TWM261318U - Improved carrier head for chemical mechanical polishing - Google Patents
Improved carrier head for chemical mechanical polishing Download PDFInfo
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- TWM261318U TWM261318U TW93210057U TW93210057U TWM261318U TW M261318 U TWM261318 U TW M261318U TW 93210057 U TW93210057 U TW 93210057U TW 93210057 U TW93210057 U TW 93210057U TW M261318 U TWM261318 U TW M261318U
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M261318 四、創作說明(1) 【新型所屬之技術領域】 本創作係有關於化學機械研磨設備,特別係有關於一 種化學機械研磨之研磨頭改良構造。 【先前技術】 習知化學機械研磨(Chemical Machine Polishing, CMP )設備係運用在平坦化一半導體晶圓之積體電路形成表 面,使得其介電層之表面平坦化,以利後續積體電路製 程。習知化學機械研磨設備係包含有一具有複數個研磨站 之研磨基座以及一研磨頭系統,在每一研磨站上係設置有 一研磨墊’並提供一研磨漿在該些研磨墊上,該研磨頭系 統係包含有複數個研磨頭,用以定位複數個半導體晶圓在 該些研磨墊上進行平坦化研磨。 中華民國專利公告第485089號「化學機械研磨用之具 有多層固定環的研磨頭」揭示有一種化學機械研磨之研磨 頭,其包含有一研磨基座、一固定環(retaining ring, 或可稱杓束環)、一軟膜(membrane)以及一墊片(shim),M261318 IV. Creation Instructions (1) [Technical Field to which the New Type belongs] This creation relates to chemical mechanical polishing equipment, and in particular to an improved structure of a chemical mechanical polishing grinding head. [Previous technology] The conventional chemical machine polishing (CMP) equipment is used to planarize the surface of a semiconductor wafer integrated circuit to form a surface, so that the surface of its dielectric layer is flattened to facilitate subsequent integrated circuit manufacturing processes. . The conventional chemical mechanical grinding equipment includes a grinding base having a plurality of grinding stations and a grinding head system. A grinding pad is provided on each grinding station, and a grinding slurry is provided on the grinding pads. The grinding head The system includes a plurality of polishing heads for positioning a plurality of semiconductor wafers for planarization polishing on the polishing pads. Republic of China Patent Bulletin No. 485089 "Grinding head with multi-layer fixing ring for chemical mechanical grinding" discloses a grinding head for chemical mechanical grinding, which includes a grinding base, a retaining ring (or a retaining ring) Ring), a soft membrane (membrane) and a shim (shim),
該拘束環係裝設於該基座下方,用以定位一半導體晶圓於 違研磨基座下方並使該半導體晶圓與該軟膜接觸,該拘束 環包含有一較硬質上部與一較軟質下部,該軟膜係以一夾 具(clamp)夾合其内邊緣至邊研磨基座之支撲盤 plate) ’以使該軟膜連接至該研磨基座且具有一晶圓接合 表面,忒塾片係位在該研磨基座與該拘束環之較硬質上部 之^,在化學機械研磨過程中,該軟膜之晶圓接合表面要 承受該半導體晶圓與下方研磨墊之磨擦應力,該軟膜會彈The restraint ring is arranged below the pedestal, and is used to position a semiconductor wafer under the grinding base and contact the semiconductor wafer with the soft film. The restraint ring includes a harder upper portion and a softer lower portion. The soft film is clamped by a clamp to clamp the plate from the inner edge to the edge polishing base) so that the soft film is connected to the polishing base and has a wafer bonding surface. The harder upper part of the grinding base and the restraint ring. During the chemical mechanical polishing process, the wafer bonding surface of the soft film must withstand the frictional stress of the semiconductor wafer and the polishing pad below, and the soft film will spring.
M261318____ 四、創作說明(2) 性疲乏,並且該軟膜之内邊緣係為被夾具固定夾合,無伸 縮之彈性空間,該軟膜在長時間使用後其晶圓接合表面會 II弛。 請參閱第1圖,另一種習知化學機械研磨之研磨頭係 主要包含有一拘束環11 〇,該拘束環丨丨〇係具有一開口 111 ’用以限制一半導體晶圓,一研磨基座之支撐盤12〇係 設在該拘束環11 〇之開口 i u内,該支撐盤12〇係具有一内 表面121、一外表面122及在該内表面121與該外表面122之 間之環側壁123,一軟膜130係包覆該支撐盤120之外表面 1 2 2並沿著該環側壁1 2 3延伸至在該内表面1 21周邊,該軟 膜130係具有一扣合凸緣131,其係貼合於在該内表面121 之扣合槽125,其中該内表面丨21與該環側壁丨23之間與該 外表面122與該環側壁丨23之間均為直角124設計,該軟膜 130在该直角124處係具有對應之外表面突起部132,可在 初使用之正常狀態下,研磨頭將一半導體晶圓壓在研磨墊 上帶動該晶圓旋轉作化學機械研磨,利用該軟膜丨3 〇之上 緣外表面突起部1 3 2可防止該軟膜1 3 0被接觸之半導體晶圓 拉伸,然而,在化學機械研磨一段時間之後,請參閱第2 圖,一旦该軟膜130之外表面突起部132被拉動而卡夾在該 支撐盤120之環侧壁123與該拘束環11〇之環内壁之間時/ 該軟膜130之外表面突起部丨32無法回復至定位,將導致研 磨毁粒子聚集在支撐盤12〇之環側壁123與該拘束環11〇之 環内壁之間的該外表面突起部丨32處,產生硬化堵塞,使 该軟膜1 3 0無法彈性復位而失效,並且,該軟膜丨3 〇其中一M261318____ Fourth, creation description (2) Sexual fatigue, and the inner edge of the soft film is an elastic space without being stretched and fixed by a clamp. After a long time use, the soft film's wafer bonding surface will relax. Please refer to FIG. 1. Another conventional chemical mechanical polishing grinding head system mainly includes a restraint ring 11 〇, which has an opening 111 ′ for limiting a semiconductor wafer and a polishing base. A support plate 120 is provided in the opening iu of the restraint ring 110. The support plate 120 has an inner surface 121, an outer surface 122, and a ring side wall 123 between the inner surface 121 and the outer surface 122. A soft film 130 covers the outer surface 1 2 2 of the support plate 120 and extends along the ring side wall 1 2 3 to the periphery of the inner surface 1 21. The soft film 130 has a fastening flange 131, which is It fits into the fastening groove 125 on the inner surface 121, wherein the inner surface 21 and the ring side wall 23 and the outer surface 122 and the ring side 23 23 are at right angles 124, and the soft film 130 At the right angle 124, there is a corresponding outer surface protruding portion 132. In the normal state of initial use, a polishing head presses a semiconductor wafer on a polishing pad to drive the wafer to rotate for chemical mechanical polishing. The soft film is used. 3 〇The upper edge outer surface protrusion 1 3 2 can prevent the soft film 1 3 0 The contacted semiconductor wafer is stretched. However, after a period of chemical mechanical polishing, please refer to FIG. 2. Once the protruding portion 132 on the outer surface of the soft film 130 is pulled and caught on the side wall 123 of the ring of the support plate 120. Between the inner wall of the ring of restraint 11 and the protruding portion of the outer surface of the soft film 130 cannot be restored to position, which will cause abrasive particles to collect on the side wall 123 of the ring 12 of the support plate and the restraint ring 11 The outer surface protrusions between the inner walls of the ring 32 have a hardened blockage, making the soft film 130 unable to elastically reset and fail, and one of the soft films 3
M261318 四、創作說明(3) 外表面突起部132將外露在該支撐盤丨20之外表面122,無 法再平貼抵壓半導體晶圓,經常要停機以更換該支撐盤… 120與該軟膜ΐ3〇〇 、Λ 【新型内容】 一本創作之主要目的係在於提供一種化學機械研磨之研 磨頭改良構造,一支撐盤(support disk)係設在一拘束環 (retaining ring)之開口内並其一外表面包覆有一軟膜, 該支撐盤之内表面與其環側壁之間係形成為弧角,且該軟 膜係順從該支撐盤之弧角而使得該軟膜在該弧爲處具有一 致之厚度,使得該軟膜被拉伸至該拘束環環内壁後^可彈 性復位,而減少研磨漿之粒子聚集在該支撐盤之環側壁與 該拘束環之環内壁之間,不會有研磨漿硬化堵塞的問題。、 依本創作之化學機械研磨之研磨頭改良構造,其係主 要,含有一拘束環以及一晶背支撐組件,該拘束環係結合 於该研磨頭之基座,該拘束環係具有一開口,該晶背支擇 組件係装設於在該拘束環之開口内,該晶背支撐組件係包 含有一支撐盤及一軟膜(membrane),該支撐盤係具有一内 表面、一外表面及在該内表面與該外表面之間之環侧壁, 其中該内表面與該環側壁之間係為弧角,該内表面之周邊 係形成有一扣合槽,該軟膜係具有一晶圓接合面、一環狀 包覆部及一扣合凸緣,該晶圓接合面係形成於該支撐盤之 外表面上’該環狀包覆部係包覆該支撐盤之環側壁,以使 ”玄扣合凸緣貼合於該支撐盤之扣合槽,並且該軟膜係順從 該支推盤之弧角而使得該軟膜在該弧角處具有一致孓厚M261318 IV. Creation instructions (3) The protruding portion 132 on the outer surface will be exposed on the outer surface 122 of the support plate 20, and can no longer be pressed against the semiconductor wafer. It is often necessary to stop the machine to replace the support plate ... 120 and the soft film ΐ3 〇〇 、 Λ [New content] The main purpose of a book is to provide an improved structure of a chemical mechanical polishing grinding head. A support disk is set in an opening of a retaining ring and one of them A soft film is coated on the outer surface, and an arc angle is formed between the inner surface of the support disk and the side wall of the ring, and the soft film follows the arc angle of the support disk so that the soft film has a uniform thickness at the arc, so that After the soft film is stretched to the inner wall of the restraint ring, it can be elastically reset, and the particles of the grinding slurry can be reduced to collect between the side wall of the ring of the support plate and the inner wall of the ring of the restraint ring. . The improved structure of the chemical-mechanical abrasive grinding head created in accordance with this book is mainly composed of a restraint ring and a crystal back support assembly. The restraint ring is combined with the base of the grinding head, and the restraint ring has an opening. The crystal back support assembly is installed in the opening of the restraint ring. The crystal back support assembly includes a support plate and a membrane. The support disk system has an inner surface, an outer surface, and an inner surface. A ring side wall between the inner surface and the outer surface, wherein an arc angle is formed between the inner surface and the ring side wall, a buckle groove is formed on the periphery of the inner surface, and the soft film has a wafer bonding surface, A ring-shaped covering portion and a buckle flange, the wafer bonding surface is formed on the outer surface of the support plate, the ring-shaped covering portion covers the ring side wall of the support plate, so that The fitting flange fits into the fastening groove of the support plate, and the soft film follows the arc angle of the pushing plate so that the soft film has a uniform thickness at the arc angle.
HI 第11頁 M261318HI Page 11 M261318
度0 【實施方式】 ^閱所附圖式,本創作將列舉以下之實施例說明。 請參閱第3圖,依據本創作之一具體實施例,一種化 學機之研磨頭改良構造係主要包含有一拘束環21〇 以及一晶背支撐組件,該拘束環210係結合於該研磨頭之 基座,該研磨頭之基座係可為目前既有的機構,可在一研 ^墊上作旋轉活動,其細部組合構造不在此贅述,該拘束 環210係具有一開口211,該開口 211係形成有筆直之環内 壁2 1 2 ’較佳地’該拘束環2丨〇係由一硬質上環部2丨3與一 軟為下裱部2 1 4所組成,該硬質上環部2丨3可以是硬質金屬 =該軟質下環部214係為可供磨耗之pps塑膠材質,該 晶背支撐組件係連接於該研磨頭之基座之支撐架而裝設於 該拘束環2 1 0之開口 211内。Degree 0 [Embodiment] ^ Read the attached drawings, this creation will enumerate the following examples. Please refer to FIG. 3. According to a specific embodiment of the present invention, an improved structure of a polishing head of a chemical machine mainly includes a restraint ring 21 and a crystal back support assembly. The restraint ring 210 is combined with the base of the grinding head. The base of the grinding head can be an existing mechanism, which can be rotated on a research pad. The detailed combined structure is not described here. The restraint ring 210 has an opening 211, and the opening 211 is formed. A straight ring inner wall 2 1 2 'preferably' the restraint ring 2 丨 〇 is composed of a hard upper ring portion 2 丨 3 and a soft lower mounting portion 2 1 4. The hard upper ring portion 2 丨 3 may be Hard metal = The soft lower ring 214 is a pps plastic material that can be worn. The crystal back support assembly is connected to the support frame of the base of the grinding head and is installed in the opening 211 of the restraint ring 2 1 0. .
該晶背支撐組件係包含有一支撐盤220及一軟膜230, 該支樓盤220係具有一内表面mi、一外表面222及在該内 表面221與該外表面222之間之環側壁223,其中該内表面 221與該環側壁223之間係形成為弧角224,該内表面221之 周邊係形成有一扣合槽225,在本實施例中,該扣合槽225 係為圓弧槽’此外,該外表面222與該環側壁223之間係形+ 成為直角226。該軟膜23 0係具有一晶圓接合面231、一環 狀包覆部232及一扣合凸緣233,該晶圓接合面231係形成 於該支撐盤220之外表面222上,該環狀包覆部232係包:覆 該支撲盤220之環側壁223,以使該扣合凸緣233貼合於該The crystal back support assembly includes a support plate 220 and a soft film 230. The support building 220 has an inner surface mi, an outer surface 222, and a ring side wall 223 between the inner surface 221 and the outer surface 222. An arc angle 224 is formed between the inner surface 221 and the ring side wall 223, and a fastening groove 225 is formed around the inner surface 221. In this embodiment, the fastening groove 225 is a circular arc groove. A positive angle 226 is formed between the outer surface 222 and the ring side wall 223. The soft film 230 has a wafer bonding surface 231, a ring-shaped covering portion 232, and a fastening flange 233. The wafer bonding surface 231 is formed on the outer surface 222 of the support plate 220. The covering portion 232 is a package: covering the ring side wall 223 of the flapping plate 220 so that the fastening flange 233 fits on the
第12頁 M261318 四、創作說明(5) 支撐盤22G之扣合槽225,並且,該軟膜230係順從該支撐 盤220之弧角224而使得該軟膜230在該弧角224處係具有一 致厚度之外表面順從部2 3 4,因此,該軟膜2 3 0在該内表面 2 21與該環側壁2 2 3之間不會有外表面突起部位,以利彈性 復位。另,較佳地,該軟膜230在對應該支撐盤220直角 226之外表面部位係為弧角235,該弧角235之半徑應小於 該軟膜230之外表面順從部2 34之彎曲半徑。 因此,請參閱第4圖,上述之化學機械研磨之研磨頭 改良構造即使在長時間化學機構研磨之後或者研磨時遭受 過大應力,導致該軟膜2 3 0部份滑動後,該軟膜2 3 〇之外表 面順從部234可順利地再由該拘束環21〇之環内壁21 2與該 支樓盤220之環側壁223滑出,該軟膜23〇之扣合凸緣233^乃 可再復位至該支撐盤220之扣合槽225,研磨漿粒子將不會 聚集在該支樓盤220之環側壁223與該拘束環21〇之環内壁 212之間,解決了習知研磨漿聚集在拘束環21〇之環内壁 2 1 2處產生硬化堵塞之問題。 本創作之保護範圍當視後附之申請專利範圍所界定 為準,任何熟知此項技藝者’在不脫離本創作之精神 圍内所作之任何變化與修改,均屬於本創作之保護範圍Page 12 M261318 IV. Creation instructions (5) The engaging groove 225 of the support plate 22G, and the soft film 230 conforms to the arc angle 224 of the support plate 220 so that the soft film 230 has a uniform thickness at the arc angle 224 The outer surface is compliant with the portion 2 3 4. Therefore, the soft film 2 3 0 does not have a protruding portion on the outer surface between the inner surface 2 21 and the ring side wall 2 2 3 to facilitate elastic restoration. In addition, preferably, the soft film 230 is an arc angle 235 on the surface portion corresponding to the right angle 226 of the support plate 220, and the radius of the arc angle 235 should be smaller than the bending radius of the compliance portion 2 34 of the outer surface of the soft film 230. Therefore, please refer to FIG. 4. The improved structure of the above-mentioned chemical-mechanical polishing head is subjected to excessive stress even after grinding for a long time in the chemical mechanism or during grinding, which causes the soft film 2 30 to partially slide, and the soft film 2 3 0 The outer surface compliance portion 234 can smoothly slide out from the inner wall 21 2 of the ring of restraint ring 21 and the side wall 223 of the ring of the building 220, and the fastening flange 233 of the soft film 23 can be reset to the support. The fastening groove 225 of the disc 220 will not collect the abrasive slurry particles between the side wall 223 of the ring 220 of the support building 220 and the inner wall 212 of the ring 21 of the restraint ring, which solves the problem that the conventional slurry gathers in the ring 21 The ring inner wall 2 1 2 has a problem of hardening and blocking. The scope of protection of this creation shall be determined by the scope of the attached patent application. Any changes and modifications made by those skilled in the art without departing from the spirit of this creation are within the scope of this creation.
M261318 _ 圖式簡單綱 飄^ —— 【圖式簡單說明】 第1圖:習知化學機械研磨之研磨頭之局部截面示意圖; 第2圖:習知化學機械研磨之研磨頭在研磨後產生不良之 局部截面示意圖; 第3圖··依據本創作,一種化學機械研磨之研磨頭改良構 造之局部截面示意圖;及 第4圖:依據本創作,該化學機械研磨之研磨頭改良構造 在研磨後仍可使用之局部截面示意圖。 元件符號簡單說明 110拘束環 120支撐盤 123環侧壁 130軟膜 2 1 0拘束環 2 1 3硬質上環部 220 支撐盤 223環側壁 226 直角 230軟膜 233扣合凸緣 111 開口 121内表面 124直角 1 31 扣合凸緣 211 開口 2 1 4軟質下環部 221 内表面 224 弧角 231 晶圓接合面 234 外表面順從部 1 2 2外表面 1 2 5扣合槽 132外表面突起部 21 2 環内壁 222外表面 2 2 5扣合槽 232環狀包覆部 2 3 5弧角M261318 _ Simple schematic diagram ^ —— [Schematic description] Figure 1: Partial cross-sectional schematic diagram of a conventional chemical mechanical polishing grinding head; Figure 2: A conventional chemical mechanical polishing grinding head produces a defect after grinding Partial cross-section schematic diagram; Figure 3 ·· A partial cross-sectional schematic diagram of an improved structure of a chemical mechanical polishing grinding head according to the present creation; and FIG. 4: According to this creation, the chemical mechanical polishing grinding head's improved structure remains after grinding A schematic diagram of a partial cross section that can be used. Element symbol brief description 110 restraint ring 120 support plate 123 ring side wall 130 soft film 2 1 0 restraint ring 2 1 3 rigid upper ring 220 support plate 223 ring side wall 226 right angle 230 soft film 233 snap flange 111 opening 121 inner surface 124 right angle 1 31 Fastening flange 211 Opening 2 1 4 Soft lower ring portion 221 Inner surface 224 Arc angle 231 Wafer joint surface 234 Outer surface compliance portion 1 2 2 Outer surface 1 2 5 Fastening groove 132 Outer surface protruding portion 21 2 Ring inner wall 222 outer surface 2 2 5 snap groove 232 ring-shaped covering part 2 3 5 arc angle
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Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US8585468B2 (en) | 2003-11-13 | 2013-11-19 | Applied Materials, Inc. | Retaining ring with shaped surface |
TWI606889B (en) * | 2015-10-30 | 2017-12-01 | Sumco股份有限公司 | Wafer polishing device and a polishing head used therein |
US11260500B2 (en) | 2003-11-13 | 2022-03-01 | Applied Materials, Inc. | Retaining ring with shaped surface |
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2004
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Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US8585468B2 (en) | 2003-11-13 | 2013-11-19 | Applied Materials, Inc. | Retaining ring with shaped surface |
US10766117B2 (en) | 2003-11-13 | 2020-09-08 | Applied Materials, Inc. | Retaining ring with shaped surface |
US11260500B2 (en) | 2003-11-13 | 2022-03-01 | Applied Materials, Inc. | Retaining ring with shaped surface |
US11577361B2 (en) | 2003-11-13 | 2023-02-14 | Applied Materials, Inc. | Retaining ring with shaped surface and method of forming |
TWI606889B (en) * | 2015-10-30 | 2017-12-01 | Sumco股份有限公司 | Wafer polishing device and a polishing head used therein |
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MM4K | Annulment or lapse of a utility model due to non-payment of fees |