TWM456491U - Junction board set of testing and sorting equipment, and easy disassemble/assemble structure of testing connectors - Google Patents

Description

Test the classification of the joint plate set of the sorting device and the test connector

The present invention relates to a test device, and more particularly to an easy-to-assemble structure for a joint plate set and a test connector for use in an automated test classification device for integrated circuit components.

Currently used in automated test classification equipment for integrated circuit component testing applications, based on automated test classification operations, many joints must be used for the joint between the bond plates, test connectors and test boards in the test classification equipment. When the screw is used for fixing, the integrated circuit component to be tested is required to be disassembled and assembled at the time of automatic test change production, or when the test connector is to be disassembled for cleaning and replacing the electrical connection member in the test connector. Fixing a plurality of screws between the joint plate and the test connector and the circuit board, and each test connector is reassembled, and the test connector is correctly electrically connected to the circuit board of the test system. The combination relationship requires a long assembly time, especially when using multiple sets of test connectors for parallel testing, it takes a lot of time and manual disassembly and assembly.

As we all know, in the automatic test equipment classification equipment of today's integrated circuit components, expensive automatic test equipment and classification equipment are the most important capital investment in the test factory. For the overall test capacity, it takes more time to do non-production related things. Is a waste. In the process of using the automatic test and classification equipment for the integrated circuit components, the automatic test and classification equipment of the integrated circuit components must be shut down for several ten minutes for each assembly and test connector. The efficiency of the detection and classification of circuit components is highly influential.

The main purpose of this creation is to provide an easy-to-disassemble group structure for the test panel assembly and the test connector of the test classification device, and to create a solution to overcome the inconvenience and inconvenience of the joint panel assembly and the test connector in the existing classification test equipment. Work and other issues.

For the purpose of achieving the foregoing disclosure, the easy-to-disassemble structure of the joint plate set and the test connector of the test classification device proposed by the present invention comprises: a joint plate set comprising a joint carrier plate, at least one positioning plate and a plurality of fixed plates The bonding carrier is configured to be fixed on the test circuit board of the test classification device, and at least one engagement hole is formed in the joint carrier, the engagement hole includes an engagement groove portion and a positioning groove portion which are arranged up and down and communicated The upper engaging groove portion is larger than the lower positioning groove portion, and a joint surface is formed between the bottom portion of the engaging groove portion and the positioning groove portion, the positioning plate shape is corresponding to the shape of the engaging groove portion, and a component is formed in the positioning plate. The bottom surface of the positioning plate is a set of connecting surfaces, and the positioning plate is detachably assembled with the fixing member in the engaging groove portion of the engaging carrier plate, and the connecting surface of the positioning plate abuts on the joint surface of the engaging hole At least one test connector, the test connector includes a connecting base and an electrical connecting member including an electrical connecting component, wherein the connecting seat forms a mounting hole, and the electrical connecting component is detachably assembled to the connecting seat In the assembly hole, the electrical connection component of the electrical connection component corresponds to the component placement hole of the positioning plate, and the test connector is fixed at the assembly surface of the bottom of the positioning plate by the connection seat, and can be assembled with the positioning plate. In the engagement hole of the engagement carrier, the test connector is located in the positioning groove portion of the engagement hole.

In this way, the joint plate group of the sorting device and the easy-to-remove group structure of the test connector are created, and when it is applied to the integrated circuit component automatic test classification device The bonding carrier of the bonding plate group can be normally fixed on the test circuit board, and need not be removed due to the disassembly and assembly of the test connector, so that the test connector before and after the disassembly can be maintained between the test connector and the test circuit board. Good electrical joint consistency, and the test connector must be replaced when it is necessary to test the production line change according to the different specifications of the integrated circuit component to be tested, or to clean and replace the electrical connection components in the test connector. When the test connector is detachably mounted on the joint carrier board fixed on the test circuit board by the positioning board, the test connector can be directly disassembled and assembled on the line of the automatic test classification device, and the test connector is disassembled. The installation time is short, so that the test classification operation can be carried out quickly. In addition, the test circuit board of the assembled joint plate group can simplify the circuit layout of the test circuit board because it is not necessary to reserve a screw fixing hole for fixing the test connector.

The creation department includes an easy-to-disassemble group structure of the joint plate group and the test connector of the test classification device, as shown in FIG. 1 to FIG. 4, which discloses the easy-to-detach group structure of the joint plate group and the test connector of the creation test classification device. In several preferred embodiments, the easy-to-assemble assembly of the joint plate set and the test connector comprises a joint plate set 1 and at least one test connector 2, wherein: the joint plate set 1 comprises a joint carrier plate 10, at least one positioning plate 11 and a plurality of fixing members 12, at least one engaging hole 101 is formed in the joint carrier plate 10, and the engaging hole 101 includes an engaging groove portion 102 and a positioning groove portion 103 which are arranged up and down and communicated with each other. The shape of the upper engaging groove portion 102 is larger than the shape of the lower positioning groove portion 103, so that the joint surface 104 is formed between the bottom of the engaging groove portion 102 and the positioning groove portion 103, and the shape of the engaging groove portion 102 corresponds to the shape of the positioning plate, and the positioning groove The shape of the portion 103 corresponds to the test connector 2 An outer surface of the positioning plate 11 is formed with a component receiving hole 111, and the bottom surface of the positioning plate 11 is a set of connecting surfaces 112. The positioning plate 11 is detachably assembled to the supporting carrier 10 in combination with the fixing member 12. In the joint groove portion 102, the joint surface 112 of the positioning plate 11 abuts on the joint surface 104 of the joint hole 101, and the fixing member 12 can be screwed, magnetically attracted or snapped, etc., so that the positioning plate 11 can be borrowed. The fixing member 12 is detachably disposed in the joint carrier plate 10, and the upper surface of the positioning plate 11 is further provided with a connecting post 113, and the connecting rod 113 can be provided to provide the disassembling jig assembly thereon. The positioning plate 11 is taken out from the bonding carrier 10.

In the foregoing joint plate group 1, the number of the engaging holes 11 provided in the joint carrier plate 10 and the number of the positioning plates 11 are set according to the number of integrated circuit components to be tested which can be simultaneously detected by the detecting sorting device; as shown in FIG. When a plurality of the engaging holes 11 are formed in the joint carrier 10, the plurality of the engaging holes 11 may be arranged in a row or matrix manner; the joint carrier 10 is further provided with a plurality of fixing holes 105 for fixing by screws. On the test circuit board in the test classification device, a plurality of positioning posts 106 may be disposed on the bonding carrier 10 to facilitate the alignment of the test operations.

As shown in FIG. 1 , the embodiment in which the fixing member 12A is a screw is disclosed, and a through hole is formed in the positioning plate 11 , and a screw hole 107 is disposed on the joint surface 104 of the joint carrier plate 10 corresponding to the position of the through hole, so that the fixing member is provided. The 12A is screwed into the screw hole through the through hole, and the positioning plate 11 is fixed to the joint carrier 10.

As shown in FIG. 2, an embodiment in which the fixing member fixes the positioning plate 11 to the bonding carrier 10 by magnetic fixing means is disclosed. The fixing member may be a combination of two magnets 121B, 122B, wherein the first magnet 121B The second magnet 122B is disposed on the side wall of the positioning plate 11, and the second magnet 122B is disposed on the joint carrier board 10. The second magnet 122B and the first magnet 121B are oppositely disposed with opposite magnetic polarities for mounting on the positioning plate 11 in the joint hole 101 of the joint carrier 10 by the first side. The magnet 121A and the second magnet 122B are magnetically oppositely magnetized to fix the positioning plate 11 in the joint carrier 10, and the positioning plate 11 can be directly taken out from the bonding carrier 10; The component may also be a combination of a magnet and a magnetically conductive component (such as a magnetic component that can be magnetically attracted) instead of the magnetic polarization of the two magnets.

As shown in FIG. 3, the fixing member 12C is a block-like or strip-shaped elastic body having a compressive resilience, which fixes the elastic fixing member 12C to the side wall of the engaging groove portion 102 of the joining carrier 10. And protruding the surface of the side wall, and providing a recess 113 at a corresponding position on the side wall of the positioning plate 11, when the positioning plate 11 is placed in the engaging groove portion 102 of the engaging carrier 10, the elastic fixing member 12C is elastically pressed against the opposite side. The recessed portion 113 of the carrier 10 is joined and fixed, and the positioning plate 11 can be directly taken out from the bonded carrier 10.

In addition to the foregoing several preferred embodiments, the fixing member may be a combination of a steel ball and a spring, and is attached to a predetermined counterbore on the side wall of the engaging groove portion 102 of the joint carrier 10, and then the spring and the steel ball are respectively The sequence is installed in the counterbore, so that the steel ball is pushed down by the elastic force provided by the spring, the steel ball can protrude from the side wall surface of the joint groove portion 102, and the steel ball can be pushed and retracted into the side wall of the joint groove portion 102, In addition, a positioning recess is disposed on the peripheral wall of the positioning plate 11 corresponding to the fixing member for inserting the positioning plate 11 into the engaging hole 101 of the engaging carrier 10, and the steel ball pushed by the elastic force is correspondingly engaged with the positioning concave portion. In this manner, the positioning plate 11 is fixed in the joint carrier 10, and the positioning plate 11 can be directly taken out from the bonding carrier 10, and the positioning recess can also be disposed on the positioning recess. The side wall of the engaging groove portion 102 of the joining carrier 10 is provided with a fixing member composed of a steel ball and a spring on the side wall of the positioning plate 11, and the same detachable group function can be achieved.

The test connector 2 is detachably mounted on the assembly surface 112 at the bottom of the positioning plate 11. The test connector 2 includes a connecting base 20 and an electrical connecting member 21, and a mounting hole is formed in the connecting base 20. The electrical connection member 21 includes an electrical connection element 22 such as a probe type or a conductive film type, and the conductive film type electrical connection element 22 includes a plurality of conductive electrodes, conductive wires, conductive blocks or conductive particles. The external dimension of the electrical connecting member 21 is set according to the measuring circuit component, and the electrical connecting member 21 is detachably assembled in the mounting hole of the connecting base 20 to make the electrical connecting member 21 A plurality of types of electrical connecting elements 22, such as probes, conductive wires, conductive blocks or conductive particles, correspond to the component placement holes 111 of the positioning plate 11, whereby the plurality of electrical connection elements 22 are used to provide corresponding output of the integrated circuit components to be tested. The terminal (such as a pin, a lead pad, a ball pad, etc.) and the contact pad of the test circuit board serve as a medium for electrical contact, and the test connector 2 is screwed to the bottom of the positioning plate 11 by using the connecting seat 20 thereof. Group junction, and can be positioned along with The plate 11 is assembled in the engagement hole 101 of the joint carrier 10 such that the test connector 2 is positioned in the positioning groove portion 103 of the engagement hole 101.

When the easy-to-assemble assembly structure of the bonding plate group 1 and the test connector 2 of the creation test classification device is applied to the integrated circuit test classification device of the integrated circuit component, the fastening carrier plate 10 of the bonding plate group is screwed to The test circuit board of the test classification device is tested, and the test connector 2 is fixed in the joint carrier 10 by the positioning plate 11, and the electrical connection elements 22 in the electrical connection member 21 of the test connector are respectively contacted. Corresponding test board Contact pad. When the integrated circuit component performs the automatic detection and classification operation, the circuit component to be measured is placed in the test connector 2 through the component placement hole 111 of the positioning plate 11 by using the device in the automatic integrated circuit component test classification device. The electrical connection member 21 is applied with a pressure to the measured circuit component to make the respective output terminals (such as pins, pads, ball pads, etc.) at the bottom of the integrated circuit component to be tested corresponding to the electrical connection member 21. The conductive element 22 is electrically contacted, and then electrically connected to the test circuit board through the electrical connection element 22 to electrically connect the test system of the integrated integrated circuit component test classification device, and performs functional test operation of the integrated circuit component, and then, according to the test system The result (ie, the classification of the function is correct) controls the pick-up device to classify the detected integrated circuit components.

The present invention is applied to an automatic test classification device for integrated circuit components, and the joint carrier plate of the joint plate group can be normally fixed on the test circuit board, and need not be removed due to the disassembly and assembly of the test connector 2, so that before and after replacement The test connector 2 can pass through the bonding plate set 1 to have good joint consistency with the test circuit board. When it is necessary to test the production change line in response to different specifications of the integrated circuit components to be tested, or to clean and replace the electrical connection members in the test connector, etc., and the test connector must be disassembled, the test connection of this creation The device 2 is detachably mounted via the positioning plate 11 in the joint carrier 10 fixed on the test circuit board, so that it can be directly taken from the bonded carrier 10 by using a manual or automated disassembly tool on the line of the automated test sorting device. The lower positioning board 11 and the test connector 2 on the bottom surface thereof are further removed from the positioning board 11 and the other test connector 2 is replaced, and then reassembled on the joint carrier board 10, And the positioning board 11 is assembled on the bonding carrier 101, even if the test connector 2 can correctly electrically connect the test circuit The board has a short time for disassembly and assembly, so that the test classification operation can be carried out quickly.

The above description is only a preferred embodiment of the present invention, and is not intended to limit the present invention in any way. Although the present invention has been disclosed above in the preferred embodiment, it is not intended to limit the present invention, and any technique familiar to the art. A person skilled in the art can make some modifications or modifications to equivalent embodiments by using the technical content disclosed above, but the content of the present invention is not deviated from the present invention. Technical simplifications Any simple modifications, equivalent changes and modifications made to the above embodiments are still within the scope of the present technical solution.

1‧‧‧ joint plate set

10‧‧‧Joining carrier board

101‧‧‧Join hole

102‧‧‧ joint groove

103‧‧‧ positioning groove

104‧‧‧ joint surface

105‧‧‧Fixed holes

106‧‧‧Positioning column

107‧‧‧ screw holes

11‧‧‧ Positioning board

111‧‧‧Component placement hole

112‧‧‧Group junction

113‧‧‧Connecting column

114‧‧‧ recess

12A‧‧‧Fixed parts

121B, 122B‧‧‧ magnet

12C‧‧‧Fixed parts

2‧‧‧Test connector

20‧‧‧Connecting Block

21‧‧‧Electrical connection members

22‧‧‧Electrical connection elements

1 is a perspective exploded view of a first preferred embodiment of a detachable assembly of a joint plate set and a test connector of the present invention.

2 is a perspective exploded view of a second preferred embodiment of the easy-to-assemble assembly of the joint plate set and the test connector of the present invention.

3 is a perspective exploded view of a third preferred embodiment of the easy-to-assemble assembly of the joint plate set and the test connector of the author test classification device.

4 is a perspective exploded view showing a fourth preferred embodiment of the easy-to-assemble assembly structure of the joint plate set and the test connector of the present invention.

1‧‧‧ joint plate set

10‧‧‧Joining carrier board

101‧‧‧Join hole

102‧‧‧ joint groove

103‧‧‧ positioning groove

104‧‧‧ joint surface

105‧‧‧Fixed holes

106‧‧‧Positioning column

107‧‧‧ screw holes

11‧‧‧ Positioning board

111‧‧‧Component placement hole

112‧‧‧Group junction

113‧‧‧Connecting column

12A‧‧‧Fixed parts

2‧‧‧Test connector

20‧‧‧Connecting Block

21‧‧‧Electrical connection members

22‧‧‧Electrical connection elements

Claims (16)

An easy-to-assemble assembly structure for testing a joint plate assembly and a test connector of a sorting device, comprising: a joint plate set, comprising a joint carrier plate, at least one positioning plate and a plurality of fixing members, wherein the joint carrier plate is used for Fixing on the test circuit board of the test classification device, at least one engagement hole is formed in the joint carrier plate, the engagement hole includes an engagement groove portion and a positioning groove portion which are arranged up and down and communicated, and the upper engagement groove portion is larger than the lower portion Positioning the groove portion to form a joint surface between the bottom portion of the joint groove portion and the positioning groove portion, the shape of the positioning plate is corresponding to the shape of the joint groove portion, and a component placement hole is formed in the positioning plate, and the bottom surface of the positioning plate is a set of joint faces The positioning plate is detachably assembled with the fixing member in the engaging groove portion of the joint carrier plate, and the connecting surface of the positioning plate abuts on the joint surface in the joint hole; at least one test connector, the test The connector comprises a connecting base and an electrical connecting member including an electrical connecting component, wherein the connecting seat forms a mounting hole, and the electrical connecting component is detachably assembled in the mounting hole of the connecting seat, so that the electrical connecting component is The connecting component corresponds to the component placing hole of the positioning plate. The test connector is fixed to the connecting surface of the bottom of the positioning plate by the connecting seat, and can be assembled with the positioning plate in the engaging hole of the bonding carrier, and tested. The connector is located in the positioning groove portion of the engaging hole. The easy-to-disassemble assembly of the joint plate set and the test connector of the test sorting device according to claim 1, wherein the fixing member is a screw, and the through hole is disposed on the positioning plate, and the joint surface of the joint carrier plate corresponds to A screw hole is disposed at a position of the through hole, and the fixing member is screwed into the screw hole through the through hole, so that the positioning plate is detachably fixed to the joint carrier plate. Bonding plate set and test of test classification equipment as described in claim 1 The easy-to-assemble assembly of the connector, wherein the fixing member is a combination of two magnets, wherein the first magnet is disposed on the sidewall of the positioning plate, and the second magnet is disposed on the side wall of the engaging groove of the bonding carrier, the second The magnets are opposite to the first magnets in opposite magnetic polarities, and the positioning plates are mounted in the joint holes of the joint carriers to be fixed by magnetic attraction of the fixing members. The easy-to-assemble assembly structure of the joint plate set and the test connector of the test classification device according to claim 1, wherein the fixing member is a magnet and a magnetically permeable magnetic component, and the magnet and the magnetic conductive component are respectively The positioning plate is disposed at a position opposite to the side wall of the engaging groove portion of the engaging carrier plate, and the positioning plate is fixed in the engaging hole of the joint carrier plate by magnetic attraction of the fixing member. The easy-to-assemble assembly of the joint plate set and the test connector of the test sorting device according to claim 1, wherein the fixing member is an elastic body, and the fixing member is fixed on a side wall of the engaging groove portion of the joint carrier plate and is convex. The surface of the side wall is provided with a concave portion at a corresponding position on the side wall of the positioning plate, and is fixed in the engaging groove portion of the engaging carrier plate by the positioning plate, and is elastically pressed against the concave portion of the engaging carrier plate. The easy-to-assemble assembly of the joint plate set and the test connector of the test sorting device according to any one of claims 1 to 5, wherein the joint carrier plate is provided with a plurality of joint holes, and the plurality of joint holes are always Columns are arranged at intervals. The easy-to-assemble assembly structure of the joint plate set and the test connector of the test sorting device according to any one of claims 1 to 5, wherein the joint carrier plate is provided with a plurality of joint holes, and the plurality of joint holes are in a matrix Arranged at intervals. The detachable group configuration of the joint plate set and the test connector of the test sorting device according to any one of claims 1 to 5, wherein the joint carrier plate is provided with a plurality of positioning posts, and the surface of the positioning plate is set Connect the column. The detachable group structure of the joint plate set and the test connector of the test sorting device according to claim 6, wherein the joint carrier plate is provided with a plurality of positioning posts, and the surface of the positioning plate is provided with a connecting post. The easy-to-disassemble assembly of the joint plate set and the test connector of the test sorting device according to claim 7, wherein the joint carrier plate is provided with a plurality of positioning posts, and the surface of the positioning plate is provided with a connecting post. The detachable set construction of the joint plate set and the test connector of the test sorting device according to any one of claims 1 to 5, wherein the electrical connection element is a probe type electrical connection element. The easy-to-assemble configuration of the bonding plate set and the test connector of the test sorting device according to claim 9, wherein the electrical connecting component is a probe-type electrical connecting component having a plurality of probes. The detachable set structure of the joint plate set and the test connector of the test sorting device according to claim 10, wherein the electrical connection element is a probe type electrical connection element having a plurality of probes. The detachable group configuration of the bonding plate set and the test connector of the test sorting device according to any one of claims 1 to 5, wherein the electrical connecting component is a conductive film type electrical connecting component having a plurality of electrical conductors. The easy-to-assemble assembly of the bonding plate set and the test connector of the test sorting device of claim 9, wherein the electrical connecting component is a conductive film-type electrical connecting component having a plurality of electrical conductors. The easy-to-assemble assembly of the bonding plate set and the test connector of the test sorting device of claim 10, wherein the electrical connecting component is a conductive film-type electrical connecting component having a plurality of electrical conductors.