TWM261696U - Circuit board measuring fooling having fast-clamping mechanism - Google Patents

Circuit board measuring fooling having fast-clamping mechanism Download PDF

Info

Publication number
TWM261696U
TWM261696U TW93213950U TW93213950U TWM261696U TW M261696 U TWM261696 U TW M261696U TW 93213950 U TW93213950 U TW 93213950U TW 93213950 U TW93213950 U TW 93213950U TW M261696 U TWM261696 U TW M261696U
Authority
TW
Taiwan
Prior art keywords
fixing plate
test
circuit board
fixture
jig
Prior art date
Application number
TW93213950U
Other languages
Chinese (zh)
Inventor
Chau-Tung Liou
Original Assignee
Utron Technologies Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Utron Technologies Corp filed Critical Utron Technologies Corp
Priority to TW93213950U priority Critical patent/TWM261696U/en
Publication of TWM261696U publication Critical patent/TWM261696U/en

Links

Landscapes

  • Tests Of Electronic Circuits (AREA)

Description

M261696 八、新型說明: 【新型所屬之技術領域】 本創作係一種電路板測試治具,尤指一種對大面積之 軟式或硬式電路板進行電路測試並提供快速更換所需治 具之設備者。 【先前技術】 由於電子產業日新月異,電子產品之電路設計亦日趨 雜,為了驗證此種複雜電路是否在製作產出後具有與原設 計相同之功能,實有賴精密準確的電路板測試治具來達到 快速檢測之目的。 但以現今電路板測試治具而言,在實際檢測的作業當 中通韦必須依照待測電路板的不同使用相對應的測試治 具,且一旦更換不同的測試治具之後,還必須作位置上的 校正,以免治具在與待測電路板作電性接觸時因相對位置 偏差而沒有正確接觸,造成測試失敗,如此一來,使得測 试作業往往在更換不同的測試治具#中浪費了許多時間 及人力’使得測試作業效率不彰。 【新型内容】 依據上述,本創作之主要目的在於,提供一種能夠驾 到快速更換所需治具單元 — .0Ϊ _ θ . 了自動作疋位補償之電路相 測试治具者。 職是’為達上述之目的,士名丨从 雷μ 、Λ θ 本創作之具快速夾持機構之 電路板測5式治具,包含可力 匕3了在直立方向上相對移動之一第一 M261696 單元與一第二治具單元,以及用以夾持一待測電路板而 使其在該第一治具單元與該第二治具單元間之水平面上 移動之一承載單元,藉該承載單元使該待測電路板移動至 特定位置處而供該第一治具單元與該第二治具單元電性 接觸以進行測試。 该第一治具單元包括一上固定板、一下固定板、一受 该上固定板與該下固定板夾持之第一測試治具,及二分別 連接該上固定板與該下固定板對應側邊之驅動裝置,而該 驅動装置具有一固接於該上固定板之導塊及一定位在該 下固定板上可橫向移動之驅動件,該導塊設置有一斜向導 槽,而該驅動件則形成有一容置在該斜向導槽中之移動 部,在該驅動件橫向移動而使該移動部隨之在該斜向導槽 内k向運動以推擠該導塊時,可連動該上固定板作直立方 向之運動,以達到該上固定板與該下固定板相對接近或遠 離之作用,可快速拆裝該第一測試治具。 【實施方式】 有關本創作為達上述目的、特徵所採用的技術手段及 其功效,茲例舉一較佳實施例並配合以下圖式說明如下: 參閱第一圖與第二圖,本創作之電路板測試治具包含 機架1 疋位在機架1内接近上方處之第一治具單元 2、 -同樣定位在機架i内但位於下方處之第二治具單元 3, 以及一承載單元4。 第/口,、單元2 (參照第三圖)包括一上固定板2工、 -下固定板22、-受上固定板21與下較板22夾持之第 M261696 一測試治具23,及二分別連接上固定板21與下固定板22 對應侧邊之驅動裝置24。其中,驅動裝置24具有一固接 於上固定板2丨之導塊25及一定位在下固定板22上可橫 向移動之驅動件26,本例中,驅動件26為一水平配置之 氣壓缸,又,導塊25設置有一斜向導槽251,而驅動件 %則形成有一容置在斜向導槽251中之移動部加,在驅 動件26橫向移動而使移動部261隨之在斜向導槽251内 橫向運動時,可用以推擠導塊25,進而連動上固定板Η 作直立方向之運動。 第二治具單元3之構造概與第一治具單元2相同,於 $即不再重複說明。在本實施财,第二治具單元3呈固 疋不動狀態,而第一 且爱士 〇 Q . A早兀2則可相對於第二治具單元 3在直立的Z方向上接近或遠離。 承載早疋4係用以夾持一待測電路板 治具單元2與第二治且單 便-在第 口,、早70 3間之水平面上移動。本例 中,承載單元4包括四個分 本例 盔綈斗私二 用夾固一待測電路板5(可 為硬式或軟式電路板)之四w並可調 件4卜-提供該等夾 、田诋力之夾持 42、一提#笛一 s 、牛循X方向移動之第一驅動組 第一驅動組42循Y方向移動之第-驅動组43 當四夾持件41夹固往制φ * 弟一驅動組43。 天固待測電路板5並使Α 後,可藉由第一驄為,, H、具有適當張力 弟驅動組U與第二驅動組43之捭 測電路板5在第一户且留_ ,、 之搭配,使待 / 口具早το 2與第二治具單 XY平面上水平運動。 /、早疋3中間的 測試作業進行時, 一 ’、承載早兀4帶動待測電路板5 M261696 广治具單元2及第二治具單元3移動,由程式將待測 路板5表面區分為複數個陣列區域,使特定之陣列區域 ,第-治具單元2與第二治具單元3 f曰,,再令第一治具 單,2向第二治具單元3接近,使第一治具單元2之第二 測:式治具23與第二治具單元3之第二測試治具33分別接 觸相電路板5之上下兩面,以進行該陣列區域内電路之 】式作業,爾後第一測試治具23與第二測試治具33分 開再由承載單几4將待測電路板移動至另外一個陣列區 域而重複上述測試,如此直到所有陣列區域皆測試完畢, Ρ可得去整個待測電路板之功能是否與原言免計相同,以判 斷產品之可靠性。 抑而本創作之主要特點,在於第一治具單元2(第二治 八單元3亦同)3又计有可分離地上下貼合之上固定板h 與下固,板22’當上固定板21與下固定板22藉由驅動件 26之杈向移動而使其相互接近時,可用以將第一測試治具 23牢固;t位’而當欲更換第—測試治具23時,則僅需之 使驅:件26反向移動’即可使上固定板Η與下固定板22 才這離此時即此夠快速拆裝第一測試治具23。同樣 地,第二治具單元3亦具有相同設計。 另外,第一治具單元2與第二治具單元3更分別包括 一補償第一測試治具23或第二測試治具33相對於待測電 路板5之相對位置之定位補償裝置6。本例中,定位補償 裝置6具有四姐分別在χ、γ、ζ、㊀方向進行微調之一伺 服馬達及受祠服馬達61驅動之一滾珠螺桿62,藉以精確 M261696 測試治具33之位置,使第一 33能夠穩定地接觸待測電路 具快速夾持機構之電路板測 ’達到快速更換及定位補償 地補償第一測試治具23或第二 測4治具23或第二測試治具 板5 ’確保測試之正確性。 綜合以上所述,本創作『 試治具』,確能藉由上述構造 I】預期功效’且申請前未見於刊物亦未公開使用,符合新 $專利之新賴、進步及符合產業利用性等要件,爰依法申 請專利之。而以上所述僅為本創作之實施例而已,凡依本 創作之精神所作之簡易修飾及等效變化設計,應涵蓋於以 下之申請專利範圍内。 【圖式簡單說明】 第一圖係本創作之具快速夾持機構之電路板測試治 具之一較佳實施例側視圖。 第二圖係該較佳實施例之部份構件立體圖。 第三圖係該較佳實施例之一第一治具單元立體圖。 【主要元件符號說明】 1 機架 26 驅動件 2 第一治具單元 261 移動部 21 上固定板 3 第二治具單元 22 下固定板 33 第二測試治具 23 第一測試治具 4 承載單元 24 驅動裝置 41 失持件 25 導塊 42 第一驅動組 251 斜向導槽 5 待測電路板 M261696 6 定位補償裝置 61 伺服馬達M261696 8. Description of the new type: [Technical field to which the new type belongs] This creation is a circuit board test fixture, especially a device that performs a circuit test on a large-area soft or hard circuit board and provides rapid replacement of the fixture required. [Previous technology] Due to the rapid development of the electronics industry, the circuit design of electronic products is becoming more and more complicated. In order to verify whether such complex circuits have the same functions as the original design after production, it depends on accurate and accurate circuit board test fixtures to achieve this. Purpose of rapid detection. However, in terms of current circuit board test fixtures, in the actual inspection operation, Tongwei must use the corresponding test fixtures according to the different circuit boards to be tested, and once the different test fixtures are replaced, they must be positioned. Calibration to prevent the fixture from making incorrect contact due to the relative position deviation when making electrical contact with the circuit board to be tested, which causes the test to fail. As a result, the test operation is often wasted in changing different test fixtures # A lot of time and manpower 'make testing operations inefficient. [New content] Based on the above, the main purpose of this creation is to provide a fixture that can quickly change the fixture unit required. —0Ϊ _ θ. Circuit phase test fixture for automatic position compensation. In order to achieve the above-mentioned purpose, the name 丨 from Lei μ, Λ θ The circuit board with a fast clamping mechanism of the type 5 test fixture, including the force dagger 3, one of the relative movement in the upright direction A M261696 unit and a second jig unit, and a load-bearing unit for holding a circuit board to be tested and moving it on a horizontal plane between the first jig unit and the second jig unit, by which The carrying unit moves the circuit board under test to a specific position for the first jig unit to be in electrical contact with the second jig unit for testing. The first jig unit includes an upper fixing plate, a lower fixing plate, a first test fixture clamped by the upper fixing plate and the lower fixing plate, and two connecting the upper fixing plate and the lower fixing plate respectively. A driving device at the side, and the driving device has a guide block fixed to the upper fixing plate and a driving member positioned laterally movable on the lower fixing plate, the guide block is provided with an inclined guide groove, and the drive The part is formed with a moving part accommodated in the inclined guide groove. When the driving member moves laterally so that the moving part moves in the k direction in the inclined guide groove to push the guide block, the upper part can be linked with the upper part. The fixing plate is moved in the upright direction to achieve the effect that the upper fixing plate is relatively close to or away from the lower fixing plate, and the first test fixture can be quickly disassembled and assembled. [Embodiment] Regarding the technical means adopted by this creation to achieve the above-mentioned objectives and features, and its effects, a preferred embodiment is given below and illustrated in conjunction with the following diagrams: Refer to the first and second pictures. The circuit board test fixture includes a first fixture unit 2 located at the upper part of the rack 1 near the upper part, a second fixture unit 3 which is also located in the rack i but is located at the lower part, and a bearing. Unit 4. No./port, Unit 2 (refer to the third figure) includes an upper fixing plate 2 worker,-a lower fixing plate 22,-a M261696 test fixture 23 held by the upper fixing plate 21 and the lower plate 22, and Two driving devices 24 connected to the corresponding sides of the upper fixing plate 21 and the lower fixing plate 22 respectively. Wherein, the driving device 24 has a guide block 25 fixed to the upper fixing plate 2 and a driving member 26 positioned on the lower fixing plate 22 and capable of moving laterally. In this example, the driving member 26 is a horizontally arranged pneumatic cylinder. In addition, the guide block 25 is provided with a slanted guide groove 251, and the driving member% is formed with a moving portion accommodated in the slanted guide groove 251, and the drive member 26 is laterally moved so that the moving portion 261 follows the slanted guide groove 251. When moving inwardly and laterally, it can be used to push the guide block 25, and then link the upper fixing plate Η for vertical movement. The structure of the second jig unit 3 is almost the same as that of the first jig unit 2. Therefore, the description will not be repeated here. In this implementation case, the second jig unit 3 is in a fixed state, while the first and second ascendant Q. A. Aowu 2 can approach or move away from the second jig unit 3 in the upright Z direction. The load cell 4 is used to hold a circuit board under test. The jig unit 2 and the second cell are simple and easy to move on the horizontal plane between the mouth and the morning. In this example, the load-bearing unit 4 includes four parts. In this example, the helmet and the bucket are used to hold a four-w and adjustable pieces 4 of the circuit board 5 (which can be a hard or soft circuit board) under test. 、 Tian Yili's clamping 42 、 One mention # 笛 一 s 、 The first driving group moving in the X direction of the first driving group 42 The first driving group moving in the Y direction-the driving group 43 When the four clamping members 41 are fixed to制 φ * Brother one driving group 43. After the Tiangu circuit board 5 to be tested is set to A, the test circuit board 5 of the driving group U and the second driving group 43 with proper tension can be used in the first house, H, and _, With the combination, the horizontal movement on the single XY plane of the waiting / mouthpiece το 2 and the second jig is early. / 、 When the test operation in the middle of the early test 3 is carried out, the first and the early test 4 will drive the circuit board 5 to be tested. M261696 The wide fixture unit 2 and the second fixture unit 3 move, and the surface of the test board 5 will be distinguished by the program. For a plurality of array regions, make a specific array region, the first jig unit 2 and the second jig unit 3 f, and then make the first jig single and 2 approach the second jig unit 3 so that the first The second test of the jig unit 2: the type jig 23 and the second test jig 33 of the second jig unit 3 contact the upper and lower sides of the phase circuit board 5, respectively, to perform the operation of the circuit in the array area, and then The first test fixture 23 is separated from the second test fixture 33, and the circuit board to be tested is moved to another array area by the carrier sheet 4. The above test is repeated, so that all the array areas are tested, and P can be completely removed. The function of the circuit board under test is the same as the original exemption to judge the reliability of the product. The main feature of this creation is that the first jig unit 2 (the same as the second jig unit 3 and 3) 3 also includes an upper and lower fixing plate detachably attached to the upper and lower plates, and the plate 22 'is fixed on the upper side. When the plate 21 and the lower fixing plate 22 are moved toward each other by the direction of the branch of the driving member 26, they can be used to secure the first test fixture 23; t position, and when the first test fixture 23 is to be replaced, then Only the driving member 26 needs to be moved in the reverse direction to enable the upper fixing plate Η and the lower fixing plate 22 to be quickly removed and attached to the first test fixture 23 at this time. Similarly, the second jig unit 3 has the same design. In addition, the first jig unit 2 and the second jig unit 3 each include a positioning compensation device 6 that compensates the relative position of the first test jig 23 or the second test jig 33 relative to the circuit board 5 to be tested. In this example, the positioning compensation device 6 has four servo motors for fine adjustment in the directions of χ, γ, ζ, and 分别, respectively, and a ball screw 62 driven by the temple service motor 61, so as to accurately test the position of the fixture 33 by M261696. Enables the first 33 to stably contact the circuit board of the fast clamping mechanism of the circuit under test to achieve quick replacement and positioning compensation to compensate the first test fixture 23 or the second test fixture 23 or the second test fixture plate 5 'Make sure the test is correct. To sum up, the "trial fixture" of this creation can indeed use the above structure I "expected effect" and it has not been seen in publications or publicly used before application, which is in line with the new claims of new patents, progress, and industrial applicability. Essentials, apply for a patent according to law. The above is only an example of this creation. Any simple modification and equivalent change design made according to the spirit of this creation should be covered by the following patent applications. [Brief description of the drawings] The first figure is a side view of a preferred embodiment of a circuit board test fixture with a quick clamping mechanism. The second figure is a perspective view of some components of the preferred embodiment. The third figure is a perspective view of the first jig unit of the preferred embodiment. [Description of symbols of main components] 1 frame 26 driving member 2 first jig unit 261 moving part 21 upper fixing plate 3 second jig unit 22 lower fixing plate 33 second test jig 23 first test jig 4 loading unit 24 Drive device 41 Missing piece 25 Guide block 42 First drive group 251 Slant guide groove 5 Circuit board under test M261696 6 Positioning compensation device 61 Servo motor

Claims (1)

M261696 九、申請專利範園: 1. 一種具快速夾持機構之電路板測試治具,包含可在直立方向 上相對移動之一第一治具單元與一第二治具單元,以及用二 夾持-待測電路板而使其在該第一治具單元與該第二治且單 疋間之水平面上移動之一承載單元,藉該承載單元使該待測 ,路板移動至特定位置處而供該第_治具單S與該第二治具 單元電性接觸以進行測試,其特徵在於·· 該第-治具單元包括一上固定板、一下固定板、一受該 上固定板與該下固定板夾持之第一測試治具,及二分別連接 該上固定板與該下固定板對應側邊之驅動裝置,而該驅動裝 置具有-固接於該上固定板之導塊及_定位在該下固定板: 可橫向移動之驅動件’該導塊設置有一斜向導槽,而該驅動 件則形成有一容置在該斜向導槽中之移動部,在該驅動件橫 向移動而使該移動部隨之在該斜向導槽内橫向運動以推擠該 導塊時,可連動該上㈣板作直立方向之運動,以達到該上 固定板與該下固定板相對接近或遠離之作S,可快速拆裝該 第一測試治具。 、/ 2·如申請專㈣圍第i項所述之具快速夾持機構之電路板測試 :具’其中該第二治具單元包括一上固定板、一下固定板、 一受該上固定板與該下固定板夾持之第二測試治具,及二分 別連接該上固定板與該下固定板對應側邊之驅動裝置,而該 :動裝置具有一固接於該上固定板之導塊及一定位在該下固 定板上可橫向移動之驅動件,該導塊設置有—斜向導槽,而 該驅動件則形成有—容置在該斜向導槽中之移動部,在該驅 M261696 動件橫向移動而使該移動部隨之在該斜向導槽内橫向運動以 推擠該導塊時,可連動該上固定板作直立方向之運動,以達 到該上固定板與該下固定板相對接近或遠離之作用,可快速 拆裝該第二測試治具。 3 ·如申請專利範圍第1項所述之具快速夾持機構之電路板測試 冶具’其中該第一治具單元更包括一補償該第一測試治具相 對於該待測電路板之相對位置之定位補償裝置。 4·如申請專利範圍第2項所述之具快速夾持機構之電路板測試 治具,其中該第二治具單元更包括一補償該第二測試治具相 對於忒待測電路板之相對位置之定位補償裝置。 5.如申請專利範圍第3項或第4項所述之具快速夾持機構之電 ^板測試治具,其中該定位補償裝置具有四組分別在χ、γ、 Ζ、Θ方向進行微調之—舰馬達及受該伺服馬達驅動之一M261696 Nine, patent application Fanyuan: 1. A circuit board test jig with a fast clamping mechanism, which includes a first jig unit and a second jig unit that can move relatively in the upright direction, and uses two clamps Hold the circuit board under test to move a load-bearing unit on the horizontal plane between the first jig unit and the second jig unit, and use the load-bearing unit to move the circuit board under test to a specific position The first fixture unit S is in electrical contact with the second fixture unit for testing, and is characterized in that the first fixture unit includes an upper fixing plate, a lower fixing plate, and an upper fixing plate. A first test fixture clamped with the lower fixing plate, and two driving devices respectively connected to the corresponding sides of the upper fixing plate and the lower fixing plate, and the driving device has a guide block fixed to the upper fixing plate And _ located on the lower fixing plate: a laterally movable driving member 'the guide block is provided with a slanted guide groove, and the driving member is formed with a moving part accommodated in the slanted guide groove, and moves laterally on the driving member And the moving part follows the oblique direction When the lateral movement in the slot pushes the guide block, the upper cymbal plate can be linked to move in the upright direction to achieve that the upper fixing plate is relatively close to or away from the lower fixing plate, and the first can be quickly disassembled and assembled. Test Fixture. / 2 · If you apply for a circuit board test with a fast clamping mechanism as described in item i of the application, the tooling includes the upper fixture plate, the lower fixture plate, and the upper fixture plate. A second test fixture clamped with the lower fixing plate, and two driving devices respectively connected to the corresponding sides of the upper fixing plate and the lower fixing plate, and the moving device has a guide fixed to the upper fixing plate A block and a driving member positioned on the lower fixing plate and capable of moving laterally. The guide block is provided with an inclined guide groove, and the driving member is formed with a moving part accommodated in the inclined guide groove. M261696 When the moving part moves laterally so that the moving part moves laterally in the inclined guide groove to push the guide block, the upper fixing plate can be moved in the upright direction to achieve the upper fixing plate and the lower fixing. The relatively close or far away effect of the plate can quickly disassemble the second test fixture. 3 · The circuit board test tool with a quick clamping mechanism as described in item 1 of the scope of the patent application, wherein the first jig unit further includes a compensation for the relative position of the first test jig relative to the circuit board to be tested. Positioning compensation device. 4. The circuit board testing jig with a quick clamping mechanism as described in item 2 of the scope of the patent application, wherein the second jig unit further includes a compensation for the relative of the second test jig with respect to the circuit board to be tested. Positioning compensation device. 5. The electric plate test jig with a quick clamping mechanism as described in item 3 or 4 of the scope of patent application, wherein the positioning compensation device has four groups of fine adjustments in the directions of χ, γ, ZZ, and Θ, respectively. —Ship motor and one driven by the servo motor
TW93213950U 2004-09-02 2004-09-02 Circuit board measuring fooling having fast-clamping mechanism TWM261696U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW93213950U TWM261696U (en) 2004-09-02 2004-09-02 Circuit board measuring fooling having fast-clamping mechanism

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW93213950U TWM261696U (en) 2004-09-02 2004-09-02 Circuit board measuring fooling having fast-clamping mechanism

Publications (1)

Publication Number Publication Date
TWM261696U true TWM261696U (en) 2005-04-11

Family

ID=36087071

Family Applications (1)

Application Number Title Priority Date Filing Date
TW93213950U TWM261696U (en) 2004-09-02 2004-09-02 Circuit board measuring fooling having fast-clamping mechanism

Country Status (1)

Country Link
TW (1) TWM261696U (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN114325327A (en) * 2021-12-29 2022-04-12 苏州欣华锐电子有限公司 Universal programming test equipment for integrated circuit

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN114325327A (en) * 2021-12-29 2022-04-12 苏州欣华锐电子有限公司 Universal programming test equipment for integrated circuit

Similar Documents

Publication Publication Date Title
KR102426032B1 (en) Flexible substrate inspecting apparatus
TWI517290B (en) A substrate position alignment device, a substrate alignment method, and a manufacturing method of a multilayer semiconductor
JP5450391B2 (en) Wafer probe test and inspection system
TW201712346A (en) Positioning device for a parallel tester for testing circuit boards and parallel tester for testing circuit boards
TW201834953A (en) Circuit board test system, circuit board test method, and circuit board clamping apparatus
KR101286250B1 (en) Array test apparatus having multiple head unit
JP2008221438A (en) Robot hand and robot
TWM261696U (en) Circuit board measuring fooling having fast-clamping mechanism
CN218370361U (en) Resistance element electrical property test equipment
CN218135253U (en) Sucker type clamp of numerical control milling machine
JP4986130B2 (en) Board inspection equipment
JP2010175287A (en) Apparatus and method for inspecting electronic device
KR100994199B1 (en) Wafer print device for solar cell
JPH06186271A (en) Method and apparatus for inspection of printed circuit board
KR20130022126A (en) Probe unit and apparatus for testing electrical characteristics of an object including the same
TWM523258U (en) Clamping device of screen printing machine
JP2011080918A (en) Material tester
CN103698208B (en) A kind of built-up jig for special-shaped component six degree of freedom rigidity test
KR100969539B1 (en) Lighting Inspection Apparatus
WO2015072594A1 (en) Chip alignment apparatus of laser chip bonding machine
KR100647538B1 (en) Probe system for testing chip de-capped
JP6035168B2 (en) Board inspection equipment
TWI834440B (en) Processing equipment and processing method
JP2009063342A (en) Device and method for inspecting wiring board
JPH10319075A (en) Continuity inspecting method for ic package board of b/g/a, p/g/a, or others, and its device

Legal Events

Date Code Title Description
MM4K Annulment or lapse of a utility model due to non-payment of fees