CN112444684A

CN112444684A - Method and measuring mechanism for measuring antenna in antenna system in back point needle mode

Info

Publication number: CN112444684A
Application number: CN201910827056.7A
Authority: CN
Inventors: 颜坤昱
Original assignee: Feist Technology Industry Co ltd
Current assignee: Feist Technology Industry Co ltd
Priority date: 2019-09-03
Filing date: 2019-09-03
Publication date: 2021-03-05

Abstract

An antenna measuring mechanism for measuring a millimeter wave antenna, the millimeter wave antenna having an electrically connected antenna and a feed-in point, the measuring mechanism comprising a turntable, the turntable being provided with a stabilizer, a first controller and a second controller. Wherein the stabilizer is used to elevate the millimeter wave antenna relative to the turntable, the antenna of the millimeter wave antenna is disposed upward, and the feed point is disposed downward; the first controller is used for controlling a micro lens to be aligned to one surface of the millimeter wave antenna with the feed-in point; the second manipulator is used for controlling a lower probe to contact the feed-in point from bottom to top; the invention further provides a method for measuring an antenna in an antenna system by using a back point probe mode, so as to improve the measurement accuracy.

Description

Method and measuring mechanism for measuring antenna in antenna system in back point needle mode

Technical Field

The invention relates to a measuring antenna; in particular to a method for measuring an antenna in an antenna system by a back point needle mode and a measuring mechanism thereof.

Background

Antennas manufactured by millimeter wave technology, such as antennas of the fifth generation mobile communication technology (5G for short), anti-collision radar antennas for automobiles, millimeter wave image radar antennas, etc., are being developed, used, and detected as related technologies are being vigorously developed, applied, and detected because the performance goal of millimeter wave antennas is high data rate, reduced delay, energy saving, reduced cost, increased system capacity, and large-scale device connection. In the millimeter wave Antenna, because of its small size and large line attenuation, AiP (Antenna-in-package) or sip (system in a package) is often used in design to reduce the loss caused by the circuit, and the Antenna and the rf component are integrated together, so there is no interface to perform the test. The millimeter wave antenna manufactured by AiP or SiP packaging technology forms the feed point on the side opposite to the antenna, so that the feed point can be directly electrically connected with the chip to achieve the purpose of reducing the volume. Therefore, how to measure the millimeter wave antenna without an interface manufactured by AiP or SiP packaging technology and ensure the measurement accuracy is a lesson of the related practitioners.

Disclosure of Invention

In view of the above, the present invention provides a method for measuring an antenna in an antenna system by a back point probe method and a measuring mechanism thereof, which are suitable for measuring a millimeter wave antenna having a feed point formed on a side opposite to the antenna and can improve the measurement accuracy.

In view of achieving the above object, the present invention provides an antenna measuring mechanism for measuring a millimeter wave antenna, the millimeter wave antenna having an antenna and a feed-in point electrically connected thereto, the measuring mechanism comprising a rotatable turntable, the turntable being provided with a stabilizer, a first manipulator and a second manipulator. The stabilizer is used for elevating the millimeter wave antenna relative to the turntable, the antenna of the millimeter wave antenna is arranged upwards, and the feed point is arranged downwards; the first controller is used for controlling a micro lens to be aligned to one surface of the millimeter wave antenna with the feed-in point; the second manipulator is used for controlling a lower probe to contact the feed-in point from bottom to top.

The invention further provides a method for measuring an antenna in an antenna system in a back point needle mode, which is to measure a millimeter wave antenna in an isolation chamber, wherein the millimeter wave antenna is provided with an antenna and a feed-in point which are electrically connected; controlling a lower probe to contact the feed-in point from bottom to top; starting a rotating arm, wherein a transmitting/receiving antenna is arranged on the rotating arm, the transmitting/receiving antenna is positioned above the millimeter wave antenna and receives signals radiated by the millimeter wave antenna along with the swinging of the rotating arm in an arc track.

The invention has the advantages that the lower probe is controlled to contact the feed-in point of the millimeter wave antenna from bottom to top, so that the improper interference in the measurement process can be reduced, and the measurement accuracy and the symmetry of the radiation pattern can be ensured.

Drawings

FIG. 1 is a flow chart of the measurement steps of the present invention;

FIG. 2 is a perspective view of a measuring mechanism for measuring an antenna in an antenna system by a back point method according to a preferred embodiment of the present invention;

FIG. 3 is a front view of FIG. 2;

FIG. 4 is a perspective view of a measuring mechanism according to a preferred embodiment of the present invention;

FIG. 5 is a perspective view of the measurement mechanism of FIG. 4 with the shock table omitted;

FIG. 6 is a perspective view of a stabilizer in the measuring mechanism of the preferred embodiment of the present invention;

FIG. 7 is a front view of a stabilizer in the measuring mechanism of the preferred embodiment of the present invention;

fig. 8 is a front view illustrating a positional relationship between the first manipulator, the second manipulator and the millimeter wave antenna in the measuring mechanism;

FIG. 9 is a schematic diagram illustrating a position relationship between a first manipulator and a millimeter wave antenna in the measuring mechanism according to the preferred embodiment of the present invention;

FIG. 10 is a perspective view of an alternate angle of the structure shown in FIG. 9;

fig. 11 is a diagram illustrating a positional relationship between a second manipulator and a millimeter wave antenna in the measuring mechanism according to the preferred embodiment of the present invention;

fig. 12 is a perspective view of another angle of the structure shown in fig. 11.

Detailed Description

The invention is used for measuring millimeter wave antenna, and the items of the antenna include 2D radiation field shape, 3D radiation field shape, antenna efficiency, antenna gain value, 3dB lobe width (3dB beam width), antenna directivity and the like. The measuring method is carried out in an antenna system, and factors interfering measurement are reduced by adopting a back point probe mode so as to improve the measuring accuracy. Referring to fig. 1, the measurement method of the present invention includes the following steps: the millimeter wave antenna is elevated, the antenna of the millimeter wave antenna faces upwards, the feed point faces downwards, then a lower probe is controlled to contact the feed point from bottom to top, then a transmitting/receiving antenna (horn antenna) faces to the millimeter wave antenna to transmit signals, the signals radiated by the millimeter wave antenna are received by the transmitting/receiving antenna, and the transmitting/receiving antenna moves along an arc track.

Referring to fig. 2 and 3, the measuring mechanism 100 according to the preferred embodiment of the measuring method of the present invention is disposed in an isolation chamber C, which is used to isolate the measured millimeter wave antenna 200 from the environmental signal, so as to reduce the environmental signal interference and directly measure the signal of the millimeter wave antenna 200, the measured millimeter wave antenna of the present embodiment is manufactured by AiP or SiP packaging technology, and the antenna and the feeding point are located on opposite sides, that is, the millimeter wave antenna 200 has an antenna 201 and a feeding point 202 (see fig. 7) electrically connected and oppositely disposed. It should be noted that the object of the present invention is to provide a millimeter wave antenna with the feeding point on the opposite side, and the present invention is not limited to AiP or SiP packaging technology.

The measuring mechanism 100 is located below a swing arm 300, the swing arm 300 is composed of a cross beam 301 and two side arms 302, wherein the two side arms 302 are symmetrically connected to two ends of the cross beam 301, and one end of each of the two side arms 302 is connected to a pivot 303, when the pivot 303 is controlled to rotate, the two side arms 302 swing; the middle of the beam 301 is installed with a transmitting/receiving antenna 304, the transmitting/receiving antenna 304 moves along an arc track with the swing of the swing arm 300, during the measurement, the transmitting/receiving antenna 304 transmits a signal to the millimeter wave antenna 200 to be measured, and receives a radiation signal of the millimeter wave antenna to obtain a measurement result. In addition, in order to ensure the accuracy of measurement, the placement position of the millimeter-wave antenna 200 is preferably located on the axis L passing through the rotation centers of the two side arms 302 and directly below the transmitting/receiving antenna 304 (refer to fig. 3).

Referring to fig. 4 and 5, a measuring mechanism 100 according to a preferred embodiment of the present invention includes a shockproof table 10, a motor 20, a turntable 30, a stabilizer 40, a first manipulator 50 and a second manipulator 60. The anti-vibration table 10 has a platform 12 and four legs 14, the four legs 14 are connected to the periphery of the platform 12 to make the platform 12 horizontally elevated with respect to the ground, and the four legs 14 provide a good anti-vibration effect to the platform 12. The motor 20 is mounted on the bottom surface of the platform 12, and the turntable 30 is disposed above the platform 12 and driven by the motor 20 to rotate, which may be in an indexing manner.

The stabilizer 40, the first manipulator 50 and the second manipulator 60 are disposed on the turntable 30 and can rotate along with the turntable 30, in this embodiment, the stabilizer 40, the first manipulator 50 and the second manipulator 60 are combined on the turntable 30 in a vacuum absorption manner, and then the vacuum absorption function is respectively turned on or off through a controller 70, which is easy to say, the placement positions of the stabilizer 40, the first manipulator 50 and the second manipulator 60 in this embodiment can be adjusted as required to make the measuring mechanism 100 exert the maximum use function, and of course, the stabilizer 40, the first manipulator 50 and the second manipulator 60 can also be selected to be directly fixed on the turntable 30.

As shown in fig. 6 and 7, the stabilizer 40 includes two brackets 42 disposed at an interval, one end of each of the two brackets 42 is connected to the turntable 30, and the other ends of the two brackets 42 jointly support the millimeter wave antenna 200. In one embodiment, the two supports 42 respectively include a base column 421 and a movable column 422, wherein the base column 421 is fixed to the turntable 30 by vacuum suction at the bottom, and the movable column 422 is connected to the base column 422 in a manner of being capable of moving along the axial direction of the base column 421, preferably, the movable column 422 is driven to move up and down along the axial direction by driving a knob 423 to generate screwing; in addition, a clamping portion 422a is formed at one end of the movable column 422, the millimeter wave antenna 200 is supported between the clamping portions 422a of the two movable columns 422 and pressed by a plurality of pressing members 424, the pressing members 424 are locked on the movable columns 422 through bolts 425, the antenna 201 of the clamped millimeter wave antenna 200 faces upward, and the feed point 202 faces downward. The two brackets 42 support the millimeter wave antenna 200 together, and have the effect of adjusting the height position.

The first manipulator 50 disclosed in fig. 8 to 10 includes a three-axis stage 52 with three knobs and a holder 54, the bottom of the three-axis stage 52 is fixed on the turntable 30 by vacuum absorption, a micro-lens 56 is mounted on the holder 54, the micro-lens 56 is located below the millimeter-wave antenna 200 and between the two brackets 42, such that the micro-lens 56 is aligned with the plane of the millimeter-wave antenna 200 having the feed-in point 202, the holder 54 can be driven to move in the direction X, Y, Z by rotating the three knobs of the three-axis stage 52, and the micro-lens 56 is controlled to move to or away from the millimeter-wave antenna 200 to change the focusing position. The second manipulator 60 includes a three-axis displacement table 62 with three knobs and a probe base 64, the bottom of the three-axis displacement table 62 is fixed on the turntable 30 by vacuum absorption, a lower probe 66 is mounted on the probe base 64, the probe base 64 can be driven to move in the direction X, Y, Z by rotating the three knobs of the three-axis displacement table 62 respectively, so that the lower probe 66 approaches the feed point 202 from bottom to top, and in the process of controlling the movement of the lower probe 66, the lower probe 66 can accurately contact the feed point 202 in cooperation with the magnification development of the microscope 56. The three-axis displacement table 52 of the first manipulator 50 and the three-axis displacement table 62 of the second manipulator 60 have the same structure, and both belong to a fine adjustment mechanism, which can control the displacement precisely in a gradual step manner, however, in other embodiments, the three-axis displacement table 52 and the three-axis displacement table 62 may be composed of different mechanisms and still achieve the same purpose. It should be noted that the second manipulator 60 can also optionally provide an adjusting unit 68 between the three-axis moving stage 62 and the probe seat 64 for rapidly moving the lower probe 66 close to the mm-wave antenna 200 to reduce the moving stroke before fine adjustment of the lower probe 66, in this embodiment, the adjusting unit 68 includes a slider 681 slidably coupled to a rail 621 of the three-axis moving stage 62, and a knob 682 for fixing the slider 681 to the rail 621 when the slider 681 is adjusted to a predetermined height, the slider 681 being coupled to the probe seat 64, and then fine adjustment of the lower probe 66 via the three-axis moving stage 62 to avoid an improper firing pin, the knob 682 can be a bolt with a screw for tightening and tightening the bolt to achieve the locking purpose.

As described above for the measuring mechanism 100 according to the preferred embodiment of the present invention, it can be known that raising the mm wave antenna 200 with the antenna 201 facing upward helps the radiated signal to be received by the transmitting/receiving antenna 304, and the feeding point 202 of the mm wave antenna 200 facing downward contacts the feeding point 202 from bottom to top in a back-point manner with the lower probe 66 of the measuring mechanism 100, which will not cause undue interference to the measurement and can ensure the measurement accuracy and the symmetry of the radiation pattern.

The above description is only a preferred embodiment of the present invention, and all equivalent changes and modifications to the present invention as described and claimed should be included in the scope of the present invention.

Description of the reference numerals

[ invention ]

100 measuring mechanism

10 shockproof table

12 platform 14 foot

20 Motor

30 rotating disc

40 stabilizer

42 support 421 base 422 movable column

422a clamping part 423 knob 424 pressing piece

425 bolt

50 first manipulator

52 three-axis displacement table 54 holder 56 microscope lens

60 second manipulator

62 triaxial displacement table 621 orbit 64 probe seat

66 lower probe 68 adjusting unit 681 slider

682 knob

70 controller

200 millimeter wave antenna

300 spiral arm

301 crossbeam 302 side arm

303 pivot 304 transmit/receive antenna

C isolation chamber

Claims

1. An antenna measuring mechanism for measuring a millimeter wave antenna having an antenna and a feed-in point electrically connected, the measuring mechanism comprising:

a rotatable turntable;

the stabilizer is arranged on the turntable and used for elevating the millimeter wave antenna relative to the turntable, the antenna of the millimeter wave antenna is arranged upwards, and the feed point is arranged downwards;

the first manipulator is arranged on the turntable and used for controlling a micro lens to align to one surface of the millimeter wave antenna with the feed-in point; and

the second manipulator is arranged on the turntable and used for controlling a lower probe to contact the feed-in point from bottom to top.

2. The antenna measuring mechanism according to claim 1, wherein the stabilizer comprises two supports arranged at intervals, one ends of the two supports are connected to the turntable, and the other ends of the two supports jointly support the millimeter wave antenna; the microscope lens and the lower probe are located below the millimeter wave antenna and between the two supports.

3. The antenna measuring mechanism according to claim 2, wherein the two supports respectively include a base post fixed to the turntable and a movable post movably butted against the base post along an axial direction of the base post, the movable post having a holding portion for holding the millimeter wave antenna.

4. The antenna measuring mechanism of claim 1, wherein the first manipulator comprises a three-axis stage and a holder, the three-axis stage drives the holder to move in X, Y, Z direction, and the holder is mounted with the micro lens.

5. The antenna measuring mechanism of claim 1, wherein the second manipulator comprises a triaxial displacement stage and a probe base, the triaxial displacement stage moves the probe base in X, Y, Z direction, and the lower probe is mounted on the probe base.

6. The antenna measuring mechanism of claim 5, wherein the second manipulator comprises an adjusting unit disposed between the triaxial displacement stage and the probe mount, the adjusting unit having a knob for adjusting the height of the probe mount.

7. An antenna measuring mechanism as claimed in any one of claims 1 to 6, which includes a shock table having a platform elevated relative to the ground, the turntable being disposed above the platform and a motor disposed below the platform, the motor driving the turntable to rotate.

8. The antenna measuring mechanism of claim 1, wherein the stabilizer, the first manipulator and the second manipulator are vacuum-suction-bonded to the turntable.

9. A method for measuring an antenna in an antenna system by a back point probe method is to measure a millimeter wave antenna in an isolation chamber, wherein the millimeter wave antenna is provided with an antenna and a feed-in point which are electrically connected, and the method comprises the following steps:

raising the millimeter wave antenna to enable the antenna of the millimeter wave antenna to face upwards and the feed point to face downwards;

controlling a lower probe to contact the feed-in point from bottom to top;

and starting a rotating arm, wherein a transmitting/receiving antenna is arranged on the rotating arm, is positioned above the millimeter wave antenna and receives signals radiated by the millimeter wave antenna along with the swinging of the rotating arm in an arc track.

10. The method for back-pointing antenna measurement in an antenna system of claim 9 wherein said millimeter wave antenna is elevated above a turntable, said turntable being controlled for rotation.

11. The method of claim 10, wherein the radial arm comprises a beam and side arms connected to two ends of the beam, the two side arms are connected to a pivot at one end and the two side arms are pivoted around the pivot, and the transmitting/receiving antenna is mounted on the beam.