TWM548271U - Assembled probe component - Google Patents

Description

Assembly probe assembly

The present invention relates to an assembled probe assembly, and more particularly to an assembled probe assembly that is removably mounted to a probe machine.

In general, existing solar cells usually have a plurality of finger electrodes and a bus bar connecting all the finger electrodes, so as to effectively collect current; however, the bus bar arrangement requires a large amount of conductive glue, which not only increases manufacturing. Cost, and will relatively cover the light absorption area of the solar cell, and even affect the aesthetics of the solar cell; therefore, the existing solar cell will develop a solar cell without a bus bar, in order to effectively reduce the cost and improve the solar cell The area of light absorption.

Please refer to the first figure and the second figure. The first figure shows a perspective view of a conventional solar cell without a bus bar; the second figure shows a stereoscopic view of a conventional solar cell with a fine grid line. As shown in the first figure, a solar cell PA100 includes a solar cell body PA1 and a plurality of finger electrodes PA2. Among them, when the user wants to conduct electrical test on the solar cell PA100, since the solar cell PA100 does not have a bus bar, it needs to be tested with a special test machine.

As shown in the second figure, a solar cell PA200 includes a solar cell body PA3, a plurality of finger electrodes PA4 and four connections. A fine gate line PA5 of the finger electrodes PA4. The width of the fine gate line PA4 is extremely narrow, so that the existing probe type test machine can not effectively perform the electrical test on the solar cell PA100 by using the probe to contact the fine gate line PA5. Use a special test machine for electrical testing.

As described above, although in the prior art, a solar cell with no bus bar or fine grid line can be electrically tested through a special test machine, since a general solar cell manufacturer usually has multiple test probes. Needle test equipment, therefore, for manufacturers of test equipment that already have multiple test probes, the purchase of new test equipment for solar cells without busbars or fine grid lines will substantially increase the manufacturing cost of solar cells.

In view of the existing technology, most manufacturers have a probe test machine for electrically connecting the bus bars of solar cells, but when the solar cells are provided with a fine fine gate line to sink the current collected by the finger electrodes, The contact area between the existing probe test machine and the fine grid line is too small, resulting in an inability to perform an effective electrical test of the fine grid line. It is necessary to additionally purchase a rod electrode test machine to contact the entire fine grid by the rod electrode. The line is tested, but it will greatly increase the manufacturing cost of the solar cell; therefore, the main purpose of this creation is to use the existing probe test machine to electrically test the fine grid or the bus without the bus. .

Based on the above purposes, the technical means used in this creation Providing a set of probe assembly for assembling to a test device having a plurality of probe holders and a plurality of test probes detachably disposed in the probe holder, the probe probe assembly A plurality of probe elements and a plurality of probe holders are included.

Each of the probe elements has a connecting surface and a contact surface disposed oppositely, and has a first mating end and a second mating end opposite to each other. The connecting surface is provided with a plurality of connecting grooves; wherein the contact surface is a rough surface. The first butt end is used to interface with the second butt end of the adjacent probe element, so that the probe elements are assembled to form a probe assembly structure extending along a first extending direction, and the probe assembly structure Contacting a plurality of finger electrodes of a solar cell with a contact surface of each probe element, wherein the finger electrodes extend in a second extending direction different from the first extending direction; preferably, the second extending direction It is perpendicular to the first direction of extension.

Each probe holder includes a bracket body and a connector. The bracket system is detachably inserted into the probe holder. The connecting member is elastically repositioned in the bracket body and coupled to the probe member. Preferably, the connecting member is coupled to the probe member by means of insertion, welding or integral molding.

Wherein, when the test probe is detached from the probe holder, the probe element is inserted into the probe holder through the probe holder and electrically connected to the test device.

As described above, since the assembled probe assembly of the present invention utilizes a plurality of probe holders to electrically connect the plurality of probe elements to the existing test device, the contact can be adjusted not only by the number of probe elements. The length distance of the solar cell can be effectively reduced by the use of the existing test device.

The specific embodiments used in the present application will be further illustrated by the following examples and drawings.

PA100, PA200‧‧‧ solar cells

PA1, PA3‧‧‧ solar cell body

PA2, PA4‧‧‧ finger electrode

PA5‧‧‧fine grid line

100‧‧‧Connected probe assembly

1, 1a, 1b, 1c‧‧‧ probe components

11‧‧‧ Linkage

111, 112‧‧‧ connection slot

12‧‧‧Contact surface

13‧‧‧First docking end

131‧‧‧First inner contact surface

132‧‧‧First side contact surface

133‧‧‧First outer contact surface

14‧‧‧Second docking end

141‧‧‧Second outer contact surface

142‧‧‧Second side contact surface

143‧‧‧Second inner contact surface

2a, 2b‧‧‧ probe holder

21a, 21b‧‧‧ bracket body

22a, 22b‧‧‧Connecting parts

200‧‧‧Testing device

201‧‧‧ machine body

202, 202a, 202b, 202c‧‧‧ probe set

203a, 203b, 203c‧‧‧ test probe

300, 400‧‧‧ solar cells

301, 401‧‧‧ solar cell body

302, 402‧‧‧ finger electrodes

303‧‧‧fine grid line

D1‧‧‧First extension direction

D2‧‧‧ second extension direction

The first figure shows a perspective view of a conventional solar cell without a busbar; the second figure shows a schematic view of a conventional solar cell with a fine grid line; and the third figure shows the group provided by the preferred embodiment of the present invention. The schematic view of the probe assembly is connected to the test device; the fourth diagram is a schematic exploded view of the probe component and the probe holder of the assembled probe assembly provided by the preferred embodiment of the present invention; The schematic diagram of the test device for docking assembly of the assembled probe assembly provided by the present invention is shown; the sixth figure shows a schematic view of a part of the test probe of the test device removed from the probe setting seat; the seventh figure shows the present The stereoscopic exploded view of the assembled probe assembly assembled to the test device for electrical testing of the thin grid row solar cells; the eighth diagram shows that the assembled probe assembly of the present invention is mounted on the test device A schematic diagram of electrical testing of a thin grid of solar cells; and a ninth diagram showing that the assembled probe assembly of the present invention is mounted on a test device A schematic exploded view of an electrical test for a busbarless solar cell.

The specific implementation of the present creation will be described in more detail below with reference to the schematic drawings. The advantages and features of the present invention will be more apparent from the following description and claims. It should be noted that the drawings are in a very simplified form and all use non-precise proportions, and are only used to facilitate and clearly explain the purpose of the present embodiment.

Please refer to the third figure. The third figure shows a perspective view of the assembled probe assembly provided in the preferred embodiment of the present invention. As shown, an assembled probe assembly 100 includes a plurality of probe elements 1, 1a, 1b, and 1c and eight probe holders 2a and 2b (only two are shown). The assembled probe assembly 100 is used for assembly in a test device 200.

Please refer to the fourth figure, which is a perspective exploded view showing the probe element and the probe holder of the assembled probe assembly provided by the preferred embodiment of the present invention. As shown in the figure, the probe element 1 is extended along a first extending direction D1, and has a connecting surface 11, a contact surface 12, a first butting end 13 and a second docking end. End 14. The first butt end 13 and the second butt end 14 are respectively connected to the two connecting faces 11 and the contact faces 12 .

The connecting surface 11 is provided with two connecting grooves 111 and 112. The contact surface 12 is disposed opposite to the joint surface 11, and the contact surface 12 is a rough surface. The first butt end 13 and the second butt end 14 are located oppositely Both ends of the joint surface 11 and the contact surface 12 are connected to the joint surface 11 and the contact surface 12, respectively. The first butt end 13 and the second butt end 14 are complementary structural designs, and the first butt end 13 has a first inner contact surface 131, a first side contact surface 132, and a first outer contact surface. 133, and the second butt end 14 has a second outer contact surface 141, a second side contact surface 142, and a second inner contact surface 143.

In practical use, the first inner contact surface 131, the first side contact surface 132 and the first outer contact surface 133 are respectively adjacent to the adjacent probe elements (not shown, corresponding to the probe element 1). The inner contact surface (not shown, corresponding to the second outer contact surface 141), the second side contact surface (not shown, corresponding to the second side contact surface 142) and the second outer contact surface (not shown, Corresponding to the second inner contact faces 143) are spaced apart from each other.

Taking the probe holders 2a and 2b as an example, the probe holder 2a includes a holder body 21a and a connecting member 22a. The connecting member 22a is elastically re-inserted in the bracket body 21a, and the connecting member 22a is inserted into the connecting groove 111 of the probe element 1, and is connected by welding, thereby fixing the probe bracket 2a. Connected to the probe element 1. Similarly, the probe holder 2b also includes a bracket body 21b and a connecting member 22b, and the connecting member 22b is coupled to the probe member 21 in addition to being elastically re-inserted in the bracket body 21b. In the present embodiment, the connecting member 22b is inserted and coupled to the connecting groove 112 of the probe element 1, and is fixedly connected by soldering, thereby fixing the probe holder 2b to the probe element 1; however, In other embodiments, the connector 22b may also be integrally coupled to the probe element 1. That is, in the present creation, the manner in which the connecting member 22b is coupled to the probe element 1 includes insertion and welding. Connection or integral molding.

Please refer to the fifth and sixth figures. The fifth figure shows the schematic diagram of the test device for the docking assembly of the assembled probe assembly provided by this creation. The sixth figure shows the test probe from the test device. The three-dimensional diagram of the seat is removed. As shown, the existing testing device 200 includes a machine body 201, ten probe mounting seats 202a, 202b and 202c (only three are shown) and ten test probes 203a, 203b and 203c (in the figure). Only three are marked). When the assembled probe assembly 100 of the present embodiment is to be installed in the testing device 200, first, a plurality of test probes (including the test probes 203b and 203c) are separately provided from the probe mounting base (including the probe). The holders 202b and 202c) are detached, and then, as shown in the third figure, the probe elements 1 are taken as an example, and the probe holders 2a and 2b are correspondingly inserted into the probe holders 202b and 202c, thereby making the probes The element 1 is electrically connected to the stage body 201 through the probe holders 2a and 2b, and further, the plurality of probe elements 1, 1a, 1b and 1c are arranged to extend in the first extending direction D1.

Please continue to refer to the seventh and eighth figures. The seventh figure shows a three-dimensional exploded view of the assembled probe assembly of the present invention installed in the test device for electrically testing the solar cells of the fine grid line; The schematic diagram shows that the assembled probe assembly of the present invention is installed in a test device to electrically test a solar cell of a fine grid line. As shown in the figure, a solar cell 300 includes a solar cell body 301, a plurality of finger electrodes 302 extending in a second extending direction D2 perpendicular to the first extending direction D1 and disposed on the solar cell body 301, and when the user When the solar cell 300 is to be electrically tested, the assembled probe assembly of the present invention can be used. 100 is installed in the machine body 201 of the testing device 200, and then moves the assembled probe assembly 100 toward the solar cell 300 through the lowering of the machine body 201, wherein the probe set of the assembled probe assembly 100 The connection structure extends in the first extending direction D1, so that the fine gate lines 303 which also extend in the first extending direction D1 can be largely contacted, thereby testing the electrical properties of the fine gate lines 303.

In practical practice, when the size of the solar cell 300 changes, the user can increase or decrease the number of the probe elements 1, 1a, 1b, and 1c installed in the testing device 200 according to the range of the finger electrode distribution. .

Please refer to the ninth figure. The ninth figure shows a three-dimensional exploded view of the assembled probe assembly of the present invention installed in the testing device for electrical testing of the busbar-free solar cell. As shown, the test device 100 of the present invention can also be used to electrically test another solar cell 400.

Compared with the solar cell 300 described above, the solar cell 400 in this embodiment also includes a solar cell body 401 and a plurality of finger electrodes 402. However, the solar cell 400 does not include the fine grid lines 203 as described above. That is, the solar cell 400 of the present embodiment is a busbarless solar cell, and the finger electrode 402 is also disposed on the solar cell body 401 so as to extend in a second extending direction D2 perpendicular to the first extending direction D1.

The testing device 100 of the present invention can contact a plurality of finger electrodes 402 extending along the second extending direction D2 by the probe elements 1, 1a, 1b, and 1c extending along the first extending direction D1, thereby completing the solar energy. Electrical test of battery 400.

In summary, in the prior art, in order to electrically test a solar cell of a fine grid line, a test machine for additionally purchasing a rod probe is required for testing, thereby increasing the manufacturing of the solar cell. Cost; the assembled probe assembly of the present invention can be inserted into the probe setting seat of the existing testing device by using the probe holder, thereby electrically connecting the probe element to the machine body, and due to multiple explorations of the present invention The needle elements are respectively connected to the probe mounting base through the probe holder and are butted into each other to form a probe assembly structure. Therefore, the user can adjust the number of probe element docking according to the size of the solar battery or the length of the fine grid line. In turn, the convenience of the solar cell in performing electrical testing is increased, and the cost can be effectively reduced because the sleeve is used in an existing test device.

In addition, since the plurality of probe elements of the present invention are electrically connected to the test device through the respective fixed probe holders, and are coupled into the probe assembly structure through the corresponding first butt end and the second butt end, Therefore, when the test device is pressed down and each probe element is contacted to the solar cell through the probe holder, each probe element can independently adjust the stroke of the pressing force independently without being affected by interference of other probe elements. Contacting the area of the solar cell; compared to the prior art rod probe is a long strip electrode structure, it is easy to affect the contact area due to the degree of the both ends falling, the assembled probe assembly of the present invention can be effective Increase the stability of the contact solar cell.

The features and spirit of the present invention are more clearly described in the above detailed description of the preferred embodiments, and the scope of the present invention is not limited by the preferred embodiments disclosed herein. in contrast It is intended to cover a wide range of changes and equivalences within the scope of the patent application to which the Creative Application is intended.

100‧‧‧Connected probe assembly

1, 1a, 1b, 1c‧‧‧ probe components

2a, 2b‧‧‧ probe holder

200‧‧‧Testing device

201‧‧‧ machine body

202a, 202b, 202c‧‧‧ probe set

203a‧‧‧Test probe

D1‧‧‧First extension direction

Claims (6)

An assembled probe assembly for assembling a test device having a plurality of probe holders and a plurality of test probes detachably disposed on the probe holders, the assembly The probe assembly includes: a plurality of probe elements, each of the probe elements having a first mating end and a second mating end opposite to each other, the first mating end of one of the probe elements And abutting the second butt end adjacent to one of the probe elements, so that the probe elements are assembled to form a probe assembly structure extending along a first extending direction, the probe The assembly structure is configured to contact a plurality of finger electrodes of a solar cell, the finger electrodes extending along a second extension direction different from the first extension direction; and the plurality of probe holders are respectively fixed Connecting to the probe components, and detachably being inserted into the probe mounting seats; wherein when the test probes are detached from the probe mounting seats, the probe components are transmitted through the probe components Some probe brackets are inserted in the probe mounting seats and electrically connected In the test apparatus. The assemblage probe assembly of claim 1, wherein each of the probe elements has a connecting surface and a contact surface for fixing the probes. At least one of the brackets, the contact surface is for contacting the finger electrodes. The splicing probe assembly of the second aspect of the invention, wherein the connecting surface is provided with a plurality of connecting slots, and the probe brackets are respectively inserted into the connecting slots. The assembly probe assembly of claim 3, wherein the probe holders are respectively soldered to the connection slots. The assembly probe assembly of claim 2, wherein the contact surface is a rough surface. The assemblage probe assembly of claim 1, wherein the second extending direction and the first extending direction are perpendicular to each other.