TWM486055U - Dual-arm tester - Google Patents

Description

Double arm tester

This creation is related to a detection device, in particular to a two-arm test machine.

According to the miniaturization and volume space considerations of today's electronic products, the trend is toward a light, thin and short trend. The carrier board can be densely arranged with a circuit structure, and the three-dimensional wiring can be made according to the shape of the space to reduce the volume of the electronic product. Boards are one of the ways that are often used.

Usually, in various boards such as PCB, HDI, and IC carrier board, after the manufacturing is completed, for example, after setting passive components such as capacitors, inductors, resistors, or wafers, electrical detection is performed to confirm whether the carrier board is normal. The operation is carried out, so that the test results are normalized to the carrier, and the abnormality of the carrier is eliminated, thereby reducing the probability of misusing the bad carrier and ensuring the yield of the product. Among them, the general test machine is bulky and expensive, indirectly causing problems such as occupying a large space, increasing equipment and manufacturing costs. In addition, the electrical detection performed by one carrier usually takes a considerable amount of time. How to shorten the time for conducting electrical detection of these carriers to improve the efficiency of electrical detection is also an urgent problem to be solved.

For this reason, the two-arm type test machine has been developed in the prior art, in order to alternate the operation of the two arms to achieve the time required for shortening the program of carrying and detecting. However, the conventional input and discharge portion of the double-arm type tester for detecting the carrier is not disposed directly opposite the test machine. Instead, the device for injecting and discharging is additionally disposed on the side (that is, the device for feeding and discharging is not part of the testing machine), which indirectly causes an increase in equipment manufacturing cost and an excessively large equipment.

Therefore, it is necessary to provide a novel and progressive double arm testing machine to solve the above problems.

The purpose of the present invention is to provide a double-arm testing machine which is provided on the front side of the testing machine as part of the testing machine, which can reduce manufacturing cost and space problems, and can reduce the working path and time cost.

To achieve the above objectives, the present invention provides a dual arm testing machine comprising a base, a loading platform, a testing mechanism, a two-loading mechanism, a feeding arm and a discharge arm. The base is provided with a receiving portion and a receiving portion on a first side, and the receiving portion can sequentially provide a carrier for testing. The carrier includes, but is not limited to, a PCB, an HDI, an IC carrier, and the like. The receiving platform is movably disposed on the base and adjacent to the receiving portion and the receiving portion on the first side. The testing mechanism is disposed on the base and has a test platform for placing the carrier. The two loading mechanisms are movably disposed on the base, and are controllably alternately moved between the loading platform and the testing platform, and are respectively controllably parked on the loading platform or the testing platform. Position, one of the carriers to be tested is alternately carried between the loading platform and the test platform. The feeding arm is movably disposed on the base, controllably moves between the receiving portion and the receiving platform, and controllably obtains a carrier from the receiving portion and moves to the loading platform Place. The discharge arm is movably disposed on the base, controllably moves between the loading platform and the receiving portion, and controllably obtains the tested carrier from the loading platform and moves to the The loading section is placed.

10‧‧‧ Pedestal

11‧‧‧ first side

12‧‧‧Being Department

121‧‧‧Transportation track

122‧‧‧roller

123‧‧‧Receiving Department

13‧‧‧Feeding Department

131‧‧‧Place rack

20‧‧‧Matching platform

90‧‧‧Printing machine

30‧‧‧Test institutions

31‧‧‧Test platform

32‧‧‧CCD imaging device

40,50‧‧‧Loading agency

60‧‧‧feeding arm

61‧‧‧Sucking pipe fittings

70‧‧‧Output arm

71‧‧‧Sucking pipe fittings

80‧‧‧Laser marking machine

81‧‧‧ grab the arm

100‧‧‧ Carrier Board

FIG. 1 is a schematic diagram of a test operation of a double arm testing machine for detecting a carrier board according to a preferred embodiment of the present invention.

FIG. 2 is a schematic diagram of the test operation of the double arm testing machine for detecting the carrier board according to a preferred embodiment of the present invention.

FIG. 3 is a schematic diagram of a test operation of the double arm testing machine for detecting a carrier board according to a preferred embodiment of the present invention.

FIG. 4 is a schematic diagram of the test operation of the double arm testing machine for detecting the carrier board according to a preferred embodiment of the present invention.

FIG. 5 is a schematic diagram of the test operation of the double arm testing machine for detecting the carrier board according to a preferred embodiment of the present invention.

FIG. 6 is a schematic view showing the test operation of the dual arm testing machine for the IC carrier board according to another preferred embodiment of the present invention.

FIG. 7 is a schematic diagram of a test operation of the double arm testing machine for HDI according to another preferred embodiment of the present invention.

The following is a description of possible implementations of the present invention by way of example only, and is not intended to limit the scope of the creation of the present invention.

Referring to FIG. 1 to FIG. 5, a preferred embodiment of the present invention is shown. The dual arm testing machine of the present invention is used to detect the carrier 100. The dual arm testing machine includes a base 10, a loading platform 20, a testing mechanism 30, two loading mechanisms 40, 50, a feeding arm 60 and a discharge arm 70.

The base 10 is provided with a receiving portion 12 and a receiving portion 13 on a first side 11 . The material portion 12 can sequentially provide the carrier plate 100 for testing. In this embodiment, the first side 11 is relatively located in front of the loading platform 20 and the testing mechanism 30, so that the carrier board 100 can be easily grasped and stored, and the overall occupation space of the testing tool can be greatly reduced. . In more detail, the receiving portion 12 includes a conveying rail 121, at least one pair of roller rods 122 disposed on the conveying path of the conveying rail 121, and a material to be reclaimed on one side of the at least one pair of roller rods 122. a portion 123, the carrier plate 100 is transported by the transport rail 121 and is pinched by the at least one pair of roller rods 122, and then placed on the to-be-removed portion 123, wherein the roll surface of the at least one pair of roller rods 122 is preferably provided For example, a material layer with adhesive ability or a gas blowing function, so that foreign matter such as dust, processing debris, other particles, etc. remaining on the surface of the carrier plate 100 or other substances that may affect the detection result may be moved before the detection. In addition, to improve the efficiency, accuracy and accuracy of test operations such as image inspection. The accommodating portion 13 preferably includes a plurality of placing frames 131 arranged side by side along the first side 11, so that a larger amount of the detected carrier plates 100 can be placed. It should be noted that the placing frames 131 are arranged. It can be divided into normal and abnormal two areas of the detection result, so that the normal or abnormal carrier board 100 can be placed on the front side of the double arm testing machine without moving the tested carrier board 100 to the double arm test. Store outside the machine, convenient and fast.

The loading platform 20 is movably disposed on the base 10 and adjacent to the receiving portion 12 and the receiving portion 13 on the first side 11 . In detail, the loading platform 20 is movable up and down, and the receiving portion 12 and the receiving portion 13 are respectively located on two adjacent sides of the loading platform 20 to minimize the two loading mechanism 40. 50. The working path of the feeding arm 60 and the discharging arm 70 can reduce the space and reduce the time cost.

The test mechanism 30 is disposed on the base 10 and has a test platform 31 for placing the carrier 100. The test platform 31 is preferably movable up and down, so that the object to be tested placed thereon can be adjusted to be Located at the correct detection position, but the test platform 31 can be moved, for example, by detection The detection unit of the head can also move. In the present invention, preferably, the testing mechanism 30 further includes a CCD image capturing device 32 (which can be regarded as a detecting head), and the CCD image capturing device 32 is located at a position above the testing platform 31 for waiting for The image of the carrier 100 is measured for subsequent detection of the alignment operation.

The two loading mechanisms 40, 50 are movably disposed on the base 10, and are controllably alternately moved between the loading platform 20 and the testing platform 31, respectively. The two loading mechanisms 40, 50 are respectively Controlly parked in the relative position above the loading platform 20 or the testing platform 31, and one of the carrier plates 100 to be tested is alternately carried between the loading platform 20 and the testing platform 31. More specifically, when one of the two loading mechanisms 40, 50 is in the process of carrying one of the carrier plates 100 to the test platform 31, the other of the two loading mechanisms 40, 50 The process of carrying the other carrier board 100 to the loading platform 20 to complete the test.

The loading arm 60 is movably disposed on the base 1 (0, controllably movable between the receiving portion 12 and the receiving platform 20, and controllably obtains a carrier from the receiving portion 12. 100 and moved to the loading platform 20. In particular, the feeding arm 60 has a plurality of suction tubes 61 connected to a suction source, and the carrier 100 can be sucked and sucked by suction.

The discharge arm 70 is movably disposed on the base 10 and is controllably movable between the loading platform 20 and the loading portion 13 to controllably obtain the tested load from the loading platform 20 The plate 100 is moved to the loading portion 13 for placement. Specifically, the discharge arm 70 has a plurality of suction tube members 71 connected to a suction source, and the carrier plate 100 is adsorbed and sucked by suction, wherein the suction source is connected to the suction tube member 61 of the feeding arm 60. The suction source can be the same device, but it can also be two independent devices.

When the two loading mechanisms 40, 50 carry the carrier 100 to be tested to the When the platform 31 is tested, the feeding arm 60 grabs another carrier 100 and prepares to move to the loading platform 20 for the other of the two loading mechanisms 40, 50 to load; when the discharging When the arm 70 obtains the tested carrier plate 100 and sends it to the loading portion 13, the feeding arm 60 moves the other carrier plate 100 to the loading platform 20 and the two loading mechanisms 40 are placed. One of the 50 is carried to the test platform 31.

In an actual detecting operation, the feeding portion 12 first carries and mounts one of the carriers 100 to be tested on the conveying rail 121 through a device such as a robot arm (suction type), and the conveying rail 121 is The test carrier 100 is transported through the pair of roller bars 122 or other cleaning devices for surface cleaning, and the cleaned test carrier 100 is parked in the to-be-received portion 123. Then, the feeding arm 60 takes the carrier board 100 to be tested from the receiving portion 12 and moves it to the loading platform 20 for placement. One of the two loading mechanisms 40, 50 (for example, the right side of the drawing) The feeding mechanism 40 is carried by the loading platform 20 to the testing platform 31 for testing, and at the same time, the feeding arm 60 can obtain another load to be tested from the receiving portion 12. The plate 100 is ready to be moved to the loading platform 20 for placement. After the test carrier 100 is tested, the other of the two loading mechanisms 40, 50 (for example, the loading mechanism 50 on the left side in the drawing) carries the detected carrier 100 from the test platform 31. To the loading platform 20. Finally, the discharge arm 70 takes the tested carrier plate 100 from the loading platform 20 and moves it to the loading portion 13 for placement (preferably in front of the double arm testing machine). At the same time, the feeding arm 60 can move the other to-be-tested carrier 100 to the loading platform 20 for the next detection. Wherein, in the next detection procedure, another carrier board 100 to be tested is carried by the loading platform 20 to the test platform 31 for detection by, for example, the loading mechanism 50 on the left side of the drawing. After the other test carrier 100 is tested, the other test carrier 100 to be tested is carried by the test platform 31 to the loading platform 20 by, for example, the loading mechanism 40 on the right side of the drawing. The discharge arm 70 moves it to the loading portion 13 for placement. Through the above steps, you can follow the order The detection and storage of the carrier 100 is performed.

As shown in FIG. 6, when the present invention is used in an IC carrier tester, a laser marking machine 80 can be additionally disposed on one side of the test machine, and the laser marking machine is provided with a grab arm 81. , for feeding and loading. In addition, as shown in FIG. 7 , when the present invention is used in a HDI special testing machine, a printer 90 can be additionally disposed on one side of the testing machine, and the nozzle of the printing machine can be moved by using other mobile devices. Between the materials department.

The double arm testing machine of the present invention is provided with the feeding portion and the loading portion in front of the loading platform and the testing mechanism, that is, the feeding and discharging device is disposed on the front side of the testing machine and is a testing machine. In part, it is very convenient to grab and store the carrier board, which also greatly reduces the overall space occupied by the test equipment, which can reduce manufacturing costs and space problems.

And, when one of the loading mechanisms carries a test carrier to the test platform for testing, the feeding arm simultaneously acquires another carrier to be tested and prepares to move to the loading platform for placement, and when When the discharge arm moves the tested carrier plate to the loading portion, the feeding arm simultaneously moves another to-be-tested carrier plate to the loading platform for the next detection, which can be reduced. The working path of the two loading mechanism, the feeding arm and the discharging arm, and the space can be reduced and the time cost can be reduced.

In summary, the overall structural design, practicality and efficiency of this creation are indeed in full compliance with the needs of industrial development, and the disclosed structural creation is also an unprecedented innovative structure, so it has a "novelty" should Undoubtedly, this creation can be more effective than the conventional structure. Therefore, it is also "progressive". It fully complies with the requirements of the application requirements for new patents in the Chinese Patent Law. It is a patent application in accordance with the law, and please The bureau will review it early and give it affirmation.

10‧‧‧ Pedestal

11‧‧‧ first side

12‧‧‧Being Department

121‧‧‧Transportation track

122‧‧‧roller

123‧‧‧Receiving Department

13‧‧‧Feeding Department

131‧‧‧Place rack

20‧‧‧Matching platform

30‧‧‧Test institutions

31‧‧‧Test platform

32‧‧‧CCD imaging device

40,50‧‧‧Loading agency

60‧‧‧feeding arm

70‧‧‧Output arm

100‧‧‧ Carrier Board

Claims (7)

A double arm testing machine includes: a base, a receiving portion and a receiving portion are disposed on a first side, and the receiving portion can sequentially provide a carrier for testing; a receiving platform a test unit disposed on the base and having a test platform for placing the carrier plate; The loading mechanism is movably disposed on the base, and is controllably alternately moved between the loading platform and the testing platform, and is controllably parked on the loading platform or the relative position above the testing platform And one of the carriers to be tested is alternately carried between the loading platform and the testing platform, and further comprises a CCD image capturing device, wherein the CCD image capturing device is located at a position above the testing platform for supplying Taking the image alignment of the carrier to be tested; a feeding arm movably disposed on the base, controllably moving between the receiving portion and the loading platform, and controllably from the receiving Part of the carrier board is moved to the loading platform for placement; and a discharge arm is movable Mounted on the base, it can be controllably movable feed platform is set between the facing material and the portion of the controllably feeding platform made from the home via the carrier plate and transferred to test the placement portion facing material. The double arm testing machine according to claim 1, wherein the feeding portion includes a conveying rail, at least one pair of roller rods disposed on the conveying rail conveying path, and one side of the at least one pair of roller rods To be taken out, the carrier is transported by the transport track and is pinched by the at least one pair of roller bars and placed in the to-be-removed portion. The dual arm testing machine of claim 1, wherein the loading portion includes a plurality of placement racks disposed side by side along the first side. The double arm testing machine of claim 1, wherein when one of the loading mechanisms carries the carrier to be tested to the testing platform, the feeding arm grabs another carrier and prepares to move to the positioning The material platform is placed for loading by another loading mechanism. The double arm testing machine according to claim 1, wherein when the discharging arm obtains the tested carrier and sends it to the loading portion, the feeding arm moves the other carrier to the receiving material. The platform is placed for transport by a loading mechanism to the test platform. The double arm testing machine of claim 1 further comprising a laser marking machine disposed on one side of the testing machine, the laser marking machine having a grabbing arm for feeding and loading. The double arm testing machine of claim 1 further includes a printer disposed on one side of the testing machine for marking the HDI.