TWM543737U - Mold test fixture - Google Patents
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- TWM543737U TWM543737U TW106203832U TW106203832U TWM543737U TW M543737 U TWM543737 U TW M543737U TW 106203832 U TW106203832 U TW 106203832U TW 106203832 U TW106203832 U TW 106203832U TW M543737 U TWM543737 U TW M543737U
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Description
本新型為提供一種模具測試治具,特別是指一種均勻施壓使測試更為準確的模具測試治具。 The present invention provides a mold test fixture, and more particularly to a mold test fixture that uniformly applies pressure to make the test more accurate.
按,於一般於研發或是製造生產流程中,都會對成品或半成品進行檢測,以確保品質、降低不良率、及發掘需改進處,且為了進行檢測是否正常,大多會透過各種檢測設備進行不同檢測,特別是無法單獨直接使用之零組件。 According to the general research and development or manufacturing process, the finished product or semi-finished product will be tested to ensure the quality, reduce the defect rate, and find out the improvement, and in order to test whether it is normal, most of them will be different through various testing devices. Detection, especially components that cannot be used directly alone.
檢測設備可依作動方式的不同分為許多不同類別,其中一種為習用夾合檢測裝置,而習用夾合檢測裝置包含有至少一升降裝置、至少一設於該升降裝置上且隨其連動之壓制件、及至少一對應設置於該壓制件下方之承載座,且該承載座具有複數導電金屬並供設置待測件;使用時先將待測件置放於承載座上,且操作升降裝置向下位移讓壓制件壓制待測件,以確保待測件與各導電金屬接觸,並透過各導電金屬與待測件導通以進行檢測。 The detecting device can be divided into many different categories according to the different driving modes, one of which is a conventional clamping detecting device, and the conventional clamping detecting device comprises at least one lifting device, at least one pressing on the lifting device and pressing with the same And at least one corresponding to the carrier disposed under the pressing member, and the carrier has a plurality of conductive metals and is provided with the device to be tested; in use, the device to be tested is placed on the carrier, and the lifting device is operated The lower displacement causes the pressing member to press the member to be tested to ensure that the device to be tested is in contact with each of the conductive metals, and is electrically connected to the device to be tested through the respective conductive members for detection.
但經實際使用檢測後發現,因待測件表面未必完全平整、且待測件兩側平行度也未必足夠、及壓制件未必能對待測件均勻施壓等因素,造成壓制時發生待測件偏斜翹起等狀況,導致待測件未能妥善與各導電金屬接觸影響檢測結果。 However, after the actual use test, it is found that the surface of the workpiece to be tested may not be completely flat, and the parallelism of the two sides of the workpiece to be tested may not be sufficient, and the pressing member may not be able to uniformly apply pressure to the workpiece, causing the workpiece to be tested during pressing. The condition of skewing and tilting causes the test piece to fail to properly contact the conductive metal to affect the detection result.
是以,要如何解決上述習用之問題與缺失,即為本新型之申請人與從事此行業之相關廠商所亟欲研究改善之方向所在者。 Therefore, how to solve the above problems and deficiencies in the past, that is, the applicants of the new type and the relevant manufacturers engaged in this industry are eager to study the direction of improvement.
故,本新型之申請人有鑑於上述缺失,乃蒐集相關資料,經由多方評估及考量,並以從事於此行業累積之多年經驗,經由不斷試作及修改,始設計出此 種均勻施壓使測試更為準確的模具測試治具之新型專利者。 Therefore, in view of the above-mentioned shortcomings, the applicants of this new type have collected relevant information, and through multiple assessments and considerations, and through years of experience in the industry, through continuous trial and modification, they have designed this. A new type of patent for the mold test fixture that makes the test more accurate.
本新型之主要目的在於:透過對待測物平均施加壓力,以確保待測物妥善接觸,藉此提升測試正確性。 The main purpose of the novel is to improve the accuracy of the test by applying pressure on the object to be measured to ensure proper contact with the object to be tested.
為達上述目的,本新型包括有一位移組件,位移組件上設有至少一抵壓裝置,抵壓裝置包含有複數活動設置於位移組件上之抵壓連結件、至少一設於各抵壓連結件端處且位於位移組件側處,並與位移組件選擇性接觸之抵壓件、及複數設於抵壓件與位移組件間之抵壓彈性件。 In order to achieve the above object, the present invention comprises a displacement assembly, the displacement assembly is provided with at least one pressing device, and the pressing device comprises a plurality of pressing connecting members disposed on the displacement assembly, at least one of the pressing connecting members. a pressing member at the end and located at the side of the displacement assembly and in selective contact with the displacement assembly, and a plurality of pressing elastic members disposed between the pressing member and the displacement assembly.
抵壓裝置側處則設有至少一與其位置對應之測試裝置,測試裝置包含有至少一測試基板、至少一設於測試基板鄰近抵壓裝置側處之承載件、至少一設於承載件背離測試基板側處,且與承載件位置對應設置之置放件、複數設於承載件上並穿設置放件之測試連結件、複數設於置放件與承載件間之測試彈性件、及複數插設承載件且一端選擇性穿出置放件,另端與測試基板電性連結之傳輸件。 At least one test device corresponding to the position is disposed at the side of the pressing device, the testing device includes at least one test substrate, at least one carrier disposed at a side of the test substrate adjacent to the pressing device, and at least one disposed on the carrier away from the test a placement member corresponding to the position of the carrier member, a plurality of test pieces disposed on the carrier member and penetrating the placement member, a plurality of test elastic members disposed between the placement member and the carrier member, and a plurality of insertion pins A transmission member having a carrier member and one end selectively penetrating the placement member and the other end electrically connected to the test substrate.
當使用時先把待測物置放於置放件上,且操作位移組件使抵壓裝置往測試裝置移動,當抵壓件接觸到待測物或置放件時,各抵壓彈性件、及各測試彈性件會分別產生變形,使待測物能妥善與抵壓件、及置放件接觸,並對待測物平均施加壓力,同時傳輸件會穿出置放件與待測物接觸,讓測試基板能對待測物進行正確檢測,藉由上述技術,可針對習用夾合檢測裝置所存在之妥善與接觸而影響檢測結果的問題點加以突破,達到均勻施壓使測試更為準確之實用進步性。 When in use, the object to be tested is placed on the placing member, and the displacement assembly is operated to move the pressing device to the testing device. When the pressing member contacts the object to be tested or the placing member, each pressing elastic member, and Each test elastic member will be deformed separately, so that the object to be tested can be properly contacted with the pressing member and the placing member, and the average pressure is applied to the object to be tested, and the transmitting member will pass through the placing member and contact with the object to be tested, so that The test substrate can correctly detect the object to be tested, and the above technology can be used to break through the problems of the proper sandwiching detection device and affecting the detection result, and achieve a practical improvement of uniform pressure to make the test more accurate. Sex.
1‧‧‧位移組件 1‧‧‧displacement components
11‧‧‧操作裝置 11‧‧‧Operating device
12‧‧‧移動裝置 12‧‧‧Mobile devices
121‧‧‧滑移件 121‧‧‧Slipper
1211‧‧‧限位部 1211‧‧‧Limited
122‧‧‧位移件 122‧‧‧ displacement parts
1221‧‧‧調整部 1221‧‧‧Adjustment Department
1222‧‧‧位移容置部 1222‧‧‧Displacement Department
13‧‧‧固定件 13‧‧‧Fixed parts
2‧‧‧抵壓裝置 2‧‧‧Resisting device
21‧‧‧抵壓連結件 21‧‧‧Pressure link
22‧‧‧抵壓件 22‧‧‧Resistance parts
221‧‧‧抵壓容置部 221‧‧‧Resistance
23‧‧‧抵壓彈性件 23‧‧‧Resist the elastic parts
3‧‧‧測試裝置 3‧‧‧Testing device
31‧‧‧測試基板 31‧‧‧Test substrate
311‧‧‧導通部 311‧‧‧Training Department
32‧‧‧承載件 32‧‧‧Carriers
321‧‧‧承載容置部 321‧‧‧Loading Department
33‧‧‧置放件 33‧‧‧Placement
331‧‧‧置放容置部 331‧‧‧Place and Placement Department
332‧‧‧置放部 332‧‧‧Placement Department
34‧‧‧測試連結件 34‧‧‧Test links
35‧‧‧測試彈性件 35‧‧‧Test elastic parts
36‧‧‧傳輸件 36‧‧‧Transportation
361‧‧‧收容件 361‧‧‧Accessories
362‧‧‧伸縮件 362‧‧‧Flexible parts
363‧‧‧傳輸彈性件 363‧‧‧Transporting elastic parts
4‧‧‧待測物 4‧‧‧Test object
第一圖 係為本新型較佳實施例之立體示意圖。 The first figure is a perspective view of a preferred embodiment of the present invention.
第二圖 係為本新型較佳實施例之抵壓裝置分解示意圖。 The second drawing is an exploded view of the pressing device of the preferred embodiment of the present invention.
第三圖 係為本新型較佳實施例之測試裝置分解示意圖。 The third figure is an exploded view of the test apparatus of the preferred embodiment of the present invention.
第四圖 係為本新型第一圖之A-A線段抵壓裝置剖面示意圖。 The fourth figure is a schematic cross-sectional view of the A-A line segment pressing device of the first figure of the present invention.
第五圖 係為本新型第一圖之A-A線段測試裝置剖面示意圖。 The fifth figure is a schematic cross-sectional view of the A-A line segment test device of the first figure of the present invention.
第六圖 係為本新型較佳實施例之調整示意圖。 Figure 6 is a schematic view of the adjustment of the preferred embodiment of the present invention.
第七圖 係為本新型較佳實施例之作動示意圖。 Figure 7 is a schematic view of the operation of the preferred embodiment of the present invention.
第八圖 係為本新型較佳實施例之均壓示意圖。 The eighth figure is a schematic view of the pressure equalization of the preferred embodiment of the present invention.
第九圖 係為本新型較佳實施例之使用示意圖。 The ninth drawing is a schematic view of the use of the preferred embodiment of the present invention.
為達成上述目的及功效,本新型所採用之技術手段及構造,茲繪圖就本新型較佳實施例詳加說明其特徵與功能如下,俾利完全了解。 In order to achieve the above objects and effects, the technical means and structure adopted by the present invention are described in detail in the preferred embodiment of the present invention, and the features and functions thereof are as follows.
請參閱第一圖至第五圖所示,係為本新型較佳實施例之立體示意圖、抵壓裝置分解示意圖、測試裝置分解示意圖、第一圖之A-A線段抵壓裝置剖面示意圖、及第一圖之A-A線段測試裝置剖面示意圖,由圖中可清楚看出本新型包括一位移組件1、至少一抵壓裝置2、及至少一測試裝置3。 Please refer to the first to fifth figures, which are schematic perspective views of the preferred embodiment of the present invention, an exploded view of the pressing device, an exploded view of the testing device, a cross-sectional view of the AA line pressing device of the first figure, and a first A cross-sectional view of the AA line test device of the figure, it is clear from the figure that the present invention comprises a displacement assembly 1, at least one pressing device 2, and at least one testing device 3.
位移組件1包含有至少一供設置抵壓裝置2之移動裝置12、及至少一設於移動裝置12側處且與其連動之操作裝置11,移動裝置12包含有至少一活動設置於操作裝置11上且與其連結作動之滑移件121、及至少一與滑移件121連結設置,並供設置抵壓裝置2之位移件122,而滑移件121鄰近位移件122之側處具有複數限位部1211,且位移件122鄰近滑移件121之側處,具有複數與各限位部1211位置對應之調整部1221,並限位部1211與調整部1221係插設有至少一固定件13。 The displacement assembly 1 includes at least one mobile device 12 for providing the pressing device 2, and at least one operating device 11 disposed at the side of the mobile device 12 and associated therewith. The mobile device 12 includes at least one movable device disposed on the operating device 11. And the sliding member 121 coupled to the movable member and the at least one sliding member 121 are disposed, and the displacement member 122 of the pressing device 2 is disposed, and the sliding member 121 has a plurality of limiting portions adjacent to the displacement member 122. 1211, and the displacement member 122 is adjacent to the side of the sliding member 121, and has a plurality of adjusting portions 1221 corresponding to the positions of the limiting portions 1211, and the limiting portion 1211 and the adjusting portion 1221 are inserted with at least one fixing member 13.
抵壓裝置2設於位移組件1上,抵壓裝置2包含有複數活動設置於位移組件1上之抵壓連結件21、至少一設於各抵壓連結件21端處且位於位移組件1側處,並與位移組件1選擇性接觸之抵壓件22、及複數設於抵壓件22與位移組件1間之抵壓彈性件23,而各抵壓彈性件23受各抵壓連結件21穿 設,且抵壓件22鄰近位移組件1之側處具有複數供容置各抵壓彈性件23之抵壓容置部221,並位移組件1鄰近抵壓裝置2之側處具有複數供容置各抵壓彈性件23之位移容置部1222。 The pressing device 2 is disposed on the displacement assembly 1 , and the pressing device 2 includes a plurality of pressing connecting members 21 disposed on the displacement assembly 1 , at least one disposed at the end of each pressing connecting member 21 and located on the displacement assembly 1 side. And a pressing member 22 selectively contacting the displacement assembly 1 and a plurality of pressing elastic members 23 disposed between the pressing member 22 and the displacement assembly 1 , and each of the pressing elastic members 23 is pressed by the pressing connecting member 21 wear The pressure receiving member 22 has a plurality of pressing receiving portions 221 for receiving the pressing elastic members 23 adjacent to the displacement assembly 1 , and the displacement assembly 1 has a plurality of receiving portions adjacent to the side of the pressing device 2 . Each of the displacement elastic members 23 resists the displacement portion 1222.
測試裝置3位於抵壓裝置2側處,且測試裝置3與抵壓裝置2位置對應,而測試裝置3包含有至少一測試基板31、至少一設於測試基板31鄰近抵壓裝置2側處之承載件32、至少一設於承載件32背離測試基板31側處,且與承載件32位置對應設置之置放件33、複數設於承載件32上並穿設置放件33之測試連結件34、複數設於置放件33與承載件32間之測試彈性件35、及複數插設承載件32且一端選擇性穿出置放件33,另端與測試基板31電性連結之傳輸件36,測試基板31上具有複數導通部311,且各導通部311與各傳輸件36位置對應並電性連結,置放件33上形成有至少一置放部332,且置放部332與各傳輸件36位置對應,並置放部332供置放至少一待測物,使待測物得經各傳輸件36與測試基板31電性連結,各傳輸件36包含有至少一與測試基板31接觸導通之收容件361、活動設置於收容件361背離測試基板31側處之伸縮件362、及至少一設於收容件361與該伸縮件362間之傳輸彈性件363,而各測試彈性件35受各測試連結件34穿設,且承載件32鄰近置放件33之側處具有複數供容置各測試彈性件35之承載容置部321,並置放件33鄰近承載件32之側處具有複數供容置各測試彈性件35之置放容置部331,另,上述僅為本新型其中之一實施態樣,其態樣不設限於此。 The testing device 3 is located at the side of the pressing device 2, and the testing device 3 corresponds to the position of the pressing device 2, and the testing device 3 includes at least one test substrate 31, and at least one of the test substrates 31 is disposed adjacent to the side of the pressing device 2 The carrier member 32, at least one of the placing member 33 disposed at a side of the supporting member 32 facing away from the test substrate 31 and corresponding to the position of the carrying member 32, and a plurality of test connecting members 34 disposed on the carrying member 32 and passing through the placing member 33 a plurality of test elastic members 35 disposed between the placing member 33 and the carrier member 32, and a plurality of transmitting members 36 electrically inserting the mounting member 33 at one end and electrically connected to the test substrate 31 at the other end. The test substrate 31 has a plurality of conductive portions 311, and each of the conductive portions 311 is electrically connected to the respective transmitting members 36. The mounting member 33 is formed with at least one placing portion 332, and the placing portion 332 and each of the transmitting portions The position of the member 36 is correspondingly disposed, and the placing portion 332 is configured to place at least one object to be tested, so that the object to be tested is electrically connected to the test substrate 31 via the respective transmitting members 36, and each of the transmitting members 36 includes at least one of the contacts with the test substrate 31. The receiving member 361 is arranged to be disposed away from the test base 361 away from the test base The telescopic member 362 at the side of the 31 and the at least one transmission elastic member 363 disposed between the receiving member 361 and the telescopic member 362, and the test elastic members 35 are pierced by the test coupling members 34, and the carrier member 32 is placed adjacent to the bearing member 32. The side of the member 33 has a plurality of bearing accommodating portions 321 for accommodating the test elastic members 35, and the side of the placing member 33 adjacent to the carrier member 32 has a plurality of receiving accommodating portions 331 for accommodating the test elastic members 35. In addition, the above is only one of the embodiments of the present invention, and the aspect thereof is not limited thereto.
請同時配合參閱第一圖至第九圖所示,係為本新型較佳實施例之立體示意圖、抵壓裝置分解示意圖、測試裝置分解示意圖、第一圖之A-A線段抵壓裝置剖面示意圖、第一圖之A-A線段測試裝置剖面示意圖、調整示意圖、作動示意圖、均壓示意圖、及使用示意圖,由第六圖中可清楚看出,本新型得先視需求(如欲施加壓力、或待測物厚度等)操作位移組件1之固定件13、及移動裝置12,使固定件13與滑移件121之限位部1211、及位移件122之調整部1221相配合,以調整抵壓裝置2與測試裝置3之距離,進而調整欲施加之壓力大小。 Please refer to the first to ninth drawings at the same time, which is a perspective view of the preferred embodiment of the present invention, an exploded view of the pressing device, an exploded view of the testing device, and a cross-sectional view of the AA line segment pressing device of the first figure. A cross-sectional view, adjustment diagram, actuation diagram, pressure equalization diagram, and usage diagram of the AA line test device in a figure. It can be clearly seen from the sixth figure that the present invention has a prior view requirement (such as applying pressure or a test object) The fixing member 13 of the displacement assembly 1 and the moving device 12 are operated to match the fixing member 13 with the limiting portion 1211 of the sliding member 121 and the adjusting portion 1221 of the displacement member 122 to adjust the pressing device 2 and The distance of the device 3 is tested to adjust the amount of pressure to be applied.
同參第七圖至第九圖所示,其中以第八圖中置放部332未置放待測物, 但第九圖中置放部332有置放待測物4作為解說,欲使用本新型則先對位移組件1之操作裝置11進行操作,使移動裝置12之位移件122、及抵壓裝置2順著滑移件121往測試裝置3方向移動,且於抵壓件22接觸待測物4、或置放件33時,抵壓件22會受到壓力的影響往位移件122方向移動,並帶動各抵壓連結件21位移、以及使各抵壓彈性件23分別發生變形,各抵壓彈性件23則因受抵壓連結件21穿設,且設於各抵壓容置部221與各位移容置部1222內,以避免發生偏移脫離之情事,藉此讓待測物4上側能夠妥善與抵壓件22接觸;同時,置放件33會往承載件32移動,使各測試彈性件35分別發生變形,各測試彈性件35則因受測試連結件34穿設,且設於各承載容置部321與各置放容置部331內,以避免發生偏移脫離之情事,藉此讓待測物4下側能夠妥善與置放件33接觸,透過抵壓裝置2與測試裝置3相配合,令待測物4能夠均勻的承受壓力及受到固定,使測試更為準確。 Referring to the seventh to ninth drawings, in which the object to be tested is not placed in the placement portion 332 in the eighth figure, However, in the ninth embodiment, the placing portion 332 has the object 4 to be placed as an explanation. To use the present invention, the operating device 11 of the displacement unit 1 is first operated to cause the displacement member 122 of the moving device 12 and the pressing device 2 to be moved. Moving along the sliding member 121 in the direction of the testing device 3, and when the pressing member 22 contacts the object to be tested 4 or the placing member 33, the pressing member 22 is moved by the pressure member to the displacement member 122, and is driven. Each of the pressing and connecting members 21 is displaced, and each of the pressing elastic members 23 is deformed, and each of the pressing elastic members 23 is pierced by the pressing and connecting member 21, and is disposed at each of the pressing and receiving portions 221 and each of the displacements. The inside of the accommodating portion 1222 prevents the offset from coming off, so that the upper side of the object to be tested 4 can be properly brought into contact with the pressing member 22; at the same time, the placing member 33 moves toward the carrier member 32, so that the test elastic members are respectively The deformation of each of the test elastic members 35 is performed by the test coupling member 34 and is disposed in each of the load-receiving portions 321 and the respective placement and receiving portions 331 to prevent the offset from being detached. The lower side of the object to be tested 4 can be properly brought into contact with the placing member 33, and passed through the pressing device 2 and the testing device 3 Together, 4 so that the analyte can be subjected to a uniform and fixed under pressure, make the test more accurate.
此外,因置放件33往承載件32移動,所以傳輸件36可穿出置放部332與待測物4接觸,以供測試基板31經導通部311對待測物4進行測試,且透過傳輸件36之伸縮件362與傳輸彈性件363配合,讓伸縮件362接觸待測物4後可適度縮入收容件361內,以確保各傳輸件36皆可與待測物4有效接觸,使測試更為準確。 In addition, since the placing member 33 moves toward the carrier 32, the transmitting member 36 can pass through the placing portion 332 to contact the object to be tested 4, so that the test substrate 31 can be tested by the conducting portion 311 to be tested, and transmitted. The telescopic member 362 of the member 36 cooperates with the transmission elastic member 363, so that the telescopic member 362 can be appropriately retracted into the receiving member 361 after contacting the object to be tested 4, so as to ensure that each of the transmission members 36 can effectively contact the object to be tested 4, so that the test is performed. More accurate.
是以,本新型之模具測試治具為可改善習用之技術關鍵在於:藉由位移組件1、抵壓裝置2、及測試裝置3相配合,令本新型達到均勻施壓使測試更為準確之實用進步性。 Therefore, the key to the improvement of the mold test fixture of the present invention is that: by the displacement component 1, the pressing device 2, and the testing device 3, the new type of pressure is applied to make the test more accurate. Practical and progressive.
惟,以上所述僅為本新型之較佳實施例而已,非因此即侷限本新型之專利範圍,故舉凡運用本新型說明書及圖式內容所為之簡易修飾及等效結構變化,均應同理包含於本新型之專利範圍內,合予陳明。 However, the above description is only the preferred embodiment of the present invention, and thus does not limit the scope of the patent of the present invention. Therefore, all the simple modifications and equivalent structural changes that are made by using the present specification and the drawings are the same. It is included in the scope of this new patent and is given to Chen Ming.
綜上所述,本新型之模具測試治具於使用時,為確實能達到其功效及目的,故本新型誠為一實用性優異之新型,為符合新型專利之申請要件,爰依法提出申請,盼 審委早日賜准本新型,以保障申請人之辛苦研發,倘若 鈞局審委有任何稽疑,請不吝來函指示,申請人定當竭力配合,實感公便。 In summary, the mold test fixture of the present invention can achieve its efficacy and purpose when it is used. Therefore, the novel is a new type of practicality, which is in conformity with the application requirements of the new patent, and is submitted according to law. I hope that the trial committee will grant this new model as soon as possible to protect the hard work of the applicant. If there is any doubt in the trial committee, please do not hesitate to give instructions. The applicant will try his best to cooperate and feel punished.
122‧‧‧位移件 122‧‧‧ displacement parts
1222‧‧‧位移容置部 1222‧‧‧Displacement Department
2‧‧‧抵壓裝置 2‧‧‧Resisting device
21‧‧‧抵壓連結件 21‧‧‧Pressure link
22‧‧‧抵壓件 22‧‧‧Resistance parts
221‧‧‧抵壓容置部 221‧‧‧Resistance
23‧‧‧抵壓彈性件 23‧‧‧Resist the elastic parts
3‧‧‧測試裝置 3‧‧‧Testing device
31‧‧‧測試基板 31‧‧‧Test substrate
311‧‧‧導通部 311‧‧‧Training Department
32‧‧‧承載件 32‧‧‧Carriers
321‧‧‧承載容置部 321‧‧‧Loading Department
33‧‧‧置放件 33‧‧‧Placement
331‧‧‧置放容置部 331‧‧‧Place and Placement Department
332‧‧‧置放部 332‧‧‧Placement Department
34‧‧‧測試連結件 34‧‧‧Test links
35‧‧‧測試彈性件 35‧‧‧Test elastic parts
36‧‧‧傳輸件 36‧‧‧Transportation
361‧‧‧收容件 361‧‧‧Accessories
362‧‧‧伸縮件 362‧‧‧Flexible parts
363‧‧‧傳輸彈性件 363‧‧‧Transporting elastic parts
Claims (10)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
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TW106203832U TWM543737U (en) | 2017-03-17 | 2017-03-17 | Mold test fixture |
Applications Claiming Priority (1)
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TW106203832U TWM543737U (en) | 2017-03-17 | 2017-03-17 | Mold test fixture |
Publications (1)
Publication Number | Publication Date |
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TWM543737U true TWM543737U (en) | 2017-06-21 |
Family
ID=59689800
Family Applications (1)
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TW106203832U TWM543737U (en) | 2017-03-17 | 2017-03-17 | Mold test fixture |
Country Status (1)
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TW (1) | TWM543737U (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN110544644A (en) * | 2019-09-12 | 2019-12-06 | 深圳市联润丰电子科技有限公司 | semi-packaged stacked wafer detection and classification device |
-
2017
- 2017-03-17 TW TW106203832U patent/TWM543737U/en not_active IP Right Cessation
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN110544644A (en) * | 2019-09-12 | 2019-12-06 | 深圳市联润丰电子科技有限公司 | semi-packaged stacked wafer detection and classification device |
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