M369613 五、新型說明： 【新型所屬之技術領域】 路的能測試裝置’尤其涉及測試印刷電路的短路和斷 【先前技術】 a線路板生產廠家在製作完成線路板後都要對線路板上的枚政 '佳^ 短路測試。1知技術對線路板短路和斷路的測試設傷包括專^ 娜議和飛針測試機，其中飛針測試機測試速度ί ΐ 機而用於批量生產線路板的測試設備則主要是 社ί糊試機主要是借助與線職f制的複合測端置才能對繞 試:複合測試裝置包括針盤和線盤，針盤是口 库十J3㈣探針與f要測試線路板上的每伽m點一對 和待測試線路板ΐ良好:提:的繼每個測試探針 長，而且每—台=對比較複雜，其製作時間也比較 通用。針對不同型^的疋3同二型號的線路板而製作，不能 複合測試裝機便宜，但是由於其上的 ，而且線盤的製作時間長，這也給使用者帶 針與需要測if針元件的針盤’該針盤上的每個測試探 —個密Ϊ彈性點—對應；瓣性元件底座是 尾部都可以落在談萬用㈣兀’來保證針盤上的每—侧試探針的 測試不_號的線路板的—轉性元件上。在 試點--對應的針盤作一塊舆不同型號線路板的各測 就了以測試該線路扳了。但是由於通用測試機上 M369613 元件的數量非常大，同時每 試機要昂責❹，對應，魏的成本比專用測 【新型内容】 試、在二提供-種用_ 5式採針的針盤和測試信號導•綠，、 h專用測试機上設有多個測 點對應；該通用轉接裝▲包】設有待測試電路板的測試 件、设有多個第二導電元件的下網格點组电几:牛的上網格點組 下網格點組件之間的轉‘，、、、、，牛、位於該上網格點組件和 座； 換線路板、以及設在該下網格點組件下侧的底 該正認=以正面導電點和反面導電點， 導電元件的點的位置二對，:^件，和職探針接觸到的第— 面導電點一一對應雷逵垃:丄該正面令電點在轉換線路板内部與反 連接的插座點；該第S和職信號導電線 該上網袼點祕座上_麵導電連接，· 過該上網格點組件上對^“ 背=’·該針盤上的各測試探針通 座點和'測試二二對應的第二導電元件與底座：; ί彈菁導電器件，·在該上網。組:導電元件為 接入1帶彈簧導電器件的第-通孔和第開設有與 導電元件和“ 且^彈性絕緣板，並且在該第— 絕緣板結合形成該第一導電元件件由該導電微粒和彈性 在本創作的通用轉接裝置中，4該上網格點組件上的第一導電元件 fif!!的通用轉接裝置中，該第一導電. M369613 佈滿於，上網格點組件所有的測試區域； 10倍密度。 刀伸在厪疋2倍、4倍、8倍或M369613 V. New description: [New technical field] The road's energy test device' especially involves short circuit and break of test printed circuit. [Prior technology] A circuit board manufacturer must be on the circuit board after making the circuit board. Meizheng 'good ^ short circuit test. 1 Know the technology to test the short circuit and open circuit of the circuit board, including the special test and flying probe test machine, wherein the flying probe test machine test speed ί 而 and the test equipment used for mass production of the circuit board is mainly The test machine is mainly used for the winding test by means of the composite measuring end of the line f: the composite test device includes the dial and the reel, the dial is the mouthpiece of the J3 (four) probe and the f is to test every gamma on the circuit board. The pair of points and the circuit board to be tested are good: the following is long after each test probe, and each time is relatively complicated, and the production time is relatively common. It is made for the different types of 疋3 and the same type of circuit board. It is not cheap to use the composite test, but because of the above, and the production time of the reel is long, this also gives the user a needle and a need to measure the needle component. The dial plate 'each test probe on the dial is a close-point elastic point-corresponding; the base of the petal element can be placed on the tail (four) 兀' to ensure each side of the probe on the dial Test the board of the non-numbered - on the rotating component. In the pilot--the corresponding dial, a separate test of the different types of circuit boards was tested to test the line. However, because the number of M369613 components on the universal test machine is very large, and each test machine has to be blamed, the cost of Wei is higher than the special test [new content] test, and the second one is used - the type _ 5 type needle is used. And the test signal guide, green, and h special test machine is provided with a plurality of measuring points; the universal transfer package ▲ package] has a test piece of the circuit board to be tested, and a lower net provided with a plurality of second conductive elements Grid point group: the turn of the grid point component under the grid point group of the cow, ',,,,, cattle, the grid point component and seat; the circuit board, and the grid The bottom of the lower part of the point assembly is positively defined = the front conductive point and the reverse side conductive point, the position of the conductive element is two pairs, the ^ piece, and the first surface conductive point contacted by the job probe corresponds to the Thunder : 丄 The front side makes the electrical point inside the conversion circuit board and the reverse connection socket point; the S-th and the job signal conductive line are connected to the 袼-surface conductive connection on the Internet, and the upper grid point component is on the ^" Back = '· the test probe pass point on the dial and the second guide corresponding to the test 22 Component and base: ί 弹 导电 conductive device, · in the Internet. Group: conductive element is connected to the first through hole with a spring conductive device and the first opening is provided with conductive elements and "and elastic insulation board, and in The first insulating member is combined to form the first conductive component by the conductive particles and the elastic in the universal switching device of the present invention, 4 in the universal conductive device of the first conductive component fif! , the first conductive. M369613 is covered with all the test areas on the grid point component; 10 times density. The knife is stretched 2 times, 4 times, 8 times or
格點組件通導電元件的-面伸出該下網 柊點細杜μ 6A结導U形成良好的電接觸；和/¾，兮L -：：ίΐί;：ίΐ：ίΙ：：;;-—， 板、下網晴、轉換線路 電線點通過該底座内部的導 、本創作還提供一種用於測試線路板 、 用治具包括分別位於該線路板兩側的上治且和；、八里k用治具’該通 治具均包括上述針盤和通用轉接裝下〉口具；該上治具和下 在本創作的通用治具中，該下治具的通用 件上的第二導電元件數量大於或等於該專用置的下網格點組 治j的通轉接裝置的下網格點 ’：ς ^__數’該上 於專用測試機的測試點數的—半。導㈣件數量大於或等 - /4·在本創作的通用治具中，該下治具的下網;# =件=數量等於該專用測試機的測試點點r上的第二導電 〜下網格點組件的N健第二導電元件為二 >,的整數，相應 座上的一個插座點連接； ”、、—、、、且，並且每一組與底 試機件的數量等於該專用測 饵的捌忒點數，並且該上 M369613 ' 第二導電元件缝按給定的比例分配。 接裝置及通用:具目ίϊ益於測試線路板專峨 該通測試線路板的， 備了該通用轉接裝置的專 -件底座有類似功能，而裝 •》作與待測試線路板相對應的$盤===的，路板時，只需要 母次治具探針用到的彈性元件反即可，轉換線路板將 本身所帶的測試點組成的網格=而點和專用測試 用彈性底座上的幾萬或幾十萬數見了將通用測試機上萬 f式點數量的對應關係。轉換_^===身幾千點的 =。讀跟習知技術裝有複合測試裝置用機成本要 的縮短；而跟習知技術通用測試機相比時間會大大 用測試機價格要便宜得多。{ 吏用了该通用轉接裝置的專 的下網格 置 @ f L ίί ?的通用治具將下治具對應的通用轉接穿詈的Τ烟 ，汉疋和測試機的總點數一樣或 置的下網 f下網格點數設定和職機的總點數的一半=對應用轉接裝- 點數；= 導線的彈簧連接在-起，具有製作成===點和底座通過帶有 式，導線的彈她 粒，通過金屬微粒和橡膠的結合位置=有金屬微 -塊板下上的導電元件略伸出下網格點的反面，底座上有 塊線路板，線路板上有和 M369613 =’導電點通過線路板内部的線路和插座點 和底座組额，下祕點上料電元魏可畔插舰格點 【實施方式】 下面結合各附圖對本創作作進一步詳細說明。 用轉=圖試機的通 210的針盤200和測試信號導電線(圖中標晝=)。g === 線路板_或40(T製作，不同型號的線路板4〇〇 t對，$試 針盤2()()，使得針盤·的峨探針21()同的 :數待測試線路板卿。。、試點數小於專用測試機 通用轉接裝置100包括設有多個彈性第—導带 =組件，、轉換線路板12〇、設有多個彈性第二件 格點組件13〇和底座刚。所有彈性第一導電元 ，下、、周 ί，地成行、成列分佈於各第-通孔112之中= L弟一 ¥%(讀131分佈在下曝馳件⑽的 ， 正、反兩面設有多個正面導電點:和反面; =22 ’轉換線路板120正面導電點121的位置和 ^ 試探針210接觸到的彈性第-導電單元111位i”-、-:。底座H。上設有與下網格點組件二 =㈡= ^ ΐϊ; ； ^2r ^141 双里，止面钕甩點卜反面導電點122 口 、^ ^ ^ 專數1，>則試探針210的數量小於彈性第一導電件=、’ ^二 元件131的數量。 守电辑111、第一導電 400名侧試探針210頭部頂在待测試線路板400或 电綱上職點組件110絲在針盤2〇〇的下面，針盤上的多 M369613 尾稍上娜·雜件11G场躺雜帛—導電元件 问fi奐線路板120錄上網格點組件110 f口下網格點組件130之 二f· 位於下網格點組件130下面’底座140111定在專用測試 機的測ii號ϊίίί多個插座點147，11過插座點147與專用測試 ίο點格點組件13G上對應的彈性第二導電元件131盘底ί 對應的導電點141 ——電接觸連接，紐14〇上的各導電點Μ 拍Ϊ路與插魅147點連接’通過插座點147與各戰作 連Λ通過這樣的連财式就將待峨線路板4 〇Ϊ ίΐΐί該專用測試機上引出的各測試信號導電線一電連接Ϊ 通過以開路等測試。或者，下網格點也可以 導電i 座點147導電連接，而省略了底座上的 f換線路板120根據待測試線路板4〇〇或4〇(r 面ίΐ=不工上轉換線路㈣二 ίϊίίί，通過線路轉換後’成功地在專制試機上進3= ί 無需重新製作線盤或使用萬關試機。 項上進仃㈣，而 上網測S點===編 試裝置的、，盤網格點的密度一樣，，該弟通孔112的岔度和複合測 參見第四圖，該第—通孔112 第—通孔112的中心距離L1 3 —疋么，即每行兩相鄰 的中心距離L2也是2 54毫来疋米’母列兩相鄰第-通孔112 列的相鄰第一通孔112的中^通孔112與相鄰 M369613 參見第五圖，該第一通孔112的密度可以是4 第：通孔m的中心距離L1是U7毫米，“鄰^ 的中心距離L2是1.27絲，而且每行的一個第 的相鄰第一通孔〗12的中心距離也是127毫米。 12』侧 第-該第:舰112的密度可以是8倍，即每行兩相鄰 弟通孔112的中心距離L1是U7毫米，每列兩相鄰第 = 的中心距離L2也是1.27毫米’但是每行的一個第一通孔112 列的相鄰第一通孔112的中心距離L3是〇9〇毫米。 ”郇 參見第七圖，該第-通孔112的密度可以是^ ^通孔m的中娜和是U3絲，每列^鄰 的中〜距離L2也是1.13鼋米，但是每行的一個第一 列的相鄰—第一通孔112的中心距離u是_毫|。 2 /、相郇 該第一通孔112的密度還可以是更高的密度。 針盤200上的測試探針21〇很多是傾斜 ί: 測試探針210的傾斜，使上網 有ΐ 開—些，在製作上網格點組件110的所 處理灑針時，每一個針必定有一體^針’雜體 樣就可保證不同型號的針盤200上的每^ 3;這 與上上的—個彈性第—導電元^電接ίΐ。阿以 數量根據專用測試機的測試點數而定。表電，13j的 i!f〇trTm' Π〇ο各-個，下網格點組件13G上的第二通孔 】3 點數是10240點，則下網格點組件13 ^專式 導電元件m各有聰〇個。 上㈣-通孔132神性弟二 參見第三圖’是本創作的通用治具的—個 面或多於雙面的線路板伽、行測試。該通職具包括二 M369613 二具:。該上治具和下治具均包括上面 各兩個，在該線路板的正面和】和通用轉接裝置1〇〇 100來同時測試。 各用個針盤200和通用轉接裝置 131 接裝置_的下網格'點組件130上的第-導電元株 點數，上治具通用St二 具的下網格，如此設置上下治 機上使用。 在適配上述下網格點的通用轉接裝置的測試 以成;便，換線路板的製作’使下網格點有更多的備用點可 乂、擇和上雜點來按就近原則的佈線連接，可以將 二z 數的增加’即對於單面線路板的 口安& = =ί=ίΓ°各一個，下網格點=二ΐ ί ϊ ϊ 4 i 後按給定的規律和專用測試機的-個測試信“ I 製作轉換線路板120時，其反面的每個反面導電ί 對岸點組件m上設定的—組ν個點中的—個點位置 測^幾^式點數是_點，㈣，則下網格點組 上有_個導電點141，共有_組點，有難〇 二起’該底座140上的10240處3個點短接在—起分 耗測試錢導電線電連接。這樣下網格點組 、里疋專用測试機測试點數的Ν倍，這樣在作一此轉#& 10 M369613 - 選擇，轉換線路板120製作的難度會小I多。 -此理解的’上ΐ具和下治具的兩個下網格點組件上㈣-兀件的數量還可以根據需要進行分配，例如.卜、么目，上的弟一蜍迅 下網格點組件13G上的第二導電祕131數;^和下治具的兩個 測試點數，並且上治具和下治具的第二導電^ 用測試機的 例分配，如按照7 : 3或8 ·· 2或6 : 4等ζ 安給定的比 ，_參見第—圖和第三圖，下網格點組件130_2^^配。〜.. 兀件131兩頭略伸出下網格點組件13〇 而而彈性第一導電 -件130上的每個彈性第二導電元件131分難吏了網格點組 •反面==122和底座14〇上對應的導電點ΐ4ι有應的 參見第-圖和第三圖，上網格點組件i 2=，觸： 元件111尾部略伸出上網格點組件110的 2^性弟-導電 電點Ip的==11分別與轉換線路板m對應的正面導 參見第二圖’針盤200、上網格點組件11() 135、145，方便將它們安裝在一起。 15、125、 插座料爾連接的 月 細年 12 測试用轉接彈簧，，技術y进口、國創作專利“線路板 二導電元件13 利唬是ZL 2_咖_·6。彈性第 f方ί;如第八圖所示，上網-種 有導電微粒，由導電微粒和彈性ζ 的位置摻 元ί揭⑶。彈性絕緣板中摻加ϊΐ微和 Μ。竭吻職爾瓣爾， 11 M369613 低整個轉接裝置的高度的作用。 1來說’用於測試線路板專用測試機的通 即使疋很小的面積上也會遠遠的超過—萬 巧予的，淋點 的測試點數--對應起來就是二個本===測 的測試點數，賴作將^^路定Ht"測試機内 格點組件⑽、轉換線路板⑽、下網格點通過針盤·、上網 實現將待測試線路板4GG或40(Τ的測1输& f座140就可以 試點數實現—對應的電連接，而要Ϊίί π /]試機的測 間短，價格也比較低，因此使用者爯/、衣作起來化費時 作習知技:專關試機的線盤花f時間長起通㈣試機和製 免以施例僅表達了本創作的優選實施方式，t描述較為呈奸和 :可==通:以ΐ不脫離本創作:二= 凡跟本創作專 圍的涵蓋範圍。 寸沒均應屬於本創作專利範 【圖式簡單說明】 第和 _試 M369613 嶋训上通孔 點組件加上通孔 地卿10上通孔 第八用轉繼的下網格點組件採用 112的密度 112的密度 112的密度 彈性絕緣板及導 【主要元件符號說明】 轉接裝置100 第—導電元件111 轉換線路板120 反面導電點122 弟一導電元件;[31 針盤200 底座140 向外延伸的部位146 定位孔 205、115、125、135 上網格點組件110 第一通孔112 正面導電點121 下網格點組件130 第二通孔132 測試探針210 導電點141 插座點147 145測試線路板400、400 13The grid element extends through the lower surface of the conductive element to form a good electrical contact; and /3⁄4, 兮L -:: ΐ ;;: ΐ ΐ Ι - Ι - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - - , the board, the lower net, the conversion line wire point through the inside of the base guide, the present invention also provides a test circuit board, the fixture includes the upper side of the circuit board respectively; and; The fixture 'the fixture includes the above-mentioned dial and the universal adapter> the mouthpiece; the upper fixture and the second fixture in the universal fixture of the creation, the second conductive component on the common part of the lower fixture The number of the lower grid points of the pass-through device of the lower grid point group j of the dedicated set is greater than or equal to the number of the test points of the dedicated test machine - half. The number of guides (four) is greater than or equal to -4. In the universal fixture of the creation, the lower net of the lower fixture; #=piece=number is equal to the second conductivity of the test point of the special test machine. The N-th conductive element of the grid point component is an integer of two, and a socket point connection on the corresponding seat; ",, -, ,, and, and the number of each set and the bottom test device is equal to the The number of defects in the special bait, and the upper M369613 'Second conductive element seam is allocated according to a given ratio. The connection device and the general purpose: the purpose of the test circuit board is dedicated to the test circuit board. The special-purpose base of the universal adapter has a similar function, and the device has a disk corresponding to the circuit board to be tested ===, and the road plate only needs the elasticity used by the female fixture. The component can be reversed, the conversion circuit board will be the grid of the test points it has, and the number of points and the tens of thousands or hundreds of thousands of special test elastic bases will be seen on the universal test machine. Correspondence relationship. Conversion _^=== thousand of thousands of points. Read and use of conventional technology equipped with composite test equipment The shortening is required; compared with the conventional technology universal test machine, the time is much cheaper than the test machine.{ 通用Using the universal grid of the universal adapter to set the generality of @ f L ίί ? The jig will be the corresponding general-purpose transfer of the sputum, and the total number of points of the sputum and the test machine is the same or the number of grid points under the lower net f is half of the total number of points of the job machine = For the application adapter - the number of points; = the spring connection of the wire is - in, with the point made by === and the base through the belt, the wire of the bomb, the combination of the metal particles and the rubber = metal micro - The conductive element under the block slightly protrudes from the reverse side of the lower grid point. There is a circuit board on the base. The circuit board has M369613 = 'conductive point through the line inside the circuit board and the socket point and the base group. The secret point feeding element Wei Kebian inserts the ship grid point [Embodiment] The following is a detailed description of the creation in conjunction with the drawings. The dial 200 of the pass 210 of the test machine and the test signal conductive line (the figure is marked昼=).g === circuit board _ or 40 (T production, different models of circuit boards 4 〇〇 t pairs , $ test dial 2 () (), so that the · probe 21 () of the dial is the same: the number of test circuit boards to be tested. The number of pilots is less than the dedicated test machine universal transfer device 100 includes multiple Elastic first-conducting belt=component, conversion circuit board 12〇, multiple elastic second-piece grid assembly 13〇 and base just. All elastic first conductive elements, lower, and horizontal, in rows and columns Distributed in each of the first through holes 112 = L brother + ¥% (read 131 distributed in the lower exposure member (10), the front and back sides are provided with a plurality of front conductive points: and the reverse side; = 22 'converted circuit board 120 front The position of the conductive dot 121 and the elastic first-conducting unit 111 where the test probe 210 is in contact i"-, -:. Base H. On the upper and lower grid point components two = (two) = ^ ΐϊ; ; ^2r ^ 141 double mile, the stop surface 钕甩 point 反 reverse conductive point 122 mouth, ^ ^ ^ special number 1,> test probe 210 The number is smaller than the number of elastic first conductive members =, '^ two elements 131. The power saver 111, the first conductive 400 side test probe 210 head is placed on the circuit board 400 to be tested or the electric job upper assembly 110 is under the dial 2, and the M369613 tail on the dial Slightly on the miscellaneous pieces 11G field lying hodge - conductive elements asked fi circuit board 120 recorded grid point component 110 f under the grid point component 130 two f · located below the lower grid point component 130 'base 140111 In the special test machine, the number of sockets 147, 11 is over the socket point 147 and the dedicated test ίο corresponds to the elastic second conductive element 131 on the grid component 13G. The corresponding conductive point 141 - electrical contact Connected, the conductive points on the New 14 Μ Ϊ Ϊ 与 与 147 147 147 147 147 147 147 147 147 147 147 147 147 147 147 147 147 147 147 147 147 147 147 147 147 147 147 147 147 147 147 147 147 147 147 147 147 147 147 147 147 147 147 147 Each of the test signal wires drawn from the machine is electrically connected to the test line by an open circuit or the like. Alternatively, the lower grid point may also electrically connect the i-seat 147 conductive connection, and the f-switched circuit board 120 on the base is omitted according to the circuit board to be tested 4〇〇 or 4〇 (r surface ΐ 不 = not up-conversion line (four) two Ίϊίίί, after the conversion of the line, 'successfully enters on the authoritative test machine. 3= ί No need to re-create the reel or use the Wanguan test machine. On the item (4), and the S point on the Internet === the test device, The density of the grid grid points is the same. For the measurement of the twist and the composite hole 112, see the fourth figure. The center distance L1 3 of the first through hole 112 is the same, that is, two phases per line. The center distance L2 of the neighbor is also 2 54 millimeters of 'm's two adjacent first through holes 112 of the adjacent first through holes 112 of the middle through holes 112 and adjacent M369613 see the fifth figure, the first The density of the through holes 112 may be 4: the center distance L1 of the through holes m is U7 mm, and the center distance L2 of the adjacent ^ is 1.27 filaments, and the center distance of one first adjacent first through hole 12 of each row It is also 127 mm. 12′′ side-the first: the density of the ship 112 can be 8 times, that is, the center distance L1 of the two adjacent brothers 112 in each row is U7 The center distance L2 of two adjacent sides of each column is also 1.27 mm' but the center distance L3 of the adjacent first through holes 112 of one row of the first through holes 112 of each row is 〇9 mm. For example, the density of the first through-holes 112 may be ^· and the U3 filaments of the through-holes m, and the middle-distance L2 of each column is also 1.13 mm, but the adjacent one of the first columns of each row The central distance u of the first through hole 112 is _ milli |. 2 /, the density of the first through hole 112 may also be a higher density. The test probe 21 on the dial 200 is mostly tilted ί : The inclination of the test probe 210 is such that the Internet is opened. Some of the needles of the grid point assembly 110 must have an integrated needle to ensure different types of dials. Each of the two on the 200; this is electrically connected to the upper-elastic first-conducting element ^. The number of the A-Issue depends on the number of test points of the special test machine. Table power, 13j i!f〇trTm' Π 〇ο each, the second through hole on the lower grid point component 13G] 3 points is 10240 points, then the lower grid point component 13 ^ specialized conductive elements m each have a smart On (4)-through-hole 132 divine brother II, see the third picture 'is the general fixture of this creation - one side or more than two-sided circuit board gamma, line test. The general tool includes two M369613 two:. The upper fixture and the lower fixture each include the above two, and are tested simultaneously on the front side of the circuit board and the universal switching device 1100. Each of the dial 200 and the universal switching device 131 is connected to the device. The lower grid of the lower grid 'point component 130', the number of points of the first conductive element, and the lower grid of the upper part of the upper fixture, so set up on the upper and lower machine. In the adaptation of the above-mentioned lower grid point of the universal adapter device test; then, the production of the circuit board to make the next grid point have more spare points to select, select and add noise to the principle of proximity Wiring connection, you can increase the number of two z's, that is, for the single-sided board's mouth and & = = ί=ίΓ° each, the lower grid point = two ΐ ί ϊ i 4 i and then according to the given law and A test letter of the special test machine "I. When the conversion circuit board 120 is made, each reverse side of the reverse side is electrically conductive. ί is set on the opposite point component m - the position of the group of ν points is measured. Yes _ point, (four), then there are _ a conductive point 141 on the grid point group, there are _ group points, there are two difficult points, and the 3240 points on the base 140 are short-circuited at the beginning of the consumption test. The line is electrically connected. In this way, the number of test points of the lower grid point group and the special test machine of the Lieutenant is doubled, so that the selection of the switch ###amp; 10 M369613 - selection, the difficulty of converting the circuit board 120 is small. - This understanding of the 'two lower grid point components on the upper and lower fixtures (four) - the number of pieces can also be allocated according to needs, for example. , 目目, the younger brother, the number of the second conductive secret 131 on the grid point component 13G; ^ and the two test points of the lower fixture, and the second fixture of the upper fixture and the lower fixture ^ Use the test machine's example assignment, such as according to 7: 3 or 8 · · 2 or 6 : 4 etc. given the ratio, _ see the first and third figures, the lower grid point component 130_2 ^ ^ match. The two ends of the element 131 slightly protrude from the lower grid point assembly 13 and each of the elastic second conductive elements 131 on the elastic first conductive member 130 is difficult to divide the grid point group • the reverse side == 122 and the base The corresponding conductive point 〇4ι on the 14〇 has the following reference to the first and third figures, the upper grid point component i 2=, touch: the tail of the element 111 slightly protrudes from the upper grid point component 110 The front side of Ip==11 corresponding to the conversion board m, respectively, see the second figure 'the dial 200, the upper grid point components 11 () 135, 145, to facilitate their installation together. 15, 125, socket connection The monthly fine 12 test with the adapter spring, the technology y import, the national creation patent "the circuit board two conductive components 13 Li Wei is ZL 2_ coffee _·6. Elastic f-th ί; as shown in the eighth figure, the Internet - has conductive particles, which are exposed by the position of conductive particles and elastic ( (3). The elastic insulating plate is doped with yttrium and yttrium. Exhausted to the erection, 11 M369613 low the effect of the height of the entire adapter. 1] 'The tester used to test the circuit board will even exceed the area of a small area, even if it is small, the number of test points of the shower point is corresponding to two copies === Test the number of test points, relying on ^^路定Ht" test machine grid point component (10), conversion circuit board (10), lower grid point through the dial, and the Internet to achieve the test circuit board 4GG or 40 (Τ measured 1 lose & f block 140 can be achieved by pilot number - the corresponding electrical connection, and the test room of Ϊ ίί π /] test machine is short, the price is relatively low, so the user 爯 /, clothing made up time-consuming Technology: The thread of the special test machine takes a long time to start (4) Test machine and system exemption only expresses the preferred implementation of this creation, t describes more sinister and: == pass: ΐ does not leave this Creation: 2 = The scope of coverage of this creation. The inch should not belong to this creation patent model [Simple description of the diagram] The first and the _ test M369613 The training of the through hole point component plus Tong Kong Diqing 10 The eighth hole of the hole is used to rotate the lower grid point component by using a density 112 of density 112 of the density of the elastic insulating plate and the guide [ Description of the symbol of the component] Transfer device 100 - Conductive component 111 Switching circuit board 120 Reverse conductive point 122 Younger conductive component; [31 dial 200 Base 140 Extending portion 146 Positioning holes 205, 115, 125, 135 Grid assembly 110 first through hole 112 front conductive point 121 lower grid point assembly 130 second through hole 132 test probe 210 conductive point 141 socket point 147 145 test circuit board 400, 400 13