TWM506971U - High pressure detection module and high pressure detection apparatus for multilayer capacitor - Google Patents

Description

High-voltage detection module and high-voltage detection device for laminated capacitor

The present invention relates to a high voltage detecting module and a high voltage detecting device for a multilayer capacitor, and more particularly to a detecting module and a detecting device suitable for applying a high voltage test to a laminated capacitor.

As the size of electronic devices is constantly pursuing lightness and thinness, multilayer capacitors have obvious advantages in volume compared with conventional ceramic capacitors, so the demand for multilayer capacitors continues to rise, and the development of capacitor specifications is also diversified. However, in terms of the test specifications and detection methods that the existing multilayer capacitor test equipment can tolerate, it has not been able to meet the demand.

Please refer to FIG. 1A and FIG. 1B simultaneously. FIG. 1A is a schematic diagram of a conventional rotary type detecting device, and FIG. 1B is a partial cross-sectional view of the A-A line segment of the conventional rotary type detecting device. 1A and 1B show a rotary disc type detecting device which mainly uses a turntable mechanism 91 for feeding and transferring, and the laminated capacitor C to be tested and completed is accommodated in the recess 910 on the turntable mechanism 91. Roller electrodes 91 are provided on both sides of the turntable mechanism 91, and are detected when the roller electrodes 92 on both sides of the turntable mechanism 91 roll up and contact the laminated capacitor C.

However, the high-voltage test of the conventional rotary type testing equipment can only test at most 1000 volts; and, after long-term testing, The multilayer capacitor C inevitably leaves residual metal chips in the recess 910. When accumulated to a certain amount, it is easy to form a glitch due to a high voltage, which affects the accuracy of the detection, and the spurt may damage the laminated capacitor C. Or even damage the detection equipment.

Please refer to FIG. 2A and FIG. 2B simultaneously. FIG. 2A is a schematic diagram of a conventional parallel detecting device, and FIG. 2B is a partial cross-sectional view of a conventional parallel detecting device B-B line segment. 2A and 2B show a parallel type detecting device, which mainly uses a vibration track 93 for feeding. When the multilayer capacitor C to be tested is fed to a positioning member 94, it passes through a transfer mechanism (in the figure). The multilayer capacitor C is transferred to a detecting device 95 for high voltage detection. As shown in FIG. 2B, the detecting device 95 includes a plurality of through slots 951, and the multilayer capacitor C is placed in the through slot 951, and two needle electrodes 96 extend into the through slots 951 and contact the laminated capacitor C. Perform a high voltage test.

However, this parallel type detecting device must be assisted by the through-groove 951 to fix the laminated capacitor C. As in the conventional rotary-type detecting device described in the preceding paragraph, it is easy to generate a surge due to the residual metal scrap. Affects the accuracy of the test, or may cause damage to the multilayer capacitor C or the detection device. On the other hand, the parallel type detection equipment performs parallel test on the multilayer capacitor C of the same batch detection at the same time, so once an abnormal measurement value is detected, it is impossible to immediately identify which one or which of the batch is not Good products, usually eliminated in the whole batch, otherwise they will have to be re-tested one by one.

In addition, the above-mentioned conventional rotary type detecting device or conventional parallel detecting device, whether or not it is in electrical contact with the laminated capacitor C, All are directly tested for high voltage. That is to say, the conventional detecting device does not perform a so-called contact check, so that the test failure due to the electrical contact problem cannot be excluded. However, in this case, the conventional device will directly judge the laminated capacitor C as a defective product, and cannot detect the situation of poor contact, which seriously affects the accuracy of the test.

The main purpose of this creation is to provide a high-voltage detection module and high-voltage detection device for a multilayer capacitor, which can provide high-voltage detection and completely avoid the formation of glitch, thereby improving the accuracy of detection without causing lamination. Damage to capacitors and testing equipment.

Another object of the present invention is to provide a high voltage detecting module and a high voltage detecting device for a multilayer capacitor, which can first detect whether the electrode end faces of the electrode group and the multilayer capacitor are in complete contact, and then perform a high voltage test to ensure the detection electrode group and the first The multilayer capacitor is turned on and then subjected to high voltage test to avoid test failure or misalignment.

In order to achieve the above object, the high voltage detecting module of the laminated capacitor mainly comprises a first electrode group, a second electrode group, and an actuator; wherein the first electrode group and the second electrode group respectively correspond to one The second electrode of the multilayer capacitor corresponds to the end face of the electrode, and the actuator drives at least one of the first electrode group and the second electrode group toward each other to sandwich the multilayer capacitor or to move away from each other to disengage the multilayer capacitor. Accordingly, the present invention simply clamps and tests the multilayer capacitor by the first electrode group and the second electrode group, and there is no other mechanism or device to assist in supporting or fixing the multilayer capacitor, that is, to perform a dangling test. Directly using air as insulation, there will be no residual metal debris and no glitch.

Preferably, the first electrode group and the second electrode group of the high voltage detecting module of the laminated capacitor may respectively comprise two chip electrodes, and the two chip electrodes are insulated from each other; and, the first electrode group, And the second electrode group sandwiches the multilayer capacitor with the side end faces of the sheet electrodes corresponding to each other. Accordingly, the creation of the two-piece electrode can be carried out by the commonly known Kelvin test specification or the 4-wire test specification, that is, the contact test is used to detect whether the two-piece electrode is laminated or not. The electrode end faces of the capacitor are completely in contact to form a conduction, and the test failure due to poor contact can be sufficiently avoided.

In addition, the high-voltage detecting module of the laminated capacitor may further include a base and a sliding table, and the sliding table may be placed on the base, and the actuator may be assembled on the base and connected to the sliding. The actuator can drive the sliding table to slide on the base, and the first electrode group can be assembled on the sliding table. Accordingly, the present invention can easily drive the first electrode group to be driven closer to or away from the second electrode group by the arrangement of the susceptor and the slide table.

In order to achieve the above objectives, the present invention creates a high-voltage detecting device for a multilayer capacitor, which mainly comprises a feeding module, the aforementioned high-voltage detecting module, a transfer module, a sorting module, and a main controller; the main controller is electrically Connecting the feeding module, the high-voltage detecting module, the transferring module, and the sorting module; the main controller controls the feeding module to supply the laminated capacitor to be tested, and the main controller controls the transfer module to be transferred for testing The multilayer capacitor is between the feeding module and the high voltage detecting module, the main controller controls the high voltage detecting module to detect the laminated capacitor, and the main controller controls the sorting module to classify the laminated capacitors measured by the high voltage detecting module.

Furthermore, the sorting module of the high-voltage detecting device of the laminated capacitor may further include an inlet port located below the first electrode group and the second electrode group; when the multilayer capacitor is separated from the first electrode group, and In the second electrode group, the multilayer capacitor falls into the feed port. Accordingly, when the multilayer capacitors are tested, they are directly classified into the sorting module, and no further transfer is performed through any transfer device. In addition to significantly improving the detection efficiency, the hardware cost of the device is also reduced.

[study]

91‧‧‧Carousel mechanism

910‧‧‧ Groove

92‧‧‧Roller electrode

93‧‧‧Vibration track

94‧‧‧ Positioning parts

95‧‧‧Detection device

951‧‧‧through slot

96‧‧‧needle electrode

C‧‧‧ multilayer capacitor

C1, C2‧‧‧ electrode end face

[this creation]

2‧‧‧Feed module

21‧‧‧Vibration plate

22‧‧‧Transportation track

3‧‧‧High voltage detection module

31‧‧‧First electrode group

32‧‧‧Second electrode group

33‧‧‧Actuator

34‧‧‧Base

35‧‧‧ slide table

4‧‧‧Transfer module

41‧‧‧ Lifting and lowering device

42‧‧‧Sucking head

5‧‧‧Sorting module

51‧‧‧Inlet

52‧‧‧Rotating distributor

521‧‧‧Outlet

53‧‧‧ 容仓

54‧‧‧Rotating drive

6‧‧‧Master controller

P‧‧‧chip electrode

Fig. 1A is a schematic view of a conventional rotary type detecting device.

Fig. 1B is a partial cross-sectional view showing the A-A line segment of the conventional rotary type detecting device.

2A is a schematic diagram of a conventional parallel detecting apparatus.

2B is a partial cross-sectional view showing a line B-B of a conventional parallel detecting device.

3 is a system architecture diagram of a preferred embodiment of the present invention.

4 is a top plan view of a preferred embodiment of the present invention.

Figure 5 is a perspective view of a conventional multilayer capacitor.

FIG. 6A is a schematic diagram of a high voltage detection module, a sorting module, and a transfer module according to a preferred embodiment of the present invention.

6B is a top plan view of a high voltage detection module in accordance with a preferred embodiment of the present invention.

Fig. 6C is a perspective view showing the first electrode group and the second electrode group of the preferred embodiment of the present invention when the laminated capacitor is sandwiched.

Before the high-voltage detection module and the high-voltage detecting device of the present inventive laminated capacitor are described in detail in the present embodiment, it is to be noted that in the following description, similar elements will be denoted by the same reference numerals.

Please refer to FIG. 3 and FIG. 4, FIG. 3 is a system architecture diagram of a preferred embodiment of the present invention, and FIG. 4 is a top view of a preferred embodiment of the present invention. As shown in the figure, the high-voltage detecting device of the multilayer capacitor of the embodiment mainly comprises a feeding module 2, a high-voltage detecting module 3, a transfer module 4, a sorting module 5, and a main controller 6. As shown in FIG. 4, the feeding module 2 of the present embodiment mainly includes a vibrating plate 21 and a conveying rail 22, and the vibrating plate 21 pushes the laminated capacitor C to the end of the conveying rail 22 through the vibration feeding. It is transported by the transfer module 4.

Furthermore, the apparatus of this embodiment is provided with two high-voltage detecting modules 3, which are respectively disposed on two sides of the end of the conveying rail 22. In addition, the transfer module 4 of the embodiment includes two lifting and lowering devices 41, which are in a V-shaped configuration, and the two lifting and lowering devices 41 swing back and forth to take turns to the end of the conveying rail 22 to suck the multilayer capacitor C to be tested. And the high-voltage detection module 3 transferred to the two sides is detected, and the detection results are classified through the respective sorting modules 5 under the two-side high-voltage detection module 3. Accordingly, the present embodiment utilizes the V-shaped arrangement of the lift-and-place device 41 to form a double feed, and the two high-voltage detection modules 3 constitute a bilateral test, which can greatly improve the detection efficiency.

Please refer to FIG. 5, FIG. 6A, FIG. 6B, and FIG. 6C at the same time. FIG. 5 is a perspective view of a common laminated capacitor C, and FIG. 6A is a creation of the present invention. FIG. 6B is a plan view of a high voltage detecting module 3 according to a preferred embodiment of the present invention, and FIG. 6C is a top view of the high voltage detecting module 3, the sorting module 5, and the transfer module 4. A perspective view of the first electrode group 31 and the second electrode group 32 of the preferred embodiment when the laminated capacitor C is sandwiched. As shown in FIG. 5, the conventional multilayer capacitor C is formed by interleaving a plurality of internal electrodes and a plurality of dielectric layers, and electrode end faces C1 and C2 are provided at both ends of the laminated structure.

Furthermore, the high voltage detecting module 3 mainly includes a first electrode group 31, a second electrode group 32, an actuator 33, a base 34, and a sliding table 35. The sliding table 35 is placed on the base 34. Above, the actuator 33 is assembled on the base 34 and connected to the slide table 35, and the actuator 33 drives the slide table 35 to slide on the base 34. In addition, the first electrode group 31 is disposed on the slide table 35, the second electrode group 32 is disposed on the base 34, and the first electrode group 31 and the second electrode group 32 correspond to the second layer of the multilayer capacitor C, respectively. Electrode end faces C1, C2.

In addition, the first electrode group 31 and the second electrode group 32 respectively include two sheet electrodes P, and the two sheet electrodes P are insulated from each other. Accordingly, the actuator 33 can drive the slide table 35 to reciprocate and slide, thereby driving the first electrode group 31 toward the second electrode group 32, and sandwiching the multilayer capacitor with the side end faces of the sheet electrodes P corresponding to each other. C, or away from each other to separate the multilayer capacitor C.

Referring to FIG. 6A again, the transfer module 4 shown in the figure includes a suction head 42 which can form a negative pressure to adsorb the laminated capacitor C, or can cancel the negative pressure to release the laminated capacitor C. On the other hand, regarding the sorting module 5, in the embodiment, each sorting module 5 includes a spin The branching pipe 52, a rotating drive 54, and eight receiving compartments 53, and the rotating branching pipe 52 includes an inlet port 51 and a discharge port 521. The inlet port 51 is connected to the discharge port 521 of the rotary branching pipe 52, and the rotary actuator 54 is connected to drive the rotary branching pipe 52 to rotate, and the eight receiving compartments 53 are respectively different grades of the multilayer capacitor C. Placed. In other words, the sorting module 5 of the present embodiment can drive the rotary branching tube 52 to rotate through the rotary actuator 54 and align the discharge port 521 with one of the eight housings 53 to classify the laminated capacitor C.

Furthermore, regarding the main controller 6, it is electrically connected to the feeding module 2, the high pressure detecting module 3, the transfer module 4, and the sorting module 5; and the main controller 6 is mainly used for controlling the feeding The module 2 supplies the multilayer capacitor C to be tested, and the control transfer module 4 transfers the multilayer capacitor C to be tested between the feeding module 2 and the high voltage detecting module 3, and controls the high voltage detecting module 3 to detect the laminated capacitor C. And controlling the sorting module 5 to classify the multilayer capacitor C measured by the high voltage detecting module 3.

Referring to FIG. 4, FIG. 6A, FIG. 6B, and FIG. 6C, the operation flow of the high voltage detecting module 3 of the multilayer capacitor C of the present embodiment will be briefly described. First, the vibrating plate 21 transmits the laminated capacitor C through the vibration feeding. The self-vibrating disk 21 is pushed to the end of the transport track 22 via the transport track 22 for transport by the transfer module 4.

Furthermore, one of the two lifting and lowering devices 41 is connected to the end of the conveying rail 22, and the multilayer capacitor C to be tested is sucked through the suction head 42 and transferred to a high voltage detecting module 3, and placed in the high voltage detecting module 3 Between an electrode group 31 and a second electrode group 32.

Next, the actuator 33 drives the first electrode group 31 toward the second electrode group 32 to sandwich the multilayer capacitor C; after the first electrode group 31 and the second electrode group 32 firmly hold the multilayer capacitor C, the lift The pick-and-place device 41 releases the multilayer capacitor C and returns to the end of the transport track 22 to prepare for transfer of the next multilayer capacitor C.

Further, the high voltage detecting module 3 performs a contact test on the multilayer capacitor C, which mainly detects whether the two chip electrodes P of the first electrode group 31 and the second electrode group 32 correspond to the two of the multilayer capacitors C, respectively. The electrode end faces C1, C2 constitute conduction. The main controller 6 inputs a turn-on voltage to one of the two electrode electrodes P of the first electrode group 31 and the second electrode group 32, and measures the first electrode group 31 and the second electrode group 32. The output voltage of the other of the two sheet electrodes P. However, in this embodiment, the on-voltage input by the contact test belongs to a low voltage, generally 5 V (volts) or less. If the two electrode electrodes P of the first electrode group 31 and the second electrode group 32 constitute conduction, The voltages fed back will not differ too much.

Then, if the two electrode electrodes P of the first electrode group 31 and the second electrode group 32 are correctly configured to be turned on, the high voltage detecting module 3 performs a high voltage test on the multilayer capacitor C; it inputs a predetermined order to the multilayer capacitor C. The voltage, which belongs to a high voltage such as 1000V (volts) to 6000V (volts), and detects the insulation resistance (IR), electrostatic capacitance (CAP), dielectric material attenuation coefficient (TanD), and leakage current (IL) of the multilayer capacitor C. And at least one of withstand voltage (HV).

On the other hand, if the first electrode group 31, the second electrode group 32, and the multilayer capacitor C have a poor contact condition, that is, the first electrode When the two chip electrodes P of the group 31 and the second electrode group 32 are not electrically connected, the high voltage test will not be performed, and the multilayer capacitor C is directly entered into the sorting module 5, that is, the first electrode group 31 is The second electrode group 32 is moved away to cause the multilayer capacitor C to be detached and fall into the lower inlet port 51, and is classified as a poor contact, and when it is accumulated to a certain amount, the vibration disk 21 is returned to be re-detected.

Finally, after the high voltage detection is completed, the first electrode group 31 is moved away from the second electrode group 32 to disengage the multilayer capacitor C and falls into the lower inlet port 51; at the same time, the main controller 6 analyzes the detection result, and according to the analysis As a result, the sorting module 5 sorts the laminated capacitor C to fall into the corresponding housing 53.

In summary, this creation has at least the following advantages:

(1) The present invention directly clamps and fixes the multilayer capacitor C through the first electrode group 31 and the second electrode group 32; that is, when performing the high voltage test, only the first electrode group 31, and the second The electrode group 32 is in contact with the multilayer capacitor C. There is no other mechanism or device to assist in supporting or fixing the multilayer capacitor, that is, the suspension test is performed, and air is directly used as the insulation, so that no surge is generated.

(2). Before performing the high voltage test, a contact check is first performed, which mainly uses the Kelvin test specification or the 4-wire test specification to detect the first electrode group 31 first, and Whether or not the electrode end faces C1, C2 of the second electrode group P of the second electrode group 32 corresponding to the two of the multilayer capacitors C are electrically connected can effectively eliminate the misjudgment caused by the contact failure.

(3). This creation uses two lifting and lowering device 41, two high-voltage detection modules 3, and two sorting modules 5 to form double transfer, double test, and double classification, which can greatly improve the detection efficiency.

(4) When the multilayer capacitors are subjected to the contact test or the high-voltage test, they are directly entered into the sorting module for sorting, and no transfer is carried out through any transfer device. In addition to significantly improving the detection efficiency, the device is also reduced. Hardware cost.

The above-described embodiments are merely examples for convenience of description, and the scope of the claims is intended to be limited to the above embodiments.

31‧‧‧First electrode group

32‧‧‧Second electrode group

33‧‧‧Actuator

34‧‧‧Base

35‧‧‧ slide table

4‧‧‧Transfer module

41‧‧‧ Lifting and lowering device

42‧‧‧Sucking head

51‧‧‧Inlet

52‧‧‧Rotating distributor

521‧‧‧Outlet

53‧‧‧ 容仓

54‧‧‧Rotating drive

P‧‧‧chip electrode

Claims (6)

A high voltage detecting module of a multilayer capacitor, comprising: a first electrode group; a second electrode group; and an actuator; wherein the first electrode group and the second electrode group respectively correspond to a multilayer capacitor Corresponding electrode end faces, the actuator driving at least one of the first electrode set and the second electrode set toward each other to clamp the multilayer capacitor or away from each other to disengage the laminated capacitor. The high voltage detecting module of the multilayer capacitor of claim 1, wherein the first electrode group and the second electrode group respectively comprise two chip electrodes which are insulated from each other. The high voltage detecting module of the multilayer capacitor of claim 2, wherein the first electrode group and the second electrode group sandwich the multilayer capacitor with the side end faces of the chip electrodes corresponding to each other. The high voltage detecting module of the multilayer capacitor of claim 1, further comprising a base and a sliding table, wherein the sliding table is placed on the base, and the actuator is disposed on the base and connected to the base The sliding table, the actuator drives the sliding table to slide on the base, and the first electrode assembly is assembled on the sliding table. A high-voltage detecting device for a laminated capacitor, comprising: a feeding module; a high-voltage detecting module according to any one of claims 1 to 4; a transfer module; a sorting module; a main controller; wherein the main controller is electrically connected to the feeding module, the high voltage detecting module, the transferring module, and the sorting module; the main controller controls the feeding module Supplying a multilayer capacitor to be tested, the main controller controlling the transfer module to transfer the multilayer capacitor to be tested between the input module and the high voltage detection module, and the main controller controls the high voltage detection module The laminated capacitor is detected, and the main controller controls the sorting module to classify the laminated capacitor measured by the high voltage detecting module. The high voltage detecting device of the multilayer capacitor of claim 5, wherein the sorting module comprises an inlet port located below the first electrode group and the second electrode group; when the multilayer capacitor is separated from the first In the electrode group and the second electrode group, the laminated capacitor falls into the inlet port.