TWM582256U - Fast switching optical-path architecture for cutting low dielectric material (low-K) wafers - Google Patents

Fast switching optical-path architecture for cutting low dielectric material (low-K) wafers Download PDF

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TWM582256U
TWM582256U TW108204901U TW108204901U TWM582256U TW M582256 U TWM582256 U TW M582256U TW 108204901 U TW108204901 U TW 108204901U TW 108204901 U TW108204901 U TW 108204901U TW M582256 U TWM582256 U TW M582256U
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splitting
mirror
low
laser
cutting
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TW108204901U
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黃萌義
熊學毅
蘇柏年
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雷科股份有限公司
黃萌義
熊學毅
蘇柏年
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Publication of TWM582256U publication Critical patent/TWM582256U/en

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Abstract

The present invention relates to a fast switching optical-path architecture for cutting low dielectric material (low-K) wafers, comprising a laser beam generating device for generating a laser beam, a spectroscope device located behind the laser beam generating device to perform splitting or non-splitting of light, a beam converting device located behind the spectroscope device that is composed of a plurality of beam control cartridges and is used to adjust the optical-path of the laser beam, and a central control device that is electrically connected to the laser beam generating device, the spectroscope device, and the beam converting device. The present invention enables a single laser processing machine to use a plurality of different optical-paths for cutting by switching among different beam control cartridges.

Description

用於切割低介電值材料(Low-K)晶圓的快速切換光路架構Fast switching optical path architecture for cutting low dielectric material (Low-K) wafers

本創作係有關於一種快速切換光路架構;更詳而言之,特別係關於一種用於切割低介電值材料(Low-K)晶圓的快速切換光路架構。This creation is about a fast switching optical path architecture; more specifically, it relates to a fast switching optical path architecture for cutting low dielectric material (Low-K) wafers.

半導體晶圓的切割是在晶圓表面設置分割預定線將其劃分成複數個格子狀之區域,並在該劃分的區域中形成積體電路,再藉由沿著分割預定線將半導體晶圓切斷而取得一個個的半導體器件,而目前的常見的切割方式可分為刀刃切割和雷射切割兩種,但若是遇到切割低介電值材料(Low-K)晶圓,使用刀刃切割會破壞晶圓的完整性因此只能使用雷射切割。The semiconductor wafer is cut by dividing a predetermined line on the surface of the wafer into a plurality of lattice-shaped regions, and forming an integrated circuit in the divided region, and then cutting the semiconductor wafer along the dividing line. The semiconductor devices are obtained one by one, and the current common cutting methods can be divided into blade cutting and laser cutting. However, if cutting low dielectric material (Low-K) wafers, cutting with a blade will be used. Destroying the integrity of the wafer can therefore only be done using laser cutting.

然而採用雷射切割的問題在於現有的雷射加工機台只有一種固定的光學路徑和加工方法,因此一但碰到有特殊的線寬切割需求,就必須使用到不同的加工機台,而更換加工機台不但會使加工的成本大幅增加,且各式的雷射加工機台更是會佔據不少場地空間。However, the problem with laser cutting is that the existing laser processing machine has only one fixed optical path and processing method. Therefore, when it comes to special line width cutting requirements, it is necessary to use different processing machines and replace them. The processing machine will not only greatly increase the cost of processing, but also all kinds of laser processing machines will occupy a lot of space.

故要是能將兩種或兩種以上的雷射加工機台整合成獨立的一台設備,並能依照需求來切換光路和加工方法,就能降低加工成本並解決機台設置的空間問題。Therefore, if two or more laser processing machines can be integrated into a single device, and the optical path and processing method can be switched according to requirements, the processing cost can be reduced and the space problem of the machine setting can be solved.

有鑑於此,本案申請人遂依其多年從事相關領域之研發經驗,針對前述之缺失進行深入探討,並依前述需求積極尋求解決之道,歷經長時間的努力研究與多次測試,終於完成本創作。In view of this, the applicant of this case has been engaged in research and development experience in related fields for many years, and has conducted in-depth discussions on the above-mentioned shortcomings, and actively sought solutions according to the above-mentioned needs. After a long period of hard work and many tests, the applicant finally completed this book. creation.

本創作之主要目的在於同時將多種雷射光路整併於同一台雷射加工機內。The main purpose of this creation is to simultaneously align multiple laser paths into the same laser processing machine.

為達上述之目的,本創作用於切割低介電值材料(Low-K)晶圓的快速切換光路架構,係包含有雷射光束產生裝置、分光裝置、光束轉換裝置以及中央控制裝置。For the above purposes, the present invention is directed to a fast switching optical path architecture for cutting low dielectric material (Low-K) wafers, including a laser beam generating device, a beam splitting device, a beam converting device, and a central control device.

所述雷射光束產生裝置係用於產出切割低介電值材料(Low-K)晶圓的雷射光束。The laser beam generating device is used to produce a laser beam that cuts a low dielectric material (Low-K) wafer.

所述分光裝置係用於接收雷射光束產生裝置所射出的雷射光束,該分光裝置係包含有波長板、分光鏡、第一反光鏡、第二反光鏡、以及聚光鏡;The beam splitting device is configured to receive a laser beam emitted by the laser beam generating device, the beam splitting device comprising a wavelength plate, a beam splitter, a first mirror, a second mirror, and a collecting mirror;

其中,該波長板位於雷射光束產生裝置之後;Wherein the wavelength plate is located behind the laser beam generating device;

其中,該分光鏡位於波長板之後,並將雷射光束分為兩道不同角度且不重疊的第一分光光束和第二分光光束;Wherein the beam splitter is located behind the wavelength plate, and divides the laser beam into two different angles and does not overlap the first beam splitting beam and the second beam splitting beam;

其中,該第一反光鏡位於分光鏡之後,並用於反射第一分光光束,又該第一反光鏡上設有位移裝置;The first mirror is located behind the beam splitter and is used for reflecting the first beam splitter, and the first mirror is provided with a displacement device;

其中,該第二反光鏡位於分光鏡之後,並用於反射第二分光光束;Wherein the second mirror is located behind the beam splitter and is used for reflecting the second beam splitting beam;

其中,該聚光鏡位於第一反光鏡和第二反光鏡所反射之第一分光光束和第二分光光束的路徑上,並將第一分光光束和第二分光光束同整成相同方向,且第一分光光束和第二分光光束之間的平行距離係由位移裝置移動第一反光鏡來控制。Wherein, the condensing mirror is located on a path of the first splitting beam and the second beam splitting beam reflected by the first mirror and the second mirror, and the first splitting beam and the second beam splitting beam are in the same direction, and the first The parallel distance between the split beam and the second split beam is controlled by the displacement device moving the first mirror.

所述光束轉換裝置係位於分光裝置之後,並用於接收經聚光鏡處理過的第一分光光束和第二分光光束,該光束轉換裝置係由兩個或兩個以上的光束控制匣所組成,且各個光束控制匣內設有繞射元件,又該光束轉換裝置上設有用於切換光束控制匣的移動裝置,並透過移動裝置切換使用不同的光束控制匣來產出兩種或兩種以上的雷射光路。The beam converting device is located behind the beam splitting device and is configured to receive the first beam splitting beam and the second beam splitting beam processed by the condensing mirror, wherein the beam converting device is composed of two or more beam control devices, and each A diffractive element is disposed in the beam control unit, and a moving device for switching the beam control unit is disposed on the beam converting device, and different beam control units are switched through the moving device to generate two or more types of laser light. road.

所述中央控制裝置係分別與雷射光束產生裝置、波長板、第一反光鏡以及光束轉換裝置電性連結。The central control device is electrically coupled to the laser beam generating device, the wave plate, the first mirror, and the beam converting device, respectively.

本創作用於切割低介電值材料(Low-K)晶圓的快速切換光路架構優點在於: 1. 使用者能透過中央控制裝置任意切換使用不同的光束控制匣,使單一雷射機台能使用多種不同的雷射光路進行加工。 2. 第一反光鏡上的位移裝置能任意調整其位置,並透過調整第一反光鏡的位置來改變第一分光光束和第二分光光束之間的間距。 The advantages of this fast switching optical path architecture for cutting low dielectric material (Low-K) wafers are:  1. The user can switch between different beam control options through the central control unit, so that a single laser machine can be processed using a variety of different laser light paths.  2. The displacement device on the first mirror can adjust its position arbitrarily and change the distance between the first beam splitting beam and the second beam splitting beam by adjusting the position of the first mirror.  

期許本創作之目的、功效、特徵及結構能夠有更為詳盡之瞭解,茲舉較佳實施例並配合圖式說明如後。The purpose, function, features and structure of the present invention can be understood in a more detailed manner, and the preferred embodiment will be described in conjunction with the drawings.

首先請參閱圖1,圖1為本創作結構示意圖。First, please refer to FIG. 1, which is a schematic diagram of the creation structure.

本創作用於切割低介電值材料(Low-K)晶圓的快速切換光路架構1,係包含有雷射光束產生裝置11、分光裝置 12、光束轉換裝置13以及中央控制裝置14。 The present invention is directed to a fast switching optical path architecture 1 for cutting low dielectric material (Low-K) wafers, comprising a laser beam generating device 11 and a spectroscopic device  12. Beam conversion device 13 and central control device 14.  

所述雷射光束產生裝置11係用於產出切割低介電值材料(Low-K)晶圓2的雷射光束,而該雷射光束之波長為355nm。The laser beam generating device 11 is used to produce a laser beam that cuts a low dielectric material (Low-K) wafer 2 having a wavelength of 355 nm.

所述分光裝置12係用於接收雷射光束產生裝置 11所射出的雷射光束,該分光裝置12係包含有波長板121、分光鏡122、第一反光鏡123、第二反光鏡124、以及聚光鏡125; The spectroscopic device 12 is configured to receive a laser beam generating device  11 emitted laser beam, the spectroscopic device 12 includes a wave plate 121, a beam splitter 122, a first mirror 123, a second mirror 124, and a concentrating mirror 125;  

其中,該波長板121位於雷射光束產生裝置11之後,該波長板121採用 λ波長板121為最佳; The wavelength plate 121 is located behind the laser beam generating device 11, and the wavelength plate 121 is adopted. The λ wavelength plate 121 is optimal;

其中,該分光鏡122位於波長板121之後,並將雷射光束分為兩道不同角度且不重疊的第一分光光束和第二分光光束,且該第一分光光束和第二分光光束的能量比例係透過調整波長板121來控制;The beam splitter 122 is located behind the wave plate 121, and divides the laser beam into two different angles and does not overlap the first split beam and the second split beam, and the energy of the first split beam and the second split beam The ratio is controlled by adjusting the wavelength plate 121;

其中,該第一反光鏡123位於分光鏡122之後,並用於反射第一分光光束,又該第一反光鏡123位上設有位移裝置1231,而該位移裝置1231係用於調整第一反光鏡 123的位置; The first mirror 123 is located behind the beam splitter 122 and is used to reflect the first beam splitter. The first mirror 123 is provided with a displacement device 1231, and the displacement device 1231 is used to adjust the first mirror.  123 location;  

其中,該第二反光鏡124位於分光鏡122之後,並用於反射第二分光光束;The second mirror 124 is located behind the beam splitter 122 and is used to reflect the second beam splitter;

其中,該聚光鏡125位於第一反光鏡123和第二反光鏡124所反射之第一分光光束和第二分光光束的路徑上,並將反射之第一分光光束和第二分光光束同整成相同方向,且第一分光光束和第二分光光束之間的平行距離係由位移裝置 1231移動第一反光鏡123來控制。 The condensing mirror 125 is located on the path of the first beam splitting beam and the second beam splitting beam reflected by the first mirror 123 and the second mirror 124, and the reflected first beam splitting beam and the second split beam collating beam are identical. Direction, and the parallel distance between the first split beam and the second split beam is by the displacement device  The 1231 moves the first mirror 123 to control.  

所述光束轉換裝置13係位於分光裝置12之後,並用於接收經聚光鏡125處理過的第一分光光束和第二分光光束,該光束轉換裝置13係由兩個或兩個以上的光束控制匣 131所組成,且各個光束控制匣131內設有可任意替換的繞射元件1311,該繞射元件1311係用於將第一分光光束和第二分光光束整形成平頂或多個聚焦點,又該光束轉換裝置13上設有能移動光束控制匣131的移動裝置132,並透過移動裝置132切換使用不同的光束控制匣131來產出兩種或兩種以上的雷射光路。 The beam converting device 13 is located behind the beam splitting device 12 and is configured to receive the first splitting beam and the second beam splitting beam processed by the collecting mirror 125, the beam converting device 13 being controlled by two or more beams.  131 is composed, and each of the beam control 匣 131 is provided with an arbitrarily replaceable diffractive element 1311 for forming a first split beam and a second split beam into a flat top or a plurality of focus points, The beam converting device 13 is provided with a moving device 132 capable of moving the beam control unit 131, and is switched by the moving device 132 to use different beam control units 131 to produce two or more types of laser light paths.  

所述中央控制裝置14係分別與雷射光束產生裝置 11、波長板121、位移裝置1231以及光束轉換裝置13電性連結。 The central control device 14 is respectively associated with a laser beam generating device  11. The wavelength plate 121, the displacement device 1231, and the beam conversion device 13 are electrically connected.  

另外,為了更加精準的控制切割低介電值材料(Low-K)晶圓2的雷射光束,可在雷射光束產生裝置11和分光裝置 12之間加裝一和中央控制裝置14電性連結的功率控制裝置 15,讓雷射光束先經過功率控制裝置15並透過中央控制裝置14調整其能量後再進入分光裝置12,藉此來使切割用的雷射光束能量更平均。 In addition, in order to more precisely control the laser beam of the low dielectric material (Low-K) wafer 2, the laser beam generating device 11 and the spectroscopic device can be used.  A power control device electrically connected to the central control unit 14 is installed between 12  15. Let the laser beam pass through the power control device 15 and adjust its energy through the central control unit 14 before entering the beam splitting device 12, thereby averaging the energy of the laser beam for cutting.  

有關於本創作之實施方式及相關可供參考圖式詳述如下所示:The details of the implementation of this creation and related reference drawings are as follows:

本創作在進行切割低介電值材料(Low-K)晶圓2前,會先透過中央控制裝置14選擇切割的光路種類(如圖2、圖3或圖4所示),再透過移動裝置132將能產出相對應光路的光束控制匣131移至定位後,接著開啟雷射光束產生裝置11並使雷射光束射入功率控制裝置15,並透過中央控制裝置14調整其能量後再進入分光裝置12,接續由分光裝置12將射入的雷射光束進行分光或不分光處理後再射入光束控制匣131,當雷射光束進入光束控制匣131後,其內部的繞射元件1311會將雷射光束轉變成預先設置的光路,最後使光路通過聚光元件16並打在低介電值材料(Low-K)晶圓2表面來進行切割。Before the cutting of the low dielectric material (Low-K) wafer 2, the creation first selects the type of the cut light path through the central control device 14 (as shown in FIG. 2, FIG. 3 or FIG. 4), and then transmits the mobile device. 132, after the beam control 匣 131 capable of outputting the corresponding optical path is moved to the position, then the laser beam generating device 11 is turned on and the laser beam is incident on the power control device 15, and the energy is adjusted by the central control device 14 before entering. The spectroscopic device 12 is connected to the laser beam by the spectroscopic device 12 to split or not split the light beam into the beam control unit 131. When the laser beam enters the beam control unit 131, the internal diffractive element 1311 The laser beam is converted into a predetermined optical path, and finally the optical path is passed through the concentrating element 16 and struck on the surface of the low dielectric material (Low-K) wafer 2 for cutting.

另外,須特別注意的是如要採用圖2所示之光路進行切割,則先透過調整波長板121使雷射光束進入分光鏡122後,將雷射光束的能量全數反射至第二反光鏡124;又若是要採用圖3所示之光路進行切割,則可預先透過調整位移裝置1231來設定兩道雷射光束之間的間距,接著由波長板121分配第一分光光束和第二分光光束的能量比例,再由分光鏡122將雷射光束分成第一分光光束和第二分光光束,且其能量分配的比例介於1%~99%:99%~1%之間,另外圖2、圖3以及圖4中所示之光路種類僅作為輔助參考,並非用以限定本創作之光路種類。In addition, it should be specially noted that if the optical path shown in FIG. 2 is used for cutting, the laser beam is first adjusted to enter the beam splitter 122, and the energy of the laser beam is totally reflected to the second mirror 124. And if the optical path shown in FIG. 3 is to be used for cutting, the spacing between the two laser beams can be set in advance by adjusting the displacement device 1231, and then the first beam splitting beam and the second beam splitting beam are distributed by the wavelength plate 121. The energy ratio is further divided into a first beam splitting beam and a second beam splitting beam by the beam splitter 122, and the energy distribution ratio is between 1% and 99%: 99% to 1%, and FIG. 2 3 and the type of optical path shown in FIG. 4 are only used as an auxiliary reference, and are not intended to limit the type of optical path of the present creation.

綜合上述,本創作用於切割低介電值材料(Low-K)晶圓的快速切換光路架構主要特色在於: 1. 使用者能透過中央控制裝置任意切換使用不同的光束控制匣,使單一雷射機台能使用多種不同的雷射光路進行加工。 2. 第一反光鏡上的位移裝置能任意調整其位置,並透過調整第一反光鏡的位置來改變第一分光光束和第二分光光束之間的間距。 In summary, the main features of this fast switching optical path architecture for cutting low dielectric material (Low-K) wafers are:  1. The user can switch between different beam control options through the central control unit, so that a single laser machine can be processed using a variety of different laser light paths.  2. The displacement device on the first mirror can adjust its position arbitrarily and change the distance between the first beam splitting beam and the second beam splitting beam by adjusting the position of the first mirror.  

故,本創作在同類產品中具有極佳之進步性以及實用性,同時查遍國內外關於此類結構之技術資料文獻後,確實未發現有相同或近似之構造存在於本案申請之前,因此本案應已符合『創作性』、『合於產業利用性』以及『進步性』的專利要件,爰依法提出申請之。Therefore, this creation has excellent progress and practicality in similar products. At the same time, after checking the technical literature on such structures at home and abroad, it has not been found that the same or similar structure exists before the application of this case, so this case It should meet the patent requirements of "creative", "combined with industrial use" and "progressive", and apply in accordance with the law.

唯,以上所述者,僅係本創作之較佳實施例而已,舉凡應用本創作說明書及申請專利範圍所為之其它等效結構變化者,理應包含在本創作之申請專利範圍內。It is to be understood that the above-mentioned preferred embodiments of the present invention are intended to be included in the scope of the present invention.

1‧‧‧用於切割低介電值材料(Low-K)晶圓的快速切換光路架構 11‧‧‧雷射光束產生裝置 12‧‧‧分光裝置 121‧‧‧波長板 122‧‧‧分光鏡 123‧‧‧第一反光鏡 1231‧‧‧位移裝置 124‧‧‧第二反光鏡 125‧‧‧聚光鏡 13‧‧‧光束轉換裝置 131‧‧‧光束控制匣 1311‧‧‧繞射元件 132‧‧‧移動裝置 14‧‧‧中央控制裝置 15‧‧‧功率控制裝置 16‧‧‧聚光元件 2‧‧‧低介電值材料(Low-K)晶圓 1‧‧‧Fast switching optical path architecture for cutting low dielectric material (Low-K) wafers  11‧‧‧Laser beam generating device  12‧‧‧ Spectroscopic device  121‧‧‧wavelength board  122‧‧‧beam splitter  123‧‧‧First mirror  1231‧‧‧displacement device  124‧‧‧Second mirror  125‧‧‧Condenser  13‧‧‧beam conversion device  131‧‧‧ Beam Control匣  1311‧‧‧Diffractive components  132‧‧‧Mobile devices  14‧‧‧Central control unit  15‧‧‧Power control unit  16‧‧‧ Concentrating elements  2‧‧‧Low dielectric material (Low-K) wafer  

圖1: 本創作架構示意圖; 圖2:本創作雷射切割示意圖(一); 圖3:本創作雷射切割示意圖(二); 圖4:本創作雷射切割示意圖(三)。 Figure 1: Schematic diagram of this creative architecture;  Figure 2: Schematic diagram of the laser cutting of this creation (1);  Figure 3: Schematic diagram of the laser cutting of this creation (2);  Figure 4: Schematic diagram of the laser cutting of this creation (3).  

Claims (6)

一種用於切割低介電值材料(Low-K)晶圓的快速切換光路架構,係包含有雷射光束產生裝置、分光裝置、光束轉換裝置以及中央控制裝置; 所述雷射光束產生裝置係用於產出切割低介電值材料(Low-K)晶圓的雷射光束; 所述分光裝置係用於接收雷射光束產生裝置所射出的雷射光束,該分光裝置係包含有波長板、分光鏡、第一反光鏡、第二反光鏡、以及聚光鏡; 其中,該波長板位於雷射光束產生裝置之後; 其中,該分光鏡位於波長板之後,並將雷射光束分為兩道不同角度且不重疊的第一分光光束和第二分光光束; 其中,該第一反光鏡位於分光鏡之後,並用於反射第一分光光束,又該第一反光鏡上設有位移裝置; 其中,該第二反光鏡位於分光鏡之後,並用於反射第二分光光束; 其中,該聚光鏡位於第一反光鏡和第二反光鏡所反射之第一分光光束和第二分光光束的路徑上,並將第一分光光束和第二分光光束同整成相同方向,且第一分光光束和第二分光光束之間的平行距離係由位移裝置移動第一反光鏡來控制; 所述光束轉換裝置係位於分光裝置之後,並用於接收經聚光鏡處理過的第一分光光束和第二分光光束,該光束轉換裝置係由兩個或兩個以上的光束控制匣所組成,且各個光束控制匣內設有繞射元件,又該光束轉換裝置上設有用於切換光束控制匣的移動裝置,並透過移動裝置切換使用不同的光束控制匣來產出兩種或兩種以上的雷射光路; 所述中央控制裝置係分別與雷射光束產生裝置、波長板、第一反光鏡以及光束轉換裝置電性連結。 A fast switching optical path architecture for cutting low dielectric material (Low-K) wafers, comprising a laser beam generating device, a beam splitting device, a beam converting device and a central control device;  The laser beam generating device is configured to produce a laser beam that cuts a low dielectric material (Low-K) wafer;  The beam splitting device is configured to receive a laser beam emitted by the laser beam generating device, the beam splitting device comprising a wavelength plate, a beam splitter, a first mirror, a second mirror, and a collecting mirror;  Wherein the wavelength plate is located behind the laser beam generating device;  Wherein the beam splitter is located behind the wavelength plate, and divides the laser beam into two different angles and does not overlap the first beam splitting beam and the second beam splitting beam;  The first mirror is located behind the beam splitter and is used for reflecting the first beam splitter, and the first mirror is provided with a displacement device;  Wherein the second mirror is located behind the beam splitter and is used for reflecting the second beam splitting beam;  Wherein, the condensing mirror is located on a path of the first splitting beam and the second beam splitting beam reflected by the first mirror and the second mirror, and the first splitting beam and the second beam splitting beam are in the same direction, and the first The parallel distance between the splitting beam and the second beam splitting beam is controlled by the displacement device moving the first mirror;  The beam converting device is located behind the beam splitting device and is configured to receive the first beam splitting beam and the second beam splitting beam processed by the condensing mirror, wherein the beam converting device is composed of two or more beam control devices, and each A diffractive element is disposed in the beam control unit, and a moving device for switching the beam control unit is disposed on the beam converting device, and different beam control units are switched through the moving device to generate two or more types of laser light. road;  The central control device is electrically coupled to the laser beam generating device, the wave plate, the first mirror, and the beam converting device, respectively.   如請求項第1項所述之用於切割低介電值材料(Low-K)晶圓的快速切換光路架構,其中,該雷射光束產生裝置所發出之雷射光束波長為355nm。The fast switching optical path architecture for cutting a low dielectric value material (Low-K) wafer according to claim 1, wherein the laser beam emitted by the laser beam generating device has a wavelength of 355 nm. 如請求項第1項所述之用於切割低介電值材料(Low-K)晶圓的快速切換光路架構,其中,該雷射光束產生裝置和分光裝置之間設有功率控制裝置。The fast switching optical path architecture for cutting a low dielectric value material (Low-K) wafer according to claim 1, wherein a power control device is disposed between the laser beam generating device and the spectroscopic device. 如請求項第3項所述之用於切割低介電值材料(Low-K)晶圓的快速切換光路架構,其中,該功率控制裝置係與中央控制裝置電性連結。The fast switching optical path architecture for cutting a low dielectric value material (Low-K) wafer according to claim 3, wherein the power control device is electrically connected to the central control device. 如請求項第1項所述之用於切割低介電值材料(Low-K)晶圓的快速切換光路架構,其中,該光束控制匣內的繞射元件為可替換式。A fast switching optical path architecture for cutting a low dielectric material (Low-K) wafer, as described in claim 1, wherein the diffractive element in the beam control crucible is replaceable. 如請求項第1項所述之用於切割低介電值材料(Low-K)晶圓的快速切換光路架構,其中,該繞射元件係用於將第一分光光束和第二分光光束整形成平頂或多個聚焦點。The fast switching optical path architecture for cutting a low dielectric material (Low-K) wafer according to claim 1, wherein the diffraction element is used to shape the first beam splitting beam and the second beam splitting beam Flat top or multiple focus points.
TW108204901U 2019-04-19 2019-04-19 Fast switching optical-path architecture for cutting low dielectric material (low-K) wafers TWM582256U (en)

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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI752311B (en) * 2019-04-19 2022-01-11 雷科股份有限公司 Fast switching optical-path architecture for cutting low dielectric material (low-k) wafers

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI752311B (en) * 2019-04-19 2022-01-11 雷科股份有限公司 Fast switching optical-path architecture for cutting low dielectric material (low-k) wafers

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