M425279 五、新型說明： 【新型所屬之技術領域】 本創作係與薄膜覆晶式液晶面板檢測裝置有關，特別 是指一種探針裝置。 【先前技術】M425279 V. New description: [New technical field] This creation is related to the film flip-chip LCD panel inspection device, especially a probe device. [Prior Art]
業界之薄膜覆晶(Chip on film，簡稱COF)型式液晶面 板’為確保液晶面板不會有顯示不良的問題，會透過品保 檢測來判斷液晶面板之訊號是否正常’在過程中會搭配使 用探針裝置，以自動化之方式迅速地確認液晶面板是否正 常運作。 先前中華民國專利第M396398U1號用於薄膜覆晶封 裝液晶螢幕檢測用之探針，即為一先前技術之探針裝置·， 具有-上殼體、-調整塊、一彈性條及一軟性電路板，其 中該調整塊係用以夾持該彈性條，使該彈性條把接該軟性 電路板的金屬端子(接觸部)於適當位置，檢測液晶面板的 戒號是否正常。 两、上之量產製造在可達朗樣的產品魏下，製造 研發如何減少產品的組件，以減少組件之間所產 整產的成本。上述之先前技術中，該調 料狀二心細該雜鮮可用其它 之間所產生的誤差亦進一步簡化，徒增組件 針裝置軸時，倾電路板之金相子和液晶面板In the industry, the Chip on Film (COF) type LCD panel will ensure that the LCD panel will not display poorly. It will judge whether the LCD panel signal is normal through the quality assurance test. The needle device quickly confirms whether the LCD panel is functioning properly in an automated manner. The former probe of the Republic of China Patent No. M396398U1 for detecting a liquid crystal screen of a film flip chip package is a prior art probe device having an upper casing, an adjustment block, an elastic strip and a flexible circuit board. The adjusting block is configured to clamp the elastic strip so that the elastic strip connects the metal terminal (contact portion) of the flexible circuit board in an appropriate position to detect whether the ring number of the liquid crystal panel is normal. In the mass production of the product, we can reduce the components of the product to reduce the cost of production between components. In the above prior art, the error between the two-hearted and the other can be further simplified. When the component of the needle device is added, the metallurgical phase of the circuit board and the liquid crystal panel are tilted.
3 S M425279 訊號線連接時會產生撞擊，上述之先前技術中該彈性件雖 可減緩撞擊力道，惟若能進—步加強，則可再減低组件受 損之牆舍。 ' 【新型内容】 為解決上述先前技術所存在組件可簡化以降低生產 時間及成本之問題，以及進—步加_緩金屬端子和液晶 面板之撞擊力道，摘作之主要目的在於提供—種探針裝 置，其，化了探針裝置的組件，減少組件之騎產生的誤 差亦可節省生產的咖及成本，並且，使探針裝置抵接於 軟性電路板之金屬端子的部份具可撓性，#金屬端子與液 晶面板之職線連接時’可減低探針裝置魏晶面板撞擊 之力道以避免損傷。 為了達成前述目的，依據本創作所提供之一種探針裝 置’係用於薄膜覆晶式液晶面板檢測，包含有：一基座， 具有凹。[5朝向—待測液晶面板；—抵接件，具有一頂面 與-底面’該抵接件係以該頂面固設於該凹部之表面，並 以該底面朝向該待測液晶面板，該抵接件係向—側且向下 斜向延伸—雜f，郷性f於其末端受到下方上頂的外 力時係略微向上撓曲變形並產生—復歸彈力；以及一軟性 電路板’係於其板身定義出_固定部、u部以及一抵 接。P 。玄軟性電路板係以其固定部之頂面固設於該基座， 且該懸吊部係由該固定部向該凹部延伸，該抵接部係由該 懸吊4向5亥彈性臂延伸而抵接於該抵接件之底面 ’該抵接 部係涵蓋該彈性臂之末端，且該抵接部之底面具有複數金 屬端子，該等金屬端子係相對位於該彈性臂之末端下方。 另外，本創作進一步於該軟性電路板上設有一支撐 桿，橫跨設於該軟性電路板之懸吊部底面，以避免軟性電 路板因其軟性特性而彎曲，保持該抵接部整體之平坦，使 檢測時該抵接部與待測液晶面板訊號線得到較佳之電氣連 接。 【實施方式】 為了詳細說明本創作之構造及特點所在，茲舉以下之 較佳實施例並配合圖式說明如後： 如第一至第三圖所示之本創作第一較佳施實例所提供 之一種探針裝置10 ,包含有一基座u、一抵接件21及一 軟性電路板31，其中： 該基座11，具有一凹部12朝向一待測液晶面板95。 該抵接件21，具有一頂面與一底面，該抵接件21係 以該頂面固設於該凹部12之表面，並以該底面朝向該待測 液晶面板95，該抵接件21係向一側且向下斜向延伸—彈 性臂22 ’該彈性22於其末端受到下方上了頁的外力時係 略微向上撓曲變形並產生一復歸彈力；在本實施例中，該 抵接件21係以黏貼方式固設於該凹部12，另外，該抵接 件21之彈性臂22係較該抵接件21之身部更薄。 該軟性電路板3卜係於其板身定義出一固定部32、一 懸吊部33以及一抵接部34，該軟性電路板3H系以其固定 部32之頂面固設於該基座u，且該懸吊部％係由該固定 部32向該凹部12延伸而成，該抵接部％係由該懸吊部 33向該彈性臂22延伸而抵接於該抵接件21之底面，該抵 接部34係涵蓋該彈性臂22之末端，且該抵接部％之底/面 具有複數金屬端子35，料金屬端子35係械位於該彈 性臂22之末端下方，於本實施例t ,該軟性電路板3ι係 以黏貼方式設於該基座11。 以側視方向觀察本實施例時(如第三圖所示），該凹部 12係為位於該基座丨丨前端下方，且該凹部12之表面係與 該待測液晶面板95相夾預定角度而非平行。 接下來說明本第一較佳實施例之操作狀態如下： 如第二圖至第四圖所示，本創作所提供之一種探針震 置10在檢測待測液晶面板95時’該探針裝置1〇會朝向待 測液晶面板95訊號線(圖中未標示訊號線)移動，當該軟性 電路板31往下貼近待測液晶面板95使該抵接部34與待測 液晶面板95訊號線連接時，因該抵接件之該彈性臂22相 對於该待測液晶面板95相夾預定角度而非平行，使該抵接 件21抵接於待測液晶面板95時從該彈性臂22開始向上撓 曲變形並產生一復歸彈力，該復歸彈力係使該彈性臂22 向下壓制，而使抵接於該彈性臂22底面的該抵接部之金屬 端子35與待測液晶面板95的訊號線更為貼合、電氣連接 更為良好’如此可增加檢測的可靠度，再者，藉由該彈性 臂22可向上撓曲變形並產生一復歸彈力之特性，可減少該 探針裝置10在移動過程中撞擊待測液晶面板95之力道， 以避免組件損傷。 如第五圖所示之本創作第二較佳施實例所提供之一種 探針裝置50，概同於前揭之第一較佳施實例，其不同之處 在於： 該凹部51相對於待測液晶面板95概呈平行，但仍維 持該抵接件52之底面與該待測液晶面板95相夾預定角 度，使得該彈性臂53抵接於待測液晶面板95時可向上撓 曲變形，本第二較佳實施例旨在說明該凹部可以有不同方 式之態樣。 本第二實施例其餘結構及所能達成的功效均與前述第 一較佳實施例相同，容不贅述。 如第六至第七圖所示之本創作第三較佳施實例所提供 之一種探針裝置60，係概同於前揭第一較佳實施例，其不 同之處在於： 該軟性電路板61更包含有一支撐桿62，橫跨設於該 軟性電路板61之懸吊部63底面。 因軟性電路板為軟性材質，當其寬度或長度增加時愈 容易彎曲。在本第二實施例中，該支撐桿62其功能係為維 持該軟性電路板61之平坦，使相鄰的該抵接部64在該支 樓桿62橫跨的方向上，可以維持良好的平坦度；藉此當 該抵接部64在與待測液晶面板95訊號線連接時，該抵接 部64整個平面能均勻地貼合於待測液晶面板％訊號線而 得到較佳之電氣連接。 本第三較佳實施例其餘結構及所能達成的功效均與前 M425279 述第一較佳實施例相同，容不贅述。 惟，上述較佳實施例在於說明本創作之實施方式，並 不侷限於本創作僅能以上述之方式實施。 【圖式簡單說明】 第一圖為本創作第一較佳實施例之立體圖； 第二圖為本創作第一較佳實施例之立體分解圖； 第三圖為本創作第一較佳實施例之局部放大側視圖； 第四圖為本創作第一較佳實施例之另一局部放大側視3 S M425279 There is an impact when the signal line is connected. In the above prior art, the elastic member can slow down the impact force, but if it can be further strengthened, the wall of the component can be reduced. 'New content】 In order to solve the problems of the above-mentioned prior art, the components can be simplified to reduce the production time and cost, and the impact force of the metal terminal and the liquid crystal panel is further increased. The main purpose of the extraction is to provide a probe. The needle device, which simplifies the components of the probe device, reduces the error caused by the riding of the component, saves the cost of production, and makes the probe device abutting on the metal terminal of the flexible circuit board. Sex, when the metal terminal is connected to the job line of the liquid crystal panel, the force of the impact of the probe device Weijing panel can be reduced to avoid damage. In order to achieve the foregoing object, a probe device according to the present invention is used for film flip-chip liquid crystal panel inspection, comprising: a pedestal having a concave shape. [5-oriented - the liquid crystal panel to be tested; the abutting member has a top surface and a bottom surface", the abutting member is fixed on the surface of the concave portion, and the bottom surface faces the liquid crystal panel to be tested. The abutting member is obliquely extended to the side and downwardly, and the miscibility f is slightly deflected and deformed at the end of the upper end by the external force of the upper top and generates a returning elastic force; and a flexible circuit board The fixed part, the u part, and the abutment are defined in the body. P. The flexible circuit board is fixed to the base by the top surface of the fixing portion, and the hanging portion extends from the fixing portion to the recess portion, and the abutting portion is extended from the suspension 4 to the 5 liter elastic arm And abutting on the bottom surface of the abutting member, the abutting portion covers the end of the elastic arm, and the bottom surface of the abutting portion has a plurality of metal terminals, and the metal terminals are located opposite to the end of the elastic arm. In addition, the present invention further includes a support rod disposed on the flexible circuit board across the bottom surface of the suspension portion of the flexible circuit board to prevent the flexible circuit board from being bent due to its soft characteristic, and maintaining the flatness of the entire abutting portion. Therefore, the abutting portion and the liquid crystal panel signal line to be tested are preferably electrically connected during the detection. [Embodiment] In order to explain in detail the construction and features of the present invention, the following preferred embodiments are described with reference to the following: The first preferred embodiment of the present invention as shown in the first to third figures A probe device 10 is provided, which includes a base u, an abutting member 21 and a flexible circuit board 31. The base 11 has a recess 12 facing a liquid crystal panel 95 to be tested. The abutting member 21 has a top surface and a bottom surface. The abutting member 21 is fixed on the surface of the recess portion 12, and the bottom surface faces the liquid crystal panel 95 to be tested. The abutting member 21 Tilting to one side and downward obliquely—the elastic arm 22' is elastically deformed slightly upward when the end is subjected to an external force on the page, and generates a return elastic force; in this embodiment, the abutment The member 21 is fixed to the recess 12 by adhesive bonding, and the elastic arm 22 of the abutting member 21 is thinner than the body of the abutting member 21. The flexible circuit board 3 defines a fixing portion 32, a hanging portion 33 and an abutting portion 34, and the flexible circuit board 3H is fixed to the base by the top surface of the fixing portion 32. And the % of the suspension portion is extended by the fixing portion 32 toward the concave portion 12, and the abutting portion is extended by the hanging portion 33 toward the elastic arm 22 to abut against the abutting member 21 a bottom surface, the abutting portion 34 covers the end of the elastic arm 22, and the bottom/face of the abutting portion has a plurality of metal terminals 35, and the material metal terminal 35 is mechanically located below the end of the elastic arm 22, in the present embodiment In the example t, the flexible circuit board 3ι is provided on the susceptor 11 in an adhesive manner. When the embodiment is viewed in a side view direction (as shown in the third figure), the recess 12 is located below the front end of the base, and the surface of the recess 12 is at a predetermined angle with the liquid crystal panel 95 to be tested. Not parallel. Next, the operation state of the first preferred embodiment will be described as follows: As shown in the second to fourth figures, a probe shock 10 provided by the present invention detects the liquid crystal panel 95 to be tested. 1〇 will move toward the signal line of the liquid crystal panel 95 to be tested (not shown in the figure), when the flexible circuit board 31 is placed close to the liquid crystal panel 95 to be tested, the abutting portion 34 is connected to the signal line of the liquid crystal panel 95 to be tested. The elastic arm 22 of the abutting member is opposite to the liquid crystal panel 95 to be tested by a predetermined angle instead of being parallel, so that the abutting member 21 abuts from the elastic arm 22 when abutting against the liquid crystal panel 95 to be tested. Flexing the deformation and generating a returning elastic force, the elastic arm 22 pressing the elastic arm 22 downward, and the metal terminal 35 of the abutting portion abutting the bottom surface of the elastic arm 22 and the signal line of the liquid crystal panel 95 to be tested It is more suitable and the electrical connection is better. This can increase the reliability of the detection. Moreover, the elastic deformation of the probe device 10 can be reduced by the elastic arm 22 being capable of flexing upward and deforming and generating a returning elastic force. The force that hits the liquid crystal panel 95 to be tested during the process To avoid component damage. A probe device 50 according to a second preferred embodiment of the present invention, as shown in FIG. 5, is similar to the first preferred embodiment of the prior art, except that: the recess 51 is opposite to the test The liquid crystal panel 95 is substantially parallel, but the bottom surface of the abutting member 52 is maintained at a predetermined angle with the liquid crystal panel 95 to be tested, so that the elastic arm 53 can be flexed and deformed upward when abutting against the liquid crystal panel 95 to be tested. The second preferred embodiment is intended to illustrate that the recess can be in a different manner. The rest of the structure and the achievable effects of the second embodiment are the same as those of the first preferred embodiment, and are not described herein. A probe device 60 according to a third preferred embodiment of the present invention, as shown in the sixth to seventh embodiments, is similar to the first preferred embodiment, and the difference is: the flexible circuit board The 61 further includes a support rod 62 spanning the bottom surface of the suspension portion 63 provided on the flexible circuit board 61. Because the flexible board is a soft material, it tends to bend as its width or length increases. In the second embodiment, the support rod 62 functions to maintain the flatness of the flexible circuit board 61 so that the adjacent abutting portion 64 can maintain a good direction in the direction in which the tower pole 62 straddles. The flatness is obtained. When the abutting portion 64 is connected to the signal line of the liquid crystal panel 95 to be tested, the entire surface of the abutting portion 64 can be evenly attached to the liquid crystal panel to be tested to obtain a better electrical connection. The remaining structure and the achievable functions of the third preferred embodiment are the same as those of the first preferred embodiment of the former M425279, and are not described herein. However, the above-described preferred embodiments are intended to illustrate the embodiments of the present invention, and are not limited to the present invention and can be implemented only in the manner described above. BRIEF DESCRIPTION OF THE DRAWINGS The first drawing is a perspective view of a first preferred embodiment of the present invention; the second drawing is an exploded perspective view of the first preferred embodiment of the present invention; Partially enlarged side view; the fourth figure is another partial enlarged side view of the first preferred embodiment of the creation
圖’表不探針裝置檢測制液晶面板時之狀態，抵接件會向上 撓曲變形並產生一復歸彈力； 第五圖為本創作第二較佳實施例之局部放大側視圖，表示 凹部相對於待測液晶面板亦可概呈平行； -第/、圖為本創作第二較佳冑施例之軟性電路板立體圖，表 I·生電路板下方有-支雜，明加軟性電路板抵接部的平 第七圖為辅作第三_實關之局部放大側視圖。Figure 2 shows the state of the probe device when detecting the liquid crystal panel, the abutment member will flex upward and deform and generate a returning elastic force; the fifth figure is a partially enlarged side view of the second preferred embodiment of the present invention, showing that the concave portion is opposite The liquid crystal panel to be tested may also be substantially parallel; - the / / figure is a perspective view of the flexible circuit board of the second preferred embodiment of the creation, and the surface of the circuit board has a - branch, and the soft circuit board is The seventh figure of the joint is a partial enlarged side view of the third _ real off.
11基座 21抵接件 31軟性電路板 33懸吊部 35金屬端子 【主要元件符號說明】 10探針裝置 12凹部 22彈性臂 32固定部 34抵接部11 base 21 abutment 31 flexible circuit board 33 suspension part 35 metal terminal [Description of main components] 10 probe device 12 recessed portion 22 elastic arm 32 fixed portion 34 abutment portion
S 8 M425279 51凹部 53彈性臂 61軟性電路板 63懸吊部 50探針裝置 52抵接件 60探針裝置 62支撐桿 64抵接部 95待測液晶面板(非本創作元件)S 8 M425279 51 recess 53 elastic arm 61 flexible circuit board 63 suspension part 50 probe device 52 abutment 60 probe device 62 support rod 64 abutment portion 95 liquid crystal panel to be tested (not a creative component)