TWM452525U - Universal testing board - Google Patents

Abstract

An universal testing board is provided. The universal testing board comprises a plurality of channel ends for connecting with a plurality of load boards; a plurality of tester connection ends for connecting with a least two testers; and a plurality of relay control switch, coupled between the channel ends and the tester connection ends, for controlling the connection between the testers and the load boards.

Description

Universal test adapter board

This creation is about circuit testing.

In order to obtain the electrical characteristics of a load board, the conventional technology usually performs various circuit tests on the load board by a tester, which includes a DC test part, an AC test part, or a power test. Part and so on. In practice, various types of testers must be paired with their dedicated test adapter boards to test the load circuit board connected to the test riser board. For professional circuit testers, if they use a variety of different types of test machines for circuit testing, it is bound to use the corresponding number of test adapter boards, which will lead to the line connection between the test machine, test adapter board and load circuit board. It is quite complicated, and the extra line insertion and removal actions increase the probability of connection errors in addition to wasting time, which is not conducive to the automation of the test process and the efficiency of circuit test.

This creation provides a universal test adapter board. The test adapter board includes: a plurality of channel ends for connecting a plurality of load circuit boards; a plurality of test machine connection ends for connecting at least two test machines; and a plurality of relay control switches coupled to the channel ends And connecting the tester terminals to control the connection between the test machines and the load circuit boards.

The following is a description of the preferred embodiment of the creation. The embodiments are used to illustrate the principles of the present invention, but are not intended to limit the present invention. The scope of this creation is subject to the claims appended hereto.

Figure 1 is a schematic diagram of a test adapter plate according to an embodiment of the present invention. As shown in the figure, the test adapter board 100 of the present invention comprises: a plurality of channel ends 110, a plurality of tester terminals 120, a plurality of relay control switches 130, and a plurality of power terminals (Device Power Supply, DPS) 140 and a plurality of attenuation circuit terminals 150.

The channel ends 110 are used to connect a plurality of load circuit boards 112, 114 and 116, wherein the load circuit board is a so-called "Device Under Test" (DUT). Different load circuit boards 112, 114, and 116 can have various integrated circuits (ICs) and electronic components that can be used to perform various specific applications. However, regardless of their use, the test is turned on in this creation. The range to which the board 100 can be applied. In addition, it should be noted that, for convenience of explanation, FIG. 1 only takes a specific number (3) of load circuit boards 112, 114, and 116 as an example, however, in other embodiments, the test adapter board 100 of the present invention. The number of load boards that can be connected is not limited to this.

The main purpose of the present invention is to integrate the circuit connection between the plurality of test machines and the plurality of load boards. Therefore, in this embodiment, the plurality of test machine terminals 120 of the present invention are connected to at least two specifications through the cable. Different test machines 122 and 124. For example, the testers 122 and 124 can be two types of test machines SCUD-1A and V50 of (Verigy), respectively. Both have different numbers of input/output pins (I/O pins), different testing rates, and different driving voltages and currents provided by different Precision Measurement Units (PMUs). However, it must be understood that the test adapter plate of this creation is not limited to application on a particular model or a specific number of test machines.

In the present test adapter plate 100, the most important feature is the design and configuration of the plurality of relay control switches 130 thereon. Through the relay control switch 130 of the present invention, a plurality of test adapter boards dedicated to a specific test machine in the prior art are integrated, thereby reducing the line connection and increasing the control efficiency. In the embodiment of FIG. 1 , a relay control switch 130 is coupled between the channel ends 110 and the tester terminals 120 for controlling the test machines 122 , 124 and the load circuit boards 112 . The connection. For example, in a test flow, the connection between the test machine 122 and the load circuit board 112 can be turned on through the relay control switch 130, and the connection between the test machines 122 and 124 and the other load circuit boards 114 and 116 is turned off; In another test flow, the connection between the test machine 124 and the load circuit board 114 can be turned on again through the relay control switch 130, and the connection between the test machines 122 and 124 and the other load circuit boards 112 and 116 is turned off. This type of push. Through the control of the relay control switch 130 of the present invention, various connection modes between the test machine and the load circuit board can be quickly switched, which helps to reduce the number of times of connection between different test machines and different load circuit boards, thereby improving the test. Efficiency and test quality. In addition, it is worth noting that, in the case of a test machine, it often has a certain number of output input pins (for example, 8 pins), and it is also possible to control the switch 130 to be turned on or off at the appropriate time. Expansion output input pin The effect of the number of bits (for example, 192 pin).

The plurality of power terminals 140 of the present application are connected to the load circuit boards 112, 114, and 116 for the purpose of supplying power to the respective load circuit boards 112, 114, and 116, and in some embodiments, for measuring the load circuit. Whether the static or dynamic current on the board is normal.

The test adapter board 100 of the present invention can also be used for high voltage or high current test of the load circuit board. In some embodiments, the inventive attenuation circuit connection 150 can be additionally coupled to an attenuation circuit 160. The attenuation circuit 160 is coupled between the output of the load circuit boards 112, 114, and 116 and the input of the test machines 122 and 124 to attenuate the voltage outputted by the load circuit board to the tester voltage. The range helps to measure the current value of special functions.

Because this creation integrates all the lines used for testing into a single test adapter board, a single test adapter board can perform a variety of different circuit tests to meet the needs of multiple functional tests. It should be noted that the first figure is only a schematic diagram of the structure of the creation test adapter board. Those skilled in the art can, according to the spirit of the present creation, connect the channel end and the test machine connection end of the universal test adapter board of the creation. The physical circuit layout of the relay control switch, the power supply terminal, and the attenuation circuit connection end is optimally designed.

The present invention is disclosed in the above preferred embodiments, and is not intended to limit the scope of the present invention. Anyone skilled in the art can make some changes and refinements without departing from the spirit and scope of the present invention. The scope of protection of this creation is subject to the definition of the scope of the patent application attached.

100‧‧‧Test adapter board

110‧‧‧ channel end

112, 114, 116‧‧‧ load circuit board

120‧‧‧Tester connection

122, 124‧‧‧Tester

130‧‧‧Relay control switch

140‧‧‧Power terminal

150‧‧‧Attenuation circuit connection

160‧‧‧Attenuation circuit

Figure 1 is a schematic diagram of a test adapter plate according to an embodiment of the present invention.

100‧‧‧Test adapter board

110‧‧‧ channel end

112, 114, 116‧‧‧ load circuit board

120‧‧‧Tester connection

122, 124‧‧‧Tester

130‧‧‧Relay control switch

140‧‧‧Power terminal

150‧‧‧Attenuation circuit connection

160‧‧‧Attenuation circuit

Claims (8)

A universal test adapter board includes: a plurality of channel ends for connecting a plurality of load circuit boards; a plurality of test machine connection ends for connecting at least two test machines; and a plurality of relay control switches coupled to the plurality of The channel end and the tester connection end are used to control the connection between the test machine and the load circuit board. The universal test adapter board of claim 1, wherein the at least two test machines have different numbers of output input pins (I/O pins). The universal test adapter board of claim 1, wherein the at least two test machines have different testing rates. The universal test adapter board of claim 1, wherein the at least two test machines have different driving voltages or currents. The universal test adapter board according to claim 1 further includes an attenuation circuit connection end for connecting to an attenuation circuit. The universal test adapter board according to claim 5, further comprising the attenuation circuit coupled between the output of the load circuit board and the input of the test machine for attenuating the load The voltage output by the board. The universal test adapter board of claim 1 further includes a plurality of power terminals for supplying power to the load circuit boards. The universal test adapter board of claim 1, wherein the test machine has a plurality of output input pins, and the relay control switches are used to expand the output input pins of the test machines. The number of bits.