TWM589282U - Antenna measurement mechanism - Google Patents

Abstract

An antenna measuring mechanism for measuring a millimeter-wave antenna. The millimeter-wave antenna has an electrically connected antenna and a feeding point. The measuring mechanism includes a turntable on which a stabilizer, a first controller, and a second Manipulator. The stabilizer is used to raise the millimeter wave antenna relative to the turntable. The antenna of the millimeter wave antenna is arranged upward and the feed point is arranged downward; the first controller is used to control a microscope head to align the millimeter wave antenna with the feed The side of the entry point; the second manipulator is used to control the probe to touch the feed point from bottom to top, thereby improving the measurement accuracy.

Description

Antenna measuring mechanism

This creation is related to measuring antennas; in particular, it refers to a mechanism for measuring antennas in the antenna system with a needle on the back.

Antennas made with millimeter wave technology, such as the fifth generation mobile communication technology (referred to as 5G) antennas, automobile collision avoidance radar antennas, millimeter wave image radar antennas, etc., because the performance goals of millimeter wave antennas are high data rate, reduced delay, and saving Energy, reduce costs, increase system capacity and connect large-scale devices, so related technologies are being developed, used and tested in full swing. Among them, taking the millimeter wave antenna as an example, because of its small size and large line attenuation, it is often used in the design of AiP (Antenna-in-package) or SiP (System in a Package) package to reduce the circuit caused by the circuit Loss, the antenna and RF components are integrated together, so there is no interface to test. The aforementioned millimeter wave antenna manufactured by AiP or SiP packaging technology forms the feed point on the side facing away from the antenna, so that the feed point can be directly electrically connected to the chip to reduce the volume. Therefore, how to measure millimeter wave antennas without interfaces through AiP or SiP packaging technology, and ensure the accuracy of the measurement, is the homework of the relevant industry.

In view of this, the purpose of this creation is to provide a mechanism for measuring the antenna in the antenna system with a dotted needle on the back, which is suitable for measuring the millimeter wave antenna with the feed point formed on the side facing away from the antenna, and can increase the amount Measuring accuracy.

In order to achieve the above object, the present invention provides an antenna measuring mechanism for measuring a millimeter wave antenna. The millimeter wave antenna has an antenna electrically connected to a feed point, and the measuring mechanism includes a rotatable turntable , A stabilizer, a first manipulator and a second manipulator are provided on the turntable. The stabilizer is used to raise the millimeter wave antenna relative to the turntable. The antenna of the millimeter wave antenna is arranged upward and the feed point is arranged downward; the first controller is used to control a microscope head to align the millimeter wave antenna with the feed The side of the entry point; the second manipulator is used to control the probe to contact the feed point from bottom to top.

The effect of this creation is to control the feeding point of the millimeter wave antenna from the bottom to the top of the probe, which can reduce undue interference in the measurement process to ensure the accuracy of the measurement and the symmetry of the radiation field shape.

This creation is used to measure millimeter wave antennas. The items for measuring antennas include 2D radiation pattern, 3D radiation pattern, antenna efficiency, antenna gain value, 3dB beam width and antenna directivity. This creative measurement method is carried out in the antenna system, using the back-pointing method to reduce the interference measurement factors to improve the measurement accuracy. As shown in Figure 1, the measurement method includes the following steps: Elevate the millimeter wave antenna so that the antenna of the millimeter wave antenna is facing upward and the feed point is facing downward, and then operate the probe to touch the feed point from the bottom up. Then, a transmitting/receiving antenna (horn antenna) is transmitted to the millimeter wave antenna to transmit signals, and the signals radiated by the millimeter wave antenna are received by the transmitting/receiving antenna. The aforementioned transmitting/receiving antenna moves in an arc-shaped trajectory.

Please refer to FIG. 2 and FIG. 3, the measuring mechanism 100 of the preferred embodiment used in the measuring method is set in an isolation room C, which is used to connect the millimeter wave antenna 200 and the environmental signal to be measured Isolate to reduce the interference of environmental signals and directly measure the signal of the millimeter wave antenna 200. The tested millimeter wave antenna in this embodiment is made by AiP or SiP packaging technology. The antenna and the feed point are located on the back-to-side side, which is the aforementioned millimeter The wave antenna 200 has an antenna 201 and a feeding point 202 (refer to FIG. 7) that are electrically connected and disposed opposite to each other. It should be noted that the object of this measurement method is the millimeter wave antenna with the antenna and the feed point located on the back-to-back side. It is not limited to those made with AiP or SiP packaging technology.

The measuring mechanism 100 is located below a swing arm 300. The swing arm 300 is composed of a beam 301 and two side arms 302, wherein the two side arms 302 are symmetrically connected to both ends of the beam 301, and the two side arms 302 One end of each is connected to a pivot 303, when the pivot 303 is controlled to rotate, the two side arms 302 generate a swing; the middle position of the beam 301 is installed with a transmission/reception antenna 304, the transmission/reception antenna 304 follows the rotation arm The swing of 300 moves in an arc-shaped trajectory. During the measurement process, the transmitting/receiving antenna 304 transmits signals to the millimeter wave antenna 200 under test, and simultaneously receives the radiation signals of the millimeter wave antenna to obtain the measurement result. In addition, in order to ensure the accuracy of the measurement, the placement of the millimeter wave antenna 200 is preferably located on the axis L passing through the center of rotation of the two side arms 302 and directly below the transmitting/receiving antenna 304 (FIG. 3 Reference).

4 and FIG. 5 again, the measuring mechanism 100 of the preferred embodiment of the present invention includes a shock-proof table 10, a motor 20, a turntable 30, a stabilizer 40, a first manipulator 50 and a second manipulator 60. The anti-vibration table 10 has a platform 12 and four legs 14. The four legs 14 are connected to the periphery of the platform 12 so that the platform 12 is elevated above the ground horizontally. The four legs 14 provide good platform 12 Anti-shock effect. The motor 20 is installed on the bottom surface of the platform 12. The turntable 30 is disposed above the platform 12 and driven by the motor 20 to rotate. The rotation may be cut in an indexing manner.

The stabilizer 40, the first manipulator 50 and the second manipulator 60 are disposed on the turntable 30 together and can rotate with the turntable 30. In this embodiment, the stabilizer 40, the first manipulator 50 and the second The manipulator 60 is combined with the turntable 30 in a vacuum suction mode, and then the vacuum suction function is individually turned on or off through a controller 70. In other words, the stabilizer 40, the first manipulator 50 and The placement position of the second manipulator 60 can be adjusted according to requirements, so that the measuring mechanism 100 can exert the maximum function. Of course, the stabilizer 40, the first manipulator 50 and the second manipulator 60 can also be selected Directly fixed on the turntable 30.

6 and FIG. 7, the stabilizer 40 includes two brackets 42 spaced apart. The two brackets 42 are connected to the turntable 30 at one end, and the other end of the two brackets 42 supports the millimeter wave antenna 200 together. In an embodiment, the two brackets 42 include a base post 421 and a movable post 422, wherein the bottom of the base post 421 is fixed on the turntable 30 by vacuum suction, and the movable post 422 is It can be docked with the base post 422 along the axial movement of the base post 421. Preferably, the movable post 422 is driven to move up and down in the axial direction by driving a knob 423 to produce a screw-in method; A clamping portion 422a is formed at one end of the movable post 422, and the millimeter wave antenna 200 bears between the clamping portions 422a of the two movable posts 422 and is pressed by a plurality of pressing pieces 424, the pressing pieces 424 is locked on the movable post 422 through the bolt 425, the antenna 201 of the clamped millimeter wave antenna 200 faces upward, and the feeding point 202 faces downward. The two brackets 42 support the millimeter wave antenna 200 together, and have the effect of adjusting the height position.

The first manipulator 50 disclosed in FIGS. 8 to 10 includes a three-axis stage 52 with three knobs and a holding seat 54. The bottom of the three-axis stage 52 is fixed on the turntable 30 by vacuum suction. A microscope head 56 is mounted on the holding base 54, and the microscope head 56 is located below the millimeter wave antenna 200 and between the two supports 42, so that the microscope head 56 is aligned with the side of the millimeter wave antenna 200 having the feed point 202 By rotating the three knobs of the three-axis stage 52 respectively, the holder 54 can be moved in the X, Y, and Z directions, and then the microscope head 56 can be moved to or away from the millimeter wave antenna 200 to change the focus position . As for the second manipulator 60, it includes a three-axis stage 62 with three knobs and a probe base 64. The bottom of the three-axis stage 62 is fixed on the turntable 30 by vacuum suction. A probe 66 is installed on the needle base 64. By rotating the three knobs of the three-axis stage 62, the probe base 64 can be driven to move in the X, Y, and Z directions, so that the lower probe 66 moves downward. The upper is close to the feeding point 202, and in the process of manipulating the movement of the lower probe 66, cooperate with the magnification and development of the microscope head 56 so that the lower probe 66 can accurately contact the feeding point 202. The aforementioned three-axis stage 52 of the first manipulator 50 and the three-axis stage 62 of the second manipulator 60 have the same structure, and all belong to a fine-tuning mechanism that can slowly and accurately control the displacement. However, in other embodiments, The three-axis translation stage 52 and the three-axis translation stage 62 may be composed of different mechanisms but still achieve the same purpose. In addition, it is further explained that the second manipulator 60 can optionally set an adjustment unit 68 between the three-axis translation stage 62 and the probe base 64, which is used to adjust the lower probe 66 before fine-tuning the lower probe 66. The probe 66 quickly moves close to the millimeter-wave antenna 200 to reduce the travel distance. In this embodiment, the adjustment unit 68 includes a slider 681 slidably coupled to a track 621 of the three-axis stage 62. And includes a knob 682 for fixing the slider 681 on the rail 621 when the slider 681 is adjusted to a predetermined height, the probe base 64 is coupled to the slider 681, and then the three-axis stage is used 62 to fine-tune the movement of the lower probe 66 to avoid an improper striker. The aforementioned knob 682 may be a bolt with a screw to achieve the locking purpose in a tightening and pressing manner.

The above is the description of the measurement mechanism 100 of the preferred embodiment of the creation. From the above, it can be known that elevating the millimeter wave antenna 200 with the antenna 201 facing upward helps the radiation signal to be received by the transmission/reception antenna 304 And the feeding point 202 of the millimeter wave antenna 200 faces downwards, and the lower probe 66 of the measuring mechanism 100 contacts the feeding point 202 from the bottom to the top in a needle-pointing manner on the back, and it will not cause any measurement Improper interference can ensure the accuracy of the measurement and the symmetry of the radiation pattern.

The above is only the preferred and feasible embodiment of the creation, and any equivalent changes in the application of the specification and the scope of patent application should be included in the scope of the patent of the creation.

[This creation] 100‧‧‧Measurement agency 10‧‧‧Shockproof table 12‧‧‧Platform 14‧‧‧ feet 20‧‧‧Motor 30‧‧‧Turntable 40‧‧‧Stabilizer 42‧‧‧Bracket 421‧‧‧Base pillar 422‧‧‧Activity column 422a‧‧‧Clamping Department 423‧‧‧ knob 424‧‧‧Pressure parts 425‧‧‧bolt 50‧‧‧ First controller 52‧‧‧Three-axis stage 54‧‧‧Retainer 56‧‧‧Microscope head 60‧‧‧ Second controller 62‧‧‧Three-axis stage 621‧‧‧ Orbit 64‧‧‧Probe 66‧‧‧ Lower probe 68‧‧‧Regulation unit 681‧‧‧slider 682‧‧‧ knob 70‧‧‧Controller 200‧‧‧mm wave antenna 300‧‧‧arm 301‧‧‧beam 302‧‧‧Side arm 303‧‧‧Pivot 304‧‧‧Transmit/receive antenna C‧‧‧Isolation Room

Figure 1 is a flow chart of the measurement steps of the creation; FIG. 2 is a perspective view of a measuring mechanism for measuring an antenna in an antenna system with a dotted back method according to a preferred embodiment; Figure 3 is a front view of Figure 2; 4 is a perspective view of a measuring mechanism of a preferred embodiment of the creation; Fig. 5 is a perspective view of the measuring mechanism in Fig. 4 omitting the shockproof table; FIG. 6 is a perspective view of the stabilizer in the measuring mechanism of the preferred embodiment; 7 is a front view of the stabilizer in the measuring mechanism of the preferred embodiment of the creation; Figure 8 is a front view showing the positional relationship between the first manipulator, the second manipulator and the millimeter wave antenna in the measuring mechanism; 9 is the positional relationship between the first manipulator and the millimeter wave antenna in the measuring mechanism of the preferred embodiment of the creation; 10 is another perspective view of the structure shown in FIG. 9; 11 is a positional relationship between the second manipulator and the millimeter wave antenna in the measuring mechanism of the preferred embodiment of the present invention; FIG. 12 is another perspective view of the structure shown in FIG. 11.

100‧‧‧Measurement agency

10‧‧‧Shockproof table

12‧‧‧Platform

14‧‧‧ feet

30‧‧‧Turntable

42‧‧‧Bracket

50‧‧‧ First controller

60‧‧‧ Second controller

70‧‧‧Controller

200‧‧‧mm wave antenna

Claims (8)

An antenna measuring mechanism for measuring a millimeter-wave antenna. The millimeter-wave antenna has an antenna electrically connected and a feeding point. The measuring mechanism includes: A rotatable turntable; A stabilizer is installed on the turntable. The stabilizer is used to raise the millimeter wave antenna relative to the turntable. The antenna of the millimeter wave antenna is arranged upward and the feeding point is downward; A first manipulator disposed on the turntable to control a microscope head to align with the side of the millimeter wave antenna having the feed point; and A second manipulator is arranged on the turntable to control the probe to contact the feed point from bottom to top. The antenna measurement mechanism according to claim 1, wherein the stabilizer includes two brackets spaced apart, one end of the two brackets is connected to the turntable, and the other end of the two brackets jointly supports the millimeter wave antenna; the microscope head and The lower probe is located below the millimeter wave antenna and between the two brackets. The antenna measurement mechanism according to claim 2, wherein the two brackets respectively include a base post and a movable post, the base post is fixed on the turntable, and the movable post can move along the axial direction of the base post The ground is docked with the base post, and the movable post has a clamping portion for fixing the millimeter wave antenna. The antenna measurement mechanism according to claim 1, wherein the first manipulator includes a three-axis displacement stage and a holding base, and the three-axis displacement stage drives the holding base to move in the X, Y, and Z directions, and the holding Mount the microscope head on the base. The antenna measuring mechanism according to claim 1, wherein the second manipulator includes a three-axis displacement stage and a probe base, and the three-axis displacement stage drives the probe base to move in the X, Y, and Z directions, The lower probe is installed on the probe base. The antenna measurement mechanism according to claim 5, wherein the second manipulator includes an adjustment unit disposed between the triaxial stage and the probe base, the adjustment unit has a knob for adjusting the probe base the height of. The antenna measurement mechanism according to any one of claims 1 to 6, including a shock-proof table, the shock-proof table has a platform set above the ground, the turntable is set above the platform, and a motor is set under the platform, the motor Drive the turntable to rotate. The antenna measuring mechanism according to claim 1, wherein the stabilizer, the first manipulator and the second manipulator are combined on the turntable by vacuum adsorption.

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