TWM548270U - Rod-shaped probe component and test device - Google Patents

Description

Rod probe assembly and test device

The present invention relates to a rod probe assembly and a test device, and more particularly to a rod probe assembly and a test device for attaching a rod probe body to a probe test machine using a probe holder.

In general, existing solar cells usually have a plurality of finger electrodes and a bus bar connecting all the finger electrodes to collect current. However, the bus bar arrangement requires a large amount of conductive glue, which not only increases the manufacturing cost, but also It will relatively block the light absorption area of the solar cell, and even affect the aesthetics of the solar cell; therefore, the existing solar cell will develop a solar cell without a bus bar, in order to effectively reduce the cost and increase the light absorption area of the solar cell. .

Please refer to the first figure. The first figure shows a schematic view of an existing solar cell. As shown, a solar cell PA100 includes a solar cell body PA1, a plurality of finger electrodes PA2, and four bus bars PA3. Wherein, when the user wants to perform electrical testing on the solar cell PA100, since the bus bar PA3 is provided to connect the plurality of finger electrodes PA2 in the solar cell PA100, since the shielding area of the bus bar PA3 is reduced, Increasing the photoelectric conversion rate of the solar cell PA100, so the width of the bus bar PA3 is designed to be extremely narrow, resulting in the existing The probe type test machine uses the probe contact busbar PA3 to have an area that is too small to electrically test the solar cell PA100.

In addition, existing solar cells also have a busbar-free design, and solar cells without busbars cannot be electrically tested using existing probe-type testers.

As described above, in the prior art, a solar cell without a bus bar or a thin bus bar cannot be electrically tested by an existing probe measuring device, and the solar cell manufacturer must separately purchase a special electrical test device. Further, the manufacturing cost of the solar cell is relatively increased.

In view of the existing technology, most manufacturers have probe test machines for electrically connecting the bus bars of solar cells. However, when the bus bars of solar cells are extremely thin or have no bus bars, the existing probe test machine It is impossible to access all the finger electrodes, which requires the addition of a rod electrode test machine to test the solar cells with fine busbars or busbars, but it will greatly increase the manufacturing cost of solar cells. Therefore, the main purpose of this creation is to use the existing probe testing machine to electrically test the thin bus or the bus without the bus.

Based on the above purposes, the necessary technical means adopted by the present invention is to provide a rod probe assembly for assembling to a probe testing machine, the probe testing machine having at least one probe setting seat and at least one detachable a test probe disposed in the probe holder, the rod probe assembly includes a A rod probe body and at least one probe holder.

The rod probe system extends in a first extending direction and has a connecting surface and a contact surface disposed opposite each other. The connecting surface is provided with at least one connecting groove. The contact surface is a rough surface for contacting a plurality of finger electrodes of a solar cell extending in a second extending direction different from the first extending direction; preferably, the second extending direction and the first extending direction are Perpendicular to each other.

Each probe holder includes a bracket body, a spring, and a connector. The bracket is configured to be detachably inserted into the probe mounting seat, and has a receiving slot, and one of the opening of the receiving slot is provided with a stopping structure. The spring system is disposed in the receiving groove. The connecting member is movably disposed in the receiving groove, and has a stopping portion, a through portion and a connecting portion. The stopping portion is used for abutting against the stopping structure and the spring, and the connecting portion is integrally formed. The ground portion is disposed on one side of the stopping portion and is configured to be disposed on the spring. The connecting portion is integrally formed on the other side of the stopping portion with respect to the wearing portion, and protrudes from the opening, and the connecting portion is used The rod probe body is fixed to the rod probe body, and is electrically connected to the rod probe body. The connection portion may be integrally fixedly coupled to the rod probe body or inserted through the connection groove. The rod-shaped probe body is fixed, and when the connecting portion is inserted and fixed to the rod-shaped probe body, it can be fixedly connected by welding.

Wherein, when the test probe is detached from the probe holder, the rod probe system is inserted into the probe holder through the probe holder and electrically connected to the probe test machine.

This creation is intended to solve the problems of the prior art. A test device includes a probe test machine and a rod probe assembly.

The probe testing machine has at least one probe mounting base and at least one test probe detachably disposed in the probe mounting seat. The rod probe assembly includes a rod probe body and at least one probe holder.

The rod probe system extends in a first extending direction and has a connecting surface and a contact surface disposed opposite each other. The connecting surface is provided with at least one connecting groove. The contact surface is a rough surface for contacting a plurality of finger electrodes extending in the second extending direction of the solar cell, and the second extending direction is perpendicular to the first extending direction.

Each probe holder includes a bracket body, a spring, and a connector. The bracket is configured to be detachably inserted into the probe mounting seat, and has a receiving slot, and one of the opening of the receiving slot is provided with a stopping structure. The spring system is disposed in the receiving groove. The connecting member is movably disposed in the receiving groove, and has a stopping portion, a through portion and a connecting portion. The stopping portion is used for abutting against the stopping structure and the spring, and the connecting portion is integrally formed. Is disposed on one side of the stopping portion and is configured to be disposed on the spring. The connecting portion is integrally formed on the other side of the stopping portion with respect to the wearing portion, and protrudes from the opening for inserting The rod-shaped probe body is fixed to the connection groove, and the connection portion is fixed by welding after being inserted into the connection groove.

Wherein, when the test probe is detached from the probe holder, the rod probe system is inserted into the probe holder through the probe holder and electrically connected to the probe test machine.

As described above, the test device and the rod probe of the present invention The component is mainly fixed to the rod probe body by using at least one probe bracket, and the probe probe is used to replace the test probe of the existing probe test machine, so that the probe bracket is inserted into the probe holder, and then The rod probe body is electrically connected to the probe testing machine through the probe holder.

The specific embodiments used in the present application will be further illustrated by the following examples and drawings.

PA100‧‧‧Solar cell without busbar

PA1‧‧‧ solar cell body

PA2‧‧‧ finger electrode

100‧‧‧Testing device

1‧‧‧ rod probe assembly

11‧‧‧ Rod probe body

111‧‧‧ Linkage

112‧‧‧Contact surface

1111‧‧‧Connection slot

12a, 12b, 12c, 12d‧‧‧ probe holder

121a‧‧‧ bracket body

1211a‧‧‧ accommodating slots

12111a‧‧‧stop structure

122a‧‧ Spring

123a‧‧‧Connecting parts

1231a‧‧‧stop

1232a‧‧‧ Department of Wear

1233a‧‧‧Connecting Department

2‧‧‧Probe test machine

21a, 21b, 21c, 21d, 21e, 21f, 21g, 21h‧‧‧ probe set

22a‧‧‧Test probe

200, 300‧‧‧ solar cells

201, 301‧‧‧ solar cell body

202, 302‧‧‧ finger electrodes

203‧‧‧fine bus

D1‧‧‧First extension direction

D2‧‧‧ second extension direction

The first figure shows a perspective view of a conventional solar cell; the second figure shows a perspective exploded view of the rod probe assembly provided by the preferred embodiment of the present invention; and the third figure shows the preferred embodiment of the present invention. A schematic view of a rod-shaped probe assembly; a fourth diagram showing a planar exploded view of the test apparatus of the present invention; a fifth diagram showing a schematic diagram of the test apparatus of the present creation; and a sixth diagram showing a preferred embodiment of the present invention. A schematic cross-sectional view of the test apparatus provided; the seventh diagram is an enlarged schematic view of the sixth diagram of the sixth diagram; the eighth diagram is a schematic exploded view showing the actual operation of the test apparatus of the present invention; and the ninth diagram shows the test apparatus of the present creation. The practical use of the three-dimensional schematic diagram; and the tenth diagram shows another practical application of the test device of the present invention Figure.

The specific implementation of the present creation will be described in more detail below with reference to the schematic drawings. The advantages and features of the present invention will be more apparent from the following description and claims. It should be noted that the drawings are in a very simplified form and all use non-precise proportions, and are only used to facilitate and clearly explain the purpose of the present embodiment.

Please refer to the second and third figures. The second figure shows a perspective exploded view of the rod probe assembly provided by the preferred embodiment of the present invention. The third figure shows the rod shape provided by the preferred embodiment of the present invention. A schematic view of the probe assembly. As shown, a rod probe assembly 1 includes a rod probe body 11 and a plurality of probe holders 12a, 12b, 12c and 12d.

The rod-shaped probe body 11 extends along a first extending direction D1 and has a connecting surface 111 and a contact surface 112 disposed opposite to each other. The connecting surface 111 is provided with four connecting grooves 1111 (only one is shown in the figure). Contact surface 112 is a rough surface.

The probe holders 12a, 12b, 12c and 12d have the same configuration. Taking the probe holder 12a as an example, the probe holder 12a includes a holder body 121a, a spring 122a (indicated in the eighth figure), and a connecting member 123a. The connecting member 123a is movably disposed in the bracket body 121a and is inserted and fixed to the connecting slot 1111; wherein, since the connecting member 123a and the rod-shaped probe body 11 are both conductive metal, the connecting member 123a is inserted. When the fixing groove 1111 is fixed, the connecting member 123a is electrically connected to the rod probe. Body 11.

Please refer to the fourth and fifth figures. The fourth figure shows the planar exploded view of the test device of the present creation; the fifth figure shows the schematic view of the test device of the present creation. As shown, a test apparatus 100 includes the above-described rod probe assembly 1 and a probe test machine 2. Wherein, the probe testing machine 2 has eight probe mounting seats 21a, 21b, 21c, 21d, 21e, 21f, 21g and 21h and four test probes (only one test probe 22a is indicated in the figure), and the test The probe 22a is detachably provided to the probe mounting seat 21a.

In practice, in order to connect the rod probe assembly 1 to the probe testing machine 2, the user can first disassemble the probe probes 21b, 21d, 21e and 21g, and then probe The needle holders 12a, 12b, 12c, and 12d can be respectively inserted into the probe mounting seats 21b, 21d, 21e, and 21g, and the rod probe body 11 can be electrically connected through the four probe holders 12a, 12b, 12c, and 12d. For the probe test machine 2. The probe testing machine 2 is an existing solar battery electrical testing machine.

Taking the bracket body 121a as an example, the bracket body 121a is detachably inserted into the probe mounting seat 21b, and the probe mounting seat 21a of the other test probes 22a without being detached can be assembled in the rod probe assembly 1 When the probe is tested on the machine 2, it is electrically connected to the rod probe body 11 through the original test probe 22a, that is, when the rod probe body 11 passes through the probe holders 12a, 12b, 12c, and 12d, respectively. After the probes are attached to the probe holders 21b, 21d, 21e, and 21g, the probe holders 21a, 21c, 21f, and 21g from which the test probes (such as the test probes 22a) are not removed can still pass the previously set test probe. The needle (such as the test probe 22a) directly contacts the rod probe body 11, thereby making the rod probe There is more electrical connection path between the needle body 11 and the probe testing machine 2.

Please refer to the sixth and seventh figures. The sixth drawing is a schematic cross-sectional view of the testing device provided by the preferred embodiment of the present invention; the seventh drawing is an enlarged schematic view of the sixth drawing. As shown in the figure, the probe holder 12a is detachably inserted into the probe mounting seat 21b, and has a receiving slot 1211a, and one opening of the receiving slot 1211a is provided. Block structure 12111a. The spring 122a is disposed in the accommodating groove 1211a. The connecting member 123a is movably disposed in the receiving groove 1211a, and has a stopping portion 1231a, a through portion 1232a and a connecting portion 1233a.

The two faces of the stopper portion 1231a are respectively abutted against the stopper structure 12111a and the spring 122a. The insertion portion 1232a is integrally formed on one side of the stopper portion 1231a and is disposed to be disposed on the spring 122a. The connection portion 1233a is integrally formed on the other side of the stopper portion 1231a with respect to the insertion portion 1232a. The opening of the self-receiving slot 1211a protrudes and is inserted into the connecting groove 1111 to fix the rod-shaped probe body 11. In addition, in the present embodiment, the connecting portion 1233a is fixed by soldering after being inserted into the connecting groove 1111, so that the connecting member 123a is electrically connected to the rod probe body 11; however, In other embodiments, the connecting portion 1233a of the connecting member 123a can also be integrally fixed to the rod probe body 11.

Please refer to the eighth and ninth diagrams. The eighth figure shows a schematic exploded view of the actual application of the test device of the present invention; the ninth figure shows the practical use of the test device of the present invention. As shown, when the user wants to test a solar cell 200, although the plurality of finger electrodes 202 of the solar cell 200 are perpendicular to the first extending direction The second extending direction D2 of the D1 is extended and disposed on a solar cell body 201, and is connected by four thin bus bars 203 extending along the first extending direction D1, but the user can utilize the testing device 100 of the present invention. The probe holder 12a (and the probe holders 12b, 12c and 12d) couples the rod probe body 11 to the existing probe testing machine 2, thereby causing the rod probe body 11 extending in the first extending direction D1 to While contacting the fine bus bar 203, it is also possible to contact a plurality of finger electrodes 202 of the second extending direction D2, thereby effectively performing electrical testing on the solar cell 200. Further, in other embodiments, the rod probe assembly 1 of the present invention has a rod-shaped probe body 11 extending in the first extending direction D1. In the embodiment, the first extending direction D1 and the second extending direction D2 are perpendicular to each other. However, in other embodiments, the first extending direction D1 and the second extending direction D2 may also intersect without being perpendicular to each other.

Please continue to refer to the tenth figure, which shows a schematic view of another practical application of the test device of the present invention. As shown, the test device 100 of the present invention can also be used to electrically test another solar cell 300.

Compared with the solar cell 200 described above, the solar cell 300 in this embodiment also includes a solar cell body 301 and a plurality of finger electrodes 302. However, the solar cell 300 does not include the thin bus bar 203 as described above. That is, the solar cell 300 of the present embodiment is a busbarless solar cell, and the finger electrode 302 is also disposed on the solar cell body 301 so as to extend in a second extending direction D2 perpendicular to the first extending direction D1.

The test device 100 of the present invention can contact a plurality of finger electrodes 302 extending along the second extending direction D2 by the rod probe body 11 extending along the first extending direction D1, thereby completing the electrical properties of the solar cell 300. test.

In summary, since the test device and the rod probe assembly of the present invention are mainly fixed to the rod probe body by using at least one probe holder, and the probe probe is used to replace the existing probe test machine. The needle is inserted into the probe holder, and the rod probe body is electrically connected to the probe testing machine through the probe holder; thereby, when the user wants to use the solar cell without the busbar For the electrical test, it is only necessary to disassemble the test probe of the existing probe test machine and install the rod probe assembly. Compared with the prior art, the solar cell without the busbar is used. Electrical testing requires the addition of a probe testing machine with a rod probe. The test device and the rod probe assembly provided by this creation can indeed be replaced by the replacement of the test probe and the rod probe assembly. The solar cell without the busbar is electrically tested, thereby effectively reducing the manufacturing cost of the solar cell.

The features and spirit of the present invention are more clearly described in the above detailed description of the preferred embodiments, and the scope of the present invention is not limited by the preferred embodiments disclosed herein. On the contrary, it is intended to cover all kinds of changes and equivalences within the scope of the patent application to which the present invention is intended.

100‧‧‧Testing device

1‧‧‧ rod probe assembly

11‧‧‧ Rod probe body

111‧‧‧ Linkage

112‧‧‧Contact surface

12a, 12b, 12c, 12d‧‧‧ probe holder

121a‧‧‧ bracket body

123a‧‧‧Connecting parts

2‧‧‧Probe test machine

21a, 21b, 21c, 21d, 21e, 21f, 21g, 21h‧‧‧ probe set

22a‧‧‧Test probe

Claims (16)

A rod probe assembly for assembling to a probe testing machine, the probe testing machine having at least one probe mounting seat and at least one test probe detachably disposed on the at least one probe mounting seat The needle probe assembly comprises: a rod-shaped probe body extending along a first extending direction for contacting a plurality of finger electrodes of a solar cell, wherein the finger electrodes are different from each other The second extending direction of the first extending direction extends; and at least one probe holder is fixed to the rod probe body and is detachably inserted into the at least one probe setting seat; wherein, when When the at least one test probe is detached from the at least one probe holder, the rod probe is electrically connected to the probe through the at least one probe holder. Machine. The rod probe assembly of claim 1, wherein the rod probe body has a pair of connecting surfaces and a contact surface for fixing the at least one probe bracket The contact surface is for contacting the finger electrodes. The rod probe assembly of claim 2, wherein the connecting surface is provided with at least one connecting groove, and the at least one probe holder is inserted into the at least one connecting groove. The rod probe set as described in claim 2 And the at least one probe holder is soldered to the at least one connecting groove. The rod probe assembly of claim 2, wherein the contact surface is a rough surface. The rod probe assembly of claim 1, wherein the at least one probe holder is integrally fixed to the rod probe body. The rod probe assembly of claim 1, wherein the first extending direction is perpendicular to the second extending direction. The rod probe assembly of claim 1, wherein the at least one probe holder comprises: a bracket body having a receiving groove, and one of the receiving slots is provided with a stop structure a spring is disposed in the accommodating groove; and a connecting member is movably disposed in the accommodating groove, and has a stopping portion, a through portion and a connecting portion, the stopping portion And is configured to be integrally formed on the side of the stop portion and configured to be disposed on the spring. The connecting portion is integrally formed on the spring portion. The stop portion is opposite to the other side of the through portion and protrudes from the opening for fixing to the rod probe body. A testing device comprising: a probe testing machine having at least one probe mounting seat and at least one test probe detachably disposed on the at least one probe mounting seat; and a rod probe assembly including a rod-shaped probe body extending along a first extending direction for contacting a plurality of finger electrodes of a solar cell, the finger electrodes being adjacent to a second extension different from the first extending direction And extending at least one probe holder to the rod probe body for detachably inserting into the at least one probe mounting seat; wherein, when the at least one test probe is from the at least one When the probe holder is removed, the rod probe system is electrically connected to the probe testing machine through the at least one probe holder inserted in the at least one probe mounting seat. The test device of claim 9, wherein the rod probe body has a connecting surface and a contact surface, the connecting surface is for fixing the at least one probe holder, the contact The face is for contacting the at least one finger electrode. The test device of claim 10, wherein the connecting surface is provided with at least one connecting slot, and the at least one probe bracket is respectively inserted into the at least one connecting slot. The test device of claim 10, wherein the at least one probe holder is soldered to the at least one connecting groove. The test device of claim 10, wherein the contact surface is a rough surface. The test device of claim 9, wherein the at least one probe holder comprises: a bracket body having a receiving slot, and one of the receiving slots is provided with a stop structure; a spring And a connecting member is movably disposed in the receiving groove, and has a stopping portion, a through portion and a connecting portion, wherein the stopping portion is used for Abutting the stop structure and the spring, the through portion is integrally formed on one side of the stop portion, and is configured to be disposed on the spring, and the connecting portion is integrally formed on the stop portion The other side of the wearing portion protrudes from the opening for fixing to the rod probe body. The test device of claim 9, wherein the at least one probe holder is integrally fixed to the rod probe body. The test device of claim 9, wherein the first extending direction is perpendicular to the second extending direction.