TWM273713U - Quality inspection device of electronic component - Google Patents

Description

M273713 Creation Instructions (1) [Technical Field to which the New Type belongs] This creation is about a quality inspection device for electronic components, especially regarding the use of a workstation's detection mode, and each station performs various flaw detection functions. [Prior technology] As shown in Figures 1 and 2, the appearance dimensions and surface flaw detection items of conventional electronic components are shown in the figure. "In terms of chip capacitance, its appearance size includes the full length of the chip capacitor ^ and the electrode length D2. , Electrode width D3, element body length D4, element body width D5 #, and its surface flaws include ... 1. Brightness and darkness inspections, such as stains, foreign matter adhesion, surface scratches; 2. Shape inspections, such as cuts, missing corners, The electrode is small, the electrode is large, and the total length is large; and 3. Color inspection, such as electrode discoloration, element body discoloration, and electrode absence. In the production process of electronic components, some electronic components inevitably produce the above-mentioned appearance dimensions and surface defects. Therefore, it is indeed necessary to further develop a testing device so that the factory can accurately screen and detect the electronic components to ensure product quality. Key :: In view of this, this creation uses a vibrating feeder, and cooperates with several dynamic cameras, several dynamic image manipulation cards, and several optical modules. The software with multiple execution functions performs fast calculations and high-speed inspections to screen out defective electronic components to achieve accurate detection and high detection efficiency. [New content] The main purpose of this creation is to provide a quality inspection device for electronic components, which uses a workstation to detect various types of flaws, and then performs a variety of flaw detections, and then captures dynamic images for high-speed detection, so that this creation has Promote

C: \ L0G0-5 \ FIVE C0NTINENTSNPK9631.ptd Page 5 M273713 4. Creation Instructions (2) The efficacy of detection accuracy and detection efficiency. 2 According to the quality detection device of the electronic components created by the second, it includes-loading, several workstations, several dynamic cameras, several computers, several moving shirt image capture cards and several nozzle discharge mechanisms. The loading carousel is used to transport :: child: pieces through each station in sequence. Each dynamic camera is used to capture you: 70 electronic images of the location of the station. The Xiao computer uses the motion image capture card to separately process the $ Gongnao discriminating task captured by each dynamic camera. When the electronic components of the workstation have defects, the job uses the nozzle discharge mechanism to blow and discharge the materials to remove the electronic components. No. If the computer judges that the electronic components of the Ren-Workstation meet the test, the turntable transports the electronic components to the next workstation for the next test. If it is tested at all workstations, the electronic component is judged to be a good product. [Embodiment] In order to make the above and other purposes, features, and advantages of this creation clearer, the following exemplifies the preferred embodiment of this creation and cooperates with the attached drawings', and the detailed description is as follows: 2nd 3rd As shown in Figure 4, the quality inspection of the electronic components of this creation consists of a vibrating feeder 1, a feeding turntable 2, several workstations = S6, several dynamic cameras CCD1 to "㈣, several computers to pc3" , ^ Dynamic image capture cards C1 to C6, several nozzle discharge mechanisms B1 to ⑽, one defective product recovery area F1 to F6, and one good product recovery area p. This creative factor workstation S1 to S6 method, each station judges Whether an electronic component 9 (such as a chip capacitor) has a defect in appearance or surface (as shown in Figures 丨 and 2 ^ No), and each electronic component 9 must pass through all workstations S1 to S6 and be inspected. Page 6 C: M0G0- 5 \ FIVE C0NTINENTS \ PK963J. Ptd M273713 IV. Creation Instructions (3) ---- Passing the test 'can be regarded as a good product. $ In order to achieve high-speed detection, this creation further uses computers with dual CPUs PC1 to PC3 and One software with multiple execution sequence functions b for fast calculation And high-speed inspection to screen out the defective products, so as to achieve accurate detection and high detection efficiency. Referring to Figures 3 and 4, the vibration feeder J of this creation can use the centrifugal force to rotate the electronic components 9 to a feed. Road 丨 丨, and then the gate at the feed channel 11 is automatically controlled to introduce the electronic component 9 into the loading carousel 2 at a fixed amount of time. The appropriate orientation of the loading carousel 2 is provided with six workstations sj to S6, and each workstation S1. To S6 have 6 sets of the dynamic cameras ccD1 to CCD6 and 6 nozzle discharge mechanisms ^ to ". The dynamic camera "^ to CCD6 can perform independent acquisition at random triggered acquisition timings, and transmit the image to six of the dynamic image acquisition cards ci to c 6. See Qingdi 4 as shown in Figure 4 'in order to achieve high speed Detection function, this creation uses several computers PC1 to PC3. The computers PC1 to PC3 are preferably computers with dual CPUs. At the same time, the computers pci to PC3 must be installed with software with multi-execution; ^ (Multithrend) functions in order to perform Fast calculation and processing. For this creation, three computers PCI, PC2, and PC3 are preferred. [1], the computer PC 1 is dedicated to the human-machine operating system, which is connected to a control machine 丨 〇 and the computer PC2 Between PC3 and PC3, the computer PC1 is used to interactively control the control machine 10 and the detection system, and display the detection status on a screen M1; [2], the computer PC2 is equipped with three of the dynamic image capture cards C1 to C3, which is dedicated to the detection function of the first, second, and third workstations S1 to S3, and displays the detection status on a screen M2; [3], the computer PC3 is also equipped with three of the dynamic image capture cards C4 to C6, It is dedicated to the fourth, fifth and sixth workstations S4 Detection of S6

M273713 IV. Creation Instructions (4) ------ Achieve this ’and also display the detection status in the heart of the glory. The computer and ... transmit the detection results to the computer PΠ, respectively, and then the computer PC1 controls a control machine 10 to perform the ancestor package removal operation. If any of the workstations S1 to S6 determines that they have any two defects, the nozzle discharge mechanism β1 to ㈣ will immediately blow out the air from the defective product recovery area η to? 6 Recover the bad mouth of the electronic component 9. Right after the electronic το component 9 passes all kinds of flaw detection inspections of 31 to%, it is regarded as a good product, and the good product of the electronic 7L component 9 is recovered from the good product recovery area p. The detection mechanisms of the workstations S1 to 56 will be described in further detail below. Please refer to FIG. 5, the first work station 81 of this creation uses a backlight rendering optical module 3, which includes a diffusion plate 31 and several! ^]) 32. The material turntable 2 is made of transparent glass and is used to carry electronic components 9. The LED 32 is used to illuminate, so that the diffuser plate 31 can provide the brightness required for high-speed photography of dynamic imaging. The diffusion plate 31 is spaced from the loading turntable 2 by an appropriate distance. If the distance is too close, the edge image of the electronic component 9 will be distorted. If the reading distance is too long, the brightness will be insufficient. After the backlight imaging optical module 3 provides a backlight light source, an image is captured by the dynamic camera CCD1. During analysis, the computer PC2 first binarizes the edge points of the image, further searches for the sub-image position coordinates at the tracked points, and finally brings the sub-image position obtained by the edge into the edges and edges of the calculation specifications. Distance and find the maximum distance. Thereby, the electrode width of the electronic component 9, the total length of the capacitor, the width of the element body, and appearance defects are detected [as shown in Fig. 1]. As shown in FIG. 3, if the first workstation S1 determines that it has the above-mentioned specific defect, the nozzle discharge mechanism B1 will immediately blow and discharge, and

M273713 4. Creation instructions (5) The defective product recovery area F1 collects defective products of the electronic component 9. If the electronic component 9 passes the specific flaw detection inspection of the first work station s1, it is regarded as a good product, and is sent from the loading carousel 2 to the second work station S2 for subsequent inspection. Please refer to FIG. 6, the second workstation S2 of this creation also uses a backlight imaging optical module 4, which also includes a diffusion plate 41 and a plurality of LEDs 42. The LED 42 is used for lighting, and an image is captured by the dynamic camera CCD2 to detect the height of the element body, the height of the electrode, and appearance defects [as shown in Fig. 1]. In order to accurately calculate the height dimension of the electronic component 9, the backlight is arranged in the small circular space in the center of the loading turntable 2 like the optical module 4, so as not to hinder the rotation of the loading turntable 2 and provide sufficient space. Backlight surface to accurately measure the relative dimensions of the thickness of the electronic component 9 on the side. As shown in FIG. 3, if the second workstation s 2 determines that it has the specific defect described above, the nozzle discharge mechanism B2 will immediately blow and discharge, and recover the electronic component from the remote defective product recovery area F2. 9 defective products. If the electronic component 9 passes the specific flaw detection test of the second work station S 2, it is regarded as a good product, and is sent from the loading turntable 2 to the third work station § 3 for subsequent detection. Please refer to FIG. 7. The third work station 33 of this creation uses a reflective optical module 5. The reflective optical module 5 includes a plurality of reflectors 51 and a plurality of LEDs 52. The low-angle LED 52 is illuminated by the upper and lower sides on the electronic component 9 'After the image is reflected through the mirror 51 and the upper and lower images are integrated and reflected', the moving camera CCD3 extracts the image to detect the electrons The surface texture of element 9 is different, such as front scratches, foreign matter adhesion, stains (such as

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M273713 IV. Creation Instructions (6) (shown in Figure 2). The advantages of the above image integration are that it can enhance Morphology image processing, improve resolution, reduce the number of dynamic camera CCD3 and image acquisition card C3 used by the system, and reduce the complexity of the overall system integration. ^ As shown in FIG. 3, if the third workstation S3 determines that it has the above-mentioned specific defects, the nozzle discharge mechanism B3 will immediately blow air and collect the electronic component 9 from the defective product recovery area F3. Defective. If the electronic component 9 passes the specific flaw detection inspection of the third work station S3, it is regarded as a good product 'and sent from the loading turntable 2 to the fourth work station S4 for post-performance inspection. Please refer to FIG. 8 and FIG. 9. The fourth workstation S4 of this creation uses a reflective optical module 6 ′. The reflective optical module 6 includes a plurality of mirrors 61 and a plurality of shadowless light sources 62. 62 is provided with an opening 622 at one end of a cover body 621. A plurality of LEDs 623 and a reflective refractive mirror 624 are provided on the inner peripheral surface of the opening 622, and an arc-shaped reflector 625 is provided inside the cover 621. With this, the shadowless light source 62 generates an appropriate light source, projects it to the electronic component 9, and uploads the image through the opening 6 2 2 and sends it to the dynamic camera CCD4 through the mirror 61 to capture the image to detect the electronic component 9 Front, electrode discoloration, element body discoloration, element body length, electrode length, presence or absence of electrode, and electrode shape [as shown in Figure 2]. With the special structured light source 'of the shadowless light source 62, the electrode shape and the length of the element body can be standardized to reduce the ambiguity' and the detection can be stabilized. As shown in FIG. 3, if the fourth workstation s 4 determines that it has the above-mentioned specific defect, the nozzle discharge mechanism B4 will immediately blow and discharge,

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The defective product recovery_recover the defective & of the electronic part 9. If the electronic component 9 passes the specific defect detection inspection of the fourth workstation S4 in the province, it is regarded as a good product, and is sent by the loading turntable 2 to the fifth worker for subsequent inspection. As shown in FIG. 10, the M work-in-process shows that the fifth work station S5 of this creation also employs a reflective optical branch group 7. The reflective optical module 7 is provided with a plurality of beveled mirrors 71 and a shadowless light source 72. The beveled mirror 71 is disposed on two sides of the electronic component 9, and its setting and setting angle is 47. . The structure of the shadowless light source 72 is the same as the shadowless light source 62 of the fourth workstation S4. Under this erection, the dead side of the two side of the electronic component 9 attached to the turntable 2 can be appropriately presented through a 47-degree beveled mirror 71. See the same day, use the shadowless light source 7 2 above to fill the light, so that The dynamic camera CCD5 captures images to detect electrode discoloration, element body discoloration, and electrode shape on the side of the electronic component 9 [as shown in FIG. 2]. ^ As shown in FIG. 3, if the fifth workstation S5 determines that the above-mentioned specific defect is identified, the nozzle discharge mechanism B5 will immediately blow and discharge, and the electronic component 9 will be recovered by the defective product recovery area F5. Bad product. If the electronic component 9 passes the specific flaw detection test for the fifth work station s5, it is regarded as a good product, and is sent from the loading carousel 2 to the sixth work station S6 for subsequent detection. Please refer to FIG. 11, the sixth workstation 36 of this creation uses a reflective optical module 8. The reflective optical module 8 is provided with a plurality of bevel mirrors 81 and a plurality of LEDs 82. The LED 82 is arranged under the loading turntable 9 to provide a low-angle light source to highlight the side scratches, foreign objects, and stains on the electronic component 9 (as shown in FIG. 2), so as to capture images by the dynamic camera CCD6. To strengthen

C: \ L0G0-5 \ FIVE C0NTINENTS \ PK9631.ptd Page 11 M273713 IV. Creative Instructions (8) The shape [Morpho 1 ogy] image, and then the detection is stable. As shown in FIG. 3, if the sixth workstation S 6 determines that it has the above-mentioned specific defects, the nozzle discharge mechanism B6 will immediately blow and discharge, and the electronic component 9 will be recovered by the defective product recovery area F6. Bad product. If the electronic component 9 passes the specific flaw detection inspection of the sixth workstation S6, it is regarded as a good product and recovered by the good product recovery area p. Although this creation has been disclosed using the above-mentioned preferred embodiments, it is not intended to limit the creation of this work. Any person skilled in this art can make various changes and modifications without departing from the scope of this work. The creation of the crime is subject to the scope of the attached patent application. "U

M273713 Schematic description [Schematic description] Figure 1: Front view of the external dimensions of conventional electronic components [chip capacitors]. Fig. 2: A schematic diagram of a side surface defect of a conventional electronic component [chip capacitor]. Fig. 3: Schematic diagram of the mechanism and detection system architecture of the quality inspection device for the creation of electronic components. Figure 4 Schematic diagram of the detection and control system architecture of this creation. Fig. 5 Schematic diagram of the first station detection area of the creation of this picture. 6 Fig. 6 Diagram of the second station detection area of the creation. Schematic diagram of the third station of the creation area. Schematic diagram of the station detection area. Figure 9 Schematic diagram of the shadowless light source structure of this creation. 0 Figure 10: Schematic diagram of the fifth station detection area of this creation. Figure 11: Schematic diagram of the sixth station detection area of this creation. [Description of Symbols of Main Components] 1 Vibration feeder 10 Control machine 11 Feeding channel 2 Feeding turntable 3 Backlight imaging optical module 31 Diffusion plate 32 LED 4 Backlight imaging optical module 41 Diffusion plate 42 * LED 5 Reflective optics Module 51 Mirror 52 LED 6 Reflective Optical Module

C: \ L0G0-5 \ FIVE CONTINENTS \ PK9631. Ptd Page 13 M273713 Brief description of the diagram 61 Reflector 62 Shadowless light source 621 Housing 622 Opening 623 LED 624 Reflective refraction mirror 625 Arc reflector 7 Reflective optical module 71 Beveled mirror 72 Shadowless light source 8 Reflective optical module 81 Beveled mirror 82 LED 9 Electronic components D1 Full length D2 Electrode length D3 Electrode width D4 Element length D5 Element width B1 to B6 Nozzle discharge mechanism CCD1 to CCD6 Dynamic cameras F1 to F6 Defective Product Recycling Area

Ml, M2 screen P Good product recycling area PCI, PC2, PC3 Computer S1 to S6 Workstation

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Claims (1)

M273713 V. Application for Patent Scope 1. A quality inspection device for electronic components, which includes: a loading carousel 'which is used to transport an electronic component; several workstations' which are respectively provided with a dynamic camera, and each dynamic camera is used for capturing Take the images of the electronic components at the workstations for sub-stations to detect various defects of the electronic components; shelter; several computers, each of which is equipped with several dynamic image capture cards, which are processed separately by each dynamic sorrowful image capture card The electronic component images of each station captured by each dynamic camera; and several nozzle discharge mechanisms. If the computer judges that the electronic components of any workstation have defects, the workstation uses the nozzle discharge mechanism to discharge gas. To remove the defective parts of the electronic components; if the computer determines that the electronic components of a workstation meet the test, the loading turntable transports the electrical components to the next workstation for the next test; if the testing of all the thousand stations is completed, the electronic component It is judged as good. Work 2. According to the scope of patent application! The quality inspection of the electronic components described in the above item is false, in which one of the workstations uses a backlight imaging optical module, which also includes a diffusion plate and several LEDs for detecting electronic components, its width, capacitance Full length, body width and appearance defects. Pole 3. The quality inspection of the electronic components according to item 丨 of the patent application scope. One of the workstations uses a backlight imaging optical module, ^, including a diffuser and several LEDs for testing electronics. Components, height, electrode height and appearance defects. Body 4. According to the quality of electronic components described in item i of the scope of patent application, one of the workstations uses a reflective optical module. M273713 patent application scope several counter-intuitive differences 5, according to the application, its optical mode electronic element electrode length 6, according to the application, its oblique electrodes 7, according to the application device, in the cover 8, according to the application Several oblique, foreign objects 9, according to the application, 10, according to the application, and then the lens and the sex, the positive degree of the working group included in the patent, the electric mirror and the mirror and Discoloration, patent, where the inside of the opening is provided with the face mirror in the patent, and the electric patent in the attached patent, the electricity quickly counts the LED surface to the mark, several reflective surfaces around one of the first station, With or without electrodes, one of the stations in item 1 is a shadowless photochromic body. The inner peripheral surface of the shadowless light source is provided with a number of LEDs and stains in one of the stations in item 1 of the shadowless light source. The 1st item of the brain system belongs to the 1st item of the brain installation calculation. For detecting foreign matter adhesion and stain on the surface of electronic components. The quality detection device of the electronic component adopts a reflective optical module, and the reflection 1¾ and a plurality of shadow sources are provided for detecting discoloration, element body discoloration, element body length, and electrode shape. The quality detection of the electronic components described above uses a reflective optical module, which is provided with a source 'for detecting the sides of the electronic components and the shape of the electrodes. The quality detection of the electronic component described in the item is to set an opening at one end of a cover, and place a plurality of LEDs, a reflective mirror, and a reflective mirror. The quality detection device of the electronic component adopts a reflective optical module, which is provided with a side CPU for detecting scratches of the electronic component. The quality detection device of the electronic component is equipped with a dual CPU computer. The above-mentioned electronic component quality testing software is one of multiple execution sequence functions. M273713 V. Patent application scope 11. The quality inspection device for electronic components according to item 1 of the patent application scope. At least one of the computers is dedicated to a man-machine operating system, which is connected to a control machine and the rest of the computer. Between; and the rest of the computer are each equipped with a plurality of the dynamic image capture cards to be dedicated to various detection functions of each workstation. 1 2. The quality inspection device for electronic components according to item 1 of the scope of patent application, wherein the electronic components are chip capacitors. C: \ L0G0-5 \ FIVE CONTINENTS \ PK9631.ptd Page 17