M327479 八、新型說明： 【新型所屬之技術領域】 本創作係與測試裝置有關，特別是指一種測試液晶顯 示面板的模組裝置。 ' 【先前技術】 15 一般液晶顯示器製造階段，包括形成驅動線路的陣列 製程階段、產生光學色階的渡光片製程階段以及形成顯示 元件的面板整合階段等，於重要製程條件中多有對應輔助 =測試工程則貞測製程缺陷避免影響後段製程，才能有效 掌控製程因素以提升製程效率及產品良率；尤其在液晶顯 示器越趨高晝素的需求下，伴隨為高密集度的線路佈設， 使顯不器面板中驅動晝素的電極線路更為高精密度的製程 技術’-旦製程中有電極線路的製程不良現象，如顯影或 烟過程因製程條件控制不良或異物污染所造成的短路或 開路缺陷’則導致顯示器產品有亮點或暗點的顯示缺陷， $於陣列製雜段及面板整合階段皆有針對電極線路的測 試工程。 為例，為—種於玻璃基板1上藉由測試 為口、i日二旦哭/Γ進行缺陷偵測的測試工程，玻璃基板1 二口 Γ:p列製程階段的陣列側玻璃或面板整合階 板！邊緣之周邊線路*分佈於玻璃基 与後查去π 101 區1〇2’周邊線路區102具有複數條與 ^晝素£ ΚΗ之電極線路電性連接之 短路桿11、12末顺設_試㈣、14，/供職治具t 4 20 M327479 之探針20對應點觸；由於影像晝素區仙 電極線路未連接至相同之短路桿u或15，1 狀兩條 2之探針2G電性連接該些短路桿n =將測試治具 程短路缺陷時，即可將短& 田目卻線路有製 5可傳送賴台治具2 電極線路進行短路賴。 H賴麵基板1之 佈於玻璃基短路測試條件時，分 10 及周邊線路區302，周邊绩敗f ===畫路r❶1之電極線 5測試墊33、34，龙中，在32所對應電性連接之 之短路浐3〗4 *周邊線路區302上較為密集分佈 科座心Γ击 相闕距需更為縮減，該些短路桿31所 ，應電性連接之戦墊33亦設置為交互錯位方式，才不致斤 方式受到測試墊本身既定面積限制而需佔用 二第1所°搬更多的空間；如此在測試過程一般則使用 座二ΓΛ 測試治具2, ’係具有一座體21以及設置於M327479 VIII. New description: [New technical field] This creation is related to test equipment, especially a modular device for testing liquid crystal display panels. [Prior Art] 15 General liquid crystal display manufacturing stage, including the array process stage of forming the driving line, the process stage of the optical film generating the optical color gradation, and the panel integration stage of forming the display element, etc., and corresponding auxiliary in important process conditions = Test engineering measures the process defects to avoid affecting the back-end process, in order to effectively control the process factors to improve process efficiency and product yield; especially in the demand for high-density LCDs, accompanied by high-density circuit layout, The electrode circuit that drives the halogen in the panel is more high-precision process technology. - The process of electrode circuit is poor in the process, such as short circuit or open circuit caused by poor control of process conditions or foreign matter during development or smoke process. The defect 'causes the display product to have bright or dark display defects, and there are test projects for the electrode line in the array segment and the panel integration stage. For example, a test project for detecting defects on a glass substrate 1 by testing the mouth, i day crying/deaming, glass substrate 1 two-port: array side glass or panel integration in the p-stage process stage Step board! The peripheral line of the edge* is distributed on the glass base and the π 101 area 1〇2' peripheral line area 102 has a plurality of short-circuit bars 11 and 12 electrically connected to the electrode line of the electrode. (4), 14, /, service fixture t 4 20 M327479 probe 20 corresponding to touch; because the image of the pixel area is not connected to the same short rod u or 15, 1 type 2 2 probe 2G electrical Connecting the short-circuiting rods n = When the test fixture is short-circuited, the short & field can be routed to the 5 electrode line for short-circuiting. When the substrate of the H-surface substrate 1 is placed under the glass-based short-circuit test condition, it is divided into 10 and the peripheral circuit region 302, and the peripheral performance is f === the electrode line 5 of the drawing circuit r❶1, the test pads 33, 34, the dragon, corresponding to 32 Short circuit of electrical connection 浐3〗 4 * The densely distributed section of the surrounding line area 302 needs to be further reduced. The shorting bars 31 are also electrically connected to the cymbal pad 33. The method of interactive misplacement is not subject to the limited area of the test pad itself and needs to occupy two first places to move more space; in this case, the test procedure is generally used to test the fixture 2, 'the system has a body 21 And set to
Mm /之一^電路板22與多數個不同長度之前、後 、制二轨3 ’該些极針23即對應將玻璃基板3上交互錯位之 33刀別電性連接該電路板Μ，可透過電路板22及 各探針23傳遞測試機台所送出之短路測試訊號至對應之短 20 M327479 路桿，因此該些探針23製作上便 計’然對應於高精密度線路所使用的同為設 而言，並無法很方便的由探針製作商所供應=二= 針自行做修改以應用於測試治且， 乂式才木 5提供不同規格的探針，如此則静“二:針製作商 路規格後才能提出探針的設測試線 具整越製作交期，且探針額外的規格設計:Ϊ 了成本支出’皆大幅降低了測試上 ) 【新型内容】 15 板二且本二作之主要目的乃在於提供-種液晶顯示面 面ΓΓ規格形式探針應用於不同短路測試 生產ί本 有效縮短測試·之製作交期及降低其 測試二=的，本創作所提供之-種液晶顯示面板 連接多數個探針及與各該探針電性 ，擇之電路板，該座體設有至少一定位 座，該定位座之底面銜接於該座一曰 有相鄰特定間距之多數個凹縫二凹設 少—定位座與财㈣評Γ n座分別鄰近該至 抵止部及二止部’===== 20 M327479 隔座二座’使各該針身抵止於其中-該間 針尖穿設該至少—定位座之凹縫並凸 因此各該間隔座之嵌溝與凸部可將該些探針之 π斜2後分射抵於第—及第二間隔座，並造成相鄰各 才木針之針哭形成有前後之錯位。 【實施方式】 以下，絲配合若干圖式列舉一最佳實施例，用以對本 10創作之組成構件及功效作進一步說明，其中所用各圖式之 簡要說明如下： 第四圖係本創作所提供最佳實施例之分解立體圖； 第五及第六圖係上述最佳實施例不同視角之組合立體 圖； * 15 第七圖係第六圖中7-7連線剖視圖； 第八圖係上述最佳實施例部分結構之組合立體圖，顯 示探針與各定位座及間隔座之組合態樣； 第九圖係第八圖之側視圖； 請參閱如第四至第七圖所示，為本創作第一較佳實施 例所提供之一液晶顯示面板測試模組4，係供以接收電測機 台所送出之測試訊號於顯示面板測試短路缺陷，包括有_ 座體40以及容置於該座體40中之多數個探針50、一電路 板60及多數條導線70，其中： M327479 該胃座體4 〇兩端區分有一前、後緣4 〇卜4 〇 2，該些探針 刈及導線70分別外露於該座體4〇之前、後緣4(η、4〇2， 4座，40具有—容置部41、一承載部42，並設有一第一 及第一定位座43、44、一第一及一第二間隔座45、46、 5 、支撐座47以及一卡板48，該容置部41及該承載部42 分別為放置該些探針5〇及該電路板60之空間，該二定位 座43、=4及間隔座45、46為如陶竟材料等具良好絕緣特 陡=材貝所製成，該第一定位座43設於該前緣4〇1，該第 一疋位座44鄰接該電路板6〇，配合第四及第五圖參照，各 1〇该疋位座43、44具有相對之_頂面431、441及一底面432、 442，各該底面432、442銜接於該座體4〇，各該頂面々η、 441凹設有相鄰特定間距之多數個凹縫433、糾3，供以穿 设各該探針50，該第一間隔座45設於該容置部41鄰接該 第一定位座43，該第二間隔座46設於該支撐座47以藉由 15該支撐座47固定於該電路板60上，使該第二間隔座46對 應位於該第二定位座44之頂面441上，各該間隔座45、46 與該操針50相鄰接之一侧面451、461凹設有與該些凹縫 433、443相對應之多數個嵌溝452、462，相對於該些嵌溝 452、462即形成有多數個凸部453、463，該些嵌溝452、 2〇 462之相鄰間距等於該些凹縫433、443相鄰間距之2倍， 使相鄰二該凹縫433、443可分別對應於一該嵌溝452、462 及一該凸部453、463，該卡板48對應於該容置部41鎖固 於該座體40上，用以覆蓋該些探針50。 請配合如第七圖參照，該些探針50為具導電性之金屬 8 M327479 材質所製成’係相互並列設於該容置部41，各該探針5〇 具有扁長形之一針身51以及分別凸設於該針身兩端之一針 尖52與一針尾53 ,該針身51表面覆蓋有絕緣薄膜以避免 相鄰探針50之間的電性干擾，且該針身51與該座體4〇相 5接觸之接觸面上設有數個絕緣片54，更有效避免各該探針 5〇於傳輸測試訊號時發生不必要的漏電流現象，配合第八 及第九圖參照，該針身51兩端鄰近該針尖52及該針尾53 分別^有—前抵止部511及—後抵止部512,相鄰各該探針 5〇之前抵止部511交互抵止於該第一間隔座45之後溝452 1〇及凸部453 ’相鄰各該探針5〇之後抵止部512交互抵止於 該第二間隔座46之後溝462及凸部463，各該探針％之針 2 1及，53分別穿設該第一及第二定位座43、44之凹 15 如之照，該電路板60設於該座體 墊61、62辞此贷以 設有多數個第一及第二銲 53琴此f苐—銲墊61分難性連接各聰針之針尾 後一料62分別電性連接各該導線70，使該此導 傳送至==台所送出之測試訊號藉由該電路板 1 及身51前後卡抵於該第― 維持各該探針5。之橫二該43， 有該卡板48,形成對； “十身51上覆蓋 固定效用，使該==十身51於三個立體空間方向上的 二才木針50固定於該座體40之容置部41， 20 M327479 由於該第-及第二間隔座45、46之嵌溝松、462與凸部 5=63造成相鄰各該探針如形成有前後之錯位，可以該 52對應闕如第二圖所示玻璃基板3上相互錯位之 ::圖，相鄰測試墊為間隔-短路桿錯位的測試型 二’=爾差動訊號形式需藉由成對並行之路徑傳 :一产㈣要將特定接收各差動訊號對 同—嵌溝或凸部中，亦可有效應用於傳 遞差動HfL號至制液晶顯示面板。 測試作所，之測試模組可針對不同 更改定位座之:縫:間二依=顯示面板上測試墊之規格 =之探針結構用於製作測試』之::::二二 故舉二:上二 變化，理㈣為之等效結構 15 M327479 【圖式簡單說明】 第一圖係習用測試治具於顯示 之測試示意圖； 第二圖係另一短路測試型 器玻璃基板作短路测試 示意圖，· 態之顯示器玻璃基板之局部 f三圖係另—f用顺治具之結構示意圖’· ”本緩所提供最佳實闕之分解立體圖； 圖 .五及第六關上述最佳實施财同視肖之組合 10 第七圖係第六圖中7_7連線剖視圖；Mm / one ^ circuit board 22 with a plurality of different lengths before and after, two rails 3 'the poles 23 corresponding to the glass substrate 3 interdigitated 33 electrically connected to the board Μ, permeable The circuit board 22 and each of the probes 23 transmit the short-circuit test signal sent by the test machine to the corresponding short 20 M327479 road rod. Therefore, the probes 23 are manufactured to correspond to the same design used for the high-precision line. In fact, it is not convenient to be supplied by the probe manufacturer. === The needle is modified by itself to be applied to the test. Moreover, the type 5 probes of different specifications are provided, so the static “two: needle maker” After the specification of the road, the probe can be set up to test the delivery line, and the additional specification of the probe: the cost expenditure 'has greatly reduced the test.】 [New content] 15 board 2 and the second The main purpose is to provide a liquid crystal display panel. The probe is applied to different short-circuit test productions. This is effective to shorten the test delivery period and reduce the test. Connect most of the probes And the electrical circuit of each of the probes, the circuit board is provided with at least one positioning seat, and the bottom surface of the positioning seat is connected to the plurality of recesses and recesses of the seat with a certain adjacent spacing. Positioning seat and Cai (4) Evaluation n Blocks are adjacent to the abutting part and the second part respectively ====== 20 M327479 Two-seat two seats 'to make each needle body resist in it - the needle tip is worn at least - the recess of the positioning seat is convex and convex, so that the groove and the convex portion of each of the spacers can slant the two of the probes to the first and second spacers, and cause adjacent wooden needles The needle is crying to form a front and rear dislocation. [Embodiment] Hereinafter, a preferred embodiment will be described with reference to a plurality of drawings for further explaining the components and functions of the present creation, and a brief description of each of the drawings is as follows The fourth drawing is an exploded perspective view of the preferred embodiment provided by the present creation; the fifth and sixth figures are the combined perspective views of the different preferred embodiments of the above preferred embodiment; * 15 The seventh figure is the 7-7 connection in the sixth figure. Cross-sectional view; the eighth figure is a combined perspective view of the partial structure of the above preferred embodiment, The combination of the probe and the positioning base and the spacer; the ninth is a side view of the eighth figure; please refer to the fourth to seventh figures, which are provided for the first preferred embodiment of the present invention. A liquid crystal display panel test module 4 is configured to receive a test signal sent by the electrical test machine to test a short defect on the display panel, and includes a body 40 and a plurality of probes 50 accommodated in the base 40, A circuit board 60 and a plurality of wires 70, wherein: M327479 has two front and rear edges 4 〇 4 〇 2 at the two ends of the stomach seat body 4, and the probe 刈 and the wire 70 are respectively exposed to the seat body 〇 The front and rear edges 4 (η, 4〇2, 4, 40 have a receiving portion 41, a carrying portion 42, and a first and first positioning seats 43, 44, a first and a second interval The housings 45, 46, 5, the support base 47 and a card 48, the receiving portion 41 and the carrying portion 42 are spaces for placing the probes 5 and the circuit board 60, respectively. 4 and the spacers 45, 46 are made of a good insulating material such as ceramic material, etc., the first positioning seat 43 is disposed at the leading edge 4〇1, the first A mounting seat 44 is adjacent to the circuit board 6A. Referring to the fourth and fifth figures, each of the mounting seats 43, 44 has opposite top surfaces 431, 441 and a bottom surface 432, 442, each of the bottom surfaces 432. The 442 is connected to the base 4, and each of the top surfaces 々η and 441 is recessed with a plurality of recesses 433 and corrections 3 adjacent to a specific interval for penetrating the probes 50. The first spacers 45 are provided. The second spacer 46 is disposed on the support base 47 to be fixed to the circuit board 60 by the support base 47, so that the second spacer 46 is disposed on the support base 47. Corresponding to the top surface 441 of the second positioning seat 44, each of the spacers 45, 46 and one side surface 451, 461 adjacent to the operating pin 50 are recessed with a plurality of corresponding recesses 433, 443 The plurality of convex portions 453 and 462 are formed with respect to the plurality of concave grooves 452 and 462. The adjacent spacing between the concave grooves 452 and 2 462 is equal to the adjacent concave portions 433 and 443. 2 times the spacing, the two adjacent recesses 433, 443 can respectively correspond to a recessed groove 452, 462 and a convex portion 453, 463, and the latching plate 48 is locked to the receiving portion 41. The body 40 for covering the plurality of probe 50. Referring to FIG. 7 , the probes 50 are made of a conductive metal 8 M327479 material and are arranged side by side in the accommodating portion 41 . Each of the probes 5 〇 has a flat long needle. The body 51 and a needle tip 52 and a needle tail 53 respectively protruded from one end of the needle body, the surface of the needle body 51 is covered with an insulating film to avoid electrical interference between adjacent probes 50, and the needle body 51 and The plurality of insulating sheets 54 are disposed on the contact surface of the contact body 5 of the body 4, which is more effective for avoiding unnecessary leakage current when the probes 5 are transmitted during the test signal, and refer to the eighth and ninth drawings. The needle body 51 has a front end abutting portion 511 and a rear abutting portion 512 adjacent to the needle tip 52 and the needle tail 53 respectively, and the abutting portion 511 adjacent to each of the probes 5 交互 alternately abuts against the first portion After a spacer 45, the groove 452 1 〇 and the convex portion 453 ′ are adjacent to the probe 5 〇 and then the abutting portion 512 alternately abuts against the groove 462 and the convex portion 463 after the second spacer 46 , each of the probes The pins 2 1 and 53 respectively pass through the recesses 15 of the first and second positioning seats 43 and 44, and the circuit board 60 is disposed on the seat pads 61 and 62. The loan is provided with a plurality of first and second weldings 53. The bonding pad 61 is connected to each of the wires of the respective needles 62, and the wires 62 are electrically connected to the wires 70, respectively, so that the guiding is transmitted to the = = The test signal sent by the station is maintained by the board 1 and the body 51 to the front of the probe. The transverse direction of the 43 is such that the card 48 is formed to form a pair; "the ten body 51 is covered with a fixed utility, so that the ==10 body 51 is fixed to the seat body 40 in the three-dimensional space direction. The accommodating portions 41, 20 M327479 may be offset by the gap between the first and second spacers 45, 46, and the convex portion 5=63, so that the adjacent probes are formed with front and rear misalignment. For example, in the second figure, the glass substrate 3 is misaligned with each other:: the adjacent test pad is a test type of the gap-short-pole misalignment. The form of the differential signal is transmitted by a pair of parallel paths: a production (4) To specifically transmit the differential signals to the same groove or the convex portion, it can also be effectively applied to the transmission of the differential HfL number to the liquid crystal display panel. The test module can be modified for different positioning positions. :Sew: Between the two = the size of the test pad on the display panel = the probe structure used to make the test 』:::: two two slaps two: the last two changes, the rational (four) is the equivalent structure 15 M327479 Simple description] The first picture is a test schematic diagram of the test fixture used in the display; the second picture is another short circuit test. The glass substrate is used as a short-circuit test diagram, and the partial view of the glass substrate of the display is the same as that of the structure of the Shunzhi tool. The schematic diagram of the structure of the Shunzhi tool is provided. The above-mentioned best implementation of the above-mentioned best implementation of the same view of the combination of 10, the seventh figure is the cross-sectional view of the 7_7 line in the sixth picture;
第八®係上述最佳實施例部分結構之組合立體 不探針與各定位座及間隔座之組合鱗； 苐九圖係第八圖之侧視圖； M327479 【主要元件符號說明】 3玻璃基板 4測試模組 40座體 5 402後緣 42承載部 431、441 頂面 433、443 凹缝 45第一間隔座 ίο 452、462 嵌溝 46第二間隔座 48卡板 51針身 512後抵止部 15 53針尾 60電路板 62第二銲墊 33測試墊 401前緣 41容置部 43第一定位座 432、442 底面 44第二定位座 451、461 侧面 453、463 凸部 47支撐座 50探針 511前抵止部 52針尖 54絕緣片 61第一銲墊 70導線 12The eighth embodiment is a combination of the three-dimensional probe and the combination of the positioning base and the spacer; the side view of the eighth figure; M327479 [Main component symbol description] 3 glass substrate 4 Test module 40 seat body 5 402 rear edge 42 bearing portion 431, 441 top surface 433, 443 recess 45 first spacer ίο 452, 462 recessed groove 46 second spacer seat 48 card 51 needle body 512 rear abutment 15 53-pin 60 circuit board 62 second pad 33 test pad 401 leading edge 41 accommodating portion 43 first positioning seat 432, 442 bottom surface 44 second positioning seat 451, 461 side 453, 463 convex portion 47 support seat 50 probe 511 front abutting portion 52 tip 54 insulating sheet 61 first pad 70 wire 12