TWM486507U - Laser machining system, detection module and determination circuit - Google Patents

Laser machining system, detection module and determination circuit Download PDF

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Publication number
TWM486507U
TWM486507U TW103204305U TW103204305U TWM486507U TW M486507 U TWM486507 U TW M486507U TW 103204305 U TW103204305 U TW 103204305U TW 103204305 U TW103204305 U TW 103204305U TW M486507 U TWM486507 U TW M486507U
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Taiwan
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logic level
laser beam
laser
signal
voltage signal
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TW103204305U
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Chinese (zh)
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jun-wei Hu
shi-wen Xu
Yu-Bin Chen
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Tong Tai Machine & Tool Co Ltd
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Publication of TWM486507U publication Critical patent/TWM486507U/en

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雷射加工系統、偵測模組及判斷電路Laser processing system, detection module and judgment circuit

本新型是有關於一種系統、模組及電路,特別是指一種雷射加工系統、偵測模組及判斷電路。The present invention relates to a system, a module and a circuit, and more particularly to a laser processing system, a detection module and a judgment circuit.

雷射加工系統產生雷射光束並將雷射光束照射在需加工的工件表面,做雷射切割、熱處理、雷射鑽孔、雷射焊接等處理,用途相當廣泛,而照射在工件上的雷射光束需維持一定的功率大小,才能保有加工的品質,如圖1所示。The laser processing system generates a laser beam and irradiates the laser beam on the surface of the workpiece to be processed, and performs laser cutting, heat treatment, laser drilling, laser welding, etc., and has a wide range of uses, and the lightning irradiated on the workpiece. The beam needs to maintain a certain power level in order to maintain the processing quality, as shown in Figure 1.

然而,當雷射加工系統因一些異常狀況,無法產生穩定的雷射光束時,如圖2所示,會導致加工後的結果參差不齊,造成品質上嚴重的問題。However, when the laser processing system is unable to generate a stable laser beam due to some abnormal conditions, as shown in Fig. 2, the result after processing is uneven, resulting in serious quality problems.

因此,本新型之第一目的,即在提供一種偵測一雷射光束的功率並調整是否匯聚該雷射光束,以保有加工品質的雷射加工系統。Therefore, the first object of the present invention is to provide a laser processing system that detects the power of a laser beam and adjusts whether or not the laser beam is concentrated to maintain processing quality.

於是,本新型雷射加工系統,適用一工件,且包含:一雷射源,用以產生一雷射光束; 一光路模組,接收來自該雷射源的該雷射光束,並引導該雷射光束的傳遞路徑,且產生一相關於該雷射光束的一透射光,並受一控制信號控制以決定是否匯聚該雷射光束以照射在該工件的表面進行加工;及一偵測模組,電連接該光路模組且接收來自該光路模組的該透射光,並根據該透射光的功率來產生該控制信號;當該透射光的功率不在正常範圍內,該控制信號將控制該光路模組不匯聚該雷射光束;當該透射光的功率在正常範圍內,該控制信號將控制該光路模組匯聚該雷射光束照射在該工件的表面進行加工。Therefore, the novel laser processing system is applicable to a workpiece and includes: a laser source for generating a laser beam; An optical path module receives the laser beam from the laser source and directs a transmission path of the laser beam, and generates a transmitted light associated with the laser beam, and is controlled by a control signal to determine whether Converging the laser beam to illuminate the surface of the workpiece for processing; and detecting a module electrically connecting the optical path module and receiving the transmitted light from the optical path module, and generating the light according to the power of the transmitted light a control signal; when the power of the transmitted light is not within a normal range, the control signal controls the optical path module not to converge the laser beam; and when the power of the transmitted light is within a normal range, the control signal controls the optical path module The laser beam is concentrated to illuminate the surface of the workpiece for processing.

本新型之第二目的,即在提供一種偵測一雷射光束的功率並調整是否匯聚該雷射光束的偵測模組。A second object of the present invention is to provide a detection module that detects the power of a laser beam and adjusts whether or not to converge the laser beam.

於是,本新型一種偵測模組,包含:一判斷電路,包括:一光偵測器,接收一雷射光束,且將該雷射光束轉換成一電壓信號並輸出,及一比較器,電連接該光偵測器以接收該電壓信號,並將該電壓信號與儲存的一第一臨界值及一第二臨界值做比較,且據以輸出一通知信號;當該電壓信號大於該第一臨界值或小於該第二臨界值,該通知信號的邏輯準位為一第一邏輯準位;當該電壓信號小於該第一臨界值且大於該第二 臨界值,該通知信號的邏輯準位為一第二邏輯準位。Therefore, the detection module of the present invention comprises: a judgment circuit comprising: a photodetector, receiving a laser beam, converting the laser beam into a voltage signal and outputting, and a comparator, electrically connecting The photodetector receives the voltage signal, compares the voltage signal with a stored first threshold and a second threshold, and outputs a notification signal; when the voltage signal is greater than the first threshold The value is less than the second threshold, the logic level of the notification signal is a first logic level; when the voltage signal is less than the first threshold and greater than the second The threshold value, the logic level of the notification signal is a second logic level.

本新型之第三目的,即在提供一種判斷雷射光束的功率是否在正常範圍內的判斷模組。A third object of the present invention is to provide a judging module for judging whether the power of a laser beam is within a normal range.

於是,本新型一種判斷電路,包含:一光偵測器,接收一雷射光束,且將該雷射光束轉換成一電壓信號並輸出;及一比較器,電連接該光偵測器以接收該電壓信號,並將該電壓信號與儲存的一第一臨界值及一第二臨界值做比較,且據以輸出一通知信號;當該電壓信號大於該第一臨界值或小於該第二臨界值,輸出的該通知信號的邏輯準位為一第一邏輯準位;當該電壓信號小於該第一臨界值且大於該第二臨界值,輸出的該通知信號的邏輯準位為一第二邏輯準位。Therefore, the present invention provides a judging circuit comprising: a photodetector that receives a laser beam and converts the laser beam into a voltage signal and outputs the same; and a comparator electrically connected to the photodetector to receive the photodetector a voltage signal, and comparing the voltage signal with a stored first threshold and a second threshold, and outputting a notification signal; when the voltage signal is greater than the first threshold or less than the second threshold The logic level of the output signal is a first logic level; when the voltage signal is less than the first threshold and greater than the second threshold, the logic level of the output signal is a second logic Level.

1‧‧‧雷射源1‧‧‧Laser source

311‧‧‧光偵測器311‧‧‧Photodetector

2‧‧‧光路模組2‧‧‧Light path module

312‧‧‧比較器312‧‧‧ Comparator

21‧‧‧第一全反射鏡21‧‧‧First total reflection mirror

313‧‧‧第一級運算放大器電路313‧‧‧First-stage operational amplifier circuit

22‧‧‧第二全反射鏡22‧‧‧second total reflection mirror

23‧‧‧聚焦鏡23‧‧‧ Focusing mirror

312‧‧‧第二級運算放大器電路312‧‧‧Second stage operational amplifier circuit

24‧‧‧部分反射鏡24‧‧‧Partial mirror

25‧‧‧止光器25‧‧‧Light Stopper

32‧‧‧雷射控制卡32‧‧‧Laser Control Card

26‧‧‧聲光調制器26‧‧‧Acousto-optic modulator

33‧‧‧微處理器33‧‧‧Microprocessor

3‧‧‧偵測模組3‧‧‧Detection module

4‧‧‧進給模組4‧‧‧Feed module

31‧‧‧判斷電路31‧‧‧Judgement circuit

5‧‧‧工件5‧‧‧Workpiece

本新型之其他的特徵及功效,將於參照圖式的實施方式中清楚地呈現,其中:圖1是一量測圖,說明現有的一雷射加工系統的功率大小為穩定的狀態;圖2是一量測圖,說明該雷射加工系統的功率大小為不穩定的狀態;圖3是一方塊圖,說明本新型雷射加工系統的一較佳實施例; 圖4是一方塊圖,說明該較佳實施例的一雷射光束匯聚至一聚焦鏡;及圖5是一方塊圖,說明該較佳實施例的一光偵測器。Other features and effects of the present invention will be clearly shown in the embodiments with reference to the drawings, wherein: FIG. 1 is a measurement diagram illustrating a state in which the power of a conventional laser processing system is stable; FIG. Is a measurement, indicating that the power of the laser processing system is unstable; FIG. 3 is a block diagram illustrating a preferred embodiment of the novel laser processing system; 4 is a block diagram showing a laser beam of the preferred embodiment condensed to a focusing mirror; and FIG. 5 is a block diagram showing a photodetector of the preferred embodiment.

參閱圖3,本新型雷射加工系統之較佳實施例包含一雷射源1、一光路模組2、一偵測模組3,及一進給模組4,用於在一工件5的表面做雷射加工處理。Referring to FIG. 3, a preferred embodiment of the laser processing system includes a laser source 1, an optical path module 2, a detection module 3, and a feed module 4 for use in a workpiece 5. The surface is laser processed.

該雷射源1用以產生一雷射光束,在本例中,設置該雷射源1呈水平擺放,則產生的該雷射光束平行該工件5。The laser source 1 is used to generate a laser beam. In this example, the laser source 1 is placed horizontally, and the resulting laser beam is parallel to the workpiece 5.

該光路模組2用以引導該雷射光束至該工件5的傳遞路徑,使該雷射光束垂直該工件5,該光路模組2包括一第一全反射鏡21、一第二全反射鏡22、一聚焦鏡23、一部分反射鏡24、一止光器25,及一聲光調制器26。該第一、第二全反射鏡21、22用以接收並反射該雷射光束,且該第一全反射鏡21設置靠近該雷射源1,該第二全反射鏡22設置靠近該工件5。該聚焦鏡23設置在該工件5上方並接收來自該第二全反射鏡22反射的雷射光束,並匯聚該雷射光束成高能量光束以照射在該工件5的表面。該部分反射鏡24設置於該第一全反射鏡21與該第二全反射鏡22之間,用以接收來自該第一全反射鏡21反射的雷射光束,並反射大部分的雷射光束且使少部分的雷射光束穿透該部分反射鏡24以產生相關該雷射光束的透射光。該止光器25設置靠近該第二全反射鏡22且用以吸收該雷射光束,使該 雷射光束不匯聚到該聚焦鏡23。該聲光調制器26設置於該部分反射鏡24與該第二全反射鏡22之間,用以接收從該部分反射鏡24反射的該雷射光束,且電連接該偵測模組3用以接收一控制信號,並根據該控制信號決定將接收的該雷射光束導引至該止光器25或該聚焦鏡23。The optical path module 2 is configured to guide the transmission path of the laser beam to the workpiece 5 so that the laser beam is perpendicular to the workpiece 5. The optical path module 2 includes a first total reflection mirror 21 and a second total reflection mirror. 22. A focusing mirror 23, a portion of the mirror 24, a light stop 25, and an acousto-optic modulator 26. The first and second total reflection mirrors 21, 22 are configured to receive and reflect the laser beam, and the first total reflection mirror 21 is disposed adjacent to the laser source 1, and the second total reflection mirror 22 is disposed adjacent to the workpiece 5. . The focusing mirror 23 is disposed above the workpiece 5 and receives the laser beam reflected from the second total reflection mirror 22, and condenses the laser beam into a high-energy beam to illuminate the surface of the workpiece 5. The partial mirror 24 is disposed between the first total reflection mirror 21 and the second total reflection mirror 22 for receiving the laser beam reflected from the first total reflection mirror 21 and reflecting most of the laser beam. And a small portion of the laser beam is transmitted through the partial mirror 24 to produce transmitted light associated with the laser beam. The light stop 25 is disposed adjacent to the second total reflection mirror 22 and configured to absorb the laser beam, so that the The laser beam does not converge to the focusing mirror 23. The acousto-optic modulator 26 is disposed between the partial mirror 24 and the second total reflection mirror 22 for receiving the laser beam reflected from the partial mirror 24 and electrically connected to the detecting module 3 A control signal is received, and the received laser beam is guided to the light stop 25 or the focusing mirror 23 according to the control signal.

該偵測模組3用以判斷該雷射光束的功率大小並作調整,且包括一判斷電路31、一雷射控制卡32,及一微處理器33。該判斷電路31具有一光偵測器311,及一比較器312。The detection module 3 is configured to determine the power of the laser beam and adjust it, and includes a determination circuit 31, a laser control card 32, and a microprocessor 33. The determining circuit 31 has a photodetector 311 and a comparator 312.

參閱圖5,該光偵測器311具有一第一級運算放大器電路313,及一第二級運算放大器電路314。該第一級運算放大器電路313接收該透射光,且將該透射光轉換成一電流信號並輸出。該第二級運算放大器電路314接收該電流信號且將該電流信號轉換成一電壓信號並輸出。Referring to FIG. 5, the photodetector 311 has a first stage operational amplifier circuit 313 and a second stage operational amplifier circuit 314. The first stage operational amplifier circuit 313 receives the transmitted light and converts the transmitted light into a current signal and outputs it. The second stage operational amplifier circuit 314 receives the current signal and converts the current signal into a voltage signal and outputs it.

參閱圖3,該比較器312內部儲存一第一臨界值及一第二臨界值,且電連接該光偵測器311以接收該電壓信號,並將該電壓信號與該第一臨界值及該第二臨界值做比較,且據以輸出一通知信號。該雷射控制卡32電連接該比較器312、該光路模組2的聲光調制器26,及該雷射源1,且接收該通知信號,並根據該通知信號來產生該控制信號。該微處理器33電連接該雷射控制卡32用以設定該雷射控制卡32。Referring to FIG. 3, the comparator 312 internally stores a first threshold and a second threshold, and electrically connects the photodetector 311 to receive the voltage signal, and the voltage signal and the first threshold and the The second threshold is compared and a notification signal is output accordingly. The laser control card 32 is electrically connected to the comparator 312, the acousto-optic modulator 26 of the optical path module 2, and the laser source 1, and receives the notification signal, and generates the control signal according to the notification signal. The microprocessor 33 is electrically coupled to the laser control card 32 for setting the laser control card 32.

該進給模組4用以盛放該工件5並控制該工件5需加工的位置及完成加工的外型,即帶動該工件5,使該工 件5需加工的位置移動至該聚焦鏡23下,以接收該雷射光束並進行雷射加工。The feeding module 4 is used for holding the workpiece 5 and controlling the position of the workpiece 5 to be processed and the shape of the finished machining, that is, driving the workpiece 5, so that the workpiece The position to be processed of the piece 5 is moved to the focusing mirror 23 to receive the laser beam and perform laser processing.

開始進行加工時,該雷射源1發射該雷射光束,該雷射光束經過該第一全反射鏡21全反射至該部分反射鏡24,大部分的雷射光束由該部分反射鏡24全反射至該聲光調制器26,少部分的雷射光束穿透該部分反射鏡24產生該透射光,該光偵測器311接收該透射光且將該透射光轉換成該電壓信號並輸出,該比較器312接收該電壓信號並將該電壓信號與該第一臨界值及該第二臨界值做比較,且據以輸出該通知信號,該雷射控制卡32根據該通知信號而有以下兩種控制狀態:When the processing is started, the laser source 1 emits the laser beam, and the laser beam is totally reflected by the first total reflection mirror 21 to the partial mirror 24, and most of the laser beam is completely covered by the partial mirror 24. Reflected to the acousto-optic modulator 26, a small portion of the laser beam passes through the partial mirror 24 to generate the transmitted light, and the photodetector 311 receives the transmitted light and converts the transmitted light into the voltage signal and outputs The comparator 312 receives the voltage signal and compares the voltage signal with the first threshold value and the second threshold value, and outputs the notification signal, and the laser control card 32 has the following two according to the notification signal. Kind of control status:

狀態一:State one:

當該電壓信號大於該第一臨界值或小於該第二臨界值時,亦即該透射光的功率不在正常範圍內,使該電壓信號超出該第一、第二臨界值,則該比較器312輸出的該通知信號的邏輯準位為一第一邏輯準位。在本例中,該第一臨界值大於該第二臨界值,且該第一邏輯準位是高邏輯準位。該雷射控制卡32接收該通知信號,並據以輸出該控制信號控制該聲光調制器26,使該聲光調制器26將接收到的雷射光束導引至該止光器25,而不匯聚該雷射光束。接著,該雷射控制卡32再輸出一觸發信號給該雷射源1,觸發該雷射源1再重新產生該雷射光束。When the voltage signal is greater than the first threshold or less than the second threshold, that is, the power of the transmitted light is not within the normal range, and the voltage signal exceeds the first and second thresholds, the comparator 312 The logic level of the output of the notification signal is a first logic level. In this example, the first threshold is greater than the second threshold, and the first logic level is a high logic level. The laser control card 32 receives the notification signal and outputs the control signal to control the acousto-optic modulator 26 to cause the acousto-optic modulator 26 to direct the received laser beam to the light stop 25, and The laser beam is not concentrated. Then, the laser control card 32 outputs a trigger signal to the laser source 1, and triggers the laser source 1 to regenerate the laser beam.

狀態二:State 2:

參閱圖4,當該電壓信號小於該第一臨界值且大 於該第二臨界值時,亦即該透射光的功率在正常範圍內,使該電壓信號不超出該第一、第二臨界值,則該比較器312輸出的該通知信號的邏輯準位為一第二邏輯準位。在本例中,該第二邏輯準位是低邏輯準位。該雷射控制卡32接收該通知信號,並據以輸出該控制信號控制該聲光調制器26,使該聲光調制器26將接收到的雷射光束導引至該第二全反射鏡22,則雷射光束經由該第二全反射鏡22全反射至該聚焦鏡23,該聚焦鏡23匯聚該雷射光束以照射在該工件5的表面,進行後續的雷射加工。Referring to FIG. 4, when the voltage signal is less than the first threshold and is large When the second threshold is used, that is, the power of the transmitted light is within a normal range, so that the voltage signal does not exceed the first and second thresholds, the logic level of the notification signal output by the comparator 312 is A second logic level. In this example, the second logic level is a low logic level. The laser control card 32 receives the notification signal and outputs the control signal to control the acousto-optic modulator 26 to cause the acousto-optic modulator 26 to direct the received laser beam to the second total reflection mirror 22 Then, the laser beam is totally reflected to the focusing mirror 23 via the second total reflection mirror 22, and the focusing mirror 23 converges the laser beam to illuminate the surface of the workpiece 5 for subsequent laser processing.

綜上所述,藉由該判斷電路31分析該透射光,以判斷該雷射光束的功率大小是否在正常的範圍內,再藉由該雷射控制卡32根據該判斷電路31輸出的該通知信號來調整該雷射光束是否要會聚至該聚焦鏡23,以確保該雷射光束在正常的功率範圍內進行加工,以保有該雷射加工系統在加工時的品質,故確實能達成本新型之目的。In summary, the judging circuit 31 analyzes the transmitted light to determine whether the power level of the laser beam is within a normal range, and the notification output by the laser control card 32 according to the judging circuit 31. a signal to adjust whether the laser beam is to be concentrated to the focusing mirror 23 to ensure that the laser beam is processed within a normal power range to preserve the quality of the laser processing system during processing, so the present invention can be achieved The purpose.

惟以上所述者,僅為本新型之較佳實施例而已,當不能以此限定本新型實施之範圍,即大凡依本新型申請專利範圍及專利說明書內容所作之簡單的等效變化與修飾,皆仍屬本新型專利涵蓋之範圍內。However, the above is only a preferred embodiment of the present invention, and is not intended to limit the scope of the present invention, that is, the simple equivalent changes and modifications made in accordance with the scope of the present patent application and the contents of the patent specification, All remain within the scope of this new patent.

1‧‧‧雷射源1‧‧‧Laser source

2‧‧‧光路模組2‧‧‧Light path module

21‧‧‧第一全反射鏡21‧‧‧First total reflection mirror

22‧‧‧第二全反射鏡22‧‧‧second total reflection mirror

23‧‧‧聚焦鏡23‧‧‧ Focusing mirror

24‧‧‧部分反射鏡24‧‧‧Partial mirror

25‧‧‧止光器25‧‧‧Light Stopper

26‧‧‧聲光調制器26‧‧‧Acousto-optic modulator

3‧‧‧偵測模組3‧‧‧Detection module

31‧‧‧判斷電路31‧‧‧Judgement circuit

311‧‧‧光偵測器311‧‧‧Photodetector

312‧‧‧比較器312‧‧‧ Comparator

32‧‧‧雷射控制卡32‧‧‧Laser Control Card

33‧‧‧微處理器33‧‧‧Microprocessor

4‧‧‧進給模組4‧‧‧Feed module

5‧‧‧工件5‧‧‧Workpiece

Claims (13)

一種雷射加工系統,適用一工件,且包含:一雷射源,用以產生一雷射光束;一光路模組,接收來自該雷射源的該雷射光束,並引導該雷射光束的傳遞路徑,且產生一相關於該雷射光束的一透射光,並受一控制信號控制以決定是否匯聚該雷射光束以照射在該工件的表面進行加工;及一偵測模組,電連接該光路模組且包括一判斷電路並接收來自該光路模組的該透射光,並根據該透射光的功率來產生該控制信號;當該透射光的功率不在正常範圍內,該控制信號將控制該光路模組不匯聚該雷射光束;當該透射光的功率在正常範圍內,該控制信號將控制該光路模組匯聚該雷射光束照射在該工件的表面進行加工。 A laser processing system for a workpiece, comprising: a laser source for generating a laser beam; an optical path module for receiving the laser beam from the laser source and guiding the laser beam Passing a path and generating a transmitted light associated with the laser beam, and being controlled by a control signal to determine whether to converge the laser beam to illuminate the surface of the workpiece for processing; and a detecting module, electrical connection The optical path module further includes a determining circuit and receiving the transmitted light from the optical path module, and generating the control signal according to the power of the transmitted light; when the power of the transmitted light is not within a normal range, the control signal is controlled The optical path module does not converge the laser beam; when the power of the transmitted light is within a normal range, the control signal controls the optical path module to converge the laser beam to illuminate the surface of the workpiece for processing. 如請求項1所述的雷射加工系統,其中,該判斷電路具有:一光偵測器,接收該透射光,且將該透射光轉換成一電壓信號並輸出,及一比較器,電連接該光偵測器以接收該電壓信號,並將該電壓信號與儲存的一第一臨界值及一第二臨界值做比較,且據以輸出一通知信號;當該電壓信號大於該第一臨界值或小於該第二臨界值,該通知信號的邏輯準位為一第一邏輯準位; 當該電壓信號小於該第一臨界值且大於該第二臨界值,該通知信號的邏輯準位為一第二邏輯準位。 The laser processing system of claim 1, wherein the determining circuit has: a photodetector, receiving the transmitted light, converting the transmitted light into a voltage signal and outputting, and a comparator electrically connecting the The photodetector receives the voltage signal, compares the voltage signal with a stored first threshold value and a second threshold value, and outputs a notification signal; when the voltage signal is greater than the first threshold value Or less than the second threshold, the logic level of the notification signal is a first logic level; When the voltage signal is less than the first threshold and greater than the second threshold, the logic level of the notification signal is a second logic level. 如請求項2所述的雷射加工系統,其中,該偵測模組還包括:一雷射控制卡,電連接該比較器、該光路模組,及該雷射源,且接收該通知信號,並根據該通知信號的邏輯準位來產生該控制信號;當該通知信號的邏輯準位為該第一邏輯準位時,該雷射控制卡輸出的該控制信號控制該光路模組不匯聚該雷射光束;當該通知信號的邏輯準位為該第二邏輯準位時,該雷射控制卡輸出的該控制信號控制該光路模組匯聚該雷射光束。 The laser processing system of claim 2, wherein the detection module further comprises: a laser control card electrically connected to the comparator, the optical path module, and the laser source, and receiving the notification signal And generating the control signal according to the logic level of the notification signal; when the logic level of the notification signal is the first logic level, the control signal output by the laser control card controls the optical path module not to aggregate The laser beam; when the logic level of the notification signal is the second logic level, the control signal output by the laser control card controls the optical path module to converge the laser beam. 如請求項3所述的雷射加工系統,其中,該第一邏輯準位是高邏輯準位,該第二邏輯準位是低邏輯準位。 The laser processing system of claim 3, wherein the first logic level is a high logic level and the second logic level is a low logic level. 如請求項3所述的雷射加工系統,其中,當該雷射控制卡輸出的該控制信號控制該光路模組不匯聚該雷射光束後,該雷射控制卡再輸出一觸發信號給該雷射源,觸發該雷射源再重新產生該雷射光束。 The laser processing system of claim 3, wherein when the control signal output by the laser control card controls the optical path module not to converge the laser beam, the laser control card outputs a trigger signal to the A laser source that triggers the laser source and regenerates the laser beam. 如請求項1所述的雷射加工系統,其中,該光路模組包括:一聚焦鏡,接收該雷射光束,並匯聚該雷射光束以照射在該工件;一部分反射鏡,設置於該雷射源與該聚焦鏡之間, 用以接收並反射該雷射光束且產生該透射光;一止光器,用以吸收該雷射光束,使該雷射光束不匯聚到該聚焦鏡;一聲光調制器,設置於該部分反射鏡與該聚焦鏡之間用以接收該雷射光束,且電連接該偵測模組用以接收該控制信號,並根據該控制信號決定將接收的該雷射光束導引至該止光器或該聚焦鏡。 The laser processing system of claim 1, wherein the optical path module comprises: a focusing mirror that receives the laser beam and condenses the laser beam to illuminate the workpiece; a portion of the mirror is disposed on the laser Between the source and the focusing mirror, Receiving and reflecting the laser beam and generating the transmitted light; a light stop for absorbing the laser beam so that the laser beam does not converge to the focusing mirror; an acousto-optic modulator disposed in the portion The mirror and the focusing mirror are configured to receive the laser beam, and are electrically connected to the detecting module for receiving the control signal, and according to the control signal, determining to receive the received laser beam to the stop light Or the focusing mirror. 如請求項1所述的雷射加工系統,還包含:一進給模組,用以盛放該工件並控制該工件需加工的位置及完成加工的外型。 The laser processing system of claim 1, further comprising: a feed module for holding the workpiece and controlling the position to be processed and the finished shape of the workpiece. 一種偵測模組,包含:一判斷電路,包括:一光偵測器,接收一雷射光束,且將該雷射光束轉換成一電壓信號並輸出,及一比較器,電連接該光偵測器以接收該電壓信號,並將該電壓信號與儲存的一第一臨界值及一第二臨界值做比較,且據以輸出一通知信號;當該電壓信號大於該第一臨界值或小於該第二臨界值,該通知信號的邏輯準位為一第一邏輯準位;當該電壓信號小於該第一臨界值且大於該第二臨界值,該通知信號的邏輯準位為一第二邏輯準位。 A detection module includes: a determination circuit, comprising: a photodetector, receiving a laser beam, converting the laser beam into a voltage signal and outputting, and a comparator electrically connecting the light detection Receiving the voltage signal, comparing the voltage signal with a stored first threshold value and a second threshold value, and outputting a notification signal; when the voltage signal is greater than the first threshold value or less than the a second threshold, the logic level of the notification signal is a first logic level; when the voltage signal is less than the first threshold and greater than the second threshold, the logic level of the notification signal is a second logic Level. 如請求項8所述的偵測模組,還包含: 一雷射控制卡,電連接該比較器,且接收該通知信號,並根據該通知信號的邏輯準位來產生一控制信號;當該通知信號的邏輯準位為該第一邏輯準位時,該雷射控制卡輸出的該控制信號控制不匯聚該雷射光束;當該通知信號的邏輯準位為該第二邏輯準位時,該雷射控制卡輸出的該控制信號控制匯聚該雷射光束。 The detection module of claim 8, further comprising: a laser control card electrically connecting the comparator and receiving the notification signal, and generating a control signal according to a logic level of the notification signal; when the logic level of the notification signal is the first logic level, The control signal outputted by the laser control card does not converge the laser beam; when the logic level of the notification signal is the second logic level, the control signal output by the laser control card controls the convergence of the laser beam. 如請求項9所述的偵測模組,其中,該第一邏輯準位是高邏輯準位,該第二邏輯準位是低邏輯準位。 The detection module of claim 9, wherein the first logic level is a high logic level and the second logic level is a low logic level. 如請求項9所述的偵測模組,其中,當該雷射控制卡輸出的該控制信號控制不匯聚該雷射光束後,該雷射控制卡再輸出一觸發信號。 The detection module of claim 9, wherein the laser control card outputs a trigger signal after the control signal output by the laser control card does not converge the laser beam. 一種判斷電路,包含:一光偵測器,接收一雷射光束,且將該雷射光束轉換成一電壓信號並輸出;及一比較器,電連接該光偵測器以接收該電壓信號,並將該電壓信號與儲存的一第一臨界值及一第二臨界值做比較,且據以輸出一通知信號;當該電壓信號大於該第一臨界值或小於該第二臨界值,則輸出的該通知信號的邏輯準位為一第一邏輯準位;當該電壓信號小於該第一臨界值且大於該第二臨界值,則輸出的該通知信號的邏輯準位為一第二邏輯準位。 A judging circuit comprising: a photodetector that receives a laser beam and converts the laser beam into a voltage signal and outputs the same; and a comparator electrically connected to the photodetector to receive the voltage signal, and Comparing the voltage signal with a stored first threshold value and a second threshold value, and outputting a notification signal; when the voltage signal is greater than the first threshold value or less than the second threshold value, the output signal is output The logic level of the notification signal is a first logic level; when the voltage signal is less than the first threshold and greater than the second threshold, the logic level of the output signal is a second logic level . 如請求項12所述的判斷電路,其中,該第一邏輯準位 是高邏輯準位,該第二邏輯準位是低邏輯準位。 The determining circuit of claim 12, wherein the first logic level It is a high logic level, and the second logic level is a low logic level.
TW103204305U 2014-03-13 2014-03-13 Laser machining system, detection module and determination circuit TWM486507U (en)

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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI632971B (en) * 2015-08-10 2018-08-21 南韓商Eo科技股份有限公司 Laser processing apparatus and laser processing method
TWI645928B (en) * 2015-08-31 2019-01-01 南韓商Eo科技股份有限公司 Laser processing apparatus and laser processing method using the laser processing apparatus

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI632971B (en) * 2015-08-10 2018-08-21 南韓商Eo科技股份有限公司 Laser processing apparatus and laser processing method
TWI645928B (en) * 2015-08-31 2019-01-01 南韓商Eo科技股份有限公司 Laser processing apparatus and laser processing method using the laser processing apparatus

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