up detection system for turning and accurately aligning a plurality of objects to be tested at one time, the detection time efficiency will be improved and it will be industrially practical.
本創作的目的是提供一種載盤翻面檢測系統,可以把產線搬運的塑膠盤上複數個待測物,利用翻轉機構一次性將複數個待測物進行翻面,並將小尺寸的待測物放置在精密盤上進行光學檢測流程。The purpose of this creation is to provide a carrier disc turning detection system, which can turn a plurality of objects to be tested on a plastic tray carried on a production line, and use a turning mechanism to turn the plurality of objects to be turned at a time The test object is placed on a precision disk for optical inspection process.
為了達到上述創作目的,本創作提供的一種載盤翻面檢測系統,包含:一上料盤,具有複數個放置區,每一放置區具有一放置輪廓,該放置輪廓適於承載一檢測面朝下之一待測物;一精密盤,具有複數個檢測區,每一檢測區具有一限位輪廓,且該限位輪廓由複數個移動限位塊所界定,並與該放置輪廓呈鏡射關係;一上料翻轉機構,包含用於承載該上料盤的一上料盤載具與用於承載該精密盤的一精密盤載具,該上料盤載具與該精密盤載具可分別旋轉閉合或分離,使該精密盤的限位輪廓用以承載該檢測面朝上之該待測物;以及一光學影像檢測系統,包含:一檢測載台,用以承載該精密盤,用以檢測該精密盤的每一檢測區所承載的該待測物的檢測面。In order to achieve the above-mentioned creation purpose, the present invention provides a loading tray turning detection system, including: an upper feeding tray, having a plurality of placement areas, each placement area has a placement contour, the placement contour is suitable for carrying a detection face The next one to be tested; a precision disc with a plurality of detection areas, each detection area has a limit contour, and the limit contour is defined by a plurality of moving limit blocks, and mirrors the placement contour Relation; a loading turning mechanism, including a loading tray carrier for carrying the loading tray and a precision tray carrier for carrying the precision tray, the loading tray carrier and the precision tray carrier can Rotate to close or separate separately, so that the limit profile of the precision disk is used to carry the object to be tested with the detection surface facing upward; and an optical image detection system, including: a detection stage for carrying the precision disk, To detect the detection surface of the object to be tested carried in each detection area of the precision disk.
為了達到上述創作目的,本創作提供的一種載盤翻面檢測系統,包含:一精密盤,具有複數個檢測區,每一檢測區具有一限位輪廓,且該限位輪廓由複數個移動限位塊所界定,該限位輪廓適於承載一檢測面朝上之一待測物;一下料盤,具有複數個放置區,每一放置區具有一放置輪廓,該放置輪廓與該限位輪廓呈鏡射關係;一下料翻轉機構,包含用於承載該下料盤的一下料盤載具與用於承載該精密盤的一精密盤載具,該下料盤載具與該精密盤載具可分別旋轉閉合或分離,使該下料盤的放置輪廓用以承載該檢測面朝下之該待測物;以及一光學影像檢測系統,包含:一檢測載台,用以承載該精密盤,用以檢測該精密盤的每一檢測區所承載的該待測物的檢測面。In order to achieve the above-mentioned creation purpose, this creation provides a disc turning detection system, which includes: a precision disc with a plurality of detection areas, each detection area has a limit contour, and the limit contour is limited by a plurality of movement limits Defined by the position block, the limit contour is suitable for carrying a test object with a detection surface facing upwards; the lower tray has a plurality of placement areas, each placement area has a placement contour, the placement contour and the limit contour A mirroring relationship; a stock turning mechanism, including a stock tray carrier for carrying the lower stock tray and a precision tray carrier for carrying the precision tray, the blank tray carrier and the precision tray carrier It can be rotated closed or separated separately, so that the placement profile of the lower tray is used to carry the test object with the detection surface facing down; and an optical image detection system includes: a detection stage for carrying the precision disk, It is used to detect the detection surface of the object to be tested carried in each detection area of the precision disk.
其中,該檢測載台與該精密盤載具分別包含一固定治具,當該精密盤置於該檢測載台與該精密盤載具上時,該固定治具會固定保持該精密盤。Wherein, the detection stage and the precision disk carrier respectively include a fixed jig. When the precision disk is placed on the detection stage and the precision disk carrier, the fixed jig will fix and hold the precision disk.
其中,該檢測載台或該精密盤載具包含一移動治具,當該精密盤置於該檢測載台或該精密盤載具上時,該移動治具耦合每一檢測區的複數個移動限位塊,且該移動治具驅動複數個移動限位塊使每一檢測區的該待測物彼此對齊。該移動治具包含一XY位移控制機構,該XY位移控制機構分別控制每一檢測區的一部分的移動限位塊在X方向移動每一待測物對齊,且控制每一檢測區的另一部分的移動限位塊在Y方向移動每一待測物對齊。Wherein, the detection stage or the precision disk carrier includes a moving jig, and when the precision disk is placed on the detection stage or the precision disk carrier, the moving jig is coupled to a plurality of movements of each detection area A limit block, and the moving jig drives a plurality of moving limit blocks to align the objects to be tested in each detection area with each other. The moving jig includes an XY displacement control mechanism, which controls the movement limit blocks of a part of each detection zone to move each object to be aligned in the X direction, and controls the other part of each detection zone. The movement limit block moves each object to be measured in the Y direction to align.
其中,該精密盤的每一檢測區的限位輪廓內設有複數個穿孔,該檢測載台或該精密盤載具包含具有複數個氣孔之一汽缸控制機構,該等氣孔對準每一檢測區的複數個穿孔,用以吸附該待測物而固定於該限位輪廓。Wherein, the limit contour of each detection zone of the precision disk is provided with a plurality of perforations, the detection stage or the precision disk carrier includes a cylinder control mechanism having a plurality of air holes, and the air holes are aligned with each detection A plurality of perforations in the area are used to attract the object to be measured and fixed to the limit contour.
其中,該上料翻轉機構包含一旋轉軸,該旋轉軸可控制地分別耦合或解耦合至該上料盤載具與該精密盤載具,俾使該旋轉軸驅動該上料盤載具與該精密盤載具分別旋轉閉合或分離。該旋轉軸耦合該精密盤載具且解耦合該上料盤載具,以驅動該精密盤載具旋轉閉合至該上料盤載具,再耦合該上料盤載具,以驅動該精密盤載具與該上料盤載具一起旋轉,將該上料盤的放置區所承載的複數個待測物翻轉至該精密盤載具的檢測區內。Wherein, the loading turning mechanism includes a rotating shaft, which can be controllably coupled or decoupled to the loading tray carrier and the precision tray carrier, respectively, so that the rotating shaft drives the loading tray carrier and The precision disk carrier rotates closed or separated respectively. The rotating shaft is coupled to the precision disc carrier and decouples the upper disc carrier to drive the precision disc carrier to rotate and close to the upper disc carrier, and then coupled to the upper disc carrier to drive the precision disc The carrier rotates together with the loading tray carrier, and the plurality of objects to be tested carried in the placing area of the loading tray is turned into the detection area of the precision tray carrier.
其中,該下料翻轉機構包含一旋轉軸,該旋轉軸可控制地分別耦合或解耦合至該下料盤載具與該精密盤載具,俾使該旋轉軸驅動該下料盤載具與該精密盤載具分別旋轉閉合或分離。該旋轉軸耦合該下料盤載具且解耦合該精密盤載具,以驅動該下料盤載具旋轉閉合至該精密盤載具,再耦合該精密盤載具,以驅動該精密盤載具與該下料盤載具一起旋轉,將該精密盤載具的檢測區所承載的複數個待測物翻轉至該下料盤載具的放置區內。Wherein, the blanking turning mechanism includes a rotating shaft, which can be controllably coupled or decoupled to the blanking plate carrier and the precision plate carrier, so that the rotary shaft drives the blanking plate carrier and The precision disk carrier rotates closed or separated respectively. The rotating shaft is coupled to the lower tray carrier and decouples the precision tray carrier to drive the lower tray carrier to rotate and close to the precision tray carrier, and then coupled to the precision tray carrier to drive the precision tray carrier The tool rotates together with the unloading tray carrier, and a plurality of objects to be tested carried by the detection area of the precision disc carrier is turned into the placing area of the unloading tray carrier.
根據本創作的載盤翻面檢測系統,複數個待測物上下料時,翻轉機構可一次性將複數個待測物從塑膠盤翻面放置在一精密盤,藉由該精密盤的精密定位可使檢測時程效率提升,並提高光學影像檢測系統的檢測良率。 According to the creation of the disc turning detection system, when a plurality of objects to be tested are loaded and unloaded, the turning mechanism can place the plurality of objects to be turned from the plastic disc to a precision disc at a time, through the precise positioning of the precision disc It can improve the efficiency of the detection time and improve the detection yield of the optical image detection system.
首先參考第一A圖至第一C圖,係分別顯示本創作系統所檢測之一待測物的俯視圖、該待測物翻轉後背面的俯視圖以及其側視圖。在本創作的一種實施例中,適於本創作系統所檢測之一待測物1包含一電路板2,該電路板2的一部份為具有金手指匯流排的軟性印刷電路板,另一部分為硬性印刷電路板,該硬性印刷電路板則配置有連接端口3,其中連接端口3與電路板2之間多個焊點的良率,必須如第一B圖所示該待測物翻轉後的背面進行檢測。First, referring to the first A to the first C drawings, respectively, a top view of a test object detected by the authoring system, a top view of the back surface after the test object is turned over, and a side view thereof are shown. In an embodiment of the authoring, one of the
請參考第二圖,顯示產線上搬運的塑膠盤10的俯視圖。產線上搬運的塑膠盤10規畫有複數個放置區,每一放置區具有一放置輪廓12,以收容放置一待測物1,該放置輪廓12是固定的輪廓且由固定限位塊11以界定出略大於該待測物1的外輪廓。在本創作的一種實施例中,當待測物1放置於放置區時,該待測物1的檢測面係朝下。Please refer to the second figure, which shows a top view of the
請參考第三圖,顯示本創作載盤翻面檢測系統使用的精密盤20的俯視圖。在本創作的一種實施例中,精密盤20為一精密加工之金屬盤,其上規畫有複數個檢測區,每一檢測區具有一限位輪廓24,以收容放置被翻面的待測物1。因此,每一檢測區的限位輪廓24對應每一放置區的放置輪廓12,彼此呈鏡射關係以符合待測物1的翻轉操作。每一限位輪廓24由複數個可移動的移動限位塊所界定,所以,該等移動限位塊可界定出略大於該待測物1的外輪廓,如放置輪廓12的鏡射輪廓;或者該等移動限位塊可界定出恰好符合該待測物1的外輪廓,以定位該待測物1準確地對齊。可移動的移動限位塊包含在X方向上移動的複數個X移動限位塊21與Y方向上移動的複數個Y移動限位塊22。精密盤20的每一檢測區內規劃設置X方向槽道與Y方向槽道,分別保持該X移動限位塊21在X方向槽道上位移以及保持該Y移動限位塊22在Y方向槽道上位移。而且X移動限位塊21與Y移動限位塊22可由下方耦合至一XY位移控制機構34,以驅動在X方向與Y方向位移。該XY位移控制機構34設置於翻轉機構30的精密盤載具33或光學影像檢測系統40的檢測載台45,配合第五圖將有進一步的詳述。Please refer to the third figure, which shows a top view of the
在本創作的另一種實施例中,每一檢測區可進一步包含一固定限位塊23,用來定位翻轉至精密盤20上之待測物1。每一檢測區的限位輪廓24內設置複數個穿孔25,該等穿孔25的下方可對應吸氣孔,以吸附待測物1保持定位於限位輪廓24內。In another embodiment of the present invention, each detection zone may further include a
當被翻面的待測物1欲收容放置於檢測區的限位輪廓24時,該等移動限位塊可界定出略大於該待測物1的外輪廓,使該待測物1易於放進檢測區的限位輪廓24內。請同時參考第六A圖與第六B圖,分別顯示本創作系統精密盤20分別在X方向與Y方向移動限位待測物1的俯視圖。當待測物1位於較大的限位輪廓24後,X移動限位塊21可被控制移動使精密盤20上每一檢測區的待測物1在X方向上彼此精準對齊,如第六A圖所示;之後,Y移動限位塊22可被控制移動使精密盤20上每一檢測區的待測物1在Y方向上彼此精準對齊,如第六B圖所示。因此,本創作載盤翻面檢測系統的光學影像檢測系統在掃描拍攝所有的檢測區後,可在檢測影像上每一檢測區的對應位置進行精確定位的判讀。When the to-
請參考第四圖,顯示本創作載盤翻面檢測系統的翻轉機構30的側視圖。在本創作的一種實施例中,翻轉機構30包含:用於承載一塑膠盤10的一塑膠盤載具32、用於承載一精密盤20的一精密盤載具33、以及一旋轉軸31,該旋轉軸31可控制地分別耦合或解耦合至該塑膠盤載具32與該精密盤載具33,俾使該旋轉軸31適於驅動該塑膠盤載具32與該精密盤載具33分別旋轉閉合或分離,將該塑膠盤載具32的放置區所承載的待測物1翻轉至該精密盤載具33對應的檢測區的限位輪廓24內。當翻轉機構30將該塑膠盤載具32所承載的待測物1翻轉至該精密盤載具33的精密盤20而閉合時,如第八B、八C圖所示,在檢測區的該等移動限位塊所界定的限位輪廓24是符合對應的放置區的放置輪廓12的鏡射位置,且該等移動限位塊也對應著對應的放置區的固定限位塊11的鏡射位置上。第四圖同時顯示待測物1位於該塑膠盤10與該精密盤20上的狀態,且複數個待測物1定位於精密盤20時,複數個待測物1可保持一致的平整度或使檢測面位於相同的高度。Please refer to the fourth figure, which shows a side view of the
翻轉機構30的塑膠盤載具32與精密盤載具33分別包含一固定治具(圖未示)。當機械手臂將塑膠盤10移置塑膠盤載具32時,固定治具可將塑膠盤10固定且保持在塑膠盤載具32上。當精密盤20放置在精密盤載具33時,固定治具可將精密盤20固定且保持在精密盤載具33上。此外,精密盤載具33進一步包含:一XY位移控制機構34,當精密盤20放置於精密盤載具33上,該XY位移控制機構34耦合至精密盤20上各檢測區的X移動限位塊21與Y移動限位塊22,以驅動X移動限位塊21與Y移動限位塊22位移各檢測區的待測物1彼此對齊;以及,一汽缸控制機構37,具有複數個吸氣孔,當精密盤20放置於精密盤載具33上,各吸氣孔分別對準各檢測區內的穿孔25,以吸附待測物1保持定位於限位輪廓24內。The
請參考第五圖,顯示本創作載盤翻面檢測系統的系統方塊圖。在本創作的一種實施例中,一種載盤翻面檢測系統包含:一光學影像檢測系統40、至少一翻轉機構30,包含一翻轉控制機構、以及一處理單元50,控制該光學影像檢測系統40進行複數個待測物1的瑕疵檢測,以及控制該翻轉機構30的翻轉控制機構將塑膠盤載具32所承載的待測物1上料至該精密盤載具33的精密盤20或將精密盤載具33所承載檢測後的待測物1下料至該塑膠盤載具32的塑膠盤10。Please refer to the fifth figure, which shows the system block diagram of the creation plate turning detection system. In an embodiment of the present invention, a disc flip detection system includes: an optical
該光學影像檢測系統40包含:一檢測載台45,如第七B圖所示,可承載一精密盤20;一影像拍攝系統41,用以拍攝精密盤20上各檢測區所承載的待測物1的檢測面,並提供檢測影像給處理單元50進行瑕疵檢測的判讀;一正面光源42與一側面光源43,用以照明精密盤20的檢測區,經由一光源控制51接受處理單元50的控制;以及,一相機移動控制機構44,用以驅動影像拍攝系統41掃描精密盤20的所有檢測區,經由一控制軸卡52接受處理單元50的控制。The optical
此外,該光學影像檢測系統40的檢測載台45包含一固定治具(圖未示),當精密盤20移置於檢測載台45上,固定治具可固定且保持精密盤20;一XY位移控制機構34,當精密盤20移置於檢測載台45上,該XY位移控制機構34耦合至精密盤20上各檢測區的X移動限位塊21與Y移動限位塊22,以驅動X移動限位塊21與Y移動限位塊22位移各檢測區的待測物1彼此對齊;以及,一汽缸控制機構37,具有複數個吸氣孔,當精密盤20移置於檢測載台45上,各吸氣孔分別對準各檢測區內的穿孔25,以吸附待測物1保持定位於限位輪廓24內。In addition, the
該翻轉機構30包含一翻轉控制機構,由處理單元50控制將一旋轉軸31耦合或解耦合至該塑膠盤載具32與該精密盤載具33,且控制該旋轉軸31驅動該塑膠盤載具32與該精密盤載具33旋轉閉合或分離,將該塑膠盤載具32的放置區所承載的待測物1翻轉至該精密盤載具33對應的檢測區內。此外,該翻轉機構30可進一步包含一XY位移控制機構34,設置於該精密盤載具33,當精密盤20移置於檢測載台45上,該XY位移控制機構34耦合至精密盤20上各檢測區的X移動限位塊21與Y移動限位塊22,以驅動X移動限位塊21與Y移動限位塊22位移各檢測區的待測物1彼此對齊;以及,一汽缸控制機構37,設置於該精密盤載具33,該汽缸控制機構37具有複數個吸氣孔,當精密盤20移置於檢測載台45上,各吸氣孔分別對準各檢測區內的穿孔25,以吸附待測物1保持定位於限位輪廓24內。The
該XY位移控制機構34對應精密盤20的檢測區設置複數個可移動的定位柱,這些定位柱分別對應耦合至X移動限位塊21與Y移動限位塊22,以驅動在X方向與Y方向位移。這些定位柱的驅動來源可為一汽缸。The XY displacement control mechanism 34 is provided with a plurality of movable positioning columns corresponding to the detection area of the
請參考第七A圖與第七B圖,分別顯示本創作載盤翻面檢測系統的系統架構圖,分別顯示俯視圖與側視圖。在本創作的另一種實施例中,一種載盤翻面檢測系統包含:一光學影像檢測系統40,如第五圖所示;一上料翻轉控制機構35,設於一上料區4的翻轉機構30;一下料翻轉控制機構36,設於一下料區5的翻轉機構30;以及一處理單元50,控制該光學影像檢測系統40進行複數個待測物1的瑕疵檢測,且控制該上料翻轉控制機構35將塑膠盤載具32所承載的待測物1上料至該精密盤載具33的精密盤20,且控制該下料翻轉控制機構36將精密盤載具33所承載檢測後的待測物1下料至該塑膠盤載具32的塑膠盤10。該處理單元50係經由控制卡53控制該上料翻轉控制機構35與該下料翻轉控制機構36。Please refer to Figures 7A and 7B, respectively, for showing the system architecture diagram of the creation tray flip detection system, showing a top view and a side view, respectively. In another embodiment of the present invention, a tray turning detection system includes: an optical
此外,位於上料區4與下料區5的翻轉機構30可進一步包含一XY位移控制機構34,設置於該精密盤載具33,當精密盤20移置於檢測載台45上,該XY位移控制機構34耦合至精密盤20上各檢測區的X移動限位塊21與Y移動限位塊22,以驅動X移動限位塊21與Y移動限位塊22位移各檢測區的待測物1彼此對齊;以及,一汽缸控制機構37,設置於該精密盤載具33,該汽缸控制機構37具有複數個吸氣孔,當精密盤20移置於檢測載台45上,各吸氣孔分別對準各檢測區內的穿孔25,以吸附待測物1保持定位於限位輪廓24內。In addition, the reversing
在本創作的一種實施例中,一上料機械手臂將承載複數個待測物1的塑膠盤10上料至上料區4,並放置於翻轉機構30的塑膠盤載具32。該塑膠盤載具32的固定治具鎖定該塑膠盤10,上料區4的翻轉機構30執行翻轉操作,如第八A圖至第八D圖所示,將該塑膠盤10的複數個待測物1翻轉至該精密盤載具33的精密盤20上。該精密盤載具33對精密盤20上的複數個待測物1進行精密定位。該精密盤載具33的固定治具解鎖精密盤20,讓上料機械手臂將承載複數個待測物1的精密盤20移置光學影像檢測系統40的檢測載台45,並使檢測載台45的固定治具鎖定精密盤20且吸附檢測區的待測物1,以進行掃描檢測。In an embodiment of the present invention, a loading robot arm loads the
待影像檢測系統40完成掃描檢測後,檢測載台45的固定治具解鎖精密盤20,由一下料機械手臂將承載檢測過的複數個待測物1的精密盤20下料至下料區5,並將精密盤20放置於翻轉機構30的精密盤載具33。該精密盤載具33的固定治具鎖定該精密盤20,下料區5的翻轉機構30執行翻轉操作,如第九A圖至第九D圖所示,將該精密盤20的複數個待測物1翻轉至該塑膠盤載具32的塑膠盤10上。After the
以下進一步說明第八A圖至第八D圖。如第八A圖所示,上料機械手臂依箭頭A將塑膠盤10放置於翻轉機構30的塑膠盤載具32,該塑膠盤載具32的固定治具鎖定該塑膠盤10,翻轉機構30的旋轉軸31耦合至精密盤載具33且解耦合塑膠盤載具32,依箭頭B由旋轉軸31旋轉驅動精密盤載具33閉合塑膠盤載具32,如第八B圖所示。之後,翻轉機構30的旋轉軸31同時耦合至精密盤載具33與塑膠盤載具32,依箭頭C由旋轉軸31旋轉驅動精密盤載具33與塑膠盤載具32執行翻轉,使塑膠盤10的複數個待測物1翻轉至精密盤20對應的檢測區,如第八C圖所示。之後,翻轉機構30的旋轉軸31解耦合精密盤載具33,依箭頭D由旋轉軸31旋轉驅動塑膠盤載具32回到原來位置,如第八D圖所示。精密盤載具33的X/Y移動限位塊21、22靠近待測物1進行精密定位後,限位輪廓24恰好符合待測物1的外輪廓,上料機械手臂依箭頭E將精密盤20移送至檢測載台45進行檢測。The eighth figures A to D are further described below. As shown in FIG. 8A, the loading robot arm places the
以下進一步說明第九A圖至第九D圖。當影像檢測系統40完成掃描檢測後,檢測載台45的固定治具解鎖精密盤20,如第九A圖所示,一下料機械手臂依箭頭F將檢測過的精密盤20放置於翻轉機構30的精密盤載具33,該精密盤載具33的固定治具鎖定該精密盤20,且精密盤載具33的X/Y移動限位塊21、22遠離待測物1,限位輪廓24略大於該待測物1的外輪廓,翻轉機構30的旋轉軸31耦合至塑膠盤載具32且解耦合精密盤載具33,依箭頭G由旋轉軸31旋轉驅動塑膠盤載具32閉合精密盤載具33,如第九B圖所示。之後,翻轉機構30的旋轉軸31同時耦合至精密盤載具33與塑膠盤載具32,依箭頭H由旋轉軸31旋轉驅動精密盤載具33與塑膠盤載具32執行翻轉,使精密盤20的複數個待測物1翻轉至塑膠盤10對應的放置區,如第九C圖所示。之後,翻轉機構30的旋轉軸31解耦合塑膠盤載具32,依箭頭I由旋轉軸31旋轉驅動精密盤載具33回到原來位置,如第九D圖所示。下料機械手臂依箭頭J將塑膠盤10移送出下料區5。The ninth figures A to D are further described below. After the
在本創作的不同實施例中,精密盤載具33的X/Y移動限位塊21、22靠近待測物1進行精密定位,可於上料區4的翻轉機構30的精密盤載具33或檢測載台45上執行;精密盤載具33的X/Y移動限位塊21、22遠離待測物1,可於檢測載台45或下料區5的翻轉機構30的精密盤載具33上執行。
In different embodiments of the present invention, the X/Y moving limit blocks 21 and 22 of the
1‧‧‧待測物
2‧‧‧電路板
3‧‧‧連接端口
4‧‧‧上料區
5‧‧‧下料區
10‧‧‧塑膠盤
11‧‧‧固定限位塊
12‧‧‧放置輪廓
20‧‧‧精密盤
21‧‧‧X移動限位塊
22‧‧‧Y移動限位塊
23‧‧‧固定限位塊
24‧‧‧限位輪廓
25‧‧‧穿孔
30‧‧‧翻轉機構
31‧‧‧旋轉軸
32‧‧‧塑膠盤載具
33‧‧‧精密盤載具
34‧‧‧XY位移控制機構
35‧‧‧上料翻轉控制機構
36‧‧‧下料翻轉控制機構
37‧‧‧汽缸控制機構
40‧‧‧光學影像檢測系統
41‧‧‧影像拍攝系統
42‧‧‧正面光源
43‧‧‧側面光源
44‧‧‧相機移動控制機構
45‧‧‧檢測載台
50‧‧‧處理單元
51‧‧‧光源控制
52‧‧‧控制軸卡
53‧‧‧控制卡
A~J‧‧‧箭頭
1‧‧‧
第一A圖至第一C圖分別是一待測物的俯視圖、該待測物翻轉後背面的俯視圖以及其側視圖。The first picture A to the first picture C are respectively a top view of a test object, a top view of the back surface after the test object is turned over, and a side view thereof.
第二圖是產線上搬運的塑膠盤的俯視圖。The second picture is a top view of the plastic tray transported on the production line.
第三圖是本創作載盤翻面檢測系統使用的精密盤的俯視圖。The third figure is a top view of the precision disc used in the original disc flip detection system.
第四圖是本創作載盤翻面檢測系統的翻轉機構的側視圖。The fourth figure is a side view of the flip mechanism of the original disc flip detection system.
第五圖是本創作載盤翻面檢測系統的系統方塊圖。The fifth figure is the system block diagram of the original disc turning detection system.
第六A圖與第六B圖是本創作系統精密盤分別在X方向與Y方向移動限位待測物的俯視圖。Figures 6A and 6B are top views of the precision disc of the authoring system moving the limit test object in the X and Y directions, respectively.
第七A圖與第七B圖是本創作載盤翻面檢測系統的系統架構圖,分別顯示俯視圖與側視圖。Figures 7A and 7B are system architecture diagrams of the original disc turning detection system, showing a top view and a side view, respectively.
第八A圖至第八D圖是本創作上料翻轉機構執行上料翻轉操作的分解示意圖。Figures 8A to 8D are exploded schematic diagrams of the material feeding and turning mechanism of the present invention performing the material turning operation.
第九A圖至第九D圖是本創作下料翻轉機構執行下料翻轉操作的分解示意圖。 Figures 9A to 9D are exploded schematic diagrams of the blanking and turning mechanism of the present invention performing the blanking and turning operation.
4‧‧‧上料區 4‧‧‧ feeding area
5‧‧‧下料區 5‧‧‧cutting area
10‧‧‧塑膠盤 10‧‧‧Plastic plate
20‧‧‧精密盤 20‧‧‧Precision disk
30‧‧‧翻轉機構 30‧‧‧Flip mechanism
31‧‧‧旋轉軸 31‧‧‧rotation axis
32‧‧‧塑膠盤載具 32‧‧‧Plastic plate carrier
33‧‧‧精密盤載具 33‧‧‧Precision disk carrier
40‧‧‧光學影像檢測系統 40‧‧‧Optical image detection system
41‧‧‧影像拍攝系統 41‧‧‧Image shooting system
45‧‧‧檢測載台 45‧‧‧ Testing platform
Claims (10)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW108213811U TWM591166U (en) | 2019-10-18 | 2019-10-18 | Tray turnover detection system |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW108213811U TWM591166U (en) | 2019-10-18 | 2019-10-18 | Tray turnover detection system |
Publications (1)
Publication Number | Publication Date |
---|---|
TWM591166U true TWM591166U (en) | 2020-02-21 |
Family
ID=70414195
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
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TW108213811U TWM591166U (en) | 2019-10-18 | 2019-10-18 | Tray turnover detection system |
Country Status (1)
Country | Link |
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TW (1) | TWM591166U (en) |
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2019
- 2019-10-18 TW TW108213811U patent/TWM591166U/en unknown
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