TWM588593U - Compression fixture - Google Patents

Compression fixture Download PDF

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TWM588593U
TWM588593U TW108211337U TW108211337U TWM588593U TW M588593 U TWM588593 U TW M588593U TW 108211337 U TW108211337 U TW 108211337U TW 108211337 U TW108211337 U TW 108211337U TW M588593 U TWM588593 U TW M588593U
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mold
pressing
lower mold
component
module
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王裕賢
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竑騰科技股份有限公司
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Abstract

一種壓合治具,其包括下模、設於下模上方的上模,以及設於上模中能上下運動的活動壓塊,下模與能相對於上模上下運動,其中利用下模之下模本體頂部設置分別對應活動壓塊之下模塊,每一下模塊於其實質為矩形之模塊基部四角隅分別形成延伸支撐部,四個延伸支撐部的外周緣延伸至對應待壓物件之元件定位區的邊界,藉此,使每一下模塊能對其承載的待壓合物件的邊角部位提供佳的支撐性能,讓待壓合物件周邊各角隅處能於壓合治具中接受足夠的壓合力量而達到較佳的熱壓合效果,以避免壓合後物件邊角因壓合力量不足而發生翹曲之問題。A pressing jig includes a lower mold, an upper mold provided above the lower mold, and a movable pressing block provided in the upper mold which can move up and down. The lower mold can move up and down relative to the upper mold. The top of the lower mold body is respectively provided with a module corresponding to the movable pressing block, and each lower module forms an extension support part at the four corners of the substantially rectangular module base, and the outer edges of the four extension support parts extend to the components corresponding to the object to be pressed. The boundary of the zone, so that each lower module can provide good support performance for the corners of the pieces to be pressed, so that the corners around the pieces to be pressed can receive enough in the pressing fixture The pressing force can achieve a better hot pressing effect to avoid the problem of the warpage of the object corner after pressing due to insufficient pressing force.

Description

壓合治具Pressing fixture

本新型係關於一種壓合治具,尤指一種應用於包含基板與散熱片之半導體元件或其他元件之壓合作業使用之壓合裝置中,基板與散熱片能完全平貼之壓合治具。The present invention relates to a pressing jig, especially a pressing jig used in the pressing industry of semiconductor components including substrates and heat sinks or other components, where the substrate and the heat sink can be completely flat .

如高頻半導體元件等,其工作通常會伴隨著產生的高溫。為確保半導體元件能處於適當的工作溫度下運作,避免因高溫而損毁或降低其性能,除了須利用外部的散熱機構提供冷卻散熱效果之外,基於散熱性能的需求,現有半導體元件本身之構裝結構中,通常在其具有半導體晶片的基板上增設散熱片,藉以使具有半導體晶片的基板產生的熱通過散熱片擴大散熱表面積而輔助散熱。Such as high-frequency semiconductor components, etc., its work is usually accompanied by high temperature. In order to ensure that the semiconductor element can operate at an appropriate operating temperature, to avoid damage or degradation of its performance due to high temperature, in addition to the need to use an external heat dissipation mechanism to provide cooling and heat dissipation effects, based on the requirements of heat dissipation performance, the existing semiconductor element itself is constructed In the structure, a heat sink is usually added on the substrate with a semiconductor wafer, so that the heat generated by the substrate with the semiconductor wafer expands the heat dissipation surface area through the heat sink to assist heat dissipation.

目前半導體元件構裝製程之基板上壓合散熱片程序中,其需於具有半導體晶片的基板頂面周緣先行塗佈導熱膠,再將散熱片預貼合於該基板上,再將已貼合有散熱片的半導體元件置放於元件承載盤上,藉由元件承載盤承載而移置於半導體元件壓合機的壓合治具中,由壓合治具中之上模與下模相對壓合半導體元件的基板與散熱片及加熱作用,完成熱壓合步驟後,將置放有半導體元件的元件承載盤自半導體元件壓合機中取出。In the current process of pressing the heat sink on the substrate of the semiconductor device assembly process, it is necessary to apply the thermal conductive adhesive on the periphery of the top surface of the substrate with the semiconductor chip first, then pre-attach the heat sink to the substrate, and then attach the heat sink The semiconductor component with heat sink is placed on the component carrier tray, and is carried by the component carrier tray and placed in the pressing jig of the semiconductor component pressing machine, and the upper die and the lower die are pressed against each other by the pressing jig After combining the substrate of the semiconductor element with the heat sink and the heating effect, after completing the thermal compression step, the component carrier plate on which the semiconductor element is placed is taken out of the semiconductor component pressing machine.

前述半導體元件壓合機中之壓合治具,雖能藉由推頂機構對下模提供向上推頂力量以及壓力供給機構對上模的壓塊提供向下壓力,使壓合治具之上模中的壓塊與下模能將半導體元件的散熱片熱壓固定於基板上,但是現有半導體元件壓合機中之壓合治具之構造,對半導體元件的散熱片與基板的執行壓合作用時,壓合治具僅能對散熱片與基板相對貼合的中間區域施以熱壓合作用,難以擴及至基板與散熱片相對貼合部位的周邊及各角隅處,造成基板與散熱片相對貼合部位的各角隅部位未受到足夠的壓合力量,以及熱壓動作中之薄形基板與散熱片受熱變形的影響,使得熱壓合後半導體元件的散熱片與基板相對貼合部位的各角隅部位易發生翹曲現象,不僅影響半導體元件之外觀品質,也使半導體晶片的基板中的熱難以均衡地傳導至散熱片上散熱,而會發生散熱不均的現象,實有進一步克服改善之必要。Although the pressing jig in the aforementioned semiconductor device pressing machine can provide an upward pushing force to the lower mold by the pushing mechanism and the pressure supply mechanism provides downward pressure to the pressing block of the upper mold, the pressing jig The pressing block and the lower mold in the mold can thermally fix the heat sink of the semiconductor element on the substrate, but the structure of the pressing jig in the existing semiconductor element pressing machine performs the pressure cooperation between the heat sink of the semiconductor element and the substrate When used, the pressing jig can only apply heat and pressure to the middle region where the heat sink and the substrate are relatively bonded, and it is difficult to extend to the periphery of the part where the substrate and the heat sink are relatively bonded and the corners, resulting in the substrate and the heat dissipation The corner parts of the relative bonding parts of the sheet are not subjected to sufficient pressing force, and the thin substrate and the heat sink during the hot pressing operation are affected by thermal deformation, so that the heat sink of the semiconductor element and the substrate are relatively bonded after the hot pressing The corners of the parts are prone to warp, which not only affects the appearance quality of the semiconductor element, but also makes it difficult for the heat in the substrate of the semiconductor chip to be uniformly transmitted to the heat sink to dissipate heat, resulting in uneven heat dissipation, which is further Overcome the need for improvement.

本新型之目的在於提供一種壓合治具,用以解決現有壓合治具難以對被壓合之物件周邊各角隅處提供足夠的壓合力量而易發生翹曲現象之問題。The purpose of the present invention is to provide a pressing jig to solve the problem that it is difficult for the existing pressing jig to provide sufficient pressing force to the corners around the object to be warped, and warping is easy to occur.

為了達成前述目的,本新型所提出之壓合治具係包括一下模、設於該下模上方的一上模,以及設於該上模中能上下運動的至少一活動壓塊,該下模與能相對於該上模上下運動,其中: 該下模包括: 一下模本體,其界定有一載盤定位區間以及位於該載盤定位區間內之至少一元件定位區: 至少一下模塊,其係設於該下模本體的頂面且位於所述元件定位區內向上凸伸,所述下模塊包括一模塊基部以及四延伸支撐部,該模塊基部實質為一矩形塊體,該模塊基部之各周邊與其側鄰之所述元件定位區的邊界各具有一間距,該四個延伸支撐部分別形成於該模塊基部的四個角隅處且朝外凸伸,該四個延伸支撐部的外周緣實質延伸至所述元件定位區的邊界;以及 至少一氣流通道,其係設於該下模本體中且延伸至所述下模塊的頂面而形成一抽氣孔; 該上模包括一上模板,該上模板中形成至少一通孔,所述通孔之數量及位置相對應於該下模的元件定位區; 所述活動壓塊係能上下運動地設置於該上模之通孔中,且每一所述活動壓塊的位置對應其下方的一所述下模塊,所述活動壓塊底面與相應的下模塊的頂面平行且能上下相對位移。 In order to achieve the foregoing purpose, the press-fitting jig proposed by the present invention includes a lower mold, an upper mold provided above the lower mold, and at least one movable pressing block provided in the upper mold capable of moving up and down. And can move up and down relative to the upper die, where: The die includes: The lower mold body defines a carrier positioning area and at least one component positioning area within the carrier positioning area: At least one lower module, which is disposed on the top surface of the lower mold body and protrudes upward in the component positioning area, the lower module includes a module base and four extended support parts, the module base is substantially a rectangular block , Each periphery of the module base and the boundary of the component positioning area adjacent to it have a distance respectively, and the four extension support portions are formed at four corners of the module base and protrude outward, the four The outer periphery of the extension support portion extends substantially to the boundary of the element positioning area; and At least one air flow channel, which is disposed in the lower mold body and extends to the top surface of the lower module to form an air extraction hole; The upper mold includes an upper template, at least one through hole is formed in the upper template, the number and position of the through holes correspond to the component positioning area of the lower mold; The movable pressing block is disposed in the through hole of the upper mold so as to be able to move up and down, and the position of each of the movable pressing blocks corresponds to a lower module below it, and the bottom surface of the movable pressing block and the corresponding lower The top surface of the module is parallel and can be relatively displaced up and down.

藉由前述壓合治具之創作,其主要係利用下模之下模本體頂部設置分別對應活動壓塊之下模塊,每一下模塊於其實質呈矩形的模塊基部四角隅分別形成延伸支撐部,四個延伸支撐部的外周緣延伸至對應待壓物件之元件定位區的邊界,藉此,使每一下模塊能對其承載的待壓合物件的邊角部位提供佳的支撐性能,讓待壓合物件周邊各角隅處能於壓合治具中接受足夠的壓合力量而達到較佳的熱壓合效果,以避免壓合後物件邊角因壓合力量不足而發生翹曲之問題。Through the creation of the above-mentioned pressing jig, it mainly uses the top of the lower body of the lower mold to provide modules respectively corresponding to the movable pressing blocks. Each lower module forms an extension support portion at the four corners of the substantially rectangular module base, The outer edges of the four extension support parts extend to the boundary of the component positioning area corresponding to the object to be pressed, thereby enabling each lower module to provide good support performance to the corners of the object to be pressed carried by the lower module. The corners around the composite part can receive enough pressing force in the pressing jig to achieve better hot pressing effect, so as to avoid the problem of warpage of the object corner after pressing due to insufficient pressing force.

本新型壓合治具中,還可進一步包括一中模,該中模係能上下運動地設置於上模與下模之間,該中模於其中模板中形成至少一對位孔,每一所述對位孔相對應於該下模的元件定位區,且能與上模位置對應的通孔相連通,對位孔之底緣形成由內朝外側向傾斜的導斜面,藉以使被頂升的待壓合物件對位置入於中模板的對位孔內,接受上方的活動壓塊施加之下壓力量,確保待壓合物件於壓合過程中,待壓合物件中之部件能確實對正壓合而不致發生部件偏斜之問題。The novel pressing jig can further include a middle mold, which can be disposed between the upper mold and the lower mold so as to move up and down. The middle mold forms at least one pair of positioning holes in the template, each The alignment hole corresponds to the component positioning area of the lower mold, and can communicate with the through hole corresponding to the position of the upper mold, and the bottom edge of the alignment hole forms a sloped surface inclined from the inside to the outside, so as to be topped The position of the to-be-laminated piece is placed in the alignment hole of the middle template, and the lower pressure amount is applied by the upper movable block to ensure that the to-be-laminated piece can be surely in the laminating process. The problem of positive deflection without component deflection.

如圖1所示,其揭示本新型壓合治具之一較佳實施例,由圖式中可見及,該壓合治具30係配合一元件承載盤10及其上承載之至少一待壓合的半導體元件20而設定的。其中,所述元件承載盤10界定有至少一元件置放區11,所述元件承載盤10於每一元件置放區11放置一半導體元件20,所述元件承載盤10於每一元件置放區11中形成一元件孔111、分布於該元件孔111四側邊的承載邊112,以及位於元件孔111四個角隅處且與元件孔111相連通的貫穿孔113,所述元件承載盤10周邊還具有複數對位貫孔115,所述元件藉由承載邊112承載半導體元件20,並藉由每一元件置放區11周邊的多個定位針114對待壓合之半導體元件20作初步定位。As shown in FIG. 1, it discloses a preferred embodiment of the new pressing jig. As can be seen from the drawings, the pressing jig 30 cooperates with a component carrying tray 10 and at least one to-be-pressed bearing thereon The semiconductor element 20 is set in combination. The component carrier tray 10 defines at least one component placement area 11, the component carrier tray 10 places a semiconductor component 20 in each component placement area 11, and the component carrier tray 10 is placed on each component A component hole 111, a supporting edge 112 distributed on four sides of the component hole 111, and a through hole 113 located at four corners of the component hole 111 and communicating with the component hole 111 are formed in the area 11 10 There are a plurality of alignment through holes 115 on the periphery, the device carries the semiconductor device 20 through the carrying edge 112, and the positioning of the semiconductor device 20 to be pressed by a plurality of positioning pins 114 around each device placement area 11 Positioning.

如圖1所示,該壓合治具30包括一下模40、一上模50以及至少一活動壓塊60。As shown in FIG. 1, the pressing fixture 30 includes a lower die 40, an upper die 50 and at least one movable pressing block 60.

如圖1及圖2所示,該下模40包括一下模本體41、至少一下模塊42以及至少一氣流通道,該下模本體41界定有一載盤定位區間400以及位於該載盤定位區間400內之至少一元件定位區401,所述元件定位區401的數量係依據該元件承載盤10所承載之半導體元件的數量而設定,且所述元件定位區401係對應於半導體元件的外形及尺寸,所述下模塊42係設於該下模本體41的頂面且位於所述元件定位區401內向上凸伸,所述氣流通道設於下模本體41中且延伸至所述下模塊42的頂面而形成一抽氣孔43。As shown in FIGS. 1 and 2, the lower mold 40 includes a lower mold body 41, at least a lower module 42 and at least one air flow channel. The lower mold body 41 defines a carrier positioning section 400 and is located in the carrier positioning section 400 At least one element positioning area 401, the number of the element positioning areas 401 is set according to the number of semiconductor elements carried by the element carrier 10, and the element positioning area 401 corresponds to the shape and size of the semiconductor element, The lower module 42 is disposed on the top surface of the lower mold body 41 and protrudes upward in the component positioning area 401, and the airflow channel is disposed in the lower mold body 41 and extends to the top of the lower module 42面而形成一个抽孔孔43。 Forming a suction hole 43.

如圖1及圖2所示,前述中,每一所述下模塊42係能通過元件承載盤10中預設的一元件孔111,用以承載一半導體元件20,所述下模塊42包括一模塊基部421以及四延伸支撐部422,該模塊基部421實質為一矩形塊體,該模塊基部421之各周邊與其側鄰之所述元件定位區的邊界各具有一間距,亦即該模塊基部421的頂面的面積略小於半導體元件底部的底面積,該四個延伸支撐部422分別形成於該模塊基部421的四個角隅處且朝外凸伸,且該四個延伸支撐部422的外周緣實質延伸至所述元件定位區401的邊界,所述下模塊42能通過所述元件承載盤10之元件孔111及其四角隅處相連通的貫穿孔113。As shown in FIGS. 1 and 2, in the foregoing, each of the lower modules 42 can pass through a component hole 111 preset in the component carrier tray 10 for supporting a semiconductor component 20. The lower module 42 includes a The module base 421 and the four extended support parts 422 are substantially rectangular blocks. Each periphery of the module base 421 and the boundary of the component positioning area adjacent to the module base 421 have a distance, that is, the module base 421 The area of the top surface is slightly smaller than the bottom area of the bottom of the semiconductor device. The four extension support portions 422 are formed at four corners of the module base 421 and protrude outward, and the outer periphery of the four extension support portions 422 The edge substantially extends to the boundary of the component positioning area 401, and the lower module 42 can pass through the component hole 111 of the component carrier tray 10 and the through hole 113 communicating with its four corners.

如圖1及圖2所示,前述中,所述下模本體41的頂面之相對兩側於該載盤定位區間400的邊界外緣處各形成向上凸伸的至少一載盤限位擋部411,該下模本體41的頂面於該載盤定位區間400內相對於所述元件定位區401外圍處分布設置複數對位穿設柱412,該下模本體41的頂部於載盤定位區間400內設置複數伸縮支撐組件413。As shown in FIGS. 1 and 2, in the foregoing, opposite sides of the top surface of the lower die body 41 form at least one carrier plate stopper projecting upward at the outer edge of the boundary of the carrier plate positioning section 400 Part 411, the top surface of the lower mold body 41 is distributed with a plurality of positioning through columns 412 relative to the periphery of the component positioning area 401 in the carrier positioning area 400, and the top of the lower mold body 41 is positioned on the carrier In the section 400, a plurality of telescopic support assemblies 413 are provided.

如圖1所示,前述中,所述伸縮支撐組件413可選用已知具有伸縮功能之組件。於本較佳實施例中,所述伸縮支撐組件413包含一支撐柱以及一位於該支撐柱下端的彈簧,所述支撐柱藉由彈簧供給的彈力,使所述支撐柱能伸出下模本體41的頂面用以支撐元件承載盤10,且所述支撐柱能受向下的壓力而縮入下模本體的頂面。As shown in FIG. 1, in the foregoing, the telescopic support component 413 may be a component known to have a telescopic function. In this preferred embodiment, the telescopic support assembly 413 includes a support column and a spring located at the lower end of the support column. The support column is elastically supplied by the spring so that the support column can extend out of the lower die body 41 The top surface of is used to support the component carrying tray 10, and the support column can be retracted into the top surface of the lower mold body by downward pressure.

如圖1所示,該上模50係設置於該下模40的上方,該上模50包括一上模板51,該上模板51中形成至少一通孔511,所述通孔511之數量及位置係相對應於該下模40的元件定位區401。As shown in FIG. 1, the upper mold 50 is disposed above the lower mold 40. The upper mold 50 includes an upper template 51, and at least one through hole 511 is formed in the upper template 51. The number and position of the through holes 511 It corresponds to the component positioning area 401 of the lower mold 40.

如圖1所示,所述活動壓塊60係能上下直線運動地設置於所述通孔511中,且每一所述活動壓塊60的位置對應其下方的一所述下模塊42,所述活動壓塊60底面與相應的下模塊42的頂面平行且能上下相對位移。As shown in FIG. 1, the movable pressing block 60 is disposed in the through hole 511 in a linear motion up and down, and the position of each movable pressing block 60 corresponds to a lower module 42 below it. The bottom surface of the movable pressing block 60 is parallel to the top surface of the corresponding lower module 42 and can be relatively displaced up and down.

關於前述壓合治具30較佳實施例應用於壓合裝置中執行半導體元件之熱壓合作業情形,該壓合治具係以上模裝設於該壓合裝置之壓力供給機構之基座底部,壓力供給機構中之每一壓力單元分別連接位於該上模中相應位置的活動壓塊,該下模位於上模的下方且連接該壓合裝置之升降驅動機構(圖未示),前述壓合裝置之壓力供給機構與升降驅動機構等可以選用已知的機構,且非屬本新型創作之部分,於此不再贅述。With regard to the above-mentioned preferred embodiment of the pressing jig 30 applied to the case of performing hot-pressing cooperation of semiconductor elements in a pressing device, the pressing jig is the above mold mounted on the bottom of the base of the pressure supply mechanism of the pressing device , Each pressure unit in the pressure supply mechanism is connected to the movable pressing block located at the corresponding position in the upper mold respectively, the lower mold is located below the upper mold and connected to the lifting drive mechanism of the pressing device (not shown), the aforementioned pressure Known mechanisms can be used for the pressure supply mechanism and lifting drive mechanism of the closing device, and they are not part of the creation of the new model, and will not be repeated here.

當壓合治具之上模與下模上下分離的起始狀態下,上模與下模之間具有一預定大小的空間,提供承載至少一待壓合半導體元件的元件承載盤移置於下模的頂部定位,所述元件承載盤於每一元件置放區放置一半導體元件,所述半導體元件包含一具有晶片的基板、一導熱膠以及一散熱片,所述導熱膠係預先塗布於該基板頂面周緣,散熱片藉由導熱膠黏著於該基板頂面,且所述導熱膠未經壓合之前係呈未固化之狀態。其次,藉由升降驅動機構推頂下模的升降運動,結合受壓力的活動壓塊,於加熱的環境中,執行半導體元件之散熱片與基板間之熱壓合作業,並藉由活動壓塊與下模的下模塊相對夾擠力量,使半導體元件之散熱片與基板熱壓固接一體。In the initial state where the upper mold and the lower mold of the pressing jig are separated up and down, there is a space of a predetermined size between the upper mold and the lower mold to provide a component carrier tray carrying at least one semiconductor component to be pressed and moved down The top of the mold is positioned, and the component carrier plate places a semiconductor component in each component placement area. The semiconductor component includes a substrate with a wafer, a thermally conductive adhesive, and a heat sink. The thermally conductive adhesive is pre-coated on the On the periphery of the top surface of the substrate, the heat sink is adhered to the top surface of the substrate by thermally conductive adhesive, and the thermally conductive adhesive is uncured before being pressed. Secondly, the lifting movement of the lower die is pushed up and down by the lifting driving mechanism, combined with the movable pressing block under pressure, in the heated environment, the heat pressing cooperation between the heat sink of the semiconductor element and the substrate is performed, and the movable pressing block The clamping force is relatively opposed to the lower module of the lower mold, so that the heat sink of the semiconductor element and the substrate are thermally and pressure bonded together.

如圖3所示之另一較佳實施例,該壓合治具30還可進一步包括一中模70,該中模70係能上下運動地設置於上模50與下模40之間。該中模70包括一中模板71,該中模板71中形成至少一對位孔711,所述對位孔711之數量及位置係相對應於該下模40的元件定位區401,且能與上模50位置對應的通孔511相連通,所述對位孔711之底緣形成由內朝外側向傾斜的導斜面712。該中模板71還可分布設置複數個伸縮壓抵組件72,複數所述伸縮壓抵組件72能凸伸中模板71的底面以及縮入中模板71內。As shown in another preferred embodiment shown in FIG. 3, the pressing fixture 30 may further include a middle mold 70, which is disposed between the upper mold 50 and the lower mold 40 so as to move up and down. The middle mold 70 includes a middle template 71 in which at least one pair of positioning holes 711 is formed. The number and position of the positioning holes 711 correspond to the component positioning area 401 of the lower mold 40 and can The through holes 511 corresponding to the positions of the upper mold 50 communicate with each other, and the bottom edge of the alignment hole 711 forms a sloped surface 712 inclined from the inside toward the outside. The middle template 71 may also be provided with a plurality of telescoping and pressing components 72, and the plurality of telescoping and pressing components 72 may extend the bottom surface of the middle template 71 and retract into the middle template 71.

所述伸縮壓抵組件72可選用已知具有伸縮功能之組件。於本較佳實施例中,所述伸縮壓抵組件72包含一壓抵柱以及一位於該壓抵柱上端的彈簧,所述壓抵柱藉由彈簧供給的彈力,使所述壓抵柱能伸出中模板71的底面,用以壓抵元件承載盤10,且所述壓抵柱能受向上推力而縮入中模板71的底面。The telescoping and pressing component 72 can be a component known to have a telescoping function. In the preferred embodiment, the telescoping pressing component 72 includes a pressing column and a spring located at the upper end of the pressing column. The pressing column can be extended by the elastic force supplied by the spring The bottom surface of the middle template 71 is used to press against the component bearing tray 10, and the pressing column can be retracted into the bottom surface of the middle template 71 by being pushed upward.

如圖3至圖5所示,有關前述具有中模70之壓合治具30另一較佳實施例應用於壓合裝置中執行半導體元件之熱壓合作業情形,該壓合治具30係以上模50裝設於該壓合裝置之壓力供給機構80之基座81底部,壓力供給機構80中之每一壓力單元82分別連接位於該上模50中相應位置的活動壓塊60,該中模70係能裝設於基座81底部且位於上模50下方,中模與其上方的上模之間具有一間距,中模70能相對於上模50有限距離上下運動,且中模70連接基座81中的升降驅動組件83,該下模40位於中模70的下方且連接該壓合裝置之升降驅動機構(圖未示),前述壓合裝置之壓力供給機構80與升降驅動機構等可以選用已知的機構,且非屬本新型創作之部分,於此不再贅述。As shown in FIG. 3 to FIG. 5, another preferred embodiment of the aforementioned pressing jig 30 having a middle mold 70 is applied to the case of performing a hot pressing cooperation of semiconductor devices in a pressing device. The pressing jig 30 is The upper mold 50 is installed at the bottom of the base 81 of the pressure supply mechanism 80 of the pressing device. Each pressure unit 82 in the pressure supply mechanism 80 is connected to the movable pressing block 60 at a corresponding position in the upper mold 50. The mold 70 can be installed at the bottom of the base 81 and below the upper mold 50, with a gap between the middle mold and the upper mold above it, the middle mold 70 can move up and down relative to the upper mold 50 with a limited distance, and the middle mold 70 is connected The lifting drive assembly 83 in the base 81, the lower mold 40 is located below the middle mold 70 and is connected to the lifting drive mechanism (not shown) of the pressing device, the pressure supply mechanism 80 and the lifting drive mechanism of the foregoing pressing device You can choose a known institution, which is not part of this new creation, so I won’t go into details here.

如圖5至圖7所示,於啟始狀態下,該下模40位於設於壓力供給機構80的基座81中的上模50與中模70的正下方,下模40與中模70之間上下間隔相對而具有一預定的空間。當承載有半導體元件的元件承載盤10經由該空間被移置於下模40的頂部時,元件承載盤10藉由下模40之下模本體41頂部相對兩側的載盤限位擋部411限位,以及由對位穿設柱412分別對位設於元件承載盤10的對位貫孔115而對位,同時,藉由下模本體41頂部複數伸縮支撐組件413頂舉支撐元件承載盤10,使元件承載盤10位於下模本體41頂面上方,元件承載盤10底面與下模本體41頂面之間具有間距而未接觸,元件承載盤10上之元件孔111分別對應下模塊42,元件承載盤10上的半導體元件20四角隅部位分別對應於。As shown in FIGS. 5 to 7, in the initial state, the lower die 40 is located directly below the upper die 50 and the middle die 70 provided in the base 81 of the pressure supply mechanism 80, and the lower die 40 and the middle die 70 The upper and lower intervals are opposite and have a predetermined space. When the component carrier tray 10 carrying the semiconductor components is moved to the top of the lower mold 40 through the space, the component carrier tray 10 passes through the carrier disc stopper portions 411 on opposite sides of the top of the lower mold body 41 of the lower mold 40 The limit position, and the alignment through holes 412 are respectively positioned on the alignment through holes 115 of the component carrying tray 10 for positioning, and at the same time, the component supporting tray is lifted by a plurality of telescopic support assemblies 413 on the top of the lower die body 41 10, the component carrier tray 10 is located above the top surface of the lower mold body 41, the bottom surface of the component carrier tray 10 and the top surface of the lower mold body 41 are spaced without contact, and the component holes 111 on the component carrier tray 10 respectively correspond to the lower module 42 The four corners of the semiconductor element 20 on the element carrier 10 correspond to each other.

如圖5至圖8所示,係由升降驅動機推頂下模40及其上置放有半導體元件20的元件承載盤10一同上升,當中模70之伸縮壓抵組件72對應抵接元件承載盤10之對位貫孔115時,利用複數伸縮壓抵組件72對元件承載盤10再次對位。As shown in FIGS. 5 to 8, the lower drive 40 is pushed up by the lifting drive and the component carrier tray 10 on which the semiconductor device 20 is placed rises, and the telescoping and pressing component 72 of the middle mold 70 corresponds to the load bearing component When the through holes 115 of the disk 10 are aligned, the component carrier disk 10 is aligned again by using a plurality of telescopic pressing members 72.

其次,下模40及其上置放有半導體元件20的元件承載盤10持續被推頂而朝中模70上升,當位於下模40上的元件承載盤10中的半導體元件20開始進入中模70的中模板71的元件對位孔711的過程中,元件承載盤10因被複數伸縮壓抵組件72施以壓抵作用,以及下模40持續被推頂上升,使元件承載盤10壓抵位於下模本體41頂部的伸縮支撐組件413縮入下模本體41頂面,進而使元件承載盤10抵靠在下模本體41頂面。另一方面,下模40之下模塊42通過元件承載盤10的元件孔111而推舉半導體元件20進入中模板71的元件對位孔711,於半導體元件20上升進入中模70之元件對位孔711的過程中,利用中模板71的元件對位孔711底緣的導斜面712導正半導體元件20之位置,使半導體元件20的散熱片22與基板21能夠上下精確對位。Secondly, the lower die 40 and the component carrier tray 10 on which the semiconductor elements 20 are placed are continuously pushed up to rise toward the middle mold 70, when the semiconductor components 20 in the component carrier tray 10 on the lower mold 40 start to enter the middle mold In the process of the component alignment hole 711 of the middle template 71 of 70, the component carrier disk 10 is pressed by a plurality of telescopic pressure components 72, and the lower die 40 continues to be pushed up to press the component carrier disk 10 against The telescopic support assembly 413 located at the top of the lower mold body 41 is retracted into the top surface of the lower mold body 41, so that the component carrier tray 10 abuts against the top surface of the lower mold body 41. On the other hand, the module 42 under the lower die 40 pushes the semiconductor element 20 into the element alignment hole 711 of the middle template 71 through the element hole 111 of the element carrier 10, and rises into the element alignment hole of the middle mold 70 after the semiconductor element 20 In the process of 711, the inclined surface 712 at the bottom edge of the element alignment hole 711 of the middle template 71 is used to guide the position of the semiconductor element 20, so that the heat sink 22 of the semiconductor element 20 and the substrate 21 can be accurately aligned up and down.

如圖8及圖9所示,下模40及其上置放有半導體元件20的元件承載盤10一同持續上升,使半導體元件20完全進入中模70的元件對位孔711中,元件承載盤10被夾持於中模70之中模板71與下模40之下模本體41之間,下模塊42也伸入中模70的元件對位孔711中,另藉由外部抽氣設備通過下模40的下模塊42中的抽氣孔43對半導體元件20中位置在下的基板21施以吸附作用,使基板21平置地被固定於下模塊42的頂面上,且基板21四角隅部位分別抵靠在下模塊42相應位置的延伸支撐部422上,As shown in FIGS. 8 and 9, the lower mold 40 and the component carrier 10 on which the semiconductor element 20 is placed continue to rise together, so that the semiconductor component 20 completely enters the component alignment hole 711 of the middle mold 70, the component carrier 10 is clamped between the middle mold 70 of the middle mold 70 and the lower mold body 41 of the lower mold 40, the lower module 42 also extends into the component alignment hole 711 of the middle mold 70, and is passed through the external suction equipment through the lower The suction hole 43 in the lower module 42 of the mold 40 exerts an adsorption action on the lower substrate 21 of the semiconductor element 20, so that the substrate 21 is fixed on the top surface of the lower module 42 flatly, and the four corners of the substrate 21 respectively Leaning on the extension support portion 422 of the corresponding position of the lower module 42,

如圖8至圖9所示,下模40及其上置放有半導體元件20的元件承載盤10持續被推頂上升預定高度,設於基座81中的升降驅動組件83帶動中模70伴隨著下模40一同上升,以及經由下模塊42對半導體元件20施以向上的推頂力量,使壓力供給機構80中的壓力單元82脫離基座81的支撐而通過活動壓塊60對半導體元件20施以下壓力,使半導體元件20受到上下夾擊的作用力,進而壓縮半導體元件之散熱片22與基板21之間的間隙,以及擠壓位於散熱片22與基板21之間的導熱膠擴散,其中,藉由中模70的對位孔711的導引作用,使半導體元件能在受熱環境中均勻地被壓合,直至導熱膠於壓合作用中逐漸固化而將散熱片22穩固黏著在基板21上定型。As shown in FIGS. 8 to 9, the lower die 40 and the component carrier 10 on which the semiconductor element 20 is placed are continuously pushed up to a predetermined height, and the lifting drive assembly 83 provided in the base 81 drives the middle die 70 to accompany The lower mold 40 rises together, and the semiconductor module 20 is pushed upward by the lower module 42, so that the pressure unit 82 in the pressure supply mechanism 80 is released from the support of the base 81 and the semiconductor element 20 is moved by the movable block 60 The following pressure is applied to subject the semiconductor element 20 to an upward and downward pinching force, thereby compressing the gap between the heat sink 22 of the semiconductor element and the substrate 21, and squeezing the diffusion of the thermally conductive adhesive between the heat sink 22 and the substrate 21, wherein, The guiding function of the alignment hole 711 of the middle mold 70 enables the semiconductor element to be evenly pressed in the heated environment until the thermally conductive adhesive gradually solidifies during the pressing and the heat sink 22 is firmly adhered to the substrate 21 Stereotypes.

如圖9及圖10所示,半導體元件20完成熱壓合至定型後,藉由升降驅動機構帶動下模40下降復位,設於基座81中的升降驅動組件83帶動中模70伴隨著下模40一同下降復位,當位於下模40上的元件承載盤10脫離中模70的伸縮壓抵組件72後,下模40之伸縮支撐組件413即推頂元件承載盤10上升,直至完成壓合後定型的半導體元件20重為元件承載盤10承載,同時停止通過下模塊42對半導體元件20的基板21的抽氣吸附作用,使半導體元件20完全由元件承載盤10承載並脫離下模40的下模塊42,並在下模40下降復位後,將承載完成壓合後半導體元件20的元件承載盤10移離下模40,即完成半導體元件的壓合作業。As shown in FIGS. 9 and 10, after the semiconductor element 20 is thermally pressed to finalization, the lower die 40 is driven down by a lifting drive mechanism to be reset, and the lifting driving assembly 83 provided in the base 81 drives the middle die 70 with the lower The mold 40 is lowered and reset together. When the component carrier tray 10 on the lower mold 40 is separated from the telescopic pressing assembly 72 of the middle mold 70, the telescopic support assembly 413 of the lower mold 40 pushes the component carrier tray 10 upward until the pressing is completed The post-finished semiconductor component 20 is carried by the component carrier tray 10, and at the same time, the suction suction of the substrate 21 of the semiconductor component 20 by the lower module 42 is stopped, so that the semiconductor component 20 is completely carried by the component carrier tray 10 and is separated from the lower mold 40 The lower module 42, and after the lower mold 40 is lowered and reset, the component carrier tray 10 carrying the semiconductor components 20 after the completion of the pressing is moved away from the lower mold 40, that is, the semiconductor component pressing operation is completed.

10‧‧‧元件承載盤 11‧‧‧元件置放區 111‧‧‧元件孔 112‧‧‧承載邊 113‧‧‧貫穿孔 114‧‧‧定位針 115‧‧‧對位貫孔 20‧‧‧半導體元件 21‧‧‧基板 22‧‧‧散熱片 30‧‧‧壓合治具 40‧‧‧下模 400‧‧‧載盤定位區間 401‧‧‧元件定位區 41‧‧‧下模本體 411‧‧‧載盤限位擋部 412‧‧‧對位穿設柱 413‧‧‧伸縮支撐組件 42‧‧‧下模塊 421‧‧‧模塊基部 422‧‧‧延伸支撐部 43‧‧‧抽氣孔 50‧‧‧上模 51‧‧‧上模板 511‧‧‧通孔 60‧‧‧活動壓塊 70‧‧‧中模 71‧‧‧中模板 711‧‧‧對位孔 712‧‧‧導斜面 72‧‧‧伸縮壓抵組件 80‧‧‧壓力供給機構 81‧‧‧基座 82‧‧‧壓力單元 83‧‧‧升降驅動組件10‧‧‧Component carrier plate 11‧‧‧Component placement area 111‧‧‧Component hole 112‧‧‧bearing edge 113‧‧‧Through hole 114‧‧‧Positioning pin 115‧‧‧Aligned through hole 20‧‧‧Semiconductor components 21‧‧‧ substrate 22‧‧‧heat sink 30‧‧‧ Pressing fixture 40‧‧‧ Die 400‧‧‧span positioning position 401‧‧‧Component positioning area 41‧‧‧Lower die body 411‧‧‧Carrier limit stop 412‧‧‧ Alignment column 413‧‧‧Telescopic support assembly 42‧‧‧Lower module 421‧‧‧Module base 422‧‧‧Extended support 43‧‧‧Suction hole 50‧‧‧ Upper die 51‧‧‧Up template 511‧‧‧Through hole 60‧‧‧mobile briquetting 70‧‧‧Middle 71‧‧‧ medium template 711‧‧‧Alignment hole 712‧‧‧Bevel guide 72‧‧‧Extendable and pressable components 80‧‧‧ pressure supply mechanism 81‧‧‧Dock 82‧‧‧Pressure unit 83‧‧‧ Lifting drive assembly

圖1係本新型壓合治具之一較佳實施例與具有待壓合半導體元件的元件承載盤之立體分解示意圖。 圖2係圖1所示壓合治具較佳實施例中之下模俯視平面示意圖。 圖3係圖1所示壓合治具增設活動中模之另一較佳實施例與具有待壓合半導體元件的元件承載盤之的立體分解示意圖。 圖4係圖3所示壓合治具較佳實施例應用於壓合裝置中之平面示意圖。 圖5係圖3所示壓合治具較佳實施例應用於壓合裝置中對元件承載盤上的待壓合半導體元件執行熱壓合作業之使用狀態參考圖(一)。 圖6係圖5的局部剖面示意圖。 圖7係圖6的放大圖。 圖8係圖3所示壓合治具較佳實施例應用於壓合裝置中對元件承載盤上的待壓合半導體元件執行熱壓合作業之使用狀態參考圖(二)。 圖9係圖3所示壓合治具較佳實施例應用於壓合裝置中對元件承載盤上的待壓合半導體元件執行熱壓合作業之使用狀態參考圖(三)。 圖10係圖3所示壓合治具較佳實施例應用於壓合裝置中對元件承載盤上的待壓合半導體元件執行熱壓合作業之使用狀態參考圖(四)。 FIG. 1 is a schematic exploded perspective view of a preferred embodiment of the novel press-fitting jig and a device carrier with semiconductor devices to be pressed. FIG. 2 is a schematic top plan view of the lower die in the preferred embodiment of the press-fitting jig shown in FIG. 1. FIG. 3 is a perspective exploded view of another preferred embodiment of the press-fitting jig shown in FIG. 1 with an additional movable middle mold and a component carrier with semiconductor devices to be pressed. FIG. 4 is a schematic plan view of a preferred embodiment of the pressing jig shown in FIG. 3 applied to a pressing device. FIG. 5 is a reference diagram (1) of the use state of the preferred embodiment of the press-fitting jig shown in FIG. 3 applied to the press-fitting device to perform the hot press-cooperating industry on the semiconductor device to be pressed on the component carrier plate. 6 is a schematic partial cross-sectional view of FIG. 5. 7 is an enlarged view of FIG. 6. FIG. 8 is a reference diagram (2) of a use state of a preferred embodiment of the press-fitting jig shown in FIG. 3 applied to a press-fitting device to perform a hot-pressing operation on a semiconductor device to be pressed on a component carrier plate. 9 is a reference diagram (3) of a use state of a preferred embodiment of the press-fitting jig shown in FIG. 3 used in a press-fitting device to perform thermocompression on the semiconductor device to be pressed on the component carrier plate. FIG. 10 is a reference diagram (4) of the use state of the preferred embodiment of the press-fitting jig shown in FIG. 3 applied to the press-fitting device to perform the hot press-cooperating industry on the semiconductor device to be pressed on the component carrier plate.

10‧‧‧元件承載盤 10‧‧‧Component carrier plate

11‧‧‧元件置放區 11‧‧‧Component placement area

111‧‧‧元件孔 111‧‧‧Component hole

112‧‧‧承載邊 112‧‧‧bearing edge

113‧‧‧貫穿孔 113‧‧‧Through hole

114‧‧‧定位針 114‧‧‧Positioning pin

115‧‧‧對位貫孔 115‧‧‧Aligned through hole

20‧‧‧半導體元件 20‧‧‧Semiconductor components

30‧‧‧壓合治具 30‧‧‧ Pressing fixture

40‧‧‧下模 40‧‧‧ Die

41‧‧‧下模本體 41‧‧‧Lower die body

411‧‧‧載盤限位擋部 411‧‧‧Carrier limit stop

412‧‧‧對位穿設柱 412‧‧‧ Alignment column

413‧‧‧伸縮支撐組件 413‧‧‧Telescopic support assembly

42‧‧‧下模塊 42‧‧‧Lower module

421‧‧‧模塊基部 421‧‧‧Module base

422‧‧‧延伸支撐部 422‧‧‧Extended support

43‧‧‧抽氣孔 43‧‧‧Suction hole

50‧‧‧上模 50‧‧‧ Upper die

51‧‧‧上模板 51‧‧‧Up template

511‧‧‧通孔 511‧‧‧Through hole

60‧‧‧活動壓塊 60‧‧‧mobile briquetting

Claims (4)

一種壓合治具,其包括一下模、設於該下模上方的一上模,以及設於該上模中能上下運動的至少一活動壓塊,該下模與能相對於該上模上下運動,其中: 該下模包括: 一下模本體,其界定有一載盤定位區間以及位於該載盤定位區間內之至少一元件定位區: 至少一下模塊,其係設於該下模本體的頂面且位於所述元件定位區內向上凸伸,所述下模塊包括一模塊基部以及四延伸支撐部,該模塊基部實質為一矩形塊體,該模塊基部之各周邊與其側鄰之所述元件定位區的邊界各具有一間距,該四個延伸支撐部分別形成於該模塊基部的四個角隅處且朝外凸伸,該四個延伸支撐部的外周緣實質延伸至所述元件定位區的邊界;以及 至少一氣流通道,其係設於該下模本體中且延伸至所述下模塊的頂面而形成一抽氣孔; 該上模包括一上模板,該上模板中形成至少一通孔,所述通孔之數量及位置相對應於該下模的元件定位區; 所述活動壓塊係能上下運動地設置於該上模之通孔中,且每一所述活動壓塊的位置對應其下方的一所述下模塊,所述活動壓塊底面與相應的下模塊的頂面平行且能上下相對位移。 A pressing jig includes a lower mold, an upper mold provided above the lower mold, and at least one movable pressing block provided in the upper mold capable of moving up and down. The lower mold and the upper mold can move up and down relative to the upper mold Sports, where: The die includes: The lower mold body defines a carrier positioning area and at least one component positioning area within the carrier positioning area: At least one lower module, which is disposed on the top surface of the lower mold body and protrudes upward in the component positioning area, the lower module includes a module base and four extended support parts, the module base is substantially a rectangular block , Each periphery of the module base and the boundary of the component positioning area adjacent to it have a distance respectively, and the four extension support portions are formed at four corners of the module base and protrude outward, the four The outer periphery of the extension support portion extends substantially to the boundary of the element positioning area; and At least one air flow channel, which is disposed in the lower mold body and extends to the top surface of the lower module to form an air extraction hole; The upper mold includes an upper template, at least one through hole is formed in the upper template, the number and position of the through holes correspond to the component positioning area of the lower mold; The movable pressing block is disposed in the through hole of the upper mold so as to be able to move up and down, and the position of each of the movable pressing blocks corresponds to a lower module below it, and the bottom surface of the movable pressing block and the corresponding lower The top surface of the module is parallel and can be relatively displaced up and down. 如請求項1所述之壓合治具,其中,所述下模本體的頂面之相對兩側於該載盤定位區間的邊界外緣處各形成向上凸伸的至少一載盤限位擋部,該下模本體的頂面於該載盤定位區間內且相對於所述元件定位區外圍處分布設置複數對位穿設柱,該下模本體的頂部於載盤定位區間內設置複數伸縮支撐組件。The press-fitting jig according to claim 1, wherein at least one carrier disc stop projecting upward is formed on the opposite outer sides of the top surface of the lower mold body at the boundary outer edge of the carrier disc positioning interval The top surface of the lower die body is provided with a plurality of alignment piercing posts in the positioning area of the carrier and relative to the periphery of the component positioning area, and the top of the lower die body is provided with a plurality of expansion and contraction in the positioning area of the carrier Support components. 如請求項1或2所述之壓合治具,其中,該壓合治具還包括一中模,該中模係能上下運動地設置於該上模與該下模之間,該中模包括一中模板,該中模板中形成至少一對位孔,所述對位孔之數量及位置係相對應於該下模的元件定位區,且能與該上模位置對應的通孔相連通,所述對位孔之底緣形成由內朝外側向傾斜的導斜面。The press-fitting jig according to claim 1 or 2, wherein the press-fitting jig further includes a middle mold, the middle mold is disposed between the upper mold and the lower mold movably up and down, the middle mold It includes a middle template, at least one pair of positioning holes is formed in the middle template, the number and position of the positioning holes correspond to the component positioning area of the lower mold, and can communicate with the through hole corresponding to the position of the upper mold , The bottom edge of the alignment hole forms a sloped surface inclined from the inside to the outside. 如請求項3所述之壓合治具,其中,該中模板分布設置複數伸縮壓抵組件,所述伸縮壓抵組件能凸伸該中模板的底面以及縮入該中模板內。The press-fitting jig according to claim 3, wherein the middle template is distributed with a plurality of telescopic pressing components, and the telescopic pressing components can extend the bottom surface of the middle template and retract into the middle template.
TW108211337U 2019-08-27 2019-08-27 Compression fixture TWM588593U (en)

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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN113757237A (en) * 2020-06-01 2021-12-07 竑腾科技股份有限公司 Spacing tool and spacing compression fittings

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN113757237A (en) * 2020-06-01 2021-12-07 竑腾科技股份有限公司 Spacing tool and spacing compression fittings

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