TWM366679U - Infrared lens eccentric testing device - Google Patents

Description

M366679 V. New description: [New technical field] This creation is related to an eccentric test device, especially an infrared lens eccentric test device, which can be quickly detected, with high precision, simple device and low cost, and can be measured differently. Bands and infrared detection are not subject to external light interference and other advantages and effects. [Prior Art]

The techniques of the center of the visible lens and the eccentricity measurement are quite mature. As for the infrared ray in the invisible area, _ can not be seen, plus the infrared wave # _ professional talents lack of 'resources are relatively small, relative The difficulty is even higher. Now the production of the infrared pro-strip is to make the amount of "5" times more than the amount of the super-measurement, the thickness of the outer edge of the microscope test, the thickness of the outer edge is measured by a total of three 2, to determine its 34 amount 'this kind of qualified finished product The method is very uneconomical, and the township has twice the quality of the product, the fine sound of the law, the word eight, the two methods, the mechanical measurement, the special 3, the amount of shame, the recording of money, and the special solution. There is a limit to its existence. As for the traditional interferometer, the adjustment and the optical axis of the lens are experienced by the _HW gamma complex, which requires money, and the amount of money touches the single-drying W-structure. The lens to be tested needs to be rotated 18 〇 early detection accuracy Although ¥-moving, etc., will affect the use of software error correction, but the correction effect is limited. 3 M366679 In view of this, it is necessary to develop a technique that can solve the above disadvantages. [New content] The purpose of the new model is to provide an infrared lens eccentricity test device, which has the functions of quick system, high precision S, low device count, low-measurement of different wavelength bands, and infrared detection of undisturbed line interference. . In particular, the problems to be solved by the present invention include the inability to detect infrared lenses quickly, accurately and simply. ’

The technical means for solving the above-mentioned f-picking method provides a red light lens partial testing device, which comprises: the second testing portion has a light-transmitting reference surface; the virtual axis has a virtual axis, and the test paste is set again. The light-transmitting correcting member and the light-transmitting member-to-be-tested member have a human-surface and a penetrating surface coaxially connected from the emitting surface and the light-transmitting reference surface. The light-receiving device can be rotated at least twice at a distance of 10 degrees each time. The light-receiving device is provided with a light-emitting device and a green light. Recording that 'the light passes through the combination and the light-transmitting reference surface, and can illuminate the incident surface of the light-transmitting correcting member and the light-transmitting test object and reflect out - perpendicular to the person Rotation - sub-heart μ; (d) - Jud, and consider the light to be measured, and the 'light' and the third plane of light from the plane through the plane to form a third light; Receiving the second light, and confirming that the first light 4 M366679 is perpendicular to the light-transmitting reference surface and the incident surface; ★-the second detecting unit The system can move at least between the original position, the first position, and the -f position; and receive the two third rays respectively, and then take the average value of the displacement of the second detecting portion to obtain the dragon through The amount of eccentricity of the light parts. The above objects and advantages of the present invention are obtained from the detailed description of the embodiments described below and the accompanying drawings. The following examples are described in detail with reference to the drawings: [Embodiment] This creation is an infrared lens partial (four) test device, the first, second, third and ninth figures of money, including: a test portion 1G has a light-transmitting reference surface (9); and has a virtual axis ～X test portion 1G for setting—a light-transmitting correction member and a light-transmitting test object 10B ❸ one of the light-correcting corrections The member 1A and the light-transmitting device to be tested each have a person's face 111 and a penetrating face 112, and the incident face m is coaxially coupled with the light-transmitting test face 101, and the light-transmitting test piece U can be The test portion has the virtual axis X as an axis, and is rotated at least twice (refer to the fourth and the strong image) at intervals of 180 degrees. - The light-emitting portion 20 is provided with a light-emitting device 21 and a light-collecting mirror 22 The illuminating device 21 emits a first light ray 211; the first light ray 211 passes through the light combining mirror 22 and the light transmission reference φ 1 (Π, * can be irradiated to the light transmitting correcting member ι 〇Α Transmitting the incident surface η丨 of the 1GB of the test piece 1GB, and reflecting a second light ray 212 perpendicular to the incident surface 111; and Turning 5 M366679 into a process of '5 Xuan ray 211 and passing through the penetration surface 112 from the incident surface Hi to form a third ray 213 (see the fourth and seventh figures); The portion 30 is configured to receive the second light ray 212, and confirm that the first light ray 211 is perpendicular to the light-transmitting reference surface ι and the incident surface lu; a second detecting portion 40 is at least The original position p〇, a first position P1 and a second position P2 (refer to the sixth figure) are moved; and the two third rays 213 are respectively received; and the displacement of the second detecting unit 4〇 is averaged The value of the eccentricity of the light-transmitting test piece 10B can be obtained. In practice, the light-transmitting correcting member 10A can be an infrared optical plate. The light-transmitting test object 10B can be an infrared (flat) lens. The illuminating device 2 is one of the visible light laser system and the red laser light source of the Jixian County. The creation includes:

(5) - Control unit 50, which is connected to the test unit 1Q, the light-emitting unit 2A, the first detecting unit 30 without the second detecting unit 4G, and the hybrid unit % is provided with: a moving multiplexer 5 For receiving the displacement amount generated by the second detecting unit in different positions; the analog/digital converter 52' is configured to convert the displacement generated by the second detecting unit 40 at different positions from the analog signal to Digital signal; „:53' can be an 8051 single-chip processor: the early function of the same function is suppressed. 'Turning the Jinglin 2 detection unit 4G in the 砰 position mobile production 6 M366679 The displacement (transformed into digital signal) The average value is calculated to obtain the eccentricity of the light-transmitting test object 11. [b] The sliding device 60 includes: a slide 61; a slide seat 62 coupled to the second detecting portion 4 In other words, the slide seat 62 can slide on the slide 61; and the second detecting unit 40 can be moved to a predetermined position. The actual use of the present invention includes the adjustment and testing process: • #阅第In the first and second figures, the portion of the correction process is such that the incident surface 111 of the light-transmitting correcting member 10A is positioned in the test portion 1 On the light-transmitting reference surface (9), the light-emitting device 21 is activated to mistakenly see the light, and the first light 211 can be emitted by using the laser light source or directly using the infrared laser light source. 22, the light-transmitting reference surface 1〇1 is irradiated to the hidden incident surface m of the light-transmitting correcting member, and the second light ray 212 is reflected-path; if the first detecting unit receives the second light ray 212, it represents The first light ray 211 is perpendicular to the light-transmitting-reference surface 101 and the input ηι; otherwise, the position of the test portion 10 and the light-emitting device 21 needs to be adjusted until the calibration is completed. • Of course, the first The light 211 also passes through the through surface 112 through the incident surface 111 to illuminate the third light 213, which is coaxial with the first light 211 and is located on the same axis (also referred to as the original position P〇). The second detecting unit 4 receives the 'double confirmation confirmation result. Referring to the second, fourth and fifth figures, the part of the testing process is the device used in the calibration process, and only the light-transmitting correction member is taken off. Replace with light to be used 7 M366679 piece 10B (can be infrared flat convex ), the light-emitting surface 111 on the side of the light-transmitting test object is also positioned on the light-transmitting reference * 101, and the correction process is repeated, and the light/light 211 is simultaneously confirmed with the light-transmitting reference surface and the light-transmitting test object. (10) The incident surface 111 is vertical. Because the apex of the transparent surface of the transparent member to be tested 丨GB may not be coaxial with the virtual axis (as shown in the fourth figure, the apex of the penetration surface m may be Is the eccentric point A) eccentric with the virtual axis X, so when the first light 211 passes through the incident surface (1)

When the third light ray 213 is irradiated through the through surface m', the third wire 213 is offset (as shown in the fifth and fifth figures), and the second detecting portion 40 may be adjusted at this time - The second angle 213 is received by the first angle (for example, from the original position p on the slide 61 to the first position P1), and the second detection unit 4 can be recorded by the control early 50 ( The amount of displacement. Continue to rotate the light-transmitting test piece ι twice every (10) degrees (as shown in the sixth, seventh and eighth circles after the first rotation, and back to the original position in the second time as the third, the first 4 and 5), and with the transmission of the test piece 1GB per revolution - and can be = the first reading knowing portion 4 is adjusted from the first angle Μ to the second angle (10) to participate in the eighth figure) Then adjust back (that is, adjust from the first position P1 to the second = P2 and then adjust back to the first position, and finally, the control unit (4) averages the displacements of the two, and the light transmission test piece can be measured. The amount of eccentricity. Of course, it is only _, the official operation of Ke Cai's transparent test piece / and change the number of rotations to save inspection _ (if the light is to be tested), or improve the detection accuracy (Assume to apply in precise optics for 8 M366679

The advantages and effects of this creation can be summarized as follows: = Quick detection. After quickly completing the calibration, just open the 'outside riding_tree light parts, and cook (10) rotate the surface every 2 times (10), then ride the second detection department to receive the eccentric riding bee. The infrared laser, and the second detection department moves and moves to take the average value, that is, the eccentricity and quantity of the transparent measurement piece are known, and the detection process is very fast. 2] High precision. The _mainly illuminates the light-transmitting device to be tested on the test portion by the illuminating device and moves the second detecting portion to operate the infrared laser from the eccentric illuminating ridge on the transparent measuring member (illuminated on the second detecting portion) "Point,,", and finally the amount of the second inspection unit is Ping Cong is the eccentricity of the transparent parts, the whole process is calculated by the control unit, and the infrared laser irradiation is on the second detection department. The point is "," so the accuracy of the test is extremely high. ... [3] The unit 0 has a low cost. The main devices of this creation are only the light source, the light mirror, the test unit, the two detection units and a control unit. It can be a well-known device, so the device is simple and low cost. [4] The Co-band lens can be measured. This is based on the measurement of the sister, and the different wavelengths of the lens will make the light source produce different eccentricity, different wavelengths of light source. It will also produce non-eccentricity and quantity on the same-lens. Therefore, it is possible to measure the different wavelengths of the lens by replacing the light source and the detector of different wavelength bands. [5] The infrared detection is not interfered by external light. Use M366679 ==_, it is more convenient to view, but the field Necessity of darkness to avoid the outer day = line ^ _) or non-ferrous shot (infrared), when the visible light ^ | 丨 does not cross the external light interference, can be directly detected in the bright detection site, so the detection process is not subject to external light Interference. Any simple modifications and variations to this embodiment are intended to be removed from the spirit and scope of the present invention.

From the above detailed description, it will be apparent to those skilled in the art that the present invention can achieve the above-mentioned objects, and has been in compliance with the general-purpose mosquito and grade-salt patent applications. BRIEF DESCRIPTION OF THE DRAWINGS The first diagram is a schematic diagram of the apparatus for the calibration process of the present invention. The second diagram is the plan view of the first diagram. The third diagram is the schematic diagram of the first operational state of some devices of the detection process of the present creation. 4 is a magnified schematic view of a portion of the structure of the third diagram. The fifth diagram is a plan view of the third diagram. The sixth diagram is a schematic diagram of the second operational state of a portion of the apparatus of the present invention. Figure 8 is a plan view of a portion of the structure of the figure. The ninth figure is a block diagram of the preferred embodiment of the present invention. M366679 [Description of main component symbols]

10 test portion 10A light-transmitting correcting member 111 incident surface 20 light-emitting portion 211 first light 213 third light 30 first detecting portion 50 control unit 52 analog/digital converter 60 sliding device 62 slide seat A eccentric point P1 first Position 第一1 first angle 101 light-transmitting reference surface 10B light-transmitting test object 112 penetration surface 21 light-emitting device 212 second light 22 condensing mirror 40 second detecting portion 51 multiplexer 53 processor 61 slide X virtual axis Heart P0 original position P2 second position Θ 2 second angle 11

Claims (1)

M366679 VI. Patent application scope: 1 infrared lens eccentricity test device, comprising: - a test part having a light-transmitting reference surface; having a virtual axis, the test part is used for setting - a transparent element and - one of the light-transmitting test pieces - the light-transmitting correcting member and the light-transmitting test object each have an incident surface and a penetrating surface 4, the human emitting surface and the 9 light-transmitting reference surface are coaxially connected, and the light-transmitting is to be The measuring component can be on the measuring scale with the virtual axis ^ as the axis, at least _ twice at intervals of 180 degrees; - the light emitting portion is configured to - the light emitting device and the light combining mirror, the light emitting device is issued with u a first light passing through the light combining mirror and the light transmitting reference surface, and irradiating to an incident surface of one of the light transmitting correcting member and the light transmitting detecting member, and reflecting a perpendicular to the incident surface a second light of the surface; and the first light ray passes through the through surface from the incident surface to form a third light every time the light-transmitting test object rotates - the first detecting portion; Receiving the second light, and confirming the first light system and the light-transmitting reference surface and the incident The second detecting portion is movable at least between an original position, a first position and a first position; and receives the two third rays respectively; and the displacement of the first detecting portion By averaging, the eccentricity of the light-transmitting test piece is obtained. 0 2 · For the infrared lens-biased wm device according to item 1, wherein: 12 5 丨 Test set The slide seat can be used to slide the predetermined position. The M366679 5 ray light-correcting member may be an infrared optical plate; the light-transmitting device to be tested may be an infrared lens. 3, such as the infrared lens eccentricity testing device described in the first paragraph of the "Zhao patent range," the eight-inch illuminating device is one of a visible light laser source and an infrared laser source. 4 · If applying for patent infrared The lens biasing test device, the eight-individually includes a control unit, and is provided with: multiplexing for receiving the displacement of the second detecting portion at different positions; - analog/digital converter for using the second The amount of rotation generated by the detecting unit at different positions is converted to a digital signal by the domain; the portion is processed by the single-chip wafer 11, and the ribs calculate the displacement amount generated by the second detecting and the different positions to calculate the average value. The eccentricity of the infrared ray lens according to the first aspect of the invention is as follows: the eccentricity measurement of the infrared lens according to the first aspect of the invention: the sliding device further comprises: a sliding device; The second detecting unit slides on the track; and the second detecting unit moves to 13